Eye pattern test method, device and system for optical module

Abstract

The invention relates to the technical field of optical module eye pattern test data communication services, in particular to an optical module eye pattern test method, device and system, and the method comprises the steps: obtaining all test parameter data in an optical module eye pattern test process to form all test data sequences, and dividing time intervals in the optical module eye pattern test process; according to the correlation between the data of each test parameter in each time interval and the temperature data, in combination with the variation trend difference between each test parameter in each time interval and the temperature data, obtaining a temperature influence coefficient, constructing a first vector of each time interval, analyzing the similarity between each time interval and other time intervals about the first vector, and obtaining a temperature influence coefficient; and in combination with the temperature influence coefficient, temperature influence values of other test parameters except the temperature are calculated, and temperature control in the optical module eye pattern test process is optimized and adjusted so as to test the optical module eye pattern. The stability of the eye pattern test condition of the optical module can be ensured, and the test precision is improved.

Description

Technical Field

[0001] The present application relates to the technical field of optical module eye diagram testing data communication service, and in particular to an optical module eye diagram testing method, device and system. Background Art

[0002] Optical modules play a vital role in modern communication systems and are widely used in data centers, telecommunication networks, and enterprise networks. The performance of optical modules directly affects the quality of communication. Eye diagram testing, as an important method for testing the performance of optical modules, has been widely studied in recent years. At present, many studies have been devoted to improving the accuracy and efficiency of eye diagram testing, including the use of advanced testing equipment and the optimization of testing methods.

[0003] However, the temperature changes in the test environment during the eye diagram test of the optical module will affect the accuracy of the eye diagram test. As the transmission rate of the optical module continues to increase, the eye diagram test of high-speed signals becomes more difficult, requiring higher performance testing equipment and technology. During the eye diagram test of the optical module, temperature changes will cause performance changes of the electronic components and optical distance inside the optical module, which will increase the signal jitter, blur the eye diagram, and reduce the transmission quality of the signal. The impact of temperature changes on the performance of the optical module will eventually be reflected in the bit error rate. Temperature increases or decreases will cause the bit error rate to increase, affecting the reliability and stability of the optical communication system. The traditional feedback control monitoring method is used to test the performance of the optical module. The correlation between temperature changes and data transmission performance and test results during the actual test process is not considered, and the optical module eye diagram test conditions are not effectively stabilized, resulting in generally low test accuracy. Summary of the invention

[0004] In order to solve the above technical problems, the purpose of this application is to provide an eye diagram test method, device and system for an optical module. The technical solutions adopted are as follows:

[0005] In a first aspect, an embodiment of the present application provides an eye diagram testing method for an optical module, comprising the following steps:

[0006] Acquire the data of each test parameter during the optical module eye diagram test to form each test data sequence;

[0007] Analyze the autocorrelation coefficient of the test data sequence of each test parameter at different delay times, and divide the time interval of the optical module eye diagram test process according to the mutation of the autocorrelation coefficient of all test data sequences at different delay times;

[0008] According to the correlation between the data of each test parameter in each time interval and the temperature data, combined with the difference in the change trend of each test parameter and the temperature data in each time interval, the temperature influence coefficient of each test parameter in each time interval is obtained;

[0009] Construct the first vector of each time interval according to the temperature influence coefficient of each test parameter in each time interval and the fluctuation of all temperatures in the time interval, analyze the similarity between each time interval and other time intervals about the first vector, and calculate the temperature influence value of each test parameter except temperature in combination with the temperature influence coefficient of each test parameter in each time interval;

[0010] The temperature control during the optical module eye diagram test is optimized and adjusted based on the temperature impact value, and the optical module eye diagram is tested.

[0011] Preferably, the test parameters include: signal amplitude, bit error rate, temperature and optical power during the optical module eye diagram test.

[0012] Preferably, the acquisition of the time interval further includes: using an autocorrelation function to obtain the autocorrelation coefficient of the test data sequence at different delay times, extracting the mutation points of all autocorrelation coefficients, using the delay time corresponding to the mutation point as the segmentation point of the test data sequence, and obtaining each time interval.

[0013] Preferably, the expression of the temperature influence coefficient of each test parameter in each time interval is: x,i =|a x,i ―a x,t |×b x,i,t ; Among them, h x,i Indicates the temperature influence coefficient of the i-th test parameter in the x-th time interval during the optical module eye diagram test, a x,i 、a x,t Respectively represent the trend statistics of the data of the i-th test parameter and the trend statistics of the temperature data in the x-th time interval; b x,i,t Represents the Pearson correlation coefficient between the data of the i-th test parameter and the temperature data in the x-th time interval.

[0014] Preferably, the first vector of each time interval is a vector composed of the temperature influence coefficient of each test parameter in each time interval and the coefficient of variation of all temperature data in each time interval.

[0015] Preferably, the expression of the temperature influence value is: Among them, w i Indicates the temperature impact value of the i-th test parameter except temperature during the optical module eye diagram test; z xrepresents the average value of the cosine similarity of the first vector between the xth time interval and all other time intervals; h x,i Indicates the temperature influence coefficient of the i-th test parameter in the x-th time interval during the optical module eye diagram test, where n is the number of time intervals.

[0016] Preferably, the optimization adjustment further includes:

[0017] All temperature impact values ​​are normalized, and the proportional parameters of the PI controller are adjusted according to the mean of all normalized results combined with the initial proportional parameters. The PI controller is used to optimize the temperature control during the optical module eye diagram test.

[0018] Preferably, the expression of the proportional parameter P after adjustment by the PI controller is: P=P0+P0×c, wherein P0 is the initial proportional parameter obtained by the attenuation curve method, and c is the mean value of all the normalized processing.

[0019] In a second aspect, an embodiment of the present application further provides an eye diagram test device for an optical module, the device comprising:

[0020] The optical module eye diagram test parameter acquisition module acquires the data of each test parameter in the optical module eye diagram test process to form each test data sequence;

[0021] The optical module eye diagram test parameter impact analysis module analyzes the autocorrelation coefficient of the test data sequence of each test parameter at different delay times, and divides the time interval of the optical module eye diagram test process based on the mutation of the autocorrelation coefficient of all test data sequences at different delay times;

[0022] According to the correlation between the data of each test parameter in each time interval and the temperature data, combined with the difference in the change trend of each test parameter and the temperature data in each time interval, the temperature influence coefficient of each test parameter in each time interval is obtained;

[0023] Construct the first vector of each time interval according to the temperature influence coefficient of each test parameter in each time interval and the fluctuation of all temperatures in the time interval, analyze the similarity between each time interval and other time intervals about the first vector, and calculate the temperature influence value of each test parameter except temperature in combination with the temperature influence coefficient of each test parameter in each time interval;

[0024] The optical module eye diagram test optimization module optimizes and adjusts the temperature control during the optical module eye diagram test based on the temperature impact value, and tests the optical module eye diagram.

[0025] In a third aspect, an embodiment of the present application further provides an eye diagram testing system for an optical module, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, wherein the processor implements the steps of any one of the above methods when executing the computer program.

[0026] It can be seen from the above that the eye diagram test method, device and system of an optical module provided by the present application have at least the following beneficial effects:

[0027] This application takes into account that during the eye diagram test of the optical module at different temperatures, the feedback fluctuation of temperature will cause signal fluctuation. However, the temperature feedback control for the eye diagram test of the optical module at different temperatures does not fully consider the impact of the temperature change during the actual test process on the fluctuation of signal transmission, thereby affecting the quality of the eye diagram generated at the set temperature and reducing the accuracy of the eye diagram test of the optical module at different temperatures.

[0028] In response to the above problems, the present application considers that the temperature control deviation of the test environment during the test of the optical module will affect the accuracy of the test results at different temperatures. In the actual temperature control process, since the temperature change has a correlated response characteristic to the parameter change during the eye diagram test, the autocorrelation response characteristics of each test parameter in the optical module test process are compared and analyzed, and then the time interval is divided, and the test parameters in the time interval with a relative delayed response characteristic during the optical module test process are compared and analyzed, and the temperature influence coefficient of other test parameters affected by temperature changes in the optical module eye diagram test process is obtained. The beneficial effect is that the temperature influence coefficient is used to comprehensively analyze the response fluctuation characteristic deviation of the test process affected by temperature changes, and then the temperature influence value in the test process is accurately analyzed;

[0029] Furthermore, the temperature influence value of the optical module eye diagram test process is obtained according to the temperature influence coefficient of the temperature change during the optical module eye diagram test process, and the temperature change during the optical module eye diagram test process is optimized and adjusted according to the temperature influence value. The beneficial effect lies in combining the transmission response characteristics affected by temperature changes during the test process, effectively adjusting the optical module eye diagram test conditions at the set temperature, and obtaining accurate optical module eye diagram test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present application or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0031] Figure 1A flowchart of the eye diagram testing method of an optical module provided in this application;

[0032] Figure 2 A schematic diagram of the eye height, eye width and jitter duration of the eye diagram generated after the signals provided in this application are superimposed;

[0033] Figure 3 This is a block diagram of an eye diagram testing device for an optical module provided in the present application. DETAILED DESCRIPTION

[0034] In order to further explain the technical means and effects adopted by the present application to achieve the predetermined invention purpose, the eye diagram test method, device and system of an optical module proposed in the present application, its specific implementation method, structure, features and effects are described in detail as follows in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0035] Unless otherwise specified and limited, terms such as "comprises", "comprising" or any other variants thereof are intended to cover non-exclusive inclusion, so that a circuit structure, article or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such articles or devices. In the absence of further restrictions, an element defined by the sentence "comprising a ..." does not exclude the presence of other identical elements in the article or device including the element. In addition, the term "and\or" used herein includes any and all combinations of one or more related listed items. All technical and scientific terms used herein have the same meaning as those commonly understood by technicians in the technical field of this application.

[0036] The following is a detailed description of a method, device and system for testing an eye diagram of an optical module provided by the present application in conjunction with the accompanying drawings.

[0037] See also Figure 1 , which shows a flowchart of a method for testing an eye diagram of an optical module provided by an embodiment of the present application, including the following steps:

[0038] Step 1: Obtain the data of each test parameter during the optical module eye diagram test to form each test data sequence.

[0039] Optical modules are mainly used for the conversion of photoelectric signals during data fiber optic communication transmission. Therefore, the performance of optical modules directly affects the performance and accuracy of data transmission. The data transmission performance test of optical modules is mainly an eye diagram test. The test instruments used are high-speed oscilloscopes and bit error meters. The signal amplitude data during the test can be obtained through the high-speed oscilloscope, and the bit error rate corresponding to the output signal of the optical module and the reference signal can be obtained through the bit error meter. The use of high-speed oscilloscopes and bit error meters in the specific eye diagram test and the process of obtaining corresponding operating data are well known to technicians in this field and will not be described in detail.

[0040] Furthermore, since temperature changes during the optical module eye diagram test will affect data transmission performance, and temperature changes affect the eye diagram quality and accuracy of the optical module eye diagram test during the eye diagram test; therefore, this embodiment takes into account the associated response characteristics of temperature changes and various test parameters during the actual test process, and then effectively controls the temperature of the optical module eye diagram test process, reducing the impact of temperature changes on the eye diagram test results. Specifically, during the eye diagram test of the optical module, a temperature sensor and an optical power meter are used to collect temperature data and optical power data, respectively, and the collected temperature data and optical power data are used as input, and a median filter is used for noise reduction processing.

[0041] At this point, data of various test parameters during the optical module eye diagram test are obtained, and the test parameters include signal amplitude, bit error rate, temperature, and optical power during the optical module eye diagram test.

[0042] Step 2: Analyze the autocorrelation coefficient of the test data sequence of each test parameter at different delay times, and divide the time interval of the optical module eye diagram test process according to the mutation of the autocorrelation coefficient of all test data sequences at different delay times.

[0043] Generally, during the performance test of optical modules, the data transmission performance of optical modules at different temperatures is different. Therefore, the data transmission performance of optical modules at different temperatures is analyzed by testing the eye diagram test results of optical modules at different temperatures. However, during the test of optical modules, the test environment temperature control deviation will affect the accuracy of the test results at different temperatures. In the actual temperature control process, the associated response characteristics of the parameters in the eye diagram test process are not considered, which leads to the use of traditional feedback control methods to control the temperature. The corresponding deviation of the temperature control will affect the quality of the generated eye diagram and reduce the accuracy of the eye diagram test at different temperatures.

[0044] In view of the above problems, in this embodiment, by collecting optical power data, amplitude data and temperature data during the eye diagram test of the optical module, the response relationship of different test data to temperature changes during the eye diagram test is analyzed, the temperature feedback deviation during the eye diagram test is analyzed, and the transmission response value affected by the temperature of the optical module eye diagram test is obtained. The specific test analysis process is as follows:

[0045] Since the temperature fluctuation during the optical module eye diagram test will affect the transmission fluctuation of the photoelectric signal during the test, wavelength drift may occur to affect the transmission characteristics of the signal, thereby affecting the quality of the corresponding eye diagram of the optical module. In order to further accurately analyze the impact of temperature changes on transmission performance during the optical module test, for each test parameter in the optical module test process, the sequence composed of the test parameter data is used as the test sequence. In this embodiment, the sequence composed of the test parameter data in ascending time order is used as the test data sequence for the optical module eye diagram test, and the autocorrelation function is used to obtain the autocorrelation coefficient of the test data sequence at different delay times. In this embodiment, the different delay times are selected from the various acquisition moments in the test parameter data acquisition process. It should be noted here that the implementer can set multiple delay times by himself in the actual application scenario, that is, select some data acquisition moments as the delay time, which is set by the specific implementer.

[0046] The process of obtaining the autocorrelation coefficient under different delay times through the autocorrelation function is a technology known to those skilled in the art and will not be described in detail. Through the autocorrelation characteristics of each test parameter under different delay times during the optical module eye diagram analysis process, the response delay of each test parameter caused by temperature changes during the test process can be accurately analyzed. It should be noted that in the process of performing autocorrelation analysis on each test parameter, the delay time corresponding to each test parameter is the same, which is the data collection time of each test parameter.

[0047] Furthermore, a Bayesian mutation point detection algorithm is used to perform mutation point detection on all autocorrelation coefficients of all test data sequences to extract mutation points. The mutation points indicate that at the delay time corresponding to the mutation points, the response changes of the optical module eye diagram test parameters are quite different.

[0048] Therefore, the delay time corresponding to all the mutation points in the above-mentioned optical module eye diagram test process is used as the timing interval division point of the acquisition time in the optical module eye diagram test process, and the total acquisition time in the optical module eye diagram test process is divided. For example, the delay time corresponding to all mutation points is 25, 37, and 45, and the total acquisition time up to the current moment is recorded as 100. The corresponding divided time intervals are [1,25), [25,37), [37,45), and [45,100] respectively.

[0049] After the above analysis, the autocorrelation response characteristics of each test parameter in the optical module test process are compared and analyzed, and then the time interval is divided, and the test parameters in the time interval with relatively delayed response characteristics in the optical module test process are compared and analyzed.

[0050] Step 3: According to the correlation between the data of each test parameter in each time interval and the temperature data, combined with the difference in the change trend of each test parameter and the temperature data in each time interval, the temperature influence coefficient of each test parameter in each time interval is obtained.

[0051] Considering that in the actual optical module eye diagram test process, in the process of testing the performance of the optical module at the same temperature, the instantaneous temperature error in the test process is fed back and analyzed. In order to consider that in the actual test process, the signal stability is different in the time intervals of different temperature fluctuations, resulting in the generated eye diagram quality may be poor, thereby affecting the accuracy of the optical module data transmission performance test results at different temperatures. Therefore, for each test parameter in each time interval divided in the optical module eye diagram test process, a trend verification algorithm is used to obtain the trend statistics of each test parameter. The larger the trend statistics, the more significant the response trend characteristics of the test parameter data affected by temperature changes in the divided time interval.

[0052] Furthermore, in order to accurately analyze the correlation response of different test parameter trend characteristics within a time interval with a relative delay response characteristic, for each test parameter in each time interval divided during the optical module eye diagram test, the Pearson correlation coefficient b between the data of each test parameter and the data of each other test parameter is calculated. The larger the Pearson correlation coefficient, the more significant the parameter fluctuation response correlation characteristics caused by temperature changes within the time interval.

[0053] According to the trend characteristics and correlation characteristics of each test parameter in the time interval divided during the optical module eye diagram test, the temperature influence coefficient of the temperature change during the optical module eye diagram test process is obtained. The calculation relationship is: h x,i =|a x,i ―a x,t |×b x,i,t ; Among them, h x,i Indicates the temperature influence coefficient of the i-th test parameter in the x-th time interval during the optical module eye diagram test, a x,i 、a x,t Respectively represent the trend statistics of the data of the i-th test parameter and the temperature data in the x-th time interval; b x,i,t Represents the Pearson correlation coefficient between the data of the i-th test parameter and the temperature data in the x-th time interval.

[0054] It can be understood that the larger the temperature influence coefficient is, the more significant the deviation of the response fluctuation characteristic of the current test parameter to the temperature change is during the optical module eye diagram test.

[0055] Step 4: Construct the first vector of each time interval according to the temperature influence coefficient of each test parameter in each time interval and the fluctuation of all temperatures in the time interval, analyze the similarity between each time interval and other time intervals with respect to the first vector, and calculate the temperature influence value of each test parameter except temperature in combination with the temperature influence coefficient of each test parameter in each time interval.

[0056] Due to the influence of temperature changes during the eye diagram test of the optical module, the fluctuation deviation of signal transmission will show delay fluctuation characteristics. Therefore, after dividing the time intervals with the same delay response characteristics, the trend and correlation differences between each test parameter and the temperature data are analyzed, and then the response fluctuation characteristic deviation of the test process affected by temperature changes is comprehensively analyzed based on the analysis results.

[0057] Specifically, for each time interval divided during the optical module eye diagram test, a vector consisting of the temperature influence coefficient corresponding to each test parameter in the time interval and the coefficient of variation of all temperature data in the time interval is used as the first vector of each time interval; the average value of the cosine similarity of the first vector between each time interval and all other time intervals is calculated. For ease of understanding, this is recorded as the temperature influence confidence of each time interval in this embodiment. The larger the temperature influence confidence, the greater the response fluctuation affected by temperature changes during the optical module eye diagram test.

[0058] According to the response fluctuation deviation of each test parameter in the optical module eye diagram test in different time intervals and the influence of temperature change on the signal fluctuation response, the temperature influence value in the optical module eye diagram test is obtained. The specific calculation relationship is:

[0059] Among them, w i Indicates the temperature impact value of the i-th test parameter except temperature during the optical module eye diagram test; z x Indicates the confidence level of the temperature effect on the signal waveform response caused by temperature changes in the xth time interval during the optical module eye diagram test; h x,i It indicates the temperature influence coefficient of the i-th test parameter in the x-th time interval during the optical module eye diagram test. n is the number of time intervals. The larger the calculated temperature influence value is, the more significant the response feedback of the signal transmission fluctuation affected by temperature changes during the optical module eye diagram test is.

[0060] Step 5: Optimize and adjust the temperature control during the optical module eye diagram test based on the temperature impact value, and test the optical module eye diagram.

[0061] Since the temperature change during the optical module eye diagram test has a great impact on the quality of the generated eye diagram, if the temperature parameters are not effectively controlled during the test, the eye diagram test results may have a large deviation, and the transmission performance parameters of the optical module at different temperatures cannot be accurately analyzed. Therefore, based on the delay response characteristics of different test parameters during the optical module eye diagram test, the data of the test parameters in the time interval with relative delay response characteristics are compared and analyzed to obtain the feedback response degree of signal data fluctuation caused by temperature changes under the set temperature conditions during the optical module eye diagram test, and then the feedback response parameters during the optical module eye diagram test are optimized and adjusted.

[0062] Specifically, a PI controller is used to feedback control the temperature of the optical module during the eye diagram test at different temperatures, wherein the initial proportional parameter P0 and integral parameter I of the PI controller are determined by the attenuation curve method; all temperature influence values ​​obtained during the optical module eye diagram test are used as input, and the Z-score normalization algorithm is used to obtain the normalized results of all temperature influence values, and the mean of the normalized results is used as the optimization parameter c of the feedback response of the optical module eye diagram test. The larger the optimization parameter, the more significant the response feedback of the signal transmission fluctuation affected by the temperature change under the set temperature conditions during the optical module eye diagram test, that is, the greater the response deviation of the feedback control; the proportional parameter of the temperature feedback control during the optical module test is adjusted according to the optimization parameter, and the expression of the adjusted proportional parameter is: P=P0+P0×c.

[0063] After the above adjustment, the eye diagram test result of the optical module at the set temperature is obtained. Specifically, the temperature feedback control process at different set temperatures is adjusted through the above steps, and then the accurate results of the eye diagram test of the optical module at different temperatures are obtained in combination with the size of the bit error rate at different temperatures. Among them, the signal transmission performance at different temperatures can be comprehensively judged by the eye height, eye width and jitter time of the eye diagram generated after signal superposition and the bit error rate collected by the bit error meter. The schematic diagram of the eye height, eye width and jitter time of the eye diagram generated after signal superposition is as follows Figure 2 As shown, Figure 2 Numbers 1-3 represent eye height, eye width and jitter duration respectively. The specific process of judging the data transmission performance at different temperatures based on the generated eye diagram parameters and bit error rate can be judged according to the actual data transmission performance requirements. It should be noted that in different optical module production requirements, the settings of eye diagram parameters and bit error rates for data transmission at different temperatures are different, and the data transmission quality can be judged according to the actual production requirements.

[0064] On the other hand, an embodiment of the present application further provides an eye diagram testing device for an optical module, the device comprising:

[0065] The optical module eye diagram test parameter acquisition module acquires the data of each test parameter in the optical module eye diagram test process to form each test data sequence;

[0066] The optical module eye diagram test parameter impact analysis module analyzes the autocorrelation coefficient of the test data sequence of each test parameter at different delay times, and divides the time interval of the optical module eye diagram test process based on the mutation of the autocorrelation coefficient of all test data sequences at different delay times;

[0067] According to the correlation between the data of each test parameter in each time interval and the temperature data, combined with the difference in the change trend of each test parameter and the temperature data in each time interval, the temperature influence coefficient of each test parameter in each time interval is obtained;

[0068] Construct the first vector of each time interval according to the temperature influence coefficient of each test parameter in each time interval and the fluctuation of all temperatures in the time interval, analyze the similarity between each time interval and other time intervals about the first vector, and calculate the temperature influence value of each test parameter except temperature in combination with the temperature influence coefficient of each test parameter in each time interval;

[0069] The optical module eye diagram test optimization module optimizes and adjusts the temperature control during the optical module eye diagram test based on the temperature impact value, and tests the optical module eye diagram.

[0070] Specifically, a block diagram of an eye diagram test device for an optical module is as follows: Figure 3 shown.

[0071] Based on the same inventive concept as the above method, an embodiment of the present application also provides an eye diagram testing system for an optical module, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, wherein when the processor executes the computer program, the steps of any one of the above-mentioned eye diagram testing methods for an optical module are implemented.

[0072] It is to be understood that the sequence of the embodiments of the present application described above is for description only and does not represent the advantages and disadvantages of the embodiments. The above describes specific embodiments of the present specification. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0073] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

[0074] The above content is only an implementation method of the present application and is not intended to limit the scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the protection scope of the present application.

Claims

1. A method for testing an eye diagram of an optical module, characterized in that: The following steps are involved: Acquire the data of each test parameter during the optical module eye diagram test to form each test data sequence; Analyze the autocorrelation coefficient of the test data sequence of each test parameter at different delay times, and divide the time interval of the optical module eye diagram test process according to the mutation of the autocorrelation coefficient of all test data sequences at different delay times; According to the correlation between the data of each test parameter in each time interval and the temperature data, combined with the difference in the change trend of each test parameter and the temperature data in each time interval, the temperature influence coefficient of each test parameter in each time interval is obtained; Construct the first vector of each time interval according to the temperature influence coefficient of each test parameter in each time interval and the fluctuation of all temperatures in the time interval, analyze the similarity between each time interval and other time intervals about the first vector, and calculate the temperature influence value of each test parameter except temperature in combination with the temperature influence coefficient of each test parameter in each time interval; The temperature control during the optical module eye diagram test is optimized and adjusted based on the temperature impact value, and the optical module eye diagram is tested.

2. The eye diagram testing method of an optical module according to claim 1, characterized in that: The test parameters include: signal amplitude, bit error rate, temperature and optical power during the optical module eye diagram test.

3. The eye diagram testing method of an optical module according to claim 1, characterized in that: The acquisition of the time interval further includes: using an autocorrelation function to obtain the autocorrelation coefficient of the test data sequence at different delay times, extracting the mutation points of all autocorrelation coefficients, using the delay time corresponding to the mutation point as the segmentation point of the test data sequence, and obtaining each time interval.

4. The eye diagram testing method of an optical module according to claim 1, characterized in that: The expression of the temperature influence coefficient of each test parameter in each time interval is: x,i =|a x,i ―a x,t |×b x,i,t ; Among them, h x,i Indicates the temperature influence coefficient of the i-th test parameter in the x-th time interval during the optical module eye diagram test, a x,i 、a x,t Respectively represent the trend statistics of the data of the i-th test parameter and the trend statistics of the temperature data in the x-th time interval; b x,i,t Represents the Pearson correlation coefficient between the data of the i-th test parameter and the temperature data in the x-th time interval.

5. The eye diagram testing method of an optical module according to claim 1, characterized in that: The first vector of each time interval is a vector composed of the temperature influence coefficient of each test parameter in each time interval and the coefficient of variation of all temperature data in each time interval.

6. The eye diagram testing method of an optical module according to claim 1, characterized in that: The expression of the temperature influence value is: Among them, w i Indicates the temperature impact value of the i-th test parameter except temperature during the optical module eye diagram test; z x represents the average value of the cosine similarity of the first vector between the xth time interval and all other time intervals; h x,i Indicates the temperature influence coefficient of the i-th test parameter in the x-th time interval during the optical module eye diagram test, where n is the number of time intervals.

7. The eye diagram testing method of an optical module according to claim 1, characterized in that: The optimization adjustment further includes: All temperature impact values ​​are normalized, and the proportional parameters of the PI controller are adjusted according to the mean of all normalized results combined with the initial proportional parameters. The PI controller is used to optimize the temperature control during the optical module eye diagram test.

8. The eye diagram testing method of an optical module as claimed in claim 7, characterized in that: The expression of the proportional parameter P after the PI controller is adjusted is: P=P0+P0×c, wherein P0 is the initial proportional parameter obtained by the attenuation curve method, and c is the mean value of all the normalized processing.

9. An eye diagram test device for an optical module, characterized in that: The device comprises: The optical module eye diagram test parameter acquisition module acquires the data of each test parameter in the optical module eye diagram test process to form each test data sequence; The optical module eye diagram test parameter impact analysis module analyzes the autocorrelation coefficient of the test data sequence of each test parameter at different delay times, and divides the time interval of the optical module eye diagram test process based on the mutation of the autocorrelation coefficient of all test data sequences at different delay times; According to the correlation between the data of each test parameter in each time interval and the temperature data, combined with the difference in the change trend of each test parameter and the temperature data in each time interval, the temperature influence coefficient of each test parameter in each time interval is obtained; Construct the first vector of each time interval according to the temperature influence coefficient of each test parameter in each time interval and the fluctuation of all temperatures in the time interval, analyze the similarity between each time interval and other time intervals about the first vector, and calculate the temperature influence value of each test parameter except temperature in combination with the temperature influence coefficient of each test parameter in each time interval; The optical module eye diagram test optimization module optimizes and adjusts the temperature control during the optical module eye diagram test based on the temperature impact value, and tests the optical module eye diagram.

10. An eye diagram test system for an optical module, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 8 are implemented.

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