Method and device for eliminating detection error of shear speckle interference near-surface defect

By setting the initial shear amount and rotary adjustment of the shear direction in the shear speckle interference technology, combining dynamic loading and light intensity map acquisition, the detection error problem introduced by the shear amount is solved, and high accuracy of near-surface defects of the material is achieved Testing, simplifies the inspection process and lowers the threshold.

CN119125139AActive Publication Date: 2024-12-13BEIJING INST OF TECH +1
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Patent Information

Application Number
CN202411009109.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-07-26
Publication Date
2024-12-13
Estimated Expiration
2044-07-26

AI Technical Summary

Technical Problem

The shear speckle interference technology has detection errors introduced by the shear amount in the detection of near-surface defects of materials, and the prior art is difficult to effectively eliminate, resulting in large defect detection results and inaccurate positioning.

Method used

Adjust the shear direction by setting the initial shear amount and rotation, combining dynamic loading and light intensity map acquisition, calculate and filter the shear phase map, locate abnormal fringes, and eliminate errors through intersections under different shear directions, achieving high-precision defects Test.

Benefits of technology

The defect detection error introduced by the shear amount can be accurately eliminated without shear calibration, which improves the accuracy of material near-surface defect detection, lowers the detection threshold, and is suitable for industrial inspection and material maintenance.

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Abstract

The invention discloses a shearing speckle interference near surface defect detection error elimination method and device, and the method sequentially comprises the steps: setting the shearing amount, rotating and adjusting the shearing direction, rotating and adjusting a slit diaphragm, dynamically loading and collecting a light intensity diagram, calculating and screening a shearing phase diagram, positioning abnormal fringes, summarizing the detection results in all directions, and calculating the defect distribution. Shear phase diagrams in different shear directions are used as defect detection objects, defect detection errors introduced by shear quantities are distributed in different directions, the defect detection errors introduced by the shear quantities are eliminated by taking intersection of measurement results in all the shear directions, and high-precision detection of near-surface defects of materials is achieved. Defect detection errors introduced by shearing amount can be directly and accurately eliminated without shearing amount calibration and compensation, and defect distribution of a detected piece is obtained. The whole process is convenient and fast, and the detection threshold is low.
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Citation Information

Patent Citations

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    DE102017002419A1

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