Magnetic circuit structure analysis method and device for MHD angular velocity sensor element
By using a method based on magnetic circuit Kilhoff's law, a relational expression is generated that characterizes the magnetic induction intensity distribution of MHD angular velocity sensing elements, and the magnetic induction intensity distribution is calculated based on the leakage magnetic coefficient, which solves the problem of long calculation period and poor accuracy in the prior art. , realizes efficient calculation and design guidance for magnetic induction intensity distribution.
Patent Information
- Application Number
- CN202411586511.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-08
- Publication Date
- 2025-02-18
- Estimated Expiration
- 2044-11-08
AI Technical Summary
In the prior art, when calculating the magnetic induction intensity distribution of the current conducting fluid ring region in the MHD angular velocity sensing element, the calculation period is long and the accuracy is poor.
By responding to the magnetic circuit analysis instruction, the magnetic circuit structure parameters of the MHD angular velocity sensing element are obtained from the target database, and the first relational expression, the second relational expression and the constitutive relational expression are generated based on the magnetic circuit Kirchoff's law, combined with the leakage The magnetic coefficient generates magnetic induction intensity distribution data.
It realizes accurate and convenient calculation of the magnetic induction intensity distribution in the conductive fluid ring area in the sensing element, guides the preliminary design of magnetic circuit structure and material parameters, and shortens the development cycle of MHD angular velocity sensor.
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Figure CN119125601B_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of sensor technology, and more specifically, to a magnetic circuit structure analysis method and device for an MHD angular velocity sensor element. Background Art
[0002] With the continuous development of space science and technology, space technologies such as high-resolution earth observation, deep space exploration, and laser communication have continuously increased the requirements for the attitude stability and pointing accuracy of spacecraft payloads. However, the payload platform is extremely sensitive to the disturbance effect of micro-angular vibration and is easily affected by the micro-angular vibration of the space structure. The micro-angular vibration of the space structure limits the further improvement of the attitude and pointing control accuracy of high-precision spacecraft payloads.
[0003] Magnetohydrodynamics (MHD) angular velocity sensor has the characteristics of low noise, wide bandwidth, miniaturization, long life, etc. It is insensitive to acceleration shock and is currently one of the most direct, effective and reliable sensors for measuring broadband micro-angular vibrations of spacecraft payload platforms.
[0004] In the process of realizing the concept of the present application, it was found that the calculation cycle of the related technology was long and the accuracy was poor when calculating the magnetic induction intensity distribution of the conductive fluid ring area in the sensor element. Summary of the invention
[0005] In view of this, the present application provides a method and device for analyzing the magnetic circuit structure of an MHD angular velocity sensor element.
[0006] One aspect of the present application provides a magnetic circuit structure analysis method for an MHD angular velocity sensor element, comprising:
[0007] In response to the magnetic circuit analysis instruction, obtaining magnetic circuit structure parameters of the magnetic circuit structure diagram of the MHD angular velocity sensor element corresponding to the magnetic circuit analysis instruction from the target database;
[0008] Based on Kirchhoff's law of magnetic circuit, a processor is used to generate a first relational expression, a second relational expression and a constitutive relational expression according to the magnetic circuit structural parameters, wherein the first relational expression represents the relationship between the average magnetic induction intensity of the air gap where the conductive fluid ring in the MHD angular velocity sensor element is located and the magnetic circuit structural parameters, the second relational expression represents the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structural parameters, and the constitutive relational expression represents the relationship between the permanent magnet in the MHD angular velocity sensor element and the air gap;
[0009] According to the above magnetic circuit structure parameters, a magnetic leakage coefficient is generated;
[0010] Based on the above-mentioned leakage magnetic coefficient, according to the above-mentioned first relationship expression, the above-mentioned second relationship expression and the above-mentioned constitutive relationship expression, magnetic induction intensity distribution data is generated, wherein the above-mentioned magnetic induction intensity distribution data characterizes the magnetic induction intensity distribution relationship of the air gap where the above-mentioned conductive fluid ring is located.
[0011] According to an embodiment of the present application, the above magnetic circuit structure parameters are generated in the following manner:
[0012] The magnetic circuit structure diagram is simplified based on the sensitive axis symmetry and the central plane symmetry to obtain a simplified magnetic circuit structure diagram;
[0013] Parameters are extracted from the simplified magnetic circuit structure diagram to obtain the magnetic circuit structure parameters.
[0014] According to an embodiment of the present application, based on Kirchhoff's law of magnetic circuit, a processor is used to generate a first relational expression, a second relational expression and a constitutive relational expression according to the above magnetic circuit structure parameters, including:
[0015] Based on Kirchhoff's first law of magnetic circuit, the first relational expression is generated according to the magnetic circuit structure parameters;
[0016] Based on Kirchhoff's second law of magnetic circuit, the second relational expression is generated according to the magnetic circuit structure parameters;
[0017] According to the above magnetic circuit structure parameters, the above constitutive relationship expression is generated.
[0018] According to an embodiment of the present application, the first relationship expression is shown in formula (1), the second relationship expression is shown in formula (2), and the constitutive relationship expression is shown in formula (3):
[0019] (1)
[0020] in, is the magnetic induction intensity of the permanent magnet working point, is the magnetic pole area of the permanent magnet, is the permanent magnet radius, is the average magnetic induction intensity of the working air gap of the conductive fluid ring, is the working air gap area where the conductive fluid ring is located, is the height of the conductive fluid ring, is the inner radius of the conductive fluid ring, is the outer radius of the conductive fluid ring, is the magnetic flux leakage coefficient;
[0021] (2)
[0022] in, is the permanent magnet operating point The corresponding magnetic field strength, is the height of the cylindrical permanent magnet, is the average magnetic field strength of the working air gap where the conductive fluid ring is located, is the working air gap length, is the magnetoresistance coefficient;
[0023] (3)
[0024] in, is the residual magnetic induction intensity, To recover the magnetic permeability, the air gap region is given by the constitutive relation Characterization, where is the magnetic permeability of vacuum.
[0025] According to an embodiment of the present application, the above-mentioned magnetic flux leakage coefficient As shown in formula (4):
[0026] (4)
[0027] Among them, the total magnetic flux in the magnetic circuit It is mainly composed of two parts: the main leakage magnetic circuit and the working magnetic flux circuit. The magnetic flux of the main leakage magnetic circuit is recorded as , the working magnetic flux loop represents the magnetic flux loop passing through the conductive fluid ring, and its magnetic flux is recorded as , is the permanent magnet radius, is the outer radius of the conductive fluid ring, is the working air gap area where the conductive fluid ring is located, is the height of the conductive fluid ring, is the inner radius of the conductive fluid ring.
[0028] According to an embodiment of the present application, based on the above-mentioned magnetic leakage coefficient, according to the above-mentioned first relationship expression, the above-mentioned second relationship expression and the above-mentioned constitutive relationship expression, magnetic induction intensity distribution data is generated, including:
[0029] Generate a set of functions to be solved according to the first relational expression, the second relational expression and the constitutive relational expression;
[0030] The magnetic flux density distribution data is generated according to the magnetic leakage coefficient and the function set to be solved.
[0031] According to an embodiment of the present application, the magnetic flux density distribution data is generated according to the magnetic leakage coefficient and the function set to be solved, including:
[0032] Substitute the above leakage magnetic coefficient into the above function set to be solved to obtain the target expression;
[0033] According to the above target expression and the above magnetic circuit structure parameters, a magnetic induction intensity distribution function is generated, wherein the above magnetic induction intensity distribution function represents the above magnetic induction intensity distribution data.
[0034] According to an embodiment of the present application, the above target expression is shown in formula (5):
[0035] (5)
[0036] in, is the average magnetic induction intensity of the working air gap of the conductive fluid ring, is the residual magnetic induction intensity, is the height of the cylindrical permanent magnet, is the permanent magnet radius, is the magnetic flux leakage coefficient, is the height of the conductive fluid ring, is the inner radius of the conductive fluid ring, is the outer radius of the conductive fluid ring, is the recovery magnetic permeability.
[0037] According to an embodiment of the present application, the magnetic induction intensity distribution function is as shown in formula (6):
[0038] (6)
[0039] in, is the magnetic induction intensity vector in the conductive fluid ring, is the distribution function of magnetic induction intensity in the conductive fluid, is the radial basis vector in the cylindrical coordinate system, is the average radius of the conductive fluid ring, is the radial coordinate of the target point inside the conductive fluid ring.
[0040] Another aspect of the present application provides a magnetic circuit structure analysis device for an MHD angular velocity sensor element, comprising:
[0041] an acquisition module, for acquiring, in response to a magnetic circuit analysis instruction, magnetic circuit structure parameters of a magnetic circuit structure diagram of an MHD angular velocity sensor element corresponding to the magnetic circuit analysis instruction from a target database;
[0042] A first generating module is used to generate a first relational expression, a second relational expression and a constitutive relational expression based on Kirchhoff's law of magnetic circuit and the magnetic circuit structural parameters using a processor, wherein the first relational expression represents the relationship between the average magnetic induction intensity of the air gap where the conductive fluid ring in the MHD angular velocity sensor element is located and the magnetic circuit structural parameters, the second relational expression represents the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structural parameters, and the constitutive relational expression represents the relationship between the permanent magnet in the MHD angular velocity sensor element and the air gap;
[0043] A second generating module is used to generate a magnetic leakage coefficient according to the magnetic circuit structure parameters;
[0044] The third generating module is used to generate magnetic induction intensity distribution data based on the above-mentioned leakage magnetic coefficient, according to the above-mentioned first relationship expression, the above-mentioned second relationship expression and the above-mentioned constitutive relationship expression, wherein the above-mentioned magnetic induction intensity distribution data characterizes the magnetic induction intensity distribution relationship of the air gap where the above-mentioned conductive fluid ring is located.
[0045] Another aspect of the present application provides an electronic device, comprising:
[0046] one or more processors;
[0047] a memory for storing one or more programs,
[0048] When the one or more programs are executed by the one or more processors, the one or more processors implement the method as described above.
[0049] Another aspect of the present application provides a computer-readable storage medium storing computer-executable instructions, which are used to implement the method described above when executed.
[0050] Another aspect of the present application provides a computer program product, which includes computer executable instructions, and the instructions are used to implement the method as described above when executed.
[0051] According to the embodiments of the present application, based on Kirchhoff's law of the magnetic circuit and according to the magnetic circuit structure parameters, a first relationship expression characterizing the relationship between the average magnetic induction intensity of the air gap where the conductive fluid ring is located in the MHD angular velocity sensor element and the magnetic circuit structure parameters, a second relationship expression characterizing the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structure parameters, and a constitutive relationship expression characterizing the relationship between the permanent magnet and the air gap in the MHD angular velocity sensor element are generated. At the same time, according to the magnetic circuit structure parameters, a leakage magnetic coefficient is generated, so that it is convenient to generate magnetic induction intensity distribution data according to the leakage magnetic coefficient, the first relationship expression, the second relationship expression and the constitutive relationship expression, so that the magnetic induction intensity distribution of the conductive fluid ring area in the sensor element can be accurately and conveniently calculated, thereby guiding the preliminary design of the magnetic circuit structure and material parameters of the sensor element, and greatly shortening the research and development cycle of the MHD angular velocity sensor. BRIEF DESCRIPTION OF THE DRAWINGS
[0052] The above and other objects, features and advantages of the present application will become more apparent through the following description of the embodiments of the present application with reference to the accompanying drawings, in which:
[0053] Figure 1 An exemplary system architecture to which the magnetic circuit structure analysis method according to an embodiment of the present application can be applied is shown;
[0054] Figure 2 A flow chart of a magnetic circuit structure analysis method according to an embodiment of the present application is shown;
[0055] Figure 3 A schematic diagram of the magnetic circuit structure of a sensor element according to an embodiment of the present application is shown;
[0056] Figure 4 A simplified schematic diagram of a magnetic circuit structure of a sensor element according to an embodiment of the present application is shown;
[0057] Figure 5 A schematic diagram of a magnetic circuit structure for parameter extraction according to an embodiment of the present application is shown;
[0058] Figure 6 A schematic diagram of solving the magnetic induction intensity distribution of the air gap where the conductive fluid ring is located according to an embodiment of the present application is shown;
[0059] Figure 7 A block diagram of a magnetic circuit structure analysis device according to an embodiment of the present application is shown; and
[0060] Figure 8 A block diagram of an electronic device suitable for implementing the method described above according to an embodiment of the present application is shown. DETAILED DESCRIPTION
[0061] Below, embodiments of the present application will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present application. In the following detailed description, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of the embodiments of the present application. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of the concepts of the present application.
[0062] The terms used herein are only for describing specific embodiments and are not intended to limit the present application. The terms "include", "comprising", etc. used herein indicate the existence of the features, steps, operations and / or components, but do not exclude the existence or addition of one or more other features, steps, operations or components.
[0063] All terms (including technical and scientific terms) used herein have the meanings commonly understood by those skilled in the art unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.
[0064] When using expressions such as "at least one of A, B, and C, etc.", they should generally be interpreted according to the meaning of the expression commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).
[0065] In the MHD angular velocity sensor, the structural component that can convert the external angular velocity input into the motional electromotive force output is called the MHD angular velocity sensor element, hereinafter referred to as the sensor element. The sensor element has a magnetic circuit structure and a conductive fluid inside. The conductive fluid remains stationary due to inertia and generates relative motion with the magnetic circuit structure to generate a motional electromotive force, which is the output of the sensor element. The output scale factor of the sensor element is proportional to the magnetic induction intensity of the conductive fluid ring inside it, which determines the motion characteristics of the conductive fluid in the ring cavity. Therefore, the magnetic circuit design is one of the key technical indicators and parameters that must be considered first in the design of the sensor element. Since the internal magnetic circuit structure of the MHD angular velocity sensor element is relatively complex, involving multiple permanent magnets and air gaps and other magnetic circuit components, numerical methods such as finite elements are usually used for analysis and calculation. However, the implementation of numerical methods requires entity modeling, and the calculation cycle is long, which is not suitable for the preliminary design and analysis of the magnetic circuit structure of the sensor element.
[0066] In view of this, an embodiment of the present application provides a method and device for analyzing the magnetic circuit structure of an MHD angular velocity sensor element, the method comprising: in response to a magnetic circuit analysis instruction, obtaining magnetic circuit structure parameters of a magnetic circuit structure diagram of an MHD angular velocity sensor element corresponding to the magnetic circuit analysis instruction from a target database; based on Kirchhoff's law of the magnetic circuit, using a processor to generate a first relationship expression, a second relationship expression and a constitutive relationship expression according to the magnetic circuit structure parameters, wherein the first relationship expression represents the relationship between the average magnetic induction intensity of an air gap where a conductive fluid ring is located in the MHD angular velocity sensor element and the magnetic circuit structure parameters, the second relationship expression represents the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structure parameters, and the constitutive relationship expression represents the relationship between the permanent magnet and the air gap in the MHD angular velocity sensor element; generating a leakage magnetic coefficient according to the magnetic circuit structure parameters; based on the leakage magnetic coefficient, generating magnetic induction intensity distribution data according to the first relationship expression, the second relationship expression and the constitutive relationship expression, wherein the magnetic induction intensity distribution data represents the magnetic induction intensity distribution relationship of the air gap where the conductive fluid ring is located.
[0067] In the embodiments of this application, the collection, updating, analysis, processing, use, transmission, provision, disclosure, storage, etc. of the data involved (for example, including but not limited to user personal information) are in compliance with the provisions of relevant laws and regulations, are used for legitimate purposes, and do not violate public order and good morals. In particular, necessary measures are taken for user personal information to prevent illegal access to user personal information data and maintain the security of user personal information and network security.
[0068] Figure 1 An exemplary system architecture 100 to which the magnetic circuit structure analysis method according to an embodiment of the present application can be applied is shown. It should be noted that: Figure 1 What is shown is merely an example of a system architecture to which the embodiments of the present application can be applied, in order to help those skilled in the art understand the technical content of the present application, but it does not mean that the embodiments of the present application cannot be used in other devices, systems, environments or scenarios.
[0069] like Figure 1 As shown, the system architecture 100 according to this embodiment may include a first terminal device 101, a second terminal device 102, a third terminal device 103, a network 104, and a server 105. The network 104 is used to provide a medium for a communication link between the first terminal device 101, the second terminal device 102, the third terminal device 103, and the server 105. The network 104 may include various connection types, such as wired and / or wireless communication links, etc.
[0070] The user may use the first terminal device 101, the second terminal device 102, and the third terminal device 103 to interact with the server 105 through the network 104 to receive or send messages, etc. Various communication client applications may be installed on the first terminal device 101, the second terminal device 102, and the third terminal device 103, such as shopping applications, web browser applications, search applications, instant messaging tools, email clients, and / or social platform software, etc. (only for example).
[0071] The first terminal device 101, the second terminal device 102, and the third terminal device 103 may be various electronic devices having display screens and supporting web browsing, including but not limited to smart phones, tablet computers, laptop computers, desktop computers, and the like.
[0072] The server 105 may be a server that provides various services, such as a background management server (only as an example) that provides support for websites browsed by users using the first terminal device 101, the second terminal device 102, and the third terminal device 103. The background management server may analyze and process the received data such as user requests, and feed back the processing results (such as web pages, information, or data obtained or generated according to user requests) to the terminal device.
[0073] It should be noted that the magnetic circuit structure analysis method provided in the embodiment of the present application can generally be executed by the server 105. Accordingly, the magnetic circuit structure analysis device provided in the embodiment of the present application can generally be arranged in the server 105. The magnetic circuit structure analysis method provided in the embodiment of the present application can also be executed by a server or server cluster that is different from the server 105 and can communicate with the first terminal device 101, the second terminal device 102, the third terminal device 103 and / or the server 105. Correspondingly, the magnetic circuit structure analysis device provided in the embodiment of the present application can also be arranged in a server or server cluster that is different from the server 105 and can communicate with the first terminal device 101, the second terminal device 102, the third terminal device 103 and / or the server 105. Alternatively, the magnetic circuit structure analysis method provided in the embodiment of the present application can also be performed by the first terminal device 101, the second terminal device 102 or the third terminal device 103, or can also be performed by other terminal devices that are different from the first terminal device 101, the second terminal device 102 or the third terminal device 103. Correspondingly, the magnetic circuit structure analysis device provided in the embodiment of the present application can also be set in the first terminal device 101, the second terminal device 102 or the third terminal device 103, or in other terminal devices different from the first terminal device 101, the second terminal device 102 or the third terminal device 103.
[0074] It should be understood that Figure 1The number of terminal devices, networks and servers in the embodiment is only . According to the implementation requirements, there can be any number of terminal devices, networks and servers.
[0075] Figure 2 A flow chart of a magnetic circuit structure analysis method according to an embodiment of the present application is shown.
[0076] like Figure 2 As shown, the magnetic circuit structure analysis method for the MHD angular velocity sensor element includes operations S201-S204.
[0077] In operation S201, in response to a magnetic circuit analysis instruction, a magnetic circuit structure parameter of a magnetic circuit structure diagram of an MHD angular velocity sensor element corresponding to the magnetic circuit analysis instruction is acquired from a target database;
[0078] In operation S202, based on Kirchhoff's law of magnetic circuit, a processor is used to generate a first relational expression, a second relational expression and a constitutive relational expression according to the magnetic circuit structural parameters, wherein the first relational expression represents the relationship between the average magnetic induction intensity of the air gap where the conductive fluid ring is located in the MHD angular velocity sensor element and the magnetic circuit structural parameters, the second relational expression represents the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structural parameters, and the constitutive relational expression represents the relationship between the permanent magnet and the air gap in the MHD angular velocity sensor element;
[0079] In operation S203, a magnetic flux leakage coefficient is generated according to the magnetic circuit structure parameters;
[0080] In operation S204, based on the magnetic leakage coefficient, magnetic induction intensity distribution data is generated according to the first relationship expression, the second relationship expression and the constitutive relationship expression, wherein the magnetic induction intensity distribution data represents the magnetic induction intensity distribution relationship of the air gap where the conductive fluid ring is located.
[0081] According to an embodiment of the present application, the magnetic circuit analysis instruction can be generated by a staff member performing a corresponding operation on an electronic device, and the electronic device responds to the operation.
[0082] According to the embodiment of the present application, the target database may store magnetic circuit structure diagrams and magnetic circuit structure parameters of various MHD angular velocity sensor elements, and the magnetic circuit structure parameters include the magnetic induction intensity of the permanent magnet working point , permanent magnet radius , the average magnetic induction intensity of the working air gap of the conductive fluid ring , the working air gap area where the conductive fluid ring is located , Conductive fluid ring height , Inner radius of conductive fluid ring , the outer radius of the conductive fluid ring , permanent magnet working point The corresponding magnetic field strength , Height of cylindrical permanent magnet , residual magnetic induction intensity , Reverse Permeability wait.
[0083] According to an embodiment of the present application, Kirchhoff's law of magnetic circuit is an important law in electromagnetism, which is used to analyze the relationship between current and magnetic flux in a magnetic circuit.
[0084] According to an embodiment of the present application, the processor processes the magnetic circuit structure parameters based on Kirchhoff's law of magnetic circuit, and can obtain a first relationship expression characterizing the relationship between the average magnetic induction intensity of the air gap where the conductive fluid ring is located in the MHD angular velocity sensor element and the magnetic circuit structure parameters, a second relationship expression characterizing the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structure parameters, and a constitutive relationship expression characterizing the relationship between the permanent magnet and the air gap in the MHD angular velocity sensor element.
[0085] According to an embodiment of the present application, a processor is used to generate a leakage magnetic coefficient according to the magnetic circuit structure parameters, and the leakage magnetic coefficient, the first relationship expression, the second relationship expression and the constitutive relationship expression are jointly solved to obtain magnetic induction intensity distribution data that characterizes the magnetic induction intensity distribution relationship of the air gap where the conductive fluid ring is located.
[0086] According to the embodiments of the present application, based on Kirchhoff's law of the magnetic circuit and according to the magnetic circuit structure parameters, a first relationship expression characterizing the relationship between the average magnetic induction intensity of the air gap where the conductive fluid ring is located in the MHD angular velocity sensor element and the magnetic circuit structure parameters, a second relationship expression characterizing the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structure parameters, and a constitutive relationship expression characterizing the relationship between the permanent magnet and the air gap in the MHD angular velocity sensor element are generated. At the same time, according to the magnetic circuit structure parameters, a leakage magnetic coefficient is generated, so that it is convenient to generate magnetic induction intensity distribution data according to the leakage magnetic coefficient, the first relationship expression, the second relationship expression and the constitutive relationship expression, so that the magnetic induction intensity distribution of the conductive fluid ring area in the sensor element can be accurately and conveniently calculated, thereby guiding the preliminary design of the magnetic circuit structure and material parameters of the sensor element, and greatly shortening the research and development cycle of the MHD angular velocity sensor.
[0087] Figure 3 A schematic diagram of the magnetic circuit structure of a sensor element according to an embodiment of the present application is shown. Figure 4 A simplified magnetic circuit structure schematic diagram of a sensor element according to an embodiment of the present application is shown. Figure 5 A schematic diagram of a magnetic circuit structure for parameter extraction according to an embodiment of the present application is shown.
[0088] According to an embodiment of the present application, the magnetic circuit structure parameters are generated in the following manner:
[0089] The magnetic circuit structure diagram is simplified based on the sensitive axis symmetry and the central plane symmetry to obtain a simplified magnetic circuit structure diagram;
[0090] Parameters of the simplified magnetic circuit structure diagram are extracted to obtain the magnetic circuit structure parameters.
[0091] According to the embodiment of the present application, the sensitive axis symmetry and the central plane symmetry are used to Figure 3 The magnetic circuit structure diagram of the sensor element shown in the figure is simplified to obtain the following Figure 4 The simplified magnetic circuit structure diagram shown in the figure is then Figure 5 The magnetic circuit structure parameters can be obtained by extracting the parameters of the magnetic circuit structure diagram shown.
[0092] According to an embodiment of the present application, based on Kirchhoff's law of magnetic circuit, a processor is used to generate a first relational expression, a second relational expression and a constitutive relational expression according to magnetic circuit structure parameters, including:
[0093] Based on Kirchhoff's first law of magnetic circuit and according to magnetic circuit structure parameters, a first relational expression is generated;
[0094] Based on Kirchhoff's second law of magnetic circuit and according to the magnetic circuit structure parameters, a second relational expression is generated;
[0095] According to the magnetic circuit structure parameters, the constitutive relationship expression is generated.
[0096] According to an embodiment of the present application, Kirchhoff's first law of magnetic circuit: when the magnetic circuit is a branch magnetic circuit, the algebraic sum of the magnetic flux passing through the junction of different cross-sections in the magnetic circuit is equal to zero.
[0097] According to an embodiment of the present application, Kirchhoff's second law of magnetic circuit: in a magnetic circuit, the magnetomotive force of the loop is equal to the total current interconnected with the loop.
[0098] According to an embodiment of the present application, based on Kirchhoff's first law of magnetic circuit and according to magnetic circuit structure parameters, a first relational expression is generated, as shown in formula (1):
[0099] (1)
[0100] in, is the magnetic induction intensity of the permanent magnet working point, is the magnetic pole area of the permanent magnet, is the permanent magnet radius, is the average magnetic induction intensity of the working air gap of the conductive fluid ring, is the working air gap area where the conductive fluid ring is located, is the height of the conductive fluid ring, is the inner radius of the conductive fluid ring, is the outer radius of the conductive fluid ring, is the magnetic leakage coefficient.
[0101] According to an embodiment of the present application, based on Kirchhoff's second law of magnetic circuit, according to the magnetic circuit structure parameters, a second relational expression is generated, as shown in formula (2):
[0102] (2)
[0103] in, is the permanent magnet operating point The corresponding magnetic field strength, is the height of the cylindrical permanent magnet, is the average magnetic field strength of the working air gap where the conductive fluid ring is located, is the working air gap length, is the magnetoresistance coefficient.
[0104] According to an embodiment of the present application, the constitutive relationship expression of the permanent magnet and the air gap is determined according to the magnetic circuit structure parameters, as shown in formula (3):
[0105] (3)
[0106] in, is the residual magnetic induction intensity, To recover the magnetic permeability, the air gap region is given by the constitutive relation Characterization, where is the magnetic permeability of vacuum.
[0107] According to the embodiments of the present application, according to Figure 5 The specific magnetic circuit structure parameters of the sensor element shown are used to determine the paths of the total magnetic flux, working magnetic flux and leakage magnetic flux, and to estimate the leakage magnetic coefficient. The total magnetic flux in the magnetic circuit It is mainly composed of two parts: the blue line loop and the red line loop. The former represents the main leakage magnetic loop, and its magnetic flux is recorded as , the latter represents the working magnetic flux loop passing through the conductive fluid ring, and its magnetic flux is recorded as , then the magnetic flux leakage coefficient It can be estimated by formula (4):
[0108] (4)
[0109] in, is the permanent magnet radius, is the outer radius of the conductive fluid ring, is the working air gap area where the conductive fluid ring is located, is the height of the conductive fluid ring, is the inner radius of the conductive fluid ring.
[0110] According to an embodiment of the present application, based on the magnetic leakage coefficient, according to the first relationship expression, the second relationship expression and the constitutive relationship expression, magnetic induction intensity distribution data is generated, including:
[0111] Generate a set of functions to be solved according to the first relational expression, the second relational expression and the constitutive relational expression;
[0112] The magnetic flux density distribution data is generated according to the magnetic leakage coefficient and the function set to be solved.
[0113] Figure 6 A schematic diagram of solving the magnetic induction intensity distribution of the air gap where the conductive fluid ring is located according to an embodiment of the present application is shown.
[0114] According to an embodiment of the present application, magnetic induction intensity distribution data is generated according to the magnetic leakage coefficient and the function set to be solved, including:
[0115] Substitute the magnetic leakage coefficient into the function set to be solved to obtain the target expression;
[0116] According to the target expression and magnetic circuit structure parameters, the following is generated: Figure 6 The magnetic induction intensity distribution function shown, wherein the magnetic induction intensity distribution function represents the magnetic induction intensity distribution data.
[0117] According to an embodiment of the present application, the target expression is shown in formula (5):
[0118] (5)
[0119] in, is the average magnetic induction intensity of the working air gap of the conductive fluid ring, is the residual magnetic induction intensity, is the height of the cylindrical permanent magnet, is the permanent magnet radius, is the magnetic flux leakage coefficient, is the height of the conductive fluid ring, is the inner radius of the conductive fluid ring, is the outer radius of the conductive fluid ring, is the recovery magnetic permeability.
[0120] According to an embodiment of the present application, the magnetic induction intensity distribution function is shown in formula (6):
[0121] (6)
[0122] in, is the magnetic induction intensity vector in the conductive fluid ring, is the distribution function of magnetic induction intensity in the conductive fluid, is the radial basis vector in the cylindrical coordinate system, is the average radius of the conductive fluid ring, is the radial coordinate of the target point inside the conductive fluid ring.
[0123] Figure 7 A block diagram of a magnetic circuit structure analysis device according to an embodiment of the present application is shown.
[0124] like Figure 7 As shown, the magnetic circuit structure analysis device 700 for the MHD angular velocity sensor element includes an acquisition module 710 , a first generation module 720 , a second generation module 730 , and a third generation module 740 .
[0125] An acquisition module 710 is used to acquire, in response to a magnetic circuit analysis instruction, magnetic circuit structure parameters of a magnetic circuit structure diagram of an MHD angular velocity sensor element corresponding to the magnetic circuit analysis instruction from a target database;
[0126] A first generating module 720 is used to generate a first relational expression, a second relational expression and a constitutive relational expression based on Kirchhoff's law of magnetic circuit and magnetic circuit structural parameters using a processor, wherein the first relational expression represents the relationship between the average magnetic induction intensity of the air gap where the conductive fluid ring is located in the MHD angular velocity sensor element and the magnetic circuit structural parameters, the second relational expression represents the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structural parameters, and the constitutive relational expression represents the relationship between the permanent magnet and the air gap in the MHD angular velocity sensor element;
[0127] The second generating module 730 is used to generate a magnetic leakage coefficient according to the magnetic circuit structure parameters;
[0128] The third generation module 740 is used to generate magnetic induction intensity distribution data based on the leakage magnetic coefficient, according to the first relationship expression, the second relationship expression and the constitutive relationship expression, wherein the magnetic induction intensity distribution data represents the magnetic induction intensity distribution relationship of the air gap where the conductive fluid ring is located.
[0129] According to the embodiments of the present application, based on Kirchhoff's law of the magnetic circuit and according to the magnetic circuit structure parameters, a first relationship expression characterizing the relationship between the average magnetic induction intensity of the air gap where the conductive fluid ring is located in the MHD angular velocity sensor element and the magnetic circuit structure parameters, a second relationship expression characterizing the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structure parameters, and a constitutive relationship expression characterizing the relationship between the permanent magnet and the air gap in the MHD angular velocity sensor element are generated. At the same time, according to the magnetic circuit structure parameters, a leakage magnetic coefficient is generated, so that it is convenient to generate magnetic induction intensity distribution data according to the leakage magnetic coefficient, the first relationship expression, the second relationship expression and the constitutive relationship expression, so that the magnetic induction intensity distribution of the conductive fluid ring area in the sensor element can be accurately and conveniently calculated, thereby guiding the preliminary design of the magnetic circuit structure and material parameters of the sensor element, and greatly shortening the research and development cycle of the MHD angular velocity sensor.
[0130] According to an embodiment of the present application, magnetic circuit structure parameters are generated by a simplification unit and an extraction unit.
[0131] A simplification unit is used to simplify the magnetic circuit structure diagram based on the sensitive axis symmetry and the central plane symmetry to obtain a simplified magnetic circuit structure diagram;
[0132] The extraction unit is used to extract parameters from the simplified magnetic circuit structure diagram to obtain magnetic circuit structure parameters.
[0133] According to an embodiment of the present application, the first generation module 720 includes a first generation unit, a second generation unit, and a third generation unit.
[0134] A first generating unit is used to generate a first relational expression based on Kirchhoff's first law of magnetic circuit and magnetic circuit structural parameters;
[0135] A second generating unit is used to generate a second relational expression based on Kirchhoff's second law of magnetic circuit and magnetic circuit structural parameters;
[0136] The third generating unit is used to generate a constitutive relationship expression according to the magnetic circuit structure parameters.
[0137] According to an embodiment of the present application, the third generation module 740 includes a fourth generation unit and a fifth generation unit.
[0138] A fourth generating unit, used for generating a set of functions to be solved according to the first relational expression, the second relational expression and the constitutive relational expression;
[0139] The fifth generating unit is used to generate magnetic induction intensity distribution data according to the magnetic leakage coefficient and the function set to be solved.
[0140] According to an embodiment of the present application, the fifth generation unit includes a substitution subunit and a solution subunit.
[0141] Substitution subunit is used to substitute the magnetic leakage coefficient into the function set to be solved to obtain the target expression;
[0142] The solving subunit is used to generate a magnetic induction intensity distribution function according to a target expression and magnetic circuit structure parameters, wherein the magnetic induction intensity distribution function represents the magnetic induction intensity distribution data.
[0143] According to the embodiments of the present application, any one or more of the modules, units, and sub-units, or at least part of the functions of any one of them, can be implemented in one module. According to the embodiments of the present application, any one or more of the modules, units, and sub-units can be split into multiple modules for implementation. According to the embodiments of the present application, any one or more of the modules, units, and sub-units can be at least partially implemented as hardware circuits, such as field programmable gate arrays (FPGAs), programmable logic arrays (PLAs), systems on chips, systems on substrates, systems on packages, application-specific integrated circuits (ASICs), or can be implemented by hardware or firmware in any other reasonable way of integrating or packaging the circuit, or in any one of the three implementation methods of software, hardware, and firmware, or in any appropriate combination of any of them. Alternatively, according to the embodiments of the present application, one or more of the modules, units, and sub-units can be at least partially implemented as computer program modules, and when the computer program modules are run, the corresponding functions can be executed.
[0144] For example, any multiple of the acquisition module 710, the first generation module 720, the second generation module 730, and the third generation module 740 can be combined in one module / unit / sub-unit for implementation, or any one of the modules / units / sub-units can be split into multiple modules / units / sub-units. Alternatively, at least part of the functions of one or more of these modules / units / sub-units can be combined with at least part of the functions of other modules / units / sub-units and implemented in one module / unit / sub-unit. According to an embodiment of the present application, at least one of the acquisition module 710, the first generation module 720, the second generation module 730, and the third generation module 740 can be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on a chip, a system on a substrate, a system on a package, an application specific integrated circuit (ASIC), or can be implemented by hardware or firmware such as any other reasonable way of integrating or packaging the circuit, or by any one of the three implementation methods of software, hardware, and firmware, or by a suitable combination of any of them. Alternatively, at least one of the acquisition module 710 , the first generation module 720 , the second generation module 730 , and the third generation module 740 may be at least partially implemented as a computer program module, and when the computer program module is executed, a corresponding function may be executed.
[0145] It should be noted that the magnetic circuit structure analysis device part in the embodiment of the present application corresponds to the magnetic circuit structure analysis method part in the embodiment of the present application. The description of the magnetic circuit structure analysis device part specifically refers to the magnetic circuit structure analysis method part, which will not be repeated here.
[0146] Figure 8 A block diagram of an electronic device suitable for implementing the method described above according to an embodiment of the present application is shown. Figure 8 The electronic device shown is merely an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.
[0147] like Figure 8 As shown, the electronic device 800 according to an embodiment of the present application includes a processor 801, which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) 802 or a program loaded from a storage part 808 to a random access memory (RAM) 803. The processor 801 may include, for example, a general-purpose microprocessor (such as a CPU), an instruction set processor and / or a related chipset and / or a dedicated microprocessor (for example, an application-specific integrated circuit (ASIC)), etc. The processor 801 may also include an onboard memory for caching purposes. The processor 801 may include a single processing unit or multiple processing units for performing different actions of the method flow according to an embodiment of the present application.
[0148] In RAM 803, various programs and data required for the operation of electronic device 800 are stored. Processor 801, ROM 802 and RAM 803 are connected to each other via bus 804. Processor 801 performs various operations of the method flow according to the embodiment of the present application by executing the program in ROM 802 and / or RAM 803. It should be noted that the program can also be stored in one or more memories other than ROM 802 and RAM 803. Processor 801 can also perform various operations of the method flow according to the embodiment of the present application by executing the program stored in the one or more memories.
[0149] According to an embodiment of the present application, the electronic device 800 may further include an input / output (I / O) interface 805, which is also connected to the bus 804. The electronic device 800 may further include one or more of the following components connected to the input / output (I / O) interface 805: an input portion 806 including a keyboard, a mouse, etc.; an output portion 807 including a cathode ray tube (CRT), a liquid crystal display (LCD), etc., and a speaker, etc.; a storage portion 808 including a hard disk, etc.; and a communication portion 809 including a network interface card such as a LAN card, a modem, etc. The communication portion 809 performs communication processing via a network such as the Internet. A drive 810 is also connected to the input / output (I / O) interface 805 as needed. A removable medium 811, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed on the drive 810 as needed, so that the computer program read therefrom is installed into the storage portion 808 as needed.
[0150] According to an embodiment of the present application, the method flow according to the embodiment of the present application can be implemented as a computer software program. For example, an embodiment of the present application includes a computer program product, which includes a computer program carried on a computer-readable storage medium, and the computer program includes a program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from the network through the communication part 809, and / or installed from the removable medium 811. When the computer program is executed by the processor 801, the above-mentioned functions defined in the system of the embodiment of the present application are executed. According to an embodiment of the present application, the system, equipment, device, module, unit, etc. described above can be implemented by a computer program module.
[0151] The present application also provides a computer-readable storage medium, which may be included in the device / apparatus / system described in the above embodiments; or may exist independently without being assembled into the device / apparatus / system. The above computer-readable storage medium carries one or more programs, and when the above one or more programs are executed, the method according to the embodiment of the present application is implemented.
[0152] According to an embodiment of the present application, the computer-readable storage medium may be a non-volatile computer-readable storage medium. For example, it may include, but is not limited to: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present application, a computer-readable storage medium may be any tangible medium containing or storing a program that may be used by or in combination with an instruction execution system, apparatus, or device.
[0153] For example, according to an embodiment of the present application, the computer-readable storage medium may include the ROM 802 and / or the RAM 803 described above and / or one or more memories other than the ROM 802 and the RAM 803 .
[0154] An embodiment of the present application also includes a computer program product, which includes a computer program, which contains program code for executing the method provided by the embodiment of the present application. When the computer program product runs on an electronic device, the program code is used to enable the electronic device to implement the method provided by the embodiment of the present application.
[0155] When the computer program is executed by the processor 801, the above functions defined in the system / device of the embodiment of the present application are executed. According to the embodiment of the present application, the system, device, module, unit, etc. described above can be implemented by a computer program module.
[0156] In one embodiment, the computer program may rely on tangible storage media such as optical storage devices, magnetic storage devices, etc. In another embodiment, the computer program may also be transmitted and distributed in the form of signals on a network medium, and downloaded and installed through the communication part 809, and / or installed from a removable medium 811. The program code contained in the computer program may be transmitted using any appropriate network medium, including but not limited to: wireless, wired, etc., or any suitable combination of the above.
[0157] According to an embodiment of the present application, the program code for executing the computer program provided by the embodiment of the present application can be written in any combination of one or more programming languages, and specifically, these computing programs can be implemented using high-level process and / or object-oriented programming languages, and / or assembly / machine languages. Programming languages include, but are not limited to, such as Java, C++, python, "C" language or similar programming languages. The program code can be executed entirely on the user computing device, partially on the user device, partially on the remote computing device, or completely on the remote computing device or server. In the case of a remote computing device, the remote computing device can be connected to the user computing device through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computing device (e.g., using an Internet service provider to connect through the Internet).
[0158] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architecture, functions and operations of the systems, methods and computer program products according to various embodiments of the present application. In this regard, each box in the flowchart or block diagram may represent a module, a program segment, or a part of a code, and the above-mentioned module, program segment, or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box may also occur in a different order from the order marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they may sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flowchart, and the combination of the boxes in the block diagram or flowchart, can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions. It will be appreciated by those skilled in the art that the features recorded in the various embodiments of the present application can be combined and / or combined in a variety of ways, even if such a combination or combination is not clearly recorded in the present application. In particular, without departing from the spirit and teachings of the present application, the features described in the various embodiments of the present application may be combined and / or combined in a variety of ways. All of these combinations and / or combinations fall within the scope of the present application.
[0159] The embodiments of the present application are described above. However, these embodiments are only for the purpose of illustration, and are not intended to limit the scope of the present application. Although each embodiment is described above, this does not mean that the measures in each embodiment cannot be used in combination advantageously. Without departing from the scope of the present application, those skilled in the art may make a variety of substitutions and modifications, which should all fall within the scope of the present application.
Claims
1. A magnetic circuit structure analysis method for an MHD angular velocity sensor element, characterized in that: include: In response to a magnetic circuit analysis instruction, obtaining magnetic circuit structure parameters of a magnetic circuit structure diagram of an MHD angular velocity sensor element corresponding to the magnetic circuit analysis instruction from a target database; Based on Kirchhoff's law of magnetic circuit, a processor is used to generate a first relational expression, a second relational expression and a constitutive relational expression according to the magnetic circuit structural parameters, wherein the first relational expression represents the relationship between the average magnetic induction intensity of the air gap where the conductive fluid ring in the MHD angular velocity sensor element is located and the magnetic circuit structural parameters, the second relational expression represents the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structural parameters, and the constitutive relational expression represents the relationship between the permanent magnet in the MHD angular velocity sensor element and the air gap; generating a magnetic leakage coefficient according to the magnetic circuit structure parameters; Based on the magnetic leakage coefficient, magnetic induction intensity distribution data is generated according to the first relationship expression, the second relationship expression and the constitutive relationship expression, wherein the magnetic induction intensity distribution data characterizes the magnetic induction intensity distribution relationship of the air gap where the conductive fluid ring is located.
2. The method according to claim 1, characterized in that: The magnetic circuit structure parameters are generated in the following way: Simplifying the magnetic circuit structure diagram based on the sensitive axis symmetry and the central plane symmetry to obtain a simplified magnetic circuit structure diagram; Parameters are extracted from the simplified magnetic circuit structure diagram to obtain the magnetic circuit structure parameters.
3. The method according to claim 1 or 2, characterized in that: Based on Kirchhoff's law of magnetic circuit, a processor is used to generate a first relational expression, a second relational expression and a constitutive relational expression according to the magnetic circuit structure parameters, including: Based on Kirchhoff's first law of magnetic circuit, generating the first relational expression according to the magnetic circuit structure parameters; Based on Kirchhoff's second law of magnetic circuit, generating the second relational expression according to the magnetic circuit structure parameters; The constitutive relationship expression is generated according to the magnetic circuit structure parameters.
4. The method according to claim 3, characterized in that The first relational expression is shown in formula (1), the second relational expression is shown in formula (2), and the constitutive relational expression is shown in formula (3): (1) in, is the magnetic induction intensity of the permanent magnet working point, is the magnetic pole area of the permanent magnet, is the permanent magnet radius, is the average magnetic induction intensity of the working air gap of the conductive fluid ring, is the working air gap area where the conductive fluid ring is located, is the height of the conductive fluid ring, is the inner radius of the conductive fluid ring, is the outer radius of the conductive fluid ring, is the magnetic flux leakage coefficient; (2) in, is the permanent magnet operating point The corresponding magnetic field strength, is the height of the cylindrical permanent magnet, is the average magnetic field strength of the working air gap where the conductive fluid ring is located, is the working air gap length, is the magnetoresistance coefficient; (3) in, is the residual magnetic induction intensity, To recover the magnetic permeability, the air gap region is given by the constitutive relation Characterization, where is the magnetic permeability of vacuum.
5. The method according to claim 1, characterized in that The magnetic flux leakage coefficient As shown in formula (4): (4) Among them, the total magnetic flux in the magnetic circuit It is mainly composed of two parts: the main leakage magnetic circuit and the working magnetic flux circuit. The magnetic flux of the main leakage magnetic circuit is recorded as , the working magnetic flux loop represents the magnetic flux loop passing through the conductive fluid ring, and its magnetic flux is recorded as , is the permanent magnet radius, is the outer radius of the conductive fluid ring, is the working air gap area where the conductive fluid ring is located, is the height of the conductive fluid ring, is the inner radius of the conductive fluid ring.
6. The method according to claim 1, characterized in that Based on the magnetic leakage coefficient, according to the first relational expression, the second relational expression and the constitutive relational expression, magnetic induction intensity distribution data is generated, including: Generate a set of functions to be solved according to the first relational expression, the second relational expression and the constitutive relational expression; The magnetic induction intensity distribution data is generated according to the magnetic leakage coefficient and the set of functions to be solved.
7. The method according to claim 6, characterized in that Generating the magnetic induction intensity distribution data according to the magnetic leakage coefficient and the set of functions to be solved, including: Substituting the magnetic leakage coefficient into the function set to be solved to obtain a target expression; A magnetic induction intensity distribution function is generated according to the target expression and the magnetic circuit structure parameters, wherein the magnetic induction intensity distribution function represents the magnetic induction intensity distribution data.
8. The method according to claim 7, characterized in that The target expression is shown in formula (5): (5) in, is the average magnetic induction intensity of the working air gap of the conductive fluid ring, is the residual magnetic induction intensity, is the height of the cylindrical permanent magnet, is the permanent magnet radius, is the magnetic flux leakage coefficient, is the height of the conductive fluid ring, is the inner radius of the conductive fluid ring, is the outer radius of the conductive fluid ring, is the recovery permeability, is the magnetoresistance coefficient.
9. The method according to claim 8, characterized in that The magnetic induction intensity distribution function is shown in formula (6): (6) in, is the magnetic induction intensity vector in the conductive fluid ring, is the distribution function of magnetic induction intensity in the conductive fluid, is the radial basis vector in the cylindrical coordinate system, is the average radius of the conductive fluid ring, is the radial coordinate of the target point inside the conductive fluid ring.
10. A magnetic circuit structure analysis device for an MHD angular velocity sensor element, characterized in that: include: an acquisition module, configured to acquire, in response to a magnetic circuit analysis instruction, magnetic circuit structure parameters of a magnetic circuit structure diagram of an MHD angular velocity sensor element corresponding to the magnetic circuit analysis instruction from a target database; A first generating module is used to generate a first relational expression, a second relational expression and a constitutive relational expression according to the magnetic circuit structural parameters using a processor based on Kirchhoff's law of magnetic circuit, wherein the first relational expression represents the relationship between the average magnetic induction intensity of the air gap where the conductive fluid ring in the MHD angular velocity sensor element is located and the magnetic circuit structural parameters, the second relational expression represents the relationship between the average magnetic field intensity of the air gap where the conductive fluid ring is located and the magnetic circuit structural parameters, and the constitutive relational expression represents the relationship between the permanent magnet in the MHD angular velocity sensor element and the air gap; A second generating module is used to generate a magnetic flux leakage coefficient according to the magnetic circuit structure parameters; The third generating module is used to generate magnetic induction intensity distribution data based on the leakage magnetic coefficient, according to the first relationship expression, the second relationship expression and the constitutive relationship expression, wherein the magnetic induction intensity distribution data represents the magnetic induction intensity distribution relationship of the air gap where the conductive fluid ring is located.
Citation Information
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