Antenna spherical near-field test method and system based on electronic control multiple probes

Through the electronically controlled multi-probe technology, the beam is synthesized in the spherical near-field test of antennas, and the problems of limited number of probes and slow mechanical movement speed in the prior art are solved, achieving high-precision and high-efficiency testing.

CN119125692APending Publication Date: 2024-12-13CHINA ELECTRONIS TECH INSTR CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
CN202411236219.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-09-04
Publication Date
2024-12-13

AI Technical Summary

Technical Problem

In the existing spherical near-field test of antennas, the number of probes on the arc frame is limited and the minimum probe spacing is limited, resulting in low test accuracy, slow mechanical shaft movement speed, and position errors are introduced, affecting the testing efficiency, accuracy and accuracy.

Method used

The electronically controlled multi-probe technology is used to synthesize beams without mechanical operation, and the equivalent transmission direction is achieved through frequency and phase control, avoid mechanical errors, and improve testing accuracy and efficiency.

Benefits of technology

The equivalent emission pointing angle interval can be arbitrarily small, which improves the test accuracy and speed, avoids mechanical errors, and improves the test efficiency and accuracy.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN119125692A_ABST
    Figure CN119125692A_ABST
Patent Text Reader

Abstract

The invention belongs to the technical field of antenna spherical surface near-field testing, and provides an antenna spherical surface near-field testing method and system based on electric control multiple probes, and the method comprises the steps: obtaining an antenna spherical surface near-field testing scene and testing demands, generating a test sequence comprising a frequency control sequence and a wave position control sequence; controlling the frequency of the microwave signal output by each probe, so that the frequency of the microwave signal output by each probe at the same moment is the same; for each specific frequency point, controlling the amplitude and phase of the microwave signal output by each probe; performing beam forming to obtain an equivalent emission pointing beam under a specific frequency point, and performing radiation of a tested target antenna in sequence to complete antenna spherical near-field testing of the tested target under the specific frequency point; and the frequency is changed through the frequency control sequence, and the antenna spherical near-field test of the tested target under different frequency points meeting the test scene and the test requirement is realized.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] The invention belongs to the technical field of antenna spherical near-field testing, and in particular relates to an antenna spherical near-field testing method and system based on electrically controlled multi-probes. Background Art

[0002] The statements in this section merely provide background information related to the present invention and do not necessarily constitute prior art.

[0003] During the spherical near-field test of an antenna, the antenna under test is usually placed at the center of the sphere, and the probe or probe array is placed on the spherical surface at a specific distance from the center of the sphere. Through the relative movement of the antenna under test and the probe / probe array, the data is processed by the host computer to obtain the equivalent electromagnetic signal radiated by the antenna under test to various positions on the spherical surface. The spherical surface and the center of the sphere are only used to represent relative positions in space and do not necessarily exist as entities.

[0004] In the existing antenna spherical near-field test, a structural form combining azimuth and pitch swing arms, or azimuth and arc frame can be used to complete spherical scanning. In the structural form combining azimuth and pitch swing arms, the antenna under test is placed on the azimuth axis of the turntable, the azimuth axis of the turntable is perpendicular to the ground, the probe is placed on the pitch swing arm, the pitch axis is parallel to the ground and intersects with the antenna under test, and the plane formed by the probe movement trajectory is perpendicular to the ground. In the structural form combining azimuth and arc frame, the antenna under test is placed on the azimuth axis of the turntable, the azimuth axis of the turntable is perpendicular to the ground, the probe array is placed on an arc frame with the antenna under test as the center, and the plane formed by the arc frame is perpendicular to the ground.

[0005] According to the inventors, the number of probes on the arc frame is limited and the minimum probe spacing is restricted, so the accuracy of the antenna spherical near-field test is often not high; in addition, due to the slow mechanical movement speed of mechanical axes such as azimuth and pitch arms, and the limited minimum movement step, the mechanical processing technology and the motion control of the motor will introduce position errors in the measurement results, ultimately affecting the test efficiency, test precision and test accuracy. Summary of the invention

[0006] In order to solve the above problems, the present invention proposes a spherical near-field test method and system for antennas based on electrically controlled multi-probes, which adopts electronic control means to synthesize beams without the need for mechanical operation, thereby achieving rapid movement of equivalent emission pointing, avoiding mechanical errors, and improving test accuracy, test speed, and test efficiency.

[0007] According to some embodiments, a first solution of the present invention provides a spherical near-field test method for an antenna based on an electrically controlled multi-probe, using the following technical solution:

[0008] An antenna spherical near-field testing method based on an electrically controlled multi-probe comprises:

[0009] Obtain antenna spherical near-field test scenarios and test requirements;

[0010] Generate a test sequence including a frequency control sequence and a wave position control sequence according to the acquired test scenario and test requirements;

[0011] Based on the generated frequency control sequence, the frequencies of the microwave signals output by each probe are controlled so that the frequencies of the microwave signals output by each probe at the same time are the same;

[0012] Based on the generated wave position control sequence, the amplitude and phase of the microwave signal output by each probe are controlled for each specific frequency point;

[0013] The amplitude and phase of the microwave signals of multiple probes are beam synthesized to obtain an equivalent transmission pointing beam at a specific frequency point;

[0014] Based on the equivalent transmission pointing beam obtained at the specific frequency point, the antenna of the target under test is radiated in turn to complete the antenna spherical near field test of the target under test at the specific frequency point;

[0015] By changing the frequency through the frequency control sequence, the antenna spherical near field test of the target under test can be achieved at different frequency points that meet the test scenarios and test requirements.

[0016] It should be noted that the equivalent transmission pointing beam realized by multiple probes is equivalent to the radiation from a single probe at the equivalent transmission pointing position (the actual single probe does not necessarily exist) to the antenna of the target under test; the change of the equivalent transmission pointing beam at a specific frequency point is equivalent to the radiation from each single probe at different equivalent transmission pointing positions (these probes do not necessarily exist) to the antenna of the target under test in turn, thereby completing the antenna spherical near field test of the target under test at the specific frequency point.

[0017] As a further technical limitation, based on the generated frequency control sequence, the microwave signal generation and receiving circuit is controlled to switch the test frequency at each test point; according to the generated wave position control sequence, the attenuation value and phase shift value of the microwave signal reaching each probe are controlled at each test point to achieve control of the amplitude and phase of the microwave signal output by each probe.

[0018] As a further technical limitation, the multiple probes are arranged on a spherical surface at equal intervals, and the target to be measured is arranged at the center of the spherical surface.

[0019] As a further technical limitation, the obtained equivalent transmitting directional beam at a specific frequency point is equivalent to the beam radiated to the antenna under test by a single probe at a specific position on the sphere (the single probe does not necessarily exist in reality). Combined with the generated test sequence, the frequency switching and amplitude and phase control of the antenna under test are performed at each test point, and the equivalent transmitting directional beams at each test frequency point are output in sequence based on the test requirements. That is, the single probe at each position on the sphere is used to radiate the target antenna under test in turn, thereby completing the spherical near-field test of the antenna of the target under test.

[0020] As a further technical limitation, each frequency test point and each equivalent transmission beam pointing required in the antenna spherical near-field test are obtained to obtain the test scenario and test requirements; and a frequency control sequence is generated according to the obtained test scenario and frequency test point test requirements.

[0021] Furthermore, according to the obtained test requirements of the frequency test points, a wave position control sequence for each test frequency point is generated based on the amplitude and phase electrically controlled multi-element method; tests are performed according to each frequency point and each equivalent transmitting beam pointing, and the total frequency control sequence and the total wave position control sequence are obtained respectively to generate a test sequence.

[0022] According to some embodiments, a second solution of the present invention provides an antenna spherical near-field test system based on an electrically controlled multi-probe, which adopts the following technical solution:

[0023] An antenna spherical near-field test system based on an electrically controlled multi-probe, comprising:

[0024] An acquisition module, configured to acquire antenna spherical near-field test scenarios and test requirements;

[0025] A generating module, configured to generate a test sequence including a frequency control sequence and a wave position control sequence according to the acquired test scenario and test requirements;

[0026] A control module configured to control the frequencies of the microwave signals output by each probe based on the generated frequency control sequence, so that the frequencies of the microwave signals output by each probe at the same time are the same;

[0027] An execution module is configured to control the amplitude and phase of the microwave signals output by each probe for each specific frequency point based on the generated wave position control sequence; the amplitudes and phases of the microwave signals of multiple probes are synthesized by beamforming to obtain an equivalent transmission pointing beam at a specific frequency point;

[0028] The test module is configured to radiate the antenna of the target under test in sequence based on the equivalent transmission pointing beam obtained at the specific frequency point, and complete the spherical near-field test of the antenna of the target under test at the specific frequency point; change the frequency by the frequency control sequence, so as to realize the spherical near-field test of the antenna of the target under test at different frequency points that meet the test scenarios and test requirements.

[0029] According to some embodiments, a third solution of the present invention provides a computer-readable storage medium, which adopts the following technical solution:

[0030] A computer-readable storage medium stores a program, which, when executed by a processor, implements the steps of the antenna spherical near-field testing method based on electrically controlled multi-probes as described in the first solution of the present invention.

[0031] According to some embodiments, a fourth solution of the present invention provides an electronic device, which adopts the following technical solution:

[0032] An electronic device comprises a memory, a processor and a program stored in the memory and running on the processor, wherein when the processor executes the program, the steps in the antenna spherical near-field testing method based on electrically controlled multi-probes as described in the first solution of the present invention are implemented.

[0033] According to some embodiments, a fifth solution of the present invention provides a computer program product, which adopts the following technical solution:

[0034] A computer program product includes software codes, wherein the program in the software codes executes the steps in the antenna spherical near-field testing method based on electrically controlled multi-probes as described in the first solution of the present invention.

[0035] Compared with the prior art, the present invention has the following beneficial effects:

[0036] The present invention adopts the electronic control method of multiple probes to synthesize beams without the need for mechanical operation. Theoretically, the interval of the synthesized equivalent emission pointing angle can be arbitrarily small, which greatly improves the test accuracy; the rapid movement of the equivalent emission pointing can be achieved, mechanical errors can be avoided, and the test accuracy, test speed and test efficiency can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] The drawings in the specification that constitute a part of this embodiment are used to provide a further understanding of this embodiment. The schematic embodiments of this embodiment and their descriptions are used to explain this embodiment and do not constitute improper limitations on this embodiment.

[0038] Figure 1 It is a schematic diagram of the antenna spherical near-field testing method based on electrically controlled multi-probes in the first embodiment of the present invention;

[0039] Figure 2This is a schematic diagram of the structure of the test sequence generated in the first embodiment of the present invention;

[0040] Figure 3 is a schematic diagram of a multi-task control circuit in Embodiment 1 of the present invention;

[0041] Figure 4 is a schematic diagram of a microwave signal generating and receiving circuit in Embodiment 1 of the present invention;

[0042] Figure 5 is a schematic diagram of a power division amplification network in Embodiment 1 of the present invention;

[0043] Figure 6 is a schematic diagram of an amplitude and phase control circuit in Embodiment 1 of the present invention;

[0044] Figure 7 It is a structural block diagram of an antenna spherical near-field test system based on electrically controlled multi-probes in the second embodiment of the present invention. DETAILED DESCRIPTION

[0045] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0046] It should be noted that the following detailed descriptions are exemplary and are intended to provide further explanation of the present application. Unless otherwise specified, all technical and scientific terms used herein have the same meanings as those commonly understood by those skilled in the art to which the present application belongs.

[0047] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit exemplary embodiments according to the present invention. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprising" and / or "including" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0048] In the absence of conflict, the embodiments of the present invention and the features of the embodiments may be combined with each other.

[0049] Embodiment 1

[0050] Embodiment 1 of the present invention introduces a spherical near-field testing method for an antenna based on an electrically controlled multi-probe.

[0051] In order to address the defects in the prior art, such as the limited number of probes in the probe array on the arc frame and the limited minimum probe spacing, resulting in low test accuracy; the slow mechanical movement speed of mechanical axes such as azimuth and pitch arms, resulting in low test efficiency; the limited minimum step of mechanical movement of mechanical axes such as azimuth and pitch arms, resulting in low test accuracy; the mechanical processing technology and the motion control of the motor will introduce position errors in the measurement results, resulting in low test accuracy, the present embodiment provides a spherical near-field test method for antennas based on electrically controlled multiple probes.

[0052] like Figure 1 As shown, in this embodiment, probes are arranged at equal intervals on the spherical surface, the target to be measured is placed at the center of the sphere, and beam synthesis is performed by using "antenna spherical surface test main control unit + multi-task control circuit + microwave signal generation and receiving circuit + power division amplifier network + amplitude and phase control circuit + multiple probes" in combination with "measurement and control software + FPGA timing control logic + amplitude and phase electronic control multi-element algorithm", so that the microwave signal equivalent emission pointing can be quickly moved without the need for physical movement of the probe and the target to be measured, thereby avoiding mechanical errors introduced by mechanical movement and improving test accuracy; in addition, since the electronic control speed is fast (microsecond level) and the theoretical equivalent emission pointing angle interval can be arbitrarily small, the test speed and test accuracy can be improved.

[0053] This embodiment obtains the test scenarios and test requirement information such as the frequency test points and the equivalent transmission beam pointing required in the antenna spherical near field test; Figure 2 As shown, according to the acquired test scenarios and test requirements, a frequency control sequence is generated for the frequency test point test requirements, and for the equivalent transmit beam pointing test requirements, for each test frequency point, a wave position control sequence is generated according to the amplitude and phase electronic control multi-element algorithm; ultimately, a total frequency control + wave position control sequence is formed when each frequency point + each equivalent transmit beam pointing is tested one by one.

[0054] like Figure 3 The multi-task control circuit shown (including FPGA timing control logic) is the control center of this embodiment and can realize the following functions:

[0055] 1) Exchange information with the "antenna spherical test main control unit (including main control software, amplitude and phase electronic control multi-tuple algorithm)", receive the test sequence generated by the main control unit according to the amplitude and phase electronic control multi-tuple algorithm, and feed back the test status such as whether the test has been started according to the test sequence and whether the test has been completed according to the test sequence to the main control unit;

[0056] 2) According to the wave position control sequence in the test sequence, the attenuation value of the electrically controlled attenuator and the phase shift value of the electrically controlled phase shifter in each amplitude and phase control circuit are controlled to realize the amplitude and phase control of the microwave signal reaching each probe. The final effect is that the multi-channel microwave signals radiated by each probe are synthesized by beam to realize the change of the equivalent transmission beam pointing at a specific frequency point; according to the frequency control sequence pre-existing in the microwave signal generation and receiving circuit in the test sequence, the microwave signal generation and receiving circuit are controlled to switch the test frequency.

[0057] The "antenna spherical test main control unit (including main control software, amplitude and phase electronic control multi-tuple algorithm)" is the human-computer interaction center of the entire device. The hardware is usually a computer with a built-in main control software that integrates the amplitude and phase electronic control multi-tuple algorithm. The antenna spherical test main control unit generates a test sequence based on the amplitude and phase electronic control multi-tuple algorithm according to the test application scenario and requirements, and sends the test sequence to the multi-task control circuit and the microwave signal generation and receiving circuit, and sends instructions such as start test and stop test to the multi-task control circuit (including FPGA timing control logic), and displays the test progress and test results of completed test points in real time;

[0058] "Multiple probes" refer to probes that are spaced apart on a spherical surface with a radius that satisfies the spherical near-field scanning conditions, with the target being measured as the center of the sphere.

[0059] Specifically, the main control unit sends a start test instruction to the multi-task control circuit through the communication interface. After receiving the start test instruction, the multi-task control circuit sends a wave position control instruction to each amplitude and phase control circuit through the interface module according to the wave position 11 control requirement of the test point 1 in the pre-stored control sequence, controls the attenuation value of the electrically controlled attenuator and the phase shift value of the electrically controlled phase shifter in each amplitude and phase control circuit, and delays for a period of time to wait for the control to be completed, and then sends a trigger signal to the microwave signal generating and receiving circuit through the interface module. After receiving the trigger signal, the microwave signal generating and receiving circuit performs a frequency switching according to the frequency control sequence pre-stored in the microwave signal generating and receiving circuit, switches to frequency 1, completes a signal transmission and reception, uploads the test result of test point 1 to the main control circuit, and sends a trigger signal to the multi-task control circuit to indicate that the test of test point 1 is completed. After the multi-task control circuit receives the trigger signal from the microwave signal generating and receiving circuit, it repeats the above process to complete the test of test point 2 according to the wave position 21 control requirements of test point 2 in the pre-stored control sequence and the frequency control requirements of test point 2... until the test of all test points is finally completed, and the multi-task control circuit sends a test completion instruction to the main control unit through the communication interface.

[0060] like Figure 4The microwave signal generation and receiving circuit shown, i.e., the vector network analyzer, can also be in the form of a signal source + receiver. This embodiment takes the vector network analyzer as an example and is introduced in detail. It is mainly composed of modules such as synchronous clock reference generation, fractional frequency division source, frequency multiplication amplification and amplitude stabilization, frequency mixing reception, and full digital intermediate frequency processing. The radio frequency signal generated by the fractional frequency division source is converted into a microwave signal after frequency multiplication amplification and amplitude stabilization, and then separated into reference and excitation outputs through a coupling module. The test signal (i.e., the microwave signal received by the antenna under test) enters the frequency mixing reception module through the radio frequency port. The reference signal and the test signal are coherently down-converted under the same local oscillator signal. The converted reference intermediate frequency and test intermediate frequency signals are converted by digital-to-analog conversion and signal processing to output the required amplitude and phase information to complete the network parameter test. The internal storage unit pre-stores the frequency test sequence generated by the antenna spherical test main control unit according to the amplitude and phase electronically controlled multi-element group algorithm. The microwave signal generation and receiving circuit completes microwave signal frequency switching and signal transmission and reception under the control of the trigger signal output by the "multi-task control circuit (including FPGA timing control logic)" interface module, and sends a test completion trigger signal to the multi-task control circuit after completing the test of the current test point, and transmits the test result of the current test point to the main control unit.

[0061] like Figure 5 The power division amplification network shown is composed of an amplifier, a power division network and a power module. The power division network is composed of multiple power dividers, and the number of RF outputs after power division is the same as the number of probes on the probe array. The power division amplification network amplifies and divides a microwave signal transmitted from the microwave signal generation and receiving circuit to compensate for the path loss, and sends it to the amplitude and phase control circuit connected to each probe.

[0062] like Figure 6 As shown, each amplitude and phase control circuit is the same, consisting of an electrically controlled attenuator, an electrically controlled phase shifter, an interface module, a control module and a power module. The amplitude and phase control circuit receives the microwave signal transmitted by the "power division amplifier network", and receives the wave position control instruction issued by the multi-task control circuit through the interface module. According to the wave position control instruction, the control module controls the phase shift value of the electrically controlled phase shifter and the attenuation value of the electrically controlled attenuator. The microwave signal after attenuation and phase shifting is output through the RF output interface and reaches the probe connected to it.

[0063] This embodiment controls the microwave signal generation and receiving circuit to switch the test frequency at each test point based on the frequency control sequence in the generated test sequence; controls the attenuation value and phase shift value of the microwave signal reaching each probe at each test point according to the wave position control sequence in the test sequence, thereby realizing the control of the amplitude and phase of the microwave signal output by each probe; the multi-channel microwave signals of specific frequency and amplitude phase radiated and output by each probe are subjected to beam synthesis to finally obtain a synthetic beam at a specific frequency point, that is, an equivalent emission directional beam at a specific frequency point; according to the test sequence, frequency switching and amplitude and phase control are performed at each test point, and the multi-probe array will realize the sequential output of each equivalent emission directional beam at each test frequency point according to the test requirement information, and complete the radiation of multi-frequency points and multi-wave positions (directional beams from multiple positions on the spherical surface) of the target under test, thereby completing the antenna spherical near-field test of the target under test.

[0064] This embodiment adopts the electronic control method of multiple probes to synthesize beams without the need for mechanical operation. Theoretically, the interval of the synthesized equivalent emission pointing angle can be arbitrarily small, which greatly improves the test accuracy; it realizes the rapid movement of the equivalent emission pointing, avoids mechanical errors, and improves the test accuracy, test speed and test efficiency.

[0065] Embodiment 2

[0066] Embodiment 2 of the present invention introduces an antenna spherical near-field testing system based on electrically controlled multi-probes.

[0067] like Figure 7 The antenna spherical near-field test system shown in the figure based on an electrically controlled multi-probe comprises:

[0068] An acquisition module, configured to acquire antenna spherical near-field test scenarios and test requirements;

[0069] A generating module, configured to generate a test sequence including a frequency control sequence and a wave position control sequence according to the acquired test scenario and test requirements;

[0070] A control module configured to control the frequencies of the microwave signals output by each probe based on the generated frequency control sequence, so that the frequencies of the microwave signals output by each probe at the same time are the same;

[0071] An execution module is configured to control the amplitude and phase of the microwave signals output by each probe for each specific frequency point based on the generated wave position control sequence; the amplitudes and phases of the microwave signals of multiple probes are synthesized by beamforming to obtain an equivalent transmission pointing beam at a specific frequency point;

[0072] The test module is configured to radiate the antenna of the target under test in sequence based on the equivalent transmission pointing beam obtained at the specific frequency point, and complete the spherical near-field test of the antenna of the target under test at the specific frequency point; change the frequency by the frequency control sequence, so as to realize the spherical near-field test of the antenna of the target under test at different frequency points that meet the test scenarios and test requirements.

[0073] The detailed steps are the same as those of the antenna spherical near-field test method based on electrically controlled multi-probes provided in Example 1, and will not be repeated here.

[0074] Embodiment 3

[0075] Embodiment 3 of the present invention provides a computer-readable storage medium.

[0076] A computer-readable storage medium stores a program, which, when executed by a processor, implements the steps of the antenna spherical near-field testing method based on electrically controlled multi-probes as described in Embodiment 1 of the present invention.

[0077] The detailed steps are the same as those of the antenna spherical near-field test method based on electrically controlled multi-probes provided in Example 1, and will not be repeated here.

[0078] Embodiment 4

[0079] A fourth embodiment of the present invention provides an electronic device.

[0080] An electronic device comprises a memory, a processor and a program stored in the memory and running on the processor, wherein when the processor executes the program, the steps in the antenna spherical near-field testing method based on electrically controlled multi-probes as described in the first embodiment of the present invention are implemented.

[0081] The detailed steps are the same as those of the antenna spherical near-field test method based on electrically controlled multi-probes provided in Example 1, and will not be repeated here.

[0082] Embodiment 5

[0083] Embodiment 5 of the present invention provides a computer program product.

[0084] A computer program product includes software codes, wherein the program in the software codes executes the steps in the antenna spherical near-field testing method based on electrically controlled multi-probes as described in the first embodiment of the present invention.

[0085] The detailed steps are the same as those of the antenna spherical near-field test method based on electrically controlled multi-probes provided in Example 1, and will not be repeated here.

[0086] The above description is only a preferred embodiment of the present embodiment and is not intended to limit the present embodiment. For those skilled in the art, the present embodiment may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present embodiment shall be included in the protection scope of the present embodiment.

Claims

1. A method for testing the spherical near field of an antenna based on an electrically controlled multi-probe, characterized in that: include: Obtain antenna spherical near-field test scenarios and test requirements; Generate a test sequence including a frequency control sequence and a wave position control sequence according to the acquired test scenario and test requirements; Based on the generated frequency control sequence, the frequencies of the microwave signals output by each probe are controlled so that the frequencies of the microwave signals output by each probe at the same time are the same; Based on the generated wave position control sequence, the amplitude and phase of the microwave signal output by each probe are controlled for each specific frequency point; The amplitude and phase of the microwave signals of multiple probes are beam synthesized to obtain an equivalent transmission pointing beam at a specific frequency point; Based on the equivalent transmission pointing beam obtained at the specific frequency point, the antenna of the target under test is radiated in turn to complete the antenna spherical near field test of the target under test at the specific frequency point; By changing the frequency through the frequency control sequence, the antenna spherical near field test of the target under test can be achieved at different frequency points that meet the test scenarios and test requirements.

2. The antenna spherical near-field testing method based on an electrically controlled multi-probe as described in claim 1, characterized in that: Based on the generated frequency control sequence, the microwave signal generation and receiving circuits are controlled to switch the test frequency at each test point; according to the generated wave position control sequence, the attenuation value and phase shift value of the microwave signal reaching each probe are controlled at each test point to achieve control of the amplitude and phase of the microwave signal output by each probe.

3. The antenna spherical near-field testing method based on an electrically controlled multi-probe as described in claim 1, characterized in that: The multiple probes are arranged on a spherical surface at equal intervals, and the measured target is arranged at the center of the spherical surface.

4. The antenna spherical near-field testing method based on an electrically controlled multi-probe as described in claim 1, characterized in that: The obtained equivalent transmission pointing beam at a specific frequency point is equivalent to the beam radiated by a single probe at a specific position on the spherical surface to the antenna under test. Combined with the generated test sequence, the frequency switching and amplitude and phase control of the antenna under test are performed at each test point. Based on the test requirements, the equivalent transmission pointing beams at each test frequency point are output in sequence, that is, the single probe at each position on the spherical surface is used to radiate the target antenna under test in turn, completing the spherical near-field test of the antenna of the target under test.

5. The antenna spherical near-field testing method based on electrically controlled multi-probes as claimed in claim 1, characterized in that: Obtain each frequency test point and each equivalent transmission beam pointing required in the antenna spherical near field test, and obtain the test scenario and test requirements; generate a frequency control sequence according to the obtained test scenario and frequency test point test requirements.

6. A method for testing the spherical near field of an antenna based on an electrically controlled multi-probe as claimed in claim 5, characterized in that: According to the test requirements of the obtained frequency test points, the wave position control sequence for each test frequency point is generated based on the amplitude and phase electronically controlled multi-element method; tests are performed according to each frequency point and each equivalent transmission beam pointing, and the total frequency control sequence and the total wave position control sequence are obtained respectively to generate a test sequence.

7. An antenna spherical near-field test system based on an electrically controlled multi-probe, characterized in that: include: An acquisition module, configured to acquire antenna spherical near-field test scenarios and test requirements; A generating module, configured to generate a test sequence including a frequency control sequence and a wave position control sequence according to the acquired test scenario and test requirements; A control module configured to control the frequencies of the microwave signals output by each probe based on the generated frequency control sequence, so that the frequencies of the microwave signals output by each probe at the same time are the same; An execution module is configured to control the amplitude and phase of the microwave signals output by each probe for each specific frequency point based on the generated wave position control sequence; the amplitudes and phases of the microwave signals of multiple probes are synthesized by beamforming to obtain an equivalent transmission pointing beam at a specific frequency point; The test module is configured to radiate the antenna of the target under test in sequence based on the equivalent transmission pointing beam obtained at the specific frequency point, and complete the spherical near-field test of the antenna of the target under test at the specific frequency point; change the frequency by the frequency control sequence, so as to realize the spherical near-field test of the antenna of the target under test at different frequency points that meet the test scenarios and test requirements.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the steps of the antenna spherical near-field testing method based on electrically controlled multi-probes as described in any one of claims 1 to 6 are implemented.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the program, the steps of the antenna spherical near-field testing method based on electrically controlled multi-probes as described in any one of claims 1 to 6 are implemented.

10. A computer program product comprising software code, characterized in that The program in the software code executes the steps of the antenna spherical near-field testing method based on electrically controlled multi-probes as described in any one of claims 1 to 6.