A test system, method, and storage medium for a hall device

Abstract

The application provides a kind of Hall device test system, method and storage medium, the system includes: controllable current source, output controllable current, the controllable current acts on solenoid to control the controllable magnetic field generated by the solenoid;Solenoid is fixed in the vertical above of test station in sorting machine, the controllable magnetic field generated by the solenoid acts on the test station;Sorting machine controls the Hall device to be tested to enter the test station, and according to the controllable magnetic field, the Hall device to be tested is tested and classified.The application forms a complete Hall device test system by the interaction of each component between systems, provides various magnetic fields suitable for testing to realize the automation test of Hall device, and tests and classifies Hall device.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of semiconductor testing, and particularly relates to a Hall device testing system and method and a storage medium. BACKGROUND

[0002] At present, in the process of testing a semiconductor integrated circuit, for the testing of a Hall device, one or more magnetic field environments are generally required to realize the functional testing of the Hall device.

[0003] A general magnetic field environment generation method includes providing a magnetic field by a current solenoid, providing a magnetic field by a magnet or providing a magnetic field by a magnetic object. In the aspect of Hall device testing, a magnetic field environment generally provides a magnetic field by a coil. However, as the functionality of the Hall device becomes more and more diverse, it can be applied to different magnetic field environments, and the subsequent diversity testing of the Hall device is particularly important, which requires a controllable magnetic field environment to provide different magnetic field environments. Therefore, how to provide a controllable magnetic field environment to realize the automatic testing of the Hall device becomes a problem to be solved in the field. The existing testing system cannot realize automatic testing or further classify the tested Hall device, and therefore has many deficiencies.

[0004] In view of this, the application provides a Hall device testing system and method and a storage medium. The application forms a complete Hall device testing system through the interaction of each component part between systems, provides various magnetic fields suitable for testing to realize the automatic testing of the Hall device, and tests and classifies the Hall device. SUMMARY

[0005] The application provides a Hall device testing system, method and storage medium.

[0006] In a first aspect, the application provides a Hall device testing system, which comprises:

[0007] a controllable current source, which outputs a controllable current, and the controllable current acts on a solenoid to control the solenoid to generate a controllable magnetic field;

[0008] a solenoid, which is fixed vertically above a test station in a handler, and the controllable magnetic field generated by the solenoid acts on the test station;

[0009] a handler, which controls the Hall device to be tested to enter the test station, tests and classifies the Hall device to be tested according to the controllable magnetic field.

[0010] Optionally, the handler clamps the Hall device to be tested and fixes the Hall device to be tested to the test station.

[0011] Optionally, the test station generates a test signal according to the test of the Hall device to be tested based on the controllable magnetic field, and the handler tests and classifies the Hall device to be tested according to the received test signal.

[0012] Optionally, the handler determines the failure of the Hall device to be tested based on the test signal.

[0013] Optionally, the handler classifies the Hall device to be tested based on the failure of the Hall device to be tested.

[0014] Optionally, when the controllable current source is connected to the solenoid and outputs a constant current, the constant current acts on the solenoid to control the solenoid to generate a fixed magnetic field.

[0015] When the controllable current source is connected to the solenoid and outputs an alternating current, the alternating current acts on the solenoid to control the solenoid to generate an alternating magnetic field.

[0016] When the controllable current source is connected to the solenoid and outputs an increasing or decreasing current, the increasing or decreasing current acts on the solenoid to control the solenoid to generate a gradually increasing or decreasing magnetic field.

[0017] Optionally, the system further comprises:

[0018] a display connected to the handler and displaying the test result obtained by the handler.

[0019] In a second aspect, an embodiment of the present application provides a Hall device testing method, comprising:

[0020] setting an output controllable current;

[0021] generating a controllable magnetic field according to the controllable current;

[0022] testing and classifying the Hall device to be tested based on the controllable magnetic field.

[0023] In a third aspect, an embodiment of the present application provides a terminal device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to apply the system as described above.

[0024] In a fourth aspect, an embodiment of the present application provides a computer readable storage medium, which stores a computer program, wherein the computer program is executed by a processor to apply the system as described above.

[0025] The application provides a Hall device testing system, characterized in that the system comprises: a controllable current source, which outputs a controllable current, the controllable current acting on a solenoid to make the solenoid generate a controllable magnetic field; the solenoid is fixed vertically above a testing station in a handler, and the controllable magnetic field generated by the solenoid acts on the testing station; the handler controls the Hall device to be tested to enter the testing station, and tests and classifies the Hall device to be tested according to the controllable magnetic field. The application forms a complete Hall device testing system through the interaction of each component in the system, provides various magnetic fields suitable for testing to realize the automatic testing of the Hall device, and tests and classifies the Hall device. BRIEF DESCRIPTION OF DRAWINGS

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor on the basis of these drawings.

[0027] Figure 1 is a structural schematic diagram of a Hall device testing system provided by the embodiments of the present application;

[0028] Figure 2 is a specific structural schematic diagram of a Hall device testing system provided by the embodiments of the present application;

[0029] Figure 3 is a flowchart of a Hall device testing process provided by the embodiments of the present application;

[0030] Figure 4 is a structural schematic diagram of a terminal device provided by the embodiments of the present application. DETAILED DESCRIPTION

[0031] In the following description, specific details such as specific system structures, techniques, etc. are presented in order to thoroughly understand the embodiments of the present application. However, it should be clear to those skilled in the art that the present application can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits and methods are omitted to avoid unnecessary details that hinder the description of the present application.

[0032] It should be understood that when used in the specification and the appended claims of the present application, the term "comprising" indicates the presence of the described features, integers, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or sets thereof.

[0033] It should also be understood that the term “and / or” as used herein refers to and encompasses any and all possible combinations of one or more of the associated listed items, and that the term “at least one of’ denotes one, or a plurality of, of the enumerated possibilities can be present and no more than one, or a plurality, of the enumerated possibilities need be present.

[0034] As used in the description of the application and the appended claims, the term “if’ can be interpreted to mean “when” or “upon” or “in response to determining” or “in response to detecting” depending on the context. Similarly, the phrase “if it is determined” or “if [a described condition or event] is detected” can be interpreted to mean “upon determining” or “in response to determining” or “upon [the described condition or event] being detected” or “in response to [the described condition or event] being detected,” depending on the context.

[0035] In addition, the terms “first,” “second,” “third,” etc. as used in the description of embodiments herein and throughout the claims (if any) are not used to connote any relative importance but are just used for discrimination in the descriptions.

[0036] As used in the description of the application and the appended claims, the term “if’ can be interpreted to mean “when” or “upon” or “in response to determining” or “in response to detecting” depending on the context. Similarly, the phrase “if it is determined” or “if [a described condition or event] is detected” can be interpreted to mean “upon determining” or “in response to determining” or “upon [the described condition or event] being detected” or “in response to [the described condition or event] being detected,” depending on the context.

[0037] At present, in the process of testing semiconductor integrated circuits, for the test of Hall devices, one or more magnetic field environments are generally required to realize the functional test of Hall.

[0038] The general magnetic field environment generation method includes providing a magnetic field by a current solenoid, providing a magnetic field by a magnet, or providing a magnetic field by a magnetic article. In the aspect of Hall device testing, the magnetic field environment generally provides a magnetic field by a coil. However, with the increasing diversity of the functionality of Hall devices, which can be applied to different magnetic field environments, the diversity test of Hall devices becomes particularly important, which requires a controllable magnetic field environment to provide different magnetic field environments. Therefore, how to provide a controllable magnetic field environment to realize the automatic test of Hall devices becomes a problem to be solved in the field.

[0039] In the prior art, Hall devices are only detected based on the magnetic field, and no sorting machine is introduced to cooperate with the magnetic field to detect the Hall devices. Therefore, the Hall devices cannot be classified according to the detection signal. In this application, the solenoid is arranged vertically above the sorter, which can enable the variable magnetic field to act directly on the Hall device so that the test station can test the Hall device. This application forms a complete testing system through the interaction between various parts of the system, and classifies the Hall devices to be tested according to the test signal.

[0040] In view of this, the present invention proposes a testing system, method and storage medium for Hall devices. This application forms a complete Hall device testing system through the interaction between various components of the system, provides various magnetic fields suitable for testing to realize automated testing of Hall devices, and tests and classifies Hall devices.

[0041] This solution provides a magnetic field control method for Hall chip testing. The solution mainly uses a solenoid and a current source to form a magnetic field control system, and cooperates with a sorting machine to form an automated testing system. The coil generates a magnetic field to act on the Hall device, and the Hall device is tested by the tester. The entire system can realize automated testing.

[0042] like Figure 1 As shown, Figure 1 1 is a structural diagram of a Hall device test system provided in an embodiment of the present application. The test system of the present application mainly includes three modules, a controllable current source 100, a solenoid 200 and a sorting machine 300.

[0043] The controllable current source 100 outputs a controllable current, and the controllable current acts on the solenoid to control the solenoid to generate the controllable magnetic field.

[0044] In an embodiment of the present application, a controllable current source is a circuit or device that can control the output current. It can output a DC or AC current that meets the requirements and can adjust the output current. Current control is usually achieved by adjusting the output voltage or the internal circuit. In one possible implementation, a rotary converter unit can be used to form a unit with an AC motor and a DC generator to obtain an adjustable DC voltage. In another possible implementation, a static controlled rectifier can be used to obtain an adjustable DC voltage. In an embodiment of the present application, a controllable current source is connected to a solenoid and acts on the solenoid to generate a controllable magnetic field. A magnetic field is generated by the flow of current in a conductor. When the current source is a controllable current source and is connected to a conductor solenoid, a variable magnetic field can be generated in the solenoid conductor.

[0045] The solenoid 200 is fixed vertically above the test station inside the sorting machine, and the controllable magnetic field generated by the solenoid acts on the test station.

[0046] In the embodiment of the present application, the solenoid refers to a multiple winding wire, the winding inside can be hollow, or have a metal core, when the current passes through the wire, the solenoid inside will produce a uniform magnetic field. The solenoid is a very important element, the solenoid can also be used as an electromagnet or an inductor. In the embodiment of the present application, the position of the solenoid is fixed, which needs to be fixed vertically above the test station inside the handler, when the current passes through the solenoid, it is beneficial to make the magnetic field generated by the solenoid directly act on the test station to test the Hall device

[0047] The handler 300 controls the Hall device to be tested to enter the test station, tests the Hall device to be tested according to the controllable magnetic field, and classifies.

[0048] In the embodiment of the present application, the handler is a device for weight grading and screening products, which is a chip handler in the embodiment and can be compared to an automatic feeder. The working principle of the chip handler mainly involves optical measurement technology, image processing technology, and scanning of laser, infrared, X-ray, etc. detection means. The chip handler first sends the chip to be tested to the detection area through the transmission belt, scans the surface of the chip by using the optical sensor, generates an image, and analyzes and processes the image to judge the quality and specification of the chip. This process realizes the automatic sorting of the chip, has high-speed processing capability and ultra-high precision, can greatly shorten the production cycle, reduce production cost, and improve enterprise competitiveness.

[0049] The handler mentioned in the present application includes not only the chip handler, but also the laser diode chip test handler, which tests the photoelectric parameters, obtains the type, quality, speed, etc. of the chip through scanning of laser, infrared, X-ray, etc. detection means, classifies the chip into different grades or types according to the detection result, and finally collects the chip into the corresponding container. The handler provided in the embodiment of the present application can use the Plitek pressure test handler, which is not limited here.

[0050] As shown in Figure 2 , the Figure 2 is a specific structure diagram of a Hall device test system provided in the embodiment of the present application.

[0051] The controllable current source is connected with the solenoid, the current passes through the conductor to form a magnetic field, the magnetic field changes with the type of current, a controllable magnetic field is formed, the solenoid is fixed vertically above the test station to directly act on the test station of the handler, the handler controls the Hall device to be tested to be fixed in the test station, and realizes that the handler automatically enters the test station to detect and classify the Hall device to be tested according to the test signal.

[0052] Further, the handler clamps the Hall device to be tested and fixes the Hall device to be tested to the test station.

[0053] The test system of the Hall device comprises a handler having an automatic device for sorting or testing integrated circuit chips, a test station in the handler, and a sorting device. The test station tests and classifies the chips according to various characteristics such as size, weight, appearance, electrical performance, etc. to distinguish qualified products from unqualified products. The integrated circuit chips are first sequentially fed into the test station of the handler, and the performance parameters of each chip are tested one by one using a probe or other testing device. The handler has a clamp for fixing the Hall device to be tested on the test station of the handler.

[0054] Further, the test station generates a test signal by testing the Hall device to be tested according to the controllable magnetic field, and the handler tests and classifies the Hall device to be tested according to the received test signal.

[0055] A Hall device, such as a chip, generally comprises a Hall element, a signal conditioning circuit, and an output interface. The Hall element is the core part of the chip, which is generally made of semiconductor material and uniformly distributed with current channels on the surface of the material. The signal conditioning circuit is used to amplify and process the weak electrical signal output by the Hall device to enhance the stability and reliability of the signal. The output interface converts the electrical signal after signal conditioning into a form available for external circuits. The Hall chip generally works under a constant direct current to produce a Hall effect. When a magnetic field acts on the Hall element, a potential difference is generated on both sides of the element. By conditioning and amplifying the potential difference, a voltage signal proportional to the magnetic field strength can be obtained.

[0056] Hall effect refers to the generation of a potential difference on both sides of a conductor when a current passes through the conductor under the action of a magnetic field perpendicular to the current direction. This potential difference is called Hall voltage, which is related to the current, magnetic field strength, and material properties of the conductor. The basic principle of the Hall effect is the Lorentz force, i.e., the Lorentz force on electrons in a magnetic field causes electrons to gather inside the conductor, thereby generating a potential difference. In the embodiments of the present application, the potential difference generated on both ends of the Hall device to be tested when the magnetic field acts on the Hall device to be tested is used to obtain a test signal, such as a voltage signal, to test and functionally classify the Hall device to be tested.

[0057] In the embodiments of the present application, the solenoid is the main device for generating a magnetic field, which is fixed to the handler and provided with a current source. The energized solenoid is similar to a magnet, and the magnetic field outside the energized solenoid is similar to a bar-shaped magnetic field. The direction of the magnetic field can be determined by the direction of the current, in combination with the right-hand Ampere rule. The size of the magnetic field is related to the current, and the size of the magnetic field at different positions is different. Since the solenoid is fixed to the handler, the distance is constant, and the size of the magnetic field is only related to the current.

[0058] Further, the sorting machine determines the failure condition of the Hall device to be tested according to the test signal.

[0059] In an embodiment of the present application, Hall chips can be divided into linear Hall chips and switch-type Hall chips according to different Hall effects. The voltage signal output by the linear Hall chip is proportional to the magnetic field strength and can be used to measure the size of the magnetic field. The switch-type Hall chip outputs a high or low signal under a specific magnetic field and can be used to detect the switching state of the magnetic field.

[0060] In another possible implementation, the test station in the sorting machine can detect the performance parameters of each Hall device to be tested one by one using probes or other test equipment according to the test signal such as a voltage signal or a current signal, and detect the failure condition of the Hall device to be tested.

[0061] Further, the sorting machine classifies the Hall device to be tested according to the failure condition of the Hall device to be tested.

[0062] In an embodiment of the present application, the failure condition can include connectivity failure, electrical parameter failure, and functional failure. Connectivity failure includes open circuit, short circuit, and resistance value change. Most of the field failures are caused by electrostatic discharge (ESD) and overvoltage stress (EOS). The main forms of electrical parameter failure are parameter value exceeding the specified range (out of tolerance) and parameter instability. The main failure modes that can be detected include gate breakdown of MOS devices, pn junction breakdown of bipolar devices, secondary breakdown of power transistors, latch-up effect of CMOS circuits, Al-Si inter-diffusion of metal-semiconductor contacts, ohmic contact degradation, pn junction leakage, Au-Al bonding failure, chip fracture, thermal carrier injection, chip fracture, chip adhesion failure, metal electromigration, ohmic contact degradation, chip fracture, lead fracture, electrical parameter change, soft error, external lead corrosion, metal corrosion, and electrical parameter drift.

[0063] Further, when the controllable current source is connected to the solenoid and outputs a constant current, the constant current acts on the solenoid to control the solenoid to generate a fixed magnetic field.

[0064] When the controllable current source is connected to the solenoid and outputs an alternating current, the alternating current acts on the solenoid to control the solenoid to generate an alternating magnetic field.

[0065] When the controllable current source is connected to the solenoid and outputs an increasing or decreasing current, the increasing or decreasing current acts on the solenoid to control the solenoid to generate a gradually increasing or decreasing magnetic field.

[0066] In the embodiment of the present application, the current source provides current for the solenoid, and the current source provides different currents according to the magnetic field requirement when the Hall device is tested. For example, when a magnetic field environment requires a magnetic field of a fixed size, the current source outputs a constant current of a fixed size to generate a fixed magnetic field; when the magnetic field environment requires an alternating magnetic field, the current source outputs an alternating current to generate an alternating magnetic field; when the magnetic field environment requires a gradually increasing magnetic field, the current source outputs an increasing current to generate a gradually increasing magnetic field. The magnetic field size is completely controlled by the current source. The test of the Hall device is generally realized by a tester, and the current source selected here is the resource board card FPVI10 of the ACCO STS8200 tester, which can provide a current of ±10A, and the output current size is completely controllable. The Hall device to be tested is the object of the design scheme, and in the process of realizing automatic testing, the position of the Hall device to be tested is controlled by a sorting machine, when the Hall device to be tested reaches the test station, the FPVI10 resource is controlled by the tester to provide current acting on the solenoid, and then a magnetic field is generated to act on the Hall device to be tested, and the size of the magnetic field can be controlled according to actual requirements.

[0067] Further, the system further comprises a display connected with the sorting machine and displaying the test results obtained by the sorting machine.

[0068] In the embodiment of the present application, the test system further comprises a display connected with the sorting machine, and the test results and classification results of the Hall device to be tested by the sorting machine according to the test signal can be presented, the failure types and failure causes detected can be presented and returned to the operator, which is beneficial to the operator to select a corresponding maintenance strategy according to the test results of the Hall device to be tested.

[0069] It should be noted that each component of the Hall device test system in the present application cannot be replaced by other modules or devices, and any module or device replacing the above test system cannot achieve equivalent effects. In the embodiment of the present application, the sorting machine is used to test the Hall device to be tested. Since the sorting machine can classify the test results of the Hall device according to the test signal, and can distinguish the Hall devices in different failure conditions, and display the failure conditions and causes by the display, this is not achieved by ordinary test platforms, and the prior art only tests the Hall device and cannot be classified into special types. Since the sorting machine is also part of the system, and each part of the test system needs to interact to complete the entire test process, the present application forms a complete Hall device test system through the interaction of each component of the system. The scheme can not only provide a stable magnetic field for the Hall device test, but also has strong versatility to provide a changeable magnetic field. Various magnetic fields suitable for testing are provided to realize the automatic testing of the Hall device, and the Hall device is tested and classified.

[0070] AsFigure 3 As shown, Figure 3 This is a test flow chart of a Hall device provided in an embodiment of the present application.

[0071] Based on the above-mentioned Hall device testing system, the present application also provides a Hall device testing method, the method comprising:

[0072] S100, set the output controllable current;

[0073] S200, generating a controllable magnetic field according to the controllable current;

[0074] S300: Testing and classifying the Hall effect devices to be tested according to the controllable magnetic field.

[0075] In an embodiment of the present application, a controllable output current is first set on a controllable current source, where the controllable current can include a constant current, an alternating current, and an increasing or decreasing current. A magnetic field is generated according to the Hall effect current. Since the current is controllable, the magnetic field is also controllable. The corresponding generation of different magnetic fields is beneficial to meeting the test environment of each Hall device to be tested. The Hall devices to be tested are tested and classified according to the controllable magnetic field. The testing and classification process has been described in detail in the above-mentioned test system and will not be repeated here.

[0076] Figure 4 This is a schematic diagram of the structure of the terminal device provided in the embodiment of the present application. Figure 4 As shown, the terminal device 700 of this embodiment includes: at least one processor 710 ( Figure 4 Only one is shown), a memory 720 and a computer program 721 stored in the memory 720 and executable on the at least one processor 710, wherein the processor 710 implements the steps in the embodiment of the above-mentioned method for testing a Hall device when executing the computer program 721.

[0077] The terminal device 700 may be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server. The terminal device may include, but is not limited to, a processor 710 and a memory 720. Those skilled in the art will appreciate that Figure 4 This is merely an example of the terminal device 700 and does not constitute a limitation on the terminal device 700 . The terminal device 700 may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the terminal device 700 may also include input and output devices, network access devices, etc.

[0078] The processor 710 can be a central processing unit (CPU), and can also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices, discrete gates or transistor logic, discrete hardware components, etc. The general-purpose processor can be a microprocessor or the processor can be any conventional processor.

[0079] The memory 720 can be an internal storage unit of the terminal device 700 in some embodiments, for example, a hard disk or a memory of the terminal device 700. The memory 720 can also be an external storage device of the terminal device 700 in other embodiments, for example, a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the terminal device 700. Further, the memory 720 can include both the internal storage unit and the external storage device of the terminal device 700. The memory 720 is used to store an operating system, application programs, a boot loader, data, and other programs, for example, program codes of the computer program, etc. The memory 720 can also be used to temporarily store data that has been output or will be output.

[0080] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the division of the above functional units and modules is taken as an example for illustration, and in actual application, the above functions can be completed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to complete all or part of the functions described above. Each functional unit and module in the embodiment can be integrated in one processing unit, or each unit can exist physically independently, or two or more units can be integrated in one unit. The integrated unit can be realized in the form of hardware or in the form of a software functional unit. In addition, the specific names of each functional unit and module are only for the purpose of mutual distinction, and do not limit the protection scope of the present application. The specific working process of the units and modules in the system can refer to the corresponding process in the foregoing method embodiments, which will not be described here.

[0081] In the above embodiments, the description of each embodiment has its own focus, and the parts not described or recorded in a certain embodiment can be referred to the relevant description of other embodiments.

[0082] Those skilled in the art can understand that the units and algorithm steps of each example described in combination with the embodiments disclosed in the present application can be realized by electronic hardware or a combination of computer software and electronic hardware. Whether the functions are realized in hardware or software depends on the specific application and design constraints of the technical solution. A person skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0083] In the embodiments provided in the present application, it should be understood that the disclosed apparatus / terminal device and method can be implemented by other ways. For example, the apparatus / terminal device embodiments described above are only schematic, and the division of the modules or units is only a logical function division, and there can be another division in actual implementation. For example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the displayed or discussed mutual couplings or direct couplings or communication connections between the units can be indirect couplings or communication connections through some interfaces, devices or units, and can be electrical, mechanical or other forms.

[0084] The units described as separate components can or can not be physically separate, and the components shown as units can or can not be physical units, that is, they can be located in one place, or can be distributed on a plurality of network units. Part or all of the units can be selected according to actual needs to achieve the purpose of the present embodiment.

[0085] In addition, each functional unit in each embodiment of the present application can be integrated in one processing unit, or each unit can be physically present separately, or two or more units can be integrated in one unit. The integrated unit can be realized in the form of hardware or in the form of a software functional unit.

[0086] The integrated module / unit, if implemented in the form of a software function unit and sold or used as an independent product, can be stored in a computer readable storage medium. Based on such understanding, all or part of the processes in the above-mentioned embodiment methods can also be completed by a computer program instructing related hardware, and the computer program can be stored in a computer readable storage medium. The computer program can implement the steps of each method embodiment described above when executed by a processor. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or some intermediate forms. The computer readable medium can include any entity or device, recording medium, U disk, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal, and software distribution medium, etc. that can carry the computer program code. It should be noted that the contents included in the computer readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, the computer readable medium does not include electrical carrier signals and telecommunication signals.

[0087] The above-mentioned embodiment methods can also be completed by a computer program product, which, when running on a terminal device, causes the terminal device to execute the steps in the above-mentioned various method embodiments.

[0088] The above-mentioned embodiments are only used to illustrate the technical solutions of the present application, rather than limit them. Although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that the technical solutions recorded in the foregoing embodiments can be modified, or some technical features can be replaced by equivalent replacements; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. A test system for a Hall device, characterized by, The system comprises: a controllable current source, which outputs a controllable current, the controllable current acting on a solenoid to control the solenoid to generate a controllable magnetic field; the controllable current output by the controllable current source is a constant current, an alternating current, an increasing current or a decreasing current, and the corresponding generated controllable magnetic field is a fixed magnetic field, an alternating magnetic field, a gradually increasing magnetic field or a gradually decreasing magnetic field; the solenoid, which is fixed vertically above a test station inside a handler, and the controllable magnetic field generated by the solenoid acts on the test station; the handler, a gripper on the handler being used to clamp a to-be-tested Hall device and fix the to-be-tested Hall device to the test station, the to-be-tested Hall device being controlled to enter the test station, the to-be-tested Hall device being tested and classified according to the controllable magnetic field; the handler determining a failure condition of the to-be-tested Hall device according to a test signal generated by the test station, and classifying the to-be-tested Hall device according to the failure condition, the failure condition including connectivity failure, electrical parameter failure and functional failure.

2. The system of claim 1, wherein, The test station tests the to-be-tested Hall device according to the controllable magnetic field to generate the test signal, and the handler tests and classifies the to-be-tested Hall device according to the received test signal.

3. The system according to claim 1, wherein: when the controllable current source is connected with the solenoid and outputs the constant current, the constant current acts on the solenoid to control the solenoid to generate the fixed magnetic field; when the controllable current source is connected with the solenoid and outputs the alternating current, the alternating current acts on the solenoid to control the solenoid to generate the alternating magnetic field; when the controllable current source is connected with the solenoid and outputs the increasing current or the decreasing current, the increasing current or the decreasing current acts on the solenoid to control the solenoid to generate the gradually increasing magnetic field or the gradually decreasing magnetic field.

4. The system of claim 1, wherein, The system further comprises: a display, which is connected with the handler and displays the test results obtained by the handler.

5. A method of testing a Hall device, characterized by, The method comprises: setting an output controllable current; the controllable current being a constant current, an alternating current, an increasing current or a decreasing current; generating a controllable magnetic field according to the controllable current; the controllable magnetic field being a fixed magnetic field, an alternating magnetic field, a gradually increasing magnetic field or a gradually decreasing magnetic field; the controllable magnetic field being generated by a solenoid fixed vertically above a test station inside a handler, the controllable magnetic field acting on the test station, and a gripper on the handler being used to clamp a to-be-tested Hall device and fix the to-be-tested Hall device to the test station; testing and classifying the to-be-tested Hall device according to the controllable magnetic field; the testing and classifying the to-be-tested Hall device according to the controllable magnetic field comprising: testing the to-be-tested Hall device according to the controllable magnetic field to generate a test signal, determining a failure condition of the to-be-tested Hall device according to the test signal, and classifying the to-be-tested Hall device according to the failure condition, the failure condition including connectivity failure, electrical parameter failure and functional failure.

6. A terminal device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, The computer program is applied to the system according to any one of claims 1 to 4 when the processor executes the computer program.

7. A computer-readable storage medium storing a computer program, wherein the computer program comprises the following steps of: The computer program is applied to the system according to any one of claims 1 to 4 when the processor executes the computer program.

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