Device testing method and device, electronic equipment and storage medium

Abstract

The invention provides a device testing method and device, electronic equipment and a storage medium, and relates to the technical field of device testing. According to the method, an intersection range is selected from a judgment range of a dynamic part average test and a target specification range as a test range of a target device, and then the target device is tested by using the test range. As the judgment range and the target specification range of the dynamic part average test are ranges determined according to different quality requirements, a smaller test range (i.e., an intersection range) is selected for testing, so that an abnormal device can be effectively detected, the probability of wrong recognition is reduced, and the detection efficiency is improved. And higher production requirements of electronic components can be met.

Description

Technical Field

[0001] The present application relates to the field of device testing technology, and in particular to a device testing method, apparatus, electronic equipment and storage medium. Background Art

[0002] When performing qualification tests on semiconductor components, the Part Average Testing (PAT) method is usually used. The PAT method is a method to improve the quality and reliability of components.

[0003] Currently, the PAT method is often used to perform quality testing on semiconductor chips. However, when the PAT method is extended to the quality testing of more electronic components, the test results may identify abnormal electronic components as normal electronic components. When these abnormal electronic components are shipped as good products, it will affect the quality of subsequent manufactured products. Therefore, the existing PAT method cannot meet the production needs of higher quality electronic components. Summary of the invention

[0004] The purpose of the embodiments of the present application is to provide a device testing method, apparatus, electronic device and storage medium to improve the problem that the PAT method in the prior art cannot meet the actual production needs of electronic components when applied to the testing of some other electronic components.

[0005] In a first aspect, an embodiment of the present application provides a device testing method, the method comprising: Determine the test range of the target device of the batch to be tested, wherein the test range refers to the intersection range of the judgment range of the average test of the dynamic parts of the target device and the target specification range, the judgment range is obtained according to a preset number of test parameters of the target device, and the target specification range is obtained by reducing the original specification range of the target device according to a set ratio; The target devices of the batch to be inspected are tested using the test range to obtain test results.

[0006] In the above implementation process, the intersection range of the judgment range and the target specification range of the dynamic part average test is selected as the test range of the target device, and then the target device is tested using the test range. Since the judgment range and the target specification range of the dynamic part average test are ranges determined for different quality requirements, a smaller test range (i.e., the intersection range) is selected for testing, thereby effectively detecting abnormal devices and reducing the probability of misidentification to meet higher production requirements of electronic components.

[0007] Optionally, the using the test range to test the target devices of the batch to be tested to obtain the test results includes: Using the test range to test the target devices of the batch to be tested, and obtaining a test result of each target device; Obtaining a first process capability index corresponding to a target device whose test result is preliminarily qualified; An overall test result of a preliminarily qualified target device is determined based on the first process capability index.

[0008] In the above implementation process, the test range can be used to perform qualification inspection on each target device. For the preliminarily qualified target devices, their overall qualification can be further evaluated through the first process capability index. The first process capability index is such as CPK. Since CPK can be used to measure the stability and consistency of the product production process, it can evaluate the capability of the process by analyzing the discreteness of the data. Therefore, CPK can be used to evaluate the risk of producing defective products in the device production process, thereby further improving the test quality of the device.

[0009] Optionally, determining the overall test result of the preliminarily qualified target device according to the first process capability index includes: If the first process capability index is greater than or equal to a first set threshold, the overall test result of the preliminarily qualified target device is determined to be qualified.

[0010] In the above implementation process, the larger the value of the first process capability index such as CPK, the more it indicates that the process can stably produce products that meet the specification requirements. Therefore, when the first process capability index is greater than or equal to the first set threshold, it indicates that the risk of producing defective products in the device production process is lower and the pass rate is higher.

[0011] Optionally, the first set threshold is determined by a first process capability index calculated based on test parameters of target devices of historical inspection batches. The value of the first process capability index calculated based on historical test parameters can reflect the actual performance of the production process over a period of time and can provide a reliable reference standard for the qualification assessment of the current batch.

[0012] Optionally, obtaining a first process capability index corresponding to a target device with a preliminarily qualified test result includes: Calculate the mean and standard deviation based on the test parameters of a set number of target devices in preliminary qualification; A first process capability index is obtained based on the test range, the mean value and the standard deviation.

[0013] In the above implementation process, by acquiring the test parameters of a set number of target devices to calculate the average value and the standard deviation, and then calculating the first process capability index, a more accurate first process capability index can be obtained.

[0014] Optionally, if the target device is a capacitor and the test parameter is a leakage current of the capacitor, the step of testing the target device of the batch to be tested using the test range to obtain the test result includes: Using the test range to test the target devices of the batch to be tested, and obtaining a test result of each target device; Obtaining a second process capability index corresponding to a target device whose test result is preliminarily qualified; The overall test result of the preliminarily qualified target device is determined according to the second process capability index.

[0015] In the above implementation process, the second process capability index such as CP can reflect the variability or discreteness of the measurement process, which can be better applied to tests that do not consider the deviation between the process mean and the specification center. Therefore, using CP for qualification assessment of some specified devices can better evaluate their production quality.

[0016] Optionally, determining the overall test result of the preliminarily qualified target device according to the second process capability index includes: If the second process capability index is greater than or equal to a second set threshold or if the second process capability index is less than or equal to a third set threshold, the overall test result of the preliminarily qualified target device is determined to be qualified.

[0017] In the above implementation process, in some cases, the larger the second process capability index is or the smaller the second process capability index is, the stronger the potential capability of the process is. Therefore, when the second process capability index is greater than or equal to the second set threshold or less than or equal to the third set threshold, the production quality of the device is higher.

[0018] Optionally, obtaining a second process capability index corresponding to a target device with a preliminarily qualified test result includes: Calculate the mean and standard deviation based on the test parameters of a set number of target devices in preliminary qualification; A second process capability index is obtained according to the upper limit value or the lower limit value in the test range, the mean value and the standard deviation.

[0019] In the above implementation process, by acquiring the test parameters of a set number of target devices to calculate the average value and the standard deviation, and then calculating the second process capability index, a more accurate second process capability index can be obtained.

[0020] Optionally, the mean value and the standard deviation are obtained by: Arrange the leakage currents of a set number of capacitors that have passed preliminary qualification in order of magnitude and divide them into four equal parts; determining the second quartile in the quartiles as the mean; The interquartile range is determined based on the first quartile and the third quartile in the four equal divisions, and the standard deviation is determined based on the interquartile range.

[0021] In the above implementation process, since the smaller the leakage current, the better, when evaluating the product quality through the leakage current, the product quality can be better evaluated through the second process capability index.

[0022] Optionally, the judgment range is obtained by: Calculate the average value and standard deviation based on the test parameters of a preset number of the target devices; The average value plus the standard deviation times a set value is used as the upper limit value of the judgment range, and the average value minus the standard deviation times a set value is used as the lower limit value of the judgment range.

[0023] In the above implementation process, the upper and lower limits of the judgment range can be determined more accurately through the average value and the standard deviation.

[0024] Optionally, the set multiple is a value greater than or equal to 1 and less than 6. In this way, a stricter test range can be obtained to cope with higher device production requirements.

[0025] Optionally, the set multiple is 3. This can better adapt to the quality inspection of electronic components on the vehicle, so as to accurately detect electronic components that do not meet the quality requirements.

[0026] Optionally, the target device is a capacitor, a resistor, an inductor, a magnetic bead, a crystal oscillator, a chip, a discrete device, a relay, a battery cell, a battery module or a battery pack. Since these devices have higher requirements on production quality, this solution can be used to achieve production quality inspection of these devices with higher quality requirements.

[0027] In a second aspect, an embodiment of the present application provides a device testing apparatus, the apparatus comprising: A limit value determination module, used to determine the test range of the target device of the batch to be tested, wherein the test range refers to the intersection range of the judgment range of the average test of the dynamic parts of the target device and the target specification range, the judgment range is obtained according to a preset number of test parameters of the target device, and the target specification range is obtained by reducing the original specification range of the target device according to a set ratio; The testing module is used to test the target devices of the batch to be tested using the testing range to obtain the testing results.

[0028] In a third aspect, an embodiment of the present application provides an electronic device, comprising a processor and a memory, wherein the memory stores computer-readable instructions, and when the computer-readable instructions are executed by the processor, the steps in the method provided in the first aspect are performed.

[0029] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps in the method provided in the first aspect are performed.

[0030] In a fifth aspect, an embodiment of the present application provides a computer program product, comprising computer program instructions, which, when read and executed by a processor, execute the steps in the method provided in the first aspect above.

[0031] Other features and advantages of the present application will be described in the following description, and partly become apparent from the description, or be understood by practicing the embodiments of the present application. The purpose and other advantages of the present application can be realized and obtained by the structures specifically pointed out in the written description, claims, and drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0033] Figure 1 A flow chart of a device testing method provided in an embodiment of the present application; Figure 2 A structural block diagram of a device testing device provided in an embodiment of the present application; Figure 3 A schematic diagram of the structure of an electronic device for executing a device testing method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0034] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the accompanying drawings in the embodiments of the present application.

[0035] It should be noted that the terms "system" and "network" in the embodiments of the present invention can be used interchangeably. "Multiple" means two or more. In view of this, in the embodiments of the present invention, "multiple" can also be understood as "at least two". "And / or" describes the association relationship of associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / ", unless otherwise specified, generally indicates that the previously associated objects are in an "or" relationship.

[0036] As the number of electronic components in automobiles and other equipment continues to increase, manufacturers need to strictly control the quality of electronic components to reduce the defect rate per million parts, minimize the problems of on-site returns and warranties related to electronic components, and reduce liability issues caused by failure of electronic components. Therefore, PAT methods can generally be used to test electronic components to eliminate abnormal parts.

[0037] Currently, the PAT method is generally a test method used for semiconductor chip testing. It mainly determines whether the test results are within the test specification range. If so, it is determined that the chip has passed the test, that is, the chip quality is qualified. However, the test results of semiconductor chips usually conform to the normal distribution. The inventors found that if the PAT method is directly applied to the test of electronic components of a vehicle, the test results may identify abnormal electronic components as normal electronic components. When these abnormal electronic components are shipped as good products, it will affect the quality of electronic component manufacturing. Therefore, the existing PAT method cannot meet the production needs of higher electronic components.

[0038] The defects existing in the solutions in the above-mentioned prior art are the results obtained by the inventor after practice and careful research. Therefore, the discovery process of the above-mentioned problems and the solutions proposed in the embodiments of the present invention for the above-mentioned problems below should all be the contributions made by the inventor to the present invention during the process of the present invention.

[0039] Based on the above problems, an embodiment of the present application provides a device testing method, which selects the intersection range of the dynamic part average test and the target specification range as the test range of the target device, and then uses the test range to test the target device. Since the judgment range and the target specification range of the dynamic part average test are limit values ​​determined for different quality requirements, a smaller intersection range is selected therefrom for testing, thereby effectively detecting abnormal devices and reducing the probability of misidentification to meet higher production requirements of electronic components.

[0040] Please refer to Figure 1 , Figure 1A flow chart of a device testing method provided in an embodiment of the present application, the method comprising the following steps: Step S110: Determine the test range of the target devices in the batch to be tested.

[0041] The target devices of the batch to be tested may refer to some target devices that need to be tested, and the target devices may refer to electronic components, such as capacitors, resistors, inductors, magnetic beads, crystal oscillators, chips, discrete devices, relays, cells, battery modules, battery packs, etc. The target devices may refer to any one of them. The chip here may refer to various chips, such as the main chip of the battery management system (BMS), the BMS isolation chip, etc.

[0042] The target devices in the batch to be tested may refer to a large number of target devices, such as tens of thousands of target devices. In order to detect abnormal devices in these target devices to check whether they are qualified, the present solution performs testing by acquiring a test range.

[0043] The test range refers to the intersection of the judgment range of the dynamic part average test (PAT) of the target device and the target specification range. The judgment range is calculated based on the test parameters of a preset number of target devices, and the target specification range is obtained by reducing the original specification range of the target device according to a set ratio.

[0044] In some embodiments, the judgment range of PAT can be calculated by obtaining the test parameters of a preset number of target devices. The preset number can be set according to actual needs. For example, if the preset number is N and N is 1000, it means that the upper and lower limits of the judgment range are calculated by obtaining the test parameters of 1000 target devices. The 1000 target devices here can refer to any 1000 target devices in the batch to be tested, or can also be 1000 target devices selected according to the production order, or can also be selected from 1000 target devices according to some rules, such as random selection, selection according to a certain production interval, stratified random sampling (dividing the target devices into multiple groups, and then randomly selecting some target devices from each group), using random numbers to determine which target devices are selected (the random number can correspond to the production sequence number or identification of the target device), etc. The specific selection methods are not listed here one by one, and the corresponding method can be flexibly selected according to actual needs to select a preset number of target devices.

[0045] After selecting a preset number of target devices, the test parameters of the target devices can be collected by relevant collection equipment, and the collection equipment can transmit the test parameters to the test equipment for subsequent calculation. The test parameters can be different for different test information. For example, the test parameters of capacitors include capacitance, loss, leakage current, etc., the test parameters of resistors include resistance, etc.; the test parameters of inductors include inductance value, DC resistance, etc.; the test parameters of magnetic beads include impedance, DC resistance, etc.; the test parameters of crystal oscillators include frequency, resistance, etc.; the test parameters of BMS main chip and BMS isolation chip include input and output voltage, static leakage current, current when input is high / low, current when output is high / low, static current (current under static conditions, used to detect leakage current and short circuit faults), etc.; discrete devices such as diodes, transistors, MOS tubes, etc., the test parameters of diodes and triodes include voltage drop difference, leakage current, etc., the test parameters of MOS tubes include turn-on voltage, drain current, on-resistance, etc.; the test parameters of relays include pull-in voltage, release voltage, action time, release time, bounce time, contact resistance, etc.; the test parameters of battery cells include capacity, voltage, internal resistance, etc.; the test parameters of battery modules include capacity, voltage, internal resistance, etc.; the test parameters of battery packs include capacity, voltage, internal resistance, etc.

[0046] It is understandable that corresponding equipment may be selected to collect corresponding test parameters according to test requirements, and then the upper and lower limits of the PAT judgment range may be calculated according to the test parameters.

[0047] The original specification range of the target device may refer to the upper and lower limits of the test parameters of the target device specified in the technical specification. The original specification range may be considered as the regulatory requirements that the test parameters of the target device need to meet, or may be understood as the minimum qualification requirements that the test parameters of the target device need to meet. The original specification range may be manually entered into the test equipment, or may be pre-stored in the test equipment and directly read. For example, the original specification ranges corresponding to various test parameters of various devices are pre-stored in the test equipment. When testing the current test parameters of the target device, the corresponding original specification range may be obtained by searching.

[0048] In some implementations, the original specification range may be relatively large, and using the original specification range to directly test may result in missing some unqualified products, leading to missed inspections. Therefore, the target specification range may be obtained by reducing the original specification range according to a set ratio. In this way, the target specification range obtained is smaller, and more stringent inspections can be performed on the target device.

[0049] The setting ratio can be flexibly set according to actual needs. For example, if the setting ratio is 20%, the target specification range refers to the range after the original specification range is reduced by 20%. Assuming that the upper limit value of the original specification range is X1 and the lower limit value is X2, the upper limit value of the target specification range is X1*20% and the lower limit value is X2*20%.

[0050] It is understandable that in other implementations, in order to expand or reduce the original specification range, the target specification range can also be obtained by adding or subtracting a set value on the basis of the original specification range. Alternatively, a conversion formula between the original specification range and the target specification range can be constructed, such as a linear conversion formula, an exponential conversion formula, etc. Other implementations are not described one by one here.

[0051] In addition, the test range can be understood as the threshold range used for the test, including the upper limit and the lower limit. The judgment range and the target specification range both include the upper limit and the lower limit. In the implementation method of selecting the intersection range from the judgment range and the target specification range as the test range, the upper and lower limits of the judgment range can be compared with the upper and lower limits of the target specification range. For example, the upper limit of the judgment range is USL1, and the lower limit is LSL1. The upper limit of the target specification range is USL2, and the lower limit is LSL2. When comparing, the upper limit USL1 is compared with USL2, and then the smaller upper limit is selected from them. The lower limit LSL1 is compared with LSL2, and then the larger lower limit is selected from them. For example, if USL1 is less than USL2 and LSL1 is greater than LSL2, the determined test range is the upper limit USL1 and the lower limit LSL1. In this way, a smaller threshold can be obtained for detection, which can reduce the probability of false recognition.

[0052] It can be understood that if the judgment range is within the target specification range, the test range is equal to the judgment range; if the target specification range is within the judgment range, the test range is equal to the target specification range; if the two have an intersection, the intersection range is selected as the test range. Therefore, the present application provides a more flexible range selection method, in which the intersection range is selected as the test range in the judgment range and the target specification range. In some cases (such as when the judgment range is greater than the target specification range or when there is a non-intersecting range between the judgment range and the target specification range), the test range can be narrowed to reduce the probability of misidentification. Since electronic components are tested in large quantities, a stricter test range can better detect abnormal devices.

[0053] Step S120: testing the target devices of the batch to be inspected using the test range to obtain test results.

[0054] When the target device is tested using the test range, each target device in the batch to be tested can be tested. For example, if there are 10,000 target devices in the batch to be tested, the test parameters of each target device will be compared with the test range. If the test parameters are not within the test range, the target device can be considered to be an abnormal product, that is, the test result of the target device is abnormal. On the contrary, if the test parameters are within the test range, the target device is considered to be a qualified product and the test result is qualified.

[0055] In the above implementation process, the intersection range of the PAT judgment range and the target specification range is selected as the test range of the target device, and then the target device is tested using the test range. Since the PAT judgment range and the target specification range are limit values ​​determined for different quality requirements, a smaller test range (i.e., the intersection range) is selected for testing, thereby effectively detecting abnormal devices and reducing the probability of misidentification to meet higher production requirements of electronic components.

[0056] In some embodiments, the testing device may provide a human-computer interaction interface, and the test results may be displayed through the human-computer interaction interface, so that the tester can see the real-time test results through the human-computer interaction interface, thereby quickly knowing the test status of the target device of the batch to be tested.

[0057] In some embodiments, the test device may be an MES (Manufacturing Execution System) device, which may collect test parameters and perform tests during the production process, such as collecting test parameters of each target device, and then using the test method of the present application to perform the test and output the test results. The MES device may execute the test program corresponding to the test method, trigger quality problem alarms or notifications, and record quality-related information for analysis and tracking, etc.

[0058] Each target device can be connected to the MES device for communication. The control software of the target device can be integrated in the MES device. During the test, the tester can use the control software to connect the target device to the MES device. For example, when the tester opens the control software, he can configure the IP address, port number, etc. of the target device. These configuration options can be placed in the password unlocking setting interface. These configuration options can be encrypted with a password. The configuration can only be realized after successful decryption to ensure the security of the configuration. A "MES connection" button can also be added to the display interface of the control software. The tester can click the button to trigger the communication connection between the target device and the MES device. If the connection is successful, it can be marked on the display interface, such as the button is displayed in green. If the connection is unsuccessful, a prompt can also be given, such as the button is displayed in gray, so that the tester can intuitively see the connection status.

[0059] In order to improve the test efficiency, the target devices of the batch to be tested can be communicated with the MES equipment in batches, so that the MES equipment can perform rapid testing.

[0060] In some embodiments, when testing, the target devices of the batch to be tested will first arrive at the testing station, and the MES device can send an entry instruction to the industrial control device, and the industrial control device will control the corresponding transmission device to transmit the target devices of the batch to be tested to the testing station. The industrial control device will send the production batch number, production material number and other information of the target device of the current batch to be tested to the MES device, and the MES device or the corresponding acquisition device will collect the test parameters of each target device and perform subsequent testing processes. For example, the tester can trigger the test start button on the MES device to start the test. After the test is completed, the MES device can send a material unloading instruction to the industrial control device. After receiving the material unloading instruction, the industrial control device can check whether the batch number and material number of the currently loaded device are consistent with the information in the material unloading instruction. After confirming that they are consistent, the material information is cleared, and the transmission device is controlled to transport the target device to the location of the next step.

[0061] During the test, the test parameters of each target device are compared with the test range. Each time a target device is tested, the test result is saved in a local folder, and each test result can be marked with the logo of the corresponding target device for easy identification. The test results of the target devices of a test batch can be saved in a table, which can facilitate quick viewing of the test results of each target device.

[0062] On the basis of the above-mentioned embodiments, in the method of testing the target devices, in order to facilitate the overall evaluation of the qualification of the target devices of the batch to be inspected, the target devices of the batch to be inspected can be tested using the test range first, and the test results of each target device can be obtained. Then, the CPK (Process Capability Index) corresponding to the target devices whose test results are preliminarily qualified is obtained, which can be referred to as the first process capability index here, and then the overall test results of the preliminarily qualified target devices are determined based on the CPK.

[0063] The test range can be used to determine whether the test parameters of each target device are within the test range, so as to obtain the test results of each target device, including abnormal or qualified. The test range can be used to first detect the abnormal target devices in the batch to be tested, and when leaving the factory, these abnormal target devices will be eliminated, and qualified target devices will be retained for shipment. Qualified target devices are considered to be preliminarily qualified devices determined by preliminary tests. CPK can be used to measure the stability and consistency of the product production process, and it can evaluate the capability of the process by analyzing the discreteness of the data. Therefore, the overall pass rate of these devices can be further judged by CPK.

[0064] In some embodiments, CPK can be calculated based on the average value, standard deviation, and upper and lower limits of the specification in the generation process. In the present application scheme, the average value and standard deviation can be calculated based on the test parameters of a set number of target devices in the preliminary qualification. The set number of target devices here can be selected from the preliminary qualified target devices, and then CPK is calculated based on the test range, average value, and standard deviation.

[0065] The calculation formula of CPK can be shown as follows: ; in, represents the standard deviation, represents the average value, USL represents the upper limit of the test range, and LSL represents the lower limit of the test range.

[0066] The mean can be used to measure the central tendency of a data set, and the standard deviation can be used to measure the dispersion of data. In some embodiments, the mean can refer to the mean of a set number of test parameters, and the standard deviation can be obtained by calculating the deviation of each test parameter from the mean.

[0067] In other embodiments, since the test parameters of the target device may not be normally distributed, in order to obtain a more accurate mean value and standard deviation, the interquartile range method may be used to determine the mean value and standard deviation, that is, the mean value may be determined by obtaining the quartiles of the test parameters of a set number of target devices. The interquartile range method has good robustness to outliers and extreme values. When there are outliers in the data set, the mean value and standard deviation determined by the traditional method may be greatly affected, resulting in distorted results. The use of the interquartile range method can reduce the impact of these outliers on the statistical results, so that the calculated mean value and standard deviation can better reflect the central trend and dispersion of the data.

[0068] Specifically, quartiles are to arrange all the data in a set number of test parameters (such as N test parameters) from small to large and divide them into four equal parts. The data at the three dividing points are the quartiles.

[0069] The first quartile Q1 is equal to the 25% data after the N test parameters are arranged from small to large, the second quartile Q2 is equal to the 50% data after the N test parameters are arranged from small to large, and the third quartile Q3 is equal to the 75% data after the N test parameters are arranged from small to large. The difference between the third quartile and the first quartile is also called the interquartile range.

[0070] When calculating the average, the second quartile Q2 can be used as the average. If N is an odd number, Q2 is the middle number, and if N is an even number, Q2 is the average of the two middle numbers. Since the second quartile Q2 is the median, it reflects the central tendency of the data and is not affected by extreme values, so it can more objectively reflect the actual situation of the data.

[0071] Then calculate the interquartile range = Q3-Q1, then the standard deviation = (Q3-Q1) / 1.35. The mean and standard deviation obtained in the above way can better handle outliers and non-normal distribution in the data.

[0072] In the above implementation process, the test range can be used to perform qualification inspection on each target device. For the preliminarily qualified target devices, their overall qualification can be further evaluated through CPK. Since CPK can be used to measure the stability and consistency of the product production process, it can evaluate the process capability by analyzing the discreteness of the data. Therefore, CPK can be used to evaluate the risk of defective products in the device production process, and further improve the test quality of the device.

[0073] Based on the above embodiment, the larger the CPK value, the more likely it is that the process can stably produce products that meet the specifications, while the lower the CPK value, the greater the variability in the process. Therefore, when testing the conformity of the entire batch, if the first process capability index CPK is greater than or equal to the first set threshold, the overall test result of the preliminarily qualified target device is determined to be qualified.

[0074] The first threshold value can be set according to actual needs. For example, it is generally set to 1.33 based on experience. Usually, a CPK above 1.33 is considered to be a good process capability. For another example, the first threshold value can also be set to 0.8, and it is considered that the quality of the target device is qualified when the process capability reaches more than 80%.

[0075] It can be understood that if CPK is greater than or equal to the first set threshold, the overall test results of the preliminarily qualified target devices are considered qualified. For example, the target devices in the batch to be tested contain 10,000 devices. After testing using the test range, there are 9,000 preliminarily qualified target devices. Then, a set number N of target devices are selected from these 9,000 target devices, and their test parameters are collected to calculate CPK. If the calculated CPK is greater than or equal to the first set threshold, the overall test results of the 9,000 target devices are considered qualified, otherwise, they are considered unqualified.

[0076] It is understandable that further testing using CPK may be aimed at some manufacturers' strict quality requirements. Originally, after testing using the test range, the qualified target devices have been able to meet the basic quality requirements. Therefore, even if the overall test results of the above-mentioned preliminarily qualified target devices are unqualified, these preliminarily qualified target devices can also be shipped to some manufacturers with less strict quality requirements.

[0077] In the above implementation process, a larger CPK value indicates that the process can stably produce products that meet the specification requirements. Therefore, when CPK is greater than or equal to the first set threshold, it indicates that the risk of producing defective products in the device production process is lower and the pass rate is higher.

[0078] Based on the above embodiment, the above first set threshold may be determined by CPK calculated based on the test parameters of the target device of the historical inspection batch.

[0079] The target devices of the historical inspection batch can be the target devices of the most recent inspection batch or the target devices of the previous inspection batch. The number of historical inspection batches may not be specifically limited, for example, K. In this way, the CPK corresponding to the target devices of each historical inspection batch can be calculated, and the calculation method of the CPK is as shown above, and then the average value of the K CPKs is calculated, and the average value is used as the first set threshold.

[0080] In other implementations, a CPK may be selected from the K CPKs as the first set threshold, for example, a CPK at the median is selected as the first set threshold.

[0081] Alternatively, a machine learning algorithm may be used to predict the first set threshold value based on the CPK calculated based on the test parameters of the target device of the historical inspection batch.

[0082] In the above implementation process, the CPK value calculated by historical test parameters can reflect the actual performance of the production process over a period of time and can provide a reliable reference standard for the qualification assessment of the current batch.

[0083] Based on the above embodiments, in actual applications, some devices do not have process deviations during the production process, so their overall qualification can be evaluated by CP (Process Capability Index). In this case, there is no need to calculate CPK, but rather by calculating CP. CP is a measure of process capability, which indicates the ability of a process to meet specification requirements without considering the center position of the process.

[0084] Therefore, when the target device is a special device, such as a capacitor, and the test parameter is the leakage current of the capacitor, the test range can be used to test the target devices of the batch to be inspected, and the test results of each target device can be obtained. Then, the CP (here referred to as the second process capability index) corresponding to the target devices with preliminarily qualified test results can be obtained, and the overall test results of the preliminarily qualified target devices can be determined based on the CP.

[0085] The method of using the test range to test each target device in the batch to be tested can refer to the relevant description in the above embodiment, and will not be repeated here. The test range can be used to first detect abnormal target devices in the batch to be tested, and when leaving the factory, these abnormal target devices are eliminated, and qualified target devices are retained for shipment. Qualified target devices are considered to be preliminarily qualified devices determined by preliminary testing, and the overall qualified rate of these devices can be further determined by CP.

[0086] In some embodiments, CP can be calculated based on the average value, standard deviation, and upper and lower limits of the specification in the generation process. In the present application scheme, the average value and standard deviation can be calculated based on the test parameters of a set number of target devices in the preliminary qualification. The set number of target devices here can be selected from the preliminary qualified target devices, and then the CP is calculated based on the upper limit value or lower limit value, the average value and the standard deviation in the test range.

[0087] The calculation formula of CP can be shown as follows: ;or ; in, represents the standard deviation, represents the average value, USL represents the upper limit of the test range, and LSL represents the lower limit of the test range.

[0088] The average value may refer to the average value of a set number of test parameters, and the standard deviation is obtained by calculating the deviation of each test parameter from the average value. Alternatively, the average value and the standard deviation may also be obtained by the above-mentioned interquartile range method, which will not be repeated here.

[0089] In the above implementation process, CP can reflect the variability or discreteness of the measurement process, which is better suitable for tests that do not consider the deviation between the process mean and the specification center. Therefore, using CP to perform qualification assessment on some specified devices can better evaluate their production quality.

[0090] Based on the above embodiment, if there is only an upper limit value, it means that the smaller the CP, the better, but it cannot be a negative number, and 0 is the natural lower limit. If there is only an upper limit value, it means that the larger the CP, the better, but it cannot exceed 100%, and the natural upper limit is 100%. Therefore, when testing the qualification of the entire batch, if the CP is greater than or equal to the second set threshold or the CP is less than or equal to the third set threshold, the overall test result of the preliminarily qualified target device is determined to be qualified.

[0091] Among them, the second set threshold and the third set threshold can be flexibly set according to actual needs, or can also be determined based on the CP calculated based on the test parameters of the target device of the historical inspection batch, which is similar to the determination method of the above-mentioned first set threshold. For details, please refer to the implementation process in the above-mentioned embodiment.

[0092] It can be understood that when CP is greater than or equal to the second set threshold or CP is less than or equal to the third set threshold, the overall test result of the preliminarily qualified target device is considered to be qualified. For example, the target device batch to be tested contains 10,000 devices. After testing using the test range, there are 9,000 preliminarily qualified target devices. Then, a set number N of target devices are selected from these 9,000 target devices, and their test parameters are collected to calculate CP. If the calculated CP is greater than or equal to the second set threshold or less than or equal to the third set threshold, the overall test result of these 9,000 target devices is considered to be qualified, otherwise, it is considered to be unqualified.

[0093] It is understandable that further testing using CP can be aimed at some manufacturers' strict quality requirements. After testing using the test range, the qualified target devices can already meet the basic quality requirements. Therefore, even if the overall test results of the above-mentioned preliminarily qualified target devices are unqualified, these preliminarily qualified target devices can also be shipped to some manufacturers with less strict quality requirements.

[0094] In the above implementation process, in some cases, the larger the CP or the smaller the CP, the stronger the potential capability of the process, so when the CP is greater than or equal to the second set threshold or less than or equal to the third set threshold, the production quality of the device is higher.

[0095] On the basis of the above-mentioned embodiment, when the CP is used for qualification assessment, it is only for some specified devices. For example, the target device is a capacitor, and the corresponding test parameter is the leakage current of the capacitor. In this case, the smaller the leakage current, the better, so the upper limit value in the test range can be used to calculate the CP. When evaluating the qualification, if the CP is less than or equal to the third set threshold value, the overall test result of the capacitor is considered to be qualified.

[0096] In the method of calculating the mean value and standard deviation based on the leakage current, the above-mentioned interquartile range method can also be used to obtain it. First, the leakage currents of a set number of capacitors that have been preliminarily qualified are arranged in order of size and divided into four equal parts. Then, the second quartile in the four equal parts is determined as the mean value, and the interquartile range is determined based on the first quartile and the third quartile in the four equal parts, and the standard deviation is determined based on the interquartile range.

[0097] For example, 1000 capacitors are selected from the preliminary qualified ones, the leakage current values ​​of these 1000 capacitors are collected, and then these 1000 leakage current values ​​are arranged in order of size, for example, from small to large, and then divided into four equal parts. If the data is at the three division points, it is the quartile.

[0098] The first quartile Q1 is equal to the 25% data after the N test parameters are arranged from small to large, the second quartile Q2 is equal to the 50% data after the N test parameters are arranged from small to large, and the third quartile Q3 is equal to the 75% data after the N test parameters are arranged from small to large. The difference between the third quartile and the first quartile is also called the interquartile range.

[0099] When calculating the mean, the second quartile Q2 can be used as the mean. If N is an odd number, Q2 is the middle number. If N is an even number, Q2 is the average of the two middle numbers.

[0100] Then calculate the interquartile range = Q3-Q1, then the standard deviation = (Q3-Q1) / 1.35. The mean and standard deviation obtained in the above way can better handle outliers and non-normal distribution in the data.

[0101] After obtaining the mean value and standard deviation, substitute them into the above CP calculation formula to obtain CP.

[0102] It can be understood that for some other devices, it is also possible to choose whether to use the upper limit value or the lower limit value in the test range to calculate the CP according to the characteristics of their test parameters. If the upper limit value is selected to calculate the CP, the third set threshold value can be used to judge its overall qualification, that is, if the CP is less than or equal to the third set threshold value, then the overall test result is considered to be qualified. If the lower limit value is selected to calculate the CP, the second set threshold value can be used to judge its overall qualification, that is, if the CP is greater than or equal to the second set threshold value, then the overall test result is considered to be qualified.

[0103] In the above implementation process, since the leakage current of the capacitor is as small as possible, when evaluating the product quality through the leakage current, the product quality can be better evaluated through CP.

[0104] Based on the above embodiment, in the above method of calculating the judgment range of PAT, the average value and standard deviation can be calculated according to the test parameters of a preset number of target devices, and then the average value plus the set multiple of the standard deviation can be used as the upper limit value of the judgment range, and the average value minus the set multiple of the standard deviation can be used as the lower limit value of the judgment range.

[0105] The preset number of target devices here can be target devices selected from the batch to be inspected. The preset number can be set according to actual needs. For example, if it is 1000, 1000 target devices can be selected from the batch to be inspected, and then the test parameters of these 1000 target devices can be obtained to calculate the mean and standard deviation. The method for calculating the mean and standard deviation can also be obtained by the interquartile range method in the above embodiment, which will not be described in detail here.

[0106] The preset multiple can also be flexibly set according to actual test requirements, for example, it is generally set to 6. In this solution, the electronic components in the vehicle are tested, and the test is more rigorous, so in some implementations, the set multiple can be a value greater than or equal to 1 and less than 6. In this way, a stricter test range can be obtained to meet higher device production requirements.

[0107] The calculation formula of PAT judgment range is as follows: ; ; Among them, USL is the upper limit value in the judgment range, and LSL is the lower limit value in the judgment range. is the average value, is the standard deviation, and a is the set multiple.

[0108] It can be understood that after the target specification range is determined as above, the intersection range is selected from the judgment range and the target specification range as the test range, so the upper limit value in the test range refers to the smaller value of the upper limit value in the judgment range and the upper limit value in the target specification range, and the lower limit value in the test range refers to the larger value of the lower limit value in the judgment range and the lower limit value in the target specification range.

[0109] In some implementations, based on long-term production test experiments, it is found that when the setting multiple is set to 3, the quality requirements of electronic components on the vehicle can be better met, so that electronic components that do not meet the quality requirements can be more accurately detected, so the setting multiple can be set to 3. In this way, the quality inspection of electronic components on the vehicle can be better adapted to accurately detect electronic components that do not meet the quality requirements.

[0110] In the above-mentioned method of calculating the judgment range of PAT, the program of general test equipment is set with a default lower limit value, which is generally set to 0. The inventors have found in actual research that the lower limit value in the calculated judgment range of PAT may be less than 0. In this case, the lower limit value may be negative. In this case, an abnormal bug will appear in the test program. Therefore, the test program can be modified accordingly, that is, when the lower limit value of the judgment range is calculated to be a negative value, the calculated negative value is retained, rather than performing the test according to the default lower limit value specified in the test program.

[0111] The above test process is described below with reference to several specific embodiments.

[0112] (1) For example, if the target device is a capacitor, its test parameter is the capacitance.

[0113] First calculate and determine the judgment range and target specification range. The judgment range is obtained by the above method. For example, first select N1 (for example, 1000) capacitors from the batch to be tested, and then collect the capacitance of these N1 capacitors. The corresponding mean and standard deviation can be calculated based on the interquartile range method, and then substituted into the calculation formula of the judgment range to obtain the upper limit USL1 and lower limit LSL1 of the judgment range. By looking up the technical specification sheet corresponding to the capacitor, determine the original specification range corresponding to its capacitance. The original specification range can be manually entered into the test equipment. The test equipment determines the target specification range based on the original specification range, for example, the target specification range = original specification range * 20%, and the target specification range includes the upper limit USL2 and the lower limit LSL2.

[0114] The test range is determined according to the judgment range and the target specification range. For example, the test range finally determined includes an upper limit value USL1 and a lower limit value LSL2.

[0115] During the test, the capacitance of each capacitor in the batch to be tested is collected, and then the capacitance of each capacitor is compared with the upper limit value USL1 and the lower limit value LSL2 to determine whether the capacitance exceeds the upper and lower limits. If it exceeds, the capacitor is considered unqualified, and if it does not exceed, it is considered preliminarily qualified.

[0116] For the preliminarily qualified capacitors, assume that there are N2 preliminarily qualified capacitors, and then select a set number (for example, N3) of capacitors to calculate the capacitance value and standard deviation. The interquartile range method can also be used here to obtain it, and then substitute the test range (upper limit USL1 and lower limit LSL2), the average value and the standard deviation into the above CPK calculation formula to calculate CPK, and then use CPK to perform an overall qualification test on the capacitor.

[0117] (2) For example, the target device is a battery cell and its test parameter is capacity.

[0118] First calculate and determine the judgment range and target specification range. The judgment range is obtained by the above method. For example, first select N4 battery cells from the batch to be tested, and then collect the capacity of these N4 battery cells. The corresponding mean and standard deviation can be calculated based on the interquartile range method, and then substitute them into the calculation formula of the judgment range to obtain the upper limit USL3 and lower limit LSL4 of the judgment range. By looking up the technical specification sheet corresponding to the battery cell, determine the original specification range corresponding to its capacity. The original specification range can be manually entered into the test equipment. The test equipment determines the target specification range based on the original specification range, for example, the target specification range = original specification range * 20%, and the target specification range includes the upper limit USL3 and the lower limit LSL4.

[0119] The test range is determined according to the judgment range and the target specification range. For example, the test range finally determined includes an upper limit value USL3 and a lower limit value LSL3.

[0120] During the test, the capacity of each battery cell in the batch to be tested is collected, and then the capacity of each battery cell is compared with the upper limit value USL3 and the lower limit value LSL3 to determine whether the capacity exceeds the upper and lower limits. If it exceeds, the battery cell is considered unqualified, and if it does not exceed, it is considered preliminarily qualified.

[0121] For the preliminarily qualified battery cells, assume that there are N5 preliminarily qualified battery cells, and then select a set number (for example, N6) of the capacity of the battery cells to calculate the mean and standard deviation. The interquartile range method can also be used here to obtain it, and then substitute the test range (upper limit USL3 and lower limit LSL3), the mean and standard deviation into the above CPK calculation formula to calculate CPK, and then use CPK to perform an overall qualification test on the battery cells.

[0122] (3) For example, the target device is a capacitor and its test parameter is leakage current.

[0123] First calculate and determine the judgment range and target specification range. The judgment range is obtained by the above method. For example, first select N7 capacitors from the batch to be tested, and then collect the leakage current of these N7 capacitors. The corresponding mean and standard deviation can be calculated based on the interquartile range method, and then substitute them into the calculation formula of the judgment range to obtain the upper limit USL5 and lower limit LSL6 of the judgment range. By looking up the technical specification sheet corresponding to the capacitor, determine the original specification range corresponding to its leakage current. The original specification range can be manually entered into the test equipment. The test equipment determines the target specification range based on the original specification range, for example, the target specification range = original specification range * 20%, and the target specification range includes the upper limit USL5 and the lower limit LSL6.

[0124] The test range is determined according to the judgment range and the target specification range. For example, the test range finally determined includes an upper limit value USL6 and a lower limit value LSL6.

[0125] During the test, the leakage current of each capacitor in the batch to be tested is collected, and then the leakage current of each capacitor is compared with the upper limit value USL6 and the lower limit value LSL6 to determine whether the leakage current exceeds the upper and lower limits. If it exceeds, the capacitor is considered unqualified, and if it does not exceed, it is considered preliminarily qualified.

[0126] For the preliminarily qualified capacitors, assume that there are N8 preliminarily qualified capacitors, and then select a set number (for example, N9) of the leakage current of the capacitors to calculate the average and standard deviation. The interquartile range method can also be used here to obtain it, and then substitute the test range (upper limit USL6 or lower limit LSL6), the average and the standard deviation into the above CP calculation formula to calculate the CP, and then use the CP to perform an overall qualification test on the capacitor.

[0127] It can be understood that the specific values ​​of N1-N9 mentioned above can be flexibly set according to actual conditions.

[0128] In conjunction with the above embodiments, please refer to Figure 2 , Figure 2 This is a structural block diagram of a device testing device 200 provided in an embodiment of the present application. The device 200 may be a module, program segment or code on an electronic device. It should be understood that the device 200 is similar to the above-mentioned Figure 1 The method embodiment corresponds to and can be executed Figure 1 The various steps involved in the method embodiment and the specific functions of the device 200 can be found in the above description. To avoid repetition, the detailed description is appropriately omitted here.

[0129] Optionally, the device 200 includes: The limit value determination module 210 is used to determine the test range of the target device of the batch to be tested, wherein the test range refers to the intersection range of the judgment range of the average test of the dynamic parts of the target device and the target specification range, the judgment range is obtained according to a preset number of test parameters of the target device, and the target specification range is obtained by reducing the original specification range of the target device according to a set ratio; The testing module 220 is used to test the target devices of the batch to be tested using the testing range to obtain the testing results.

[0130] Optionally, the test module 220 is used to test the target devices of the batch to be inspected using the test range to obtain the test results of each target device; obtain the first process capability index corresponding to the target device whose test result is preliminarily qualified; and determine the overall test result of the preliminarily qualified target device based on the first process capability index.

[0131] Optionally, the test module 220 is used to determine that the overall test result of the preliminarily qualified target device is qualified if the first process capability index is greater than or equal to a first set threshold.

[0132] Optionally, the first set threshold is determined by a first process capability index calculated based on test parameters of target devices in historical inspection batches.

[0133] Optionally, the test module 220 is used to calculate the average value and standard deviation according to the test parameters of a set number of target devices in the preliminary qualification; and obtain the first process capability index according to the test range, the average value and the standard deviation.

[0134] Optionally, if the target device is a capacitor and the test parameter is the leakage current of the capacitor, the test module 220 is used to test the target devices of the batch to be inspected using the test range to obtain the test results of each target device; obtain the second process capability index corresponding to the target device whose test result is preliminarily qualified; and determine the overall test result of the preliminarily qualified target device based on the second process capability index.

[0135] Optionally, the test module 220 is used to determine that the overall test result of the preliminarily qualified target device is qualified if the second process capability index is greater than or equal to a second set threshold or if the second process capability index is less than or equal to a third set threshold.

[0136] Optionally, the test module 220 is used to calculate the mean value and standard deviation based on the test parameters of a set number of target devices in the preliminary qualification; and obtain the second process capability index based on the upper limit value or lower limit value in the test range, and the mean value and the standard deviation.

[0137] Optionally, the mean value and the standard deviation are obtained by: Arrange the leakage currents of a set number of capacitors that have passed preliminary qualification in order of magnitude and divide them into four equal parts; determining the second quartile in the quartiles as the mean; The interquartile range is determined based on the first quartile and the third quartile in the four equal divisions, and the standard deviation is determined based on the interquartile range.

[0138] Optionally, the judgment range is obtained by: Calculate the average value and standard deviation based on the test parameters of a preset number of the target devices; The average value plus the standard deviation times a set value is used as the upper limit value of the judgment range, and the average value minus the standard deviation times a set value is used as the lower limit value of the judgment range.

[0139] Optionally, the set multiple is a value greater than or equal to 1 and less than 6.

[0140] Optionally, the set multiple is 3.

[0141] Optionally, the target device is a capacitor, a resistor, an inductor, a magnetic bead, a crystal oscillator, a chip, a discrete device, a relay, a battery cell, a battery module or a battery pack.

[0142] It should be noted that those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the device described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.

[0143] Please refer to Figure 3 , Figure 3A structural diagram of an electronic device for executing a device testing method provided in an embodiment of the present application, the electronic device may include: at least one processor 310, such as a CPU, at least one communication interface 320, at least one memory 330 and at least one communication bus 340. Among them, the communication bus 340 is used to realize the connection and communication between these components. Among them, the communication interface 320 of the device in the embodiment of the present application is used to communicate signaling or data with other node devices. The memory 330 can be a high-speed RAM memory or a non-volatile memory (non-volatile memory), such as at least one disk storage. The memory 330 can optionally also be at least one storage device located away from the aforementioned processor. Computer-readable instructions are stored in the memory 330. When the computer-readable instructions are executed by the processor 310, the electronic device executes the above-mentioned Figure 1 The method process is shown.

[0144] Understandably, Figure 3 The structure shown is for illustration only, and the electronic device may also include Figure 3 More or fewer components as shown, or with Figure 3 Different configurations are shown. Figure 3 Each component shown in the figure can be implemented by hardware, software or a combination thereof.

[0145] The present application embodiment provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the following is performed: Figure 1 The method process in the method embodiment shown is executed by the electronic device.

[0146] This embodiment discloses a computer program product, which includes a computer program stored on a non-transitory computer-readable storage medium. The computer program includes program instructions. When the program instructions are executed by a computer, the computer can perform the methods provided by the above method embodiments, for example, including: Determine the test range of the target device of the batch to be tested, wherein the test range refers to the intersection range of the judgment range of the average test of the dynamic parts of the target device and the target specification range, the judgment range is obtained according to a preset number of test parameters of the target device, and the target specification range is obtained by reducing the original specification range of the target device according to a set ratio; The target devices of the batch to be inspected are tested using the test range to obtain test results.

[0147] In summary, the embodiments of the present application provide a device testing method, apparatus, electronic device and storage medium. The method selects an intersection range from the judgment range of the dynamic part average test and the target specification range as the test range of the target device, and then uses the test range to test the target device. Since the judgment range and the target specification range of the dynamic part average test are ranges determined for different quality requirements, a smaller test range (i.e., the intersection range) is selected therefrom for testing, thereby effectively detecting abnormal devices and reducing the probability of misidentification to meet higher production requirements of electronic components.

[0148] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical or other forms.

[0149] In addition, the units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0150] Furthermore, the functional modules in the various embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

[0151] In this document, relational terms such as first and second, etc. are used merely to distinguish one entity or operation from another entity or operation, but do not necessarily require or imply any such actual relationship or order between these entities or operations.

[0152] The above description is only an embodiment of the present application and is not intended to limit the protection scope of the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A device testing method, characterized in that: The method comprises: Determine the test range of the target device of the batch to be tested, wherein the test range refers to the intersection range of the judgment range of the average test of the dynamic parts of the target device and the target specification range, the judgment range is obtained according to a preset number of test parameters of the target device, and the target specification range is obtained by reducing the original specification range of the target device according to a set ratio; The target devices of the batch to be inspected are tested using the test range to obtain test results.

2. The method according to claim 1, characterized in that: The step of testing the target devices of the batch to be tested using the test range to obtain the test results includes: Using the test range to test the target devices of the batch to be tested, and obtaining a test result of each target device; Obtaining a first process capability index corresponding to a target device whose test result is preliminarily qualified; An overall test result of a preliminarily qualified target device is determined based on the first process capability index.

3. The method according to claim 2, characterized in that The determining of the overall test result of the preliminarily qualified target device according to the first process capability index includes: If the first process capability index is greater than or equal to a first set threshold, the overall test result of the preliminarily qualified target device is determined to be qualified.

4. The method according to claim 3, characterized in that The first set threshold is determined by a first process capability index calculated based on test parameters of target devices of historical inspection batches.

5. The method according to claim 2, characterized in that: The step of obtaining a first process capability index corresponding to a target device whose test result is preliminarily qualified comprises: Calculate the mean and standard deviation based on the test parameters of a set number of target devices in preliminary qualification; A first process capability index is obtained based on the test range, the mean value and the standard deviation.

6. The method according to claim 1, characterized in that If the target device is a capacitor, the test parameter is the leakage current of the capacitor, and the test is performed on the target device of the batch to be tested using the test range to obtain the test result, including: Using the test range to test the target devices of the batch to be tested, and obtaining a test result of each target device; Obtaining a second process capability index corresponding to a target device whose test result is preliminarily qualified; The overall test result of the preliminarily qualified target device is determined according to the second process capability index.

7. The method according to claim 6, characterized in that The determining of the overall test result of the preliminarily qualified target device according to the second process capability index includes: If the second process capability index is greater than or equal to a second set threshold or if the second process capability index is less than or equal to a third set threshold, the overall test result of the preliminarily qualified target device is determined to be qualified.

8. The method according to claim 6, characterized in that The step of obtaining a second process capability index corresponding to a target device whose test result is preliminarily qualified comprises: Calculate the mean and standard deviation based on the test parameters of a set number of target devices in preliminary qualification; A second process capability index is obtained according to the upper limit value or the lower limit value in the test range, the mean value and the standard deviation.

9. The method according to claim 8, characterized in that The mean value and the standard deviation are obtained by: Arrange the leakage currents of a set number of capacitors that have passed preliminary qualification in order of magnitude and divide them into four equal parts; determining the second quartile in the quartiles as the mean; The interquartile range is determined based on the first quartile and the third quartile in the four equal divisions, and the standard deviation is determined based on the interquartile range.

10. The method according to any one of claims 1 to 9, characterized in that: The judgment range is obtained by: Calculate the average value and standard deviation based on the test parameters of a preset number of the target devices; The average value plus the standard deviation times a set value is used as the upper limit value of the judgment range, and the average value minus the standard deviation times a set value is used as the lower limit value of the judgment range.

11. A device testing apparatus, characterized in that: The device comprises: A limit value determination module, used to determine the test range of the target device of the batch to be tested, wherein the test range refers to the intersection range of the judgment range of the average test of the dynamic parts of the target device and the target specification range, the judgment range is obtained according to a preset number of test parameters of the target device, and the target specification range is obtained by reducing the original specification range of the target device according to a set ratio; The testing module is used to test the target devices of the batch to be tested using the testing range to obtain the testing results.

12. An electronic device, characterized in that: The method comprises a processor and a memory, wherein the memory stores computer-readable instructions. When the computer-readable instructions are executed by the processor, the method according to any one of claims 1 to 10 is executed.

13. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 10 is executed.

14. A computer program product, characterized in that The method comprises computer program instructions, and when the computer program instructions are read and executed by a processor, the method according to any one of claims 1 to 10 is executed.

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