A ripple test method and system for high voltage power supply

Abstract

The present application relates to the technical field of electrical variable measurement, and specifically to a ripple test method and system for high-voltage power supplies. The method includes: based on detection data, obtaining the ripple excess coefficient and the decomposed ripple waveform curve of the high-voltage power supply; based on the monitoring data of the load device, obtaining the stability coefficient of the environment in which the high-voltage power supply is located; based on the ripple excess coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located, obtaining the compensation coefficient for the ripple measurement of the high-voltage power supply; based on the compensation coefficient and detection data, obtaining the compensated identified ripple signal curve; based on the decomposed ripple waveform curve and the compensated identified ripple signal curve, obtaining the high-voltage power supply ripple waveform curve; based on the high-voltage power supply ripple waveform curve, measuring the ripple of the high-voltage power supply to obtain the measurement result. The present application improves the measurement accuracy of the existing test method in the process of measuring the ripple of the high-voltage power supply.

Description

Technical Field

[0001] The present application relates to the technical field of electrical variable measurement, and in particular to a ripple testing method and system for a high voltage power supply. Background Art

[0002] In power electronic equipment and power systems, the stability and ripple level of high-voltage power supply during operation directly affect the performance reliability of the distribution box. The output ripple of the power supply must be strictly controlled within the specified range to avoid affecting the normal operation and measurement accuracy of the power equipment. And high-precision ripple testing can provide accurate data for evaluating the quality and performance of high-voltage power supplies. By analyzing the ripple test results, problems in the high-voltage power supply design can be found.

[0003] At present, in the process of measuring the ripple of high-voltage power supply, the existing test method, especially in high-voltage environment, the change of electromagnetic field will generate induced current, which will affect the normal operation of the measuring equipment and cause deviation in the measurement results. In addition, if the high-voltage power supply is unstable, it will also generate some interference, which will be superimposed on the ripple signal, making the high-precision, low-amplitude ripple measurement accuracy insufficient, resulting in large errors in the ripple measurement results. Summary of the invention

[0004] In order to solve the technical problem of low measurement accuracy in the process of measuring the ripple of high-voltage power supply in the existing test method, the purpose of this application is to provide a ripple test method and system for high-voltage power supply, and the technical solution adopted is as follows:

[0005] A ripple test method for a high voltage power supply, the method comprising:

[0006] Acquire detection data during the high-voltage power supply ripple measurement process and monitoring data of load equipment connected to the high-voltage power supply;

[0007] Based on the detection data in the high-voltage power supply ripple measurement process, obtaining the ripple excess coefficient of the high-voltage power supply and the decomposed ripple waveform curve;

[0008] Based on the monitoring data of the load device, a stability coefficient of the environment in which the high voltage power supply is located is obtained;

[0009] Based on the ripple excess coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located, a compensation coefficient for ripple measurement of the high-voltage power supply is obtained;

[0010] Based on the compensation coefficient of the ripple measurement of the high-voltage power supply and the detection data in the process of measuring the ripple of the high-voltage power supply, a ripple signal curve of compensation identification in the output voltage is obtained;

[0011] Based on the decomposed ripple waveform curve and the compensated identified ripple signal curve, a high voltage power supply ripple waveform curve is obtained;

[0012] Based on the high-voltage power supply ripple waveform curve, the ripple of the high-voltage power supply is measured to obtain a measurement result.

[0013] Preferably, based on the detection data in the high-voltage power supply ripple measurement process, the specific steps of obtaining the ripple excess coefficient of the high-voltage power supply include:

[0014] Based on the detection data in the high-voltage power supply ripple measurement process, the outlier index of each data point in the detection data is obtained by using the LOF outlier factor algorithm;

[0015] Based on the outlier index of each data point in the detection data and the average amplitude of all data points in the detection data, the ripple excess coefficient of the high voltage power supply is obtained.

[0016] Preferably, the specific steps of obtaining the decomposed ripple waveform curve include:

[0017] Based on the detection data in the high-voltage power supply ripple measurement process, obtaining the output voltage of the high-voltage power supply;

[0018] Decomposing the output voltage of the high-voltage power supply to determine the characteristic value of the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply and the total number of components other than the ripple characteristic component and the characteristic values ​​of the remaining components;

[0019] Based on the characteristic value of the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply and the total number of components other than the ripple characteristic component and the characteristic values ​​of the remaining components, a decomposed ripple waveform curve is obtained.

[0020] Preferably, the specific step of confirming the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply includes:

[0021] Decompose the output voltage of the high voltage power supply to obtain each component of the output voltage;

[0022] The difference between the kurtosis value of each component and the kurtosis value of the standard Gaussian distribution is taken as the periodic characteristic of each component, and the result of multiplying the periodic characteristic with the average amplitude of each component is taken as the characteristic value of each component. The component with the largest characteristic value among all components is selected as the ripple characteristic component in the output voltage decomposition result.

[0023] Preferably, based on the monitoring data of the load device, the specific steps of obtaining the stability coefficient of the environment in which the high voltage power supply is located include:

[0024] Based on the monitoring data of the load device, obtaining the voltage monitoring value at each position in the voltage monitoring curve of the connected load of the high voltage power supply in the output voltage monitoring time period and the number of differences between two adjacent voltage monitoring values;

[0025] Based on the voltage monitoring value at each position in the voltage monitoring curve and the amount of difference between two adjacent voltage monitoring values, a stability coefficient of the environment in which the high voltage power supply is located is obtained.

[0026] Preferably, the specific steps of obtaining the compensation coefficient for the ripple measurement of the high-voltage power supply based on the ripple excess coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located include:

[0027] The ripple excess coefficient of the high-voltage power supply is compared with the stability coefficient of the environment in which the high-voltage power supply is located to obtain a compensation coefficient for the ripple measurement of the high-voltage power supply.

[0028] Preferably, based on the compensation coefficient of the ripple measurement of the high-voltage power supply and the detection data in the ripple measurement process of the high-voltage power supply, the specific steps of obtaining the compensated and identified ripple signal curve in the output voltage include:

[0029] Based on the detection data in the high-voltage power supply ripple measurement process, an output signal of the high-voltage power supply is obtained;

[0030] According to the output signal of the high-voltage power supply, each difference between each peak point and an adjacent valley point in the output signal of the high-voltage power supply is obtained;

[0031] Based on each difference and a compensation coefficient of the ripple measurement of the high voltage power supply, obtaining each compensated ripple identification characteristic value;

[0032] Based on each compensated ripple identification characteristic value, a compensated and identified ripple signal curve in the output voltage is obtained.

[0033] Preferably, based on each compensated ripple identification characteristic value, the specific steps of obtaining a compensated identified ripple signal curve in the output voltage include:

[0034] Arrange each compensated ripple identification characteristic value in ascending order to obtain a sorted characteristic value sequence;

[0035] According to the sorted characteristic value sequence, a ripple signal curve of compensation identification in the output voltage is obtained.

[0036] Preferably, the specific steps of obtaining the high-voltage power supply ripple waveform curve based on the decomposed ripple waveform curve and the compensated identified ripple signal curve include:

[0037] The decomposed ripple waveform curve and the compensated identified ripple signal curve are averaged to obtain a high voltage power supply ripple waveform curve.

[0038] A ripple test system for a high voltage power supply, comprising:

[0039] A data acquisition module, used to acquire detection data during the high-voltage power supply ripple measurement process and monitoring data of a load device connected to the high-voltage power supply;

[0040] A first acquisition module, configured to acquire a ripple exceeding expectation coefficient and a decomposed ripple waveform curve of the high-voltage power supply based on detection data in the high-voltage power supply ripple measurement process;

[0041] A second acquisition module is used to acquire a stability coefficient of the environment in which the high voltage power supply is located based on the monitoring data of the load device;

[0042] A third acquisition module, configured to obtain a compensation coefficient for ripple measurement of the high-voltage power supply based on the ripple exceeding expectation coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located;

[0043] A fourth acquisition module, configured to obtain a ripple signal curve of compensation identification in the output voltage based on the compensation coefficient of the ripple measurement of the high-voltage power supply and the detection data in the ripple measurement process of the high-voltage power supply;

[0044] A fifth acquisition module, configured to obtain a high-voltage power supply ripple waveform curve based on the decomposed ripple waveform curve and the compensated identified ripple signal curve;

[0045] The measuring module is used to measure the ripple of the high-voltage power supply based on the high-voltage power supply ripple waveform curve to obtain a measurement result.

[0046] This application has the following beneficial effects:

[0047] The present application obtains the ripple excess coefficient and the decomposed ripple waveform curve of the high-voltage power supply based on the detection data in the process of high-voltage power supply ripple measurement; obtains the stability coefficient of the environment in which the high-voltage power supply is located based on the monitoring data of the load device; obtains the compensation coefficient of the ripple measurement of the high-voltage power supply based on the ripple excess coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located; obtains the ripple signal curve of the compensation identification in the output voltage based on the compensation coefficient of the ripple measurement of the high-voltage power supply and the detection data in the process of high-voltage power supply ripple measurement; obtains the high-voltage power supply ripple waveform curve based on the decomposed ripple waveform curve and the compensated identification ripple signal curve; measures the ripple of the high-voltage power supply of the distribution box based on the high-voltage power supply ripple waveform curve to obtain the measurement result. The present application reduces the influence of electromagnetic field changes and high-voltage power supply instability in the process of high-voltage power supply ripple measurement in power equipment to a certain extent by obtaining a more accurate high-voltage power supply ripple waveform curve, further avoids deviations in the measurement results, and improves the accuracy of the ripple measurement results of the high-voltage power supply of the distribution box. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present application or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0049] Figure 1 A flow chart of a ripple testing method for a high voltage power supply provided in one embodiment of the present application;

[0050] Figure 2 A schematic structural diagram of a ripple test system for a high-voltage power supply provided in one embodiment of the present application. DETAILED DESCRIPTION

[0051] In order to further explain the technical means and effects adopted by the present application to achieve the predetermined invention purpose, the following is a detailed description of the ripple test method and system for a high-voltage power supply proposed in the present application, its specific implementation, structure, features and effects, in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0052] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0053] The ripple in this application refers to the AC component superimposed on the output voltage of the DC power supply. For the high-voltage power supply in the power equipment, the existence of ripple will have an adverse effect on the stability of the system, and high-precision ripple measurement can accurately evaluate the stability of the operation of the high-voltage power supply to ensure the overall performance of the power equipment.

[0054] The following is a detailed description of a ripple testing method and system for a high-voltage power supply provided by the present application in conjunction with the accompanying drawings.

[0055] See also Figure 1 , which shows a flow chart of a ripple test method for a high-voltage power supply provided by an embodiment of the present application. A ripple test method for a high-voltage power supply provided by the present application comprises the following steps:

[0056] S001. Acquire detection data during the high-voltage power supply ripple measurement process and monitoring data of a load device connected to the high-voltage power supply.

[0057] In this embodiment, an oscilloscope is used to collect detection data during the ripple measurement process of the high-voltage power supply in the power equipment, and the power equipment includes but is not limited to a distribution box, a motor controller, and a high-voltage distribution box. Preferably, as an embodiment of the present application, the high-voltage power supply in the distribution box is used as the test object. By using the data acquisition function of the oscilloscope, the detection data of the ripple waveform at the output end of the high-voltage power supply is captured in real time, and the detection data is stored in the internal memory of the oscilloscope or transmitted to a computer device, so as to obtain the detection data during the ripple measurement process of the high-voltage power supply of the distribution box.

[0058] S002: Based on the detection data in the high-voltage power supply ripple measurement process, obtain the ripple excess coefficient of the high-voltage power supply and the decomposed ripple waveform curve.

[0059] S003. Based on the monitoring data of the load device, obtain the stability coefficient of the environment in which the high voltage power supply is located.

[0060] S004. Obtain a compensation coefficient for ripple measurement of the high-voltage power supply based on the ripple exceeding expectation coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located.

[0061] S005. Obtain a ripple signal curve of compensation and identification in the output voltage based on the compensation coefficient of the ripple measurement of the high-voltage power supply and the detection data in the ripple measurement process of the high-voltage power supply.

[0062] S006. Obtain a high-voltage power supply ripple waveform curve based on the decomposed ripple waveform curve and the compensated identified ripple signal curve.

[0063] S007. Based on the high-voltage power supply ripple waveform curve, measure the ripple of the high-voltage power supply to obtain a measurement result.

[0064] The present application obtains the ripple excess coefficient and the decomposed ripple waveform curve of the high-voltage power supply based on the detection data in the process of measuring the ripple of the high-voltage power supply; obtains the stability coefficient of the environment in which the high-voltage power supply is located based on the monitoring data of the load device; obtains the compensation coefficient of the ripple measurement of the high-voltage power supply based on the ripple excess coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located; obtains the ripple signal curve of the compensation identification in the output voltage based on the compensation coefficient of the ripple measurement of the high-voltage power supply and the detection data in the process of measuring the ripple of the high-voltage power supply; obtains the ripple waveform curve of the high-voltage power supply based on the decomposed ripple waveform curve and the compensated identification ripple signal curve; measures the ripple of the high-voltage power supply based on the ripple waveform curve of the high-voltage power supply to obtain the measurement result. By obtaining a more accurate ripple waveform curve of the high-voltage power supply, the measurement error is reduced, and the ripple in the output voltage of the high-voltage power supply is measured with high precision and accuracy, so that a more accurate measurement result can be obtained.

[0065] The specific steps of obtaining the ripple excess coefficient of the high voltage power supply in step S002 include:

[0066] Based on the detection data in the high-voltage power supply ripple measurement process, the outlier index of each data point in the detection data and the average amplitude of all data points in the detection data are obtained. In this embodiment, the acquisition time of the oscilloscope can be set to 5 minutes to obtain the detection data in the high-voltage power supply ripple measurement process for 5 minutes. Among them, the detection data includes the voltage signal waveform diagram (i.e., the output voltage signal curve) of the power supply output during the high-voltage power supply ripple measurement process. The acquisition time of the oscilloscope can be set by the implementer according to the specific actual situation, and is not specifically limited here.

[0067] Furthermore, all data points in the detection data are mapped to a two-dimensional coordinate system, and the horizontal and vertical coordinates of the coordinate system represent the acquisition time of the data point and the value of the data point, respectively, so that each data point has a unique corresponding mapping point. The mapping results of the data points in all the detection data are used as input, and the LOF outlier factor detection algorithm is used to output the outlier factor of each mapping point in the mapping result, and the outlier factor of each mapping point is used as the outlier index of the data point corresponding to each mapping point. The LOF algorithm is a well-known technology, and the specific process is not repeated here.

[0068] Based on the outlier index of each data point in the detection data and the average amplitude of all data points in the detection data, the ripple excess coefficient of the high voltage power supply is obtained. Specifically, the calculation formula for obtaining the ripple excess coefficient of the high voltage power supply is as follows:

[0069] ;

[0070] In the formula, Indicates the ripple excess coefficient of the high voltage power supply; represents the average amplitude of all data points; Represents the mean of the outlier index of all data points, which is used to indicate the distribution uniformity of all data points. The closer the value of V is to 1, the greater the degree of concentrated distribution of data points. It represents the ripple exceeding expectation coefficient of the high-voltage power supply. The larger the product is, the weaker the periodicity and the larger the amplitude shown in the output voltage waveform, which means that the ripple may have exceeded the normal range. In the application of high-voltage power supply, ripple refers to the periodic fluctuation or ripple in the output voltage, which should usually be minimized to ensure the stability of the power supply. That is, the larger the product is, the stronger the ripple exceeding expectation of the high-voltage power supply.

[0071] Furthermore, since the ripple in the output voltage of the high-voltage power supply is distributed in a characteristic manner of low amplitude and periodicity, in this embodiment, the ripple in the output voltage of the high-voltage power supply is analyzed from the perspective of signal decomposition to be characterized by low amplitude and periodicity. Specifically, the specific steps of obtaining the ripple waveform curve decomposed in step S002 include:

[0072] Based on the detection data in the high-voltage power supply ripple measurement process, the output voltage of the high-voltage power supply is obtained.

[0073] The output voltage of the high-voltage power supply is decomposed to confirm the eigenvalue of the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply and the total number of components other than the ripple characteristic component and the eigenvalues ​​of the remaining components. In this embodiment, ICA (Independent Component Analysis) decomposition is adopted; in the ICA decomposition process, the component signal is decomposed with the maximum non-Gaussianity (i.e., periodicity). ICA decomposition is a well-known technology, and the specific process is not repeated. Specifically, the output voltage of the high-voltage power supply is decomposed by ICA to obtain each component of the output voltage. The difference between the kurtosis value of each component and the kurtosis value of the standard Gaussian distribution is used as the periodic characteristic of each component. The result of multiplying the periodic characteristic with the average amplitude of each component is used as the eigenvalue of each component, and the component with the largest eigenvalue among all components is selected as the ripple characteristic component in the decomposition result of the output voltage. The ICA decomposition process is then iterated, that is, each decomposition randomly generates the same number of components as the initial decomposition number, and the number of iterations can be set to 50 times. The implementer can set the number of iterations according to the specific actual situation.

[0074] Based on the characteristic value of the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply and the total number of components other than the ripple characteristic component and the characteristic values ​​of the remaining components, a decomposed ripple waveform curve is obtained. In this embodiment, the decomposed ripple waveform curve is obtained by the following objective function:

[0075] ;

[0076] In the formula, Represents the decomposition result of the objective function, which is used to characterize the decomposed ripple waveform curve. Indicates the ripple characteristic component in the decomposition result of the output voltage of the high voltage power supply The characteristic value of Represents the ripple characteristic component The components other than the eigenvalues ​​of The characteristic value of; M represents the total number of components other than the ripple characteristic component; Indicates that the objective function converges to the maximum decomposition result; Represents the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply The eigenvalues ​​of the ripple characteristic components The components other than the eigenvalues ​​of The absolute value of the difference between the eigenvalues ​​of . The larger the product of , the more obvious the difference between the ripple characteristic component and the other components, and the stronger the ripple characteristic of the ripple characteristic component. That is, when the objective function converges to the maximum, the optimal decomposed ripple waveform curve is obtained.

[0077] In order to maintain the stability of the output voltage, it is necessary to reduce the periodic fluctuation or ripple of the ripple in the output voltage as much as possible. The specific steps of S003 include:

[0078] Based on the monitoring data of the load device, the voltage monitoring value at each position in the voltage monitoring curve of the connected load of the high-voltage power supply in the output voltage monitoring time period and the number of differences between two adjacent voltage monitoring values ​​are obtained. In this embodiment, the monitoring data of the load device connected to the high-voltage power supply measured by the oscilloscope is obtained according to the voltage sensor. Among them, the load device includes but is not limited to a high-voltage AC load cabinet, a high-voltage DC load cabinet and a high-voltage resistor box. The implementer can determine the specific load device according to the actual working environment of the high-voltage power supply, and this application does not impose any special restrictions on this.

[0079] Based on the voltage monitoring value at each position in the voltage monitoring curve and the number of differences between two adjacent voltage monitoring values, the stability coefficient of the environment in which the high voltage power supply is located is obtained. In this embodiment, the calculation formula for the stability coefficient of the environment in which the high voltage power supply is located is as follows:

[0080] ;

[0081] In the formula, Indicates the stability factor of the environment in which the high voltage power supply is located. represents the voltage monitoring value of the e-th position in the voltage monitoring curve of the load connected to the high voltage power supply in the output voltage monitoring time period; Indicates the voltage monitoring value at the e-th position in the voltage monitoring curve. The voltage monitoring value at each location; there is a set of difference values ​​between two adjacent voltage monitoring values. Indicates the voltage monitoring value at the e-th position and the The voltage monitoring value of the position The difference is a positive integer; m represents the number of differences. The larger the output value is, the more violent the load voltage fluctuation of the high-voltage power supply is, that is, the environmental stability of the high-voltage power supply is poor.

[0082] Under normal circumstances, the ripple is distributed in the output voltage with low amplitude and periodic characteristics. If the unstable factor in the output voltage is caused by the ripple, it is necessary to compensate for the identification characteristics of the ripple in the process of identifying the ripple. In this embodiment, the specific steps of S004 include:

[0083] The ripple excess coefficient of the high-voltage power supply is compared with the stability coefficient of the environment in which the high-voltage power supply is located to obtain the compensation coefficient of the ripple measurement of the high-voltage power supply. The calculation formula of the compensation coefficient of the ripple measurement is as follows:

[0084] ;

[0085] In the formula, It represents the compensation coefficient of the ripple measurement of the high-voltage power supply. JN represents the ripple exceeding expectation coefficient of the high-voltage power supply, which represents the change of the output voltage of the high-voltage power supply. JU represents the stability coefficient of the environment in which the high-voltage power supply is located, which represents the stability of the environment in which the high-voltage power supply is located. represents the natural exponential function. It indicates the ratio of the load voltage fluctuation to the change of the high-voltage power supply output voltage. The larger the ratio, the more drastic the load change, but the output voltage of the high-voltage power supply is relatively stable. Under normal circumstances, the output voltage of the high-voltage power supply should be stable, and the power supply should be able to maintain the stability of the output voltage even when the load changes. When the ratio is smaller, it means that the ripple of the high-voltage power supply has a greater impact, that is, the ripple in the high-voltage power supply may temporarily break the "low amplitude" distribution characteristics, that is, when identifying the ripple in the output voltage waveform, the compensation coefficient should be higher, which can better adapt to the distribution characteristics when the ripple exceeds the normal range.

[0086] The specific steps of S005 include:

[0087] Based on the detection data in the high-voltage power supply ripple measurement process, the output signal of the high-voltage power supply is obtained, so as to realize the conversion of the digital signal corresponding to the detection data into the analog signal corresponding to the output signal.

[0088] According to the output signal of the high-voltage power supply, each difference between each peak point and an adjacent valley point in the output signal of the high-voltage power supply is obtained.

[0089] Based on each difference value and a compensation coefficient of the ripple measurement of the high voltage power supply, each compensated ripple identification characteristic value is obtained.

[0090] Based on each compensated ripple identification characteristic value, a ripple signal curve for compensation identification in the output voltage is obtained. In this embodiment, this step specifically includes: arranging each compensated ripple identification characteristic value in order from small to large to obtain a sorted characteristic value sequence. According to the sorted characteristic value sequence, a ripple signal curve for compensation identification in the output voltage is obtained. Specifically, each compensated ripple identification characteristic value is arranged in order from small to large to obtain a sorted sequence; obtaining each difference between two adjacent data points in the sorted sequence, traversing all each difference, obtaining the position where the difference first appears, and using the part to the left of the position as a small-amplitude waveform set in the output voltage signal curve; then randomly combining the data points in the output voltage until the curve composed of the data points has the largest periodicity, and obtaining the ripple signal curve for compensation identification in the output voltage.

[0091] The specific steps of S006 include:

[0092] The decomposed ripple waveform curve and the compensated identified ripple signal curve are averaged to obtain the high-voltage power supply ripple waveform curve. Specifically, each data point in the decomposed ripple waveform curve is averaged with each corresponding data point in the compensated identified ripple signal curve to obtain the high-voltage power supply ripple waveform curve. The compensated identified ripple signal curve is then compensated by the decomposed ripple waveform curve, further improving the measurement accuracy of the high-voltage power supply ripple.

[0093] The high-voltage power supply ripple waveform curve obtained through the above steps obtains the change characteristics of the ripple waveform in the time domain and frequency domain in the high-voltage power supply ripple waveform curve, such as the mean, amplitude, frequency, main frequency and other parameters, accurately measures the ripple of the high-voltage power supply through the parameters, and records the measurement results of the ripple. The output end of the high-voltage power supply is analyzed. If there is an abnormal ripple in the output end of the high-voltage power supply, it can help the staff diagnose possible faults, so as to optimize and improve the high-voltage power supply. And by performing high-precision ripple measurement on the high-voltage power supply, it helps to improve the performance of the overall system with a high-voltage power supply, especially in applications that require high stability and low noise, such as precision instruments, communication equipment, etc., to ensure its reliability and performance in various applications.

[0094] A ripple testing system for a high-voltage power supply provided in the present application is described below. The ripple testing system for a high-voltage power supply described below and the ripple testing method for a high-voltage power supply described above can refer to each other.

[0095] See also Figure 2 , which shows a structural schematic diagram 200 of a ripple test system for a high-voltage power supply. The present application provides a ripple test system for a high-voltage power supply, including a data acquisition module 210, a first acquisition module 220, a second acquisition module 230, a third acquisition module 240, a fourth acquisition module 250, a fifth acquisition module 260 and a measurement module 270.

[0096] The data acquisition module 210 is used to acquire detection data during the high-voltage power supply ripple measurement process and monitoring data of a load device connected to the high-voltage power supply;

[0097] The first acquisition module 220 is used to acquire the ripple exceeding expectation coefficient and the decomposed ripple waveform curve of the high-voltage power supply based on the detection data in the high-voltage power supply ripple measurement process;

[0098] The second acquisition module 230 is used to obtain the stability coefficient of the environment in which the high voltage power supply is located based on the monitoring data of the load device;

[0099] The third acquisition module 240 is used to obtain a compensation coefficient for ripple measurement of the high-voltage power supply based on the ripple exceeding expectation coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located;

[0100] The fourth acquisition module 250 is used to obtain a ripple signal curve of compensation identification in the output voltage based on the compensation coefficient of the ripple measurement of the high-voltage power supply and the detection data in the ripple measurement process of the high-voltage power supply;

[0101] The fifth acquisition module 260 is used to obtain a high-voltage power supply ripple waveform curve based on the decomposed ripple waveform curve and the compensated identified ripple signal curve;

[0102] The measuring module 270 is used to measure the ripple of the high-voltage power supply based on the high-voltage power supply ripple waveform curve to obtain a measurement result.

[0103] Specifically, the first acquisition module 220 is specifically used to: based on the detection data in the high-voltage power supply ripple measurement process, use the LOF outlier factor algorithm to obtain the outlier index of each data point in the detection data.

[0104] Based on the outlier index of each data point in the detection data and the average amplitude of all data points in the detection data, the ripple excess coefficient of the high voltage power supply is obtained.

[0105] The specific steps of obtaining the decomposed ripple waveform curve include:

[0106] Based on the detection data in the high-voltage power supply ripple measurement process, the output voltage of the high-voltage power supply is obtained.

[0107] The output voltage of the high-voltage power supply is decomposed to confirm the characteristic value of the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply and the total number of components other than the ripple characteristic component and the characteristic values ​​of the remaining components.

[0108] Based on the characteristic value of the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply and the total number of components other than the ripple characteristic component and the characteristic values ​​of the remaining components, a decomposed ripple waveform curve is obtained.

[0109] Specifically, the second acquisition module 230 is specifically used to: based on the monitoring data of the load device, obtain the voltage monitoring value at each position in the voltage monitoring curve of the connected load of the high voltage power supply in the output voltage monitoring time period and the number of differences between two adjacent voltage monitoring values.

[0110] Based on the voltage monitoring value at each position in the voltage monitoring curve and the amount of difference between two adjacent voltage monitoring values, a stability coefficient of the environment in which the high voltage power supply is located is obtained.

[0111] Specifically, the third acquisition module 240 is specifically used to compare the ripple excess coefficient of the high-voltage power supply with the stability coefficient of the environment in which the high-voltage power supply is located, so as to obtain a compensation coefficient for the ripple measurement of the high-voltage power supply.

[0112] Specifically, the fourth acquisition module 250 is specifically used to: acquire the output signal of the high-voltage power supply based on the detection data in the high-voltage power supply ripple measurement process.

[0113] According to the output signal of the high-voltage power supply, each difference between each peak point and an adjacent valley point in the output signal of the high-voltage power supply is obtained.

[0114] Based on each difference and a compensation coefficient of the ripple measurement of the high voltage power supply, each compensated ripple identification characteristic value is obtained.

[0115] Based on each compensated ripple identification characteristic value, a compensated and identified ripple signal curve in the output voltage is obtained. The specific steps of this step include:

[0116] Arrange each compensated ripple identification eigenvalue in ascending order to obtain a sorted eigenvalue sequence.

[0117] According to the sorted characteristic value sequence, a ripple signal curve of compensation identification in the output voltage is obtained.

[0118] Specifically, the fifth acquisition module 260 is specifically used to average the decomposed ripple waveform curve and the compensated identified ripple signal curve to obtain the high-voltage power supply ripple waveform curve.

[0119] It should be noted that the above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

[0120] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

Claims

1. A ripple test method for a high voltage power supply, characterized in that: The method comprises: Acquire detection data during the high-voltage power supply ripple measurement process and monitoring data of load equipment connected to the high-voltage power supply; Based on the detection data in the high-voltage power supply ripple measurement process, obtaining the ripple excess coefficient of the high-voltage power supply and the decomposed ripple waveform curve; Based on the monitoring data of the load device, a stability coefficient of the environment in which the high voltage power supply is located is obtained; Based on the ripple excess coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located, a compensation coefficient for ripple measurement of the high-voltage power supply is obtained; Based on the compensation coefficient of the ripple measurement of the high-voltage power supply and the detection data in the process of measuring the ripple of the high-voltage power supply, a ripple signal curve of compensation identification in the output voltage is obtained; Based on the decomposed ripple waveform curve and the compensated identified ripple signal curve, a high voltage power supply ripple waveform curve is obtained; Based on the high-voltage power supply ripple waveform curve, measuring the ripple of the high-voltage power supply to obtain a measurement result; Based on the detection data in the high-voltage power supply ripple measurement process, the specific steps of obtaining the ripple excess coefficient of the high-voltage power supply include: Based on the detection data in the high-voltage power supply ripple measurement process, the outlier index of each data point in the detection data is obtained by using the LOF outlier factor algorithm; Obtaining a ripple excess coefficient of the high voltage power supply based on an outlier index of each data point in the detection data and an average amplitude of all data points in the detection data; Based on the monitoring data of the load device, the specific steps of obtaining the stability coefficient of the environment in which the high voltage power supply is located include: Based on the monitoring data of the load device, obtaining the voltage monitoring value at each position in the voltage monitoring curve of the connected load of the high voltage power supply in the output voltage monitoring time period and the number of differences between two adjacent voltage monitoring values; Based on the voltage monitoring value at each position in the voltage monitoring curve and the amount of difference between two adjacent voltage monitoring values, a stability coefficient of the environment in which the high voltage power supply is located is obtained.

2. A ripple test method for a high voltage power supply according to claim 1, characterized in that: The specific steps of obtaining the decomposed ripple waveform curve include: Based on the detection data in the high-voltage power supply ripple measurement process, obtaining the output voltage of the high-voltage power supply; Decomposing the output voltage of the high-voltage power supply to determine the characteristic value of the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply and the total number of components other than the ripple characteristic component and the characteristic values ​​of the remaining components; Based on the characteristic value of the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply and the total number of components other than the ripple characteristic component and the characteristic values ​​of the remaining components, a decomposed ripple waveform curve is obtained.

3. A ripple test method for a high voltage power supply according to claim 2, characterized in that: The specific steps of confirming the ripple characteristic component in the decomposition result of the output voltage of the high-voltage power supply include: Decompose the output voltage of the high voltage power supply to obtain each component of the output voltage; The difference between the kurtosis value of each component and the kurtosis value of the standard Gaussian distribution is taken as the periodic characteristic of each component, and the result of multiplying the periodic characteristic with the average amplitude of each component is taken as the characteristic value of each component. The component with the largest characteristic value among all components is selected as the ripple characteristic component in the output voltage decomposition result.

4. A ripple test method for a high voltage power supply according to claim 1, characterized in that: The specific steps of obtaining the compensation coefficient for the ripple measurement of the high-voltage power supply based on the ripple exceeding expectation coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located include: The ripple excess coefficient of the high-voltage power supply is compared with the stability coefficient of the environment in which the high-voltage power supply is located to obtain a compensation coefficient for the ripple measurement of the high-voltage power supply.

5. A ripple test method for a high voltage power supply according to claim 1, characterized in that: Based on the compensation coefficient of the ripple measurement of the high-voltage power supply and the detection data in the ripple measurement process of the high-voltage power supply, the specific steps of obtaining the ripple signal curve of the compensation identification in the output voltage include: Based on the detection data in the high-voltage power supply ripple measurement process, an output signal of the high-voltage power supply is obtained; According to the output signal of the high-voltage power supply, each difference between each peak point and an adjacent valley point in the output signal of the high-voltage power supply is obtained; Based on each difference and a compensation coefficient of the ripple measurement of the high voltage power supply, obtaining each compensated ripple identification characteristic value; Based on each compensated ripple identification characteristic value, a compensated and identified ripple signal curve in the output voltage is obtained.

6. A ripple test method for a high voltage power supply according to claim 5, characterized in that: Based on each compensated ripple identification characteristic value, the specific steps of obtaining a compensated identified ripple signal curve in the output voltage include: Arrange each compensated ripple identification characteristic value in ascending order to obtain a sorted characteristic value sequence; According to the sorted characteristic value sequence, a ripple signal curve of compensation identification in the output voltage is obtained.

7. A ripple test method for a high voltage power supply according to any one of claims 1 to 6, characterized in that: Based on the decomposed ripple waveform curve and the compensated identified ripple signal curve, the specific steps of obtaining the high-voltage power supply ripple waveform curve include: The decomposed ripple waveform curve and the compensated identified ripple signal curve are averaged to obtain a high voltage power supply ripple waveform curve.

8. A ripple test system for a high voltage power supply, characterized in that: include: A data acquisition module, used to acquire detection data during the high-voltage power supply ripple measurement process and monitoring data of a load device connected to the high-voltage power supply; A first acquisition module, configured to acquire a ripple exceeding expectation coefficient and a decomposed ripple waveform curve of the high-voltage power supply based on detection data in the high-voltage power supply ripple measurement process; A second acquisition module is used to acquire a stability coefficient of the environment in which the high voltage power supply is located based on the monitoring data of the load device; A third acquisition module, configured to obtain a compensation coefficient for ripple measurement of the high-voltage power supply based on the ripple exceeding expectation coefficient of the high-voltage power supply and the stability coefficient of the environment in which the high-voltage power supply is located; A fourth acquisition module, configured to obtain a ripple signal curve of compensation identification in the output voltage based on the compensation coefficient of the ripple measurement of the high-voltage power supply and the detection data in the ripple measurement process of the high-voltage power supply; A fifth acquisition module, configured to obtain a high-voltage power supply ripple waveform curve based on the decomposed ripple waveform curve and the compensated identified ripple signal curve; A measuring module, used to measure the ripple of the high-voltage power supply based on the high-voltage power supply ripple waveform curve to obtain a measurement result; Based on the detection data in the high-voltage power supply ripple measurement process, the specific steps of obtaining the ripple excess coefficient of the high-voltage power supply include: Based on the detection data in the high-voltage power supply ripple measurement process, the outlier index of each data point in the detection data is obtained by using the LOF outlier factor algorithm; Obtaining a ripple excess coefficient of the high voltage power supply based on an outlier index of each data point in the detection data and an average amplitude of all data points in the detection data; Based on the monitoring data of the load device, the specific steps of obtaining the stability coefficient of the environment in which the high voltage power supply is located include: Based on the monitoring data of the load device, obtaining the voltage monitoring value at each position in the voltage monitoring curve of the connected load of the high voltage power supply in the output voltage monitoring time period and the number of differences between two adjacent voltage monitoring values; Based on the voltage monitoring value at each position in the voltage monitoring curve and the amount of difference between two adjacent voltage monitoring values, a stability coefficient of the environment in which the high voltage power supply is located is obtained.

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