Method and device for monitoring contact state, switching device and storage medium

Abstract

The embodiment of the invention provides a method and device for monitoring the state of a contact, a switching device and a storage medium. According to embodiments of the present disclosure, in at least one switch-on phase of a contact, an instantaneous bounce time and an interval bounce time related to a bounce of the contact are monitored based on an electrical parameter associated with the contact, the first and second bounces respectively indicate the sum of the durations of the bounces in the corresponding switch-on phase and the time difference between the first bounce and the last bounce. Based on the monitoring value of the instantaneous bounce time and at least one threshold value, a first monitoring result is determined, and the first monitoring result indicates whether the contact has the fusion welding risk or not. And determining a second monitoring result based on the monitoring value of the instantaneous bounce time and the monitoring value of the interval bounce time, the second monitoring result indicating whether the driving mechanism of the contact is abnormal or not. According to the embodiment of the invention, failure reasons can be analyzed or related risk early warning can be carried out by monitoring the bounce time of different types of contacts.

Description

Technical Field

[0001] Example embodiments of the present disclosure relate generally to the field of electrical devices, and more particularly to methods, devices, switch devices, and computer-readable storage media for monitoring contact status. Background Art

[0002] In various types of switchgear, contacts are important components that are used to disconnect and connect circuits. The key functions of various electrical appliances, such as the switching capacity of distribution appliances, the electrical life of control appliances, and the reliability of relays, all depend on the performance and quality of contacts. At the same time, contacts are also the weak link and the part that is prone to failure in switchgear. Therefore, it is expected to monitor the status of contacts and analyze the cause of failure. Summary of the invention

[0003] Embodiments of the present disclosure provide a method, an apparatus, a switch device, and a computer-readable storage medium for monitoring contact status.

[0004] In a first aspect of the present disclosure, a method for monitoring a contact state is provided. In the method, in at least one contact-on phase of the contact, based on electrical parameters associated with the contact, an instantaneous bounce time and an interval bounce time related to the bounce of the contact are monitored, the instantaneous bounce time indicates the sum of the durations of each bounce in the corresponding connection phase, and the interval bounce time indicates the time difference between the first bounce and the last bounce in the corresponding connection phase; based on the monitoring value of the instantaneous bounce time and at least one threshold value, a first monitoring result is determined, the first monitoring result indicates whether there is a risk of welding of the contact; and based on the monitoring value of the instantaneous bounce time and the monitoring value of the interval bounce time, a second monitoring result is determined, the second monitoring result indicates whether there is an abnormality in the driving mechanism of the contact.

[0005] In some embodiments of the first aspect, at least one threshold includes a failure threshold, and determining a first monitoring result includes: determining a maximum instantaneous bounce time in at least one connection phase from the monitored values ​​of the instantaneous bounce time; comparing the maximum instantaneous bounce time with the failure threshold; and in response to the maximum instantaneous bounce time being greater than the failure threshold, determining that there is a risk of welding of the contact.

[0006] In some embodiments of the first aspect, at least one threshold comprises a safety threshold, and the method further comprises: comparing the maximum instantaneous bounce time with the safety threshold; and determining that there is no risk of welding of the contacts in response to the maximum instantaneous bounce time being less than the safety threshold.

[0007] In some embodiments of the first aspect, the method further comprises presenting indicative information regarding the risk of fusion welding.

[0008] In some embodiments of the first aspect, determining the second monitoring result includes: determining the average instantaneous bounce time in at least one connection stage based on the monitoring value of the instantaneous bounce time; determining the average interval bounce time in at least one connection stage based on the monitoring value of the interval bounce time; and determining the second monitoring result based at least on a comparison of the average instantaneous bounce time and the average interval bounce time.

[0009] In some embodiments of the first aspect, determining the second monitoring result based at least on a comparison of the average instantaneous bounce time and the average interval bounce time includes: comparing the average interval bounce time with a preset multiple of the average instantaneous bounce time; in response to the average interval bounce time being greater than the preset multiple of the average instantaneous bounce time, determining the number of zero crossings occurring in at least one disconnecting stage of the contact, at least one disconnecting stage corresponding to at least one connecting stage; and in response to the average value of the number of zero crossings being greater than a threshold number, determining that there is an abnormality in the driving mechanism of the contact.

[0010] In some embodiments of the first aspect, the method further comprises presenting indication information indicating that there is an abnormality in the drive mechanism.

[0011] In a second aspect of the present disclosure, a device for monitoring the state of a contact is provided. The device includes: an electrical parameter measurement unit configured to measure electrical parameters associated with the contact in at least one connection phase of the contact; a storage unit configured to store at least one threshold value; and a processing unit configured to: in at least one connection phase, based on the electrical parameters, monitor the instantaneous bounce time and the interval bounce time related to the bounce of the contact, the instantaneous bounce time indicates the sum of the durations of each bounce in the corresponding connection phase, and the interval bounce time indicates the time difference between the first bounce and the last bounce in the corresponding connection phase; based on the monitoring value of the instantaneous bounce time and at least one threshold value, determine a first monitoring result, the first monitoring result indicates whether the contact has a risk of welding; and based on the monitoring value of the instantaneous bounce time and the monitoring value of the interval bounce time, determine a second monitoring result, the second monitoring result indicates whether the driving mechanism of the contact has an abnormality.

[0012] In some embodiments, the storage unit is further configured to store a failure threshold, and the processing unit is further configured to: determine a maximum instantaneous bounce time in at least one connection phase from the monitored value of the instantaneous bounce time; compare the maximum instantaneous bounce time with the failure threshold; and in response to the maximum instantaneous bounce time being greater than the failure threshold, determine that there is a risk of welding of the contacts.

[0013] In some embodiments, the storage unit is further configured to store a safety threshold, and the processing unit is further configured to: compare the maximum instantaneous bounce time with the safety threshold; and in response to the maximum instantaneous bounce time being less than the safety threshold, determine that there is no risk of welding of the contacts.

[0014] In some embodiments, the processing unit is further configured to: present indication information about the risk of fusion welding.

[0015] In some embodiments, the processing unit is further configured to: determine the average instantaneous bounce time in at least one connection stage based on the monitoring value of the instantaneous bounce time; determine the average interval bounce time in at least one connection stage based on the monitoring value of the interval bounce time; and determine a first monitoring result based at least on a comparison of the average instantaneous bounce time and the average interval bounce time.

[0016] In some embodiments, the processing unit is further configured to: compare the average interval bounce time with a preset multiple of the average instantaneous bounce time; in response to the average interval bounce time being greater than the preset multiple of the average instantaneous bounce time, determine the number of zero crossings that appear in at least one disconnection stage of the contact, at least one disconnection stage corresponding to at least one connection stage; and in response to the average value of the number of zero crossings being greater than a threshold number, determine that there is an abnormality in the drive mechanism of the contact.

[0017] In some embodiments, the processing unit is further configured to: present indication information indicating that there is an abnormality in the driving mechanism.

[0018] In some embodiments, the contact comprises a plurality of contact assemblies respectively corresponding to a plurality of phases, and wherein the processing unit is further configured to: in at least one make-on phase, for each of the plurality of contact assemblies, monitor the instantaneous bounce time and the interval bounce time.

[0019] In a third aspect of the present disclosure, a switch device is provided. The switch device comprises: a contact; and a device according to the second aspect, for monitoring the state of the contact.

[0020] In a fourth aspect of the present disclosure, a computer-readable storage medium is provided, wherein a computer program is stored on the computer-readable storage medium, and the computer program can be executed by a processor to implement the method of the first aspect.

[0021] It will be understood from the following description that according to the embodiments of the present disclosure, the instantaneous bounce time and the interval bounce time can be monitored for analysis to determine whether there is a risk of welding of the contact or whether the drive mechanism of the contact is abnormal. Thus, by monitoring different types of bounce times, the cause of the fault can be located. This plays a vital role in the assessment of product risks. Other benefits will be described below in conjunction with the corresponding embodiments.

[0022] It should be understood that the contents described in this content section are not intended to limit the key features or important features of the embodiments of the present disclosure, nor are they intended to limit the scope of the present disclosure. Other features of the present disclosure will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] The above and other features, advantages and aspects of the embodiments of the present disclosure will become more apparent with reference to the following detailed description in conjunction with the accompanying drawings. In the accompanying drawings, the same or similar reference numerals represent the same or similar elements, wherein:

[0024] Figure 1 A schematic diagram showing an example environment in which embodiments of the present disclosure can be implemented;

[0025] FIG. 2A to FIG. 2B A schematic diagram showing instantaneous bounce time and interval bounce time according to some embodiments of the present disclosure;

[0026] FIG. 3A to FIG. 3B A schematic diagram showing an example of calculating instantaneous bounce time and interval bounce time according to some embodiments of the present disclosure;

[0027] Figure 4 A flow chart showing a method for monitoring contact status according to some embodiments of the present disclosure is shown;

[0028] FIG. 5A to FIG. 5E An example dot graph showing the instantaneous bounce time of three-phase contacts measured during the make-up phase of the contacts according to some embodiments of the present disclosure;

[0029] Figure 6 A schematic diagram showing an example waveform in a make-up phase of a contact according to some embodiments of the present disclosure;

[0030] Figure 7 A schematic diagram showing the number of zero crossing points respectively appearing in at least one disconnection phase of a contact according to some embodiments of the present disclosure;

[0031] Figure 8 A schematic diagram showing an example zero crossing point in a disconnection phase of a contact according to some embodiments of the present disclosure;

[0032] Fig. 9 A flowchart showing an example method of monitoring contact status according to some embodiments of the present disclosure;

[0033] Fig.10 A schematic structural block diagram of an apparatus for monitoring contact status according to some embodiments of the present disclosure is shown; and

[0034] Fig.11A block diagram of a device capable of implementing various embodiments of the present disclosure is shown. DETAILED DESCRIPTION

[0035] Embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although certain embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be construed as being limited to the embodiments set forth herein. On the contrary, these embodiments are provided to provide a more thorough and complete understanding of the present disclosure. It should be understood that the drawings and embodiments of the present disclosure are only for exemplary purposes and are not intended to limit the scope of protection of the present disclosure.

[0036] In the description of the embodiments of the present disclosure, the term "including" and similar terms should be understood as open inclusion, that is, "including but not limited to". The term "based on" should be understood as "based at least in part on". The term "one embodiment" or "the embodiment" should be understood as "at least one embodiment". The term "some embodiments" should be understood as "at least some embodiments". Other explicit and implicit definitions may be included below. The terms "first", "second", etc. may refer to different or the same objects. Other explicit and implicit definitions may be included below.

[0037] In the embodiments of the present disclosure, contact bounce refers to a phenomenon in which the voltage between the moving contact and the stationary contact (it should be understood that the voltage is the absolute value of the voltage here) is greater than a voltage threshold during the contact-on phase.

[0038] As briefly mentioned above, connecting the circuit is one of the important functions of the contact. In the process of closing the contact to connect the circuit, due to various reasons (for example, mechanical impact of the moving and static contacts or mechanical impact of the electrical contact mechanism), the contact cannot be instantly and stably closed, thus causing contact bounce. Traditionally, it is believed that contact bounce will cause arc heating and welding risks. However, in some cases, contact bounce may not be related to welding risks. Traditional solutions will lead to misjudgment of the cause of failure or fault.

[0039] Through monitoring and analysis of contact bounce, the inventor of the present application realized that there are two types of bounces in the contact connection phase. One type is instantaneous bounce, which is a short and frequent bounce. The other type is a bounce with a larger interval, also known as an interval bounce. Accordingly, the contact bounce has two types of characteristic times, namely, the instantaneous bounce time and the interval bounce time. For a certain connection phase, the instantaneous bounce time indicates the sum of the durations of each bounce in the connection phase, and the interval bounce time indicates the time difference between the first bounce and the last bounce in the connection phase. Different types of bounces correspond to different causes of failure. In view of this, the contact bounce time can be monitored in order to analyze the cause of failure or to issue relevant risk warnings.

[0040] To this end, an embodiment of the present disclosure proposes a scheme for monitoring the state of contacts. According to various embodiments of the present disclosure, the relationship between the bounce time type of the contact and the safety threshold of the contact and the relationship between the two bounce time types are utilized. Specifically, in the contact-on phase, based on the current measured values ​​of electrical parameters associated with the contact (e.g., main circuit voltage, current, coil voltage waveform), the instantaneous bounce time and interval bounce time related to the bounce of the contact are monitored. Then, based on the relationship between the monitored instantaneous bounce time and the threshold, it is determined whether there is a risk of welding in the contact, or based on the relationship between the monitored instantaneous bounce time and the interval bounce time, it is determined whether the drive mechanism of the contact is abnormal. For example, the threshold can be predetermined based on previous actual measurements of the contact by a big data model.

[0041] It will be understood from the following description that according to the embodiments of the present disclosure, different types of contact bounces are directly related to different failure causes. By monitoring the instantaneous bounce time and the interval bounce time during the connection phase, visual monitoring of contact bounce and contact energy can be achieved. Combining these two times for real-time analysis can locate the cause of contact failure or warn of related risks. This plays a vital role in the assessment of product welding risks.

[0042] Some example embodiments of the present disclosure will be described below with reference to the accompanying drawings. Please note that in some descriptions of the embodiments, certain specific values ​​may be involved in order to better help readers understand. These values ​​are exemplary and may vary according to specific application scenarios, and do not limit the scope of the present disclosure in any way.

[0043] Figure 1 A schematic diagram of an example environment 100 in which embodiments of the present disclosure can be implemented is shown. The environment 100 includes a switch device 110, which can be, for example, a contactor or a circuit breaker. The switch device 110 includes a contact 120, which includes a stationary contact and a moving contact. In some embodiments, the contact 120 includes a plurality of contact assemblies corresponding to a plurality of phases, respectively. Each contact assembly includes a stationary contact assembly and a moving contact assembly. For example, the contact 120 can be a three-phase contact, which includes three pairs of moving and stationary contacts.

[0044] Although not shown, it should be understood that the switch device 110 may include any suitable element for measuring electrical parameters associated with the contact 120. The measured electrical parameters may include, but are not limited to, current, voltage, inductance, capacitance, etc. In the embodiments of the present disclosure, the element for measuring the electrical parameter may be of any suitable type and may be disposed at any position of the switch device 110. The measured electrical parameter may directly or indirectly determine the voltage between the moving contact and the stationary contact of the contact 120, thereby monitoring the contact bounce. The embodiments of the present disclosure are not limited in how to measure the electrical parameter and what electrical parameter is measured.

[0045] The environment 100 also includes a monitoring device 150. The monitoring device 150 can be any type of device with computing capabilities, including a terminal device or a server device. The terminal device can be any type of mobile terminal, fixed terminal or portable terminal, including a mobile phone, a desktop computer, a laptop computer, a notebook computer, a netbook computer, a tablet computer, a media computer, a multimedia tablet, a personal communication system (PCS) device, a personal navigation device, a personal digital assistant (PDA), an audio / video player, a digital camera / camcorder, a positioning device, a television receiver, a radio broadcast receiver, an e-book device, a gaming device, or any combination of the foregoing, including accessories and peripherals of these devices or any combination thereof. The server device can include, for example, a computing system / server, such as a mainframe, an edge computing node, a computing device in a cloud environment, and the like. In some embodiments, the monitoring device 150 can be a programmable logic controller (PLC) or a monitoring device.

[0046] In some embodiments, the monitoring device 150 may be implemented in the switch device 110, for example, a processing unit in the switch device 110. In some embodiments, the monitoring device 150 may be located remotely from the switch device to implement a remote monitoring function for the switch device 110. For example, the monitoring device 150 may monitor the instantaneous bounce time and the interval bounce time related to the bounce of the contact 120, thereby implementing remote diagnosis, etc. Alternatively or additionally, in some embodiments, the method for monitoring the contact state described below may be at least partially performed by the monitoring device 150. In such an embodiment, the switch device 110 may send required data such as the measured value of the electrical parameter to the monitoring device 150.

[0047] It should be understood that the structure and functionality of environment 100 are described for exemplary purposes only and does not imply any limitation on the scope of the present disclosure.

[0048] In order to more clearly understand the contact state monitoring scheme of the present disclosure, examples of two types of contact bounces and contact bounce times are first described. FIG. 2A to FIG. 2BFIG. 1 is a schematic diagram showing an example of monitoring instantaneous bounces and interval bounces according to some embodiments of the present disclosure. Figure 2A and 2B In the example of , the horizontal axis represents time and the vertical axis represents the voltage between the moving contact and the stationary contact. In this example, contact bounce occurs when the voltage between the moving contact and the stationary contact (it should be understood that the absolute value of the voltage here) is greater than 10V. Figure 2A , short and frequent bounces occur during time periods 201 and 202, i.e., instantaneous bounces. The instantaneous bounce time is equal to the sum of all bounce times. There is a period of time without bounces in time period 203, so time period 203 indicates interval bounces. The interval bounce time is equal to the time period from the start of the first bounce to the end of the last bounce. Figure 2A In the example of , since there is a time period without bouncing between time period 201 and time period 202, the instantaneous bouncing time is less than or equal to the interval bouncing time. Figure 2B In the example of , a momentary bounce occurs during time period 204, and no more bounces occur thereafter. Therefore, in this example, the interval bounce time is approximately equal to the momentary bounce time.

[0049] In order to understand these two bounce times more clearly, the following Figure 3A and Figure 3B An example describing how to calculate two bounce times. FIG. 3A to FIG. 3B A schematic diagram showing an example of calculating instantaneous bounce time and interval bounce time according to some embodiments of the present disclosure. Figure 3A In the example of , there are two instantaneous bounces with durations of t1 and t2. Accordingly, the instantaneous bounce time = t1 + t2, the interval bounce time = t3, and t3>t1 + t2. Figure 3B In the example of , there are x instantaneous bounces with durations of t1, t2, ..., tx. Accordingly, the instantaneous bounce time = t1 + t2 + ... + tx, the interval bounce time = t3, t3 ≥ t1 + t2 + ... + tx.

[0050] Reference below Figure 4 A flow chart of a method 400 for monitoring a contact state is described. Exemplarily, the method 400 may be performed by the monitoring device 150 .

[0051] At block 410, in at least one contact-on phase of the contact, based on electrical parameters associated with the contact, an instantaneous bounce time and an interval bounce time related to the bounce of the contact are monitored. As mentioned above, for a certain contact-on phase, the instantaneous bounce time indicates the sum of the durations of each bounce in the contact-on phase, and the interval bounce time indicates the time difference between the first bounce and the last bounce in the contact-on phase. Examples of electrical parameters may include, but are not limited to, the main circuit voltage, current, coil voltage waveform, etc. described above. The voltage between the moving contact and the stationary contact may be calculated using the measured electrical parameters, thereby calculating and monitoring the bounce time.

[0052] Each contact cycle may include one closing and opening of the contact, and accordingly includes a connection phase and a disconnection phase. In some embodiments, N contact cycles may be continuously monitored every M contact cycles, where M and N are positive integers, and M is greater than N. For example, 200 cycles may be continuously monitored every 10,000 cycles. The monitored N contact cycles are collectively referred to as a monitoring cycle.

[0053] In some embodiments, the contact may include a plurality of contact assemblies corresponding to a plurality of phases, respectively. In at least one connection phase, for each of the plurality of contact assemblies, the instantaneous bounce time and the interval bounce time are monitored. For example, for a three-phase contact, the instantaneous bounce time and the interval bounce time may be monitored for each phase, respectively.

[0054] In order to more clearly understand the embodiments of the present disclosure, it is assumed without loss of generality that the contact includes Q phases and is continuously monitored for N cycles (i.e., corresponding to N on phases), where Q is a positive integer. In this case, there are N*Q monitoring values ​​of instantaneous bounce time and N*Q monitoring values ​​of interval bounce events in the current monitoring cycle.

[0055] At block 420 , a first monitoring result is determined based on the monitoring value of the instantaneous bounce time and at least one threshold value. The first monitoring result indicates whether there is a risk of welding of the contacts.

[0056] The thresholds may include failure thresholds and safety thresholds. In some embodiments, these thresholds may be pre-set or pre-acquired. In some embodiments, these thresholds may be determined by monitoring and analyzing the bounce time of the contacts. For example, the failure thresholds and safety thresholds may be determined by any suitable big data analysis algorithm.

[0057] refer to FIG. 5A to FIG. 5E Describe an example. FIG. 5A to FIG. 5E FIG. 4 is a dot graph showing the instantaneous bounce time of the three-phase contacts monitored during the contact-on phase according to some embodiments of the present disclosure. FIG. 5A to FIG. 5E In the figure, the horizontal axis represents the contact cycle, and the vertical axis represents the monitoring value of the instantaneous bounce time. FIG. 5A to FIG. 5E As shown, the instantaneous bounce time of 200 connection phases is continuously monitored at regular contact cycles for each phase. Therefore, each monitoring cycle (corresponding to the same horizontal axis) includes 600 monitoring values ​​for three phases, but it should be understood that these monitoring values ​​overlap in the figure due to the limitation of image drawing. They can be determined according to, for example, the Kongming big data model. Figure 5A-5E 3ms, 2.5ms, 3.2ms and 3.5ms correspond to safe and risk-free operation of the contacts. Figure 5A-5E 5.8ms, 6ms, 5.6ms and 10ms in the figure correspond to the failure of the contacts. Figure 5A-5E By analyzing the dot graph shown, the failure threshold (eg, 5.6 ms) and the safety threshold (eg, 3 ms) can be determined.

[0058] In some embodiments, the maximum instantaneous bounce time can be determined from the monitoring values ​​of the instantaneous bounce time. The maximum instantaneous bounce time can be compared with a failure threshold. If the maximum instantaneous bounce time is greater than the failure threshold, it is determined that the contact has a risk of welding. Additionally, indicative information about the risk of welding can also be presented. For example, the maximum monitoring value can be determined from N*Q monitoring values ​​of the instantaneous bounce time to compare with the failure threshold. If the maximum monitoring value is greater than the failure threshold, the state of the switch device 110 can be marked red, and the contact is about to fail due to welding.

[0059] In some embodiments, the maximum instantaneous bounce time can be compared with a safety threshold, and if the maximum instantaneous bounce time is less than the safety threshold, it is determined that there is no risk of contact welding. In some embodiments, if the maximum instantaneous bounce time is greater than the safety threshold but less than the failure threshold, an early warning message can be issued to prompt the user to pay attention to or be aware of the risk of contact welding.

[0060] In this embodiment, by comparing the maximum instantaneous bounce time with the threshold, the risk of welding can be identified in a relatively strict manner, so as to provide risk warnings and prompts as early as possible.

[0061] In some other embodiments, the average instantaneous bounce time can be determined based on these monitoring values. The average instantaneous bounce time is then compared with a failure threshold or a safety threshold to determine whether there is a risk of contact welding. For example, the average value of N*Q monitoring values ​​of the instantaneous bounce time can be determined, and the average value can be compared with the threshold.

[0062] return Figure 4 At block 430, a second monitoring result is determined based on the monitoring value of the instantaneous bounce time and the monitoring value of the interval bounce time. The second monitoring result indicates whether there is an abnormality in the driving mechanism of the contact.

[0063] In some embodiments, in order to determine the second monitoring result, the average instantaneous bounce time during the monitored connection phase can be determined based on the monitored value of the instantaneous bounce time, and the average interval bounce time during the monitored connection phase can be determined based on the monitored value of the interval bounce time. For example, the average value of N*Q monitored values ​​of the instantaneous bounce time can be used as the average instantaneous bounce time, and the average value of N*Q monitored values ​​of the interval bounce time can be used as the average interval bounce time. Further, the second monitoring result is determined based on at least a comparison of the average instantaneous bounce time and the average interval bounce time.

[0064] In some embodiments, the average interval bounce time can be compared with a preset multiple (eg, 2) of the average instantaneous bounce time. If the average interval bounce time is greater than the preset multiple of the average instantaneous bounce time, it means that the contact drive mechanism may be abnormal.

[0065] For example, reference Figure 6 . Figure 6 Schematic diagram showing example waveforms in the contact-on phase according to some embodiments of the present disclosure. Figure 6 As shown, waveform 601 is a waveform generated by the contact in a connection phase, and waveform 602 is obtained by amplifying a part of waveform 601 in the connection phase. In waveform 602, duration 603 indicates the average instantaneous bounce time, and duration 604 indicates the average interval bounce time. In this example, the average interval bounce time is greater than twice the average instantaneous bounce time, so there may be an abnormality in the drive mechanism.

[0066] In some embodiments, in order to more accurately assess the risk of abnormality of the drive mechanism, when the average interval bounce time is greater than a preset multiple of the average instantaneous bounce time, the number of zero crossing points occurring in the segmented phase of the contact may be additionally considered.

[0067] Figure 7 FIG. 1 is a schematic diagram showing the number of zero crossing points that appear in the disconnection phase of the contacts according to some embodiments of the present disclosure. Figure 7 In FIG. 7 , the horizontal axis represents the number of contact cycles of the switching device, and the vertical axis represents the number of zero crossings that occur during the disconnection phase. Curve 701 and curve 702 correspond to two types of switching devices, respectively. Figure 7 As shown, for both types of switching devices, the number of zero crossings begins to increase after a certain period.

[0068] In view of this, in some embodiments, if the average interval bounce time is greater than a preset multiple of the average instantaneous bounce time, the number of zero crossings that appear in at least one disconnection stage of the contact can be determined. If the average value of the number of zero crossings is greater than a threshold value, it can be determined that there is an abnormality in the contact drive mechanism. For example, if the instantaneous bounce time and the interval bounce time of N connection stages are continuously monitored, the number of zero crossings that appear in the N disconnection stages corresponding to the N connection stages can be determined, thereby obtaining the number of N zero crossings. If the average value of the N number of zero crossings is greater than the threshold value, it can be determined that there is an abnormality in the mechanism, such as insufficient contact spring pressure and excessive electromagnetic force that cause the contacts to fail to be pressed.

[0069] In some embodiments, when it is determined that the drive mechanism is abnormal, indication information indicating the abnormality of the drive mechanism may be presented. For example, the state of the switch device or the contact may be marked in red, indicating that the drive mechanism is abnormal and the contact cannot be closed.

[0070] Figure 8 FIG. 2 shows a schematic diagram of a zero crossing point in the disconnection phase of a contact according to some embodiments of the present disclosure. Figure 8 As shown, waveform 801 is a waveform in the disconnection stage of the contact, and waveform 802 is an enlarged schematic diagram of a portion of waveform 801, wherein there are 6 zero crossing points, namely, zero crossing points 811, 812, 813, 814, 815 and 816. At this time, in response to the average value of the number of zero crossing points being greater than a threshold value (e.g., 1.5), it is determined that the driving mechanism of the contact is abnormal, such as insufficient contact spring pressure, excessive electromagnetic force causing the contact to be unable to be pressed, thereby presenting indication information that the driving mechanism is abnormal.

[0071] In the embodiment described above, the average instantaneous bounce time is compared with the average interval bounce time. In some other embodiments, other comparisons can also be made based on the monitoring values. For example, in each connection phase, it can be compared whether the interval bounce time monitored in the current connection phase (for example, in the case of multiple phases, it can be the average value or maximum value of the multi-phase interval bounce time) is greater than a preset multiple of the instantaneous bounce time (for example, in the case of multiple phases, it can be the average value or maximum value of the multi-phase instantaneous bounce time). For another example, the maximum interval bounce time (for example, the maximum monitored value among the N*Q monitored values ​​of the interval bounce time) can be compared with a preset multiple of the maximum instantaneous bounce time (for example, the maximum monitored value among the N*Q monitored values ​​of the instantaneous bounce time).

[0072] The above describes an example method for monitoring the contact state based on monitoring the bounce time. Fig. 9 To describe an example implementation. Fig. 9A flow chart of a method 900 for monitoring contact status according to some embodiments of the present disclosure is shown. The method 900 may be considered as an example of the method 400.

[0073] At box 901, electrical parameters such as main circuit voltage, current, coil voltage waveform, etc. are measured by appropriate components in the switch device. At box 902, real-time calculations are performed by the monitoring device during the switch-on phase. At box 903, real-time calculations are performed during the switch-on phase of the contact. Accordingly, at box 903, the instantaneous bounce time is monitored.

[0074] At box 904, a dot diagram of the instantaneous bounce time of the three phases in each connection stage of the contact is calculated. Each point in the dot diagram corresponds to a monitoring value of the instantaneous bounce time. When N connection stages are continuously monitored and there is a Q phase, N*Q monitoring values ​​of the instantaneous bounce time are obtained. At box 905, the maximum value in the three-phase dot diagram is monitored in real time, that is, the maximum instantaneous bounce time is monitored. At box 906, the failure threshold and safety threshold of the switching device are obtained through the big data model. Note that box 906 is optional. At box 907, it is determined whether the monitored maximum instantaneous bounce time is greater than the failure threshold. If so, the state of the switching device is immediately marked red at box 908, and it is indicated that the contact is about to produce a welding failure. If not, return to box 905.

[0075] At box 909, monitor the interval bounce time. For example, monitor the interval bounce time of each phase during the contact-on phase. At box 910, compare the interval bounce time with the instantaneous bounce time to determine whether the interval bounce time is greater than a preset multiple (e.g., 2 times) of the instantaneous bounce time. As described above, what is compared may be the average interval bounce time and the average instantaneous bounce time. If not, it means that there is no abnormality in the drive mechanism for the time being, and method 900 proceeds to box 904. If yes, method 900 proceeds to box 911.

[0076] At block 911, it is determined whether the average value of the number of zero crossings in the segmentation phase is greater than a threshold value (e.g., 1.5). If not, it indicates that there is no abnormality in the driving mechanism for the time being, and the method 900 proceeds to block 904. If yes, the method 900 proceeds to block 912. At block 912, the state of the switch device is immediately marked in red, and the indication mechanism is abnormal, and the contacts cannot be closed normally.

[0077] In the embodiments of the present disclosure, by monitoring different types of bounce times, the failure cause can be analyzed timely and accurately. The accurate location of the failure cause further helps the subsequent optimization of the contact design.

[0078] Fig.10FIG. 1 is a schematic structural block diagram of an apparatus 1000 for monitoring a contact state according to some embodiments of the present disclosure. In some embodiments, the apparatus 1000 may be implemented as or included in a switch device 110 .

[0079] As shown in the figure, the device 1000 includes an electrical parameter measuring unit 1010, which is configured to measure an electrical parameter associated with the contact in at least one contact-on phase of the contact to obtain a current measurement value of the electrical parameter. The electrical parameter measuring unit 1010 can be any suitable electrical parameter measuring element, such as a measuring element for measuring parameters such as voltage and current.

[0080] The device 1000 includes a processing unit 1020. The processing unit 1020 is configured to monitor, in at least one connection phase, an instantaneous bounce time and an interval bounce time related to the bounce of the contact based on electrical parameters, wherein the instantaneous bounce time indicates the sum of the durations of each bounce in the corresponding connection phase, and the interval bounce time indicates the time difference between the first bounce and the last bounce in the corresponding connection phase; determine a first monitoring result based on the monitoring value of the instantaneous bounce time and at least one threshold value, the first monitoring result indicating whether there is a risk of welding of the contact; and determine a second monitoring result based on the monitoring value of the instantaneous bounce time and the monitoring value of the interval bounce time, the second monitoring result indicating whether there is an abnormality in the driving mechanism of the contact. As described above, the threshold is predetermined based on previous actual measurements of the product.

[0081] In some embodiments, the apparatus 1000 may further include a storage unit 1030 configured to store at least one threshold value. Although the storage unit 1030 is shown separately from the processing unit 1020, this is only exemplary. In some embodiments, the storage unit 1030 may be a part of the processing unit 1020, such as a register of the processing unit 1020.

[0082] In some embodiments, the storage unit 1030 is further configured to store a failure threshold, and the processing unit 1020 is further configured to: determine a maximum instantaneous bounce time in at least one connection phase from the monitored value of the instantaneous bounce time; compare the maximum instantaneous bounce time with the failure threshold; and in response to the maximum instantaneous bounce time being greater than the failure threshold, determine that there is a risk of welding of the contacts.

[0083] In some embodiments, the processing unit 1020 is further configured to present indication information about the risk of fusion welding.

[0084] In some embodiments, the processing unit 1020 is further configured to: determine the average instantaneous bounce time in at least one connection stage based on the monitoring value of the instantaneous bounce time; determine the average interval bounce time in at least one connection stage based on the monitoring value of the interval bounce time; and determine a first monitoring result based at least on a comparison of the average instantaneous bounce time and the average interval bounce time.

[0085] In some embodiments, the processing unit 1020 is further configured to: compare the average interval bounce time with a preset multiple of the average instantaneous bounce time; in response to the average interval bounce time being greater than the preset multiple of the average instantaneous bounce time, determine the number of zero crossings that appear in at least one disconnection stage of the contact, at least one disconnection stage corresponding to at least one connection stage; and in response to the average value of the number of zero crossings being greater than a threshold number, determine that there is an abnormality in the drive mechanism of the contact.

[0086] In some embodiments, the processing unit 1020 is further configured to present indication information indicating that an abnormality exists in the driving mechanism.

[0087] In some embodiments, the contact comprises a plurality of contact assemblies respectively corresponding to a plurality of phases, and wherein the processing unit 1020 is further configured to: in at least one connection phase, for each of the plurality of contact assemblies, monitor the instantaneous bounce time and the interval bounce time.

[0088] Fig.11 1 shows a block diagram of an electronic device 1100 in which one or more embodiments of the present disclosure may be implemented. It should be understood that Fig.11 The electronic device 1100 shown is merely exemplary and should not constitute any limitation on the functionality and scope of the embodiments described herein. Fig.11 The electronic device 1100 shown can be used to implement Figure 1 monitoring device 150 or switching device 110 or at least a portion of device 1000.

[0089] like Fig.11 As shown, the electronic device 1100 is in the form of a general electronic device. The components of the electronic device 1100 may include, but are not limited to, one or more processors or processing units 1110, a memory 1120, a storage device 1130, one or more communication units 1140, one or more input devices 1150, and one or more output devices 1160. The processing unit 1110 may be an actual or virtual processor and is capable of performing various processes according to a program stored in the memory 1120. In a multi-processor system, multiple processing units execute computer executable instructions in parallel to improve the parallel processing capability of the electronic device 1100.

[0090] The electronic device 1100 typically includes a plurality of computer storage media. Such media may be any accessible media accessible to the electronic device 1100, including but not limited to volatile and non-volatile media, removable and non-removable media. The memory 1120 may be a volatile memory (e.g., a register, a cache, a random access memory (RAM)), a non-volatile memory (e.g., a read-only memory (ROM), an electrically erasable programmable read-only memory (EEPROM), flash memory), or some combination thereof. The storage device 1130 may be a removable or non-removable medium, and may include a machine-readable medium, such as a flash drive, a disk, or any other medium, which may be capable of being used to store information and / or data (e.g., training data for training) and may be accessed within the electronic device 1100.

[0091] The electronic device 1100 may further include additional removable / non-removable, volatile / non-volatile storage media. Fig.11 As shown in , a disk drive for reading or writing from a removable, non-volatile disk (e.g., a "floppy disk") and an optical drive for reading or writing from a removable, non-volatile optical disk may be provided. In these cases, each drive may be connected to the bus (not shown) by one or more data media interfaces. Memory 1120 may include a computer program product 1125 having one or more program modules that are configured to perform various methods or actions of various embodiments of the present disclosure.

[0092] The communication unit 1140 implements communication with other electronic devices through a communication medium. Additionally, the functions of the components of the electronic device 1100 can be implemented in a single computing cluster or multiple computing machines that can communicate through a communication connection. Therefore, the electronic device 1100 can operate in a networked environment using a logical connection with one or more other servers, a network personal computer (PC), or another network node.

[0093] The input device 1150 may be one or more input devices, such as a mouse, a keyboard, a tracking ball, etc. The output device 1160 may be one or more output devices, such as a display, a speaker, a printer, etc. The electronic device 1100 may also communicate with one or more external devices (not shown) through the communication unit 1140 as needed, such as a storage device, a display device, etc., communicate with one or more devices that allow a user to interact with the electronic device 1100, or communicate with any device that allows the electronic device 1100 to communicate with one or more other electronic devices (e.g., a network card, a modem, etc.). Such communication may be performed via an input / output (I / O) interface (not shown).

[0094] According to an exemplary implementation of the present disclosure, a device for monitoring a contact state is provided. The device includes at least one processing unit and at least one memory. The at least one memory is coupled to the at least one processing unit and stores instructions for execution by the at least one processing unit, and when the instructions are executed by the at least one processing unit, the device executes the method described above.

[0095] According to an exemplary implementation of the present disclosure, a switch device is provided, which includes: a contact; and a device for monitoring a state of the contact.

[0096] According to an exemplary implementation of the present disclosure, a computer-readable storage medium is provided, on which computer-executable instructions are stored, wherein the computer-executable instructions are executed by a processor to implement the method described above. According to an exemplary implementation of the present disclosure, a computer program product is also provided, which is tangibly stored on a non-transitory computer-readable medium and includes computer-executable instructions, and the computer-executable instructions are executed by a processor to implement the method described above.

[0097] Various aspects of the present disclosure are described herein with reference to the flowcharts and / or block diagrams of the methods, devices, equipment, and computer program products implemented according to the present disclosure. It should be understood that each box in the flowchart and / or block diagram and the combination of each box in the flowchart and / or block diagram can be implemented by computer-readable program instructions.

[0098] These computer-readable program instructions can be provided to a processing unit of a general-purpose computer, a special-purpose computer, or other programmable data processing device, thereby producing a machine, so that when these instructions are executed by the processing unit of the computer or other programmable data processing device, a device that implements the functions / actions specified in one or more boxes in the flowchart and / or block diagram is generated. These computer-readable program instructions can also be stored in a computer-readable storage medium, and these instructions cause the computer, programmable data processing device, and / or other equipment to work in a specific manner, so that the computer-readable medium storing the instructions includes a manufactured product, which includes instructions for implementing various aspects of the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0099] Computer-readable program instructions can be loaded onto a computer, other programmable data processing apparatus, or other device so that a series of operational steps are performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, so that the instructions executed on the computer, other programmable data processing apparatus, or other device implement the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0100] The flow chart and block diagram in the accompanying drawings show the possible architecture, function and operation of the system, method and computer program product according to multiple implementations of the present disclosure. In this regard, each square box in the flow chart or block diagram can represent a part of a module, program segment or instruction, and a part of a module, program segment or instruction includes one or more executable instructions for realizing the logical function of the specification. In some implementations as replacements, the function marked in the square box can also occur in a sequence different from that marked in the accompanying drawings. For example, two continuous square boxes can actually be executed substantially in parallel, and they can sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each square box in the block diagram and / or flow chart, and the combination of the square boxes in the block diagram and / or flow chart can be realized by a special hardware-based system that performs the function or action of the specification, or can be realized by a combination of special hardware and computer instructions.

[0101] The above descriptions of various implementations of the present disclosure are exemplary, non-exhaustive, and not limited to the disclosed implementations. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described implementations. The selection of terms used herein is intended to best explain the principles of the implementations, practical applications, or improvements to the technology in the market, or to enable other persons of ordinary skill in the art to understand the various implementations disclosed herein.

Claims

1. A method for monitoring a contact state, comprising: In at least one contact-on phase of the contact, based on electrical parameters associated with the contact, monitoring an instantaneous bounce time and an interval bounce time related to the bounce of the contact, wherein the instantaneous bounce time indicates the sum of durations of each bounce in the corresponding contact-on phase, and the interval bounce time indicates a time difference between a first bounce and a last bounce in the corresponding contact-on phase; Determine a first monitoring result based on the monitoring value of the instantaneous bounce time and at least one threshold value, wherein the first monitoring result indicates whether there is a risk of welding of the contact; as well as Based on the monitoring value of the instantaneous bounce time and the monitoring value of the interval bounce time, a second monitoring result is determined, and the second monitoring result indicates whether there is an abnormality in the driving mechanism of the contact.

2. The method of claim 1, wherein the at least one threshold comprises a failure threshold, and determining the first monitoring result comprises: determining a maximum instantaneous bounce time in the at least one switch-on phase from the monitored values ​​of the instantaneous bounce time; comparing the maximum instantaneous bounce time with the failure threshold; as well as In response to the maximum instantaneous bounce time being greater than the failure threshold, it is determined that there is a risk of welding of the contacts.

3. The method of claim 2, wherein the at least one threshold comprises a safety threshold, and the method further comprises: comparing the maximum instantaneous bounce time with the safety threshold; In response to the maximum instantaneous bounce time being less than the safety threshold, it is determined that there is no risk of welding of the contacts.

4. The method according to claim 2, further comprising: Indicative information about the welding risk is presented.

5. The method according to claim 1, wherein determining the second monitoring result comprises: determining an average instantaneous bounce time in the at least one switch-on phase based on the monitored value of the instantaneous bounce time; determining an average interval bounce time in the at least one switch-on phase based on the monitored value of the interval bounce time; as well as The second monitoring result is determined based at least on a comparison of the average instantaneous bounce time and the average interval bounce time.

6. The method according to claim 5, wherein determining the second monitoring result based on at least a comparison between the average instantaneous bounce time and the average interval bounce time comprises: comparing the average interval bounce time with a preset multiple of the average instantaneous bounce time; In response to the average interval bounce time being greater than the preset multiple of the average instantaneous bounce time, determining the number of zero crossings respectively occurring in at least one disconnection phase of the contact, the at least one disconnection phase respectively corresponding to the at least one connection phase; as well as In response to an average value of the number of zero-crossing points being greater than a threshold number, it is determined that an abnormality exists in the driving mechanism of the contact.

7. The method according to claim 6, further comprising: Presenting indication information that an abnormality exists in the driving mechanism.

8. The method of claim 1 , wherein the contact comprises a plurality of contact assemblies corresponding to a plurality of phases, respectively, and wherein monitoring the instantaneous bounce time and the interval bounce time comprises: During the at least one make-on phase, the instantaneous bounce time and the inter-bounce time are monitored for each contact assembly of the plurality of contact assemblies.

9. A device for monitoring contact status, comprising: An electrical parameter measuring unit configured to measure an electrical parameter associated with the contact during at least one make-on phase of the contact; a storage unit configured to store at least one threshold; and The processing unit is configured as follows: In the at least one connection phase, based on the electrical parameter, monitoring an instantaneous bounce time and an interval bounce time related to the bounce of the contact, wherein the instantaneous bounce time indicates the sum of the durations of each bounce in the corresponding connection phase, and the interval bounce time indicates the time difference between the first bounce and the last bounce in the corresponding connection phase; Determine a first monitoring result based on the monitoring value of the instantaneous bounce time and the at least one threshold value, wherein the first monitoring result indicates whether there is a risk of welding of the contact; as well as Based on the monitoring value of the instantaneous bounce time and the monitoring value of the interval bounce time, a second monitoring result is determined, and the second monitoring result indicates whether there is an abnormality in the driving mechanism of the contact.

10. The apparatus according to claim 9, wherein the storage unit is further configured to store a failure threshold, and the processing unit is further configured to: determining a maximum instantaneous bounce time in the at least one switch-on phase from the monitored values ​​of the instantaneous bounce time; comparing the maximum instantaneous bounce time to the failure threshold; and In response to the maximum instantaneous bounce time being greater than the failure threshold, it is determined that there is a risk of welding of the contacts.

11. The apparatus according to claim 10, wherein the storage unit is further configured to store a safety threshold, and the processing unit is further configured to: comparing the maximum instantaneous bounce time with the safety threshold; and In response to the maximum instantaneous bounce time being less than the safety threshold, it is determined that there is no risk of welding of the contacts.

12. The apparatus according to claim 10, wherein the processing unit is further configured to: Indicative information about the welding risk is presented.

13. The apparatus according to claim 9, wherein the processing unit is further configured to: determining an average instantaneous bounce time in the at least one switch-on phase based on the monitored value of the instantaneous bounce time; determining an average interval bounce time in the at least one switch-on phase based on the monitored value of the interval bounce time; and The first monitoring result is determined based at least on a comparison of the average instantaneous bounce time and the average interval bounce time.

14. The apparatus according to claim 13, wherein the processing unit is further configured to: comparing the average interval bounce time with a preset multiple of the average instantaneous bounce time; In response to the average interval bounce time being greater than the preset multiple of the average instantaneous bounce time, determining the number of zero crossings respectively occurring in at least one disconnection phase of the contact, the at least one disconnection phase respectively corresponding to the at least one connection phase; and In response to an average value of the number of zero-crossing points being greater than a threshold number, it is determined that an abnormality exists in the driving mechanism of the contact.

15. The apparatus according to claim 14, wherein the processing unit is further configured to: Presenting indication information that an abnormality exists in the driving mechanism.

16. The apparatus of claim 9, wherein the contact comprises a plurality of contact assemblies respectively corresponding to a plurality of phases, and wherein the processing unit is further configured to: During the at least one make-on phase, the instantaneous bounce time and the inter-bounce time are monitored for each contact assembly of the plurality of contact assemblies.

17. A switch device comprising: Contacts; as well as An apparatus as claimed in any one of claims 9 to 16, adapted to monitor the state of the contacts.

18. A computer-readable storage medium having a computer program stored thereon, wherein the computer program can be executed by a processor to implement the method according to any one of claims 1 to 8.

Images