Interchangeable detector module for spectrometer system

Abstract

A removable insertable detector module for a spectrometer. An example microscope system includes a microscope plate, a plurality of struts fixedly mounted to the microscope plate, and a detector module removably mounted to the microscope plate. A strut aligns the detector module relative to the microscope plate. The detector module comprises a detector substrate, a detector fixedly installed on the detector substrate, and an optical element fixedly installed on the detector substrate. The optical element is configured to receive the light and direct the light to the detector.

Description

Technical Field

[0001] Embodiments described herein relate to spectrometers, such as, for example, infra-red (IR) microscopes, and more particularly to detector modules that are removably insertable into spectrometers and spectral imaging microscopes. Summary of the invention

[0002] One example provides a microscope system including a microscope board, a plurality of pillars fixedly mounted to the microscope board, and a detector module removably mounted to the microscope board. The pillars align the detector module relative to the microscope board. The detector module includes a detector substrate, a detector fixedly mounted on the detector substrate, and an optical element fixedly mounted on the detector substrate. The optical element is configured to receive light and direct the light to the detector.

[0003] Another example includes an interchangeable detector module for a microscope system. The detector module includes a detector housing including a top plate, a bottom plate, and a side wall extending from the bottom plate to the top plate. The side wall includes an opening for light to enter the detector module. The detector module includes a detector fixedly mounted to the bottom plate and located within the detector housing, an optical element fixedly mounted to the bottom plate and located within the detector housing, and at least one latch coupled to the top plate for locking the detector module to the microscope. The optical element is configured to receive light entering the detector module and direct the light to the detector.

[0004] Other aspects will become apparent by consideration of the detailed description and accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0005] Illustrative embodiments of the present invention will hereinafter be described with reference to the drawings, wherein like reference numerals refer to like elements.

[0006] Figure 1A to Figure 1B A spectrometer according to an illustrative embodiment is depicted.

[0007] Figure 2 Depicted is a schematic diagram of an illustrative embodiment of Figure 1A to Figure 1B Block diagram of a spectrometer.

[0008] Figure 3A Depicted is a perspective view of a detector module according to an illustrative embodiment.

[0009] Figure 3B Depicted Figure 3A Another perspective view of the detector module.

[0010] Figure 3C Depicted Figure 3A Top view of the detector module.

[0011] Figure 3D Depicted Figure 3A Bottom view of the detector module.

[0012] Figure 4 Depicted is a schematic diagram of a device according to an illustrative embodiment. Figure 1A to Figure 1B The base plate of the spectrometer extends from a plurality of pillars.

[0013] Figure 5 Depicts installation to Figure 4 on the substrate Figure 3A The detector module.

[0014] Fig. 6A Depicted is a schematic diagram of a device mounted within an accessory opening according to an illustrative embodiment. Figure 3A The detector module.

[0015] Figure 6B Depicts a detector module removed according to an exemplary embodiment. Fig. 6A Accessory opening.

[0016] Figure 7 Depicted is a method for replacing a Figure 3A Methods of the detector module. DETAILED DESCRIPTION

[0017] Fourier transform infrared (FTIR) spectrometers (e.g., spectroscopes, microscopes, and the like) are utilized to perform accurate and efficient identification of the chemical composition of a sample. Such spectrometers are typically combined with an interferometer, such as a Michelson interferometer, which has a beam splitter and a moving mirror. The interferometer modulates the light beam from the source to provide an output beam in which the radiation intensity of different wavelengths varies. The light can be in the ultraviolet (UV), visible (Vis), near-infrared (NIR), mid-infrared (MIR), and / or far-infrared (FIR) wavelength range, and is therefore not limited to the infrared spectral region. The output beam is focused and passes through or is reflected from the sample, after which the beam is collected and focused onto a detector. The detector provides a time-varying output signal containing information about the wavelength of absorption or reflection of the sample. For example, the intensity of the output light at one or more wavelengths is compared to the intensity of the input light at one or more wavelengths to determine properties of the sample, such as absorbance, transmittance, fluorescence, reflectance, etc. Fourier analysis is performed on the output signal data to produce measured properties that provide information about the identity of the components within the sample, their relative concentrations, and possibly other characteristics of the sample.

[0018] Because the light received by the detector has a diameter of less than 0.25 mm, the placement of the detector within the spectrometer must be precise for accurate measurements. Conventional detectors require a specialized technician to replace the detector, resulting in delays in collecting data when a different detector is desired, as well as the potential for manual error and inefficient use of resources (e.g., if an experiment needs to be repeated due to improper detector installation). Therefore, there is a need for an easily replaceable (or exchangeable) detector module for a spectrometer.

[0019] Embodiments described herein provide a removable insert detector module for a microscope or spectrometer with alignment features to assist in replacing a detector. For example, a removably mounted detector module is inserted into a microscope for receiving a light beam that has been docked with a sample for analysis. The detector module may include a detector substrate, a detector fixedly mounted on the detector substrate, and at least one optical element configured to receive light from the sample and guide the light to the detector. The optical element may focus light on the detector. The optical element may be a reflector. In one example, the reflector is a parabolic mirror for focusing light on a detection element of the detector. The optical element may be pre-aligned relative to the detector and fixedly mounted on the detector substrate. The optical element may also be aligned with other optical elements arranged outside the detector module, which deliver light toward the detector module. In this way, an operator or user of a microscope / spectrometer, rather than a service person, may exchange the detector module without realigning the detector.

[0020] In order to assist the operator to ensure that the detector module is automatically aligned in the microscope, a plurality of pillars are fixedly mounted to the microscope plate of the microscope and extend vertically from the microscope plate. The microscope plate is fixedly mounted to the housing of the microscope. In one example, the microscope plate is the base of the microscope. In another example, the microscope plate is positioned parallel to the base of the microscope. In another example, the microscope plate is perpendicular to the base of the microscope. By guiding the detector module toward the target position of the microscope plate while the operator inserts the detector module into the microscope, a plurality of pillars can align the detector module with the microscope plate. In some embodiments, one or more pillars are arranged to surround the detector module when the detector module is mounted to the microscope. In other embodiments, one or more pillars can penetrate into the detector module through one or more holes in the detector substrate. In some embodiments, when the detector module is installed, some pillars are outside the detector module, and some pillars are inserted into the detector module or pass through the detector module.

[0021] To further align the detector module relative to the microscope board, the detector module may include at least one pin, and preferably two pins, extending from the bottom of the detector module (e.g., a detector-based board) and configured to interface with a recess in the base of the microscope board. The pins may also assist in aligning one or more electrical terminals that electrically connect the detector module and the microscope.

[0022] The detector module may include a detector top plate and one or more latches coupled to the detector top plate. In some examples, the detector top plate may include a recessed area around the edge for receiving a pillar when the detector module is mounted to the microscope. In some examples, the detector top plate may include one or more holes for receiving a pillar. One or more latches may engage with the pillar to fix the detector module relative to the microscope plate. In some examples, the latch may engage with the gap of the pillar and apply a vertical force to the microscope plate to push the detector module against the microscope plate. Therefore, the detector module is fixed on an axis orthogonal to the microscope plate. A handle or other type of grip may be provided on the top of the detector module (e.g., on the detector top plate) to assist the operator in installing the detector module.

[0023] The detector module may further include a side wall surrounding at least a portion of the detector and the optical element. The side wall extends from the top plate to the detector substrate. The side wall may include a recess for receiving a pillar to further align the detector module relative to the pillar.

[0024] The detector module may include an opening for receiving a coolant for the detector. The microscope may have a module opening for replacing the detector module. The microscope may have a filling port for receiving the coolant. The filling port may be part of the module opening. Thus, when the detector module is mounted with the microscope, coolant may be conveniently added to the detector module via the filling port and the opening of the detector module.

[0025] In this article, when two parts (e.g., any mechanical parts or optical parts) are fixedly mounted, the relative position between the parts cannot be changed, or the parts cannot be moved relative to each other. The two parts can be fixedly mounted via direct or indirect connectors. The user of the spectrometer cannot adjust the relative position of the fixedly mounted parts. However, the user can detach or attach removable / interchangeable mounted parts during normal operation of the spectrometer.

[0026] Once the detector module is installed and locked to the microscope board, the microscope can be configured to automatically identify the detector type via the electrical terminals of the detector module. The microscope can automatically set data acquisition parameters based on the identified detector. Therefore, the same sample can be imaged with different detectors. The operator can easily and reliably swap detector modules while the microscope is powered on. This can significantly reduce microscope downtime.

[0027] In an illustrative embodiment, a microscope system is provided. The microscope system includes a microscope board, a plurality of pillars fixedly mounted to the microscope board, and a detector module removably mounted to the microscope board. When the detector module is mounted to the microscope board, the detector module is surrounded by the plurality of pillars. The detector module includes a detector substrate, a detector fixedly mounted on the detector substrate, and an optical element fixedly mounted on the detector substrate. The optical element is configured to receive a collimated light beam and focus the light on the detector.

[0028] In another illustrative example, an interchangeable detector module for a microscope system is provided. The detector module includes a detector housing including a top plate, a bottom plate, and a side wall extending from the bottom plate to the top plate. The side wall includes an opening for light to enter the detector module. The detector module includes a detector fixedly mounted to the bottom plate and located within the detector housing, and an optical element fixedly mounted to the bottom plate and located within the detector housing. The optical element is configured to receive light entering the detector module and direct the light to the detector. The detector module also includes at least one latch coupled to the top plate for locking the detector module to the microscope.

[0029] Before explaining any embodiment in detail, it should be understood that the embodiments described herein are provided as examples, and the details of the construction and arrangement of the components described herein or shown in the drawings should not be considered to be limiting. In addition, it should be understood that the words and terms used herein are for descriptive purposes and should not be considered to be limiting. "Including," "including," or "having" and variations thereof used herein are meant to cover the items listed thereafter and their equivalents and additional items. The terms "install," "connect," and "couple" are widely used and cover direct and indirect installations, connections, and couplings. Further, "connect" and "couple" are not limited to physical or mechanical connectors or couplings, and may include electrical connectors or couplings, whether direct or indirect. In addition, electronic communications and data exchange can be performed using any known means including direct connections, wireless connections, and similar connections.

[0030] It should be noted that multiple hardware- and software-based devices and multiple different structural components can be utilized to implement the embodiments described herein or parts thereof. In addition, it should be understood that the embodiments described herein may include hardware, software and electronic components or modules, and for the purpose of discussion, they may be shown and described as being implemented in hardware as if most components were only implemented. However, those of ordinary skill in the art will recognize based on the reading of this specific embodiment that, in at least one embodiment, the electronic-based aspects described herein may be implemented in software (stored on a non-transient computer-readable medium) executable by one or more processors. Therefore, it should be noted that multiple hardware- and software-based devices and multiple different structural components may be used to implement the embodiments described herein. For example, the "controller" described in the specification may include one or more processors, one or more memory modules including a non-transient computer-readable medium, one or more input / output interfaces, and various connectors (e.g., system bus) of connecting components.

[0031] As will be appreciated by those skilled in the art, Fourier transform infrared (FTIR) spectroscopy is a measurement technique in which, rather than recording the energy absorbed within each individual spectral range, the energy across the entire spectrum is collected by a single detector. A light source emits broadband infrared energy that is directed into an interferometer (such as a Michelson interferometer) that splits the light. The light emitted from the interferometer is directed into a sample compartment of a sample analysis device. The light interacts with the sample and is transmitted through or reflected from the sample surface depending on the type of analysis performed by the sample analysis device. After leaving the sample compartment, the light reaches a detector and is measured to produce a sample analysis signal. Using Fourier transform, the sample analysis signal is transformed from the displacement of a reflector into a wave number to obtain spectral information about the sample. Typically, an FTIR spectrometer includes a laser for internal calibration of the interferometer.

[0032] Steering Figure 1A to Figure 1B , Figure 1A to Figure 1B An example spectrometer 100 is shown. The spectrometer includes an instrument housing 102 coupled to a microscope base 104. A plurality of electrical and optical components may be connected to the microscope base 104, a secondary board (e.g., Figure 4 The instrument housing 102 includes a top portion 106 in which an accessory opening 108 is formed. A lid 110 is coupled to the top portion 106 (eg, via one or more hinges) to optionally seal the accessory opening 108. Figure 1A In the example of , the cover 110 is open. Figure 1BIn some examples, the lid 110 is closed. The lid 110 can be removably coupled to the top portion 106, or can be fixed to the top portion 106, such as via a threaded coupling, a pressure or friction fit coupling, or the like. The accessory opening 108 can receive the detector module 112, as described in more detail below. In some examples, the lid 110 includes a fill port 114 that aligns with the detector top opening 328 of the detector module 112 (see FIG. 3A to FIG. 3D ) for adding coolant to the detector module.

[0033] Figure 2 An example of a spectrometer 100 including an optical microscope and an analysis system is shown. In this example, the optical microscope includes an optical microscope illumination source 210, a beam splitter 211, and a camera 280. Light (such as visible light) generated from the optical microscope illumination source is directed toward an objective lens 270 after being reflected by the beam splitter 211. The objective lens 270 directs the light toward a sample 251 positioned on a sample stage 260. A portion of the light reflected from the sample 251 passes through the objective lens 270 and is received by the camera 280. The light received by the camera 280 may also pass through one or more beam splitters (e.g., beam splitters 211, 256, 231). The camera 280 may be a video camera or any other detector suitable for acquiring an image of the sample 251. The sample image allows visualization of the sample 251. For example, features or objects on the surface of the sample 251 may be visualized in the image of the sample.

[0034] The analysis system includes an analysis illumination source 230, a beam splitter 231, an aperture stop 255, and a detector module 250 (e.g., an analysis [FTIR] detector module). The detector module 250 can be, for example, the same as the detector module 112, or include components of the detector module 112. Light generated from the analysis illumination source 230 (such as light in the NIR-IR wavelength range) is sequentially directed to the beam splitter 231, the objective lens 270, and the sample 251. Light reflected from the sample 251 passes sequentially through the objective lens 270, the beam splitter 256, the aperture stop 255, and reaches the detector module 250. The aperture stop 255 includes an adjustable aperture, wherein the size of the aperture can be adjusted by a controller (such as the illumination control system 240 or the controller 291). Based on the spectral data received by the detector module 250, the sample composition (such as the molecular composition) can be determined. The aperture of the aperture stop 255 limits the sample area from which the reflected light can reach the detector module 250. In this way, the aperture stop 255 determines the size of the sample area analyzed by the analysis system. In other words, the aperture determines the spatial resolution of the analysis system.

[0035] The spectrometer 100 also includes a marking illumination source 220. The light generated from the marking illumination source 220 reaches the sample 251 after sequentially passing through the aperture stop 255, the beam splitter 256 and the objective lens 270. A portion of the light reflected from the sample 251 is collected by the camera 280 after passing through the beam splitters 256, 231 and 211. The light generated from the marking illumination source 220 has a narrower bandwidth than the light generated from the optical microscope illumination source 210. In one example, the wavelength bandwidth of the light generated by the marking illumination source 220 is less than 100nm. In another example, the wavelength bandwidth of the light used to acquire the aperture mark image is less than 50nm or 30nm. In another example, the light generated by the marking illumination source 220 is blue light. In yet another example, the wavelength of the light used to acquire the aperture mark image is between 440nm and 480nm.

[0036] The use of a short wavelength in the visible wavelength range can increase the resolution of the aperture mark image, so as to increase the accuracy of the first part of the autofocus process. The use of a narrow wavelength range (such as blue light) can advantageously reduce the influence of external light sources on the acquisition of the aperture mark image. When the sample 251 is illuminated only by the mark illumination source 220, the image acquired by the camera 280 includes a high-intensity area corresponding to the portion of the sample surface illuminated by the light passing through the aperture. The high-intensity area in the image is referred to as an aperture mark in this article. The shape and size of the aperture mark in the image depends on the shape and size of the aperture of the aperture stop 255, the optical configuration of the spectrometer 100, and the position of the sample 251 relative to the objective lens 270. The aperture mark in the acquired image can be used to indicate the area of ​​the sample analyzed by the analysis system. Therefore, when both the optical microscope illumination source 210 and the mark illumination source 220 are turned on, the aperture mark can be used to select an area of ​​the sample for analysis and acquisition.

[0037] The optical microscope illumination source 210, the analysis illumination source 230, and the labeling illumination source 220 may have different optical characteristics (e.g., different wavelengths, intensities, etc.) because they are used by different parts of the spectrometer 100. Because the light from the labeling illumination source 220 is ultimately projected onto the sample 251 through the aperture stop 255, the labeling illumination source 220 may project less light onto the sample 251 than the optical microscope illumination source 210.

[0038] In some embodiments, the marking illumination source 220 may be a separate model from the spectrometer 100. In some embodiments, the marking illumination source 220 may be omitted. For example, the marking illumination source 220 may be implemented by filtering the light generated from the optical microscope illumination source 210.

[0039] The focus of the optical microscope and the analytical optical system is the same to allow for suitable visualization and sample analysis. In this article, the focus of the optical microscope and the analytical system is referred to as the focus of the spectrometer 100. Ideally, the focus of the spectrometer 100 should be approximately at the sample surface. Therefore, the position of the sample 251 (such as along the z-axis) is adjusted by moving the position of the sample 251 or moving an optical device (such as an objective lens 270) until the focus is correctly positioned. In one example, adjusting the focus relative to the sample surface includes adjusting the distance 252 between the objective lens 270 and the sample stage 260.

[0040] The spectrometer 100 includes a controller 291, which includes a processor and a non-transitory memory for storing computer-readable instructions. By executing the instructions in the processor, the imaging system can perform the method or part thereof implemented by the device disclosed herein. The controller 291 can send and receive information from one or more of the illumination control system 240, the camera 280, the detector module 250, the aperture stop 255, and the sample stage 260. For example, the controller 291 can communicate with the illumination control system 240 to turn on or off any one of the optical microscope illumination source 210, the analysis system illumination source 230, and the marking illumination source 220. The illumination control system can be a module separate from the controller 291, and can also include a processor and a memory. In some examples, the illumination control system can be a part of the controller 291. The controller 291 can adjust the size of the aperture by actuating the aperture stop 255. The controller 291 can adjust the distance between the sample stage 269 (or the sample 251) and the objective lens 270 by moving the sample stage 260. The controller 291 receives data acquired from the camera 280 and the detector module 250 to generate an image or chart based on the received data. The controller 291 can receive user input from the computer interface 292 and display the acquired information, such as images and sample composition information, via the computer interface 292. The computer interface 292 may include a display and a user input device.

[0041] Figure 2 An imaging system is shown for detecting light from sample 251. In some embodiments, the imaging system can collect light from sample 251 in transmission mode, with sample 251 illuminated from a first side of sample 251 and light collected from a second, opposing side of sample 251.

[0042] FIG. 3A to FIG. 3DAn example detector module 112 is shown that can be inserted or removed from an opening, such as an accessory opening 108 at the top of a microscope or spectrometer. The detector module 112 includes a detector housing 301 that is composed of side walls 302 surrounding the detector, optical elements within the detector module 112, a detector substrate 304, and a top plate 306. The top plate 306 can have one or more recessed portions 334 around the edges for alignment with corresponding pillars. The side walls 302 are coupled to the detector substrate 304 and the top plate 306. The side walls 302 as shown have a continuous solid wall perimeter that protects components within the detector module 112, for example, to prevent an operator from accidentally contacting components within the detector module 112. However, in other embodiments, the side walls 302 can have a non-continuous perimeter (e.g., a portion of the side walls 302 is removed, leaving a gap between the detector substrate 304 and the top plate 306). The side walls 302 can include one or more recesses 324 for positioning the detector module 112 relative to ( Figure 4 The microscope plate 404 shown is horizontally (i.e., XY plane) guided and aligned.

[0043] Side wall 302 includes side opening 308 for receiving light from sample 251. For example, referring to Figure 2 , the light from the sample 251 passes sequentially through the objective lens 270, the beam splitter 256, the aperture stop 255 and the side opening 308. In some embodiments, the light entering the side opening 308 is collimated light. In other embodiments, the light entering the side opening 308 is divergent (e.g., extended) light or converging light. The light entering the side opening 308 is reflected by a focusing mirror 310 (e.g., an optical element) toward a detector 312 as focused light. The focusing mirror 310 and the detector 312 are located in the detector housing 301. In some instances, the focusing mirror 310 and the detector 312 are fixedly mounted to the detector substrate 304. The focused light directed to the detector 312 by the focusing mirror 310 can have a diameter of about 0.25 mm. The detector 312 can be, for example, a mercury cadmium telluride (MCT) IR detector, an indium gallium arsenide (InGaAs) detector, or a similar detector. Different detectors can be used to detect wavelengths in different ranges. Different detector accessories can be inserted into the spectrometer 100 to use different detectors and / or imaging components with the spectrometer 100. In some embodiments, the focusing mirror 310 is a parabolic mirror.

[0044] To secure the detector module 112 within the spectrometer 100, the detector module 112 may include one or more latches. FIG. 3A to FIG. 3DIn the example of FIG. 1 , the detector module 112 includes one or more latches 314, and each latch 314 is connected to an associated knob 316. The latch 314 and the knob 316 are combined to form a cam lock. To operate the one or more latches 314, a user who installs the detector module 112 turns the associated knob 316 in a first direction. By turning the knob 316 in the first direction, the associated latch 314 is engaged and locked to a fixed ( Figure 4 The support of the microscope plate 404 (such as Figure 4 400). The latch 314 can be engaged to a recess or gap 402 on the pillar 400. By turning the knob 316, the latch 314 also applies a force relative to the pillar 400 along a vertical axis (i.e., along the axis of the pillar, the Z axis). Therefore, when the latch 314 is engaged, the detector module 112 is pushed against the microscope plate 404 and cannot move vertically relative to the microscope plate 404. That is, the detector module 112 cannot move in the Z axis. By turning the knob 316 in a second direction opposite to the first direction, the detector module 112 can be disengaged and released from the microscope plate 404. When in the unlocked position, the user can remove the detector module 112 from the spectrometer 100 by lifting the detector module 112 along the Z axis through the opening at the top of the spectrometer 100. In other examples, other locking mechanisms can be provided. For example, the knob 316 can be replaced by a lock configured to receive a key. When the key is received and turned, the corresponding latch 314 is turned to engage with the corresponding recess / gap 402. In another example, the knob 316 is replaced with, for example, a pivoting knob, a lateral push-type knob, or the like. In addition, other types of locking mechanisms that engage a portion of the spectrometer 100 may be implemented to replace the latch 314 and knob 316 that secure the detector module 112 within the spectrometer 100.

[0045] In some instances, the detector module 112 includes one or more grips, such as, for example, a handle 318 that extends perpendicular to the top plate 306 to assist in installing or removing the detector module 112. Although the handle 318 is generally illustrated as being circular with an open area, the handle 318 can have different shapes, sizes, and orientations. For example, in some instances, the handle 318 includes, for example, a knob extending from the top plate 306, can have multiple portions for receiving one or more fingers to grasp the detector module 112, or can be a handle with an open area of ​​another shape (e.g., circular, square, triangular, etc.). Additionally, in some instances, the handle 318 can extend from opposite sides of the sidewall 302, rather than from the top plate 306. A user can hold the one or more handles 318 while allowing one or more recesses 324 (e.g., see Figure 3C) is aligned with one or more pillars 400. In some examples, one or more recesses 324 extend along the height of the sidewall 302 to assist in guiding the detector module 112 into the spectrometer 100 while the detector module 112 is inserted.

[0046] The detector module 112 includes a detector controller 322 configured to read the output of the detector 312. The detector controller 322 includes a processor and a non-transitory memory for storing computer-readable instructions. By executing the instructions in the processor, the detector module 112 can perform operations related to the detector 312. For example, the detector controller 322 can analyze and / or change the data received from the detector 312, can adjust the data before sending the data to an external controller (e.g., the controller 291 of the spectrometer 100), can provide control parameters for the spectrometer 100 (e.g., control parameters for the lighting control system 240), etc. In some examples, the detector module 112 includes one or more electrical terminals 320, which are connected to ( Figure 6B The corresponding terminal 600 of the spectrometer 100 shown in FIG. FIG. 3A to FIG. 3D In the example shown, one or more electrical terminals 320 extend downward from the bottom of the detector substrate 304. The detector controller 322 can communicate with the controller 291 via the one or more electrical terminals 320. For example, the detector controller 322 can automatically read information from the installed detector and set corresponding parameters for reading signals using the installed detector. The data obtained from the detector 312 can be transmitted to the controller 291 and analyzed by the controller 291.

[0047] In some embodiments, one or more electrical terminals 320 include a ground pin configured to align with a ground terminal of a microscope board 404. During the installation of the detector module 112 into the spectrometer 100, the ground pin discharges static electricity to the ground terminal. In this way, the electrical connection between the one or more electrical terminals 320 and the spectrometer 100 is protected from static electricity. In some embodiments, one or more electrical terminals 320 include a power pin extending from the bottom of the detector housing 301. The power pin is aligned with the power terminal of the microscope board 404. When the power pin is inserted into the power terminal, the detector module 112 receives power from the spectrometer 100. In some instances, the ground pin extends farther from the bottom of the detector substrate 304 than the power pin, so that static electricity is discharged before the power pin is inserted into the power terminal. In further embodiments, one or more electrical terminals 320 include a communication pin. The communication pin is aligned with the communication terminal of the microscope board 404. In some instances, the communication pin indicates the type of the detector 312 in the detector housing 301. Thus, the controller 291 of the spectrometer 100 may receive the type of detector 312 and adjust operating parameters for the spectrometer 100 .

[0048] As mentioned above and Figure 4 As shown, the plurality of pillars 400 extend upward and perpendicular to the microscope plate 404 of the spectrometer 100. The plurality of pillars 400 are arranged so that when the detector module 112 is installed in the spectrometer 100, the plurality of pillars 400 surround the detector module 112. The plurality of pillars 400 can be arranged so that the detector module 112 can be installed in only a single orientation. The pillars 400 are fixedly mounted to the microscope plate 404. Although in Figure 4 Six pillars 400 are shown in the example of , but in some instances, a fewer or greater number of pillars 400 may be included, and the pillars 400 may only surround a portion of the detector module 112 rather than the entire perimeter of the detector module 112. In some instances, only a single pillar 400 is included. One or more of the plurality of pillars 400 can be received by one or more recesses 324 of the detector module 112 to align the detector module 112 within the spectrometer 100. In some embodiments, after the detector module 112 is placed onto the microscope plate 404, the knob 316 is turned to rotate one or more latches 314, which are received by corresponding gaps 402 in adjacent pillars 400, such as Figure 5 In some embodiments, the detector module 112 can include a plurality of posts 400 located on the sidewall 302 and configured to be received by a recess within the spectrometer 100 .

[0049] In some examples, the detector substrate 304 further includes an alignment pin 326 (eg, Figure 3D When the detector module 112 is aligned within the spectrometer 100, the alignment pins 326 are positioned by corresponding slots 602 (as shown in FIG. 6 ) of the microscope plate 404. Figure 6B 400) is received by the detector module 112, thereby providing additional support to ensure that the detector module 112 is correctly aligned. In other embodiments, the alignment pins 326 are located on the microscope support plate 404, and the corresponding slots 602 are located on the detector substrate 304. In addition, in some embodiments, the detector module 112 includes a plurality of alignment pins 326 received by the corresponding slots 602 of the microscope plate 404. Compared with the pillars 400, the alignment pins 326 provide a finer alignment (lower alignment error tolerance) in the XY plane. When the detector module 112 is inserted into the spectrometer 100, the detector module 112 is first roughly horizontally aligned by guiding the pillars 400, and then finely and more accurately horizontally aligned by the alignment pins 326. Therefore, a two-stage horizontal alignment is automatically achieved with minimal requirements for the user or operator.

[0050] In some examples, the detector module 112 includes a ring 330 that is secured to the detector substrate 304 and is configured to hold a cable (not shown) associated with the detector 312 and / or the detector controller 322. Although illustrated as having a circular opening, the ring 330 can have openings of other shapes, such as a rectangular ring or a triangular ring. The cable can connect one or more electrical terminals 320 to a controller terminal 332 of the detector controller 322.

[0051] In some examples, the detector module 112 includes a detector top opening 328 in the top plate 306. The detector top opening 328 can receive a coolant (eg, liquid nitrogen) for cooling the detector 312.

[0052] As previously described, the detector module 112 is installed into the spectrometer 100 via the accessory opening 108 . FIG. 6A to FIG. 6B The accessory opening 108 is shown in greater detail. Fig. 6A , the detector module 112 is located within the accessory opening 108. The shape of the accessory opening 108 mirrors the shape of the detector housing 301 (e.g., the top plate 306) to assist in aligning the detector module 112 within the accessory opening 108. In some examples, the accessory opening 108 includes a gasket around the outer perimeter of the accessory opening 108 so that when the lid 110 is closed to seal the accessory opening 108, the interior of the accessory opening 108 is pressure-tight. Figure 6B , the detector module 112 is removed from the accessory opening 108, thereby exposing the microscope plate 404, the plurality of posts 400, the spectrometer terminals 600 configured to receive one or more electrical terminals 320 of the detector module 112, and the slots 602 configured to receive the alignment pins 326.

[0053] If a user wishes to use multiple detectors for the same sample or multiple detectors for multiple samples, the detector module 112 can be removed and replaced, and in some instances, can be removed and replaced while the spectrometer is operating. For example, as described above, in some instances, by extending further than the power pin, the ground pin allows the detector module 112 to be removed and replaced without creating a short circuit or other electrical condition even when the spectrometer is currently operating / powered.

[0054] Figure 7 An example method 700 is provided for operating a microscope having multiple detector modules (eg, multiple detector attachments 112). The sample being analyzed by the microscope may be changed at any point during the method 700.

[0055] At step 702, method 700 includes mounting a first detector module to a plate of a microscope. The first detector module includes a first detector for detecting signals within a first wavelength range. For example, the first detector module 112 includes an MCT1r detector. The cover 110 is removed (or opened), and the first detector module 112 is lowered into the accessory opening 108. The first detector module 112 is guided onto the microscope plate 404 by a plurality of pillars 400. In some instances, the alignment pins 326 are received by the slots 602. In addition, one or more latches 314 can be operated to each engage with a corresponding gap 402 of an adjacent pillar 400.

[0056] At step 704, the method 700 includes identifying the first detector module. For example, when the first detector module 112 is installed in the spectrometer 100, the one or more electrical terminals 320 are received by the spectrometer terminal 600. The communication pins included in the one or more electrical terminals 320 allow communication between the detector controller 322 and the spectrometer controller 291. The detector controller 322 can provide an indication of the type of detector 312 included in the first detector module 112 to the spectrometer controller 291.

[0057] At step 706, the method 700 includes selecting a light source corresponding to the first detector module. For example, when the first detector module 112 is an MCT Ir detector, the infrared light source can be selected by the spectrometer controller 291. In some examples, the spectrometer controller 291 also sets data collection parameters (e.g., a time period for controlling the light source, a wavelength of the light source, and similar parameters) based on the type of detector 312 included in the first detector module 112.

[0058] At step 708, method 700 includes collecting data from a first sample using a first detector module. For example, light generated from analytical illumination source 230 is sequentially directed to beam splitter 231, objective 270, and sample 251. Light from sample 251 sequentially passes through objective 270, beam splitter 256, aperture stop 255, and reaches detector 312 of first detector module 112.

[0059] At step 710, the method 700 includes releasing the first detector module from the board. For example, the first detector module 112 is released from the microscope board 404 by disengaging one or more latches 314 from corresponding posts 400. The first detector module 112 is then removed from the accessory opening 108.

[0060] At step 712, method 700 includes mounting a second detector module to a plate of the microscope. The second detector module includes a second detector for detecting a second wavelength range. For example, the second detector module 112 includes an InGaAs detector. The second detector module 112 is lowered into the accessory opening 108 and guided onto the microscope plate 404 by the plurality of pillars 400. In some examples, the alignment pins 326 of the second detector module 112 are received by the slots 602. In addition, one or more latches 314 can be operated to each engage with a corresponding gap 402 of an adjacent pillar 400.

[0061] At step 714, the method 700 includes identifying the second detector module 112. For example, when the second detector module 112 is installed in the spectrometer 100, the one or more electrical terminals 320 are received by the spectrometer terminal 600. Communication pins included in the one or more electrical terminals 320 allow communication between the detector controller 322 and the spectrometer controller 291. The detector controller 322 provides an indication of the type of detector 312 included in the second detector module 112 to the spectrometer controller 291.

[0062] At step 716, the method 700 includes selecting a light source corresponding to the second detector module. For example, when the first detector module 112 is an InGaAs detector, a white light source can be selected by the spectrometer controller 291. In some examples, the spectrometer controller 291 also sets data collection parameters (e.g., a time period for controlling the light source, a wavelength of the light source, and similar parameters) based on the type of detector 312 included in the second detector module 112.

[0063] At step 718, method 700 includes collecting data from a second sample using a second detector module. For example, light generated from the analytical illumination source 230 is sequentially directed to the beam splitter 231, the objective lens 270, and the sample 251. The light reflected back from the sample 251 passes sequentially through the objective lens 270, the beam splitter 256, the aperture stop 255, and reaches the detector 312 of the second detector module 112. The second sample can be the same sample as the first sample analyzed using the first detector module, or it can be a different sample. For example, as described above, the ground pin can allow the detector module to be removed and replaced while the spectrometer is operating / powered, and thus it is effective to obtain data relative to the same sample loaded in the spectrometer using two different detectors. In some embodiments, the second detector module is configured to detect light of different wavelengths compared to the first detector module.

[0064] In some examples, the accessory opening 108 is located on a side of the instrument housing 102. In such examples, one or more posts 400 may instead extend from the side of the instrument housing 102 in a direction parallel to the microscope plate 404 to assist in mounting the detector module 112.

[0065] In some examples, spectrometer 100 is an IR microscope or a Raman microscope. In such examples, optical microscope illumination source 210, analysis illumination source 230 and / or labeling illumination source 220 can be laser-based illumination sources. In some examples, detector module 112 can be implemented in a spectroscopy device with a small detector element (such as an array detector).

[0066] The following paragraphs provide various examples of the embodiments disclosed herein.

[0067] (1) A microscope system, the microscope system comprising: a microscope board; a detector module, the detector module being removably mounted to the microscope board, the detector module comprising:

[0068] a detector substrate; a detector fixedly mounted on the detector substrate; and

[0069] an optical element fixedly mounted on the detector substrate, wherein the optical element is configured to receive light and direct the light to the detector; and a plurality of pillars fixedly mounted to the microscope board for aligning the detector module relative to the microscope board.

[0070] (2) The microscope system of (1), wherein the detector module further comprises a top plate and a latch coupled to the top plate, wherein the latch is configured to lock the detector module within the microscope.

[0071] (3) The microscope system according to (2), wherein the latch comprises a cam lock.

[0072] (4) The microscope system of any one of (2) to (3), wherein the detector module is locked within the microscope by engaging the latch with at least one of the plurality of pillars.

[0073] (5) The microscope system according to any one of (2) to (4), wherein the detector module further includes a side wall surrounding at least a portion of the detector and the optical element, wherein the side wall is

[0074] The detector substrate extends to the top plate, and wherein the side wall includes an opening for receiving light. (6) The microscope system according to (5), wherein the side wall includes one or more recesses,

[0075] The one or more recesses are configured to align the detector module relative to the plurality of pillars.

[0076] (7) The microscope system according to any one of (2) to (6), wherein the top plate includes an opening for receiving a coolant.

[0077] (8) The microscope system according to any one of (1) to (7), wherein the detector module further includes a handle for inserting the detector module into the microscope or removing the detector module from the microscope.

[0078] (9) The microscope system of any one of (1) to (8), wherein the microscope plate is fixedly mounted to a housing of the microscope, and wherein the housing of the microscope includes an opening at a top for receiving the detector module.

[0079] (10) The microscope system according to any one of (1) to (9), further comprising a second detector module for detecting light of a different wavelength range than the detector module.

[0080] (11) The microscope system according to any one of (1) to (10), wherein the light received by the optical element is collimated light.

[0081] (12) The microscope system according to any one of (1) to (11), wherein the optical element focuses the light toward the detector.

[0082] (13) A microscope system according to any one of (1) to (12), wherein the detector substrate includes at least one pin configured to be received by a corresponding slot in the microscope plate.

[0083] (14) The microscope system according to any one of (1) to (13), wherein the microscope system includes a Raman microscope or an IR microscope.

[0084] (15) The microscope system according to any one of (1) to (14), wherein the detector is one selected from the group consisting of an MCT IR detector and an InGaAs detector.

[0085] (16) The microscope system according to any one of (1) to (14), wherein the support pillar surrounds the detector module when the detector module is mounted to the microscope.

[0086] (17) An interchangeable detector module for a microscope system, the detector module comprising:

[0087] A detector housing comprising a top plate, a bottom plate, and a side wall extending from the bottom plate to the top plate, wherein the side wall comprises an opening for light to enter the detector module; a detector fixedly mounted to the bottom plate and located within the detector housing; an optical element fixedly mounted to the bottom plate and located within the detector housing, the optical element being configured to receive light entering the detector module and direct the light to the detector; and at least one latch coupled to the top plate for locking the detector module to the microscope.

[0088] (18) An interchangeable detector module according to (17), wherein the side wall includes one or more recesses extending along at least a portion of the height of the side wall for guiding the detector module while inserting the detector module into the housing of the microscope.

[0089] (19) The interchangeable detector module of any one of (17) to (18), wherein the latch is configured to engage one or more posts extending from a base plate of the microscope.

[0090] (20) A method of operating a microscope having a plurality of detector modules according to any one of (17) to (19), the method comprising: mounting a first detector module to a substrate of the microscope by engaging a latch with at least one of a plurality of pillars surrounding the first detector module, wherein the pillar is fixedly mounted to the substrate; identifying the first detector module; collecting data from a first sample using the first detector module; releasing the first detector module from the substrate by disengaging the latch; mounting a second detector module to the substrate;

[0091] identifying a second detector module; and collecting data from a second sample using the second detector module.

[0092] (21) The method according to (20), wherein the first sample and the second sample are the same sample.

[0093] As used herein, the word "illustrative" means serving as an example, instance, or illustration. Any aspect or design described herein as "illustrative" is not necessarily to be construed as being preferred or advantageous over other aspects or designs. Further, for purposes of this disclosure, "a" or "an" means "one or more" unless otherwise indicated. Still further, the use of "and" or "or" is intended to include "and / or" unless otherwise specifically indicated.

[0094] The foregoing description of illustrative embodiments of the present invention has been presented for purposes of illustration and description. It is not intended to be exhaustive or to limit the invention to the precise form disclosed, and modifications and variations are possible in view of the above teachings or may be obtained from the practice of the present invention. The embodiments are selected and described in order to explain the principles of the present invention and as practical applications of the present invention, so that those skilled in the art can utilize the present invention in various embodiments and make various modifications to suit the intended specific use. The scope of the present invention is intended to be limited by the appended claims and their equivalents.

[0095] Systems, methods, and devices according to the present disclosure may take any one or more of the following configurations.

[0096] Various features and advantages of the implementations described herein are set forth in the following claims.

Claims

1. A microscope system, comprising: Microscope plates; a detector module removably mounted to the microscope plate, the detector module comprising: a detector substrate; a detector fixedly mounted on the detector substrate; and an optical element fixedly mounted on the detector substrate, wherein the optical element is configured to receive light and direct the light to the detector; and A plurality of posts are fixedly mounted to the microscope plate for aligning the detector module relative to the microscope plate.

2. The microscope system according to claim 1, wherein: The detector module also includes a detector top plate and a latch coupled to the top plate, wherein the latch is configured to lock the detector module within the microscope.

3. The microscope system according to claim 2, wherein: The latch includes a cam lock.

4. The microscope system according to claim 2, wherein: The detector module is locked within the microscope by engaging the latch with at least one of the plurality of posts.

5. The microscope system according to claim 2, wherein: The detector module further includes a side wall surrounding at least a portion of the detector and the optical element, wherein the side wall extends from the detector substrate to the top plate, and wherein the side wall includes an opening for receiving light.

6. The microscope system according to claim 5, wherein: The sidewall includes one or more recesses configured to align the detector module relative to the plurality of pillars.

7. The microscope system according to claim 2, wherein: The top plate includes an opening for receiving a coolant.

8. The microscope system according to any one of claims 1 to 7, wherein: The detector module also includes a handle for inserting or removing the detector module from the microscope.

9. The microscope system according to any one of claims 1 to 7, wherein: The microscope plate is fixedly mounted to a housing of the microscope, and wherein the housing of the microscope includes an opening at a top for receiving the detector module.

10. The microscope system according to any one of claims 1 to 7, further comprising a second detector module for detecting light of a different wavelength range than the detector module.

11. The microscope system according to any one of claims 1 to 7, wherein: The light received by the optical element is collimated light.

12. The microscope system according to any one of claims 1 to 7, wherein: The optical element focuses light toward the detector.

13. The microscope system according to any one of claims 1 to 7, wherein: The detector substrate includes at least one pin configured to be received by a corresponding slot in the microscope plate.

14. The microscope system according to any one of claims 1 to 7, wherein: The microscope system comprises a Raman microscope or an IR microscope.

15. The microscope system according to any one of claims 1 to 7, wherein: The detector is one selected from the group consisting of an MCT IR detector and an InGaAs detector.

16. The microscope system according to any one of claims 1 to 7, wherein: The support posts surround the detector module when the detector module is mounted to the microscope.

17. An interchangeable detector module for a microscope system, the detector module comprising: a detector housing comprising a top plate, a bottom plate, and a side wall extending from the bottom plate to the top plate, wherein the side wall comprises an opening for light to enter the detector module; a detector fixedly mounted to the base plate and located within the detector housing; an optical element fixedly mounted on the base plate and located within the detector housing, the optical element being configured to receive light entering the detector module and direct the light to the detector; as well as At least one latch is coupled to the top plate for locking the detector module to the microscope.

18. The exchangeable detector module according to claim 17, wherein: The side wall includes one or more recesses extending along at least a portion of the height of the side wall for guiding the detector module while inserting the detector module into a housing of the microscope.

19. The exchangeable detector module according to claim 17, wherein: The latch is configured to engage one or more posts extending from a base of the microscope.

20. A method of operating a microscope having a plurality of detector modules according to claim 17, the method comprising: mounting a first detector module to a base plate of the microscope by engaging a latch with at least one of a plurality of base plates fixedly mounted to the base plate; identifying the first detector module; collecting data from a first sample using the first detector module; releasing the first detector module from the substrate by disengaging the latch; mounting a second detector module to the substrate; identifying the second detector module; as well as Data from a second sample is collected using the second detector module.

21. The method according to claim 20, wherein: The first sample and the second sample are the same sample.

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