Laser spectrum on-line analyzer

Abstract

The invention provides a laser spectrum online analyzer, and relates to the field of mineral processing. The laser spectrum online analyzer comprises a control analysis unit, a first sample chamber, a second sample chamber, a spectrum unit and a laser unit, the first sample chamber is used for accommodating a tested sample; the second sample chamber is used for accommodating a to-be-detected sample; the spectrum unit comprises a spectrograph, a first light receiving probe and a second light receiving probe; the laser unit comprises a laser light source, a reflector, a first focusing lens and a second focusing lens. The control analysis unit compares the current spectral intensity of the detected sample with the spectral intensity of the detected sample which is measured in advance, so that the change amplitude of the spectral intensity can be obtained, the spectral intensity is calibrated, and long-term on-site stable operation can be realized. In addition, the laser spectrum analyzer can also perform self-calibration on spectral line drift.

Description

Technical Field

[0001] The invention relates to the field of mineral processing, and in particular to an online laser spectrum analyzer. Background Art

[0002] In the mineral processing production process, the process flow is complex, multi-parameter and multi-variable, among which slurry grade is one of the key parameters. Online slurry grade analysis plays a very critical role in guiding production, saving reagents, controlling product quality and improving recovery rate.

[0003] The commonly used online detection technology is the current X-ray fluorescence grade analysis technology, which has excellent analysis results for heavy metal elements but poor analysis results for light elements and non-metallic elements.

[0004] Compared with this technology, laser induced breakdown spectroscopy is a rapid detection technology with full element analysis capabilities. Slurry grade analysis based on laser induced breakdown spectroscopy is gradually being applied in the field of industrial online detection.

[0005] However, the slurry grade online analyzer is a high-precision spectral device. After the equipment has been running for a long time in the industrial field, it is easy to experience laser energy attenuation, optical lens pollution and damage, etc., resulting in differences in the spectral intensity it measures. When the spectral intensity is abnormal, the equipment cannot determine whether it is the aforementioned difference or the influence of the slurry grade itself, and the measurement accuracy decreases. Therefore, the slurry grade online analyzer based on laser-induced breakdown spectroscopy technology cannot operate stably on site for a long time. Summary of the invention

[0006] In order to solve the problems existing in the prior art, the purpose of the present invention is to provide a laser spectrum online analyzer.

[0007] The present invention provides the following technical solutions:

[0008] A laser spectrum online analyzer, comprising:

[0009] Control analysis unit;

[0010] A first sample chamber, used for containing a measured sample;

[0011] The second sample chamber is used to contain the sample to be tested;

[0012] a spectral unit, comprising a spectrometer and a first light receiving probe and a second light receiving probe connected to the spectrometer, wherein the spectrometer is electrically connected to the control and analysis unit, the first light receiving probe is used to collect the spectrum of the measured sample, and the second light receiving probe is used to collect the spectrum of the sample to be measured; and

[0013] A laser unit, comprising a laser light source, a reflector, a first focusing lens and a second focusing lens, wherein the laser light source is electrically connected to the control and analysis unit, the reflector can move back and forth between a first position and a second position, the first focusing lens is located on the upper side of the first sample chamber, and the second focusing lens is located between the laser light source and the second sample chamber;

[0014] When the reflector is located at the first position, the laser light emitted by the laser light source is reflected by the reflector to the first sample chamber, and when the reflector is located at the second position, the laser light emitted by the laser light source is irradiated to the second sample chamber.

[0015] As a further optional solution for the laser spectrum online analyzer, the laser unit also includes a rotation driving member, and a driving end of the rotation driving member is connected to the reflector to drive the reflector to rotate back and forth between the first position and the second position.

[0016] As a further optional solution for the laser spectrum online analyzer, the laser unit further includes a first limit switch and a second limit switch, and the first limit switch and the second limit switch are both electrically connected to the rotary drive member;

[0017] The reflector triggers the first limit switch when located at the first position, and triggers the second limit switch when located at the second position.

[0018] As a further optional solution for the laser spectrum online analyzer, the laser unit also includes a dichroic mirror, which is located between the laser light source and the second sample chamber. The laser emitted by the laser light source passes through the dichroic mirror and is transmitted to the second sample chamber. The spectrum of the sample to be measured is reflected by the dichroic mirror to the second light receiving probe.

[0019] As a further optional solution for the laser spectrum online analyzer, a third focusing lens is provided on the side of the second light receiving probe facing the second sample chamber.

[0020] As a further optional solution for the laser spectrum online analyzer, when the reflector is located at the first position, the first light receiving probe is located on the side of the reflector facing away from the first sample chamber, and the spectrum of the measured sample passes through the reflector and is transmitted to the first light receiving probe.

[0021] As a further optional solution for the laser spectrum online analyzer, a fourth focusing lens is provided on a side of the first light receiving probe facing the first sample chamber.

[0022] As a further optional solution for the laser spectrum online analyzer, a movable platform for placing the measured sample is provided in the first sample chamber, and the movable platform is electrically connected to the control and analysis unit.

[0023] As a further optional solution for the laser spectrum online analyzer, a mercury lamp light source is further provided in the first sample chamber, and the mercury lamp light source is located on the mobile platform.

[0024] As a further optional solution for the laser spectrum online analyzer, a gas connector for injecting protective gas is provided on the wall of the first sample chamber.

[0025] The embodiments of the present invention have the following beneficial effects:

[0026] When the above-mentioned laser spectrum online analyzer is working, the reflector is located at the second position, and the laser light emitted by the laser light source is focused by the second focusing lens and then irradiated on the sample to be tested in the second sample chamber. The excited plasma spectrum is collected by the second light-receiving probe and transmitted to the spectrometer, and the grade of the sample to be tested is analyzed by the control and analysis unit. When the spectral intensity changes, the reflector moves to the first position, and the laser light emitted by the laser light source is reflected by the reflector and focused by the first focusing lens and then irradiated on the tested sample in the first sample chamber. The excited plasma spectrum is collected by the first light-receiving probe and transmitted to the spectrometer. At this time, the control and analysis unit compares the current spectral intensity of the tested sample with the spectral intensity of the tested sample previously measured, and the amplitude of the change in spectral intensity can be obtained, and the spectral intensity is calibrated according to the amplitude of the change, and then continues to work, and the measurement accuracy is guaranteed during the working process. Therefore, the above-mentioned laser spectrum analyzer can operate stably on site for a long time.

[0027] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and understandable, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0029] Figure 1 The overall structure schematic diagram of a laser spectrum online analyzer provided in Example 1 of the present invention is shown;

[0030] Figure 2The overall structure schematic diagram of a laser spectrum online analyzer provided by Example 2 of the present invention is shown;

[0031] Figure 3 The overall structural diagram of a laser spectrum online analyzer provided in Example 3 of the present invention is shown.

[0032] Description of main component symbols:

[0033] 100-control and analysis unit; 200-first sample chamber; 210-movable platform; 220-electrical connector; 230-sample box; 240-mercury lamp light source; 250-mercury lamp power supply; 260-gas connector; 300-second sample chamber; 400-spectral unit; 410-spectrometer; 420-first light receiving probe; 421-fourth focusing lens; 430-second light receiving probe; 431-third focusing lens; 440-Y-type optical fiber; 500-laser unit; 510-laser light source; 520-reflector; 530-first focusing lens; 540-second focusing lens; 550-lens group; 560-rotating drive member; 570-first limit switch; 580-second limit switch; 590-dichroic mirror; 600-measured sample. DETAILED DESCRIPTION

[0034] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0035] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. In contrast, when an element is referred to as being "directly on" another element, there is no intermediate element. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only.

[0036] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0037] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0038] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of the template are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0039] Example 1

[0040] See also Figure 1 The present embodiment provides a laser spectrum online analyzer, specifically a slurry grade laser spectrum online analyzer with a self-calibration function, the laser spectrum online analyzer includes a control and analysis unit 100, a first sample chamber 200, a second sample chamber 300, a spectrum unit 400 and a laser unit 500.

[0041] The first sample chamber 200 is used to accommodate the tested sample 600, and the second sample chamber 300 is used to accommodate the sample to be tested.

[0042] Exemplarily, the first sample chamber 200 is a solid sample chamber, and the measured sample 600 is a standard steel sample. The second sample chamber 300 is a liquid sample chamber, and the sample to be measured is slurry, and the slurry flows from top to bottom in the second sample chamber 300 to form a liquid column, and the above-mentioned laser spectrum online analyzer performs online analysis on the slurry grade.

[0043] Specifically, the spectral unit 400 includes a spectrometer 410 and a first light receiving probe 420 and a second light receiving probe 430 connected to the spectrometer 410 .

[0044] The spectrometer 410 is electrically connected to the control and analysis unit 100 , the first light receiving probe 420 is used to collect the spectrum of the measured sample 600 , and the second light receiving probe 430 is used to collect the spectrum of the sample to be measured.

[0045] When in use, the spectra collected by the first light receiving probe 420 and the second light receiving probe 430 are transmitted to the spectrometer 410, and the data generated by the spectrometer 410 are further transmitted to the control and analysis unit 100, which processes the spectral data and displays the results.

[0046] Optionally, the first light receiving probe 420 and the second light receiving probe 430 are connected to the spectrometer 410 via a Y-type optical fiber 440 .

[0047] Specifically, the laser unit 500 includes a laser light source 510 , a reflection mirror 520 , a first focusing lens 530 , and a second focusing lens 540 .

[0048] The laser light source 510 is electrically connected to the control and analysis unit 100 , and the laser light source 510 emits high-energy pulse laser when in operation.

[0049] The reflection mirror 520 can move back and forth between a first position and a second position. The first focusing lens 530 is located on the upper side of the first sample chamber 200 . The second focusing lens 540 is located between the laser light source 510 and the second sample chamber 300 .

[0050] When the reflector 520 is located at the first position, the laser light emitted by the laser light source 510 is reflected by the reflector 520 to the first sample chamber 200. When the reflector 520 is located at the second position, the laser light emitted by the laser light source 510 is irradiated to the second sample chamber 300.

[0051] Optionally, the first focusing lens 530 is disposed on a wall of the first sample chamber 200 .

[0052] Optionally, a lens group 550 is further provided between the laser light source 510 and the reflector 520 to shape and expand the laser light emitted by the laser light source 510 .

[0053] When the above-mentioned laser spectrum online analyzer is working, the reflector 520 is located at the second position, and the laser emitted by the laser light source 510 is focused by the second focusing lens 540 and irradiated onto the sample to be tested in the second sample chamber 300. The excited plasma spectrum is collected by the second light receiving probe 430 and transmitted to the spectrometer 410, and the quality of the sample to be tested is analyzed by the control and analysis unit 100.

[0054] When the spectral intensity changes, the reflector 520 moves to the first position, and the laser emitted by the laser light source 510 is reflected by the reflector 520 and focused by the first focusing lens 530 and then irradiated onto the measured sample 600 in the first sample chamber 200. The excited plasma spectrum is collected by the first light receiving probe 420 and transmitted to the spectrometer 410.

[0055] At this time, the control and analysis unit 100 compares the current spectrum intensity of the measured sample 600 with the spectrum intensity of the measured sample 600 previously measured, and can know the change amplitude of the spectrum intensity, and calibrates the spectrum intensity according to the change amplitude, and then continues to work, and ensures the measurement accuracy during the work process. Therefore, the above laser spectrum analyzer can operate stably on site for a long time.

[0056] In some embodiments, the laser unit 500 further includes a rotation driving member 560. A driving end of the rotation driving member 560 is connected to the reflector 520 to drive the reflector 520 to rotate back and forth between the first position and the second position.

[0057] Optionally, the rotary driving member 560 is a rotary motor.

[0058] In some specific embodiments, the rotation driving member 560 is electrically connected to the control and analysis unit 100 , and drives the reflector 520 to rotate under the control of the control and analysis unit 100 .

[0059] Furthermore, the laser unit 500 further includes a first limit switch 570 and a second limit switch 580 , and both the first limit switch 570 and the second limit switch 580 are electrically connected to the rotation driving member 560 .

[0060] Accordingly, the reflector 520 triggers the first limit switch 570 when located at the first position, and triggers the second limit switch 580 when located at the second position.

[0061] The position of the reflector 520 can be precisely controlled by means of the first limit switch 570 and the second limit switch 580, thereby precisely changing the projection direction of the laser.

[0062] In some specific embodiments, the first limit switch 570 and the second limit switch 580 are both electrically connected to the control and analysis unit 100 , and further electrically connected to the rotation driving member 560 through the control and analysis unit 100 .

[0063] When the rotary drive 560 drives the reflector 520 to rotate to the first position, the reflector 520 triggers the first limit switch 570. The first limit switch 570 transmits a signal to the control and analysis unit 100, and the control and analysis unit 100 controls the rotary drive 560 to stop, so that the reflector 520 remains at the first position.

[0064] When the rotary drive 560 drives the reflector 520 to rotate to the second position, the reflector 520 triggers the second limit switch 580. The second limit switch 580 transmits a signal to the control and analysis unit 100, and the control and analysis unit 100 controls the rotary drive 560 to stop, so that the reflector 520 remains at the second position.

[0065] In some other embodiments, the reflector 520 may also be driven by a linear drive member to translate back and forth between the first position and the second position, which will not be described in detail herein.

[0066] In this embodiment, when the reflector 520 is located at the first position, the first light receiving probe 420 is located on the side of the reflector 520 facing away from the first sample chamber 200 , and the spectrum of the measured sample 600 passes through the reflector 520 and is transmitted to the first light receiving probe 420 .

[0067] Optionally, the reflector 520 is a beam splitter or a dichroic mirror.

[0068] In this embodiment, the laser unit 500 further includes a dichroic mirror 590. The dichroic mirror 590 is located between the laser light source 510 and the second sample chamber 300, specifically, located on the side of the second focusing lens 540 facing away from the second sample chamber 300.

[0069] When in use, the laser light emitted by the laser light source 510 passes through the dichroic mirror 590 and is transmitted to the second sample chamber 300 , and the spectrum of the sample to be tested is reflected by the dichroic mirror 590 to the second light receiving probe 430 .

[0070] Furthermore, a moving platform 210 is disposed in the first sample chamber 200. The moving platform 210 is electrically connected to the control and analysis unit 100, and the moving platform 210 is used to place the tested sample 600.

[0071] During the process of calibrating the spectral intensity, the control and analysis unit 100 may control the moving platform 210 to move the measured sample 600 multiple times to obtain multiple sets of data to improve the calibration accuracy.

[0072] Optionally, the moving platform 210 is an XY axis moving platform 210, which can drive the measured sample 600 to move along the X axis and the Y axis respectively. The X axis and the Y axis are perpendicular to each other and are both in the horizontal direction.

[0073] In addition, an electrical connector 220 is provided on the wall of the first sample chamber 200 , and the moving platform 210 is electrically connected to the control and analysis unit 100 via the electrical connector 220 .

[0074] Exemplarily, a sample box 230 is disposed on the mobile platform 210 , and the tested sample 600 is placed on the sample box 230 .

[0075] Furthermore, considering that the large temperature difference at the industrial site will cause the wavelength of the spectrometer 410 to drift, which will eventually easily affect the accuracy of online analysis and detection, a mercury lamp light source 240 is also provided in the first sample chamber 200, and the mercury lamp light source 240 is located on the mobile platform 210.

[0076] When in use, the reflector 520 moves to the first position, and the control and analysis unit 100 controls the moving platform 210 to move the mercury lamp light source 240 to the position directly below the first focusing lens 530. At this time, the characteristic spectrum emitted by the mercury lamp light source 240 is collected by the first light receiving probe 420 and then transmitted to the spectrometer 410, and then used for calibrating the spectral line drift of the spectrometer 410.

[0077] In some specific embodiments, a mercury lamp power supply 250 is further disposed in the first sample chamber 200. The mercury lamp power supply 250 is also located on the mobile platform 210, and the mercury lamp power supply 250 is electrically connected to the control and analysis unit 100 and the mercury lamp light source 240, respectively, and is turned on and off under the control of the control and analysis unit 100, and supplies power to the mercury lamp light source 240 when turned on.

[0078] Furthermore, a gas connector 260 for injecting protective gas is provided on the wall of the first sample chamber 200 .

[0079] When in use, protective gas is blown into the first sample chamber 200 through the gas connector 260, so as to protect the tested sample 600 in the first sample chamber 200 from being corroded for a certain period of time, and the sample 600 can be used reliably for a long time.

[0080] Optionally, the protective gas may be an inert gas, such as argon, helium, or dry nitrogen.

[0081] When the above-mentioned laser spectrum online analyzer is working, the reflector 520 is located at the second position. At this time, the laser emitted by the laser light source 510 is first shaped and expanded by the lens group 550, then passes through the dichroic mirror 590, and then is focused by the second focusing lens 540 and irradiated on the sample to be tested in the second sample chamber 300, and excites the high-temperature plasma spectrum. The excited plasma spectrum is first focused by the second focusing lens 540, and then reflected by the dichroic mirror 590 to the second light receiving probe 430, and is collected by the second light receiving probe 430, and transmitted to the spectrometer 410 via the Y-type optical fiber 440, and the grade of the sample to be tested is analyzed by the control and analysis unit 100.

[0082] When the spectral intensity changes, the reflector 520 moves to the first position. At this time, the laser emitted by the laser light source 510 is first shaped and expanded by the lens group 550, then reflected by the reflector 520 and focused by the first focusing lens 530, and then irradiated on the measured sample 600 in the first sample chamber 200, and excited the plasma spectrum. The excited plasma spectrum is first focused by the first focusing lens 530, then passes through the reflector 520, and is collected by the first light receiving probe 420, and transmitted to the spectrometer 410 via the Y-type optical fiber 440.

[0083] At this time, the control and analysis unit 100 compares the current spectral intensity of the measured sample 600 with the spectral intensity of the measured sample 600 measured previously to obtain the variation range of the spectral intensity, and calibrates the spectral intensity according to the variation range, and then continues to work and ensures the measurement accuracy during the working process.

[0084] When the spectrometer 410 has a spectral line drift, the reflector 520 moves to the first position, and the control and analysis unit 100 controls the moving platform 210 to move the mercury lamp light source 240 to just below the first focusing lens 530. At this time, the characteristic spectrum emitted by the mercury lamp light source 240 is collected by the first light receiving probe 420 and transmitted to the spectrometer 410, and then used for calibrating the spectral line drift of the spectrometer 410.

[0085] In summary, the above-mentioned laser spectrum analyzer can self-calibrate the spectrum intensity and spectrum line drift, so that it can operate stably in the field for a long time.

[0086] In addition, due to the provision of the first sample chamber 200, the above-mentioned laser spectrometer can not only be used for grade analysis of key elements in liquid samples such as ore pulp, but also can realize rapid analysis of solid samples, thus expanding the scope of application.

[0087] Example 2

[0088] See also Figure 2 , which is different from the first embodiment in that, in the present embodiment, the laser unit 500 is not provided with a dichroic mirror 590. Meanwhile, a third focusing lens 431 is provided on a side of the second light collecting probe 430 facing the second sample chamber 300.

[0089] When in use, the second light collecting probe 430 is tilted toward the second sample chamber 300 , and the plasma spectrum is directly collected from the second sample chamber 300 through the third focusing lens 431 .

[0090] Example 3

[0091] See also Figure 3 The difference from Embodiment 1 is that, in this embodiment, the first light receiving probe 420 is not disposed on the side of the reflector 520 facing away from the first sample chamber 200 , but is located on the side of the first sample chamber 200 .

[0092] In addition, a fourth focusing lens 421 is disposed on a side of the first light-collecting probe 420 facing the first sample chamber 200 .

[0093] When in use, the first light collecting probe 420 directly collects the plasma spectrum from the first sample chamber 200 through the fourth focusing lens 421. At this time, the placement of each instrument component is more flexible.

[0094] In some specific embodiments, the fourth focusing lens 421 is disposed on a wall of the first sample chamber 200 .

[0095] In all examples shown and described herein, any specific values ​​should be interpreted as merely exemplary and not as limiting, and thus other examples of the exemplary embodiments may have different values.

[0096] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0097] The above-mentioned embodiments only express several implementation methods of the present invention, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the scope of the present invention. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention.

Claims

1. A laser spectrum online analyzer, characterized in that: include: Control analysis unit; A first sample chamber, used for containing a measured sample; The second sample chamber is used to contain the sample to be tested; A spectral unit, comprising a spectrometer and a first light receiving probe and a second light receiving probe connected to the spectrometer, wherein the spectrometer is electrically connected to the control and analysis unit, the first light receiving probe is used to collect the spectrum of the measured sample, and the second light receiving probe is used to collect the spectrum of the sample to be measured; as well as A laser unit, comprising a laser light source, a reflector, a first focusing lens and a second focusing lens, wherein the laser light source is electrically connected to the control and analysis unit, the reflector can move back and forth between a first position and a second position, the first focusing lens is located on the upper side of the first sample chamber, and the second focusing lens is located between the laser light source and the second sample chamber; When the reflector is located at the first position, the laser light emitted by the laser light source is reflected by the reflector to the first sample chamber, and when the reflector is located at the second position, the laser light emitted by the laser light source is irradiated to the second sample chamber.

2. The laser spectrum online analyzer according to claim 1, characterized in that: The laser unit further comprises a rotation driving member, a driving end of which is connected to the reflector to drive the reflector to rotate back and forth between the first position and the second position.

3. The laser spectrum online analyzer according to claim 2, characterized in that: The laser unit further comprises a first limit switch and a second limit switch, wherein the first limit switch and the second limit switch are both electrically connected to the rotary drive member; The reflector triggers the first limit switch when located at the first position, and triggers the second limit switch when located at the second position.

4. The laser spectrum online analyzer according to claim 1, 2 or 3, characterized in that: The laser unit also includes a dichroic mirror, which is located between the laser light source and the second sample chamber. The laser light emitted by the laser light source passes through the dichroic mirror and is transmitted to the second sample chamber. The spectrum of the sample to be measured is reflected by the dichroic mirror to the second light receiving probe.

5. The laser spectrum online analyzer according to claim 1, 2 or 3, characterized in that: A third focusing lens is arranged on a side of the second light-collecting probe facing the second sample chamber.

6. The laser spectrum online analyzer according to claim 1, 2 or 3, characterized in that: When the reflector is located at the first position, the first light receiving probe is located at a side of the reflector facing away from the first sample chamber, and the spectrum of the measured sample passes through the reflector and is transmitted to the first light receiving probe.

7. The laser spectrum online analyzer according to claim 1, 2 or 3, characterized in that: A fourth focusing lens is arranged on a side of the first light-collecting probe facing the first sample chamber.

8. The laser spectrum online analyzer according to claim 1, characterized in that: A movable platform for placing the tested sample is arranged in the first sample chamber, and the movable platform is electrically connected to the control and analysis unit.

9. The laser spectrum online analyzer according to claim 8, characterized in that: A mercury lamp light source is also provided in the first sample chamber and is located on the moving platform.

10. The laser spectrum online analyzer according to claim 1, characterized in that: A gas connector for injecting protective gas is arranged on the wall of the first sample chamber.

Images