Large thin plate measuring machine

Abstract

The invention discloses a large-scale thin plate measuring machine, and belongs to the technical field of large-scale thin plate workpiece measurement, the large-scale thin plate measuring machine comprises a basic support, an X-axis assembly, a sine support, a Y-axis assembly and a measuring head system, the X-axis assembly is arranged on the basic support and used for providing movement in the X-axis direction, the Y-axis assembly is arranged on the X-axis assembly and used for providing movement in the Y-axis direction, and the sine support is arranged on the sine support. And the X-axis assembly and the Y-axis assembly are matched to provide in-plane movement for the measuring head system. By means of the design of the inclined workbench, the workpiece can naturally slide to a preset position for self-positioning, additional clamping or fixing measures are not needed, rapid movement of the measuring head system on the surface of the whole workpiece is achieved through cooperative operation of the X-axis assembly and the Y-axis assembly, an optical probe is adopted as a measuring element, and the measuring accuracy is improved. The workpiece can be detected in a non-contact manner, and different parts of the workpiece can be accurately measured, so that the measurement efficiency is greatly improved.

Description

Technical Field

[0001] The invention relates to the technical field of large thin plate workpiece measurement, in particular to a large thin plate measuring machine. Background Art

[0002] There is an increasing demand for precision and large-scale products, and the processing range and accuracy of thin plate workpieces are also constantly improving, especially large thin plate workpieces. Large thin plate workpieces are extremely difficult to measure due to their low rigidity and variability. Traditional measurements can only rely on tools such as tape measures and rulers for simple measurements, and complex contours and element shape and position tolerances cannot be measured. How to quickly and accurately measure thin plate parts has become a difficult topic.

[0003] Therefore, in order to meet the measurement needs of thin plate workpieces, fill the gap in this type of measuring equipment, and improve the measurement accuracy, a large thin plate measuring machine is proposed. Summary of the invention

[0004] The purpose of the present invention is to provide a large thin plate measuring machine to solve the problem raised in the above background technology that due to the special characteristics of large thin plate workpieces such as low rigidity and variability, the traditional measurement method is complicated for large thin plate workpieces, especially the complex contours cannot be measured, which seriously affects the production efficiency of large thin plate workpieces.

[0005] To achieve the above-mentioned object, the present invention provides the following technical solution: a large-scale thin plate measuring machine, comprising a base bracket, an X-axis assembly, a sine bracket, a Y-axis assembly and a probe system, wherein the X-axis assembly is arranged on the base bracket to provide movement in the X-axis direction, the Y-axis assembly is arranged on the X-axis assembly to provide movement in the Y-axis, the X-axis assembly and the Y-axis assembly cooperate to provide in-plane movement for the probe system, the sine bracket is fixed on the base bracket, the top of the sine bracket is arranged as an inclined plane forming an inclination angle with the ground, and a workbench is fixedly installed on the sine bracket;

[0006] As a further preferred embodiment of the present technical solution: the X-axis assembly comprises an X-axis guide rail and an X-axis movable seat, the X-axis guide rail is fixedly connected to the base bracket, a slider 1 is fixedly connected to the bottom of the X-axis movable seat, the slider 1 is slidably connected to the X-axis guide rail, a handle is fixedly connected to the X-axis movable seat, and a positioning shaft is threadedly connected to the X-axis movable seat;

[0007] As a further preferred embodiment of the present technical solution: a workpiece positioning structure is provided on the base bracket, the workpiece positioning structure comprises a positioning frame, a workpiece positioning block is fixedly connected to the positioning frame, and a locking knob is threadedly connected to the workpiece positioning block;

[0008] As a further preferred embodiment of the present technical solution: the Y-axis assembly comprises a Y-axis crossbeam and a Y-axis moving seat, the Y-axis crossbeam is fixedly mounted on the X-axis moving seat, the Y-axis crossbeam is fixedly connected to a Y-axis guide rail, the Y-axis moving seat is fixedly connected to a slider 2, the slider 2 is slidably connected to the Y-axis guide rail, the probe system is fixedly mounted on the Y-axis moving seat, and the probe system comprises an optical probe;

[0009] As a further preferred embodiment of the present technical solution: the Y-axis guide rail is vertically arranged with respect to the X-axis guide rail, the workbench is fixed on the inclined surface of the sinusoidal bracket, and the Y-axis crossbeam is parallelly arranged with respect to the surface of the workbench;

[0010] As a further preferred embodiment of the technical solution: a probe display device is fixedly mounted on the Y-axis movable seat, the probe display device comprises a display, the probe display device is electrically connected to the probe system, and the probe display device is used to display the image detected by the probe system;

[0011] As a further preferred embodiment of the present technical solution: an integrated computer is fixedly mounted on the X-axis moving seat, a measurement program and a data processing program are configured in the integrated computer, an articulated rod is connected to the integrated computer, and the integrated computer is connected to the X-axis moving seat through the articulated rod;

[0012] As a further preferred embodiment of the present technical solution: a bearing seat is fixedly connected to the Y-axis crossbeam, a rotating shaft is rotatably connected to the bearing seat, a rotating handle is provided at one end of the rotating shaft, and a Y-axis weight balancing structure is provided at one end of the Y-axis crossbeam, and the Y-axis weight balancing structure balances the gravity of the probe system, the probe display device and the integrated computer, so that the probe system can move briskly on the Y-axis assembly;

[0013] As a further preferred embodiment of the present technical solution: two pulleys are rotatably connected at both ends of the Y-axis crossbeam, a synchronous belt is installed on the pulleys, one of the pulleys is fixedly connected to the rotating shaft, a locking clamp is fixedly installed on the Y-axis crossbeam, the locking clamp is sleeved on the rotating shaft, and a locking rod is provided on the locking clamp;

[0014] As a further preferred embodiment of the present technical solution: the locking clamp block includes clamp block 1 and clamp block 2, a clearance groove is provided between clamp block 1 and clamp block 2, through holes are provided at the clearance groove of clamp block 1 and clamp block 2, the rotating shaft passes through the through hole, the locking rod includes a rotating rod and a threaded rod, the rotating rod and the threaded rod are fixedly connected, the threaded rod is a threaded rod and passes through clamp block 2 and extends into clamp block 1, the threaded rod is threadedly connected to the locking rod, and a rotating knob is installed at one end of the rotating rod.

[0015] Compared with the prior art, the present invention has the following beneficial effects:

[0016] 1. The measuring machine of the present invention adopts a dual-axis design of X-axis and Y-axis, so that the probe system can move freely in a plane, and through the coordinated operation of the X-axis assembly and the Y-axis assembly, the present invention realizes the rapid movement of the probe system on the entire workpiece surface. Such a design allows the operator to easily adjust the position of the probe so as to accurately measure different parts of the workpiece, thereby greatly improving the measurement efficiency;

[0017] 2. Among them, with the help of the inclined workbench design, the workpiece can naturally slide to the predetermined position for self-positioning without the need for additional clamping or fixing measures. This self-positioning mechanism not only simplifies the preparation work before measurement, but also avoids the problem of workpiece deformation caused by clamping, thereby improving the accuracy and consistency of measurement;

[0018] 3. In addition, the use of optical probes as measuring elements enables the detection of workpieces in a non-contact manner. This method not only avoids the damage to the workpiece that may be caused by traditional contact measurement, but also ensures higher measurement accuracy because no measuring force is applied;

[0019] 4. The optical probe can scan the workpiece surface in detail and transmit the data to the integrated computer for analysis and processing in real time, ensuring the high accuracy of the measurement results. In addition, the probe display device can display the measurement screen in real time, helping the operator to better understand the measurement details and ensure the accuracy of data collection;

[0020] 5. The present invention adopts a modular splicing structure. The main components such as the basic bracket, sine bracket, X-axis system, workbench, etc. can be assembled or disassembled according to actual needs, which greatly increases the versatility and economy of the equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 It is a schematic diagram of the overall three-dimensional structure of the large-scale thin plate measuring machine of the present invention;

[0022] Figure 2 It is a partial structural schematic diagram of the large-scale thin plate measuring machine of the present invention;

[0023] Figure 3 It is a schematic diagram of the local structure of the X-axis component;

[0024] Figure 4 for Figure 2 The enlarged view of point A in the middle;

[0025] Figure 5 It is a structural diagram of the Y-axis assembly of the large-scale thin plate measuring machine of the present invention;

[0026] Figure 6 It is a truncated schematic diagram of the Y-axis component;

[0027] Figure 7 is a schematic diagram of a probe system and a probe display device;

[0028] Figure 8 It is a transmission schematic diagram in the Y-axis assembly;

[0029] Fig. 9 Schematic diagram of the brake of the Y-axis assembly.

[0030] In the figure: 1. basic bracket; 2. X-axis assembly; 3. sinusoidal bracket; 4. workpiece positioning structure; 5. workbench; 6. Y-axis weight balance structure; 7. Y-axis assembly; 8. probe system; 9. probe display device; 10. integrated computer; 11. X-axis guide rail; 12. slider one; 13. X-axis moving seat; 15. handle; 16. positioning shaft; 17. positioning frame; 18. workpiece positioning block; 19. locking knob; 20. Y-axis crossbeam; 21. Y-axis guide rail; 22. Y-axis moving seat; 23. slider two; 24. hinged rod; 25. rotating shaft; 26. pulley; 27. synchronous belt; 28. bearing seat; 29. ​​locking clamp block; 30. locking rod; 31. rotating rod; 32. threaded rod; 33. clamp block one; 34. clamp block two; 35. through hole. DETAILED DESCRIPTION

[0031] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0032] Example

[0033] See also Figure 1-Figure 9 As shown, the present invention provides a technical solution: including a basic bracket 1, an X-axis component 2, a sine bracket 3, a Y-axis component 7 and a probe system 8, the X-axis component 2 is arranged on the basic bracket 1 to provide movement in the X-axis direction, the Y-axis component 7 is arranged on the X-axis component 2 to provide movement in the Y-axis, the X-axis component 2 and the Y-axis component 7 cooperate to provide in-plane movement for the probe system 8, the sine bracket 3 is fixed on the basic bracket 1, the top of the sine bracket 3 is an inclined surface setting with an inclination angle with the ground, a workbench 5 is fixedly installed on the sine bracket 3, the workbench 5 supports thin plate workpieces, and with the help of the inclined workbench 5 design, the workpiece can naturally slide to a predetermined position for self-positioning without additional clamping or fixing measures, this self-positioning mechanism not only simplifies the preparation work before measurement, but also avoids the problem of workpiece deformation caused by clamping, thereby improving the accuracy and consistency of measurement.

[0034] In this embodiment, specifically: the X-axis assembly 2 includes an X-axis guide rail 11 and an X-axis moving seat 13, the X-axis guide rail 11 is fixedly connected to the base bracket 1, the bottom of the X-axis moving seat 13 is fixedly connected with a slider 12, the slider 12 is slidably connected to the X-axis guide rail 11, the X-axis moving seat 13 is fixedly connected with a handle 15, and the X-axis moving seat 13 is threadedly connected with a positioning shaft 16.

[0035] In this embodiment, specifically: a workpiece positioning structure 4 is provided on the base support 1 , and the workpiece positioning structure 4 includes a positioning frame 17 , a workpiece positioning block 18 is fixedly connected to the positioning frame 17 , and a locking knob 19 is threadedly connected to the workpiece positioning block 18 .

[0036] In this embodiment, specifically: the Y-axis assembly 7 includes a Y-axis crossbeam 20 and a Y-axis moving seat 22, the Y-axis crossbeam 20 is fixedly installed on the X-axis moving seat 13, the Y-axis crossbeam 20 is fixedly connected to a Y-axis guide rail 21, the Y-axis moving seat 22 is fixedly connected to a slider 23, the slider 23 is slidably connected to the Y-axis guide rail 21, the probe system 8 is fixedly installed on the Y-axis moving seat 22, and the probe system 8 includes an optical probe.

[0037] In this embodiment, specifically: the Y-axis guide rail 21 is vertically arranged with respect to the X-axis guide rail 11, the workbench 5 is fixed on the inclined plane of the sinusoidal bracket 3, the Y-axis crossbeam 20 is parallelly arranged with respect to the surface of the workbench 5, and the dual-axis design of the X-axis and the Y-axis allows the probe system 8 to move freely in the plane, and through the coordinated operation of the X-axis assembly 2 and the Y-axis assembly 7, the present invention realizes the rapid movement of the probe system 8 on the entire workpiece surface. Such a design allows the operator to easily adjust the position of the probe so as to accurately measure different parts of the workpiece, thereby greatly improving the measurement efficiency.

[0038] In this embodiment, specifically: a probe display device 9 is fixedly installed on the Y-axis moving seat 22, the probe display device 9 includes a display, the probe display device 9 is electrically connected to the probe system 8, the probe display device 9 is used to display the image detected by the probe system 8, the optical probe can perform a fine scan of the workpiece surface, and transmit the data in real time to the integrated computer 10 for analysis and processing, ensuring the high precision of the measurement results, in addition, the probe display device 9 can display the measurement image in real time, helping the operator to better understand the measurement details and ensuring the accuracy of data collection.

[0039] In this embodiment, specifically: an all-in-one computer 10 is fixedly mounted on the X-axis moving seat 13, a measurement program and a data processing program are configured in the all-in-one computer 10, an articulated rod 24 is connected to the all-in-one computer 10, and the all-in-one computer 10 is connected to the X-axis moving seat 13 through the articulated rod 24. Two articulated rods 24 hinged to each other connect the all-in-one computer 10 to the X-axis moving seat 13, so that the direction of the computer can be adjusted.

[0040] In this embodiment, specifically: a bearing seat 28 is fixedly connected to the Y-axis crossbeam 20, a rotating shaft 25 is rotatably connected to the bearing seat 28, a rotating handle is provided at one end of the rotating shaft 25, and a Y-axis weight balancing structure 6 is provided at one end of the Y-axis crossbeam 20. The Y-axis weight balancing structure 6 balances the gravity of the probe system 8, the probe display device 9 and the integrated computer 10, so that the probe system 8 can move lightly on the Y-axis assembly 7. A modular splicing structure is adopted, and major components such as the basic bracket 1, the sinusoidal bracket 3, the X-axis system, and the workbench 5 can be assembled or disassembled according to actual needs, which greatly increases the versatility and economy of the equipment.

[0041] In this embodiment, specifically: two pulleys 26 are rotatably connected at both ends of the Y-axis beam 20, and a synchronous belt 27 is installed on the pulleys 26. One of the pulleys 26 is fixedly connected to the rotating shaft 25. A locking clamp 29 is fixedly installed on the Y-axis beam 20, and the locking clamp 29 is sleeved on the rotating shaft 25. A locking rod 30 is provided on the locking clamp 29.

[0042] In this embodiment, specifically: the locking clamp 29 includes a clamp 1 33 and a clamp 2 34, a clearance groove is opened between the clamp 1 33 and the clamp 2 34, and a through hole 35 is opened at the clearance groove of the clamp 1 33 and the clamp 2 34, and the rotating shaft 25 passes through the through hole 35. The locking rod 30 includes a rotating rod 31 and a threaded rod 32, and the rotating rod 31 and the threaded rod 32 are fixedly connected. The threaded rod 32 is a threaded rod 32 and passes through the clamp 2 34 and extends into the clamp 1 33. The threaded rod 32 is threadedly connected to the locking rod 30, and a rotating knob is installed at one end of the rotating rod 31.

[0043] Working principle or structural principle: When measuring a large thin plate workpiece, first place the workpiece on the workbench 5. Since the workbench 5 is inclined with the ground, the workpiece slides downward along the surface of the workbench 5 under the action of gravity, so that the bottom edge of the workpiece slides onto the workpiece positioning block 18, and then the bottom edge of the workpiece is positioned. At this time, the workpiece can be laid flat on the workbench 5, and there is no need to use a clamping fixture to clamp the thin plate workpiece, thereby avoiding deformation of parts caused by clamping, and also eliminating the clamping process;

[0044] The probe system 8 is driven to move on the workpiece surface by the X-axis assembly 2 and the Y-axis assembly 7, and the optical probe on the probe system 8 measures the measuring elements on the workpiece surface, wherein the camera on the probe system 8 displays the captured image on the probe display device 9, and then the measurement details are observed in real time through the probe display device 9, and at the same time, the optical probe and camera on the probe system 8 transmit the captured data to the integrated computer 10 in real time, and the measurement program and data processing program in the integrated computer 10 calculate and process the detected data to obtain specific data of the thin plate workpiece;

[0045] When moving in the X-axis direction, the measurement personnel pulls the X-axis moving seat 13 by the handle 15 to move, so that the X-axis moving seat 13 can slide along the direction of the X-axis guide rail 11, and then the device can move along the X-axis direction of the workpiece. When the X-axis needs to stop moving, the measurement personnel manually rotates the handle on the positioning shaft 16 to rotate the positioning shaft 16, and then one end of the positioning shaft 16 can be against the X-axis guide rail 11 to lock the movement in the X-axis direction, thereby realizing the movement and locking in the X-axis direction;

[0046] When moving in the Y-axis direction, the measurement personnel manually rotate the handle on the rotating shaft 25, and the rotating shaft 25 drives the pulley 26 to rotate, and the pulley 26 drives the movement of the synchronous belt 27, and the synchronous belt 27 drives the Y-axis moving seat 22 to slide along the direction of the Y-axis guide rail 21, so that the probe system 8 can move in the Y-axis direction of the workpiece, and then the combination of the X-axis and the Y-axis enables the probe system 8 to move to any position along the entire surface of the workpiece. When it is necessary to stop moving in the Y-axis direction, the staff turns the knob on the rotating rod 31 to make the threaded rod 32 rotate on the locking clamp 29, thereby driving the clamp block 2 34 and the clamp block 1 33 to approach each other, so that the through hole 35 is tightly locked, and then the locking in the Y-axis direction is realized, so that the device can move and lock on the Y-axis.

[0047] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. Large thin plate measuring machine, characterized by: The invention comprises a base support (1), an X-axis assembly (2), a sinusoidal support (3), a Y-axis assembly (7) and a probe system (8); the X-axis assembly (2) is arranged on the base support (1) to provide movement in the X-axis direction; the Y-axis assembly (7) is arranged on the X-axis assembly (2) to provide movement in the Y-axis direction; the X-axis assembly (2) and the Y-axis assembly (7) cooperate to provide the probe system (8) with movement in a plane; the sinusoidal support (3) is fixed on the base support (1); the top of the sinusoidal support (3) is arranged as an inclined plane forming an inclination angle with the ground; and a workbench (5) is fixedly mounted on the sinusoidal support (3).

2. The large-scale thin plate measuring machine according to claim 1, characterized in that: The X-axis assembly (2) comprises an X-axis guide rail (11) and an X-axis movable seat (13); the X-axis guide rail (11) is fixedly connected to the base bracket (1); a slider 1 (12) is fixedly connected to the bottom of the X-axis movable seat (13); the slider 1 (12) is slidably connected to the X-axis guide rail (11); a handle (15) is fixedly connected to the X-axis movable seat (13); and a positioning shaft (16) is threadedly connected to the X-axis movable seat (13).

3. The large-scale thin plate measuring machine according to claim 2, characterized in that: The base support (1) is provided with a workpiece positioning structure (4), the workpiece positioning structure (4) comprises a positioning frame (17), a workpiece positioning block (18) is fixedly connected to the positioning frame (17), and a locking knob (19) is threadedly connected to the workpiece positioning block (18).

4. The large-scale thin plate measuring machine according to claim 3, characterized in that: The Y-axis assembly (7) comprises a Y-axis crossbeam (20) and a Y-axis moving seat (22); the Y-axis crossbeam (20) is fixedly mounted on the X-axis moving seat (13); a Y-axis guide rail (21) is fixedly connected to the Y-axis crossbeam (20); a slider 2 (23) is fixedly connected to the Y-axis moving seat (22); the slider 2 (23) is slidably connected to the Y-axis guide rail (21); the probe system (8) is fixedly mounted on the Y-axis moving seat (22); and the probe system (8) comprises an optical probe.

5. The large-scale thin plate measuring machine according to claim 4, characterized in that: The Y-axis guide rail (21) and the X-axis guide rail (11) are arranged vertically, the workbench (5) is fixed on the inclined surface of the sine bracket (3), and the Y-axis crossbeam (20) and the surface of the workbench (5) are arranged parallel.

6. The large-scale thin plate measuring machine according to claim 5, characterized in that: A probe display device (9) is fixedly mounted on the Y-axis movable seat (22), the probe display device (9) comprising a display, the probe display device (9) being electrically connected to the probe system (8), and the probe display device (9) being used to display the image detected by the probe system (8).

7. The large-scale thin plate measuring machine according to claim 6, characterized in that: An integrated computer (10) is fixedly mounted on the X-axis moving seat (13), wherein a measurement program and a data processing program are configured in the integrated computer (10), and an articulated rod (24) is connected to the integrated computer (10), and the integrated computer (10) is connected to the X-axis moving seat (13) via the articulated rod (24).

8. The large-scale thin plate measuring machine according to claim 7, characterized in that: A bearing seat (28) is fixedly connected to the Y-axis crossbeam (20), a rotating shaft (25) is rotatably connected to the bearing seat (28), one end of the rotating shaft (25) is provided with a rotating handle, and one end of the Y-axis crossbeam (20) is provided with a Y-axis weight balancing structure (6), the Y-axis weight balancing structure (6) balances the gravity of the probe system (8), the probe display device (9) and the integrated computer (10), so that the probe system (8) can move lightly on the Y-axis assembly (7).

9. The large-scale thin plate measuring machine according to claim 8, characterized in that: Two pulleys (26) are rotatably connected at both ends of the Y-axis crossbeam (20), and a synchronous belt (27) is installed on the pulleys (26). One of the pulleys (26) is fixedly connected to the rotating shaft (25). A locking clamp (29) is fixedly installed on the Y-axis crossbeam (20), and the locking clamp (29) is sleeved on the rotating shaft (25). A locking rod (30) is provided on the locking clamp (29).

10. The large-scale thin plate measuring machine according to claim 9, characterized in that: The locking clamp (29) comprises a clamping block 1 (33) and a clamping block 2 (34), a clearance groove is formed between the clamping block 1 (33) and the clamping block 2 (34), a through hole (35) is formed at the clearance groove of the clamping block 1 (33) and the clamping block 2 (34), the rotating shaft (25) passes through the through hole (35), the locking rod (30) comprises a rotating rod (31) and a threaded rod (32), the rotating rod (31) and the threaded rod (32) are fixedly connected, the threaded rod (32) is a threaded rod (32) and passes through the clamping block 2 (34) and extends into the clamping block 1 (33), the threaded rod (32) is threadedly connected to the locking rod (30), and a rotating knob is installed at one end of the rotating rod (31).

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