Non-contact emissivity measuring platform

Abstract

The invention discloses a non-contact emissivity measuring platform, and relates to the technical field of measurement, in particular to a non-contact measuring device for the surface emissivity of a target material. The device comprises a transmitting module, a receiving module, a to-be-tested sample, an electric control turntable and a PC (Personal Computer) end, the transmitting module and the receiving module are arranged on the electric control rotary table; a to-be-tested sample is arranged in the middle of the front parts of the transmitting module and the receiving module, and the infrared laser transmitted by the transmitting module is reflected to the receiving module and is used for cooperating with an experiment and obtaining the emissivity; the PC end is connected with the transmitting module and the receiving module, controls the transmitting module to transmit infrared laser by adjusting current and voltage, receives an electric signal amplified by the receiving module, and presents and records the electric signal at high and low levels; the transmitting module, the receiving module, the electric control rotary table and the PC terminal are all connected with the power supply system. According to the technical scheme, the problems that in the prior art, existing emissivity is measured in a contact mode, and measuring equipment is complex are solved.

Description

Technical Field

[0001] The invention discloses a non-contact emissivity measurement platform, relates to the field of measurement technology, and in particular to a non-contact measurement device for the surface emissivity of a target material. Background Art

[0002] Emissivity is an important physical quantity that characterizes the radiation capacity of a material surface. It is an important thermophysical parameter and has extremely important applications in many fields.

[0003] Emissivity is not an intrinsic property of an object, but a physical quantity that is difficult to measure accurately. It is related to temperature, wavelength, angle, etc., and its measurement is relatively complicated.

[0004] At present, there are few studies on emissivity measurement in China. Most emissivity measurement methods only involve contact measurement of a single substance, and the measurement equipment is relatively complex.

[0005] In view of the problems existing in the above-mentioned prior art, it is very necessary to study and design a new type of non-contact emissivity measurement platform to overcome the problems existing in the prior art. Summary of the invention

[0006] According to the technical problems of the existing emissivity measurement using contact method and complicated measuring equipment proposed in the above prior art, a non-contact emissivity measurement platform is provided. The present invention mainly measures the intensity of infrared echo reflected by the target to be measured, and then derives the target surface emissivity according to Kirchhoff's law.

[0007] The experimental platform designed by the present invention indirectly measures the emissivity of the target surface by non-contactly measuring the echo intensity of the target material; the light source of the experimental platform is an infrared laser transmitter, and the receiving part is an infrared echo receiver, which can convert the optical signal into an electrical signal; it is connected with an oscilloscope, and the echo intensity can be presented in the form of high and low levels, so as to obtain the echo intensity of the target material; the relative position and angle between the laser, the receiver and the target to be measured can be controlled through the three-axis linkage turntable; the turntable is designed with a universal interface and protocol, and is connected to a computer through a USB interface, so as to control the precise rotation of the turntable.

[0008] The technical means adopted by the present invention are as follows:

[0009] A non-contact emissivity measurement platform comprises: a transmitting module, a receiving module, a sample to be measured (6), an electric control turntable and a PC terminal;

[0010] Furthermore, the transmitting module and the receiving module are arranged on an electrically controlled turntable;

[0011] Furthermore, the sample to be tested is arranged in the middle position in front of the transmitting module and the receiving module, and the infrared laser emitted by the transmitting module is reflected to the receiving module for cooperating with the experiment and obtaining its emissivity;

[0012] Furthermore, the PC end is connected to the transmitting module and the receiving module, and controls the transmitting module to emit infrared laser by adjusting the current and voltage, and receives the electrical signal amplified by the receiving module, presenting and recording it in high and low levels;

[0013] Furthermore, the transmitting module, the receiving module, the electric control turntable and the PC terminal are all connected to the power supply system.

[0014] Further, the electrically controlled turntable comprises: a radiator and a turntable;

[0015] Furthermore, the turntable is a three-axis linkage turntable, on which two workbenches for carrying the transmitting module and the receiving module respectively are arranged;

[0016] Furthermore, the turntable is connected to the power supply system and the PC, and the PC controls the precise rotation around three axes to adjust the relative angle between the transmitting module and the receiving module so as to fully capture the echo;

[0017] Furthermore, a heat sink is provided on the upper part of the workbench carrying the transmitting module to control the working temperature of the laser transmitter. The optimal working temperature of the laser transmitter is 25 degrees Celsius. Too high a temperature will lead to a decrease in the transmitting power.

[0018] Further, the transmitting module includes: a laser driver, a function generator, an infrared laser transmitter and a collimator;

[0019] Furthermore, the output end of the laser driver is connected to an infrared laser emitter disposed on the workbench, and the infrared laser generator is controlled to emit infrared laser by adjusting the current and voltage;

[0020] Furthermore, the infrared laser transmitter can emit infrared lasers of different wavelengths. The central wavelength of the medium-wave band is 4.6 microns, and the central wavelength of the long-wave band is 9.13 microns. The optimal operating temperature is 25°C. Too high a temperature will cause the output power to decrease and affect the echo intensity.

[0021] Further, the input end of the laser driver is connected to the output end of the function generator, receiving the high and low levels generated by the function generator so that the emitted laser has a specific modulation frequency;

[0022] Furthermore, the laser driver can drive the laser transmitter to emit infrared laser. The wavelength band of the emitted laser is different, and the driver can select different voltage thresholds and current thresholds to ensure that the laser emits laser at the optimal output power within the rated maximum voltage and current.

[0023] Furthermore, the function generator can generate high and low level signals and input the signals into the laser driver so that the laser generated by the laser driver has a specific modulation frequency, and the modulation frequency of the function generator is adjustable within the range of 1-1010 Hz;

[0024] Furthermore, a collimator is arranged in front of the infrared laser transmitter to control the divergence angle of the infrared laser.

[0025] Further, the receiving module includes: a zinc selenide convex lens, a receiver and an oscilloscope;

[0026] Furthermore, a receiver is arranged on the upper part of the workbench for receiving infrared laser echoes;

[0027] Further, a zinc selenide convex lens is arranged on the workbench, in front of the receiver, for focusing the echo;

[0028] Furthermore, an oscilloscope is connected to the receiver, and the received echo is amplified by a digital amplifier and a function generator in the oscilloscope to present the point signal in the form of high and low levels and record the data through a PC.

[0029] Furthermore, the receiver can receive the echo. After the infrared laser emitted by the laser transmitter propagates twice in the atmosphere and is diffusely reflected by the target to be measured, the echo is received by the receiver. There is a photosensitive screen inside the receiver. The photons in the echo hit the photosensitive screen to generate an electrical signal. The electrical signal is proportional to the echo power. By detecting the magnitude of this electrical signal, the echo power can be obtained. This electrical signal is amplified by the subsequent oscilloscope and then recorded.

[0030] Furthermore, the PC is used to record and save data. The level signal displayed by the oscilloscope is recorded and saved by the computer. The laser echo intensity can be obtained through this electrical signal. According to Kirchhoff's law, considering the two atmospheric propagations and the diffuse reflection of the target surface, the surface emissivity of the target to be measured can be derived from the obtained echo intensity.

[0031] Furthermore, the target to be measured is fixed on a bracket, and the bracket can be rotated and adjusted in height;

[0032] Furthermore, the target to be measured is set in the middle position in front of the infrared laser transmitter and the receiver; the infrared laser emitted by the infrared laser transmitter is reflected to the receiver to cooperate with the experiment and obtain its emissivity.

[0033] Furthermore, the driver can set the rated voltage, current and power, which can not only output laser of specific power, but also provide over-current and voltage protection for the infrared laser transmitter.

[0034] Furthermore, the infrared laser transmitter emits infrared lasers of different bands, with reference to an optimal operating temperature of 25 degrees. The rated voltage and rated current of the infrared laser transmitter in different laser bands are different and are controlled by a driver.

[0035] Furthermore, the collimator is used to control the divergence angle of the laser beam, thereby adjusting the resolution of the distribution characteristic measurement, and the divergence angle is better than 4 mrad.

[0036] Furthermore, the zinc selenide convex lens can transmit infrared laser with a wavelength of 8 to 12 μm. The convex lens plays a focusing role and can reduce the divergence angle of the echo to achieve the purpose of enhancing the echo intensity.

[0037] Further, the receiver receives the echo reflected by the target to be measured;

[0038] Furthermore, there is a photosensitive screen inside the receiver. When the laser shines on the surface, an electric current is generated, and the magnitude of the current is proportional to the laser power.

[0039] The working process of the present invention is:

[0040] First, fix the sample to be tested on the bracket and place it at a certain distance from the laser and detector;

[0041] Adjust the driver and select appropriate circuit parameters according to the different bands of the experiment;

[0042] The function generator inputs high and low level signals into the laser driver, so that the laser it generates has a specific modulation frequency;

[0043] Start the laser to emit infrared laser. Under the action of the function generator, the emitted laser has a specific modulation frequency.

[0044] After propagating through the atmosphere, the infrared laser is incident on the target 6 to be measured and diffusely reflected on its surface;

[0045] Control the turntable to rotate the laser and receiver around the Y axis. By adjusting the relative angle between the laser, receiver and the target to be measured, the receiver can receive the echo, which is shown as a reading on the oscilloscope.

[0046] Control the turntable to rotate the laser and receiver repeatedly around the X, Y, and Z axes to find the best position of the echo spot, which is indicated by the maximum reading on the oscilloscope.

[0047] The laser reflected on the surface of the target to be measured propagates through the atmosphere, and the echo is focused by the zinc selenide convex lens before being received by the receiver, generating an electrical signal on the photosensitive screen.

[0048] The light spot of the echo is roughly circular. Keep the position and angle of the target to be measured unchanged, and control the turntable to rotate around the Z axis until the light spot is no longer received. This is the critical edge position of the light spot. The laser incident angle at this time is calibrated as 0°. Rotate in the opposite direction, the reading will gradually increase to the maximum value. Continue to rotate, and the reading will decrease until it disappears completely. Record the value every 0.01 scale in the light spot area. The light spot position collected by the receiver is edge-center-edge, and the corresponding echo intensity is low-high-low.

[0049] The electrical signal generated by the receiver is amplified by the oscilloscope and displayed in the form of high and low levels;

[0050] The PC end records the high and low levels. Since the electrical signal generated by the receiver is proportional to the echo strength, the echo strength can be obtained by recording the electrical signal on the PC end.

[0051] Based on the obtained infrared laser echo intensity and Kirchhoff's reflection law, the surface emissivity of the target to be measured can be derived.

[0052] Compared with the prior art, the present invention has the following advantages:

[0053] 1. The non-contact emissivity measurement platform provided by the present invention uses a three-axis linkage turntable, which can adjust the relative angle between the transmitter and the receiver to ensure that the laser echo reflected by the sample to be measured can be received by the receiver, thereby realizing non-contact long-distance measurement of the emissivity;

[0054] 2. The non-contact emissivity measurement platform provided by the present invention indirectly calculates the emissivity of the target to be measured by receiving the echo intensity of the infrared laser. Compared with the traditional emissivity measurement method, the target to be measured of the present invention does not require a complex integrating sphere model, and also eliminates the spectral analysis of the reflected light, and the experimental method is relatively simple.

[0055] In summary, the technical solution of the present invention solves the problem in the prior art that the existing emissivity is measured by contact and the measuring equipment is complicated. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0057] Figure 1 It is a functional module diagram of the present invention;

[0058] Figure 2 It is a schematic diagram of the testing device of the present invention;

[0059] Figure 3 This is a three-dimensional model diagram of the present invention.

[0060] In the figure: 1, driver 2, function generator 3, infrared laser transmitter 4, heat sink 5, collimator 6, target to be measured 7, zinc selenide convex lens 8, receiver 9, oscilloscope 10, PC terminal 11, turntable. DETAILED DESCRIPTION

[0061] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0062] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means intended to limit the present invention and its application or use. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0063] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit exemplary embodiments according to the present invention. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprising" and / or "including" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0064] Unless otherwise specifically stated, the relative arrangement, numerical expressions and numerical values ​​of the parts and steps described in these embodiments do not limit the scope of the present invention. At the same time, it should be clear that, for ease of description, the sizes of the various parts shown in the drawings are not drawn according to the actual proportional relationship. The technology, methods and equipment known to ordinary technicians in the relevant field may not be discussed in detail, but in appropriate cases, the technology, methods and equipment should be regarded as a part of the authorization specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once a certain item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0065] In the description of the present invention, it is necessary to understand that the directions or positional relationships indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom" are usually based on the directions or positional relationships shown in the drawings. They are only for the convenience of describing the present invention and simplifying the description. Unless otherwise specified, these directional words do not indicate or imply that the device or element referred to must have a specific direction or be constructed and operated in a specific direction. Therefore, they cannot be understood as limiting the scope of protection of the present invention: the directional words "inside and outside" refer to the inside and outside relative to the contours of each component itself.

[0066] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below their position devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.

[0067] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. If not otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of the present invention.

[0068] As shown in the figure, the present invention provides a non-contact emissivity measurement platform including: a transmitting module, a receiving module, a sample to be tested 6, an electrically controlled turntable and a PC terminal 10; the transmitting module and the receiving module are arranged on the electrically controlled turntable; the sample to be tested 6 is arranged in the middle position in front of the transmitting module and the receiving module, and the infrared laser emitted by the transmitting module is reflected to the receiving module for cooperating with the experiment and obtaining its emissivity; the PC terminal 10 is connected to the transmitting module and the receiving module, and controls the transmitting module to emit infrared laser by adjusting the current and voltage, and receives the electrical signal amplified by the receiving module, and presents and records it in high and low levels; the transmitting module, the receiving module, the electrically controlled turntable and the PC terminal 10 are all connected to the power supply system.

[0069] The electric-controlled turntable includes: a heat sink 4 and a turntable 11; the turntable 11 is a three-axis linkage turntable, on which two workbenches for carrying a transmitting module and a receiving module are arranged respectively; the turntable 11 is connected to the power supply system and the PC terminal 10, and the precise rotation around three axes is controlled by the PC terminal 10 to adjust the relative angle between the transmitting module and the receiving module so as to completely capture the echo; the upper part of the workbench carrying the transmitting module is provided with a heat sink 4 to control the working temperature of the laser transmitter. The optimal working temperature of the laser transmitter is 25 degrees Celsius. Too high a temperature will lead to a decrease in the transmitting power.

[0070] The transmitting module includes: a laser driver 1, a function generator 2, an infrared laser transmitter 3 and a collimator 5; the output end of the laser driver 1 is connected to the infrared laser transmitter 3 arranged on the workbench, and the infrared laser generator 3 is controlled to emit infrared laser by adjusting the current and voltage; the input end of the laser driver 1 is connected to the output end of the function generator 2, and the high and low levels generated by the function generator 2 are received, so that the emitted laser has a specific modulation frequency; the collimator 5 is arranged in front of the infrared laser transmitter 2 to control the divergence angle of the infrared laser.

[0071] Adjust the driver 1, and select the appropriate threshold voltage and current according to the different laser bands of the experiment, so as to ensure that the laser always emits infrared laser of a specific band at the optimal power, and on the other hand, ensure that the circuit voltage and current are within the threshold range and do not burn the laser; the function generator 2 generates high and low level signals and inputs them into the laser driver, so that the laser generated by it has a specific modulation frequency, and the modulation frequency of the function generator is adjustable within the range of 1-1010Hz; the infrared laser transmitter 3, through the circuit parameter selection of the driver, the transmitter can emit infrared laser of a specific wavelength at a specific power; the laser transmitter is installed on the heat dissipation workbench, and the maximum operating temperature of the laser transmitter is 25 degrees Celsius. Too high temperature will cause the emission power to decrease. The heat dissipation workbench detects the laser temperature in real time to keep the output power constant; the infrared laser emitted by the transmitter has a large divergence angle, resulting in low echo intensity or even difficulty in capturing; the emitted infrared laser passes through the collimator 5, which can effectively reduce the divergence angle, and the divergence angle of the laser after collimation is better than 4mrad;

[0072] The receiving module includes: a zinc selenide convex lens 7, a receiver 8 and an oscilloscope 9; the receiver 8 is arranged on the upper part of the workbench, and is used to receive the infrared laser echo; the zinc selenide convex lens 7 is arranged on the workbench, and is located in front of the receiver 8, and is used to focus the echo; the oscilloscope 9 is connected to the receiver 8, and the received echo is amplified by the digital amplifier and the function generator 2 in the oscilloscope 9, and is received by the PC terminal 10, and the laser echo intensity can be obtained through this electrical signal, and according to Kirchhoff's law, considering the two atmospheric propagations and the diffuse reflection of the target surface, the surface emissivity of the target to be measured can be derived from the obtained echo intensity;

[0073] The target to be measured 6 is approximately a Lambertian body. The infrared laser propagates through the atmosphere and diffusely reflects when it reaches the surface of the target to be measured. The reflected echo is then propagated by the atmosphere to the receiver. The target to be measured 6 is fixed on a bracket, and the bracket can be rotated and adjusted in height. The target to be measured 6 is set in the middle position in front of the infrared laser transmitter 3 and the receiver 8. The infrared laser emitted by the infrared laser transmitter 3 is reflected to the receiver 8 to cooperate with the experiment and obtain its emissivity.

[0074] The driver 1 can set the rated voltage, current and power, which can not only output laser of specific power, but also provide over-current and voltage protection for the infrared laser transmitter.

[0075] The infrared laser transmitter 3 transmits infrared lasers of different wavelength bands, with reference to the optimal operating temperature of 25 degrees. The rated voltage and rated current of the infrared laser transmitter 3 in different laser wavelength bands are different and are controlled by the driver 1.

[0076] The collimator 5 is used to control the divergence angle of the laser beam, thereby adjusting the resolution of the distribution characteristic measurement. The divergence angle is better than 4 mrad.

[0077] The zinc selenide convex lens 7 can transmit infrared laser with a wavelength of 8 to 12 μm. The convex lens plays a focusing role and can reduce the divergence angle of the echo to achieve the purpose of enhancing the echo intensity.

[0078] The receiver 8 receives the echo reflected by the target 6 to be measured; there is a photosensitive screen inside the receiver 8. When the laser irradiates the surface, an electric current is generated, and the magnitude of the electric current is proportional to the laser power.

[0079] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A non-contact emissivity measurement platform, characterized in that: The non-contact emissivity measurement platform comprises: a transmitting module, a receiving module, a sample to be tested (6), an electric control turntable and a PC terminal (10); The transmitting module and the receiving module are arranged on an electrically controlled turntable; The sample to be tested (6) is arranged in the middle position of the front part of the transmitting module and the receiving module, and reflects the infrared laser emitted by the transmitting module to the receiving module, so as to cooperate with the experiment and obtain its emissivity; The PC terminal (10) is connected to the transmitting module and the receiving module, and controls the transmitting module to emit infrared laser by adjusting the current and voltage, and receives the electrical signal amplified by the receiving module, and presents and records it in high and low levels; The transmitting module, receiving module, electric control turntable and PC terminal (10) are all connected to the power supply system.

2. The non-contact emissivity measurement platform according to claim 1, characterized in that: The electric-controlled turntable comprises: a radiator (4) and a turntable (11); The turntable (11) is a three-axis linkage turntable, on which two workbenches are arranged for carrying a transmitting module and a receiving module respectively; The turntable (11) is connected to the power supply system and the PC end (10), and is controlled by the PC end (10) to precisely rotate around three axes, so as to adjust the relative angle between the transmitting module and the receiving module, so as to completely capture the echo; A heat sink (4) is arranged on the upper part of the workbench carrying the transmitting module to control the working temperature of the laser transmitter. The optimal working temperature of the laser transmitter is 25 degrees Celsius. Too high a temperature will lead to a reduction in the transmitting power.

3. The non-contact emissivity measurement platform according to claim 1, characterized in that: The transmitting module comprises: a laser driver (1), a function generator (2), an infrared laser transmitter (3) and a collimator (5); The output end of the laser driver (1) is connected to an infrared laser emitter (3) arranged on a workbench, and the infrared laser generator (3) is controlled to emit infrared laser by adjusting the current and voltage; The input end of the laser driver (1) is connected to the output end of the function generator (2), and receives the high and low levels generated by the function generator (2), so that the emitted laser has a specific modulation frequency; The collimator (5) is arranged in front of the infrared laser emitter (2) to control the divergence angle of the infrared laser.

4. The non-contact emissivity measurement platform according to claim 1, characterized in that: The receiving module comprises: a zinc selenide convex lens (7), a receiver (8) and an oscilloscope (9); The receiver (8) is arranged on the upper part of the workbench and is used to receive the infrared laser echo; The zinc selenide convex lens (7) is arranged on a workbench, located in front of the receiver (8), and is used to focus the echo; The oscilloscope (9) is connected to the receiver (8), and the received echo is amplified by the digital amplifier and function generator (2) in the oscilloscope (9), and the point signal is presented in high and low levels and the data is recorded through the PC terminal (10).

5. The non-contact emissivity measurement platform according to claim 1, characterized in that: The target to be measured (6) is fixed on a bracket, and the bracket can be rotated and adjusted in height; The target to be measured (6) is arranged in the middle position in front of the infrared laser transmitter (3) and the receiver (8); the infrared laser emitted by the infrared laser transmitter (3) is reflected to the receiver (8) to cooperate with the experiment and obtain its emission rate.

6. The non-contact emissivity measurement platform according to claim 1, characterized in that: The driver (1) can set rated voltage, current and power, and can not only output laser light of a specific power, but also provide over-current and voltage protection for the infrared laser transmitter.

7. The non-contact emissivity measurement platform according to claim 1, characterized in that: The infrared laser emitter (3) emits infrared lasers of different wavelength bands, with reference to an optimal operating temperature of 25 degrees. The rated voltage and rated current of the infrared laser emitter (3) are different in different laser wavelength bands and are controlled by a driver (1).

8. The non-contact emissivity measurement platform according to claim 1, characterized in that: The collimator (5) is used to control the divergence angle of the laser beam, thereby adjusting the resolution of the distribution characteristic measurement, and the divergence angle is better than 4 mrad.

9. The non-contact emissivity measurement platform according to claim 1 or 2, characterized in that: The zinc selenide convex lens (7) can transmit infrared laser with a wavelength of 8 to 12 μm. The convex lens plays a focusing role and can reduce the divergence angle of the echo, so as to achieve the purpose of enhancing the echo intensity.

10. The non-contact emissivity measurement platform according to claim 1, characterized in that: The receiver (8) receives the echo reflected by the target to be measured (6); The receiver (8) has a photosensitive screen inside. When the laser irradiates the surface, an electric current is generated, and the magnitude of the current is proportional to the laser power.

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