Semiconductor test method and system, terminal and medium

Abstract

The invention relates to the technical field of semiconductor testing, in particular to a semiconductor testing method and system, a terminal and a medium, and the method comprises the steps: obtaining a start instruction; acquiring basic parameters of the target device based on the start instruction; acquiring a test environment and a test signal based on the basic parameters; acquiring a test result based on the test environment and the test signal; acquiring a test score based on the test result; judging whether the test score meets a preset standard or not; and if not, outputting a warning signal. According to the invention, the efficiency, accuracy and reliability of semiconductor device testing are improved.

Description

Technical Field

[0001] The present application relates to the field of semiconductor testing technology, and in particular to semiconductor testing methods, systems, terminals and media. Background Art

[0002] Semiconductors, as a material between insulators and conductors, have become an important part of modern electronic technology. They have the characteristics of small size, low power consumption, high stability and good reliability, and have been widely used in many fields such as information communication, computer, and automobile industry. In order to ensure that the quality of semiconductor components meets the design requirements, the development of semiconductor testing technology has become particularly important. Traditional semiconductor testing technology plays a key role in ensuring the quality of devices, and with the advancement of science and technology, this field is also constantly improving and improving.

[0003] In the field of semiconductor testing, conventional testing methods mainly rely on manually operated measuring instruments to measure various performance parameters of semiconductors. For example, technicians will use equipment such as multimeters or oscilloscopes to test the voltage, current and other performance indicators of semiconductor devices one by one.

[0004] The existing testing methods still require manual intervention in the semiconductor testing process. The results of such manual judgment are highly subjective and unstable, which in turn limits the efficiency of the overall testing process. Summary of the invention

[0005] In a first aspect, in order to improve the testing efficiency of semiconductors, the present application provides a semiconductor testing method, system, terminal and medium.

[0006] The semiconductor testing method, system, terminal and medium provided in this application adopt the following technical solutions: Semiconductor testing method, system, terminal and medium, including: Get the start command; Obtain basic parameters of the target device based on the start instruction; Acquire test environment and test signals based on basic parameters; Obtain test results based on the test environment and test signals; Get test scores based on test results; Determine whether the test score meets the preset standards; If not met, a warning signal is output.

[0007] By adopting the above technical solutions, through clear steps and processes, the standardization and consistency of the test can be ensured, which helps to improve the repeatability of the test. Testing based on the start instructions and the basic parameters of the target device can help to obtain a more accurate test environment and signals, thereby improving the accuracy of the test results. By determining the test score in real time and outputting warning signals in a timely manner, it is possible to respond quickly to potential problems and reduce the risk of wrong decisions. Such testing methods and system designs can improve the efficiency, accuracy and reliability of semiconductor device testing.

[0008] Preferably, the step of obtaining a test score based on the test result includes: Get electrical information based on test results; Preprocess the electrical information and obtain feature information and scoring models; The feature information is input into the scoring model for scoring and generating a test score.

[0009] By adopting the above technical solution and acquiring electrical information, the performance characteristics of the target device can be fully understood. Preprocessing the electrical information can remove noise and outliers, improve data quality, and thus enhance the reliability of the scoring. Extracting key feature information can focus on the main indicators that affect device performance, making the scoring model more accurate and avoiding interference from redundant data, thereby improving the systematicity, accuracy, and efficiency of the test.

[0010] Preferably, the method further comprises: Get retest instructions; Check device status and generate device information based on retest instructions; If the device information meets the retest standards, set the retest parameters based on the retest product information; Retest the device based on the retest parameters and output retest results; If the retest result does not meet the retest conditions, output unqualified information.

[0011] By adopting the above technical solution, by obtaining retest instructions and checking the device status, it is possible to ensure that the device is verified again in the event of potential problems, thereby improving the reliability of the device. If the retest results do not meet the retest conditions, the system can quickly output unqualified information to help engineers take quick measures to reduce the risk of unqualified products flowing into subsequent links. The data recording and analysis during the retest process can provide a basis for subsequent quality improvements and help to continuously improve product quality.

[0012] Preferably, the method further comprises: Get aging test instructions; Obtaining basic parameters of the target device based on the aging test instructions; Get the test strategy based on the basic parameters of the target device; Testing semiconductor devices based on test strategies and obtaining working information; Determine whether the work information meets the standards; If it meets the requirements, output the test report; If it does not meet the requirements, an alarm signal will be output.

[0013] By adopting the above technical solutions and obtaining the test strategy based on the basic parameters of the target device, it can ensure that the test is more targeted and improve the relevance and effectiveness of the test. Through aging testing, the performance stability of the device in long-term use can be evaluated, thereby improving the reliability of the product. Obtaining working information during the test process helps to monitor device performance in real time and discover potential problems in a timely manner.

[0014] Preferably, the working information includes working power parameters, working temperature and video images.

[0015] By adopting the above technical solutions, combined with the working power parameters and working temperature, the performance of the device under different environmental conditions can be comprehensively evaluated to ensure its reliability in practical applications. Real-time monitoring of the working power and temperature can promptly detect abnormal conditions of the device, helping engineers to quickly take corrective measures to prevent failures. Video images can provide intuitive visual feedback to help analyze the dynamic performance of the device during the test and identify potential physical problems or defects. Combining power parameters, temperature and video images can be used to deeply understand the impact of different conditions on device performance through data correlation analysis.

[0016] Preferably, the step of determining whether the work information meets the standard; if not, outputting an alarm signal includes: Obtaining a working power parameter and determining whether the working power parameter meets a first preset range; If not, output the first alarm information; Acquiring the operating temperature and determining whether the operating temperature meets a second preset range; If not, output the second alarm information; Acquire a video image and determine whether a change in the video image complies with a preset change; If not, the third alarm message is output.

[0017] By adopting the above technical solution, each parameter can be gradually determined to quickly identify the source of the problem, which is convenient for locating which factor caused the fault. Different alarm information can be set according to different parameters to help technicians quickly judge the severity of the problem and give priority to the most critical faults. At the same time, monitoring power, temperature and video images can fully reflect the status of the equipment, improve sensitivity to abnormal situations, and output alarm signals in time when non-compliance with standards is found. Emergency processing procedures can be quickly initiated to reduce the risk of equipment damage.

[0018] Preferably, the method further comprises: Establish a test database based on the basic parameters of the target device and the test report; Calculate the qualified rate of the current target device based on the test database; Compare this pass rate to a set standard; If the pass rate does not meet the set standard, the tested device is judged to be unqualified and a quality report is output.

[0019] By adopting the above technical solutions, a test database can be established to centrally manage the basic parameters and test reports of the target devices, facilitate subsequent data query and analysis, improve data management efficiency, and calculate the pass rate in real time to quickly feedback the current product quality status, so that management can adjust production and testing strategies in time. Quality reports can help the team identify systemic problems, so as to make targeted improvements and promote the continuous optimization of production processes and product quality.

[0020] In the second aspect, in order to improve the test efficiency, the present application provides a semiconductor test system, which adopts the following technical solution: Semiconductor test systems, including, An instruction acquisition module is used to acquire a start instruction; A basic parameter acquisition module, used for acquiring basic parameters of a target device based on a start instruction; A test parameter acquisition module is used to acquire a test environment and a test signal based on basic parameters; A test result output module obtains the test result based on the test environment and the test signal; A test score acquisition module is used to acquire the test score based on the test result; A determination module, used to determine whether the test score meets the preset standard; The alarm module is used to output a warning signal when the test score does not meet the preset standard.

[0021] In a third aspect, the present application provides a smart terminal, which adopts the following technical solution: An intelligent terminal comprises a memory and a processor, wherein the memory stores a computer program which can be loaded by the processor and execute the semiconductor testing method.

[0022] In a fourth aspect, the present application provides a computer-readable storage medium, which adopts the following technical solution: A computer-readable storage medium stores a computer program that can be loaded by a processor and execute the semiconductor testing method.

[0023] In summary, the present application includes at least one of the following beneficial technical effects: 1. Through clear steps and processes, ensuring the standardization and consistency of the test helps to improve the repeatability of the test. Testing based on the start instructions and the basic parameters of the target device helps to obtain a more accurate test environment and signals, thereby improving the accuracy of the test results. By determining the test score in real time and outputting warning signals in a timely manner, it can respond quickly to potential problems and reduce the risk of wrong decisions. Such test methods and system designs can improve the efficiency, accuracy and reliability of semiconductor device testing; 2. By acquiring electrical information, we can fully understand the performance characteristics of the target device. Preprocessing the electrical information can remove noise and outliers, improve data quality, and thus enhance the reliability of scoring. Extracting key feature information can focus on the main indicators that affect device performance, making the scoring model more accurate and avoiding the interference of redundant data, thereby improving the systematicity, accuracy, and efficiency of the test; 3. By obtaining retest instructions and checking device status, it is possible to ensure that the device is re-verified in the event of potential problems, thereby improving the reliability of the device. If the retest results do not meet the retest conditions, the system can quickly output unqualified information to help engineers take quick measures to reduce the risk of unqualified products flowing into subsequent links. The data recording and analysis during the retest process can provide a basis for subsequent quality improvements and help to continuously improve product quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a method flow chart of the semiconductor testing method according to an embodiment of the present application, mainly showing steps S100-S700.

[0025] Figure 2 It is a method flow chart of the semiconductor testing method according to an embodiment of the present application, mainly showing steps S510 - S530 .

[0026] Figure 3 It is a method flow chart of the semiconductor testing method according to an embodiment of the present application, mainly showing steps SA1-SA7. DETAILED DESCRIPTION

[0027] The present application is further described in detail below in conjunction with all the accompanying drawings.

[0028] The command can be obtained by mechanical button triggering or virtual button triggering. In the mechanical button triggering method, the command can be automatically obtained after turning on the power by pressing the power button, or the current behavior information can be obtained by pressing the corresponding trigger button again after turning on the power. In the virtual button triggering method, the command can be obtained by pressing the relevant virtual trigger button in the interface of the corresponding software.

[0029] The present application embodiment discloses a semiconductor testing method. Figure 1 , semiconductor test methods include: Step S100: Get a start instruction; Specifically, the tester may trigger the start instruction by triggering it on the human-computer interaction interface of the terminal.

[0030] Step S200: acquiring basic parameters of the target device based on the start instruction; Specifically, connect to the target device (such as a chip or module) and read its identification information and specifications (such as model, size, type, etc.), that is, basic parameters. Extract the required basic parameters through data sheets, databases or configuration files to ensure the accuracy of the parameters. The basic parameters of the target device can also be obtained through the model and ID of the target device, or the basic parameters of the target device can be uploaded by the designer.

[0031] Step S300: Acquire a test environment and a test signal based on basic parameters; Specifically, a database can be established in which each model of target device matches a different test environment and test signal, which can be input in advance by the designer. The test environment parameters (such as temperature, humidity, power supply voltage, etc.) and the test signal (such as voltage, frequency, waveform, etc.) can be automatically matched based on the basic parameters of the device. The required temperature and humidity can be adjusted and maintained using an environmental test chamber or a temperature and humidity control system, and the required test signal can be generated using a signal generator, and the signal characteristics can be adjusted according to the basic parameters.

[0032] Step S400: obtaining a test result based on a test environment and a test signal; Specifically, under the set test environment, the test signal is input to the target device through the test equipment (such as oscilloscope, multimeter, etc.) and the response data is collected. The test results are recorded in the database or real-time monitoring system to ensure data integrity and accuracy.

[0033] Step S500: Obtaining a test score based on the test result; The specific steps to obtain test scores include: Step S510: obtaining electrical information based on the test results; Step S520: preprocessing the electrical information and obtaining feature information and a scoring model; Step S530: Input the feature information into the scoring model for scoring and generate a test score.

[0034] Specifically, read electrical test data from test equipment (such as oscilloscopes, signal analyzers), including voltage, current, frequency, phase, etc. Store the data in a structured format (such as CSV or database) for subsequent processing. Use filters (such as low-pass filters, high-pass filters) to remove noise from the signal to ensure data accuracy. Standardize or normalize the data to eliminate the impact of different magnitudes on the model. Interpolate or delete missing data to ensure data integrity. Extract key features through signal processing technology, such as: time domain features: mean, standard deviation, peak, etc.; frequency domain features: obtain spectrum features through fast Fourier transform (FFT); transient analysis features: such as rise time, fall time, delay, etc. Use Python libraries (such as NumPy, Pandas, SciPy) to implement data processing and feature extraction. Select an appropriate model based on feature information and scoring requirements, such as linear regression, support vector machine (SVM), decision tree, random forest, or deep learning model (such as neural network). Train the model using a labeled historical test data set (including input features and corresponding scores). Use methods such as cross-validation to evaluate model performance and optimize hyperparameters to improve accuracy. Pass the feature information of the new test into the trained scoring model to generate a predicted score (for example, one point if the time domain feature meets the expectations, one point if the frequency domain feature meets the expectations, one point if the transient analysis feature meets the expectations, and the total score). You can use libraries (such as Scikit-learn, TensorFlow, Keras) to call and score the model. Process the scores output by the model, usually mapping the results to pass / fail criteria. Output the scoring results and record them in a database or generate a report for subsequent analysis and tracking.

[0035] Step S600: Determine whether the test score meets the preset standard; Specifically, the test score is compared with the preset standard value, which can be input in advance by the staff and obtained through multiple experiments. Usually, logical judgment is realized through programming. Reasonable thresholds are set to ensure the accuracy of the judgment process.

[0036] Step S700: If not, output a warning signal.

[0037] Specifically, if the score does not meet the standard, the warning mechanism is triggered, and the user can be prompted by sound, light or software, such as displaying an alarm icon on the human-computer interaction interface. The warning information is recorded and a quality report is generated to facilitate subsequent analysis and improvement. If it meets the standard, the device is marked as qualified and recorded in the database.

[0038] It is also possible to retest the device that outputs the alarm. The specific steps include: Step S710: Obtain retest instruction; Step S720: Checking the device status based on the retest instruction and generating device information; Step S730: If the device information meets the retest standard, retest parameters are set based on the retest product information; Step S740: retesting the device based on the retest parameters and outputting the retest results; Step S750: If the retest result does not meet the retest conditions, output unqualified information. Specifically, the retest instruction is received through a user interface, an automation system, or a remote server. The retest instruction is transmitted using an API or a message queue (such as MQTT, Kafka) to ensure that the instruction is updated in real time. The current state of the device, such as voltage, current, temperature, and device morphology, is read through a sensor or test equipment. The read data is compared with a predefined standard to generate device information, including status, fault code, test history, etc. The device information is judged whether it meets the retest standard. The standard can be based on test data, industry standards, or product specifications. If the device information meets the standard, the retest parameters related to the product (such as test method, test time, test conditions, etc.) are obtained from the database. The retest parameters are set through a configuration file or database query to ensure the accuracy and applicability of the parameters. The device is tested again using the test equipment and retest parameters. The various electrical parameters during the test process are recorded, and the stability of the test environment (such as temperature, humidity, etc.) is ensured. The test results are compared with the standard to generate a retest report. The report can include pass / fail status, detailed parameters, and test data. Use visualization tools to generate charts to help understand the test results. If the retest result does not meet the preset retest conditions (such as the threshold is not met), it will be marked as unqualified. Generate an unqualified report, detailing the reasons for the unqualified, the fault points and the solutions. Feedback to relevant personnel via email, system notification or user interface.

[0039] It is also possible to perform aging tests on the target device. The specific steps include: Step SA1: Obtain aging test instructions; Step SA2: obtaining basic parameters of the target device based on the aging test instruction; Step SA3: Acquire a test strategy based on basic parameters of the target device; Step SA4: testing the semiconductor device based on the test strategy and obtaining working information, where the working information includes working power parameters, working temperature, and video images; Step SA5: Determine whether the work information meets the standards; Step SA6: If it meets the requirements, output the test report; Step SA7: If not, output an alarm signal.

[0040] Specifically, the start instruction of the aging test is received through the user interface (UI) or the automation system. Automation can be achieved through API calls, message queues, or database trigger mechanisms. Basic parameters related to the target device are obtained from the database or configuration file, including model, specifications, characteristics, and historical test data. According to the basic parameters obtained, a suitable aging test strategy is selected. This can include different conditions such as temperature, humidity, and voltage. The test strategy can be selected from a predefined strategy library or dynamically generated by an algorithm. Use a test device (such as an automated test system) to perform an aging test on the device according to the test strategy. During the test, record the working power parameters (such as current, voltage), working temperature, and video images obtained by the camera. Use a data acquisition system to monitor and record these parameters in real time, and a data recorder or a real-time data processing system can be used. Define the qualification criteria, including the allowable power range, temperature range, etc. Compare the working information obtained from the test with the standard to determine whether it meets the preset standard and check whether the mechanical form of the target device has changed significantly. If the working information meets the standard, generate a detailed test report, which should include the test conditions, working information, result analysis, and summary. Use a report generation tool (such as a PDF generation library) to output the report to ensure that the format is clear and easy to understand. Data can be extracted from the database using SQL queries or API requests. If the work information does not meet the standards, an alarm mechanism is triggered, which can be an audible alarm, visual indicator light, system message, etc. The specific information of the non-conformity is recorded and sent to relevant personnel for subsequent processing (such as maintenance, repair).

[0041] The specific steps of determining whether the working information meets the standard; if not, outputting the alarm signal include: Step SB1: Obtaining a working power parameter and determining whether the working power parameter meets a first preset range; Step SB2: If not, output the first alarm information; Step SB3: obtaining the operating temperature and determining whether the operating temperature meets the second preset range; Step SB4: If not, output a second alarm message; Step SB5: Acquire the video image and determine whether the change of the video image conforms to the preset change; Step SB6: If it does not meet the requirements, output the third alarm information. Specifically, read working power parameters, such as voltage and current, through sensors or monitoring equipment. Compare the read power value with a preset standard range. Set a qualified range of power, such as a minimum value and a maximum value. If the working power parameter is not within this range, it is determined to be non-compliant. If the working power parameter does not meet the preset standard, an alarm mechanism is triggered. The alarm information can be output through a display screen, a sound alarm, or sending a notification (such as a text message, an email). Get the current working temperature from the temperature sensor. Compare the obtained temperature value with a preset temperature range. Set a qualified temperature range (such as a minimum temperature and a maximum temperature). If the temperature exceeds this range, it is determined to be non-compliant. If the working temperature is not within the qualified range, a second alarm is triggered. The alarm information is also output in a visual or auditory manner. Use a camera to capture video images of the working environment in real time. Analyze continuous video frames to determine whether the image changes meet the preset standard, that is, whether the mechanical form of the target device has changed significantly. Set a change threshold (such as a change rate or a change in a specific feature). If the image change does not meet the preset standard, it is determined to be non-compliant. If the video image change does not meet the standard, a third alarm is triggered. The alarm is also output in an appropriate manner.

[0042] The pass rate can also be calculated. The specific steps include: Step SC1: Establish a test database based on basic parameters of the target device and the test report; Step SC2: Calculate the qualified rate of the current target device based on the test database; Step SC3: comparing the pass rate with the set standard; Step SC4: If the pass rate does not meet the set standard, the test device is determined to be unqualified and a quality report is output. Specifically, collect the basic parameters of the target device, including model, specifications, performance indicators, etc. Record the results of each test, such as test time, test environment, pass or fail information, etc. Select a suitable database management system (such as MySQL, PostgreSQL, etc.). Design the database table structure, including the following fields: id (primary key); device_id (device identification); test_date (test date); parameters (test parameters, JSON format); result (test result, pass / fail). Enter the collected data into the database to ensure that the information is complete and accurate. Query all test records of the current target device from the database according to device_id. Count the number of qualified and unqualified tests and calculate the pass rate. Determine the standard value of the pass rate (for example, 80% or 90%), and compare the calculated pass rate with the set standard. If the pass rate is lower than the standard, it is judged as unqualified. Generate a quality report based on the comparison results. The report content may include: device model; test date range; pass rate; judgment result (pass / fail); improvement plan or cause analysis. Export the quality report to PDF, Excel and other formats for easy viewing and archiving. Reports can be sent to relevant personnel via email or displayed on the system interface.

[0043] The present application provides a semiconductor testing system, which adopts the following technical solution: Semiconductor test systems, including, An instruction acquisition module is used to acquire a start instruction; A basic parameter acquisition module, used for acquiring basic parameters of a target device based on a start instruction; A test parameter acquisition module is used to acquire a test environment and a test signal based on basic parameters; A test result output module obtains the test result based on the test environment and the test signal; A test score acquisition module is used to acquire the test score based on the test result; A determination module, used to determine whether the test score meets the preset standard; The alarm module is used to output a warning signal when the test score does not meet the preset standard.

[0044] The present application provides a smart terminal, which adopts the following technical solution: An intelligent terminal comprises a memory and a processor, wherein the memory stores a computer program which can be loaded by the processor and execute the semiconductor testing method.

[0045] The present application provides a computer-readable storage medium, which adopts the following technical solution: A computer-readable storage medium stores a computer program that can be loaded by a processor and execute the semiconductor testing method.

[0046] The implementation principles of the semiconductor testing method, system, terminal and medium of the embodiments of the present application are as follows: 1. Through clear steps and processes, the standardization and consistency of the test are ensured, which helps to improve the repeatability of the test. Testing based on the start instructions and the basic parameters of the target device helps to obtain a more accurate test environment and signals, thereby improving the accuracy of the test results. By real-time determination of the test score and timely output of warning signals, potential problems can be responded to quickly and the risk of wrong decisions can be reduced. Such a testing method and system design can improve the efficiency, accuracy and reliability of semiconductor device testing.

[0047] The above are all preferred embodiments of the present application, and the protection scope of the present application is not limited thereto. Therefore, any equivalent changes made according to the structure, shape, and principle of the present application should be included in the protection scope of the present application.

Claims

1. A semiconductor testing method, characterized in that: include: Get the start command; Obtain basic parameters of the target device based on the start instruction; Acquire test environment and test signals based on basic parameters; Obtain test results based on the test environment and test signals; Get test scores based on test results; Determine whether the test score meets the preset standards; If not met, a warning signal is output.

2. The semiconductor testing method according to claim 1, wherein: The step of obtaining a test score based on the test result includes: Get electrical information based on test results; Preprocess the electrical information and obtain feature information and scoring models; The feature information is input into the scoring model for scoring and generating a test score.

3. The semiconductor testing method according to claim 1, wherein: The method further comprises: Get retest instructions; Check device status and generate device information based on retest instructions; If the device information meets the retest standards, set the retest parameters based on the retest product information; Retest the device based on the retest parameters and output the retest results; If the retest result does not meet the retest conditions, output unqualified information.

4. The semiconductor testing method according to claim 1, wherein: The method further comprises: Get aging test instructions; Obtaining basic parameters of the target device based on the aging test instructions; Get the test strategy based on the basic parameters of the target device; Testing semiconductor devices based on test strategies and obtaining working information; Determine whether the work information meets the standards; If it meets the requirements, output the test report; If it does not meet the requirements, an alarm signal will be output.

5. The semiconductor testing method according to claim 4, characterized in that: The working information includes working power parameters, working temperature and video images.

6. The semiconductor testing method according to claim 5, characterized in that: The step of determining whether the work information meets the standard; if not, outputting an alarm signal includes: Obtaining a working power parameter and determining whether the working power parameter meets a first preset range; If not, output the first alarm information; Acquiring the operating temperature and determining whether the operating temperature meets a second preset range; If not, output the second alarm information; Acquire a video image and determine whether a change in the video image complies with a preset change; If not, the third alarm message is output.

7. The semiconductor testing method according to claim 4, characterized in that: The method further comprises: Establish a test database based on the basic parameters of the target device and the test report; Calculate the qualified rate of the current target device based on the test database; Compare this pass rate to a set standard; If the pass rate does not meet the set standard, the tested device is determined to be unqualified and a quality report is output.

8. A semiconductor testing system, characterized in that: include, An acquisition instruction module is used to acquire a start instruction; A basic parameter acquisition module, used for acquiring basic parameters of a target device based on a start instruction; A test parameter acquisition module is used to acquire a test environment and a test signal based on basic parameters; A test result output module obtains the test result based on the test environment and the test signal; A test score acquisition module is used to acquire the test score based on the test result; A determination module, used to determine whether the test score meets the preset standard; The alarm module is used to output a warning signal when the test score does not meet the preset standard.

9. An intelligent terminal, characterized in that: The method comprises a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and execute the semiconductor testing method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: A computer program capable of being loaded by a processor and executing the semiconductor testing method according to any one of claims 1 to 7 is stored.

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