Method and system for testing random power-on and power-off stability of electronic equipment

Abstract

The invention provides a random power-on and power-off stability testing method and system for electronic equipment, and belongs to the technical field of electronic product tests.The method comprises the steps that a first random numerical value is generated through the tested electronic equipment, the first numerical value is continuously updated, and when the first numerical value is not equal to the first random numerical value, the tested electronic equipment continuously runs; when the first numerical value is equal to the first random numerical value, the tested electronic equipment sends the first random numerical value to the test control module; the test control module generates a random power-off duration according to the first random numerical value and generates a random power-off signal according to the random power-off duration, and the random power-on and power-off circuit controls the tested electronic equipment to be powered off according to the random power-off signal, so that the random power-off duration of the tested electronic equipment is realized; and after the tested electronic equipment is powered off, the test control module generates a second random numerical value, generates a random power-on duration according to the second random numerical value, and generates a random power-on signal according to the random power-on duration, thereby realizing power-on of the tested electronic equipment for the random duration.

Description

Technical Field

[0001] The present application belongs to the technical field of electronic product testing, and in particular relates to a method and system for testing the random power-on and power-off stability of electronic equipment. Background Art

[0002] Many electronic devices on the market, such as surveillance cameras, tablet computers, portable media players or mobile phones, use Flash for storage. These electronic devices need to be randomly powered on and off (i.e., powered on and off) tested to verify the stability of the electronic devices.

[0003] However, the timer products commonly used on the market, such as timing relays, are all set to switch on and off at fixed times. However, the application programs that run after the electronic equipment is powered on are all fixed programs. If the power-off test is performed at the same time each time, it is not enough to explain the stability of the electronic equipment when encountering sudden power outages. Summary of the invention

[0004] The purpose of the present application is to provide a method and system for testing the random power-on and power-off stability of an electronic device, so as to solve or alleviate at least one problem in the background technology.

[0005] The technical solution of the present application is: a method for testing the random power-on and power-off stability of electronic equipment, comprising: Generate a first value and a first random value by the electronic device under test, accumulate the first value, when the first value is not equal to the first random value, the electronic device under test continues to operate, when the first value is equal to the first random value, the electronic device under test sends the first random value to a test control module for electronic device stability testing; The test control module generates a random power-off duration according to the first random value, and generates a random power-off signal for controlling the random power-on and power-off circuit to disconnect according to the random power-off duration, and the random power-on and power-off circuit controls the electronic device under test to power off according to the random power-off signal, thereby realizing the random power-off of the electronic device under test; After the electronic device under test is powered off, the test control module generates a second random value, the test control module generates a random power-on duration according to the second random value, and generates a random power-on signal for controlling the connection of a random power-on and power-off circuit according to the random power-on duration, and the random power-on and power-off circuit controls the power-on of the electronic device under test according to the random power-on signal, thereby realizing the random power-on duration of the electronic device under test.

[0006] In an optional implementation manner of the present application, the maximum value of the first numerical value is greater than the first random numerical value, and the first numerical value and the first random numerical value are both natural numbers.

[0007] In an optional implementation manner of the present application, when the first numerical value is accumulated, the accumulated value is 1.

[0008] In addition, the present application also provides a system for implementing any of the above-mentioned methods for testing the random power-on and power-off stability of an electronic device, the system comprising: A random power-on and power-off circuit, the random power-on and power-off circuit comprising: a relay and a transistor, the normally open end of the relay is connected to a power supply, the common end is connected to a device under test, the first control end is connected to the collector of the transistor, the base of the transistor is connected to a test control module through a first resistor, a second resistor is connected between the base of the transistor and the first resistor, and the second resistor is connected in parallel with the emitter of the transistor to ground; The electronic device under test; A power supply, which supplies power to the electronic device under test through a random power-on and power-off circuit; A test control module, wherein the test control module is connected to the base of the transistor through a first resistor, and the test control module is used to generate a high-level or low-level random power-on and power-off signal according to a first random value and a second random value, and to control the opening and closing of a relay in a random power-on and power-off circuit according to the random power-on and power-off signal, so as to realize random power-off or power-on of the electronic device under test.

[0009] In an optional implementation manner of the present application, the transistor is of NPN type.

[0010] In an optional implementation manner of the present application, the resistance value of the second resistor is greater than the resistance value of the first resistor.

[0011] In an optional embodiment of the present application, the test control module includes a data processing module, and the periphery of the data processing module is connected to a reset circuit and a crystal oscillator circuit, the reset circuit is used to reset the count of the data processing module, and the crystal oscillator circuit is used to provide a time frequency to the data processing module.

[0012] In an optional implementation manner of the present application, the test control module further includes a power conversion module, which converts power to supply power to the data processing module.

[0013] The random power-on and power-off stability testing method and system of electronic devices provided in the present application can realize the power-off of electronic devices for random durations when in the powered-on state, and the power-on time interval of the electronic devices after power-off is also completely random, thereby realizing random power-on and power-off stability testing of electronic products or electronic devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] In order to more clearly illustrate the technical solution provided by the present application, the following is a brief introduction to the accompanying drawings. Obviously, the accompanying drawings described below are only some embodiments of the present application.

[0015] Figure 1 Schematic diagram of the random power-on and power-off stability testing method for electronic equipment of the present application.

[0016] Figure 2 Schematic diagram of the system used for random power-on and power-off stability testing of electronic equipment in this application.

[0017] Figure 3 Schematic diagram of a test control module according to an embodiment of the present application. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical solutions and advantages of the implementation of this application clearer, the technical solutions in the embodiments of this application will be described in more detail below in conjunction with the drawings in the embodiments of this application.

[0019] In order to implement random power-on and power-off stability testing of electronic devices and verify the stability of abnormal power-off of different bits of the electronic device under test when executing a code program, the present application provides a random power-on and power-off stability testing method and system for electronic devices.

[0020] like Figure 1 As shown, the random power-on and power-off stability testing method of an electronic device provided in the present application includes the following steps: S100, generating a first numerical value and a first random numerical value through the electronic device under test, accumulating the first numerical value, and when the first numerical value is not equal to the first random numerical value, allowing the electronic device under test to continue to operate in the original state; when the first numerical value is equal to the first random numerical value, the electronic device under test sends the first random numerical value to a test control module used for random power-on and power-off stability test of the electronic device under test.

[0021] In the present application, the electronic device under test is a device with data processing capability or code execution capability. For example, the electronic device may be a mobile phone, a tablet computer, a smart monitoring device, a smart door lock, etc. The electronic device usually includes a device capable of data processing, such as a central processing unit (CPU), a system on a chip (SoC) or a microprocessor (MCU), etc. Specific application programs can be executed through the above-mentioned devices with data processing functions, such as CPU, SoC or MCU.

[0022] When the electronic device under test uses a device with the above data processing capability, the function in step S100 can be implemented by executing the following program or process, namely: Step S101, define two global variables "Random Number" and "Number" in the program of the electronic device under test, the variable "Number" is used to carry the first numerical value, and the variable "Random Number" is used to carry the first random numerical value. Each time the program is powered on and started, a random numerical value is generated by calling a random function and assigned to "RandomNumber", thereby realizing the generation of the first random numerical value.

[0023] Step S102, after the first random value is assigned, as the electronic device under test continues to run, the variable "Number" of the first value is assigned and updated through a preset assignment function in the program running the electronic device under test. For example, in the first embodiment of the present application, the running program of the electronic device under test assigns the variable "Number" to 5 for the first time during the assignment process, assigns the variable "Number" to 8 for the second time, assigns the variable "Number" to 3 for the third time, and so on. In this way, as the program continues to run, the first value is constantly modified. It should be noted that in the program assignment process, the latter assignment should be different from the previous assignment.

[0024] In a preferred embodiment of the present application, the first numerical value is assigned by the running program of the electronic device under test through a sequentially increasing assignment function, and the increment is 1. For example, in this embodiment, the running program of the electronic device under test assigns the variable "Number" to 1 through the assignment function at the beginning of the test, assigns the variable "Number" to 2 at the second assignment, assigns the variable "Number" to 3 at the third assignment, and so on.

[0025] Step S103, after each assignment of the first numerical value "Number", determine whether the first numerical value "Number" is equal to the first random numerical value "Random Number" value, if the two are not equal, the program of the electronic device under test continues to run; if the two are equal, the electronic device under test sends the first random numerical value "Random Number" value to the test control module for power-off control of the electronic device under test.

[0026] For example, in this embodiment of the present application, the electronic device under test assigns a value of 5 to the "Random Number" of the first random value through a random function, and the electronic device under test assigns a value of 5 to the "Number" of the first value through an assignment function. At this time, the first random value is the same as the first value, and the "Random Number" value of 5 of the first random value is sent to the test control module for power-off control of the electronic device under test. If the assignment function of the electronic device under test does not assign a value of 5 to the "Number" of the first value, it continues to run until the assignment function of the electronic device under test assigns a value of 5 to the "Number" of the first value after the fifth assignment. At this time, the first random value is the same as the first value, and the "Random Number" value of 5 of the first random value is sent to the test control module for power-off control of the electronic device under test.

[0027] In step S200, the test control module generates a random power-off duration according to the first random value, and generates a random power-off signal for controlling the random power-on and power-off circuit to be disconnected according to the random power-off duration, so as to realize random power-off of the electronic device under test.

[0028] In the present application, the test control module is similar to the electronic device under test, which is also a device with data processing capability or code execution capability, such as a CPU, MCU, SoC, etc. The present application is described by taking a microcontroller (MCU) as an example. It is understandable that the microcontroller MCU illustrated in this embodiment of the present application does not constitute a specific limitation on the test control module.

[0029] The test control module of the present application implements the function of step S200 by executing the following process or procedure, namely: In step S201, the microcontroller MCU continuously receives a first random value sent by the electronic device under test. When the microcontroller MCU determines that the received first random value is not empty, the random power-off duration is set according to the "Random Number" value of the first random value.

[0030] It should be noted that when the random power-off duration is set according to the "Random Number" value of the first random value, the random power-off duration may be the "Random Number" value of the first random value, and its unit may be seconds (s), milliseconds (ms), minutes (min), or hours (h), etc. In addition, the random power-off duration may also be the "RandomNumber" value of the first random value multiplied by a coefficient, and its unit is set according to demand.

[0031] Step S202, after the random power-off duration is set, the microcontroller MCU starts to execute the countdown operation. After the timing ends, the microcontroller MCU generates a random power-off signal to control the relay in the random power-on and power-off circuit to shut down, and then controls the disconnection of the relay in the random power-on and power-off circuit to achieve random power-off of the electronic device under test.

[0032] Step S300, after the random power-on and power-off circuit powers off the electronic device under test according to the random power-off signal, the test control module generates a second random value, generates a random power-on duration according to the second random value, and generates a random power-on signal for controlling the random power-on and power-off circuit to be connected according to the random power-on duration, thereby realizing random power-on of the electronic device under test.

[0033] The test control module in this application can implement the function in step S300 by executing the following program or process: Step S301, a global variable "Random Number2" is defined, and the variable "Random Number2" carries the second random value. The test control module generates a random value by executing a random function and assigns it to "RandomNumber2", thereby generating the second random value.

[0034] Step S302: The test control module sets a random power-on duration according to the value of the second random number “Random Number2”.

[0035] Similarly, when the random power-on duration is set according to the "Random Number2" value of the second random value, the random power-on duration may also be the "Random Number" value of the second random value, and its unit may be seconds (s), milliseconds (ms), minutes (min), or hours (h), etc., or the random power-on duration may also be obtained by multiplying the "RandomNumber2" value of the second random value by a coefficient, and its unit may be set according to requirements.

[0036] Step S303, after the random power-on duration is set, the microcontroller MCU starts a countdown according to the random power-on duration. After the countdown ends, the microcontroller MCU generates a random power-on signal to control the relay in the random power-on and power-off circuit to be turned on, thereby controlling the random power-on and power-off circuit to be turned on, and finally realizing the random power-on and power-off operation of the electronic device under test.

[0037] like Figure 2 The system provided by the present application for implementing the above-mentioned random power-on and power-off stability test of the electronic device under test is shown, and the system includes: The electronic device under test; Power supply, used to power the electronic device under test; A random power-on and power-off circuit, the random power-on and power-off circuit comprises a relay K1 and a transistor Q1, the relay K1 comprises a first control terminal (i.e., pin 1), a second control terminal (i.e., pin 3), a normally open terminal NO (i.e., pin 4), a normally closed terminal NC (i.e., pin 5) and a common terminal (i.e., pin 2), the normally open terminal NO is connected to a power supply for powering a device under test (i.e., an electronic device), the common terminal is connected to the device under test, the second control terminal is connected to a power supply VCC for powering the relay, the first control terminal is connected to the collector of the transistor Q1, the base of the transistor Q1 is connected to a test control module through a first resistor R1, the test control module is used to generate a random power-on and power-off signal, a second resistor R2 is provided between the base of the transistor Q1 and the first resistor R1, the second resistor R2 is connected to the emitter of the transistor Q1 and is grounded; and The test control module is connected to the base of the transistor Q1 through the first resistor R1.

[0038] In the present application, the random power-on and power-off circuit uses a transistor and a relay to turn the power on and off. A random power-on / power-off signal is generated by the test control module. When the random power-on / power-off signal is at a high level, the transistor Q1 is turned on, the common end of the relay K1 is connected to the normally closed end NC, and the electronic device under test is connected to the power supply to power on the electronic device under test; when the random power-on / power-off signal is at a low level, the transistor Q1 is not turned on, the common end of the relay K1 is connected to the normally open end NO, the electronic device under test is not turned on to power off the electronic device under test.

[0039] In some embodiments of the present application, the transistor Q1 is an NPN structure. Further, the resistance of the second resistor R2 can be set to be greater than the resistance of the first resistor R1. For example, in this embodiment of the present application, the first resistor R1 has a resistance of 1K, and the second resistor R2 has a resistance of 10K, which is about ten times the resistance of the first resistor R1.

[0040] like Figure 3 The schematic diagram of the test control module in this embodiment of the present application is shown. The test control module includes a data processing device, which can be a central processing unit (CPU), a microcontroller (MCU) or a system on a chip (SoC), etc. The microcontroller MCU is used for control in this embodiment of the present application. The power supply supplies power to the microcontroller MCU through the power conversion module. The microcontroller MCU is connected to a reset circuit and a crystal oscillator circuit. The reset circuit is used to reset the count of the microcontroller MCU. The crystal oscillator circuit is used to provide an accurate time frequency to the microcontroller MCU. The microcontroller MCU is used to generate a random value or a random power-on / off duration, and output a control signal according to the random power-on / off duration-a high level or a low level, thereby realizing the control of the random power-on and power-off circuit.

[0041] The random power-on and power-off stability testing method and system for electronic devices provided in the present application can realize the power-off of electronic devices for random durations when they are powered on, and the power-on time interval of the electronic devices after power-off is also completely random, thereby realizing random power-on and power-off stability testing of electronic products or electronic devices.

[0042] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed in the present application should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A method for testing the random power-on and power-off stability of an electronic device, characterized in that: include: Generate a first random value through the electronic device under test, and continuously update the first value during the operation of the electronic device under test, when the first value is not equal to the first random value, the electronic device under test continues to operate, and when the first value is equal to the first random value, the electronic device under test sends the first random value to a test control module for electronic device stability testing; The test control module generates a random power-off duration according to the first random value, and generates a random power-off signal for controlling the random power-on and power-off circuit to disconnect according to the random power-off duration, and the random power-on and power-off circuit controls the electronic device under test to power off according to the random power-off signal, thereby realizing the random power-off of the electronic device under test; After the electronic device under test is powered off, the test control module generates a second random value, the test control module generates a random power-on duration according to the second random value, and generates a random power-on signal for controlling the connection of a random power-on and power-off circuit according to the random power-on duration, and the random power-on and power-off circuit controls the power-on of the electronic device under test according to the random power-on signal, thereby realizing random power-on of the electronic device under test.

2. The random power-on and power-off stability testing method for an electronic device according to claim 1, characterized in that: The maximum value of the first numerical value is greater than the first random numerical value, and the first numerical value and the first random numerical value are both natural numbers.

3. The random power-on and power-off stability testing method for an electronic device according to claim 2, characterized in that: The first random value is generated by a random function, and the first value is updated by an assignment function set in a running program of the electronic device under test.

4. The random power-on and power-off stability testing method for an electronic device according to claim 3, characterized in that: The first numerical value is configured to be assigned in a running program of the electronic device under test by sequentially increasing the value by 1.

5. A system for implementing the random power-on and power-off stability testing method of an electronic device as claimed in any one of claims 1 to 4, characterized in that: The system comprises: A random power-on and power-off circuit, the random power-on and power-off circuit comprising: a relay and a triode, the normally open end of the relay is connected to a power supply, the common end is connected to the electronic device under test, the first control end is connected to the collector of the triode, the base of the triode is connected to the test control module through a first resistor, a second resistor is connected between the base of the triode and the first resistor, and the second resistor is connected in parallel with the emitter of the triode to ground; The electronic device under test; A power supply, which supplies power to the electronic device under test through a random power-on and power-off circuit; A test control module, wherein the test control module is connected to the base of the transistor through a first resistor, and the test control module is used to generate a high-level or low-level random power-on and power-off signal according to a first random value and a second random value, and to control the opening and closing of a relay in a random power-on and power-off circuit according to the random power-on and power-off signal, so as to realize random power-off or power-on of the electronic device under test.

6. The system according to claim 5, characterized in that The transistor is of NPN type.

7. The system according to claim 5, characterized in that The resistance value of the second resistor is greater than the resistance value of the first resistor.

8. The system according to claim 5, characterized in that The test control module includes a data processing module, and a reset circuit and a crystal oscillator circuit are connected to the periphery of the data processing module. The reset circuit is used to reset the count of the data processing module, and the crystal oscillator circuit is used to provide a time frequency to the data processing module.

9. The system according to claim 8, characterized in that The test control module also includes a power conversion module, which converts power to supply power to the data processing module.

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