Test method and test system

Abstract

The invention discloses a test method and a test system. The test method comprises the following steps: determining a test range of the to-be-tested equipment, and controlling the test device and the to-be-tested equipment to be powered on; setting a radio frequency parameter according to the test range, and controlling a radio frequency component of the test device to generate a radio frequency signal according to the radio frequency parameter to interfere with the to-be-tested equipment in the test cavity; collecting the working state of the to-be-tested equipment, recording the current radio frequency parameter of the radio frequency signal when the working state of the to-be-tested equipment is an abnormal state, and then adjusting the radio frequency parameter until the test of the test range is completed; and outputting a test report under the condition that the test of the test range is completed. According to the test method, the anti-electromagnetic interference characteristic of the to-be-tested equipment can be tested within the test range, and the test report corresponding to the abnormal state is output, so that the anti-electromagnetic interference characteristic of the to-be-tested equipment can be improved subsequently, and the working reliability of the to-be-tested equipment in an electromagnetic interference environment is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic equipment testing, and in particular to a testing method and a testing system. Background Art

[0002] When microwave heating equipment generates microwaves to heat the load in the cavity, since the microwave heating cavity is not completely closed (such as there is a gap between the door and the cavity), there will be a small amount of microwave leakage (this microwave leakage meets national safety standards). These leaked microwaves will also interfere with the parts of the microwave heating equipment, such as the control board, controller, etc., affecting the normal operation of related components, such as causing the display device on the control board to flicker or the control board to reset and not work, etc. Therefore, it is necessary to test the anti-electromagnetic interference characteristics of related components. Summary of the invention

[0003] The invention provides a testing method and a testing system.

[0004] A testing method provided in an embodiment of the present invention performs an anti-electromagnetic interference characteristic test on a device to be tested, comprising:

[0005] Determine a test range of the device under test, the test range including at least one of a frequency range, a phase range, and a power range, control the test device and the device under test to be powered on, and place the device under test in a test chamber of the test device;

[0006] Setting the parameters of the radio frequency signal according to the test range, and controlling the radio frequency component of the test device to generate a radio frequency signal according to the parameters of the radio frequency signal to interfere with the device under test in the test cavity;

[0007] Collecting the working state of the device under test, and when the working state of the device under test is abnormal, recording the current parameters of the radio frequency signal, and then adjusting the parameters of the radio frequency signal until the test of the test range is completed;

[0008] When the test in the test range is completed, a test report is output, wherein the test report includes the abnormal state of the device under test and the parameters of the radio frequency signal corresponding to the abnormal state.

[0009] The above test method can test the anti-electromagnetic interference characteristics of the device under test within the test range and output a test report corresponding to the abnormal state, which is conducive to subsequent improvement of the anti-electromagnetic interference characteristics of the device under test and improving the reliability of the device under test in an electromagnetic interference environment.

[0010] In certain embodiments, the frequency range is 30 MHz to 18 GHz, the phase range is 0° to 360°, and the power range is 0 W to 50 W.

[0011] In certain embodiments, the testing method is performed by the testing device, or;

[0012] The testing method is executed collaboratively by a host computer and the testing device, and the host computer is in communication connection with the testing device.

[0013] In certain embodiments, the testing method further comprises:

[0014] The test device is controlled to upload status information of the RF component to the host computer, wherein the status information of the RF component includes at least one of frequency, phase and power of a RF signal, and a switch status of the RF component.

[0015] In certain embodiments, the testing method further comprises:

[0016] The test device and / or the host computer are controlled to display current parameters of the radio frequency signal corresponding to when the working state of the device under test is an abnormal state.

[0017] In some embodiments, collecting the working status of the device under test includes at least one of the following:

[0018] Determine the working status of the device under test through a camera;

[0019] Determine the working state of the device to be tested by a temperature detection device;

[0020] The working state of the device under test is determined by a sound sensor.

[0021] A test system provided in an embodiment of the present invention performs an anti-electromagnetic interference characteristic test on a device to be tested, comprising:

[0022] A determination module, the determination module is used to determine a test range of the device under test, the test range includes at least one of a frequency range, a phase range and a power range, control the test device and the device under test to be powered on, and the device under test is placed in a test chamber of the test device;

[0023] A processing module, the processing module is used to set the parameters of the radio frequency signal according to the test range, and control the radio frequency component of the test device to generate a radio frequency signal according to the parameters of the radio frequency signal to interfere with the device under test in the test cavity;

[0024] A collection module, the collection module is used to collect the working state of the device under test, and when the working state of the device under test is abnormal, record the current parameters of the radio frequency signal, and then the determination module is used to adjust the parameters of the radio frequency signal until the test of the test range is completed;

[0025] An output module, wherein the output module is used to output a test report when the test in the test range is completed, wherein the test report includes an abnormal state of the device under test and parameters of a radio frequency signal corresponding to the abnormal state.

[0026] The above test system can test the anti-electromagnetic interference characteristics of the device under test within the test range and output a test report corresponding to the abnormal state, which is conducive to subsequent improvement of the anti-electromagnetic interference characteristics of the device under test and improving the reliability of the device under test in an electromagnetic interference environment.

[0027] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0029] Figure 1 is a flow chart of a testing method according to an embodiment of the present invention;

[0030] Figure 2 is a schematic diagram of a module of a test system according to an embodiment of the present invention;

[0031] Figure 3 is a schematic diagram of a scenario of a test system according to an embodiment of the present invention;

[0032] Figure 4 Schematic diagram of an exploded view of a testing device according to an embodiment of the present invention.

[0033] Description of main component symbols:

[0034] Test system-100, test device-10, test cavity-11, door body-111, test cavity-112, RF component-12, antenna-121, camera-13, heat dissipation component-14, air guide-141, heat dissipation motor-142, power supply component-15, control panel-16, host computer-20, device under test-30, determination module-40, processing module-50, acquisition module-60, output module-70, display module-80. DETAILED DESCRIPTION

[0035] The embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0036] See also Figure 1 A testing method according to an embodiment of the present invention performs an anti-electromagnetic interference characteristic test on a device to be tested 30. The testing method includes:

[0037] 01: Determine a test range of the device under test 30, the test range includes at least one of a frequency range, a phase range and a power range, control the test device 10 and the device under test 30 to be powered on, and place the device under test 30 in the test cavity 11 of the test device 10;

[0038] 02: Setting the parameters of the radio frequency signal according to the test range, and controlling the radio frequency component 12 of the test device 10 to generate a radio frequency signal according to the parameters of the radio frequency signal, so as to interfere with the device under test 30 in the test cavity 11;

[0039] 03: Collect the working state of the device under test 30. When the working state of the device under test 30 is abnormal, record the current parameters of the radio frequency signal, and then adjust the parameters of the radio frequency signal until the test range is completed;

[0040] 04: When the test in the test range is completed, a test report is output, where the test report includes the abnormal state of the device under test 30 and the parameters of the radio frequency signal corresponding to the abnormal state.

[0041] The test method of the embodiment of the present invention can be implemented by the test system 100 of the embodiment of the present invention. Figure 2 The test system 100 includes a determination module 40, a processing module 50, an acquisition module 60 and an output module 70. The determination module 40 is used to determine the test range of the device under test 30, the test range includes at least one of the frequency range, the phase range and the power range, control the test device 10 and the device under test 30 to be powered on, and the device under test 30 is placed in the test chamber 11 of the test device 10; the processing module 50 is used to set the parameters of the RF signal according to the test range, and control the RF component 12 of the test device 10 to generate the RF signal according to the parameters of the RF signal to interfere with the device under test 30 in the test chamber 11; the acquisition module 60 is used to collect the working state of the device under test 30, and record the current parameters of the RF signal when the working state of the device under test 30 is abnormal, and then the determination module 40 is used to adjust the parameters of the RF signal until the test of the test range is completed; the output module 70 is used to output a test report when the test of the test range is completed, and the test report includes the abnormal state of the device under test 30 and the parameters of the RF signal corresponding to the abnormal state.

[0042] The above-mentioned test method and test system 100 can test the anti-electromagnetic interference characteristics of the device under test 30 within the test range and output a test report corresponding to the abnormal state, which is conducive to the subsequent improvement of the anti-electromagnetic interference characteristics of the device under test 30 and the improvement of the reliability of the device under test 30 working in an electromagnetic interference environment.

[0043] In one embodiment, the test device 10 is formed with a test cavity 11 for accommodating the device under test 30, and the device under test 30 can be placed in the test cavity 11 to receive interference from the radio frequency signal generated by the radio frequency component 12. The test device 10 can control the device under test 30 to power on so that the device under test 30 enters a working state, thereby detecting the influence of the radio frequency signal on the operation of the device under test 30.

[0044] The radio frequency signal includes but is not limited to a signal in the microwave frequency band. In one embodiment, the parameters of the radio frequency signal include: a frequency range, a phase range, and a power range, which can be set by the operator. Specifically, the operator can set the parameters of the radio frequency signal, such as the frequency range, the phase range, and the power range, through the control panel 16 or the host computer 20. The processing module 50 can first select a frequency, and then select a phase and a power according to the parameters of the radio frequency signal, and generate a first radio frequency signal according to the selected frequency, phase, and power. The first radio frequency signal is radiated into the test cavity 11 to complete a test. After completing a test, the processing module 50 can keep the frequency unchanged, select another phase and / or another power, and then generate a second radio frequency signal, and the second radio frequency signal is radiated into the test cavity 11 to complete another test. By analogy, multiple interference tests on the device under test 30 can be completed through multiple tests.

[0045] Under the interference of radio frequency signal radiation, the working state of the device under test 30 may be abnormal or normal. By collecting the abnormal state and the parameters of the radio frequency signal corresponding to the abnormal state, a test report can be generated and output. The test report can be displayed on the control panel 16 or the display screen of the host computer 20, so that the abnormal state displayed in the test report can be improved, thereby gradually improving the reliability of the device under test 30 working in an electromagnetic interference environment.

[0046] In some embodiments, the parameters of the radio frequency signal may include one or a combination of any two of a frequency range, a phase range, and a power range.

[0047] In one embodiment, see Figure 3The RF component 12 includes multiple antennas 121, and the multiple antennas 121 are placed in the test cavity 11. The RF component 12 can radiate RF signals to the device under test 30 in the test cavity 11 through the antennas 121 to form an electromagnetic interference environment. The antennas 121 can also be partially located in the test cavity 11 and partially located outside the test cavity 11; the antennas 121 can also be completely placed outside the test cavity 11, which is not limited here.

[0048] In one embodiment, see Figure 4 The test device 10 has a test cavity 112, and the test cavity 112 is provided with a test cavity 11. The material of the test cavity 112 is a material that has the function of shielding the propagation of electromagnetic waves. This can avoid the leakage of electromagnetic waves when detecting the device to be tested 30, thereby avoiding the adverse effects of electromagnetic waves on nearby operators, and can also ensure the accuracy of detecting the device to be tested 30. In another embodiment, the test cavity 112 can be made of metal material, or it can be made of plastic material with a metal layer on the surface, which is not limited here. The test cavity 112 made of metal material is strong and durable; the test cavity 112 with a metal layer on the surface of plastic material is light in weight, low in cost, and easy to move. The material of the test cavity 112 can be selected according to actual conditions, which is not limited here.

[0049] In certain embodiments, the frequency range is 30 MHz to 18 GHz; the phase range is 0° to 360°; and the power range is 0 W to 50 W.

[0050] In this way, electromagnetic interference in different scenarios can be simulated.

[0051] Specifically, in one embodiment, the device to be tested 30 may be a component of a microwave oven, such as a control board, a chip, etc. In different working modes of the microwave oven, the frequency of the microwave generated by the microwave oven is different, and the frequency range of the generated microwave oven may be 30 MHz to 18 GHz. When the phase range and the power range are determined, by adjusting the frequency of the radio frequency signal, the changes in electromagnetic interference faced by the components of the microwave oven in different working modes can be simulated. In another embodiment, the moments when the components of the microwave oven face electromagnetic interference may also be different, and by adjusting the phase of the radio frequency signal, the changes in electromagnetic interference faced by the components of the microwave oven at different moments can be simulated. In another embodiment, the power of microwave ovens of different models may be inconsistent, so that the power of electromagnetic interference faced by the components of microwave ovens of different models is also inconsistent. The power of the microwave oven may be 0W to 50W. When the frequency range and the phase range are determined, by adjusting the power of the radio frequency signal, the changes in electromagnetic interference faced by the components of the microwave oven under different types can be simulated. The frequency range, the phase range, and the power range may be input by the operator through the control panel 16 or the host computer 20, or may be input by other control terminals.

[0052] See also Figure 3 In some embodiments, the test method is executed by the test device 10, or the test method is executed by the host computer 20 and the test device 10 in collaboration. The host computer 20 is in communication connection with the test device 10.

[0053] This is helpful for adjusting the parameters of the radio frequency signal.

[0054] Specifically, see Figure 3 In one embodiment, the test method is performed by a test device 10. The test device 10 may constitute a test system. The test device 10 may include a determination module 40, a processing module 50, an acquisition module 60, and an output module 70, and the test method is implemented by the above modules. The test device 10 may also include a control panel 16. The control panel 16 may display the parameters of the current RF signal. The operator may modify the parameters of the RF signal through the operation area on the control panel 16 to adjust the RF signal.

[0055] In another embodiment, the test method is executed by the host computer 20 and the test device 10 in collaboration, and the host computer 20 and the test device 10 can constitute a test system. The test system 100 includes a determination module 40 , a processing module 50 , a collection module 60 and an output module 70 .

[0056] In one embodiment, the determination module 40 may be located in the host computer 20, the processing module 50, the acquisition module 60 and the output module 70 may be located in the test device 10, the operator may interact with the test device 10 through the host computer 20, the determination module 40 of the host computer 20 may determine the parameters of the RF signal through the instructions input by the operator, the host computer 20 sends the parameters of the RF signal to the test device 10, and the processing module 50 controls the RF component 12 to generate the RF signal according to the parameters of the RF signal to interfere with the device under test 30 in the test cavity 11. The acquisition module 60 may acquire the working state of the device under test 30, and record the current parameters of the RF signal when the working state of the device under test 30 is abnormal. The output module 70 may output a test report according to the data recorded by the acquisition module 60.

[0057] In one embodiment, the determination module 40 and the output module 70 may be located in the host computer 20, the processing module 50 and the acquisition module 60 may be located in the test device 10, the operator may interact with the test device 10 through the host computer 20, the determination module 40 of the host computer 20 may determine the parameters of the radio frequency signal through the instructions input by the operator, the host computer 20 sends the parameters of the radio frequency signal to the test device 10, and the processing module 50 controls the radio frequency component 12 to generate a radio frequency signal according to the parameters of the radio frequency signal to interfere with the device under test 30 in the test cavity 11. The acquisition module 60 may collect the working state of the device under test 30, and record the current parameters of the radio frequency signal when the working state of the device under test 30 is an abnormal state. The acquisition module 60 may also send the recorded data to the host computer 20. The output module 70 may output a test report according to the received recorded data. This facilitates the operator to view the test report on the host computer 20.

[0058] In some embodiments, the host computer 20 may include but is not limited to a device with communication function such as a smart phone, a tablet computer, a personal computer or a wearable smart device. The host computer 20 can be connected to the test device 10 by wired or wireless means, such as connecting the test device 10 by a data cable, or by wireless means such as connecting the test device 10 by Bluetooth, a wireless local area network (such as WIFI), etc.

[0059] See also Figure 3 In some embodiments, the testing method further comprises:

[0060] The control test device 10 uploads the status information of the RF component 12 to the host computer 20 , where the status information of the RF component 12 includes at least one of the frequency, phase and power of the RF signal, and the switch status of the RF component 12 .

[0061] The test method of the embodiment of the present invention can be implemented by the test system 100 of the embodiment of the present invention. Figure 2 The test system 100 includes a collection module 60. The collection module 60 is used to control the test device 10 to upload the status information of the RF component 12 to the host computer 20. The status information of the RF component 12 includes at least one of the frequency, phase and power of the RF signal, and the switch state of the RF component 12.

[0062] This is helpful for recording abnormal information.

[0063] Specifically, see Figure 3In one embodiment, after completing an adjustment of the parameters of the RF signal and performing an electromagnetic interference test, the acquisition module 60 can control the test device 10 to collect at least one of the frequency, phase and power of the RF signal, as well as the switching state of the RF component 12, to form the status information of the RF component 12, and send the status information of the RF component 12 to the host computer 20, and the host computer 20 can make a record.

[0064] When the frequency and phase remain unchanged and the determination module 40 only changes the power, the determination module 40 can adjust the power in sequence starting from the minimum frequency of the power range with a preset step value and complete multiple tests according to the parameters of the RF signal, so that a test report containing multiple sets of data covering the test range can be obtained. By recording the parameters of the RF signal and the switch state of the RF component 12 for each test, the data changes in the entire test process can be fully recorded, thereby avoiding data omissions and improving the accuracy of subsequent improvements to the device under test 30.

[0065] In one embodiment, the testing device 10 may upload the status information of the RF component 12 to the host computer 20 once when the RF component 12 is switched from the on state to the off state.

[0066] See also Figure 3 In some embodiments, the testing method further comprises:

[0067] The control test device 10 and / or the host computer 20 displays the current parameters of the radio frequency signal corresponding to when the working state of the device under test 30 is an abnormal state.

[0068] The test method of the embodiment of the present invention can be implemented by the test system 100 of the embodiment of the present invention. Figure 2 The test system 100 includes a display module 80. The display module 80 is used to control the test device 10 and / or the host computer 20 to display the current parameters of the radio frequency signal corresponding to when the working state of the device under test 30 is an abnormal state.

[0069] In this way, it is convenient for the operator to locate the abnormal point of the device under test 30 .

[0070] Specifically, see Figure 3In one embodiment, when an electromagnetic interference test is completed, the host computer 20 records the working state of the device under test 30 and the current parameters of the radio frequency signal. In another embodiment, when the parameters of the radio frequency signal are adjusted once and an electromagnetic interference test is completed, the host computer 20 may not record, but only record and display the current parameters of the radio frequency signal when the working state of the device under test 30 is abnormal, thereby simplifying the recording process and extracting parameters that are more conducive to improving the radio frequency signal of the device under test 30.

[0071] In addition, the operator can also adjust the parameters corresponding to the radio frequency signal in the next test according to the parameters displayed by the display module 80, thereby improving the test efficiency. In some embodiments, the abnormal working state and / or normal working state of the device under test 30 can be determined and stored in advance through simulation, experience or other means. The working state of the device under test 30 collected during the test is compared with the preset abnormal working state or the preset normal working state to obtain the corresponding test result. The test result can be used to determine whether the working state of the device under test 30 is an abnormal state or a normal state. Optionally, the test system 100 can have multiple preset normal working states or multiple preset abnormal working states. When the working state of the device under test 30 is consistent with one or more preset abnormal working states, or is inconsistent with one or more preset normal working states, it is determined that the working state of the device under test 30 is an abnormal state.

[0072] See also Figure 3 In some embodiments, collecting the working status of the device under test 30 includes at least one of the following:

[0073] Determine the working status of the device under test 30 through the camera 13;

[0074] Determine the working state of the device under test 30 by means of a temperature detection device;

[0075] The working state of the device under test 30 is determined by the sound sensor.

[0076] This is helpful to determine whether the working state of the test equipment is abnormal.

[0077] Specifically, see Figure 3In one embodiment, the test system 100 includes an acquisition module 60, and the acquisition module 60 is used to determine the working state of the device under test 30 through the camera 13. The device under test 30 may include a display screen, and the working state of the device under test 30 is an abnormal state, which may be manifested as a flickering screen, a flowery screen, or other abnormal state with color changes on the display screen. During the test process, the acquisition module 60 can determine the image information of the device under test 30 through the camera 13 to identify whether the device under test 30 has a flickering screen, a flowery screen, or other abnormal state with color changes. If the device under test 30 has a flickering screen, a flowery screen, or other abnormal state with color changes, it is determined that the working state of the device under test 30 is an abnormal state, and the acquisition module 60 records the type of abnormal state and the current parameters of the radio frequency signal, which is conducive to subsequent improvement of the problem of the device under test 30.

[0078] It can be understood that in other implementations, the device under test 30 is not limited to being a display screen, and the abnormal state of the device under test 30 can be identified by using the image information of the device under test 30 collected by the camera 13 .

[0079] The camera 13 can be installed inside the test cavity 11, or outside the test cavity 11. In one embodiment, the camera 13 is installed outside the test cavity 11 and connected to the host computer 20, and the device under test 30 can be photographed by the host computer 20 to collect the working status of the device under test 30. Optionally, the camera 13 can be placed inside an electromagnetic shielding member (not shown) to reduce the impact of radio frequency signals on the camera 13. The camera 13 can collect image information of the device under test 30 in the test cavity 11 through a light-transmitting hole (not shown).

[0080] In one embodiment, the acquisition module 60 can determine the working state of the device under test 30 through a temperature detection device (not shown). The temperature detection device can be a contact temperature detection device or a non-contact temperature detection device. No specific limitation is made here. The contact temperature detection device can include a thermistor, such as an NTC (negative temperature coefficient) thermistor. The thermistor can be set on the detection part of the device under test 30. The temperature detection device can use the thermistor to detect the temperature of the detection part of the device under test 30. The non-contact temperature detection device can include an infrared sensor, and the infrared sensor can be directed toward the device under test 30 to collect temperature information of the device under test 30. The temperature detection device can use an infrared sensor to detect the temperature information of the device under test 30. The acquisition module 60 can identify the abnormal state of local overheating of the device under test 30 through the infrared sensor.

[0081] If it is determined that the temperature (such as local temperature) of the device under test 30 is within the abnormal temperature range, the working state of the device under test 30 can be determined to be an abnormal state, and the acquisition module 60 records the type of the abnormal state and the current parameters of the RF signal.

[0082] In another embodiment, the acquisition module 60 can determine the working state of the device under test 30 through a sound sensor (not shown). The sound sensor may include a microphone, which can be installed in the test cavity 11 or outside the test cavity 11. Optionally, the microphone can be placed inside the electromagnetic shielding member to reduce the influence of the radio frequency signal on the microphone. The microphone can collect sound information of the device under test 30 in the test cavity 11 through the sound pickup hole.

[0083] The abnormal working state of the device under test 30 can be displayed as abnormal sound information. During the detection process, the acquisition module 60 can collect the sound information of the device under test 30 through the sound sensor, and compare the abnormal sound information with the sound information of the device under test 30 to determine whether the device under test 30 is abnormal. If the sound information of the device under test 30 is consistent with the abnormal sound information, it is determined that the working state of the device under test 30 is abnormal, and the acquisition module 60 records the type of abnormal state and the current parameters of the radio frequency signal. In one example, during the detection process, the component of the object under test makes a sound due to cracking, and the acquisition module 60 can determine that the working state of the device under test 30 is abnormal based on the cracking sound information of the device under test 30.

[0084] Also, see Figure 4 In some embodiments, the test device 10 may further include a door body 111, which is rotatably mounted at the opening of the test cavity 11 to open or close the opening. When the door body 111 opens, the operator can take and place the device under test 30. When the door body 111 is closed, testing can be performed. The door body 111 is used to prevent the radio frequency signal from leaking from the test cavity 11 into the air, thereby improving the safety of the testing process. In one embodiment, the camera 13 is installed outside the test cavity 11. At least a portion of the door body 111 may be made of a transparent material to facilitate the camera 13 to capture the working status of the device under test 30.

[0085] The test device 10 may also include a heat dissipation component 14, which includes an air guide 141 and a heat dissipation motor 142. The air guide 141 covers the RF component 12. The heat dissipation motor 142 can provide wind when working. The wind blown by the heat dissipation motor 142 enters the air guide 141, which can take away the heat of the RF component 12 and cool it down. Thus, the temperature of the RF component 12 is reduced.

[0086] The test device 10 may also include a power supply component 15, which is disposed above the air guide 141. The power supply component 15 may be thermally connected to the air guide 141 so that the heat dissipation component 14 may dissipate heat from the power supply component 15 through the air guide 141. The power supply component 15 is electrically connected to various components and parts of the test device 10. The power supply component 15 may also be electrically connected to the device under test 30 in the test cavity 11 so that the power supply component 15 provides the device under test 30 with the electrical energy (DC and / or AC) required for operation, so that the device under test 30 can operate, thereby detecting the anti-electromagnetic interference capability of the device under test 30.

[0087] In certain embodiments of the present invention, the module involved may be a single-chip microcomputer chip that integrates a processor, a memory, a communication module, etc. The processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc.

[0088] Any process or method description in a flowchart or otherwise described herein may be understood to represent a module, segment or portion of code that includes one or more executable instructions for implementing the steps of a specific logical function or process, and the scope of the preferred embodiments of the present invention includes alternative implementations in which functions may not be performed in the order shown or discussed, including performing functions in a substantially simultaneous manner or in the reverse order depending on the functions involved, which should be understood by those skilled in the art to which the embodiments of the present invention belong.

[0089] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, apparatus or device (such as a computer-based system, a system including a processing module, or other system that can fetch instructions from an instruction execution system, apparatus or device and execute instructions), or used in combination with these instruction execution systems, apparatuses or devices.

[0090] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A test method for testing the anti-electromagnetic interference characteristics of a device under test, characterized in that: The test method includes: Determine a test range of the device under test, the test range including at least one of a frequency range, a phase range, and a power range, control the test device and the device under test to be powered on, and place the device under test in a test chamber of the test device; Setting the parameters of the radio frequency signal according to the test range, and controlling the radio frequency component of the test device to generate a radio frequency signal according to the parameters of the radio frequency signal to interfere with the device under test in the test cavity; Collecting the working state of the device under test, and when the working state of the device under test is abnormal, recording the current parameters of the radio frequency signal, and then adjusting the parameters of the radio frequency signal until the test of the test range is completed; When the test in the test range is completed, a test report is output, wherein the test report includes the abnormal state of the device under test and the parameters of the radio frequency signal corresponding to the abnormal state.

2. The testing method according to claim 1, characterized in that: The frequency range is 30 MHz to 18 GHz, the phase range is 0° to 360°, and the power range is 0 W to 50 W.

3. The testing method according to claim 1, characterized in that: The test method is performed by the test device, or; The testing method is executed collaboratively by a host computer and the testing device, and the host computer is in communication connection with the testing device.

4. The testing method according to claim 3, characterized in that: The test method also includes: The test device is controlled to upload status information of the RF component to the host computer, wherein the status information of the RF component includes at least one of frequency, phase and power of a RF signal, and a switch status of the RF component.

5. The testing method according to claim 3, characterized in that: The test method also includes: The test device and / or the host computer are controlled to display current parameters of the radio frequency signal corresponding to when the working state of the device under test is an abnormal state.

6. The testing method according to claim 1, characterized in that: Collecting the working status of the device under test includes at least one of the following: Determine the working status of the device under test through a camera; Determine the working state of the device to be tested by a temperature detection device; The working state of the device under test is determined by a sound sensor.

7. A test system for testing the anti-electromagnetic interference characteristics of a device under test, characterized in that: The test system comprises: A determination module, the determination module is used to determine a test range of the device under test, the test range includes at least one of a frequency range, a phase range and a power range, control the test device and the device under test to be powered on, and the device under test is placed in a test chamber of the test device; A processing module, the processing module is used to set the parameters of the radio frequency signal according to the test range, and control the radio frequency component of the test device to generate a radio frequency signal according to the parameters of the radio frequency signal to interfere with the device under test in the test cavity; A collection module, the collection module is used to collect the working state of the device under test, and when the working state of the device under test is abnormal, record the current parameters of the radio frequency signal, and then the determination module is used to adjust the parameters of the radio frequency signal until the test of the test range is completed; An output module, wherein the output module is used to output a test report when the test in the test range is completed, wherein the test report includes an abnormal state of the device under test and parameters of a radio frequency signal corresponding to the abnormal state.

8. The test system according to claim 7, characterized in that: The frequency range is 30 MHz to 18 GHz, the phase range is 0° to 360°, and the power range is 0 W to 50 W.

9. The test system according to claim 7, characterized in that: The test system comprises a display module, and the display module is used to display current parameters of the radio frequency signal corresponding to when the working state of the device under test is an abnormal state.

10. The test system according to claim 7, characterized in that: The acquisition module acquires the working status of the device under test in at least one of the following ways: Determine the working status of the device under test through a camera; Determine the working state of the device to be tested by a temperature detection device; The working state of the device under test is determined by a sound sensor.

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