Positioning method and device and storage medium
By measuring the reference signal reception power on the RIS device, the problem of inaccurate positioning of RIS devices in the prior art is solved, and the effect of achieving accurate positioning of a single node is achieved.
Patent Information
- Application Number
- CN202310803670.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-06-30
- Publication Date
- 2024-12-31
AI Technical Summary
The existing intelligent metasurface (RIS) positioning technology requires multiple base stations to achieve more accurate positioning, and it is impossible to achieve accurate positioning in actual applications.
The first node sends configuration information to the second node, instructs the activation of the corresponding measurement unit to perform reference signal reception power measurement on the multiple beams to be measured, obtains measurement results and determines the position information of the second node, so as to realize accurate positioning of the RIS device .
Accurate positioning of RIS equipment is achieved, the number of base stations required for positioning is reduced, and the positioning accuracy is improved.
Smart Images

Figure CN119233390A_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to the field of communications, and in particular to a positioning method, device and storage medium. Background Art
[0002] Reconfigurable intelligent surface (RIS) technology is a technology that uses artificial electromagnetic materials with programmable electromagnetic properties to control the electromagnetic environment. Specifically, RIS controls the electromagnetic environment by adjusting the phase of each array to control the outgoing beam to focus to the desired direction or point.
[0003] At present, programmable intelligent metasurface technology is still in the research stage. In practical applications, since the codebook of RIS needs to be designed according to the location information of RIS, the positioning technology related to RIS has always been the key content in its application. The existing RIS positioning technology is mainly applied to target user equipment, and multiple base stations are required to achieve relatively accurate positioning. Summary of the invention
[0004] The present disclosure provides a positioning method, an apparatus and a storage medium, which can realize accurate positioning of RIS equipment.
[0005] In order to achieve the above objectives, the present disclosure adopts the following technical solutions:
[0006] On the one hand, an embodiment of the present disclosure provides a positioning method, applied to a first node, comprising: receiving measurement results of multiple measurement units of a second node, the measurement results of the measurement units comprising measurement values of the measurement units for multiple beams to be measured;
[0007] Based on the measurement results of the multiple measurement units, the location information of the second node is determined.
[0008] On the other hand, an embodiment of the present disclosure provides a positioning method, applied to a second node, comprising: determining measurement results of multiple measurement units, the measurement results of the measurement units comprising measurement values of the measurement units for multiple beams to be measured;
[0009] The measurement results of the multiple measurement units are sent to the first node.
[0010] On the other hand, an embodiment of the present disclosure provides a positioning device, including: an acquisition unit and a processing unit;
[0011] A receiving unit, configured to receive measurement results of multiple measurement units of the second node, where the measurement results of the measurement units include measurement values of the measurement units for multiple beams to be measured;
[0012] The processing unit is used to determine the location information of the second node based on the measurement results of the multiple measurement units.
[0013] On the other hand, an embodiment of the present disclosure provides a positioning device, including: an acquisition unit and a sending unit;
[0014] A processing unit, used to determine measurement results of the multiple measurement units, where the measurement results of the measurement units include measurement values of the measurement units on the multiple beams to be measured;
[0015] The sending unit is configured to send the measurement results of the multiple measurement units to the first node.
[0016] On the other hand, an embodiment of the present disclosure provides a communication device, including: a memory and a processor; the memory and the processor are coupled; the memory is used to store a computer program; and the processor implements the positioning method of any of the above embodiments when executing the computer program.
[0017] On the other hand, a computer-readable storage medium is provided, on which computer program instructions are stored. When the computer program instructions are executed by a processor, the positioning method of any of the above embodiments is implemented.
[0018] On the other hand, a computer program product is provided. The computer program product includes computer program instructions. When the computer program instructions are executed by a processor, the positioning method of any of the above embodiments is implemented.
[0019] In the technical solution provided by the present disclosure, the first node can determine the position information of the second node based on the measurement results of multiple measurement units for multiple beams to be measured reported by the second node, thereby achieving accurate positioning of the second node. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] In order to more clearly illustrate the technical solutions in the present disclosure, the following briefly introduces the drawings required to be used in some embodiments of the present disclosure. Obviously, the drawings described below are only drawings of some embodiments of the present disclosure. For ordinary technicians in this field, other drawings can also be obtained based on these drawings. In addition, the drawings described below can be regarded as schematic diagrams, and are not limitations on the actual size of the product involved in the embodiments of the present disclosure, the actual process of the method, the actual timing of the signal, etc.
[0021] Figure 1 A schematic diagram of the architecture of a communication system provided for some embodiments of the present disclosure;
[0022] Figure 2 A schematic diagram of the architecture of a RIS device provided for some embodiments of the present disclosure;
[0023] Figure 3A flowchart of a positioning method provided in some embodiments of the present disclosure;
[0024] Figure 4 A schematic diagram of an antenna panel provided for some embodiments of the present disclosure;
[0025] Figure 5 A schematic diagram of a flow chart of another positioning method provided in some embodiments of the present disclosure;
[0026] Figure 6 A schematic diagram of a flow chart of another positioning method provided in some embodiments of the present disclosure;
[0027] Figure 7 A schematic diagram of a flow chart of another positioning method provided in some embodiments of the present disclosure;
[0028] Figure 8 A schematic diagram of the structure of a positioning device provided in some embodiments of the present disclosure;
[0029] Fig. 9 A schematic structural diagram of another positioning device provided in some embodiments of the present disclosure;
[0030] Fig.10 A schematic structural diagram of another positioning device provided for some embodiments of the present disclosure. DETAILED DESCRIPTION
[0031] The following will be combined with the accompanying drawings to clearly and completely describe the technical solutions in some embodiments of the present disclosure. Obviously, the described embodiments are only part of the embodiments of the present disclosure, rather than all the embodiments. Based on the embodiments provided by the present disclosure, all other embodiments obtained by ordinary technicians in this field belong to the scope of protection of the present disclosure.
[0032] Unless the context requires otherwise, throughout the specification and claims, the term "comprise" and other forms thereof, such as the third person singular form "comprises" and the present participle form "comprising", are to be interpreted as open, inclusive, that is, "including, but not limited to". In the description of the specification, the terms "one embodiment", "some embodiments", "exemplary embodiments", "example", "specific example" or "some examples" and the like are intended to indicate that specific features, structures, materials or characteristics associated with the embodiment or example are included in at least one embodiment or example of the present disclosure. The schematic representation of the above terms does not necessarily refer to the same embodiment or example. In addition, the specific features, structures, materials or characteristics may be included in any one or more embodiments or examples in any appropriate manner.
[0033] In the following, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the embodiments of the present disclosure, unless otherwise specified, "plurality" means two or more.
[0034] “At least one of A, B, and C” has the same meaning as “at least one of A, B, or C” and both include the following combinations of A, B, and C: A only, B only, C only, the combination of A and B, the combination of A and C, the combination of B and C, and the combination of A, B, and C.
[0035] “A and / or B” includes the following three combinations: A only, B only, and a combination of A and B.
[0036] The use of "adapted to" or "configured to" herein is meant to be open and inclusive language that does not exclude devices adapted or configured to perform additional tasks or steps.
[0037] Additionally, the use of “based on” is meant to be open and inclusive, as a process, step, calculation, or other action “based on” one or more stated conditions or values may, in practice, be based on additional conditions or values beyond those stated.
[0038] Reconfigurable intelligent surface (RIS) and smart repeater are important technologies in the current communication field. RIS uses artificial electromagnetic materials with programmable electromagnetic properties to control the electromagnetic environment. Specifically, RIS controls the outgoing beam to focus to the desired direction or point by adjusting the phase of each array to control the electromagnetic environment.
[0039] At present, programmable intelligent metasurface technology is still in the research stage. In practical applications, since the codebook of RIS needs to be designed according to the location information of RIS devices, the positioning technology of RIS devices has always been a key content in its application. The existing RIS positioning technology requires multiple base stations to achieve relatively accurate positioning.
[0040] In view of the problem that RIS equipment cannot be accurately positioned at the current stage, the present disclosure provides a positioning method and device. In the positioning method provided by the present disclosure, a first node sends first configuration information to a second node, instructing the second node to activate corresponding multiple measurement units, and performs reference signal receiving power (RSRP) measurement on multiple beams to be measured to obtain measurement results of multiple measurement units; then, the first node can determine the location information of the second node based on the measurement results of the multiple measurement units for the multiple beams to be measured reported by the second node, thereby realizing accurate positioning of the second node.
[0041] The resource allocation method and device provided by the present disclosure are described in detail below in conjunction with the accompanying drawings. It should be noted that the various embodiments of the present disclosure can refer to each other, for example, the same or similar steps, method embodiments, system embodiments and device embodiments can refer to each other without limitation.
[0042] The technical solution provided by the embodiments of the present disclosure can be applied to various communication systems, for example, a 5G new radio (NR) communication system, a 6G communication system, a future evolution system, or a multi-communication fusion system.
[0043] For example, Figure 1 As shown, Figure 1 The present invention provides a schematic diagram of the architecture of a communication system provided in some embodiments of the present disclosure. The communication system may include: at least one base station 101 and at least one RIS device 102.
[0044] The base station 101 is used to obtain measurement results of multiple measurement units of the RIS device, wherein the measurement results of the measurement units include measurement values of the measurement units for multiple beams to be measured. The base station 101 is also used to determine the location information of the RIS device based on the measurement results of the multiple measurement units.
[0045] The RIS device 102 is used to obtain measurement results of multiple measurement units, where the measurement results of the measurement units include measurement values of the measurement units for multiple beams to be measured. The RIS device 102 is also used to send the measurement results of the multiple measurement units to the first node.
[0046] In some embodiments, the base station 101 may be a device with wireless transceiver functions or a chip or chip system that may be provided in the device. The base station 101 includes but is not limited to: a small base station, a wireless access point, a transceiver point (TRP), a transmission point (TP), a macro base station, a relay base station, and any other access node.
[0047] In some embodiments, the RIS device 102 may be a device using RIS technology or a device using SmartRepeater technology, and may be deployed on land, including indoors or outdoors, handheld or vehicle-mounted. It may also be deployed on water (such as a ship), or in the air (such as an airplane, a balloon, or a satellite).
[0048] It should be noted that Figure 1 This is just an exemplary framework diagram. Figure 1 The number of nodes included in the Figure 1 In addition to the functional nodes shown, the communication system 30 may also include other nodes, such as core network equipment, and the present disclosure does not impose any limitation on this.
[0049] In some embodiments, the architecture of RIS device 102 is as follows: Figure 2 As shown. Figure 2 In the embodiment, the RIS device 102 includes a RIS controller 201 and a RIS panel 202 .
[0050] The RIS controller 201 may be used to receive antenna configuration information sent by the base station, and activate multiple measurement units to perform RSRP measurement according to the received antenna configuration information, and report the measurement results to the base station. The RIS panel 202 is provided with an antenna to receive the reference signal beam transmitted by the base station.
[0051] It should be noted that in the embodiment of the present disclosure, the second node may be implemented as a RIS controller 101, or a device having a RIS controller function, or the second node may have a built-in module having a controller function.
[0052] The application scenarios of the embodiments of the present disclosure are not limited. The system architecture and business scenarios described in the embodiments of the present disclosure are intended to more clearly illustrate the technical solutions of the embodiments of the present disclosure, and do not constitute a limitation on the technical solutions provided by the embodiments of the present disclosure. It is known to those skilled in the art that with the evolution of network architecture and the emergence of new business scenarios, the technical solutions provided by the embodiments of the present disclosure are also applicable to similar technical problems.
[0053] For example, Figure 3 As shown, Figure 3 A flowchart of a positioning method provided according to some embodiments includes the following steps:
[0054] S301: A second node determines measurement results of multiple measurement units.
[0055] The measurement result of the measuring unit includes the measurement values of the measuring unit on the multiple beams to be measured. The measuring unit includes one or more antennas.
[0056] In some embodiments, the second node is a reconfigurable intelligent metasurface, a network-controllable relay device, or an intelligent relay device. For example, the second node can be the RIS device described above. The measurement unit includes one or more antennas, which are located on the RIS panel of the second node.
[0057] It should be noted that the second node may configure multiple measurement units by receiving configuration information sent by the first node. The specific process may be referred to in S501 below, which will not be described in detail in this embodiment.
[0058] In some embodiments, the first node may be the base station described above. The plurality of measurement units are determined by the first node.
[0059] Exemplarily, the first node first obtains the angle information of the antenna panel of the second node and the configuration information of the antenna panel; thereafter, the first node determines the position information of the multiple measurement units according to the angle information of the antenna panel and the configuration information of the antenna panel. The position information of the multiple measurement units may be reflected in the configuration information sent by the first node to the second node, as can be seen in S501 below, which will not be described here.
[0060] Furthermore, in the case where the second node is a RIS device, since the antenna on the panel of the RIS device is a large-scale antenna array, when determining multiple measurement units, multiple or multiple groups of antennas that meet the requirements can be selected at preset intervals in the orthogonal directions of the horizontal and vertical panel orientations as multiple measurement units of the second node.
[0061] In some other embodiments, the plurality of beams to be measured include: an optimal beam, a first horizontal beam, a second horizontal beam, a first vertical beam, and a second vertical beam.
[0062] The optimal beam is the beam corresponding to the largest measurement value among the measurement values of the antenna panel of the second node to the multiple beams of the first node. The first horizontal beam is a beam that is positively offset from the optimal beam in the horizontal direction by a first preset angle. The second horizontal beam is a beam that is negatively offset from the optimal beam in the horizontal direction by a first preset angle. The first vertical beam is a beam that is positively offset from the optimal beam in the vertical direction by a second preset angle. The second vertical beam is a beam that is negatively offset from the optimal beam in the vertical direction by a second preset angle.
[0063] It is understandable that the second node can configure the transmission resources of multiple beams to be measured and configure multiple measurement units to measure the beams to be measured by receiving the configuration information sent by the first node. The specific process can be found in S601 below, which will not be described in detail in this embodiment.
[0064] S302: The second node sends measurement results of multiple measurement units to the first node. Correspondingly, the first node receives the measurement results of multiple measurement units.
[0065] In some embodiments, the second node performs RSRP measurement on the multiple beams to be measured based on the multiple measurement units, and determines the RSRP measurement results of the multiple beams to be measured as the measurement results of the multiple measurement units, and sends them to the first node.
[0066] It should be noted that when the second node performs RSRP measurement, each measurement unit will independently perform RSRP measurement on multiple beams to be measured. For example, if the number of beams to be measured is a and the number of measurement units is b, the final measurement results of the multiple measurement units are a*b RSRP values.
[0067] In some embodiments, the second node integrates the measurement results of the multiple measurement units into a data packet and reports it through a physical uplink shared channel (PUSCH). The PUSCH is indicated by a downlink control information (DCI) message sent by the first node.
[0068] S303: The first node determines location information of the second node based on measurement results of multiple measurement units.
[0069] In some embodiments, the location information of the second node includes at least one of the following: the horizontal angle of the second node relative to the first node, the vertical angle of the second node relative to the first node, the horizontal distance of the second node relative to the first node, and the vertical distance of the second node relative to the first node.
[0070] Exemplarily, in combination with the example in S301 above, when the multiple beams to be measured include: an optimal beam, a first horizontal beam, a second horizontal beam, a first vertical beam, and a second vertical beam, the calculation method of the four items of data included in the position information of the second node is described:
[0071] (1) Calculation of the horizontal angle of the second node relative to the first node.
[0072] a) The first node determines the offset direction of the horizontal angle according to the magnitude relationship between the measurement value of the first horizontal beam and the measurement value of the second horizontal beam.
[0073] The offset direction includes positive offset and negative offset. The positive offset and negative offset are determined as follows:
[0074] In response to the measurement value of the first horizontal beam being greater than or equal to the measurement value of the second horizontal beam, determining that the offset direction of the horizontal angle is a positive offset; or,
[0075] In response to the measurement value of the first horizontal beam being less than the measurement value of the second horizontal beam, it is determined that the offset angle in the horizontal direction is a negative offset.
[0076] b) The first node determines a first measurement value according to the offset direction of the horizontal angle.
[0077] The first measurement value is the maximum value between the measurement value of the first horizontal beam and the measurement value of the second horizontal beam.
[0078] That is, when the offset direction of the horizontal angle is a positive offset, the measurement value of the first horizontal beam is determined as the first measurement value; when the offset direction of the horizontal angle is a negative offset, the measurement value of the second horizontal beam is determined as the first measurement value.
[0079] c) The first node determines the angle value of the horizontal angle according to the difference between the first measurement value and the measurement value of the optimal beam.
[0080] The process of determining the angle value of the horizontal angle is as follows:
[0081] In response to the measurement value of the first horizontal beam being greater than or equal to the measurement value of the second horizontal beam, the angle value of the horizontal angle is determined based on the difference between the measurement value of the first horizontal beam and the measurement value of the optimal beam and a first preset correspondence relationship. The first preset correspondence relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the first horizontal beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values. Or,
[0082] In response to the measurement value of the first horizontal beam being less than the measurement value of the second horizontal beam, the angle value of the horizontal angle is determined based on the difference between the measurement value of the second horizontal beam and the measurement value of the optimal beam and a second preset correspondence relationship, wherein the second preset correspondence relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the second horizontal beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values.
[0083] For example, for ease of understanding, the calculation of the horizontal angle is explained in combination with specific values: beam#0, beam#1, and beam#2 represent the optimal beam, the first horizontal beam, and the second horizontal beam, respectively, and the center angle of beam#0 is θ. The first node obtains the theoretical beam#0, beam#1, and beam#2 in [θ±α 0° ] are respectively recorded as RSRP#0_theroy[t], RSRP#1_theroy[t], RSRP#2_theroy[t], where t represents the angle.
[0084] After this, the first node in [θ-α 0° ,θ+α 0° ] angle range, calculate the RSRP difference at every 0.1 degree, where [θ,θ+α 0° ] only calculates the difference between RSRP#0_t and RSRP#1_t, [θ-α 0° , θ], only the difference between RSRP#0_t and RSRP#2_t is calculated to obtain the RSRP difference table for each angle. It should be understood that after receiving the measurement results of multiple measurement units sent by the second node, the first node can only select the RSRP#1 and RSRP#2 measurement results of one antenna in the measurement unit for calculation, or use the RSRP of multiple antennas in the measurement unit to calculate multiple angle offset results respectively, and finally take the average value.
[0085] Furthermore, the first node determines the horizontal angle of the second node relative to the first node based on the measurement results of the multiple measurement units sent by the second node: if the measured RSRP#1>RSRP#2, the offset direction is determined to be a positive offset, and the angle range is [θ,θ+α 0°, calculate the difference between RSRP#0 and RSRP#1; if the measured RSRP#1 < RSRP#2, determine that the offset direction is negative offset, and the angle range is [θ - α 0° , θ], calculate the difference between RSRP#0 and RSRP#2.
[0086] Finally, the first node queries the RSRP difference table to obtain the horizontal angle of the second node relative to the first node.
[0087] (2) Calculation of the vertical angle of the second node relative to the first node.
[0088] d) The first node determines the offset direction of the vertical angle according to the magnitude relationship between the measurement value of the first vertical beam and the measurement value of the second vertical beam;
[0089] Among them, the offset direction includes positive offset and negative offset, and the judgment of positive offset and negative offset is as follows:
[0090] In response to the measurement value of the first vertical beam being greater than or equal to the measurement value of the second vertical beam, determine that the offset direction of the vertical angle is positive offset; or,
[0091] In response to the measurement value of the first vertical beam being less than the measurement value of the second vertical beam, determine that the offset angle of the vertical direction is negative offset.
[0092] e) The first node determines the second measurement value according to the offset direction of the vertical angle.
[0093] Among them, the second measurement value is the maximum value of the measurement value of the first vertical beam and the measurement value of the second vertical beam.
[0094] That is, when the offset direction of the vertical angle is positive offset, the measurement value of the first vertical beam is determined as the second measurement value; when the offset direction of the vertical angle is negative offset, the measurement value of the second vertical beam is determined as the second measurement value.
[0095] f) The first node determines the angle value of the vertical angle according to the difference between the second measurement value and the measurement value of the optimal beam.
[0096] The process of determining the angle value of the vertical angle is as follows:
[0097] In response to the measurement value of the first vertical beam being greater than or equal to the measurement value of the second vertical beam, based on the difference between the measurement value of the first vertical beam and the measurement value of the optimal beam and the third preset correspondence, determine the angle value of the vertical angle. Among them, the third preset correspondence includes multiple angle values, and the difference between the theoretical measurement value of the first vertical beam corresponding to each of the multiple angle values and the theoretical measurement value of the optimal beam. Or,
[0098] In response to the measurement value of the first vertical beam being less than the measurement value of the second vertical beam, the angle value of the vertical angle is determined based on the difference between the measurement value of the second vertical beam and the measurement value of the optimal beam and a fourth preset corresponding relationship, wherein the fourth preset corresponding relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the second vertical beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values.
[0099] It should be understood that the calculation principle of the vertical angle of the second node relative to the first node is the same as the horizontal angle calculation, and the calculation of the vertical angle will not be described here with examples combined with specific data.
[0100] (3) Calculation of the horizontal distance of the second node relative to the first node.
[0101] g) The first node determines a horizontal angle formed between the first node and the first test unit and the second test unit according to the test result of the first test unit and the test result of the second test unit.
[0102] The first test unit and the second test unit are parallel in a horizontal direction.
[0103] The measurement results of the first test unit and the second test unit in beam#0 are recorded as RSRP#0_antenna_0 and RSRP#0_antenna_1 respectively. According to the energy of each angle of beam#0 in its coverage area, the angle difference between RSRP#0_antenna_0 and RSRP#0_antenna_1 is calculated and recorded as γ0.
[0104] It should be understood that, in the case where there are multiple beams to be measured that differ only in horizontal angles, the horizontal angles of these beams to be measured can also be calculated. For example, the horizontal angles of beam#1 and beam#2 can be recorded as γ1 and γ2, and γ0, the average of γ1 and γ2 are calculated as the final angle γ. In the case where there are no multiple beams to be measured that differ only in horizontal angles, only γ0 is used as the final angle γ.
[0105] h) The first node determines the horizontal distance according to the horizontal angle and the horizontal spacing between the first test unit and the second test unit.
[0106] It should be understood that the horizontal spacing between the first test unit and the second test unit is the distance d between the two test units on the antenna panel of the second node.
[0107] For example, Figure 4 A schematic diagram of an antenna panel of a second node provided for some embodiments of the present disclosure. Figure 4The geometric relationship between γ and d is shown, from which the horizontal distance of the second node relative to the first node can be calculated based on trigonometric functions.
[0108] (4) Calculation of the vertical distance of the second node relative to the first node.
[0109] i) The first node determines a vertical angle formed between the third node and the third test unit and the fourth test unit according to a test result of the third test unit and a test result of the fourth test unit.
[0110] The third test unit and the fourth test unit are parallel in a vertical direction.
[0111] j) The first node determines the vertical distance according to the vertical angle and the vertical spacing between the third test unit and the fourth test unit.
[0112] It should be understood that the calculation principle of the vertical distance of the second node relative to the first node is the same as the horizontal distance calculation, and the calculation of the vertical angle will not be described in detail here in conjunction with specific illustrations.
[0113] In combination with the example in S301 above, when the multiple beams to be measured include the optimal beam, the first horizontal beam, the second horizontal beam, the first vertical beam and the second vertical beam, the calculation process of the position information of the second node is introduced.
[0114] Based on the above technical solution, when positioning the RIS device, the base station can determine the location information of the RIS device based on the measurement results of multiple measurement units for multiple beams to be measured reported by the RIS device, thereby achieving accurate positioning of the RIS device.
[0115] For example, in combination Figure 3 ,like Figure 5 As shown, Figure 5 A flowchart of another positioning method provided in some embodiments of the present disclosure. The positioning method provided in the present disclosure also includes the following steps:
[0116] S501: A first node sends first configuration information to a second node. Correspondingly, the second node receives the first configuration information.
[0117] The first configuration information is used to configure multiple measurement units.
[0118] In some embodiments, the first configuration information includes a plurality of measurement unit configuration information, and the measurement unit configuration information is used to configure the position of an antenna included in a measurement unit on the antenna panel of the second node.
[0119] Exemplarily, the measurement unit configuration information includes an identifier of the measurement unit, a first bitmap, and a second bitmap; wherein the first bitmap is used to indicate a row identifier of an antenna included in the measurement unit on an antenna panel; and the second bitmap is used to indicate a column identifier of an antenna included in the measurement unit on an antenna panel. Exemplarily, the measurement unit configuration information may include an AntennaPattern field, which includes an identifier of the measurement unit, a first bitmap, and a second bitmap. For details, see the example description of the first configuration information below.
[0120] In some embodiments, the first configuration information also includes at least one of the following: an identifier of an activated measurement unit, an identifier of a deactivated measurement unit, and a maximum number of measurement units. An activated measurement unit is an antenna or antenna group that participates in RSRP measurement of multiple beams to be measured, and a deactivated measurement unit is an antenna or antenna group that does not participate in RSRP measurement of multiple beams to be measured.
[0121] In a possible implementation manner, the first configuration information may be carried in RRC signaling between the first node and the second node, and the specific content is as follows:
[0122]
[0123] Among them, measActiveAntennaToAddModList: represents the set of activated antenna patterns configured by the base station in the RIS panel. The elements in the queue are AntennaPattern, that is, the measurement unit. The number of elements in the queue represents the number of antenna patterns in the activated panel.
[0124] And, measActiveAntennaToReleaseList: represents the set of deactivated antenna patternIds configured by the base station in the RIS panel. The elements in the queue are Antenna PatternIds, and the queue can deactivate Antenna Pattern by indicating the index value.
[0125] And, AntennaPattern: It consists of three items: its corresponding index Id: AntennaPatternId (that is, the identifier of the measurement unit), column bitmap indication: colunmsBitmap (that is, the first bitmap), and row bitmap indication: rowBitmap (that is, the second bitmap). By configuring the column bitmap and the row bitmap, one or more antennas in a panel composed of m*n antennas can be indicated. If an antenna is activated, it means that only this antenna will be used in subsequent measurements. If a group of antennas is activated, it means that this group of antennas will be used in subsequent measurements. It should be pointed out that in measActiveAntennaToAddModList, multiple patterns need to limit the number of antennas indicated to be the same, but the specific positions can be different.
[0126] And, maxNrofmeasActiveAntenna: indicates the maximum number of antenna patterns that can be configured in measActiveAntennaToAddModList, the maximum number is 1, and the specific value can be configured according to the actual situation;
[0127] It should be understood that m represents the number of columns in the antennas of the RIS panel and n represents the number of rows in the antennas of the RIS panel.
[0128] Based on the above technical solution, in the embodiment of the present disclosure, after receiving the first configuration information sent by the first node, the second node can activate the corresponding multiple measurement units to facilitate the subsequent RSRP measurement of multiple beams to be measured to obtain the measurement results of multiple measurement units.
[0129] For example, in combination Figure 3 ,like Figure 6 As shown, Figure 6 A flowchart of another positioning method provided in some embodiments of the present disclosure. The positioning method provided in the present disclosure also includes the following steps:
[0130] S601: A first node sends second configuration information to a second node. Correspondingly, the second node receives the second configuration information.
[0131] The second configuration information is used to configure transmission resources of multiple beams to be tested.
[0132] In some embodiments, the multiple beams to be measured corresponding to the second configuration information may be a group of scanning beams. After receiving the second configuration information, the second node reports the scanning result for the scanning beam. The first node determines the beam corresponding to the largest RSRP measurement value among the RSRP measurement values of the multiple beams included in the scanning result as the optimal beam based on the scanning result reported by the second node.
[0133] It should be noted that, in this step, the second node adopts a normal antenna configuration to receive the scanning beam according to the second configuration information.
[0134] In other embodiments, after the first node determines the optimal beam by sending the second configuration information to the second node, it determines the number of beams to be measured and the offset angle of each beam to be measured relative to the optimal beam according to the center angle and beam width of the optimal beam.
[0135] Exemplarily, the first node configures a preset number n of channel state information reference signals (CSI-RS), where the n symbols use different beams to be measured. For example, when n is 5, the offset angle of the beam used by each symbol is as follows:
[0136] 1) The CSI-RS beam of the first symbol is the optimal beam, denoted as beam#0;
[0137] 2) The CSI-RS beam of the second symbol is offset horizontally from the optimal beam The beam is denoted as beam#1;
[0138] 3) The CSI-RS beam of the third symbol is offset horizontally from the optimal beam The beam is denoted as beam#2;
[0139] 4) The CSI-RS beam of the 4th symbol is offset vertically from the optimal beam The beam is denoted as beam#3;
[0140] 5) The CSI-RS beam of the 5th symbol is offset vertically from the optimal beam The beam is denoted as beam#4.
[0141] in, The size of is determined by half the horizontal coverage angle of beam#0. The size of is determined by half the vertical coverage angle of beam#0.
[0142] It should be understood that when the value of n is less than 5, beams offset by preset angles in the horizontal and vertical directions can be flexibly combined. For example, when the value of n is 3, the optimal beam, a beam offset in the horizontal direction, and a beam offset in the vertical direction can be selected. At this time, for the accuracy of the final positioning, the position information of the second node can be calculated multiple times. For another example, when the value of n is greater than 5, more beams with different offset angles are selected in the horizontal or vertical direction.
[0143] Based on the above technical solution, in the embodiment of the present disclosure, the first node determines multiple beams to be measured by sending second configuration information to the second node, and sends down n consecutive symbols within a unit time slot, so that the second node can subsequently perform RSRP measurement on the multiple beams to be measured.
[0144] For example, in combination Figure 3 ,like Figure 7 As shown, Figure 7 A flowchart of another positioning method provided in some embodiments of the present disclosure. The positioning method provided in the present disclosure also includes the following steps:
[0145] S701: A first node sends third configuration information to a second node. Correspondingly, the second node receives the third configuration information.
[0146] The third configuration information is used to configure the second node to perform the measurement of the beam to be measured with multiple measurement units. Exemplarily, the third configuration information can be implemented as a DCI message, or by adding a new field in the DCI message.
[0147] Exemplarily, a new field Active antenna pattern indicator-1 bit is added to the DCI message. When the field is set to 0, it indicates that the measurement unit indicated by the first configuration information is not used to perform RSRP measurement. When the field is set to 1, it indicates that the measurement unit indicated by the first configuration information is used to perform RSRP measurement, and the measurement results of multiple measurement units are sent to the first node.
[0148] Based on the above technical solution, in the embodiment of the present disclosure, after the first node determines multiple beams to be measured by sending second configuration information to the second node, the first node will send third configuration information to the second node, instructing the second node to use multiple measurement units to perform RSRP measurement on the multiple beams to be measured according to the first configuration information, and report the measurement results of the multiple measurement units.
[0149] The embodiments of the present disclosure can divide the functional modules or functional units of the positioning device generated by the above method example. For example, each functional module or functional unit can be divided according to each function, or two or more functions can be integrated into one processing module. The above integrated module can be implemented in the form of hardware or in the form of software functional modules or functional units. Among them, the division of modules or units in the embodiments of the present disclosure is schematic, which is only a logical functional division, and there may be other division methods in actual implementation.
[0150] For example, Figure 8FIG. 8 is a schematic diagram of a possible structure of a positioning device provided in some embodiments of the present disclosure. The positioning device 800 includes: a receiving unit 801 , a processing unit 802 and a sending unit 803 .
[0151] The receiving unit 801 is used to obtain measurement results of multiple measurement units of the second node, and the measurement results of the measurement units include measurement values of the measurement units on multiple beams to be measured.
[0152] The processing unit 802 is configured to determine the location information of the second node based on the measurement results of the multiple measurement units.
[0153] In some embodiments, the sending unit 803 is used to send first configuration information to the second node, where the first configuration information is used to configure multiple measurement units.
[0154] In some embodiments, the sending unit 803 is further used to send second configuration information to the second node, where the second configuration information is used to configure transmission resources of multiple beams to be measured.
[0155] In some embodiments, the sending unit 803 is further used to send third configuration information to the second node, where the third configuration information is used to configure the second node to perform measurement of the beam to be measured using multiple measurement units.
[0156] In some embodiments, the receiving unit 801 is further used to obtain angle information of the antenna panel of the second node and configuration information of the antenna panel.
[0157] In some embodiments, the processing unit 802 is further configured to determine a plurality of measurement units according to angle information of the antenna panel and configuration information of the antenna panel.
[0158] In some embodiments, the processing unit 802 is further configured to determine the offset direction of the horizontal angle according to a magnitude relationship between a measurement value of the first horizontal beam and a measurement value of the second horizontal beam.
[0159] In some embodiments, the processing unit 802 is further used to determine the angle value of the horizontal angle according to the difference between the first measurement value and the measurement value of the optimal beam, and the first measurement value is the maximum value between the measurement value of the first horizontal beam and the measurement value of the second horizontal beam.
[0160] In some embodiments, the processing unit 802 is further configured to determine that the offset direction of the horizontal angle is a positive offset when the measurement value of the first horizontal beam is greater than or equal to the measurement value of the second horizontal beam.
[0161] In some embodiments, the processing unit 802 is further configured to determine that the horizontal offset angle is a negative offset when the measurement value of the first horizontal beam is less than the measurement value of the second horizontal beam.
[0162] In some embodiments, the processing unit 802 is further configured to determine the angle value of the horizontal angle based on the difference between the measurement value of the first horizontal beam and the measurement value of the optimal beam and a first preset corresponding relationship when the measurement value of the first horizontal beam is greater than or equal to the measurement value of the second horizontal beam. The first preset corresponding relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the first horizontal beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values.
[0163] In some embodiments, the processing unit 802 is further configured to determine the angle value of the horizontal angle based on the difference between the measurement value of the second horizontal beam and the measurement value of the optimal beam and the second preset corresponding relationship when the measurement value of the first horizontal beam is less than the measurement value of the second horizontal beam. The second preset corresponding relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the second horizontal beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values.
[0164] In some embodiments, the processing unit 802 is further configured to determine the offset direction of the vertical angle according to a magnitude relationship between a measurement value of the first vertical beam and a measurement value of the second vertical beam.
[0165] In some embodiments, the processing unit 802 is further used to determine the angle value of the vertical angle according to the difference between the second measurement value and the measurement value of the optimal beam, and the second measurement value is the maximum value between the measurement value of the first vertical beam and the measurement value of the second vertical beam.
[0166] In some embodiments, the processing unit 802 is further configured to determine that the offset direction of the vertical angle is a positive offset when the measurement value of the first vertical beam is greater than or equal to the measurement value of the second vertical beam.
[0167] In some embodiments, the processing unit 802 is further configured to determine that the vertical offset angle is a negative offset when the measurement value of the first vertical beam is less than the measurement value of the second vertical beam.
[0168] In some embodiments, the processing unit 802 is further configured to determine the angle value of the vertical angle based on the difference between the measurement value of the first vertical beam and the measurement value of the optimal beam and a third preset corresponding relationship when the measurement value of the first vertical beam is greater than or equal to the measurement value of the second vertical beam. The third preset corresponding relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the first vertical beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values.
[0169] In some embodiments, the processing unit 802 is further configured to determine the angle value of the vertical angle based on the difference between the measurement value of the second vertical beam and the measurement value of the optimal beam and a fourth preset corresponding relationship when the measurement value of the first vertical beam is less than the measurement value of the second vertical beam. The fourth preset corresponding relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the second vertical beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values.
[0170] In some embodiments, the processing unit 802 is further configured to determine a horizontal angle formed between the first node and the first test unit and the second test unit according to a test result of the first test unit and a test result of the second test unit.
[0171] In some embodiments, the processing unit 802 is further configured to determine the horizontal distance according to the horizontal angle and the horizontal spacing between the first test unit and the second test unit.
[0172] In some embodiments, the processing unit 802 is further configured to determine a vertical angle formed between the third node and the third test unit and the fourth test unit according to a test result of the third test unit and a test result of the fourth test unit.
[0173] In some embodiments, the processing unit 802 is further configured to determine the vertical distance according to the vertical angle and the vertical spacing between the third test unit and the fourth test unit.
[0174] In some embodiments, the positioning device 800 may further include a storage unit ( Figure 8 The storage unit stores a program or instruction. When the receiving unit 801, the processing unit 802 and the sending unit 803 execute the program or instruction, the positioning device can execute the positioning method described in the above method embodiment.
[0175] also, Figure 8 The technical effects of the positioning device can refer to the technical effects of the positioning method described in the above embodiment, and will not be repeated here.
[0176] For example, Fig. 9 FIG. 9 is a schematic diagram of a possible structure of another positioning device provided in some embodiments of the present disclosure. The positioning device 900 includes: a processing unit 901 , a sending unit 902 , and a receiving unit 903 .
[0177] The processing unit 901 is used to determine the measurement results of multiple measurement units, and the measurement results of the measurement units include the measurement values of the measurement units on the multiple beams to be measured.
[0178] The sending unit 902 is configured to send measurement results of multiple measurement units to the first node.
[0179] In some embodiments, the receiving unit 903 is used to receive first configuration information sent by the first node, where the first configuration information is used to configure multiple measurement units.
[0180] In some embodiments, the receiving unit 903 is further used to receive second configuration information sent by the first node, where the second configuration information is used to configure transmission resources of multiple beams to be measured.
[0181] In some embodiments, the receiving unit 903 is further used to receive third configuration information sent by the first node, where the third configuration information is used to configure the second node to perform measurement of the beam to be measured using multiple measurement units.
[0182] In some embodiments, the positioning device 900 may further include a storage unit ( Fig. 9 The storage unit stores a program or instruction. When the processing unit 901, the sending unit 902 and the receiving unit 903 execute the program or instruction, the positioning device can execute the positioning method described in the above method embodiment.
[0183] also, Fig. 9 The technical effects of the positioning device can refer to the technical effects of the positioning method described in the above embodiment, and will not be repeated here.
[0184] For example, Fig.10 FIG. 2 is another possible structural diagram of the positioning device involved in the above embodiment. Fig.10 As shown, the positioning device 1000 includes: a processor 1002 .
[0185] Among them, the processor 1002 is used to control and manage the actions of the positioning device, for example, to execute the steps performed by the above-mentioned receiving unit 801, processing unit 802, sending unit 803, processing unit 901, sending unit 902 and receiving unit 903, and / or to execute other processes of the technical solution described in this document.
[0186] The processor 1002 may be a processor that implements or executes various exemplary logic blocks, modules, and circuits described in conjunction with the present disclosure. The processor may be a central processing unit, a general-purpose processor, a digital signal processor, an application-specific integrated circuit, a field programmable gate array, or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. It may implement or execute various exemplary logic blocks, modules, and circuits described in conjunction with the present disclosure. The processor may also be a combination that implements computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, and the like.
[0187] In some embodiments, the positioning device 1000 may further include a communication interface 1003, a memory 1001 and a bus 1004. The communication interface 1003 is used to support the communication between the positioning device 1000 and other network entities. The memory 1001 is used to store program codes and data of the positioning device.
[0188] Among them, the memory 1001 can be a memory in the positioning device, which can include a volatile memory, such as a random access memory; the memory can also include a non-volatile memory, such as a read-only memory, a flash memory, a hard disk or a solid-state drive; the memory can also include a combination of the above types of memory.
[0189] The bus 1004 may be an Extended Industry Standard Architecture (EISA) bus, etc. The bus 1004 may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Fig.10 Only one thick line is used in the diagram, but this does not mean that there is only one bus or only one type of bus.
[0190] Through the description of the above implementation methods, those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above functional modules is used as an example. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. The specific working process of the system, device and module described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.
[0191] The embodiment of the present disclosure provides a computer program product including instructions. When the computer program product is run on an electronic device of the present disclosure, the computer is enabled to execute the positioning method described in the above method embodiment.
[0192] The embodiment of the present disclosure further provides a computer-readable storage medium, in which instructions are stored. When a computer executes the instructions, the electronic device of the present disclosure executes each step executed by the positioning device in the method flow shown in the above method embodiment.
[0193] Among them, the computer-readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination of the above. More specific examples of computer-readable storage media (a non-exhaustive list) include: an electrical connection with one or more wires, a portable computer disk, and a hard disk. Random Access Memory (RAM), Read-Only Memory (ROM), Erasable Programmable Read Only Memory (EPROM), registers, hard disks, optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any other form of computer-readable storage medium in a suitable combination of the above, or numerical values in the art. An exemplary storage medium is coupled to a processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an Application Specific Integrated Circuit (ASIC). In the embodiments of the present disclosure, computer-readable storage media may be any tangible media that contains or stores a program that may be used by or in conjunction with an instruction execution system, apparatus, or device.
[0194] The above is only a specific implementation of the present disclosure, but the protection scope of the present disclosure is not limited thereto. Any changes or substitutions within the technical scope disclosed in the present disclosure should be included in the protection scope of the present disclosure. Therefore, the protection scope of the present disclosure should be based on the protection scope of the claims.
Claims
1. A positioning method, characterized in that: Applied to the first node, the method comprises: Receiving measurement results of multiple measurement units of the second node, where the measurement results of the measurement units include measurement values of the measurement units on multiple beams to be measured; Based on the measurement results of the multiple measurement units, the location information of the second node is determined.
2. The method according to claim 1, characterized in that: Each of the measuring units includes one or more antennas.
3. The method according to claim 2, characterized in that The method further comprises: Sending first configuration information to the second node, where the first configuration information is used to configure the multiple measurement units.
4. The method according to claim 3, characterized in that: The first configuration information includes a plurality of measurement unit configuration information, each of which is used to configure the position of an antenna included in a corresponding measurement unit on an antenna panel of the second node.
5. The method according to claim 4, characterized in that The measurement unit configuration information includes an identifier of the measurement unit, a first bit map, and a second bit map; wherein the first bit map is used to indicate the row identifier of the antenna included in the measurement unit on the antenna panel; and the second bit map is used to indicate the column identifier of the antenna included in the measurement unit on the antenna panel.
6. The method according to claim 4, characterized in that The first configuration information further includes at least one of the following: an identifier of an activated measurement unit, an identifier of a deactivated measurement unit, and a maximum number of measurement units.
7. The method according to claim 1, characterized in that The method further comprises: Send second configuration information to the second node, where the second configuration information is used to configure transmission resources of the multiple beams to be measured.
8. The method according to claim 1, characterized in that: The method further comprises: Send third configuration information to the second node, where the third configuration information is used to configure the second node to perform measurement of the beam to be measured using the multiple measurement units.
9. The method according to claim 1, characterized in that: The method further comprises: Acquire angle information of the antenna panel of the second node and configuration information of the antenna panel; The position information of the plurality of measurement units is determined according to the angle information of the antenna panel and the configuration information of the antenna panel.
10. The method according to claim 1, characterized in that The multiple beams to be measured include: an optimal beam, a first horizontal beam, a second horizontal beam, a first vertical beam and a second vertical beam; wherein the optimal beam is the beam corresponding to the largest measurement value among the measurement values of the antenna panel of the second node on the multiple beams of the first node; the first horizontal beam is a beam that is positively offset by a first preset angle in the horizontal direction from the optimal beam; the second horizontal beam is a beam that is negatively offset by the first preset angle in the horizontal direction from the optimal beam; the first vertical beam is a beam that is positively offset by a second preset angle in the vertical direction from the optimal beam; and the second vertical beam is a beam that is negatively offset by the second preset angle in the vertical direction from the optimal beam.
11. The method according to claim 10, characterized in that The location information of the second node includes at least one of the following: a horizontal angle of the second node relative to the first node, a vertical angle of the second node relative to the first node, a horizontal distance of the second node relative to the first node, and a vertical distance of the second node relative to the first node.
12. The method according to claim 11, characterized in that The horizontal angle is determined by: Determining the offset direction of the horizontal angle according to a magnitude relationship between a measurement value of the first horizontal beam and a measurement value of the second horizontal beam; Determine a first measurement value according to the offset direction of the horizontal angle, where the first measurement value is a maximum value between a measurement value of the first horizontal beam and a measurement value of the second horizontal beam; The angle value of the horizontal angle is determined according to the difference between the first measurement value and the measurement value of the optimal beam.
13. The method according to claim 12, characterized in that The determining the offset direction of the horizontal angle according to the magnitude relationship between the measurement value of the first horizontal beam and the measurement value of the second horizontal beam includes: In response to the measurement value of the first horizontal beam being greater than or equal to the measurement value of the second horizontal beam, determining that the offset direction of the horizontal angle is a positive offset; or, In response to the measurement value of the first horizontal beam being smaller than the measurement value of the second horizontal beam, the offset angle in the horizontal direction is determined to be a negative offset.
14. The method according to claim 12, characterized in that The determining the angle value of the horizontal angle according to the difference between the first measurement value and the measurement value of the optimal beam comprises: In response to the measurement value of the first horizontal beam being greater than or equal to the measurement value of the second horizontal beam, the angle value of the horizontal angle is determined based on the difference between the measurement value of the first horizontal beam and the measurement value of the optimal beam and a first preset corresponding relationship; wherein the first preset corresponding relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the first horizontal beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values; or, In response to the measurement value of the first horizontal beam being less than the measurement value of the second horizontal beam, the angle value of the horizontal angle is determined based on the difference between the measurement value of the second horizontal beam and the measurement value of the optimal beam and a second preset correspondence; wherein the second preset correspondence includes multiple angle values, and the difference between the theoretical measurement value of the second horizontal beam and the theoretical measurement value of the optimal beam corresponding to each of the multiple angle values.
15. The method according to claim 11, characterized in that The vertical angle is determined by: Determining the offset direction of the vertical angle according to a magnitude relationship between a measurement value of the first vertical beam and a measurement value of the second vertical beam; Determine a second measurement value according to the offset direction of the vertical angle, where the second measurement value is a maximum value between a measurement value of the first vertical beam and a measurement value of the second vertical beam; The angular value of the vertical angle is determined according to the difference between the second measurement value and the measurement value of the optimal beam.
16. The method according to claim 15, characterized in that The determining the offset direction of the vertical angle according to the magnitude relationship between the measurement value of the first vertical beam and the measurement value of the second vertical beam includes: In response to the measurement value of the first vertical beam being greater than or equal to the measurement value of the second vertical beam, determining that the offset direction of the vertical angle is a positive offset; or, In response to the measurement value of the first vertical beam being less than the measurement value of the second vertical beam, the offset angle in the vertical direction is determined to be a negative offset.
17. The method according to claim 15, characterized in that Determining the angle value of the vertical angle according to the difference between the second measurement value and the measurement value of the optimal beam includes: In response to the measurement value of the first vertical beam being greater than or equal to the measurement value of the second vertical beam, determining the angle value of the vertical angle based on the difference between the measurement value of the first vertical beam and the measurement value of the optimal beam and a third preset corresponding relationship; wherein the third preset corresponding relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the first vertical beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values; or, In response to the measurement value of the first vertical beam being less than the measurement value of the second vertical beam, the angle value of the vertical angle is determined based on the difference between the measurement value of the second vertical beam and the measurement value of the optimal beam and a fourth preset correspondence; wherein the fourth preset correspondence includes multiple angle values, and the difference between the theoretical measurement value of the second vertical beam and the theoretical measurement value of the optimal beam corresponding to each of the multiple angle values.
18. The method according to claim 11, characterized in that The plurality of test units at least include a first test unit and a second test unit that are parallel in a horizontal direction; the horizontal distance is determined by: Determine, according to the test result of the first test unit and the test result of the second test unit, a horizontal angle formed between the first node and the first test unit and the second test unit; The horizontal distance is determined according to the horizontal angle and a horizontal spacing between the first test unit and the second test unit.
19. The method according to claim 11, characterized in that The plurality of test units at least include a third test unit and a fourth test unit parallel in a vertical direction; the vertical distance is determined by: Determine, according to the test result of the third test unit and the test result of the fourth test unit, a vertical angle formed between the third node and the third test unit and the fourth test unit; The vertical distance is determined according to the vertical angle and a vertical interval between the third test unit and the fourth test unit.
20. The method according to claim 1, characterized in that The second node is a reconfigurable intelligent metasurface, a network-controllable relay device or an intelligent relay device.
21. A positioning method, characterized in that: Applied to the second node, the method comprises: Determine measurement results of multiple measurement units, where the measurement results of the measurement units include measurement values of the measurement units on multiple beams to be measured; The measurement results of the multiple measurement units are sent to the first node.
22. The method according to claim 21, characterized in that The measuring unit comprises one or more antennas.
23. The method according to claim 22, characterized in that The method further comprises: First configuration information sent by the first node is received, where the first configuration information is used to configure the multiple measurement units.
24. The method according to claim 23, characterized in that The first configuration information includes a plurality of measurement unit configuration information, and the measurement unit configuration information is used to configure the position of an antenna included in a measurement unit on the antenna panel of the second node.
25. The method according to claim 24, characterized in that The measurement unit configuration information includes an identifier of the measurement unit, a first bit map, and a second bit map; wherein the first bit map is used to indicate the row identifier of the antenna included in the measurement unit on the antenna panel; and the second bit map is used to indicate the column identifier of the antenna included in the measurement unit on the antenna panel.
26. The method according to claim 24, characterized in that The first configuration information further includes at least one of the following: an identifier of an activated measurement unit, an identifier of a deactivated measurement unit, and a maximum number of measurement units.
27. The method according to claim 21, characterized in that The method further comprises: Receive second configuration information sent by the first node, where the second configuration information is used to configure transmission resources of the multiple beams to be tested.
28. The method according to claim 21, characterized in that The method further comprises: Receive third configuration information sent by the first node, where the third configuration information is used to configure the second node to perform measurement of the beam to be measured using the multiple measurement units.
29. A communication device, characterized in that: include: Memory and processor; Memory and processor coupling; The memory is used to store instructions executable by the processor; When the processor executes the instructions, the method according to any one of claims 1 to 20 or the method according to any one of claims 21 to 28 is performed.
30. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and when the computer instructions are executed on a computer, the computer is caused to execute the method according to any one of claims 1 to 20, or the method according to any one of claims 21 to 28.
