Photoelectric simulator characteristic parameter testing device and method

Abstract

The invention belongs to the technical field of photoelectric simulator characteristic parameter testing, and particularly relates to a photoelectric simulator characteristic parameter testing device and method. The laser emission module and the photoelectric detection module are respectively in signal connection with the control computer; the laser coding control system codes laser signals according to a specified coding sequence, and the laser realizes stable output of 980nm laser by adopting a main oscillation power amplification mode; the single electron detector converts a received coding laser signal or a repetition frequency laser signal into an ultra-narrow electric pulse signal, and the laser decoding measurement system processes a pulse current signal of the detector to obtain a voltage signal corresponding to the optical power density. Compared with the prior art, the single-photon detector is adopted, the power density measurement accuracy is improved, and quick response is achieved; a temperature control module is added, so that the environmental adaptability and the measurement stability are improved; the stepping convolution is adopted, the input is compressed into a vector of a potential space, the requirement for computing resources is reduced, and the operation performance is effectively improved.

Description

Technical Field

[0001] The invention belongs to the technical field of photoelectric simulator characteristic parameter testing, and in particular relates to a photoelectric simulator characteristic parameter testing device and method. Background Art

[0002] With the rapid development of optoelectronic technology, optoelectronic simulators have become more and more mature and have reached the level of large-scale output. They have been widely used in training and have achieved remarkable results. After a period of use, optoelectronic simulators have a certain probability of decreased receiving sensitivity and inaccurate indication status. Regular calibration can effectively ensure their efficient and normal use. This type of simulator is used in large quantities, and the best solution is on-site calibration to avoid a lot of time and manpower when returning to the factory for calibration. Therefore, the characteristic parameter calibration technology of optoelectronic simulators has received more and more attention. At present, the calibration test of basic optoelectronic parameters has been solved in China, but there is no mature solution for on-site calibration of characteristic parameters of optoelectronic simulators, which needs to be solved.

[0003] The core of the optoelectronic simulator is the laser transmitter at the transmitting end and the photoelectric detector at the receiving end. The basic working principle is: the coded laser transmitter emits laser that is invisible to the human eye, and the coded laser contains various effective information; after receiving the laser, the photoelectric detector performs intensity inversion and information decoding, and determines the final effect by comparing with the database information.

[0004] The laser transmitter in the optoelectronic simulator system is usually a semiconductor laser. According to the specification requirements, the output wavelength is 980nm±10nm, the pulse width is 2μs~3μs, the modulation frequency is 48kHz±0.15%, and the operating wavelength range of the optoelectronic receiver is 980nm±20nm. Due to the non-uniform design rules of the optoelectronic simulator system, the early products developed by some units operate near the wavelengths of 940nm and 1064nm, which is inconsistent with the specification requirements. The products need to be improved to adapt to the new requirements. The current calibration and testing technology of optoelectronic simulators is not yet complete. Each unit has established an indoor calibration device that meets its own needs, which is mainly used for product delivery and improvement testing. Most of them have not carried out on-site calibration technology research. The optoelectronic simulator system needs to carry out testing and calibration of parameters such as bit error rate, detection sensitivity, and detection power.

[0005] The bit error rate is the symbol error rate, which refers to the proportion of the number of erroneous symbols received by the receiving end to the total number of symbols transmitted. It can also be called the probability that a symbol is transmitted incorrectly in the transmission system. In a communication system, the signal travels from the transmitter to the receiver along the corresponding channel. Some of these channels are analog channels, and some are digital channels. In an analog channel, the transmitter and the receiver usually need a modulator and a demodulator to realize the mutual conversion between digital and analog signals. In the process of signal conversion and transmission, signal changes and attenuation will inevitably occur, causing signal judgment errors and bit errors. In digital channels, bit errors will also occur due to symbol synchronization, inter-symbol crosstalk, etc. Therefore, when transmitting information, the reliability of the communication channel in the communication system has attracted widespread attention. When testing the quality of the communication channel of the data transmission equipment, the bit error rate is a major indicator for evaluating its working performance. The bit error rate directly determines whether the communication channel is available. The bit error rate tester can perform corresponding acceptance and maintenance on optical communication, communication access network and other systems. It sends a sequence generated by itself to the tested channel, and then compares the received data with the local data at the receiving end to obtain the channel's bit error rate. The process includes test sequence generation, bit error comparison and statistics.

[0006] Detection sensitivity is an important indicator of laser detection of photoelectric simulators. Its physical meaning is the minimum light power received by the detector. High sensitivity means that the detection system can distinguish weaker light pulse signals. For example, in a pulse laser ranging system, the echo generated by the detection target will be greatly reduced by atmospheric attenuation, background light interference, and the influence of the detection system's own thermal noise. Therefore, in order to increase the detection distance, in addition to increasing the emission power of the laser, it is also necessary to suppress various types of noise and extract weak light signals from the noise. This requires a design scheme for a high-sensitivity pulse detection system to meet indicators such as detection distance and detection accuracy.

[0007] The existing technical solutions for the detection sensitivity of photoelectric simulators generally adopt the combination of laser attenuation plates with lasers. The optical components of laser detection equipment are mainly composed of forward cutoff filters and field of view light bars. The detection window is generally large, while the actual effective aperture is the diameter of the photosensitive surface of the photodetector, which is generally less than 1mm. Therefore, the stability of the test laser power and the uniformity of energy density distribution for detecting laser detection sensitivity are the main factors that determine the detection accuracy. However, the energy distribution of the main spot of the fundamental mode laser of a general laser is a quasi-Gaussian distribution, the energy of the spot fluctuates greatly randomly, the distribution is uneven, and the energy density distribution fluctuates by about 5 times. The measurement of laser detection sensitivity will produce several times of random deviation, and the minimum sensitivity value cannot be accurately determined quantitatively, and the dynamic range of sensitivity is even more difficult to calibrate. In addition, the test solutions for bit error rate at home and abroad usually use orthogonal modulation to generate jitter signals, but bit error rate test equipment usually has the disadvantages of low channel rate, slow response speed, and single output signal pattern mode. All these factors have a certain impact on the measurement accuracy and response speed of the detection sensitivity and bit error rate of the photoelectric simulator, and accurate measurement results cannot be obtained.

[0008] The existing technical solutions have the following main deficiencies: 1. Low measurement accuracy. The optical components of the laser detection equipment cannot meet the detection requirements, and the laser spot energy fluctuates randomly, resulting in large random deviations in the laser detection sensitivity and inaccurate calculations, which affects the final measurement accuracy. 2. Poor environmental adaptability. The current photoelectric simulator measurement equipment does not have a temperature control module, and the current technical solutions do not have a temperature control design for the detector and laser module, resulting in poor environmental adaptability of the system. 3. The current test solution has a high data redundancy rate, occupies more computing resources, and results in a slow response speed. Summary of the invention

[0009] In order to solve the problems existing in the prior art, the present invention provides a photoelectric simulator characteristic parameter testing device and method.

[0010] The technical solution adopted by the present invention to solve its technical problems is as follows: a photoelectric simulator characteristic parameter testing device, comprising: a laser emission module, a photoelectric detection module and a control computer, the laser emission module and the photoelectric detection module are respectively connected to the control computer signal; the laser emission module comprises: a laser and a laser coding control system, the laser is connected to the laser coding control system, the laser coding control system encodes the laser signal according to a specified coding sequence, and the laser adopts a main oscillation power amplification method to achieve a 980nm laser stable output; the photoelectric detection module comprises: a single electron detector and a laser decoding measurement system, the single electron detector converts the received coded laser signal or repetition rate laser signal into an ultra-narrow electrical pulse signal, and the laser decoding measurement system processes the detector pulse current signal to obtain a voltage signal corresponding to the optical power density.

[0011] Furthermore, the laser emission module also includes: a first optical component, the first optical component is located behind the laser emission end, and the laser couples the seed signal light and pump light with high beam quality into the double-clad optical fiber through the first optical component for amplification, so as to achieve stable output of laser of specific wavelength; the photoelectric detection module also includes: a second optical component, the second optical component is located in front of the receiving end of the single electron detector, and the second optical component converges and transmits the received laser coding signal and laser repetition signal to the single electron detector.

[0012] Furthermore, the first optical component includes: a beam expander and a first aperture, the input end of the beam expander is close to the laser, and the first aperture is located on the output end side of the beam expander; the second optical component includes: an integrating sphere and a second aperture, the light incident port of the integrating sphere is aligned with the light entrance hole of the photoelectric detection module, and the second aperture is located between the integrating sphere and the single electron detector.

[0013] Furthermore, the laser emission module is placed in the first shielding cage, and the photoelectric detection module is placed in the second shielding cage.

[0014] Furthermore, the laser emission module has a built-in first temperature control module, and the photoelectric detection module has a built-in second temperature control module.

[0015] Furthermore, the control computer has a built-in main control program module and a laser coding database, and the main control program module and the laser coding database are signal-connected.

[0016] Furthermore, the control computer is used for system control and data acquisition processing, and strided convolution is used to compress the input into a vector in a latent space.

[0017] The photoelectric simulator characteristic parameter testing method is applied to the above-mentioned photoelectric simulator characteristic parameter testing device, comprising the steps of: S1. Turn on the photoelectric simulator characteristic parameter test device and the device under test to the specified state; S2, adjust the optical axis, and connect the output to the main control computer; S3, collect data and calculate detection power; S4. Calculate detection sensitivity index, which includes but is not limited to power density; S5. Decode the laser code and calculate the bit error rate.

[0018] Compared with the prior art, the present invention has the following beneficial effects: 1. The detector in the present invention adopts a single-photon detector, which improves the accuracy of power density measurement and achieves rapid response compared with traditional test methods; 2. The present invention adds a temperature control module, which can improve environmental adaptability and measurement stability; 3. The present invention does not use the maximum pooling in the traditional convolution method, but uses strided convolution to compress the input into a vector in a latent space, which reduces the demand for computing resources and effectively improves computing performance. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is a diagram of the photoelectric simulator characteristic parameter test device; Figure 2 This is the structural principle diagram of the integrating sphere detector; Figure 3 This is the software framework diagram of the photoelectric simulator characteristic parameter test device; Figure 4 It is a test flow chart; in, 1. Laser emission module, 2. Photoelectric detection module, 3. Control computer, 101. laser, 102. beam expander, 103. first aperture, 104. first shielding cage, 105. first temperature control module, 106. laser coding control system, 201. Integrating sphere, 202. Second aperture, 203. Single electron detector, 204. Second shielding cage, 205. Second temperature control module, 206. Laser decoding measurement system, 301. Main control program module, 302. Laser coding database. DETAILED DESCRIPTION

[0020] In order to facilitate the understanding of the present invention, the present invention is described in more detail below in conjunction with the accompanying drawings and specific embodiments. However, the present invention can be implemented in many different forms and is not limited to the embodiments described in this specification. On the contrary, the purpose of providing these embodiments is to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0021] A photoelectric simulator characteristic parameter testing device comprises: a laser emitting module 1, a photoelectric detection module 2 and a control computer 3, wherein the laser emitting module 1 and the photoelectric detection module 2 are respectively connected to the control computer 3 by signals; the laser emitting module 1 comprises: a laser 101 and a laser coding control system 106, wherein the laser 101 is connected to the laser coding control system 106, the laser coding control system 106 encodes the laser signal according to a prescribed coding sequence, and the laser 101 adopts a main oscillation power amplification mode to realize a 980nm laser stable output; the photoelectric detection module 2 comprises: a single electron detector 203 and a laser decoding measurement system 206, wherein the single electron detector 203 converts a received coded laser signal or a repetition rate laser signal into an ultra-narrow electrical pulse signal, and the laser decoding measurement system 206 processes the detector pulse current signal to obtain a voltage signal corresponding to the optical power density.

[0022] In one embodiment, the laser emission module 1 also includes: a first optical component 107, the first optical component 107 is located behind the emission end of the laser 101, and the laser 101 couples the seed signal light and pump light with high beam quality into the double-clad optical fiber through the first optical component 107 for amplification to achieve stable output of laser of specific wavelength; the photoelectric detection module 2 also includes: a second optical component 207, the second optical component 207 is located in front of the receiving end of the single electron detector 203, and the second optical component 207 converges and transmits the received laser coding signal and laser repetition signal to the single electron detector 203.

[0023] In one embodiment, the first optical component 107 includes: a beam expander 102 and a first aperture 103, the input end of the beam expander 102 is close to the laser 101, and the first aperture 103 is located on the output end side of the beam expander 102; the second optical component 207 includes: an integrating sphere 201 and a second aperture 202, the light incident port of the integrating sphere 201 is aligned with the light incident hole of the photoelectric detection module 2, and the second aperture 202 is located between the integrating sphere 201 and the single electron detector 203, Figure 1 and Figure 2 understand.

[0024] In one embodiment, the laser emission module 1 is placed in a first shielding cage 104, and the photoelectric detection module 2 is placed in a second shielding cage 204. The shielding cage is mainly used to shield environmental radiation interference.

[0025] In one embodiment, the laser emission module 1 has a built-in first temperature control module 105 , and the photoelectric detection module 2 has a built-in second temperature control module 205 .

[0026] In one embodiment, the control computer 3 has a built-in main control program module 301 and a laser coding database 302 , and the main control program module 301 and the laser coding database 302 are connected by signals.

[0027] In one embodiment, the control computer 3 is used for system control and data acquisition processing, and uses strided convolution to compress the input into a vector in a latent space.

[0028] The photoelectric simulator characteristic parameter testing method is applied to the above-mentioned photoelectric simulator characteristic parameter testing device, comprising the steps of: S1. Turn on the photoelectric simulator characteristic parameter test device and the device under test to the specified state; S2, adjust the optical axis, and connect the output to the main control computer; S3, collect data and calculate detection power; S4. Calculate detection sensitivity index, which includes but is not limited to power density; S5. Decode the laser code and calculate the bit error rate.

[0029] Embodiment 1: In response to the calibration requirements of the characteristic parameters of the photoelectric simulator, research on the on-site calibration technology of parameters such as detection power, detection sensitivity, and coding frequency is carried out, and a laser coding and decoding calibration component is developed. The transmitting channel of the calibration component can output a laser signal with a coding sequence specified in the specification to realize the calibration of the laser decoding characteristic parameters of the receiving end of the photoelectric simulator; the receiving channel of the calibration component can realize the calibration of the characteristic parameters such as the coding sequence, frequency, and pulse width of the laser signal emitted by the photoelectric simulator. A photoelectric detector calibration component is developed, which can realize the calibration of laser power density, and the calibration of the power density and sensitivity of the photoelectric detector is realized by using the photoelectric detector and the standard aperture solution.

[0030] A photoelectric simulator characteristic parameter testing device is mainly composed of a laser emission module 1, a photoelectric detection module 2 and a main control program module 301, including a laser 101, a single electron detector 203, a first optical component 107, a second optical component 207 and a control computer 3 and other devices, such as Figure 1 shown.

[0031] The laser emitting module 1 includes: a laser 101 , a laser encoding control system 106 and a first optical component 107 .

[0032] Laser 101 adopts a master oscillator power amplification method, that is, the seed signal light and pump light with high beam quality are coupled into the double-clad optical fiber for amplification in a certain way, thereby achieving high-power amplification of the seed light source and realizing stable output of 980nm laser.

[0033] The first optical component 107 located behind the laser 101 mainly includes a beam expander 102 and a first aperture 103, which adjust the spot size of the laser output to match the detection module at the rear end.

[0034] The laser coding control system 106 encodes the laser signal according to the coding sequence specified by the specification.

[0035] The photoelectric detection module 2 includes: a single electron detector 203 , a laser decoding measurement system 206 and a second optical component 207 .

[0036] The single electron detector 203 mainly converts the received coded laser signal or repetitive laser signal into an ultra-narrow electrical pulse signal. The responsivity of the photoelectric detector based on Si material at a wavelength of 980nm is in the optimal response range of the detector, meeting the requirements of laser coding and decoding detection.

[0037] The second optical component 207 located in front of the single electron detector 203 is mainly used to receive the laser coding signal and the laser repetition rate signal, and converge and transmit the signals to the single electron detector 203, including the integrating sphere 201 and the second aperture 202.

[0038] The laser decoding measurement system 206 realizes the integration processing of the detector pulse current signal to obtain the voltage signal corresponding to the optical power density; the signal processing circuit realizes the collection and processing of the voltage signal, and sends it to the computer through the output port to realize the reading and display of the measurement data. The incident laser signal passes through the standard aperture hole of the second aperture 202 to reach the integrating sphere 201 detector, and the uniform light attenuation characteristics of the integrating sphere 201 are used to realize the measurement of laser high power density; the photoelectric conversion circuit realizes the integration processing of the detector pulse current signal to obtain the voltage signal corresponding to the optical power density; the signal processing circuit realizes the collection and processing of the voltage signal, and sends it to the computer through the output port to realize the reading and display of the measurement data. After experimental verification, the power density measurement range can reach 2×10 -8 W / mm 2 ~0.5W / mm 2 , laser encoding and decoding measurement range: 1Hz~100kHz.

[0039] The control computer 3 is used for system control and data acquisition processing. The software framework is as follows Figure 3 As shown. By using strided convolution, the input is compressed into a vector in a latent space, which reduces the demand for computing resources and effectively improves computing performance. Comparing the amount of data processed, the target data volume is 324900, that is, 570×570, and the number of valid data is 84300, accounting for only 26% of the total data volume. After strided convolution processing, the total data volume is 1092, that is, 28×39, and the number of valid data is 878, accounting for 80% of the total. The compression rate of redundant data by strided convolution is three times that of the traditional method, which is conducive to reducing data processing bandwidth and thus improving processing efficiency.

[0040] The first temperature control module 105 can provide a stable temperature range for the laser 101. When the temperature drifts, the temperature of the laser 101 is adjusted through TEC to ensure that the laser 101 can work normally at different temperatures. When the power of the laser 101 changes, the change of the laser 101 is monitored, and the power of the laser 101 is output stably through current adjustment, thereby improving the measurement stability and accuracy of the system. Similarly, the second temperature control module 205 improves the working stability and accuracy of the single electron detector 203.

[0041] Photoelectric simulator characteristic parameter test method, combined with Figure 3-4 Understanding, applied to the above-mentioned photoelectric simulator characteristic parameter testing device, includes the steps of: S1. Start the test; S2. Turn on the equipment and adjust it to a specified state. The equipment includes a photoelectric simulator characteristic parameter test device and a photoelectric simulator to be tested; S3, adjust the optical axis, and connect the output to the main control computer. After adjustment, the laser emitting module 1, the photoelectric detection module 2, the laser emitter and the photoelectric detector of the photoelectric simulator have a common optical axis. At the same time, the laser 101, the beam expander 102, the first aperture 103, the single electron detector 203, the integrating sphere 201 and the second aperture 202 are all on the optical axis. S4, collect data and calculate detection power; S5. Calculate detection sensitivity indicators such as power density; S6, decoding the laser code and calculating the bit error rate; S7. Testing is completed.

[0042] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

Claims

1. A photoelectric simulator characteristic parameter testing device, characterized in that: include: A laser emission module (1), a photoelectric detection module (2) and a control computer (3), wherein the laser emission module (1) and the photoelectric detection module (2) are respectively connected to the control computer (3) by signals; the laser emission module (1) comprises: a laser (101) and a laser coding control system (106), wherein the laser (101) is connected to the laser coding control system (106), wherein the laser coding control system (106) encodes the laser signal according to a prescribed coding sequence, and wherein the laser (101) adopts a main oscillation power amplification method to achieve a stable output of a 980nm laser; and the photoelectric detection module (2) comprises: a single electron detector (203) and a laser decoding measurement system (206), wherein the single electron detector (203) converts a received coded laser signal or a repetition rate laser signal into an ultra-narrow electrical pulse signal, and wherein the laser decoding measurement system (206) processes the detector pulse current signal to obtain a voltage signal corresponding to the optical power density.

2. The photoelectric simulator characteristic parameter testing device according to claim 1, characterized in that: The laser emission module (1) further comprises: a first optical component (107), the first optical component (107) being located behind the emission end of the laser (101), the laser (101) coupling seed signal light and pump light with high beam quality into the double-clad optical fiber through the first optical component (107) for amplification, thereby achieving stable output of laser light of a specific wavelength; the photoelectric detection module (2) further comprises: a second optical component (207), the second optical component (207) being located in front of the receiving end of the single electron detector (203), the second optical component (207) converging and transmitting the received laser coding signal and laser repetition frequency signal to the single electron detector (203).

3. The photoelectric simulator characteristic parameter testing device according to claim 2, characterized in that: The first optical component (107) comprises: a beam expander (102) and a first aperture (103), wherein the input end of the beam expander (102) is close to the laser (101), and the first aperture (103) is located on the output end side of the beam expander (102); the second optical component (207) comprises: an integrating sphere (201) and a second aperture (202), wherein the light incident port of the integrating sphere (201) is aligned with the light incident hole of the photoelectric detection module (2), and the second aperture (202) is located between the integrating sphere (201) and the single electron detector (203).

4. The photoelectric simulator characteristic parameter testing device according to claim 3, characterized in that: The laser emission module (1) is placed in a first shielding cage (104), and the photoelectric detection module (2) is placed in a second shielding cage (204).

5. The photoelectric simulator characteristic parameter testing device according to any one of claims 1 to 4, characterized in that: The laser emission module (1) has a built-in first temperature control module (105), and the photoelectric detection module (2) has a built-in second temperature control module (205).

6. The photoelectric simulator characteristic parameter testing device according to any one of claim 5, characterized in that: The control computer (3) has a built-in main control program module (301) and a laser coding database (302), and the main control program module (301) and the laser coding database (302) are signal-connected.

7. The photoelectric simulator characteristic parameter testing device according to any one of claim 5, characterized in that: The control computer (3) is used for system control and data acquisition processing, and uses strided convolution to compress the input into a vector in a latent space.

8. A method for testing characteristic parameters of a photoelectric simulator, characterized in that: Includes steps: S1. Turn on the photoelectric simulator characteristic parameter test device and the device under test to the specified state; S2, adjust the optical axis, and connect the output to the main control computer; S3, collect data and calculate detection power; S4. Calculate detection sensitivity index, which includes but is not limited to power density; S5. Decode the laser code and calculate the bit error rate.

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