A method and device for semi-physical simulation test of equipment control platform

Abstract

The present application relates to the technical field of control simulation test, and discloses a method and device for semi-physical simulation test of a device control platform, wherein the method includes a simulation machine receiving a specified control signal of a control unit, wherein the specified control signal is a conditioned initial control signal; matching a device simulation model according to the specified control signal, wherein the device simulation model runs mirror data and creates a temporary folder, and transmits the specified control signal to an access folder inside the device simulation model through the temporary folder, and adjusts the analog signal of the device simulation model, and converts the adjusted analog signal into a digital device feedback signal; the device feedback signal is sent to a fault test unit, and it is determined whether the fault test unit receives a fault injection instruction to perform a fault test. The technical solution provided by one or more embodiments of the present application can conduct a more convenient, safe and comprehensive test on the device control platform through semi-physical simulation test.

Description

Technical Field

[0001] The present application relates to the technical field of control simulation test, and in particular to a method and device for semi-physical simulation test of an equipment control platform. Background Art

[0002] With the continuous development of advanced equipment manufacturing industries such as aviation and navigation, the testing link of the control platform has received extensive attention in the research and development of the control platform of advanced equipment. The control platform can regulate the various system modules of the advanced equipment, such as by regulating the parameters of the various system modules of the navigation system and the ship system, and then developing and verifying the control platform.

[0003] At present, most simulation models are used to verify the control platform. However, in the simulation verification process, problems such as signal mismatch and incomplete verification often occur. In addition, if abnormal signals appear during the signal interaction process, it will cause safety hazards in the verification platform and fail to ensure the safety of the equipment.

[0004] In view of this, how to handle the signal transmission between the control platform and the test module to achieve more convenient, more comprehensive and safer simulation experiments is an urgent problem to be solved. Summary of the invention

[0005] The present application provides a method and apparatus for semi-physical simulation testing of a device control platform, which can conduct a more convenient, safe and comprehensive test on the device control platform through the form of semi-physical simulation testing.

[0006] In order to achieve the above objectives, the main technical solutions adopted in this application include:

[0007] In a first aspect, one or more embodiments of the present application provide a method for semi-physical simulation test of a device control platform, wherein the device control platform includes a host computer, a simulator, a fault test unit and a control unit, wherein the simulator includes a device simulation model, wherein the device simulation model is a frequency converter model or a pressure valve model, and wherein the method includes: the simulator receives a specified control signal from the control unit, wherein the specified control signal is a conditioned initial control signal, wherein the simulator runs a plurality of preset device simulation models in a kernel space, wherein an access folder is pre-configured in the device simulation model, and the access folder has mirror data in a user space; identifying a signal type of the specified control signal, and matching a corresponding device simulation model for the signal type; and for the matched device simulation model, reading the mirror data of the device simulation model in the user space, and running the mirror data to A temporary folder is created in the user space, which has a communication relationship with the access folder of the device simulation model; the designated control signal is placed in the temporary folder to pass the designated control signal to the access folder through the temporary folder; wherein the designated control signal will be passed to the access folder only when the designated control signal satisfies the data screening mechanism of the access folder; the device simulation model adjusts the analog signal in response to the designated control signal in the access folder, and converts the adjusted analog signal into a digital device feedback signal; the device feedback signal is sent to a fault test unit to determine whether the fault test unit has received a fault injection instruction, and if no fault injection instruction is received, the device feedback signal is output to a control unit, wherein the fault injection instruction is sent to the fault test unit by a host computer.

[0008] In a second aspect, one or more embodiments of the present application provide a semi-physical simulation test device for a device control platform, the device comprising: a host computer unit, for parsing the simulation model code, and sending the parsed simulation model code to a simulation machine unit; a simulation machine unit, for receiving and running the simulation model, adjusting the analog signal of the simulation model according to a specified control signal, and converting the analog signal into a digital device feedback signal; a fault injection unit, for receiving a fault injection instruction, and transmitting the fault injection signal represented by the fault injection instruction to a control unit; a control unit, for outputting an initial control signal, the initial control signal being a current signal of 0~6mA, receiving a fault injection signal and a digital device feedback signal; a device unit, for receiving a specified control signal, the specified control signal being a processed initial control signal, and adjusting the test equipment according to the specified control signal.

[0009] On the other hand, the present application also provides a computer device, which includes a memory and a processor, the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the above-mentioned semi-physical simulation test method of a device control platform by executing the computer instructions.

[0010] On the other hand, the present application also provides a computer-readable storage medium, which is used to store a computer program. When the computer program is executed by a processor, it implements the above-mentioned semi-physical simulation test method of a device control platform.

[0011] The technical solution provided by one or more embodiments of the present application realizes a more convenient and comprehensive control simulation test by transmitting control signals and delivering device feedback signals to the device simulation model. Specifically, the control unit sends an initial control signal, adjusts the initial control signal according to the specified input form of the simulation model, generates a specified control signal and inputs it into the device simulation model, the device simulation model adjusts the control information represented by the specified control signal, and outputs the adjusted result as a device feedback signal in a specified form, injects faults into the device feedback signal according to the fault injection instruction, generates a fault injection signal as needed, and transmits the fault injection signal back to the control unit.

[0012] It can be seen that the technical solution provided by this application can conduct a more convenient test on the device control platform through semi-physical simulation test and in a specified signal transmission form. At the same time, by performing fault injection, the control unit can be subjected to multiple types of fault injection tests to make the test of the device control platform more comprehensive. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] In order to more clearly illustrate the specific implementation methods of the present application or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0014] Figure 1 A schematic diagram showing the steps of a semi-physical simulation test method of a device control platform in this embodiment of the present application is shown;

[0015] Figure 2 Middle (a) to Figure 2 (d) shows a schematic diagram of physical layer fault injection in one embodiment of the present application;

[0016] Figure 3 Middle (a) to Figure 3(c) shows a schematic diagram of electrical layer fault injection in one embodiment of the present application;

[0017] Figure 4 A schematic diagram of protocol layer fault injection in one embodiment of the present application is shown;

[0018] Figure 5 A schematic diagram showing a semi-physical simulation test method of a device control platform in one embodiment of the present application is shown;

[0019] Figure 6 A flow chart showing a semi-physical simulation test method in one or more embodiments of the present application is shown;

[0020] Figure 7 (a) and Figure 7 (b) shows a schematic diagram of a digital-analog switching and management unit and a disconnection testing unit in one embodiment of the present application;

[0021] Figure 8 A schematic diagram of a semi-physical simulation test device of a device control platform in one embodiment of the present application is shown;

[0022] Fig. 9 A schematic diagram of the composition of a computer device in one embodiment of the present application is shown. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0024] At present, in the field of advanced equipment manufacturing such as aviation systems, simulation models are usually used to test the control platform of advanced equipment. By simulating the test equipment, the cost and risk of physical testing can be reduced, and possible equipment damage or personal injury during the test can be avoided. At the same time, the simulation model can simulate various operating environments, thereby ensuring the stability and reliability of the equipment control platform in actual applications.

[0025] In related technologies, experiments are usually conducted in the form of semi-physical simulation, and the test equipment involves multiple experimental objects. Since it is difficult to conduct accurate simulation tests on a single experimental object, scenes that are difficult for the simulation model to recognize may occur during signal transmission, thereby reducing the accuracy and convenience of the simulation test. When developing high-end equipment such as aviation systems, it is necessary to conduct accurate tests on specific equipment to ensure the stability and reliability of the equipment control platform in actual applications; in addition, during the signal interaction process, if the interaction signal is an abnormal signal, the abnormal signal may attack the simulation model, thereby destroying the security of the simulation model. Therefore, how to conduct control tests on specific equipment such as frequency converters and pressure valves to ensure the correctness of signal transmission and conduct more convenient and safe tests on the equipment control platform is a research difficulty.

[0026] In addition to verifying the control platform through simulation equipment, it is also necessary to verify the control platform through faults, by simulating various potential signal faults to test whether the control platform can correctly identify faults. Through fault verification, potential defects in the control platform design can be identified, so that necessary corrections and optimizations can be made before the system is officially deployed, so as to conduct a more comprehensive test of the equipment control platform.

[0027] In view of this, one or more embodiments of the present application provide a semi-physical simulation test method and apparatus for a device control platform, which can solve the above-mentioned problems and achieve more convenient, safe and comprehensive testing of the device control platform.

[0028] See also Figure 1 The present application provides a semi-physical simulation test method for a device control platform, wherein the device control platform includes a host computer, a simulation machine, a fault test unit and a control unit, the simulation machine includes a device simulation model, and the device simulation model is a frequency converter model or a pressure valve model. The method includes the following steps:

[0029] S101: The simulation machine receives a designated control signal from a control unit, wherein the designated control signal is a conditioned initial control signal. The simulation machine runs a plurality of preset device simulation models in a kernel space, wherein an access folder is pre-configured in the device simulation model, and the access folder has mirror data in a user space.

[0030] In this embodiment, the kernel space is a private space facing the inside of the computer, used to store important data during the operation of the computer, and the user space is an external space facing the access user, used to store data that can be accessed by external users. The access folder is stored in a device simulation model in the kernel space, which is used to receive external specified control signals. The mirror data may include the operating environment data required for the access folder, as well as the data storage format, space size, data verification and authentication mechanism, etc. of the access folder.

[0031] In order to prevent the device simulation model from being attacked by the network, the device simulation model is run in the kernel space. At the same time, in order for external users to communicate with the kernel space, by running the image data in the user space, a temporary folder that can communicate with the kernel space can be established in the user space. The temporary folder can be regarded as a mirror of the access folder. The temporary folder can communicate with the access folder, and the access folder has only this communication method, thereby ensuring the security of the access folder. Therefore, the external specified control signal will be placed in the temporary folder first, and will be passed to the access folder only after verification and confirmation of the temporary folder, avoiding attacks on the device simulation model and improving the security of the semi-physical simulation test.

[0032] In this embodiment, the control unit sends an initial control signal as needed, and the initial control signal is transmitted to the simulator in a specified format. Specifically, multiple device simulation models such as a frequency converter model and a pressure valve model are established, and Simulink (Simulink, a graphical programming environment) or LabVIEW (LabVIEW, a graphical programming environment) can be used to establish the model, and the required device simulation model is run in the kernel space of the simulator, and the frequency converter model can adjust the frequency according to the information represented by the specified control signal, and the pressure valve model can adjust the pressure according to the information represented by the specified control signal, wherein the specified control signal is a conditioned initial control signal, and the initial control signal is a 4mA~20mA current signal issued by the control unit. According to the specified signal input form of the device simulation model, the initial control signal is selectively conditioned, and optionally, it can be maintained as a 4mA~20mA current signal, or adjusted to a 0v~10v voltage signal. It should be noted that in an industrial control system, a 4mA~20mA current signal is a standardized signal range used to transmit sensor measured data.

[0033] In this embodiment, the initial control signal is selectively conditioned according to the designated signal input form of the device simulation model. Specifically, the control unit sends an initial control signal that is a current signal of 4mA~20mA, and sends the initial control signal to the signal conditioning unit for on-demand conditioning, wherein the signal conditioning unit includes one or more series resistors, and if the designated input form of the device simulation model is a current signal, the current value in the signal conditioning unit is collected, and the current value is the current value represented by the initial control signal, that is, the current signal of 4mA~20mA is transmitted to the device simulation model as the designated control signal, and if the designated input form of the device simulation model is a voltage signal, the voltage value across the series resistor in the signal conditioning unit is collected, and the voltage value is 0v~10v, that is, the voltage signal of 0v~10v is transmitted to the device simulation model as the designated control signal.

[0034] S102: Identify the signal type of the designated control signal, and match a corresponding device simulation model for the signal type.

[0035] In this embodiment, the device simulation model running in the simulator is matched according to the information carried by the designated control signal. The types of the device simulation model include inverter model and pressure valve model, and the device simulation model of the specific application is determined according to the information carried by the current signal or voltage signal itself.

[0036] S103: for the matched device simulation model, read the mirror data of the device simulation model in the user space, and create a temporary folder in the user space that has a communication relationship with the access folder of the device simulation model by running the mirror data.

[0037] S104: placing the designated control signal into the temporary folder, so as to transmit the designated control signal to the access folder through the temporary folder; wherein the designated control signal will be transmitted to the access folder only when the designated control signal satisfies the data screening mechanism of the access folder.

[0038] In this embodiment, the data screening mechanism verifies and authenticates the data. The verification of the data includes verifying the identity of the initiator of the specified control signal, and only those in the whitelist are allowed to access. In addition, it is necessary to obtain the access behavior of the initiator within a certain period of time. The above access behavior can be the number of accesses initiated by the initiator within a certain period of time and the time link of each access. By judging the access link within a certain period of time and determining the proportion of abnormal accesses, it is possible to understand whether the initiator's access behavior is normal. If the proportion of abnormal accesses is too large, the access can be directly rejected, that is, the verification fails. The authentication of data includes judging whether the transmission signal is legal, that is, judging whether the signal component of the specified control signal is complete, whether it carries abnormal fields, etc.

[0039] In one embodiment, the time link of each access by the request initiator can be specifically reflected by the order in which the access flows through each device. For example, if an access passes through a complete line formed by a control device, a signal adaptation unit, a signal conditioning unit, a simulator, etc., then the access is a normal access. If an access stops at one of the units and does not pass through the subsequent devices, then the access is an abnormal access.

[0040] S105: The device simulation model adjusts the analog signal in response to the designated control signal in the access folder, and converts the adjusted analog signal into a digital device feedback signal.

[0041] In this embodiment, the device simulation model is run on demand, and the adjustment parameters of the device simulation model are output. Specifically, the analog signal that needs to be adjusted for the device simulation model is determined according to the type of the device simulation model, the analog quantity of the device simulation model is adjusted according to the information represented by the designated control signal, and the adjusted analog signal is converted into a digital signal and the digital signal is output.

[0042] In one embodiment, when the control unit is tested with a frequency converter as a test device, the device simulation model is a frequency converter model, and the analog signal is a frequency signal. Exemplarily, the frequency converter model receives a current signal of 4mA~20mA, and the range of the frequency converter model is set to 0Hz~100Hz. The frequency of the frequency converter model is adjusted according to the value of the current signal, and the frequency is output as a frequency signal of 0Hz~100Hz. If the specified control signal is 4mA, the frequency of the frequency converter is adjusted to 0Hz; if the specified control signal is 20mA, the frequency of the frequency converter is adjusted to 100Hz; if the specified control signal is 8mA, the frequency of the frequency converter is adjusted to 25Hz. After frequency adjustment, the frequency signal of the adjusted frequency converter model is converted into a corresponding current signal of 4mA~20mA and output as a device feedback signal.

[0043] In one embodiment, when the control unit is tested with a pressure valve as a test device, the device simulation model is a pressure valve model, and the analog signal is a pressure signal. Exemplarily, the pressure valve model receives a current signal of 4mA~20mA, and the range of the pressure valve model is set to 0MPa~6MPa. The pressure value of the pressure valve model is adjusted according to the numerical value of the current signal, and the pressure value is output as a pressure signal of 0MPa~6MPa. If the specified control signal is 4mA, the corresponding pressure of the pressure valve is adjusted to 0MPa; if the specified control signal is 20mA, the corresponding pressure of the pressure valve is adjusted to 6MPa; if the specified control signal is 12mA, the corresponding pressure of the pressure valve is adjusted to 3MPa. After pressure adjustment, the pressure signal of the adjusted press model is converted into a corresponding current signal of 4mA~20mA and output as a device feedback signal.

[0044] S106: Send the device feedback signal to the fault test unit to determine whether the fault test unit receives a fault injection instruction. If no fault injection instruction is received, output the device feedback signal to the control unit, wherein the fault injection instruction is sent to the fault test unit by the host computer.

[0045] In this embodiment, the device feedback signal in S105 is transmitted to the fault test unit for fault injection as needed, and the device feedback signal after fault injection is output to the control unit as needed. The host computer sends a fault injection instruction to the fault injection unit via the integrated signal network to determine whether the fault test unit has received the fault injection instruction. If the fault test unit does not receive the fault injection instruction, the device feedback signal in S105 is directly output to the control unit; if the fault test unit receives the fault injection instruction, according to the type of fault injection information represented by the fault injection instruction, the device feedback signal is converted into a fault injection signal and fed back to the control unit through the corresponding type of circuit in the fault injection unit. By performing different types of fault tests on the control unit, the safety and comprehensiveness of the semi-physical simulation test can be improved.

[0046] Specifically, please refer to Figure 2 , Figure 3 and Figure 4 ,Fault injection types include physical layer fault injection, electrical layer fault injection and protocol layer fault injection. Among them, physical layer fault injection includes open circuit fault injection, ground fault injection, impedance simulation injection and signal amplitude and noise superposition injection, and electrical layer fault injection includes signal generation injection, signal rise and fall injection and signal pull-up and pull-down injection.

[0047] In one embodiment, please refer to Figure 2 In (a), an open-circuit fault is injected into the device feedback signal. Figure 2(a) is a schematic diagram of open-circuit fault injection. Specifically, the device feedback signal is transmitted to the open-circuit fault component in the fault injection unit, and is transmitted to the open-circuit fault component fault injection device 2 via the line COM0 of the fault injection device 1 of the open-circuit fault component. At this time, if no fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the line NC0 of the fault injection device 2, and the device feedback signal is directly transmitted to the control unit; if a fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the open circuit state, in which the device feedback signal cannot continue to be transmitted, and observe whether the control device can display the signal loss.

[0048] In one embodiment, please refer to Figure 2 In (b), a ground fault is injected into the device feedback signal. Figure 2 (b) is a schematic diagram of ground fault injection. Specifically, the device feedback signal is transmitted to the ground fault component in the fault injection unit, and then transmitted to the fault injection device 2 of the ground fault component via the line COM0 of the fault injection device 1 of the ground fault component. At this time, if no fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the line NC0 of the fault injection device 2, and the device feedback signal is directly transmitted to the control unit; if a fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the line NO0 of the fault injection device 2, that is, the ground short circuit state, the device feedback signal cannot continue to be transmitted, and observe whether the control device can display the signal loss.

[0049] In one embodiment, please refer to Figure 2 In (c), impedance simulation injection is performed on the device feedback signal. Figure 2 (c) is a schematic diagram of impedance simulation injection. Specifically, the device feedback signal is transmitted to the impedance simulation component in the fault injection unit, and is transmitted to the fault injection device 2 of the impedance simulation component through the line COM0 of the fault injection device 1 of the impedance simulation component. At this time, if no fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the line NC0 of the fault injection device 2, and the device feedback signal is directly transmitted to the control unit; if a fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the impedance simulation line NO0 of the fault injection device 2, and the device feedback signal is transmitted to the impedance simulation line NO0, wherein the impedance simulation line NO0 includes a capacitor C1 and a resistor R1, and the device feedback signal is converted into a fault injection signal through the impedance simulation line NO0, and the fault injection signal is fed back to the control unit to observe whether the control device can determine the corresponding signal fault.

[0050] In one embodiment, please refer to Figure 2 In (d), the device feedback signal is injected with signal amplitude and noise superposition. Figure 2 (d) is a schematic diagram of signal amplitude and noise superposition injection. Specifically, the device feedback signal is transmitted to the signal amplitude and noise superposition component in the fault injection unit, and is transmitted to the fault injection device 2 of the signal amplitude and noise superposition component through the line COM0 of the fault injection device 1 of the signal amplitude and noise superposition component. At this time, if no fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the line NC0 of the fault injection device 2, and the device feedback signal is directly transmitted to the control unit; if a fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the signal amplitude and noise superposition line NO0. At this time, the line NO0 is a coupling circuit, and the coupling circuit includes a signal generator and an operational amplifier. The signal generator is used to simulate different signal noises, couple the signal noise to the device feedback signal, and use the coupled signal as the fault injection signal. The operational amplifier is used to amplify the amplitude of the fault injection signal, and feed the fault injection signal back to the control device to observe whether the control device can determine the corresponding signal fault. Among them, the signal noise can be a same-frequency signal used to increase the amplitude of the device feedback signal, or it can be a high-frequency signal used to superimpose noise on the feedback signal.

[0051] In one embodiment, please refer to Figure 3 In (a), the device feedback signal is modified and injected. Figure 3 (a) is a schematic diagram of changing the signal injection. Specifically, the device feedback signal is transmitted to the changing signal component in the fault injection unit, and then transmitted to the fault injection device 2 of the changing signal component via the fault injection device 1 of the changing signal component. At this time, if no fault injection instruction is received, the switch KO of the fault injection device 2 is turned to the line NC0, and the device feedback signal is transmitted to the control unit via the line COM0; if a fault injection instruction is received, the switch KO of the fault injection device 2 is turned to the line NO0, and a new signal is randomly generated by the signal generator of the line NO0 as a fault injection signal, which is transmitted to the control unit via the line COM0 to observe whether the control device can determine the corresponding signal fault.

[0052] In one embodiment, please refer to Figure 3 In (b), the rising and falling slopes of the device feedback signal are adjusted. Figure 3(b) is a schematic diagram of signal rise and fall slope adjustment. Specifically, the device feedback signal is transmitted to the signal rise and fall slope adjustment component in the fault injection unit, and is transmitted to the fault injection device 2 of the signal rise and fall slope adjustment component through the line COM0 of the fault injection device 1 of the signal rise and fall slope adjustment component. At this time, if no fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the line NC0 of the fault injection device 2, and the device feedback signal is directly transmitted to the control unit; if a fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the signal amplitude and noise superposition line NO0. At this time, the line NO0 is a signal slope adjustment circuit, and the signal slope adjustment loop includes an operational amplifier, a feedback loop and an adjustable resistor. By adjusting the resistance and capacitance values ​​in the feedback loop, the closed-loop gain and time constant of the operational amplifier are changed, and then the device feedback signal input to the operational amplifier is adjusted for the signal rise and fall slopes. Specifically, increasing the capacitance value will prolong the charging and discharging time, and obtain a fault injection signal with smoother signal rise and fall edges. Conversely, reducing the capacitance value will speed up the charging and discharging process, and obtain a fault injection signal with steeper signal rise and fall edges. Feedback the fault injection signal to the control device to observe whether the control device can determine the corresponding signal fault.

[0053] In one embodiment, please refer to Figure 3 In (c), the device feedback signal is subjected to signal pull-up and pull-down interference adjustment. Figure 3 (c) is a schematic diagram of signal pull-up and pull-down interference adjustment. Specifically, the device feedback signal is transmitted to the signal pull-up and pull-down interference adjustment component in the fault injection unit, and is transmitted to the fault injection device 2 of the signal pull-up and pull-down interference adjustment component through the line COM0 of the fault injection device 1 of the signal pull-up and pull-down interference adjustment component. At this time, if no fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the line NC0 of the fault injection device 2, and the device feedback signal is directly transmitted to the control unit; if a fault injection instruction is received, the switch KO of the fault injection device 1 is turned to the signal amplitude and noise superposition line NO0. At this time, the line NO0 is a signal interference adjustment circuit. When K1 is turned on, the signal pull-up interference is performed, and when K2 is turned on, the signal pull-down interference is performed. Observe whether the control device can determine the corresponding signal fault.

[0054] In one embodiment, see Figure 4 , protocol layer fault injection is performed on the device feedback signal. Figure 4This is a schematic diagram of protocol layer fault injection. Specifically, a complete data unit of the protocol layer includes a frame header, length, control field, data segment, check bit and frame tail. Among them, the frame header is used to identify the beginning of a frame of data, the length is used to indicate the number of bytes in the entire data segment, the control field contains control information such as synchronization and address, the data segment contains the feedback information of the device to be transmitted, and the check bit is used to detect the transmission of data. By changing the information of the data segment, the fault injection of normal and abnormal values ​​of the protocol layer is performed.

[0055] In view of this, the technical solution provided by one or more embodiments of the present application conducts simulation tests on the equipment control platform of high-end equipment such as aviation systems. Specifically, control tests are conducted on specific equipment such as frequency converters and pressure valves to ensure the correctness of signal transmission, conduct more convenient and comprehensive tests on the equipment control platform, and improve the stability and reliability of the equipment control platform in practical applications. In addition, in addition to verifying the simulation equipment of the control platform, the control platform can also be fault-verified by simulating various potential signal failure conditions to verify whether the control platform can correctly identify the fault. Through fault verification, potential defects in the control platform design can be identified, so that necessary corrections and optimizations can be made before the system is officially deployed.

[0056] Also, see Figure 5 The present application also provides a semi-physical simulation test method for a device control platform, wherein the device control platform includes a host computer, a simulator and a test device, wherein the test device is a frequency converter or a pressure valve, and a control simulation model is run in the simulator, and the method includes the following steps:

[0057] S201: The simulator receives a designated device signal from a test device, wherein the designated device signal is a conditioned initial device signal, wherein the initial device signal is a current signal of 4mA~20mA or a voltage signal of 0v~10v, and the designated device signal is a current signal of 4mA~20mA.

[0058] S202: According to the designated device signal, the control simulation model is run, and an analog signal of the control simulation model is acquired, wherein the analog signal is determined according to the type of the test device.

[0059] In this embodiment, a control simulation model is run in the simulator, and the control simulation model receives and identifies the signal sent by the test equipment. Specifically, the test equipment sends a current signal of 4mA~20mA or a voltage signal of 0v~10v as the initial device signal according to the actual situation, and sends the initial device signal to the signal conditioning unit, wherein the signal conditioning unit includes one or more series resistors, collects the current value in the signal conditioning unit, and uses the current value as the designated device signal. The simulator collects the designated device signal, and the designated device signal is a current signal of 4mA~20mA. The designated device signal is input into the control simulation model of the simulator, and the operating state of the test equipment is analyzed according to the designated device signal, that is, the designated device signal is converted into an analog signal according to the type and range of the test equipment.

[0060] Specifically, the test equipment can be a frequency converter or a pressure valve. When the test equipment is a frequency converter, the value of the initial equipment signal is determined according to the frequency converter range. The frequency signal of 0Hz~100Hz corresponds to the output current signal of 4mA~20mA. When the test equipment is a pressure valve, the value of the initial equipment signal is determined according to the pressure valve range. The frequency signal of 0MPa~6MPa corresponds to the output current signal of 4mA~20mA.

[0061] As can be seen from the above, the execution process of each step in this embodiment is similar to the description in the aforementioned embodiment, except that the execution subject of the simulation model of some steps in the aforementioned embodiment is changed from the test equipment to the control unit, and the subject of the actual device is changed from the control unit to the test equipment. Therefore, for the specific implementation of each step, please refer to the description of the aforementioned embodiment, and it will not be repeated here.

[0062] See also Figure 6 The present application provides one or more embodiments of a method for semi-physical simulation test using the above-mentioned device control platform, wherein the device control platform includes: an integrated experiment operation center, an integrated signal network and clock synchronization unit, a tester, a control unit, and a test device, wherein the tester includes a simulator, a signal conditioning unit, a digital-analog switching unit, a disconnection test unit, a signal adaptation unit, and a fault injection unit; wherein,

[0063] The integrated experiment operation center is specifically used to transmit the code of the corresponding simulation model to the tester through the integrated signal network and clock synchronization unit, and issue fault injection instructions as needed;

[0064] The integrated signal network and clock synchronization unit are specifically used to transmit the code of the corresponding simulation model and unify the operation time axis of the simulation model and the test equipment;

[0065] The tester is specifically used to receive the code of the corresponding simulation model, exchange data with the comprehensive experiment operation center, and complete the signal debugging and transmission between the simulation model, the test equipment and the control unit;

[0066] A control unit, specifically used to output an initial control signal, receive a fault injection signal and a digital device feedback signal;

[0067] The test equipment is specifically used to output an initial equipment signal, which is transmitted to the simulator or control unit after being debugged by the tester.

[0068] In one embodiment, the test is conducted in a semi-physical simulation mode using a real control unit and a virtual test device. The comprehensive experiment operation center transmits the device simulation model code to the simulator via the comprehensive signal network and the clock synchronization unit. The simulator receives the specified control signal for analysis, runs the device simulation model according to the current value represented by the specified control signal, and outputs the parameters of the device simulation model after operation as a feedback signal. The feedback signal is injected into the fault through the disconnection test unit and the fault injection unit, and a fault injection signal is generated and transmitted to the control unit. The specified control signal is the initial control signal issued by the control unit after being processed by the signal adaptation unit, the digital-to-analog switching unit, and the signal conditioning unit. Specifically, the control unit sends a 4mA~20mA current signal as the initial control signal, the initial control signal is transmitted to the signal adapter unit, and then transmitted to the digital-to-analog switching unit via the control signal line corresponding to the initial control signal in the signal adapter unit. At this time, the single-pole double-throw switch of the digital-to-analog switching unit is switched to the simulation machine line, and the initial control signal is transmitted to the signal conditioning unit via the simulation machine line. The signal conditioning unit conditions the initial control signal according to the interface signal form of the simulation machine and outputs it as a specified control signal. The specified control signal is a 4mA~20mA current signal or a 0v~10v voltage signal. It should be noted that please refer to Figure 7 , Figure 7 (a) is a digital-to-analog switching unit, which includes a single-pole double-throw switch that can switch the line to the simulator or the test equipment. Figure 7 (b) is a line break test unit, which includes a banana plug / socket and connector that can connect the fault injection circuit to the control unit interface.

[0069] The execution process of each step in this embodiment is similar to the description in the aforementioned S101 to S106. Therefore, for the specific implementation method of each step, please refer to the description of the aforementioned embodiment, which will not be repeated here.

[0070] In one embodiment, a semi-physical simulation method of a virtual control device and a real test equipment is used for the test. The comprehensive experiment operation center transmits the control simulation model code to the simulator via the comprehensive signal network and the clock synchronization unit. The simulator receives the designated device signal for analysis, runs the control simulation model according to the current value represented by the designated device signal, and obtains the analog signal representing the device operation status according to the operation result. Specifically, the test equipment sends a current signal of 4mA~20mA or a voltage signal of 0v~10v as the initial device signal, and the initial device signal represents the parameter information inside the test equipment. The initial device signal is transmitted to the signal adapter unit, and is transmitted to the digital-analog switching unit via the device signal line corresponding to the initial device signal in the signal adapter unit. At this time, the single-pole double-throw switch of the digital-analog switching unit is dialed to the simulator line, and the initial device signal is transmitted to the signal conditioning unit via the simulator line. The signal conditioning unit conditions the initial device signal according to the interface signal form of the simulator, and outputs it as the designated device signal, and the designated device signal is a current signal of 4mA~20mA.

[0071] The execution process of the subsequent steps in this embodiment is similar to the description in the aforementioned S201 to S202. Therefore, for the specific implementation method of each step, please refer to the description of the aforementioned embodiment, which will not be repeated here.

[0072] In addition, the present application also provides an implementation method, which uses a full physical simulation method of a real control device and a real test equipment to conduct the test. Specifically, the control device sends a current signal of 4mA~20mA as the initial control signal, and the initial control signal is transmitted to the signal adaptation unit, and is transmitted to the digital-to-analog switching unit via the control signal line corresponding to the initial control signal in the signal adaptation unit. At this time, the single-pole double-throw switch of the digital-to-analog switching unit is dialed to the test equipment line, and the initial control signal is transmitted to the test equipment after being processed by the signal adaptation unit. It should be noted that when the test is conducted in a full physical simulation method of a real control device and a real test equipment, fault injection can be performed when the feedback signal is transmitted back to the control unit. For the specific implementation method, please refer to the description of the aforementioned implementation method, which will not be repeated here.

[0073] Please refer to Figure 8 The present application provides a device for semi-physical simulation test of a device control platform, the device comprising:

[0074] The upper computer unit 100 is used to parse the simulation model code and send the simulation model code obtained through the parsing to the simulation machine unit;

[0075] The simulation machine unit 200 is used to receive and run a preset simulation model, configure an access folder in the simulation model, the access folder has mirror data, run the mirror data to create a temporary folder that has a communication relationship with the access folder, the temporary folder transmits a specified control signal to the access folder, and in response to the specified control signal, adjusts an analog signal of the simulation model and converts the analog signal into a digital feedback signal;

[0076] The fault injection unit 300 is used to receive a fault injection instruction and transmit a fault injection signal represented by the fault injection instruction to the control unit;

[0077] The control unit 400 is used to output an initial control signal, where the initial control signal is a current signal of 0-6 mA, and receive a fault injection signal and a digital feedback signal;

[0078] in,

[0079] The host computer unit 100 is specifically used to transmit the code of the simulation model to the simulation unit, and to perform data exchange with the simulation unit, and to issue a fault injection instruction to the fault injection unit;

[0080] The simulation machine unit 200 is specifically used to receive a specified control signal from a control unit, wherein the specified control signal is a conditioned initial control signal, and the simulation machine runs a plurality of preset simulation models in the kernel space, wherein an access folder is pre-configured in the simulation model, and the access folder has mirror data in the user space; identify the signal type of the specified control signal, and match a corresponding simulation model for the signal type; for the matched simulation model, read the mirror data of the simulation model in the user space, and create a temporary folder in the user space that has a communication relationship with the access folder of the simulation model by running the mirror data; put the specified control signal into the temporary folder, so as to pass the specified control signal to the access folder through the temporary folder; wherein the specified control signal will be passed to the access folder only when the specified control signal satisfies the data screening mechanism of the access folder; the simulation model adjusts the analog signal in response to the specified control signal in the access folder, and converts the adjusted analog signal into a digital feedback signal;

[0081] The fault injection unit 300 is specifically used to receive a fault injection instruction issued by the host computer, and perform fault injection processing on the feedback signal of the simulation machine according to the fault injection instruction, generate a fault injection signal, and transmit the fault injection signal to the control unit;

[0082] The control unit 400 is specifically used to send an initial control signal, which can be converted into a specified control signal and output to the simulator unit. The initial control signal is a current signal of 4mA~20mA, and receives a feedback signal sent by the simulator unit or a fault injection signal sent by the fault injection unit.

[0083] The further functional description of each of the above modules and units is the same as that of the above corresponding embodiments and will not be repeated here.

[0084] In an embodiment of the present application, a device for semi-physical simulation test of a device control platform is presented in the form of a functional unit, where the unit refers to an ASIC (Application Specific Integrated Circuit) circuit, a processor and memory that executes one or more software or fixed programs, or other devices that can provide the above functions.

[0085] See also Fig. 9 , Fig. 9 is a schematic diagram of the structure of a computer device provided in an embodiment of the present application, such as Fig. 9 As shown, the computer device includes: one or more processors 10, a memory 20, and interfaces for connecting various components, including high-speed interfaces and low-speed interfaces. Various components are connected to each other using different buses for communication, and can be installed on a common mainboard or installed in other ways as needed. The processor can process the instructions executed in the computer device, including instructions stored in or on the memory to display the graphical information of the GUI on an external input / output device (such as, a display device coupled to the interface). In some optional embodiments, if necessary, multiple processors and / or multiple buses can be used together with multiple memories and multiple memories. Similarly, multiple computer devices can be connected, and each device provides some necessary operations (for example, as a server array, a group of blade servers, or a multi-processor system). Fig. 9 A processor 10 is taken as an example.

[0086] The processor 10 may be a central processing unit, a network processor or a combination thereof. The processor 10 may further include a hardware chip. The hardware chip may be a dedicated integrated circuit, a programmable logic device or a combination thereof. The programmable logic device may be a complex programmable logic device, a field programmable gate array, a general purpose array logic or any combination thereof.

[0087] The memory 20 stores instructions executable by at least one processor 10, so that the at least one processor 10 executes the method shown in the above embodiment.

[0088] The memory 20 may include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application required for at least one function; the data storage area may store data created according to the use of the computer device, etc. In addition, the memory 20 may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage device. In some optional embodiments, the memory 20 may optionally include a memory remotely arranged relative to the processor 10, and these remote memories may be connected to the computer device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0089] The memory 20 may include a volatile memory, such as a random access memory; the memory may also include a non-volatile memory, such as a flash memory, a hard disk or a solid state drive; the memory 20 may also include a combination of the above types of memory.

[0090] The computer device also includes an input device 30 and an output device 40. The processor 10, the memory 20, the input device 30 and the output device 40 may be connected via a bus or other means. Fig. 9 The example of connecting through bus is taken in the following.

[0091] The input device 30 can receive input digital or character information, and generate key signal input related to the user settings and function control of the computer device, such as a touch screen, a keypad, a mouse, a track pad, a touch pad, an indicator bar, one or more mouse buttons, a trackball, a joystick, etc. The output device 40 may include a display device, an auxiliary lighting device (e.g., an LED) and a tactile feedback device (e.g., a vibration motor), etc. The above-mentioned display device includes but is not limited to a liquid crystal display, a light emitting diode, a display and a plasma display. In some optional embodiments, the display device may be a touch screen.

[0092] The embodiment of the present application also provides a computer-readable storage medium. The above method according to the embodiment of the present application can be implemented in hardware, firmware, or can be implemented as a computer code that can be recorded in a storage medium, or can be implemented as a computer code that is originally stored in a remote storage medium or a non-temporary machine-readable storage medium and will be stored in a local storage medium through a network download, so that the method described herein can be stored in such software processing on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. Among them, the storage medium can be a magnetic disk, an optical disk, a read-only storage memory, a random access memory, a flash memory, a hard disk or a solid-state hard disk, etc.; further, the storage medium can also include a combination of the above types of memories. It can be understood that a computer, a processor, a microprocessor controller, or programmable hardware includes a storage component that can store or receive software or computer code. When the software or computer code is accessed and executed by a computer, a processor, or hardware, the method shown in the above embodiment is implemented.

[0093] The embodiment of the present application provides a computer program product, which includes computer instructions, which are stored in a computer-readable storage medium. A processor of a computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the computer device executes the method of any embodiment of the present application.

[0094] Although the embodiments of the present application are described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present application, and such modifications and variations are all within the scope defined by the appended claims.

[0095] The platform, device, module or unit described in the above embodiments may be implemented by a computer chip or entity, or by a product having a certain function. A typical implementation device is a computer. Specifically, the computer may be, for example, a personal computer, a laptop computer, a cellular phone, a camera phone, a smart phone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.

[0096] For the convenience of description, the above device is described in various units according to their functions. Of course, when implementing the present application, the functions of each unit can be implemented in the same or multiple software and / or hardware.

[0097] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, devices, or computer equipment. Therefore, the present application may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present application may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes.

[0098] The present application is described with reference to the flowcharts and / or block diagrams of the methods and devices according to the embodiments of the present application. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of the processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0099] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0100] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0101] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the process, method, commodity or device including the elements.

[0102] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the device embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0103] The above is only an embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.

[0104] Although the embodiments of the present application have been described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present application, and such modifications and variations are all within the scope defined by the appended claims.

Claims

1. A method for semi-physical simulation test of a device control platform, characterized in that: The device control platform includes a host computer, a simulator, a fault test unit and a control unit, the simulator includes a device simulation model, wherein the device simulation model is a frequency converter model or a pressure valve model, and the method includes: The emulator receives a designated control signal from the control unit, wherein the designated control signal is a conditioned initial control signal, and the emulator runs a plurality of preset device emulation models in the kernel space, wherein an access folder is pre-configured in the device emulation model, and the access folder has mirror data in the user space; Identify the signal type of the specified control signal, and match a corresponding device simulation model for the signal type; For the matched device simulation model, read the mirror data of the device simulation model in the user space, and create a temporary folder in the user space that has a communication relationship with the access folder of the device simulation model by running the mirror data; Put the designated control signal into the temporary folder, so as to transmit the designated control signal to the access folder through the temporary folder; wherein the designated control signal will be transmitted to the access folder only when the designated control signal satisfies the data screening mechanism of the access folder; The device simulation model adjusts the analog signal in response to the designated control signal in the access folder, and converts the adjusted analog signal into a digital device feedback signal; The device feedback signal is sent to the fault test unit to determine whether the fault test unit has received a fault injection instruction. If no fault injection instruction is received, the device feedback signal is output to the control unit, wherein the fault injection instruction is sent to the fault test unit by the host computer.

2. The method according to claim 1, characterized in that: The simulation machine receives a specified control signal from the control unit, where the specified control signal is a conditioned initial control signal, specifically including: The control unit sends an initial control signal, which is a current signal of 4mA to 20mA, and sends the initial control signal to the signal conditioning unit, wherein the signal conditioning unit includes one or more series resistors; The simulator collects the current value or voltage value in the signal conditioning unit according to the specified signal form, and uses the current value or voltage value as the specified control signal, wherein the specified control signal is a current signal of 4mA~20mA, or a voltage signal of 0v~10v.

3. The method according to claim 1, characterized in that Running the simulation model according to the specified control signal, adjusting the analog signal of the simulation model, and converting the adjusted analog signal into a digital device feedback signal, specifically includes: Running the simulation model, determining an analog quantity signal of the simulation model according to the type of the simulation model, and performing analog quantity adjustment on the simulation model according to the analog quantity signal; The analog signal of the adjusted simulation model is collected, and the analog signal is converted into a device feedback signal, wherein the device feedback signal is a current signal of 4mA~20mA.

4. The method according to claim 3, characterized in that The types of the simulation model include a frequency converter simulation model and a pressure valve simulation model; and determining the analog quantity signal of the simulation model according to the type of the simulation model includes: When the simulation model is a frequency converter simulation model, the analog signal is a frequency signal of 0 Hz to 100 Hz; When the simulation model is a pressure valve simulation model, the analog signal is a pressure signal of 0MPa~6MPa.

5. The method according to claim 1, characterized in that: After sending the device feedback signal to the fault test unit and determining whether the fault test unit has received the fault injection instruction, the method further includes: If a fault injection instruction is received, a fault injection signal represented by the fault injection instruction is transmitted to the control unit, and the control unit is operated. The types of the fault injection signal include physical layer fault injection signal, electrical layer fault injection signal and protocol layer fault injection signal.

6. A semi-physical simulation test device for an equipment control platform, characterized in that: The device comprises: The upper computer unit is used to parse the simulation model code and send the simulation model code obtained through the parsing to the simulation machine unit; A simulation machine unit, configured to receive and run a preset simulation model, configure an access folder in the simulation model, the access folder having mirror data, run the mirror data to create a temporary folder having a communication relationship with the access folder, the temporary folder transmits a specified control signal to the access folder, and in response to the specified control signal, adjusts an analog signal of the simulation model and converts the analog signal into a digital feedback signal; A fault injection unit, configured to receive a fault injection instruction and transmit a fault injection signal represented by the fault injection instruction to a control unit; The control unit is used to output an initial control signal, wherein the initial control signal is a current signal of 0-6 mA, and receive a fault injection signal and a digital quantity feedback signal.

7. A computer device, characterized in that: include: A memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the semi-physical simulation test method of a device control platform according to any one of claims 1 to 5 by executing the computer instructions.

8. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a computer to execute a semi-physical simulation test method for a device control platform as described in any one of claims 1 to 5.

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