Display screen test method, electronic equipment and computer storage medium

Abstract

The invention relates to the field of testing, aims to solve the problem of low testing efficiency, and provides a display screen testing method, electronic equipment and a computer storage medium. The display screen testing method is applied to the electronic equipment comprising N display screens, N is an integer larger than or equal to 2, and the method comprises the steps that testing configuration of a current testing scene is obtained; obtaining a multi-screen configuration attribute of the test configuration, wherein the multi-screen configuration attribute is used for indicating a target display screen to be tested in the current test scene; m target display screens to be tested in the N display screens are determined according to the multi-screen configuration attributes, and M is an integer larger than or equal to 2 and smaller than or equal to N; obtaining screen information of M target display screens; controlling the M target display screens to display according to the screen information of the M target display screens; and applying corresponding stress to the displayed M target display screens according to the current test scene. Two or more to-be-tested target display screens can be configured in a test scene at the same time, and the test efficiency is improved.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of testing, and in particular to a display screen testing method, an electronic device, and a computer storage medium. Background Art

[0002] Testing the display screen of an electronic device, such as an aging test, can improve the reliability of the electronic device. When implementing the embodiments of the present application, the inventors found that in traditional tests, each display screen of the electronic device is tested separately as an independent device in sequence, and the test efficiency is low. For example, the electronic device includes two display screens, and after performing an aging test on one of the display screens separately, the aging test is performed on the other display screen separately, which takes a long time and has low test efficiency. Summary of the invention

[0003] The embodiments of the present application provide a display screen testing method, an electronic device, and a computer storage medium to solve the problems of long test time and low test efficiency in display screen testing.

[0004] In a first aspect, a display screen testing method is provided, which is applied to an electronic device, wherein the electronic device includes N display screens, where N is an integer greater than or equal to 2, and the method includes: obtaining a test configuration of a current test scenario; obtaining a multi-screen configuration attribute of the test configuration, where the multi-screen configuration attribute is used to indicate a target display screen to be tested in the current test scenario; determining M target display screens to be tested among the N display screens according to the multi-screen configuration attribute, where M is an integer greater than or equal to 2, and M is less than or equal to N; obtaining screen information of the M target display screens; controlling the display of the M target display screens according to the screen information of the M target display screens; and applying corresponding stresses to the displayed M target display screens according to the current test scenario.

[0005] By setting the multi-screen configuration properties, the corresponding target display screen to be tested can be flexibly configured for each test scenario, and then two or more target display screens to be tested can be configured in the test scenario at the same time. And by controlling the two or more determined target display screens to display, and applying corresponding stress to the two or more displayed target display screens, the potential defects of the target display screens are accelerated to be exposed as early failures, so as to achieve the purpose of discovering and eliminating potential defects, thereby saving test time and improving test efficiency while ensuring the interception quality of potential defects.

[0006] In one possible implementation, controlling the display of the M target display screens according to the screen information of the M target display screens includes: controlling the M target display screens to display simultaneously according to the screen information of the M target display screens; when controlling the M target display screens to display simultaneously, applying corresponding stresses to the displayed M target display screens according to the current test scenario includes: applying corresponding stresses to the M target display screens that display simultaneously according to the current test scenario.

[0007] It is possible to control the display of two or more target display screens to be tested, and simultaneously apply corresponding stresses to the two or more target display screens to be tested.

[0008] In one possible implementation, the method further includes: obtaining a total test duration of the test configuration; obtaining a temperature of the electronic device; and when the temperature of the electronic device reaches a preset threshold, controlling the operation of electronic components in the electronic device according to the total test duration.

[0009] The test can be controlled by temperature regulation to ensure the completion of the display test.

[0010] In one possible implementation, controlling the display of the M target display screens according to the screen information of the M target display screens includes: controlling the order of display of the M target display screens and controlling the corresponding display duration of the target display screens according to the screen information of the M target display screens and the test configuration; applying corresponding stresses to the displayed M target display screens according to the current test scenario includes: applying corresponding stresses to the currently displayed target display screen according to the current test scenario.

[0011] The test of each target display screen can be flexibly controlled, and the display of the target display screen can be adjusted according to the actual situation, providing more freedom.

[0012] In a possible implementation, controlling the display of the M target display screens according to the screen information of the M target display screens also includes: acquiring test resources of the current test scene; and controlling the M target display screens to display pictures or videos corresponding to the test resources according to the screen information of the M target display screens.

[0013] The corresponding test resources are configured based on the test scenario. The configured test resources are used to better perform detection and facilitate effective testing.

[0014] In one possible implementation, the screen information includes the physical ID and resolution of the target display screen. According to the screen information of the M target display screens, controlling the M target display screens to display pictures or videos corresponding to the test resources includes: starting the corresponding M target display screens according to the physical IDs of the M target display screens; and for the started target display screens, controlling the target display screens to display pictures or videos of corresponding resolutions.

[0015] In one possible implementation, the method further includes: determining a unique target display screen to be tested among N display screens based on multi-screen configuration attributes; obtaining screen information of the unique target display screen; obtaining test resources of a current test scenario; controlling the unique target display screen to display a picture or video corresponding to the test resource based on the screen information of the unique target display screen; and applying corresponding stress to the displayed unique target display screen based on the current test scenario.

[0016] In one possible implementation, the electronic device also includes a display driver chip, and each display screen is configured with a corresponding display driver chip; applying corresponding stress to the M target display screens displayed according to the current test scenario includes: applying corresponding electrical stress to the target display screens displayed through the display driver chip according to the current test scenario.

[0017] In a second aspect, an electronic device is provided. The electronic device includes a memory and a processor. The memory is connected to the processor. The memory is used to store a computer program. The processor is used to implement any one of the above methods when executing the computer program.

[0018] According to a third aspect, a computer storage medium is provided, comprising computer instructions. When the computer instructions are executed on an electronic device, the electronic device executes any one of the above methods.

[0019] The technical effects obtained by the above-mentioned second and third aspects are similar to the technical effects obtained by the corresponding technical means in the first aspect, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 A schematic diagram of a failure rate curve of an electronic product provided in an embodiment of the present application.

[0021] Figure 2 A schematic diagram of the hardware structure of an electronic device provided in an embodiment of the present application.

[0022] Figure 3 A schematic diagram of the software structure of an electronic device provided in an embodiment of the present application.

[0023] Figure 4 A schematic diagram of a display screen testing method flow chart provided in an embodiment of the present application.

[0024] Figure 5 A schematic diagram of a target display screen display method flow provided in an embodiment of the present application.

[0025] Figure 6 A schematic flow chart of another target display screen display method provided in an embodiment of the present application.

[0026] Figure 7A schematic flow chart of another display screen testing method provided in an embodiment of the present application.

[0027] Figure 8 A schematic flow chart of another display screen testing method provided in an embodiment of the present application.

[0028] Fig. 9 A schematic diagram of a display screen test interface provided in an embodiment of the present application. DETAILED DESCRIPTION

[0029] It is understandable that the connection relationship described in this application refers to direct or indirect connection. For example, A and B are connected, which can be either A and B directly connected or A and B indirectly connected through one or more other electrical components, for example, A and C can be directly connected, and C and B can be directly connected, so that A and B are connected through C.

[0030] It should be noted that the terms "first" and "second" in the specification, claims and drawings of the present application are used to distinguish similar objects, rather than to describe a specific order or sequence. In the specification, claims and drawings of the present application, unless otherwise specified, " / " means or, for example, A / B can mean A or B. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In addition, the term "plurality" in the specification, claims and drawings of the present application refers to two or more than two.

[0031] It should also be noted that the method disclosed in the embodiments of the present application or the method shown in the flowchart includes one or more steps for implementing the method. Without departing from the scope of the claims, the execution order of multiple steps can be interchangeable with each other, and some of the steps can also be deleted.

[0032] Some embodiments will be described below in conjunction with the accompanying drawings. In the absence of conflict, the following embodiments and features in the embodiments may be combined with each other.

[0033] It is understandable that with the development of electronic technology, the integration of electronic devices is getting higher and higher, the number of processes is increasing, and the manufacturing process is becoming more and more complicated, which leads to defects in electronic products, such as potential defects and obvious defects. Obvious defects can be discovered through conventional inspection methods, but potential defects cannot be discovered through conventional inspection methods, but are eliminated through aging tests. Aging tests apply stress to products, such as electrical stress and temperature stress, to accelerate the exposure of potential defects of products into early failures, so as to achieve the purpose of discovering and eliminating potential defects, reduce product return rates, reduce maintenance costs, and improve user experience.

[0034] See also Figure 1, which exemplifies the failure rate curve of electronic products.

[0035] Figure 1 The failure rate curve of electronic products shown in the figure is also called the bathtub curve. In the early failure period, when electronic products are first used, their failure rate is very high. As the product works for a longer time, the failure rate gradually decreases. In order to shorten the early failure period, the product is tested before it is put into operation so that defects can be discovered, corrected and eliminated early. The ideal test points for aging testing are as follows: Figure 1 As shown in point A in the figure, after reaching point A, it can be ensured that the product defect ratio is effectively reduced after the aging test without increasing the aging cost.

[0036] As mentioned above, when implementing the embodiments of the present application, the inventors found that for electronic devices including two or more display screens, in traditional testing, each display screen of the electronic device is tested separately as an independent device in turn, which results in long testing time and low testing efficiency.

[0037] In view of this, the embodiments of the present application provide a display screen testing method and related equipment. By setting multi-screen configuration attributes, the corresponding target display screen to be tested can be flexibly configured for each test scenario, and then two or more target display screens to be tested can be configured in the test scenario at the same time, and by applying corresponding stresses to the two or more determined target display screens, the potential defects of the target display screen are accelerated to be exposed as early failures, thereby achieving the purpose of discovering and eliminating potential defects. This can save test time and improve test efficiency while ensuring the interception quality of potential defects.

[0038] The electronic device provided in the embodiments of the present application may be a mobile phone, a tablet computer, a desktop, a laptop, a notebook computer, an ultra-mobile personal computer (UMPC), a handheld computer, a netbook, a personal digital assistant (PDA), a wearable electronic device, a smart watch, a smart screen, and the like including two or more display screens. The present application does not impose any special restrictions on the specific form of the electronic device.

[0039] See also Figure 2 , exemplarily introduces the hardware structure of an electronic device provided in an embodiment of the present application. The electronic device 100 may include: a processor 110, an external memory interface 120, an internal memory 121, a universal serial bus (USB) interface 130, a charging management module 140, a power management module 141, a battery 142, a wireless communication module 150, a display screen 160, etc.

[0040] The processor 110 may include one or more processing units, for example, the processor 110 may include an application processor (AP), a modem processor, a graphics processor (GPU), an image signal processor (ISP), a controller, a memory, a video codec, a digital signal processor (DSP), a baseband processor, and / or a neural-network processing unit (NPU), etc. Different processing units may be independent devices or integrated into one or more processors.

[0041] The controller may be the nerve center and command center of the electronic device 100. The controller may generate an operation control signal according to the instruction operation code and the timing signal to complete the control of fetching and executing instructions.

[0042] The processor 110 may also be provided with a memory for storing instructions and data. In some embodiments, the memory in the processor 110 is a cache memory. The memory may store instructions or data that the processor 110 has just used or cyclically used. If the processor 110 needs to use the instruction or data again, it may be directly called from the memory. This avoids repeated access, reduces the waiting time of the processor 110, and thus improves the efficiency of the system.

[0043] In some embodiments, the processor 110 may include one or more interfaces. The interface may include an I2C interface, an inter-integrated circuit sound (I2S) interface, a pulse code modulation (PCM) interface, a universal asynchronous receiver / transmitter (UART) interface, a mobile industry processor interface (MIPI), a general-purpose input / output (GPIO) interface, a subscriber identity module (SIM) interface, and / or a USB interface, etc.

[0044] It is understandable that the interface connection relationship between the modules shown in this embodiment is only a schematic illustration and does not constitute a structural limitation on the electronic device 100. In other embodiments, the electronic device 100 may also adopt different interface connection methods in the above embodiments, or a combination of multiple interface connection methods.

[0045] The charging management module 140 is used to receive charging input from a charger. The charger can be a wireless charger or a wired charger. While the charging management module 140 charges the battery 142 , it can also power the electronic device 100 through the power management module 141 .

[0046] In some embodiments, when the electronic device 100 is used as a device under test, it can be connected to a connection end of the aging station through a corresponding charging interface such as the USB interface 130 to receive a charging input from the aging station.

[0047] The power management module 141 is used to connect the battery 142, the charging management module 140 and the processor 110. The power management module 141 receives input from the battery 142 and / or the charging management module 140, and provides power to the processor 110, the internal memory 121, the external memory, the display screen 160, and the wireless communication module 150. In some embodiments, the power management module 141 and the charging management module 140 can also be set in the same device.

[0048] The wireless communication module 150 can provide wireless communication solutions including WLAN (such as Wi-Fi), Bluetooth, global navigation satellite system (GNSS), frequency modulation (FM), near field communication (NFC), infrared (IR), etc., which are applied to the electronic device 100. For example, in the embodiment of the present application, the electronic device 100 can establish a Bluetooth connection with a terminal device (such as a wireless headset) through the wireless communication module 150.

[0049] The wireless communication module 150 may be one or more devices integrating at least one communication processing module. The wireless communication module 150 receives electromagnetic waves via an antenna, modulates and filters the electromagnetic wave signals, and sends the processed signals to the processor 110. The wireless communication module 150 may also receive a signal to be sent from the processor 110, modulate the frequency of the signal, amplify the signal, and convert it into electromagnetic waves for radiation via the antenna.

[0050] The electronic device 100 implements the display function through a GPU, a display screen 160, and an application processor. The GPU is a microprocessor for image processing, which connects the display screen 160 and the application processor. The GPU is used to perform mathematical and geometric calculations for graphics rendering. The processor 110 may include one or more GPUs that execute program instructions to generate or change display information.

[0051] The display screen 160 is used to display images, videos, etc. The display screen 160 may include a display panel. The display panel may be a liquid crystal display (LCD), an organic light-emitting diode (OLED), an active-matrix organic light-emitting diode or an active-matrix organic light-emitting diode (AMOLED), a flexible light-emitting diode (FLED), Miniled, MicroLed, Micro-oLed, a quantum dot light emitting diode (QLED), etc., which is not specifically limited in the present application.

[0052] In some embodiments of the present application, when the display panel is made of materials such as OLED, AMOLED, FLED, etc., the above Figure 2 The display screen 160 in the electronic device 100 can be bent. Here, the display screen 160 can be bent, which means that the display screen 160 can be bent to any angle along any axis at any part and can be maintained at the angle, for example, the display screen 160 can be folded in half from the middle to the left and right. It can also be folded in half from the middle to the top and bottom. In this application, a display screen that can be bent is referred to as a foldable display screen. Among them, the foldable display screen can be a single screen, or a display screen composed of multiple screens pieced together, which is not limited here. The display screen 160 of the electronic device 100 is a flexible screen. At present, the flexible screen has attracted much attention for its unique characteristics and huge potential. Compared with traditional screens, the flexible screen has the characteristics of strong flexibility and bendability, which can provide users with a new interaction method based on the bendable characteristics, and can meet users' more needs for electronic devices. For an electronic device 100 equipped with a foldable display screen, the foldable display screen on the electronic device 100 can be switched between a small screen in a folded form and a large screen in an unfolded form at any time. Therefore, users use the split screen function on the electronic device 100 equipped with a foldable display screen more and more frequently.

[0053] In an embodiment of the present application, the electronic device 100 may include N display screens 160, where N is an integer greater than 2. The electronic device 100 may be configured with two or more display screens 160 to provide a better display experience to the user. For example, the electronic device 100 may be provided with a folding screen on the inside and one or more other display screens 160 on the outside. In this way, when the electronic device 100 is in an unfolded state, the folding screen faces the user and provides a display function to the user. The folding screen may also be referred to as an inner screen. When the electronic device 100 is in a folded state, the display screen arranged on the outside (such as referred to as the outer screen) faces the user and provides a display function to the user.

[0054] In some embodiments, the display screen 160 may be a touch screen for receiving a user's touch.

[0055] In some embodiments, each display screen 160 may also be configured with a corresponding display driver integrated circuit (DDIC).

[0056] For example, Figure 2 As shown, taking the display screen 160 of the electronic device 100 including an inner screen and an outer screen as an example, the outer screen can be configured with a display driver chip DDIC-1, and the inner screen can be configured with a display driver chip DDIC-2.

[0057] The external memory interface 120 can be used to connect an external memory card, such as a Micro SD card, to expand the storage capacity of the electronic device 100. The external memory card communicates with the processor 110 through the external memory interface 120 to implement a data storage function, such as storing music, video and other files in the external memory card.

[0058] The internal memory 121 can be used to store computer executable program codes, and the executable program codes include instructions. The processor 110 executes various functional applications and data processing of the electronic device 100 by running the instructions stored in the internal memory 121. For example, in the present application, the processor 110 executes the display screen testing method provided in the present application by running the instructions stored in the internal memory.

[0059] The internal memory 121 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one disk storage device, a flash memory device, a universal flash storage (UFS), etc.

[0060] It should be understood that Figure 2The hardware structure of the electronic device 100 shown is only an example. The electronic device 100 of the embodiment of the present application may have more or fewer components than those shown in the figure, may combine two or more components, or may have different component configurations. The various components shown in the figure may be implemented in hardware, software, or a combination of hardware and software including one or more signal processing and / or application specific integrated circuits.

[0061] In addition, it should be understood that the electronic device 100 in the embodiment of the present application can implement different functions by installing different applications. For example, the electronic device 100 installs a test application, and implements a test on the electronic device 100, such as an aging test, through the test application. The test application can be, for example, an aging test application (also referred to as an aging APK) in a product aging test scenario, which is used to initiate an aging test.

[0062] The software system of the electronic device can adopt a layered architecture, an event-driven architecture, a microkernel architecture, a microservice architecture, or a cloud architecture.

[0063] See also Figure 3 , which illustrates the software structure of an electronic device.

[0064] The layered architecture divides the software into several layers, each with clear roles and division of labor. The layers communicate with each other through software interfaces. In some embodiments, the Android system is divided into five layers, from top to bottom: application layer, application framework layer, Android runtime and system library, hardware abstraction layer, kernel layer and hardware layer.

[0065] The application layer can include a series of application packages. Figure 3 As shown, the application package can include test, gallery, video and other applications.

[0066] On an electronic device production line, a test application can be used to trigger an electronic device to perform an aging test on its display screen, and corresponding stress can be applied to the activated display screen (the activated display screen is the display screen to be tested), thereby stimulating potential defects in the display screen and effectively intercepting electronic devices with early-stage display screen failures.

[0067] The application framework layer provides an application programming interface (API) and a programming framework for the applications in the application layer. The application framework layer includes some predefined functions.

[0068] like Figure 3As shown, the application framework layer may include a window manager service (WMS), a display manager (DMS), a content provider, a view system (views), a resource manager (resource manager), a notification manager, an activity manager (activity manager), and the like.

[0069] The window manager is used to manage window programs. The window manager can obtain the display screen size, determine whether there is a status bar, lock the screen, capture the screen, etc.

[0070] The display manager is used to manage the life cycle of the application's display. It can decide how to control its logical display based on the currently connected physical display device, and send notifications to the system and applications when the state changes.

[0071] Content providers are used to store and retrieve data and make it accessible to applications. This data can include video, images, audio, calls made and received, browsing history and bookmarks, phone books, etc.

[0072] The view system includes visual controls, such as controls for displaying text, controls for displaying images, etc. The view system can be used to build applications. A display interface can include one or more views. For example, a display interface including a text notification icon can include a view for displaying text and a view for displaying images.

[0073] The resource manager provides various resources for applications, such as localized strings, icons, images, layout files, video files, etc.

[0074] Android Runtime includes core libraries and virtual machines. Android runtime is responsible for scheduling and management of the Android system.

[0075] The core library consists of two parts: one part is the function that needs to be called by the Java language, and the other part is the Android core library.

[0076] The application layer and the application framework layer run in a virtual machine. The virtual machine executes the Java files of the application layer and the application framework layer as binary files. The virtual machine is used to perform functions such as object life cycle management, stack management, thread management, security and exception management, and garbage collection.

[0077] The system library can include multiple functional modules, such as graphics drawing module, surface manager, surface flinger, asset manager, media libraries, 3D graphics processing library (such as OpenGL ES), 2D graphics engine (such as SGL), etc.

[0078] The graphics drawing module is a module that draws and renders images before they are displayed on the interface. The graphics drawing module may include a drawing management module and a rendering module. The drawing management module can draw graphics on the canvas, that is, it can draw graphics through the CPU. The rendering module can render the drawn image through the GPU.

[0079] The graphics drawing module can call the 3D graphics processing library and 2D graphics engine, etc.

[0080] The 3D graphics processing library may be an open graphics library (Open Graphics Library, OpenGL), which is used to implement image rendering, etc. The 2D graphics engine may be SGL. A 2D graphics engine is a drawing engine for 2D (2-Dimensional, 2D) drawing. OpenGL refers to a professional graphics programming interface that defines a cross-programming language and cross-platform programming interface specification. It is used for 3D (3-Dimensional, 3D) images (2D images are also acceptable) and is a powerful, easy-to-call underlying graphics library. OpenGL ES is a subset of the OpenGL 3D graphics API, designed for embedded devices such as mobile phones and game consoles.

[0081] Surface Flinger is a system service that is responsible for processing and synthesizing upper-layer data and interacting with the display. That is, it can synthesize images based on the information provided by WMS, submit the synthesized information to the screen buffer, and wait for the display to map it to the screen. Surface Flinger uses the hardware compositor (HWC) or GPU to synthesize the display layer.

[0082] The interface manager is used to manage the display subsystem and provide fusion of two-dimensional and three-dimensional layers for multiple applications. The interface manager can obtain the Surface Flinger service, which is the core of the graphical user interface (GUI) and is responsible for mixing and outputting the graphics data of all applications to the buffer stream in sequence.

[0083] The asset manager is used to load resource classes.

[0084] The media library supports playback and recording of a variety of commonly used audio and video formats, as well as static image files, etc. The media library can support a variety of audio and video encoding formats, such as: MPEG4, H.264, MP3, AAC, AMR, JPG, PNG, etc.

[0085] The hardware abstraction layer (HAL) is an interface layer between the operating system kernel and the hardware circuit. It provides a virtual hardware platform for the operating system to control the actions of hardware devices. Figure 3 As shown, the hardware abstraction layer may include a hardware composer (HWC), production services, a frame buffer, a mouse interface, a keyboard interface, a Bluetooth interface, a GPS interface, a WiFi interface, an audio and video interface, a call interface, etc.

[0086] The hardware synthesizer is used to perform the final synthetic display on the graphics data buffer stream synthesized by Surface Flinger.

[0087] HWC can work with SurfaceFlinger to composite the surface onto the screen. Assume that the screen orientation of the electronic device is vertical, and the status bar is at the top. HWC is the hardware abstraction of the display controller system, and SurfaceFlinger will delegate some of the composite work to HWC to reduce the GPU load. This will consume less power than simply compositing through the GPU.

[0088] The frame buffer is a graphics buffer stream synthesized by the Surface Flinger service. The Surface Flinger service draws the application's user interface by writing content to the frame buffer.

[0089] The production service can be used to implement communication between the test application at the application layer and the display driver at the kernel layer. For example, during the test process, the test application can transmit the test scenario to the display driver through the production service.

[0090] The kernel layer is a layer between hardware and software. The kernel layer is used to drive the hardware to make the hardware work. The kernel layer at least includes display driver, screen driver, graphics processing unit (GPU) driver, charging driver and sensor driver, etc., which are not limited in the embodiments of the present application. For example, the screen driver can drive the screen to turn on or off.

[0091] The display driver can control the display screen to map the data synthesized in Surface Flinger to the screen. Specifically, the display driver is used to drive the display driver chip of the hardware layer to complete the processing and implementation of the display.

[0092] Charging drivers are used to manage and control the charging process of electronic devices.

[0093] The hardware layer is the hardware of the electronic device, which may include display driver chips, display screens, CPUs, and GPUs.

[0094] It is understandable that the electronic device may include two or more display screens, and each display screen may also be configured with a corresponding display driver chip.

[0095] Understandably, Figure 3 The layers in the software structure shown and the components contained in each layer do not constitute a specific limitation on the electronic device. In other embodiments of the present application, the electronic device may include more or fewer layers than shown in the figure, and each layer may include more or fewer components, which is not limited in the present application.

[0096] It should be noted that although the embodiments of the present application are based on The system is used as an example to illustrate, but its basic principles are also applicable to the Hongmeng system or Electronic devices with other operating systems.

[0097] The following is an exemplary introduction to a display screen testing method provided in an embodiment of the present application, which is applied to an electronic device, and the electronic device may include N display screens, where N is an integer greater than or equal to 2. The display screen testing method may include the following steps S41 to S46.

[0098] See also Figure 4 , which exemplarily introduces the process of display screen testing provided in an embodiment of the present application.

[0099] Step S41, obtaining the test configuration of the current test scenario.

[0100] In an embodiment of the present application, the electronic device can perform an aging test on the display screen to detect whether there is any abnormality in the display screen after the aging test, such as detecting whether the display screen has aging phenomena, which may include but is not limited to: the screen has different degrees of degradation in details, color, brightness, etc.

[0101] In the embodiment of the present application, test items for aging test of the display screen can be pre-constructed. Specifically, test items for aging test of the display screen can be constructed according to possible faults of the display screen in the early fault period.

[0102] Exemplarily, the display screen may present vertical bright lines and dark lines, thereby constructing a vertical line test item. When the electronic device executes the vertical line test item, it can be determined that the current test scene is a vertical line test scene. The vertical line test scene is used to detect whether the display screen presents vertical bright lines and dark lines due to a fault (hardware fault) after the corresponding stress is applied to the display screen.

[0103] For another example, a display screen may present horizontal bright lines and dark lines, thereby constructing a horizontal line test item. When an electronic device executes a horizontal line test item, it can be determined that the current test scenario is a horizontal line test scenario. The horizontal line test scenario is used to detect whether the display screen presents horizontal bright lines and dark lines due to a fault after a corresponding stress is applied to the display screen.

[0104] For another example, the display screen may show video playback anomalies, such as being unable to play, etc., thereby constructing a video playback test item. When the electronic device executes the video playback test item, it can be determined that the current test scene is a video playback test scene. The video playback test scene is used to detect whether the display screen can still play the video normally after applying the corresponding stress to the display screen.

[0105] It can be understood that the scenario for performing aging testing on the display screen can be set according to actual conditions, and corresponding test items can be set according to actual conditions. This application does not make specific limitations on this.

[0106] In the embodiment of the present application, each scenario of the aging test on the display screen has its corresponding test configuration. The test configuration is used to indicate the test object and test parameters in the test scenario. The test parameters may include but are not limited to: test duration, test method and state of the test object.

[0107] The test duration may be the test duration of each test object or the total test duration of all test objects in the test scenario. The test mode may be used to indicate whether to test all test objects simultaneously or in sequence when the number of test objects is greater than or equal to 2. When testing all test objects in sequence, the test mode may also indicate the test sequence of each test object. The state of the test object includes the display brightness of the test object, etc. For example, the test object may be indicated to be displayed at the maximum brightness or at the minimum brightness.

[0108] Step S42, obtaining a multi-screen configuration attribute of the test configuration, where the multi-screen configuration attribute is used to indicate a target display screen to be tested in the current test scenario.

[0109] In an embodiment of the present application, the test configuration provides a multi-screen configuration attribute, and the multi-screen configuration attribute is used to indicate the target display screen to be tested in the current test scenario. Through the multi-screen configuration attribute, the corresponding target display screen to be tested can be flexibly configured for each test scenario, thereby improving the flexibility of the test. Through the multi-screen configuration attribute, two or more target display screens to be tested can be configured for the test scenario at the same time, thereby saving test time and improving test efficiency while ensuring the interception quality of potential defects.

[0110] In an embodiment of the present application, the test configuration can be implemented as a configuration file. Exemplarily, the electronic device includes an inner screen, an outer screen and a third screen, and the inner screen is defined as having a logical id of 0, an outer screen as having a logical id of 1, and a third screen as having a logical id of 2. A multi-screen configuration attribute (multi Screen) is provided in the configuration file, and the value assigned to the multi-screen configuration attribute is of Byte type. The multi-screen configuration attribute corresponding to the inner screen is bit0, the multi-screen configuration attribute corresponding to the outer screen is bit1, and the multi-screen configuration attribute corresponding to the third screen is bit2. For the vertical line test scenario, it is determined that the target display screens to be tested are the inner screen and the outer screen, and the Byte values ​​of the inner screen bit0 and the outer screen bit1 in the multi-screen configuration attributes are set to 1, indicating that the inner screen and the outer screen are tested. The bit positions of other display screens in the multi-screen configuration attributes are set to 0, indicating that they are not tested. Finally, the multi-screen configuration attribute mulltiScreen = "cfg = 3" obtained in the vertical line test scenario, where the binary value of 3 is: 00000011. The binary value "00000011" indicates the bit positions of the inner screen, outer screen and the third screen from right to left. It can be obtained that the Byte values ​​of the inner screen bit0 and the outer screen bit1 are set to 1.

[0111] Step S43: determining M target display screens to be tested among the N display screens according to the multi-screen configuration attributes, where M is an integer greater than or equal to 2, and M is less than or equal to N.

[0112] In an embodiment of the present application, the electronic device obtains the test configuration under the current test scenario in step S41, and obtains the multi-screen configuration attributes of the test configuration in step S41 in step S42. Then, in step S43, the M target display screens to be tested among the N display screens of the electronic device can be determined according to the multi-screen configuration attributes obtained in step S42.

[0113] As in the above example, according to the multi-screen configuration attribute multiScreen = "cfg = 3", it can be determined that the Byte values ​​of the inner screen bit0 and the outer screen bit1 are set to 1, then the target display screens to be tested among the three display screens (inner screen, outer screen and third screen) of the electronic device are the inner screen and the outer screen respectively.

[0114] Step S44, obtaining screen information of M target display screens.

[0115] The screen information may include, but is not limited to, physical identification (sensor cell identification, sensor cell ID) information of the display screen and the resolution of the display screen.

[0116] It can be understood that each display screen has its corresponding unique logical ID, and each display screen has its corresponding unique physical identification information. The logical ID of the same display screen corresponds to its physical identification information.

[0117] The above physical identification information may also be referred to as a physical ID or physical identification ID information. The physical ID of the display screen may be used when an upper-layer application calls the device.

[0118] Step S45, controlling the display of the M target display screens according to the screen information of the M target display screens.

[0119] In an embodiment of the present application, the electronic device can call the target display screen according to the physical ID number of the target display screen, and then control the display of the target display screen.

[0120] In the embodiment of the present application, the electronic device can control the M target display screens to display simultaneously, and then can apply corresponding stresses to the M target display screens simultaneously. It is also possible to first control a portion of the target display screens among the M target display screens to display, and apply corresponding stresses to the displayed portion of the target display screens, and then control another portion of the target display screens among the M target display screens to display, and apply corresponding stresses to the displayed portion of the target display screens, which is not specifically limited in the embodiment of the present application.

[0121] In some embodiments, the electronic device controlling the M target display screens to display may also include controlling the state of the target display screens, such as controlling the brightness of the target display screens. The electronic device controlling the M target display screens to display may also include controlling the content displayed on the target display screens, such as controlling the target display screens to display a reloaded image.

[0122] Step S46: applying corresponding stresses to the M target display screens according to the current test scenario.

[0123] The stress applied to the display screen may include, but is not limited to, electrical stress, temperature stress, humidity stress, etc.

[0124] It is understandable that the stress to be applied can be set according to the test scenario, and this application does not make any specific limitation to this.

[0125] In the embodiment of the present application, the electronic device can apply corresponding stresses to the M target display screens displayed according to the current test scenario. That is, in different test scenarios, the target display screens tested may be different, and the applied stresses may also be different, such as different types of applied stresses or different amounts of applied stresses.

[0126] The stress applied to the target display screen may be applied by the electronic device itself, or may be applied by the electronic device controlling an external device to the target display screen.

[0127] Taking the application of temperature stress to the target display screen as an example, the electronic device can put itself in a high-load, high-power consumption scenario, such as the processor calls (or frequently calls) high processing power, the operating frequency of the processor increases, and the power consumption of the processor increases accordingly, increasing the temperature of the electronic device, thereby achieving the application of temperature stress to its own target display screen. The electronic device can also achieve the application of temperature stress to the target display screen by allowing the external device to adjust the temperature of the external environment where the electronic device is located based on the communication connection with the external device.

[0128] In the embodiment of the present application, the electronic device may further include a display driver chip. When the electronic device itself applies corresponding stress to its target display screen, the electronic device applies corresponding electrical stress to the target display screen through the display driver chip according to the current test scenario, and the electrical stress may include but is not limited to: voltage and current.

[0129] It can be understood that for display screens, electrical stress has a great impact on the reliability of display screen materials. The life and failure rate of display screen materials are closely related to the electrical stress they bear. Reducing the electrical stress they bear can improve their reliability during use. Therefore, by applying corresponding electrical stress to the display screen, the aging speed of the display material of the display screen can be stimulated, so that the display screen with aging phenomenon can be detected.

[0130] In an embodiment of the present application, after corresponding stress is applied to the M target display screens, and after a preset time (such as test duration) or a preset number of cycles is reached, the target display screens can be inspected to determine whether there are any abnormalities (such as aging phenomena) in the target display screens after the aging test.

[0131] Exemplarily, after applying corresponding stress to the M target display screens, and reaching a preset time (such as test duration) or a preset number of cycles, the target display screen can be subjected to an electrostatic test through a display driver chip, and the electrostatic test data can be stored in a register of the display driver chip. The processor of the electronic device can read the electrostatic test data from the register of the display driver chip through the mobile industry processor interface protocol (MIPI), and determine the state of the display screen based on the result of the read data, so as to judge the result of the aging test of the display screen. The test application can display the results of the aging test. For example, the results after each test scene are displayed.

[0132] In other embodiments, after applying corresponding stresses to the M target display screens, and after a preset time (such as test duration) or a preset number of cycles, technicians can inspect the target display screens after the aging test to determine whether there are any abnormalities in the target display screens after the aging test.

[0133] In some embodiments, controlling the display of M target display screens according to screen information of the M target display screens includes: controlling the M target display screens to display simultaneously according to the screen information of the M target display screens; when controlling the M target display screens to display simultaneously, applying corresponding stresses to the displayed M target display screens according to the current test scenario includes: applying corresponding stresses to the M target display screens displayed simultaneously according to the current test scenario.

[0134] As in the above example, it is determined that the target display screens in the current test scenario are the inner screen and the outer screen, the physical IDs of the inner screen and the outer screen are obtained, and the inner screen and the outer screen are started according to the physical IDs of the inner screen and the outer screen to control the inner screen and the outer screen to display simultaneously. When the inner screen and the outer screen are controlled to display simultaneously, the stress corresponding to the current test scenario can be applied to the inner screen and the outer screen that are displayed simultaneously according to the current test scenario.

[0135] In some embodiments, controlling the display of M target display screens according to the screen information of the M target display screens includes: controlling the order of display of the M target display screens and controlling the corresponding display duration of the target display screens according to the screen information of the M target display screens and the test configuration; applying corresponding stresses to the displayed M target display screens according to the current test scenario includes: applying corresponding stresses to the currently displayed target display screen according to the current test scenario.

[0136] As mentioned above, the test configuration can indicate the test mode, that is, the order in which the test objects are tested, and the order in which the target display screens are displayed.

[0137] As in the above example, it is determined that the target display screens in the current test scenario are the inner screen and the outer screen. The test configuration can indicate that the inner screen is displayed for half an hour first, and then the outer screen is displayed for half an hour. The electronic device obtains the physical IDs of the inner and outer screens, and starts the inner screen according to the physical ID of the inner screen to control the display of the inner screen for half an hour. When the inner screen is displayed, the stress corresponding to the current test scenario can be applied to the displayed inner screen according to the current test scenario. After the inner screen is displayed for half an hour, the inner screen is turned off and the external screen is started to control the display of the external screen for half an hour. When the external screen is displayed, the stress corresponding to the current test scenario can be applied to the displayed external screen according to the current test scenario.

[0138] It is understandable that the only target display screen to be tested can also be configured through the multi-screen configuration attributes. When the electronic device includes two or more display screens, the only target display screen to be tested in each test scenario can be flexibly configured based on the multi-screen configuration attributes, thereby improving the flexibility of the test.

[0139] In some embodiments, a unique target display screen to be tested among N display screens is determined according to the multi-screen configuration attributes, screen information of the unique target display screen is obtained, display of the unique target display screen is controlled according to the screen information of the unique target display screen, and corresponding stress is applied to the unique target display screen according to the current test scenario.

[0140] In some embodiments, a unique target display screen to be tested among N display screens is determined based on multi-screen configuration attributes; screen information of the unique target display screen is obtained; test resources of the current test scene are obtained; based on the screen information of the unique target display screen, the unique target display screen is controlled to display a picture or video corresponding to the test resources; and corresponding stress is applied to the displayed unique target display screen based on the current test scene.

[0141] In some embodiments, see Figure 5 Step S45 may specifically include the following steps:

[0142] Step S51, obtaining the test resources of the current test scenario.

[0143] In the embodiment of the present application, when performing an aging test on a display screen, corresponding test resources may be configured for individual test scenarios, and the test resources may include, but are not limited to, pictures and videos. Among them, the pictures may be heavy-loaded pictures.

[0144] In some embodiments, the test resources may also include application programs, such as game applications. For example, in a specific test scenario, the electronic device may be instructed to run the game application so that the display screen displays an interface when the game application is running.

[0145] Step S52: According to the screen information of the M target display screens, the M target display screens are controlled to display the pictures or videos corresponding to the test resources.

[0146] In an embodiment of the present application, in the current test scenario, the test configuration can indicate the test resources that each target display screen needs to display, such as indicating that a part of the target display screens display pictures and another part of the display screens display videos, and can also indicate M target display screens to display pictures or videos at the same time.

[0147] In some embodiments, see Figure 6 Step S52 may specifically include the following steps:

[0148] Step S61: starting the corresponding M target display screens according to the physical IDs of the M target display screens.

[0149] Step S62, for the activated target display screen, controlling the target display screen to display a picture or video of a corresponding resolution.

[0150] The resolutions of the N display screens included in the electronic device can be different or the same. When the resolutions of the display screens of the electronic device are different, pictures or videos of corresponding resolutions can be displayed based on the resolutions of each display screen. For example, if the resolution of the inner screen is 1280*2800 and the resolution of the outer screen is 1080*2400, the inner screen can be controlled to display pictures or videos corresponding to 1280*2800, and the outer screen can display pictures or videos corresponding to 1080*2400.

[0151] In some embodiments, see Figure 7 The display screen testing method provided in the embodiment of the present application may also include the following steps:

[0152] Step S71, obtaining the total test duration of the test configuration.

[0153] After obtaining the test configuration of the current test scenario in step S41, the total test duration of the test configuration can be obtained. The total test duration indicates the total test duration required for the current test scenario. When M target display screens are indicated to be displayed simultaneously in the current test scenario, the total test duration indicates the total duration of the M target display screens being displayed simultaneously. When M target display screens are indicated to be displayed sequentially in the current test scenario, the total test duration indicates the sum of the durations of the display of the M target display screens.

[0154] Step S72, obtaining the temperature of the electronic device.

[0155] The electronic device includes a temperature sensor, and the temperature of the electronic device can be obtained through the temperature sensor.

[0156] Step S73: when the temperature of the electronic device reaches a preset threshold, the operation of the electronic components in the electronic device is controlled according to the total test duration.

[0157] It is understandable that when the temperature of an electronic device reaches a certain value, it will trigger the electronic device to shut down, which will in turn affect the aging test of the target display screen.

[0158] When the temperature of the electronic device reaches a preset threshold, it can be used to indicate that the temperature of the electronic device is too high, which may trigger the electronic device to shut down. The preset threshold can be set according to actual conditions, and this application does not make specific restrictions on this.

[0159] Among them, "controlling the operation of electronic devices in the electronic device according to the total test duration" can control the operation of devices such as cameras and graphics processors in the electronic device, and can also control the threads or processes running in the electronic device.

[0160] When the temperature of an electronic device reaches a preset threshold, the display of the target display screen can be prioritized, and the operation of other devices or threads or processes can be turned off or stopped.

[0161] In another embodiment, when the temperature of the electronic device reaches a preset threshold, if it is detected that the difference between the current test duration and the total test duration exceeds the preset difference, the display of the target display screen is prioritized, and the operation of other devices, threads or processes is turned off or stopped. If it is detected that the difference between the current test duration and the total test duration does not exceed the preset difference, that is, the aging test of the target display screen can be completed before the electronic device is shut down, then the operation of the electronic device, thread or process in the electronic device may not be controlled.

[0162] See also Figure 8 , a display screen testing method flow provided by an embodiment of the present application is exemplarily introduced. Take the test application including components, test queues, multi-screen management state machine and fault excitation module as an example.

[0163] A component is a component in a test application, which includes a configuration file of the test application. The configuration file records the test configuration, including the test configuration of each device. It can also include the test resources required for each test scenario.

[0164] The test queue is a middleware used to monitor and manage test tasks and arrange the test tasks in time sequence. The test queue records the test tasks that are being executed and waiting to be executed.

[0165] The multi-screen management state machine is used to determine the target display screen according to the current test scenario. It can also be used to control the display of the target display screen.

[0166] The fault excitation module is used to trigger the display driver to apply corresponding stress to the target display screen that is displaying according to the current test scenario.

[0167] The display module includes the application layer, hardware abstraction layer, and display-related modules in the kernel layer, such as the window manager, interface manager, hardware synthesizer, and display driver.

[0168] Step S801: The test application is started and the test task is added to the test queue.

[0169] In an embodiment of the present application, an electronic device may be installed with a test application. The test application may be used to perform an aging test on each electronic device of the electronic device. The electronic devices of the electronic device may include, but are not limited to, a display screen, a memory, a microphone, etc. For each electronic device to be tested, a test item for performing an aging test on the electronic device may be pre-constructed. The relevant contents of the test items may refer to the above, and will not be repeated here.

[0170] In some embodiments, the electronic device can display each test item, so that the user can manage the test configuration corresponding to the test item. Fig. 9 As shown, the electronic device 100 displays a display screen aging test interface 900. The display screen aging test interface 900 includes a vertical line test item 901, a horizontal line test item 902, and a video playback test item 903. The vertical line test item 901, the horizontal line test item 902, and the video playback test item 903 are used to perform corresponding vertical line tests, horizontal line tests, and video playback tests, respectively.

[0171] When a user clicks on a test item, he can enter the interface of the test item. The test configuration of the test item is displayed on the interface of the test item. Thus, the user can adjust the test configuration of the test item, such as adjusting the test object and test parameters in the test scene. Exemplarily, when a user clicks on the vertical line test item 901, he can enter the vertical line test item interface, and the configured target object to be tested, test duration, test method and brightness of the test object are displayed on the vertical line test item interface. The user can adjust the content on the vertical line test item interface, such as adjusting the target object to be tested from the inner screen and the outer screen to the inner screen, the outer screen and the third screen.

[0172] In some embodiments, the user can select the above test items to control the electronic device to perform the corresponding test items. For example, for an aging test of a display screen, if the user only selects the vertical line test item and the horizontal line test item, the vertical line test and the horizontal line test will be performed on the display screen.

[0173] It is understandable that the user can also adjust the device to be tested and the test items of the device through the test application, including but not limited to: adding, deleting and modifying.

[0174] Each test item corresponds to a test task. For example, in the vertical line test item, the electronic device executes the vertical line test item, that is, the electronic device executes the vertical line test task, and the current test scenario is the vertical line test scenario.

[0175] After the test application is started, a test task is created and added to the test queue. It can be understood that after the electronic device starts the test application, the test application creates a test task according to its own internal logic and adds the test task to the test queue.

[0176] In an exemplary embodiment, when the electronic device is powered on and enters the test station, the production line system can automatically send a test application startup instruction to the electronic device, and the electronic device starts the test application after receiving the instruction. Taking the aging test application as an example, when the electronic device enters the aging test station, the production line system can automatically send a aging test application startup instruction to the electronic device, and the electronic device starts the aging test application after responding to the instruction.

[0177] In another exemplary embodiment, the test application may also be manually started by a tester. In other embodiments, the test application may be started by a manipulator on a production line. The embodiments of the present application do not impose any special restrictions on the way the test application is started.

[0178] Step S802, obtaining the current test task from the test queue.

[0179] The multi-screen management state machine and the fault excitation module obtain the test task being executed from the test queue, and the test task being executed is the current test task.

[0180] Step S803, determining the current test scenario according to the current test task.

[0181] The multi-screen management state machine and the fault excitation module determine the current test scenario according to the current test task. If the current test task is a vertical line test task, the current test scenario is a vertical line test scenario.

[0182] Step S804: Acquire the test configuration and test resources of the current test scenario.

[0183] In an embodiment of the present application, a configuration file is stored in a component of the test application, and the configuration file includes a test configuration corresponding to a test item. In some embodiments, the component of the test application may also indicate a test resource. For example, the configuration file may also include a test resource corresponding to a test item. The multi-screen management state machine obtains the test configuration and the test resource from the component.

[0184] It is understandable that in some test scenarios, no corresponding test resources are configured. Then in step S804, the multi-screen management state machine obtains the test configuration of the current test scenario.

[0185] Step S805: obtaining the multi-screen configuration attributes of the test configuration.

[0186] The multi-screen management state machine obtains the multi-screen configuration attributes of the test configuration.

[0187] Step S806: determining M target display screens to be tested among the N display screens according to the multi-screen configuration attributes.

[0188] The multi-screen management state machine determines M target display screens to be tested among the N display screens according to the multi-screen configuration attributes.

[0189] The contents of step S805 and step S806 can refer to the above-mentioned step S42 and step S43, which will not be repeated here.

[0190] Step S807: drawing display data of the target display screen through the display module.

[0191] The test application can control the display of the target display screen through the display module, including but not limited to: controlling the test resources loaded on the target display screen, controlling the display brightness of the target display screen, and controlling powering on and / or off of the target display screen.

[0192] After the test application builds the target display screen required to be displayed in the current test scenario and the content and status required to be displayed on the target display screen according to the current test task currently being executed, the display data required to be displayed on the target display screen is drawn by the display module. Please refer to the above and will not repeat it here.

[0193] Step S808: transmitting display data of each target display screen.

[0194] The display module can draw a window according to the screen information of the target display screen, and can also draw the display data of the target display screen according to the test resources, and then transmit the display data of each target display screen to the display driver.

[0195] Step S809: transmitting the current test scenario.

[0196] The fault excitation module transmits the current test scenario to the display driver through the production service.

[0197] Step S810, controlling the display of the target display screens according to the display data of each target display screen, and applying corresponding stress to the displayed target display screens according to the current test scenario.

[0198] The display driver controls the display of the target display screen according to the display data of each target display screen, and applies corresponding stress to the displayed target display screen according to the current test scenario.

[0199] In some embodiments, the test application sends the screen information of the target display screen to be tested to the hardware abstraction layer and the driver layer, and the display driver simultaneously applies voltage, brightness and other stresses to the target display screen corresponding to the received screen information to stimulate potential defects. For example, in the vertical line test scenario: after the upper-layer test application builds two display screens, the inner screen and the outer screen, to display the corresponding overloaded images at the same time, the interface of the hardware abstraction layer is used to notify the screen information of the inner screen and the outer screen to be tested, and the interface for sending stress is dispatched at the same time, so as to achieve the effect of stimulating and intercepting vertical line faults.

[0200] In other embodiments, the display driver may directly apply stress corresponding to the test scenario to the target display screen currently being displayed according to the current test scenario.

[0201] It is understandable that the display driver can apply corresponding stress to the target display screen according to the current test scenario. The actual stress of the display driver on the target display screen may vary from manufacturer to manufacturer, and this application does not make specific limitations on this.

[0202] The embodiment of the present application also provides a computer program product. When the computer program product is run on a computer, the computer is enabled to execute the above-mentioned related steps to implement the testing methods in the above-mentioned method embodiments.

[0203] An embodiment of the present application also provides a computer storage medium, including computer instructions. When the computer instructions are executed on an electronic device, the electronic device executes the test method as described in the above embodiment.

[0204] Among them, the electronic device, computer storage medium, computer program product or charging system provided in the embodiments of the present application are all used to execute the corresponding methods provided above. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding methods provided above, and will not be repeated here.

[0205] Through the description of the above implementation methods, technical personnel in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional modules is used as an example. In actual applications, the above-mentioned functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above.

[0206] In the several embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another device, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0207] The unit described as a separate component may or may not be physically separated, and the component shown as a unit may be one physical unit or multiple physical units, that is, it may be located in one place or distributed in multiple different places. Some or all of the units may be selected according to actual needs to achieve the purpose of the embodiment.

[0208] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0209] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a readable storage medium. Based on this understanding, the technical solution of the embodiment of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, which is stored in a storage medium, including several instructions to enable a device (which can be a single-chip microcomputer, chip, etc.) or a processor (processor) to perform all or part of the steps of each embodiment method of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (Read-Only Memory, ROM), random access memory (Random Access Memory, RAM), disk or optical disk and other media that can store program code.

[0210] The above are only specific implementation methods of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions within the technical scope disclosed in the present application should be included in the protection scope of the present application.

Claims

1. A display screen testing method, characterized in that: Applied to an electronic device, the electronic device includes N display screens, N is an integer greater than or equal to 2, and the method includes: Get the test configuration of the current test scenario; Acquire a multi-screen configuration attribute of the test configuration, where the multi-screen configuration attribute is used to indicate a target display screen to be tested in the current test scenario; Determine M target display screens to be tested among the N display screens according to the multi-screen configuration attributes, where M is an integer greater than or equal to 2, and M is less than or equal to N; Obtaining screen information of M target display screens; Controlling the display of the M target display screens according to the screen information of the M target display screens; Corresponding stresses are applied to the M target display screens displayed according to the current test scenario.

2. The method according to claim 1, characterized in that: The controlling the display of the M target display screens according to the screen information of the M target display screens comprises: Controlling the M target display screens to display simultaneously according to the screen information of the M target display screens; When the M target display screens are controlled to display simultaneously, applying corresponding stresses to the M target display screens displayed according to the current test scenario includes: According to the current test scenario, corresponding stresses are simultaneously applied to the M target display screens that are displayed simultaneously.

3. The method according to claim 1 or 2, characterized in that: The method further comprises: Obtain the total test duration of the test configuration; Acquiring the temperature of the electronic device; When the temperature of the electronic device reaches a preset threshold, the operation of the electronic components in the electronic device is controlled according to the total test duration.

4. The method according to claim 1, characterized in that: The controlling the display of the M target display screens according to the screen information of the M target display screens comprises: According to the screen information of the M target display screens and the test configuration, controlling the order in which the M target display screens are displayed and controlling the corresponding display duration of the target display screens; The applying corresponding stress to the M target display screens displayed according to the current test scene comprises: According to the current test scenario, corresponding stress is applied to the target display screen currently being displayed.

5. The method according to any one of claims 1 to 4, characterized in that: The controlling the display of the M target display screens according to the screen information of the M target display screens further comprises: Obtaining test resources for the current test scenario; According to the screen information of the M target display screens, the M target display screens are controlled to display the pictures or videos corresponding to the test resources.

6. The method according to any one of claims 1 to 5, characterized in that: The screen information includes a physical ID and a resolution of a target display screen, and controlling the M target display screens to display pictures or videos corresponding to the test resources according to the screen information of the M target display screens includes: Start the corresponding M target display screens according to the physical IDs of the M target display screens; For the activated target display screen, the target display screen is controlled to display a picture or video of a corresponding resolution.

7. The method according to claim 1, characterized in that: The method further comprises: Determine a unique target display screen to be tested among the N display screens according to the multi-screen configuration attributes; Acquiring screen information of the unique target display screen; Obtaining test resources for the current test scenario; According to the screen information of the unique target display screen, controlling the unique target display screen to display the picture or video corresponding to the test resource; A corresponding stress is applied to the displayed only target display screen according to the current test scenario.

8. The method according to any one of claims 1 to 6, characterized in that: The electronic device further comprises a display driver chip, and each display screen is configured with a corresponding display driver chip; The applying corresponding stress to the M target display screens displayed according to the current test scene comprises: According to the current test scenario, corresponding electrical stress is applied to the target display screen through the display driver chip.

9. An electronic device, characterized in that: The electronic device comprises a memory and a processor, the memory is connected to the processor, the memory is used to store a computer program, and the processor is used to implement the method as claimed in any one of claims 1 to 8 when executing the computer program.

10. A computer storage medium, characterized in that: The method comprises computer instructions, and when the computer instructions are executed on an electronic device, the electronic device executes the method as claimed in any one of claims 1 to 8.

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