Method for determining acceleration factor of electronic equipment

Abstract

The invention relates to the technical field of accelerated life tests of electronic equipment, and discloses a method for determining an acceleration factor of electronic equipment in order to solve the problem that the accuracy of the acceleration factor in a reliability accelerated life test scheme is not high. The method comprises the steps that the environment temperature of the electronic equipment under the normal working condition and the environment temperature of the electronic equipment under the acceleration test condition are acquired; determining the type number of the components in the electronic equipment, the number of the components of the same type and the activation energy of each component; determining a first acceleration factor of the electronic equipment; determining a second acceleration factor of the electronic equipment; based on a scoring result obtained by scoring the first acceleration factor and the second acceleration factor through an expert scoring method, a target acceleration factor is determined, and the target acceleration factor is used for carrying out an accelerated life test of the electronic equipment. By adopting the method, the accuracy of the acceleration factor of the electronic equipment in the reliability accelerated life test can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of accelerated life test of electronic equipment, and more specifically, to a method for determining an acceleration factor of an electronic equipment. Background Art

[0002] Product reliability refers to the performance of a product in completing a specific function under specified conditions and within a specified time. The mean time between failures and service life are usually used to measure product reliability.

[0003] For equipment with high reliability and long service life, sufficient reliability special tests are carried out in strict accordance with the GJB899A "Reliability Identification and Acceptance Test" test standard. The test time is long and the test cost is high. How to design an effective reliability accelerated life test plan to guide engineering personnel to fully and scientifically assess the reliability of the tested electronic equipment within a shorter test time has always been the focus of research for personnel in related fields. A key point in designing a reliability accelerated life test plan is to determine the acceleration factor.

[0004] The current method for determining the acceleration factor in the reliability accelerated life test program has the defect that the acceleration factor is not accurate enough. Summary of the invention

[0005] In order to solve the above problems, the present invention provides a method for determining an acceleration factor of an electronic device, which will improve the accuracy of the acceleration factor of the electronic device, thereby reducing the reliability accelerated life test time and test cost of the electronic device.

[0006] To achieve the above object, the present invention provides a method for determining an acceleration factor of an electronic device, the method comprising:

[0007] Obtain the ambient temperature of the electronic equipment under normal working conditions and the ambient temperature under accelerated test conditions;

[0008] Determine the number of component types, the number of components of the same type, and the activation energy of each component in an electronic device;

[0009] Determine the first acceleration factor of the electronic device according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the number of types of components in the electronic device, the number of components of the same type and the activation energy of each component, and the failure rate of each component of the same type;

[0010] Determine the second acceleration factor of the electronic device based on the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the types and number of components in the electronic device, the number of components of the same type, and the activation energy of each component;

[0011] Based on the scoring results of the first acceleration factor and the second acceleration factor using the expert scoring method, a target acceleration factor is determined, and the target acceleration factor is used for performing an accelerated life test of the electronic equipment.

[0012] Furthermore, based on the scoring results of the first acceleration factor and the second acceleration factor using the expert scoring method, the target acceleration factor is determined, including determining the weight coefficients of the first acceleration factor and the second acceleration factor based on the scoring results of the first acceleration factor and the second acceleration factor using the expert scoring method; and performing weighted summation of the first acceleration factor and the second acceleration factor according to the weight coefficients of the first acceleration factor and the second acceleration factor to obtain the target acceleration factor.

[0013] Furthermore, based on the scoring results of the first acceleration factor and the second acceleration factor using the expert scoring method, the weight coefficients of the first acceleration factor and the second acceleration factor are determined, including obtaining multiple first scoring results, the first scoring result being the score given by each expert to the first acceleration factor; obtaining multiple second scoring results, the second scoring result being the score given by each expert to the second acceleration factor; summing the sum of the multiple first scoring results and the sum of the multiple second scoring results to obtain a comprehensive scoring result; taking the ratio of the sum of the multiple first scoring results to the comprehensive scoring result as the weight coefficient of the first acceleration factor; taking the ratio of the sum of the multiple second scoring results to the comprehensive scoring result as the weight coefficient of the second acceleration factor.

[0014] Further, according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the types and number of components in the electronic device, the number of components of the same type and the activation energy of each component, and the failure rate of each component in the components of the same type, a first acceleration factor of the electronic device is determined, including determining the failure rate of each type of component according to the failure rate of each component in the components of the same type and the number of components of the same type in the electronic device; determining the failure rate of the electronic device according to the failure rate of each type of component and the types and number of components in the electronic device; determining the acceleration factor of each component according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, and the activation energy of each component; determining the first acceleration factor of the electronic device according to the failure rate of each type of component, the failure rate of the electronic device, the types and number of components in the electronic device, and the acceleration factor of each component.

[0015] Furthermore, the acceleration factor of each component is determined based on the ambient temperature of the electronic device under normal working conditions, the ambient temperature under accelerated test conditions, and the activation energy of each component, including determining the acceleration factor of each component based on the Arrhenius model, the ambient temperature of the electronic device under normal working conditions, the ambient temperature under accelerated test conditions, and the activation energy of each component.

[0016] Further, determining a first acceleration factor of the electronic device according to the failure rate of each type of component, the failure rate of the electronic device, the number of types of components in the electronic device, and the acceleration factor of each component includes:

[0017]

[0018] in, is the first acceleration factor of electronic equipment, λ i is the failure rate of the ith component under accelerated test conditions, λ s is the failure rate of the electronic equipment, A i is the acceleration factor of component i, and n is the number of component types in the electronic device.

[0019] Furthermore, a second acceleration factor of the electronic device is determined based on the ambient temperature of the electronic device under normal working conditions and the ambient temperature under test conditions, the types and number of components in the electronic device, the number of components of the same type and the activation energy of each component, including determining the activation energy of the electronic device based on the activation energy of each component, the number of components of the same type in the electronic device and the number of types of components in the electronic device; determining the second acceleration factor of the electronic device based on the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, and the activation energy of the electronic device.

[0020] Further, according to the activation energy of each component, the number of components of the same type in the electronic device and the number of types of components in the electronic device, the activation energy of the electronic device is determined, including:

[0021]

[0022] Among them, E S is the activation energy of the electronic device, E i is the activation energy of component i, m i is the number of components of the ith type, and n is the number of types of components in the electronic device.

[0023] Furthermore, a second acceleration factor of the electronic device is determined based on the ambient temperature of the electronic device under normal working conditions, the ambient temperature under accelerated test conditions, and the activation energy of the electronic device, including determining the second acceleration factor of the electronic device based on an Arrhenius model, the ambient temperature of the electronic device under normal working conditions, the ambient temperature under accelerated test conditions, and the activation energy of the electronic device.

[0024] Further, according to the Arrhenius model, the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, and the activation energy of the electronic device, a second acceleration factor of the electronic device is determined, including:

[0025]

[0026] in, is the second acceleration factor of electronic equipment, E S is the activation energy of the electronic device, k is the Boltzmann constant, T0 is the ambient temperature of the electronic device under normal working conditions, T d It is the ambient temperature of the electronic equipment under accelerated test conditions.

[0027] In general, the above technical solutions conceived by the present invention can achieve the following beneficial effects compared with the prior art:

[0028] The method for determining the acceleration factor of an electronic device provided by the present invention obtains the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the number of types of components in the electronic device, the number of components of the same type and the activation energy of each component, and fully combines the number of types of components in the electronic device, the failure rate of components and other information, scores the first acceleration factor and the second acceleration factor through an expert scoring method to determine the weight coefficients of the first acceleration factor and the second acceleration factor, and comprehensively weights the two different types of acceleration factors, the first acceleration factor and the second acceleration factor, to determine the target acceleration factor for performing an accelerated life test of the electronic device, thereby improving the accuracy of the target acceleration factor, and further using the target acceleration factor to guide engineering personnel to conduct reliability accelerated life tests on long-life electronic devices, which can effectively shorten the test time and greatly reduce the reliability accelerated life test time and test cost of the electronic device. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0030] Figure 1 A flowchart of a method for determining an acceleration factor of an electronic device provided in an embodiment of the present application;

[0031] Figure 2 A schematic diagram of a flow chart of a step of determining a weight coefficient of a first acceleration factor and a second acceleration factor provided in an embodiment of the present application;

[0032] Figure 3 A schematic diagram of the internal structure of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0033] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0034] The terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices.

[0035] like Figure 1 As shown, a method for determining an acceleration factor of an electronic device is provided, which can be executed by a terminal or by a server communicating with the terminal through a network. The terminal can be, but is not limited to, various personal computers, laptops, smart phones, tablet computers, etc. The server can be an independent server or a server cluster composed of multiple servers. Taking the method applied to a terminal as an example, the method includes the following steps:

[0036] Step 101: Obtain the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions.

[0037] Step 102, determining the number of types of components in the electronic device, the number of components of the same type, and the activation energy of each component.

[0038] Step 103, determining a first acceleration factor of the electronic device according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the number of types of components in the electronic device, the number of components of the same type and the activation energy of each component, and the failure rate of each component of the same type.

[0039] Step 104, determining a second acceleration factor of the electronic device according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the number of types of components in the electronic device, the number of components of the same type, and the activation energy of each component.

[0040] Step 105 , based on the scoring result of the first acceleration factor and the second acceleration factor using the expert scoring method, a target acceleration factor is determined, and the target acceleration factor is used to perform an accelerated life test of the electronic device.

[0041] Exemplarily, based on the scoring results of the first acceleration factor and the second acceleration factor using the expert scoring method, the weight coefficients of the first acceleration factor and the second acceleration factor are determined; according to the weight coefficients of the first acceleration factor and the second acceleration factor, the first acceleration factor and the second acceleration factor are weightedly summed to obtain the target acceleration factor.

[0042] In the above-mentioned method for determining the acceleration factor of the electronic device, by obtaining the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the number of types of components in the electronic device, the number of components of the same type and the activation energy of each component, the first acceleration factor and the second acceleration factor are scored by the expert scoring method to determine the weight coefficients of the first acceleration factor and the second acceleration factor, and the target acceleration factor for the accelerated life test of the electronic device is determined by comprehensive weighting of the two different types of acceleration factors, the first acceleration factor and the second acceleration factor, thereby improving the accuracy of the target acceleration factor. Furthermore, the target acceleration factor is used to guide engineering personnel to conduct reliability accelerated life tests on long-life electronic devices, which can effectively shorten the test time and greatly reduce the reliability accelerated life test time and test cost of the electronic equipment.

[0043] In one embodiment, Figure 2 As shown, based on the scoring result of the first acceleration factor and the second acceleration factor by the expert scoring method, the weight coefficients of the first acceleration factor and the second acceleration factor are determined, including:

[0044] Step 201, obtaining a plurality of first scoring results, where the first scoring result is a score given by each expert to the first acceleration factor;

[0045] Step 202, obtaining a plurality of second scoring results, where the second scoring result is a score given by each expert to the second acceleration factor;

[0046] Step 203, summing up the sum of the plurality of first scoring results and the sum of the plurality of second scoring results to obtain a comprehensive scoring result;

[0047] Step 204, taking the ratio of the sum of the plurality of first scoring results to the comprehensive scoring result as a weight coefficient of the first acceleration factor;

[0048] Step 205: taking the ratio of the sum of the plurality of second scoring results to the comprehensive scoring result as the weight coefficient of the second acceleration factor.

[0049] In this embodiment, by respectively obtaining the scores of the first acceleration factor and the second acceleration factor given by multiple experts, the purpose of determining the weight coefficients of the first acceleration factor and the second acceleration factor can be achieved, thereby improving the accuracy of the acceleration factor of the electronic device.

[0050] In one embodiment, a method for determining an acceleration factor of an electronic device is provided, the method comprising the following steps:

[0051] Step 1: Determine the ambient temperature T0 of the electronic equipment participating in the accelerated test under normal working conditions and the ambient temperature T d , where T0 and T d All are thermodynamic temperatures. The relationship between thermodynamic temperature T and Celsius temperature t is:

[0052] T=t+273.15,(1)

[0053] Wherein, T represents thermodynamic temperature (abbreviated as K), and t represents Celsius temperature (abbreviated as ℃).

[0054] Assume that an electronic device is participating in an accelerated life test, the ambient temperature of its normal operation is 25°C, and the ambient temperature of the accelerated test is 75°C. Determine the acceleration factor at this ambient temperature. According to formula (1), the thermodynamic temperature of this ambient temperature is determined as shown in Table 1.

[0055] Table 1

[0056] category Normal operating temperature Accelerated test environment temperature Celsius temperature (℃) 25 75 Thermodynamic temperature (K) 298.15 348.15

[0057] Step 2: Determine the number of types of components in the electronic device, the number of components of the same type, and the activation energy of each component.

[0058] The electronic device is composed of 7 different components. The activation energy of each component is obtained by consulting the data. The number of each type of component and the activation energy of the component are shown in Table 2.

[0059] Table 2

[0060] Serial number Component category Number of components Activation energy of components 1 A 25 0.78 2 B 39 0.81 3 C 56 0.79 4 D 34 0.86 5 E 28 0.71 6 F 19 0.84 7 G 32 0.75 total / 233 /

[0061] Step 3: According to the GJB / Z 299C standard, the failure rate λ of the i-th component under accelerated test conditions is estimated. i and the failure rate of electronic equipment λ s :

[0062] λ i =m i λ mi , (2)

[0063]

[0064] In the formula, m i represents the number of components of type i, λ mi represents the failure rate of a single component of the i-th component, n represents the number of types of components in the electronic device, and λ s Indicates the failure rate of electronic equipment.

[0065] According to the GJB / Z 299C standard, the failure rates of various components and electronic equipment under accelerated test temperature conditions are predicted, as shown in Table 3.

[0066] Table 3

[0067]

[0068] Step 4: Determine the acceleration factor A of component i in the electronic device according to the Arrhenius model i for:

[0069]

[0070] In the formula, E i is the activation energy of component i (in eV), the energy that makes the molecules start to move, k is the Boltzmann constant (the value is 8.623×10-5eV / K), T0 is the ambient temperature of the electronic equipment under normal working conditions (in K), T d It is the ambient temperature of the electronic equipment under accelerated test conditions (in K).

[0071] Based on the determined parameters, formula (4) is applied to determine the acceleration factors of each component, see Table 4.

[0072] Table 4

[0073] Component category <![CDATA[Activation energy (E i )]]> <![CDATA[Acceleration factor (A i )]]> A 0.78 78.036 B 0.81 92.273 C 0.79 82.519 D 0.86 122.005 E 0.71 52.781 F 0.84 109.108 G 0.75 65.996

[0074] Step 5: Determine the acceleration factor of the failure rate of electronic device components (i.e., the first acceleration factor)

[0075] According to Table 3 and Table 4, apply formula (5) to determine the first acceleration factor of the electronic device It is 84.946.

[0076] Step 6: Determine the activation energy E of the electronic device S :

[0077]

[0078] According to Table 2, using formula (6), the activation energy E of the electronic device is determined S It is 0.79.

[0079] Step 7: Determine the device activation energy acceleration factor (i.e., the second acceleration factor) of the electronic device according to the Arrhenius model

[0080]

[0081] Apply formula (7) to determine the second acceleration factor of the electronic device: It is 82.519.

[0082] Step 8: Use the expert scoring method to determine the weight coefficients α and β of the first and second acceleration factors:

[0083] (1) Hire at least 5 experts to evaluate the first acceleration factor of electronic equipment and the second acceleration factor Compare the two and give a score between 1 and 10. The higher the score, the higher the weight of the acceleration factor. and the second acceleration factor The results were compared pairwise and scored between 1 and 10. Table V shows the results.

[0084] Table 5

[0085] Acceleration Factor Expert 1 Expert 2 Expert 3 Expert 4 Expert 5 Expert 6 First acceleration factor 5 6 6 5 7 6 Second acceleration factor 4 2 5 6 5 4

[0086] (2) According to the expert scoring, the scores of the experts on the first acceleration factor (i.e., the first scoring result) are determined as follows:

[0087]

[0088] In the formula, It represents the score given by the j-th expert to the first acceleration factor, and k represents the number of experts.

[0089] Apply formula (8) to determine It is 37800.

[0090] According to the expert scoring, the scores of the second acceleration factor given by multiple experts (i.e., the second scoring result) are determined as follows:

[0091]

[0092] In the formula, It represents the score given by the j-th expert to the second acceleration factor, and k represents the number of experts.

[0093] Apply formula (9) to determine is 4800.

[0094] (3) Determine α and β as:

[0095]

[0096] Applying equations (10) and (11), it is determined that α=0.89 and β=0.11.

[0097] Step 9: Determine the final acceleration factor (i.e. target acceleration factor) A of the electronic device S :

[0098]

[0099] Apply formula (12) to determine the final acceleration factor A of the electronic device: S It is 84.673.

[0100] In this embodiment, the acceleration factor of the electronic device is fully combined with the number of components of the electronic device, the failure rate of the components and other information, and is determined by comprehensive weighting of two different types of acceleration factors, so as to improve the accuracy of the acceleration factor. There are two different types of acceleration factors, one of which (the first acceleration factor) is determined according to the acceleration factor and failure rate of the components of the electronic device, by weighting the acceleration factors of various types of components by the weights of the failure rates of different types of components in the equipment failure rate; the other type of acceleration factor (the second acceleration factor) is determined according to the activation energy of the components of the electronic device and the number of components, by weighting the activation energy of various types of components by the weights of the number of different types of components in the total number of components.

[0101] The present application also provides a computer device, whose internal structure diagram can be as follows: Figure 3As shown. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface, the display unit and the input device are connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a method for determining an acceleration factor of an electronic device is implemented.

[0102] Those skilled in the art will understand that Figure 3 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0103] like Figure 3 As shown, the present application also provides a computer device, which includes a memory, a processor, and a computer program stored in the memory, and the processor executes the computer program to implement the steps in the above-mentioned method embodiments.

[0104] The present application also provides a computer-readable storage medium on which a computer program is stored, and when the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented. The computer-readable storage medium may include, but is not limited to, any type of disk, including a floppy disk, an optical disk, a DVD, a CD-ROM, a micro drive, and a magneto-optical disk, a ROM, a RAM, an EPROM, an EEPROM, a DRAM, a VRAM, a flash memory device, a magnetic card or an optical card, a nanosystem (including a molecular memory IC), or any type of medium or device suitable for storing instructions and / or data.

[0105] The present application also provides a computer program product, including a computer program, which implements the steps in the above-mentioned method embodiments when executed by a processor.

[0106] It should be noted that, for the aforementioned method embodiments, for the sake of simplicity, they are all expressed as a series of action combinations, but those skilled in the art should be aware that the present application is not limited by the described order of actions, because according to the present application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the present application.

[0107] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0108] The above is only an exemplary embodiment of the present disclosure, and the scope of the present disclosure cannot be limited thereto. That is, any equivalent changes and modifications made according to the teachings of the present disclosure are still within the scope of the present disclosure. After considering the specification and practicing the disclosure here, those skilled in the art will easily think of the implementation scheme of the present disclosure. This application is intended to cover any modification, use or adaptation of the present disclosure, which follows the general principles of the present disclosure and includes common knowledge or customary technical means in the technical field not recorded in the present disclosure. The description and examples are only regarded as exemplary, and the scope and spirit of the present disclosure are defined by the claims.

[0109] The technical features of the above embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0110] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for determining an acceleration factor of an electronic device, characterized in that: include: Obtain the ambient temperature of the electronic equipment under normal working conditions and the ambient temperature under accelerated test conditions; Determine the number of component types, the number of components of the same type, and the activation energy of each component in an electronic device; Determine a first acceleration factor of the electronic device according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the number of types of components in the electronic device, the number of components of the same type and the activation energy of each component, and the failure rate of each component of the same type; Determine a second acceleration factor of the electronic device according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the number of types of components in the electronic device, the number of components of the same type, and the activation energy of each component; Based on the scoring results of the first acceleration factor and the second acceleration factor using an expert scoring method, a target acceleration factor is determined, and the target acceleration factor is used to perform an accelerated life test of the electronic device.

2. The method according to claim 1, characterized in that The scoring result of scoring the first acceleration factor and the second acceleration factor based on the expert scoring method, and determining the target acceleration factor, comprises: Determine weight coefficients of the first acceleration factor and the second acceleration factor based on a scoring result of the first acceleration factor and the second acceleration factor using an expert scoring method; According to the weight coefficients of the first acceleration factor and the second acceleration factor, a weighted sum is performed on the first acceleration factor and the second acceleration factor to obtain a target acceleration factor.

3. The method according to claim 2, characterized in that The scoring result of scoring the first acceleration factor and the second acceleration factor based on the expert scoring method, and determining the weight coefficients of the first acceleration factor and the second acceleration factor, include: Acquire multiple first scoring results, where the first scoring results are scores given by each expert to the first acceleration factor; Acquire multiple second scoring results, where the second scoring results are scores given by each expert to the second acceleration factor; Summing the sum of the multiple first scoring results and the sum of the multiple second scoring results to obtain a comprehensive scoring result; Using the ratio of the sum of the plurality of first scoring results to the comprehensive scoring result as a weight coefficient of the first acceleration factor; The ratio of the sum of the multiple second scoring results to the comprehensive scoring result is used as a weight coefficient of the second acceleration factor.

4. The method according to claim 1, characterized in that The step of determining a first acceleration factor of the electronic device according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the number of types of components in the electronic device, the number of components of the same type and the activation energy of each component, and the failure rate of each component of the same type includes: Determining the failure rate of each type of component according to the failure rate of each component in the same type of components and the number of the same type of components in the electronic device; Determining the failure rate of the electronic device according to the failure rate of each type of components and the number of types of components in the electronic device; Determine the acceleration factor of each component according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, and the activation energy of each component; A first acceleration factor of the electronic device is determined according to the failure rate of each type of component, the failure rate of the electronic device, the number of types of components in the electronic device, and the acceleration factor of each component.

5. The method according to claim 4, characterized in that Determining the acceleration factor of each component according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, and the activation energy of each component, comprises: The acceleration factor of each component is determined according to the Arrhenius model, the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, and the activation energy of each component.

6. The method according to claim 4, characterized in that Determining a first acceleration factor of the electronic device according to the failure rate of each type of component, the failure rate of the electronic device, the number of types of components in the electronic device, and the acceleration factor of each component includes: in, is the first acceleration factor of electronic equipment, λ i is the failure rate of the ith component under accelerated test conditions, λ s is the failure rate of the electronic equipment, A i is the acceleration factor of component i, and n is the number of component types in the electronic device.

7. The method according to claim 1, characterized in that Determining the second acceleration factor of the electronic device according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, the number of types of components in the electronic device, the number of components of the same type, and the activation energy of each component, comprises: Determining the activation energy of the electronic device according to the activation energy of each component, the number of components of the same type in the electronic device, and the number of types of components in the electronic device; A second acceleration factor of the electronic device is determined according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, and the activation energy of the electronic device.

8. The method according to claim 7, characterized in that Determining the activation energy of the electronic device according to the activation energy of each component, the number of components of the same type in the electronic device, and the number of types of components in the electronic device includes: Among them, E S is the activation energy of the electronic device, E i is the activation energy of component i, m i is the number of components of the ith type, and n is the number of types of components in the electronic device.

9. The method according to claim 7, characterized in that Determining a second acceleration factor of the electronic device according to the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, and the activation energy of the electronic device, comprises: A second acceleration factor of the electronic device is determined according to an Arrhenius model, an ambient temperature of the electronic device under normal working conditions and an ambient temperature under accelerated test conditions, and an activation energy of the electronic device.

10. The method according to claim 9, characterized in that Determining the second acceleration factor of the electronic device according to the Arrhenius model, the ambient temperature of the electronic device under normal working conditions and the ambient temperature under accelerated test conditions, and the activation energy of the electronic device includes: in, is the second acceleration factor of electronic equipment, E S is the activation energy of the electronic device, k is the Boltzmann constant, T0 is the ambient temperature of the electronic device under normal working conditions, T d It is the ambient temperature of the electronic equipment under accelerated test conditions.

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