Accelerated life test method and device

Abstract

The embodiment of the invention provides an accelerated life test method and device, and the method comprises the steps: carrying out the analysis of a vibration isolation device in an in-orbit mechanical environment, and determining test parameters; building an accelerated life test system based on the test parameters; performing an accelerated life test based on an accelerated life test system, and determining a life test result; and performing test evaluation based on the life test result, and determining a test evaluation result. According to the test method, related test data are obtained by carrying out a ground preliminary test on the service life of the vibration isolation device in an on-orbit mechanical environment, data support is provided for performance and service life evaluation of the vibration isolation device, and the test method can be applied to various aerospace platforms and provides technical support for vibration reduction and vibration isolation of aerospace products.

Description

Technical Field

[0001] The embodiments of this specification relate to the field of aerospace testing technology, and in particular to accelerated life testing methods. Background Art

[0002] With the development of high-resolution earth observation spacecraft, spacecraft has put forward higher and higher requirements for the suppression of micro-vibration. Among them, various single-machine disturbance sources affect the imaging quality of spacecraft. The function of the micro-vibration isolation device is to isolate the vibration of the single-machine disturbance source and isolate the disturbance force transmitted to the cabin when the single machine is working, so as to ensure that the overall micro-vibration suppression of the spacecraft meets the design requirements.

[0003] In order to achieve a higher damping ratio and vibration isolation effect, a metal structure vibration isolation device was designed. Compared with ordinary rubber isolators, metal materials are resistant to high temperature, high pressure, high vacuum, and ultra-low temperature, and are more suitable for use in space environments. As the spacecraft has put forward the requirement of at least 15 years of on-orbit life, the micro-vibration isolation device also needs to work on-orbit for a long time. As a key single machine, the stability of the vibration isolation device performance directly affects the overall performance of the spacecraft, so its performance and life are also of great concern. In addition to facing the micro-vibration working environment of the disturbance source single machine output for a long time, the micro-vibration isolation device also needs to withstand the complex on-orbit variable torque loading mechanical environment. The vibration isolation device based on the metal structure still has the possibility of performance degradation in the long-term vibration environment, but there is currently no relevant information and data available. Therefore, a better solution is urgently needed. Summary of the invention

[0004] In view of this, the embodiments of this specification provide an accelerated life test method. One or more embodiments of this specification also relate to an accelerated life test device, a computing device, a computer-readable storage medium and a computer program to solve the technical defects existing in the prior art.

[0005] According to a first aspect of an embodiment of this specification, there is provided an accelerated life test method, comprising: Analyze the on-orbit mechanical environment of the vibration isolation device and determine the test parameters; Build an accelerated life test system based on test parameters; Based on the accelerated life test system, carry out accelerated life test and determine the life test results; A test evaluation is performed based on the life test results to determine the test evaluation results.

[0006] In one possible implementation, the on-orbit mechanical environment of the vibration isolation device is analyzed to determine the test parameters, including: Analyze the on-orbit mechanical environment of the vibration isolation device and determine the torque parameters and life parameters; Determine the test duration based on the life parameters; determining an amplitude parameter and a frequency parameter based on the torque parameter; The test parameters are determined based on the test duration, amplitude parameters and frequency parameters.

[0007] In a possible implementation, the test parameters are determined based on the test duration, amplitude parameter, and frequency parameter, including: Accelerate the test duration based on the frequency parameter to determine the first test duration and the accelerated frequency parameter; Accelerating the first test duration based on the amplitude parameter to determine a target test duration and an accelerated amplitude parameter; The test parameters are determined based on the acceleration frequency parameter, the target test duration and the acceleration amplitude parameter.

[0008] In a possible implementation, an accelerated life test system is built based on test parameters, including: Based on the test parameters, force sensors and control system, the vibration exciters located on both sides of the force-applying fixture are controlled to determine the accelerated life test system of the vibration isolation device.

[0009] In a possible implementation, based on an accelerated life test system, an accelerated life test is performed to determine a life test result, including: Based on the accelerated life test system, conduct accelerated life test and determine the characteristic curve; The life test results are determined based on the characteristic curves.

[0010] In a possible implementation, performing a test evaluation based on the life test result to determine the test evaluation result includes: Extract the main resonance frequency and response peak value based on the life test results; The test evaluation results are determined based on the main resonance frequency and the response peak.

[0011] In a possible implementation, performing a test evaluation based on the life test result to determine the test evaluation result includes: The modal frequencies and damping of the vibration isolation device in three directions are obtained by hammering method, the performance changes of the vibration isolation device are evaluated, and the frequency characteristics of the vibration isolation device are determined; The test evaluation results are determined based on the frequency characteristics of the vibration isolation device.

[0012] According to a second aspect of an embodiment of this specification, there is provided an accelerated life test device, comprising: A parameter determination module is configured to analyze the on-orbit mechanical environment of the vibration isolation device and determine test parameters; A system building module is configured to build an accelerated life test system based on test parameters; The life test module is configured to perform an accelerated life test based on the accelerated life test system and determine a life test result; The result evaluation module is configured to perform test evaluation based on the life test result and determine the test evaluation result.

[0013] According to a third aspect of an embodiment of this specification, a computing device is provided, including: Memory and processor; The memory is used to store computer executable instructions, and the processor is used to execute the computer executable instructions. When the computer executable instructions are executed by the processor, the steps of the accelerated life test method are implemented.

[0014] According to a fourth aspect of the embodiments of this specification, a computer-readable storage medium is provided, which stores computer-executable instructions, and when the instructions are executed by a processor, the steps of the above-mentioned accelerated life test method are implemented.

[0015] According to a fifth aspect of the embodiments of this specification, a computer program is provided, wherein when the computer program is executed in a computer, the computer is caused to execute the steps of the above-mentioned accelerated life test method.

[0016] The embodiments of this specification provide an accelerated life test method and device, wherein the accelerated life test method includes: analyzing the on-orbit mechanical environment of the vibration isolation device to determine the test parameters; building an accelerated life test system based on the test parameters; conducting an accelerated life test based on the accelerated life test system to determine the life test results; conducting a test evaluation based on the life test results to determine the test evaluation results. By conducting a ground survey test on the life of the vibration isolation device in the on-orbit mechanical environment, relevant test data is obtained to provide data support for the performance and life evaluation of the vibration isolation device. This test method can be applied to a variety of aerospace platforms to provide technical support for vibration reduction and isolation of aerospace products. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 is a flow chart of an accelerated life test method provided by one embodiment of this specification; Figure 2 is a schematic diagram of an accelerated life test method provided in one embodiment of this specification; Figure 3a It is a schematic diagram of a vertical moment of an accelerated life test method provided by an embodiment of this specification; Figure 3b It is a schematic diagram of horizontal moment of an accelerated life test method provided by one embodiment of this specification; Figure 4 It is a structural schematic diagram of an accelerated life test device provided by an embodiment of this specification; Figure 5 It is a structural block diagram of a computing device provided by an embodiment of this specification. DETAILED DESCRIPTION

[0018] Many specific details are described in the following description to facilitate a full understanding of this specification. However, this specification can be implemented in many other ways than those described herein, and those skilled in the art can make similar generalizations without violating the connotation of this specification, so this specification is not limited to the specific implementation disclosed below.

[0019] The terms used in one or more embodiments of this specification are only for the purpose of describing specific embodiments, and are not intended to limit one or more embodiments of this specification. The singular forms of "a" and "the" used in one or more embodiments of this specification and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings. It should also be understood that the term "and / or" used in one or more embodiments of this specification refers to and includes any or all possible combinations of one or more associated listed items.

[0020] It should be understood that although the terms first, second, etc. may be used to describe various information in one or more embodiments of this specification, this information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of one or more embodiments of this specification, the first may also be referred to as the second, and similarly, the second may also be referred to as the first. Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".

[0021] In this specification, an accelerated life test method is provided. This specification also relates to an accelerated life test apparatus, a computing device, and a computer-readable storage medium, which are described in detail one by one in the following embodiments.

[0022] See also Figure 1 , Figure 1 A flow chart of an accelerated life test method provided according to an embodiment of the present specification is shown, which specifically includes the following steps.

[0023] Step 101: Analyze the on-orbit mechanical environment of the vibration isolation device and determine the test parameters.

[0024] In one possible implementation, the on-orbit mechanical environment of the vibration isolation device is analyzed to determine the test parameters, including: analyzing the on-orbit mechanical environment of the vibration isolation device to determine the torque parameters and life parameters; determining the test duration based on the life parameters; determining the amplitude parameters and frequency parameters based on the torque parameters; determining the test parameters based on the test duration, amplitude parameters and frequency parameters.

[0025] In practical applications, see Figure 2 , analyze the on-orbit mechanical environment of the vibration isolation device and determine the actual torque magnitude of the vibration isolation device M f And the service life in orbit T 0, and the actual stress conditions are analyzed, and the test conditions are simplified into vertical and horizontal moment loading conditions.

[0026] For example, the on-orbit mechanical environment of the vibration isolation device is analyzed to determine the actual torque magnitude of the vibration isolation device. M f 200Nm, on-orbit service life T 0=6623 hours, and the actual stress conditions are analyzed, and the test conditions are simplified to moment loading conditions.

[0027] In one possible implementation, the test parameters are determined based on the test duration, amplitude parameters and frequency parameters, including: accelerating the test duration based on the frequency parameters to determine the first test duration and the acceleration frequency parameters; accelerating the first test duration based on the amplitude parameters to determine the target test duration and the acceleration amplitude parameters; determining the test parameters based on the acceleration frequency parameters, the target test duration and the acceleration amplitude parameters.

[0028] In practical applications, considering the dispersion of life, the 1:1 test duration should be greater than the required life duration, and determining the 1:1 life test duration is also the basis for determining the accelerated life test duration. Since the vibration isolation device life test is a typical metal structure fatigue damage problem, its life distribution satisfies the Weibull distribution. First, the 1:1 test duration T R The required life span T 0 must satisfy the following relationship: (1) In the formula γ is the confidence level; R ( T 0) is the required life span T Reliability within 0; m is the shape parameter of the Weibull distribution. n is the test sample size.

[0029] Secondly, the frequency of the actual loading moment f 0 is relatively low, so the accelerated test design is carried out by increasing the frequency. That is, by increasing the test frequency, the fatigue damage evolution is accelerated, thereby shortening the test time. f Determine the test frequency f T , determine the test frequency after the frequency is acceleratedf T The life test time is obtained by accelerating the frequency. T f , as shown below: (2) If the test duration is increased after the frequency is increased T f It is still too long, so the amplitude enhancement method is used to further shorten the test time.

[0030] The equivalent formula for the amplitude enhanced accelerated test is: (3) in: T f = Test time after frequency acceleration TAF = Test time after amplitude acceleration M f = Actual loading torque, Nm M Af = Loading moment of equivalent acceleration, Nm m =Material fatigue index Formula 1-3 can finally determine the amplitude of the torque applied during the acceleration test M Af ,frequency f T and test time TAF .

[0031] For example, first, the duration of the experiment T R The required life span T 0 satisfies the following relationship: (1) In the formula, T 0 = 6623 hours, γ is the confidence level, take 0.7; R ( T 0) is the required life span T The reliability within 0 is taken as 0.9; m is the shape parameter of the Weibull distribution, which is conservatively estimated to be 1.5. n is the test sample size, take 4. Then T R =13423 hours.

[0032] Secondly, the frequency of the actual loading momentf 0 is relatively low, so the accelerated test design is carried out by increasing the frequency. That is, by increasing the test frequency, the fatigue damage evolution is accelerated, thereby shortening the test time. f Determine the test frequency f T , determine the test frequency after the frequency is accelerated f T The life test time is obtained by accelerating the frequency. T f , as shown below: (2) Table 1

[0033] Test duration after frequency increase T f It is still too long, so the amplitude enhancement method is used to further shorten the test time.

[0034] The equivalent formula for the amplitude enhanced accelerated test is: (3) in: T f = Test time after frequency acceleration T Af = Test time after amplitude acceleration M f = Actual loading torque, Nm M Af = Loading moment of equivalent acceleration, Nm m =Material fatigue index Formula 1-3 can finally determine the amplitude of the torque applied during the acceleration test M Af = 300Nm, frequency f T = 6Hz and test time T Af = 11.8 hours.

[0035] Step 102: Building an accelerated life test system based on the test parameters.

[0036] In one possible implementation, an accelerated life test system is constructed based on test parameters, including: controlling the exciters located on both sides of the force-applying fixture based on the test parameters, force sensors, and a control system to determine the accelerated life test system of the vibration isolation device.

[0037] In practical applications, see Figure 3a and Figure 3b , taking the vibration isolation device as the test object, an accelerated life test system was built. The force sensor and control system were used to control the exciters on both sides of the force-adding tooling to achieve force loading in opposite directions and of the same magnitude, ultimately forming a torque loading on the vibration isolation device. M Af ,like Figure 3a and Figure 3b As shown, generally two extreme working conditions can be selected: horizontal moment loading and vertical moment loading. Figure 3a is the vertical moment loading, Figure 3b is the horizontal moment loading.

[0038] For example, taking the vibration isolation device as the test object, an accelerated life test system is built. The force sensor and control system are used to control the exciters on both sides of the force-adding tooling to achieve force loading in opposite directions and of the same magnitude, ultimately forming a torque loading on the vibration isolation device. M Af .

[0039] Step 103: Perform an accelerated life test based on the accelerated life test system to determine the life test result.

[0040] In a possible implementation, based on an accelerated life test system, an accelerated life test is performed to determine a life test result, including: based on the accelerated life test system, an accelerated life test is performed to determine a characteristic curve; and the life test result is determined based on the characteristic curve.

[0041] In practical applications, the accelerated life test is carried out as described in the following steps.

[0042] according to Figure 3a Build a vertical torque simulation accelerated life test system; use the hammer method modal test to obtain the modal frequencies of the vibration isolation device in three directions under the test system; select 10% small-level torque as the characteristic level torque to load the sine sweep test, and obtain the acceleration response at the mass-module connection as the characteristic curve; at the same time, find the non-resonant frequency point based on the sweep results to further determine the frequency during the life test f T ; According to the test amplitude M Af and test frequency f T Perform moment loading, when the cumulative loading time reaches 1 / 4T Af , 1 / 2 T Af 、3 / 4 T Af , T Af When the Mx direction loading time reaches T Af , end the test and turn to the Mz direction test; according to Figure 3b Build the test system using the horizontal moment simulation method and repeat steps 2 to 5. T Af The test is finished and the cover is opened for inspection. The following steps are used as examples.

[0043] according to Figure 3a Build a vertical torque simulation accelerated life test system; use the hammer method modal test to obtain the modal frequencies of the vibration isolation device in three directions under the test system; select 10% small-level torque as the characteristic level torque (select 30Nm) to load the sine frequency sweep test, and obtain the acceleration response of the connection surface of the vibration isolation device as the characteristic curve; at the same time, find the non-resonant frequency point according to the frequency sweep results to further determine the frequency during the life test f T ; According to the test amplitude M Af and test frequency f T Perform moment loading. When the cumulative loading time reaches 2.95 hours, 5.9 hours, 8.85 hours, and 11.8 hours, suspend the test, conduct characteristic level sweep frequency test and modal test, obtain characteristic curve and modal frequency, and monitor the changes of vibration isolation device. When the vertical loading time reaches 11.8 hours, end the test and switch to horizontal test. Figure 3b Build a horizontal moment simulation test system and repeat steps 2 to 5; when the horizontal loading time reaches 11.8 hours, end the test and perform an open cover inspection. Step 104: Perform a test evaluation based on the life test results and determine the test evaluation results.

[0044] In a possible implementation, a test evaluation is performed based on the life test result to determine the test evaluation result, including: extracting a main resonance frequency and a response peak value based on the life test result; and determining the test evaluation result based on the main resonance frequency and the response peak value.

[0045] In practical applications, both vertical and horizontal moment loading test conditions are carried out in stages. Before and after each test stage, a characteristic level moment loading sine frequency sweep test is carried out to obtain the acceleration response characteristic curve at the interface of the vibration isolation device, extract the main resonance frequency and response peak, and analyze and evaluate the performance changes of the vibration isolation device.

[0046] For example, both vertical and horizontal moment loading test conditions are carried out in stages. Before and after each test stage, a characteristic level moment (30Nm) loading sine frequency sweep test is carried out to obtain the acceleration response characteristic curve at the interface of the vibration isolation device, extract the main resonance frequency and response peak, and analyze and evaluate the performance changes of the vibration isolation device. In one possible implementation, a test evaluation is performed based on the life test results to determine the test evaluation results, including: obtaining the modal frequencies and damping of the vibration isolation device in three directions through a hammer method, evaluating the performance changes of the vibration isolation device, and determining the frequency characteristics of the vibration isolation device; and determining the test evaluation results based on the frequency characteristics of the vibration isolation device.

[0047] In practical applications, the modal frequencies and damping in three directions of the vibration isolation device are obtained through the hammer method, and the performance changes of the vibration isolation device are further analyzed and evaluated. If the frequency characteristics of the vibration isolation device change significantly (such as frequency drift>1Hz, peak change>10%), the test is suspended. After evaluation, whether to continue the test is determined. If the test is completed normally, it indicates that the life test has passed.

[0048] For example, the modal frequencies and damping in three directions of the vibration isolation device were obtained through the hammer method, and the performance changes of the vibration isolation device were further analyzed and evaluated. The frequency characteristics of the vibration isolation device did not change significantly (frequency drift <1Hz, peak change <5%), and the test was completed normally, indicating that the vibration isolation device passed the life test.

[0049] In summary, this scheme first analyzes and simplifies the on-orbit mechanical environment of the vibration isolation device, simplifies the test conditions into multi-degree-of-freedom torque loading conditions, and clarifies the actual torque loading conditions and service life requirements; then, the torque loading acceleration test conditions of the vibration isolation device are determined according to methods such as frequency acceleration and amplitude enhancement, including the loading frequency, loading magnitude and loading time after acceleration; at the same time, the vibration isolation device is used as the test object, and a torque loading accelerated life test system is built. The exciters located on both sides of the force tooling are controlled by force sensors and multi-axis control systems to achieve force loading of opposite directions and the same magnitude, and finally a torque loading simulation of the vibration isolation device is formed; during the accelerated test, the performance changes of the vibration isolation device are evaluated by monitoring the changes in the modal frequency and characteristic curves before and after the test, thereby evaluating the life test results.

[0050] This solution fills the gap in the life test method of this type of equipment. It takes into account the environmental factors of the vibration isolation device on track to conduct accelerated life tests, which can ensure that the normal life of this type of equipment on track can be understood through accelerated life tests. It can also effectively shorten the life test time, improve the efficiency of ground life tests, and reduce the cost of ground life tests.

[0051] The embodiments of this specification provide an accelerated life test method and device, wherein the accelerated life test method includes: analyzing the on-orbit mechanical environment of the vibration isolation device to determine the test parameters; building an accelerated life test system based on the test parameters; conducting an accelerated life test based on the accelerated life test system to determine the life test results; conducting a test evaluation based on the life test results to determine the test evaluation results. By conducting a ground survey test on the life of the vibration isolation device in the on-orbit mechanical environment, relevant test data is obtained to provide data support for the performance and life evaluation of the vibration isolation device. This test method can be applied to a variety of aerospace platforms to provide technical support for vibration reduction and isolation of aerospace products.

[0052] Corresponding to the above method embodiment, this specification also provides an accelerated life test device embodiment, Figure 4 FIG. 1 is a schematic diagram showing the structure of an accelerated life test device provided by an embodiment of the present specification. Figure 4 As shown, the device comprises: The parameter determination module 401 is configured to analyze the on-orbit mechanical environment of the vibration isolation device and determine the test parameters; The system building module 402 is configured to build an accelerated life test system based on the test parameters; The life test module 403 is configured to perform an accelerated life test based on an accelerated life test system and determine a life test result; The result evaluation module 404 is configured to perform a test evaluation based on the life test result and determine a test evaluation result.

[0053] In a possible implementation, the parameter determination module 401 is further configured to: Analyze the on-orbit mechanical environment of the vibration isolation device and determine the torque parameters and life parameters; Determine the test duration based on the life parameters; determining an amplitude parameter and a frequency parameter based on the torque parameter; The test parameters are determined based on the test duration, amplitude parameters and frequency parameters.

[0054] In a possible implementation, the parameter determination module 401 is further configured to: Accelerate the test duration based on the frequency parameter to determine the first test duration and the accelerated frequency parameter; Accelerating the first test duration based on the amplitude parameter to determine a target test duration and an accelerated amplitude parameter; The test parameters are determined based on the acceleration frequency parameter, the target test duration and the acceleration amplitude parameter.

[0055] In a possible implementation, the system building module 402 is further configured to: Based on the test parameters, force sensors and control system, the vibration exciters located on both sides of the force-applying fixture are controlled to determine the accelerated life test system of the vibration isolation device.

[0056] In a possible implementation, the life test module 403 is further configured to: Based on the accelerated life test system, conduct accelerated life test and determine the characteristic curve; The life test results are determined based on the characteristic curves.

[0057] In a possible implementation, the result evaluation module 404 is further configured to: Extract the main resonance frequency and response peak value based on the life test results; The test evaluation results are determined based on the main resonance frequency and the response peak.

[0058] In a possible implementation, the result evaluation module 404 is further configured to: The modal frequencies and damping of the vibration isolation device in three directions are obtained by hammering method, the performance changes of the vibration isolation device are evaluated, and the frequency characteristics of the vibration isolation device are determined; The test evaluation results are determined based on the frequency characteristics of the vibration isolation device.

[0059] The embodiments of this specification provide an accelerated life test method and device, wherein the accelerated life test device includes: analyzing the on-orbit mechanical environment of the vibration isolation device to determine the test parameters; building an accelerated life test system based on the test parameters; conducting an accelerated life test based on the accelerated life test system to determine the life test results; and conducting a test evaluation based on the life test results to determine the test evaluation results. By conducting a ground survey test on the life of the vibration isolation device in the on-orbit mechanical environment, relevant test data is obtained to provide data support for the performance and life evaluation of the vibration isolation device. This test method can be applied to a variety of aerospace platforms to provide technical support for vibration reduction and isolation of aerospace products.

[0060] The above is a schematic scheme of an accelerated life test device of this embodiment. It should be noted that the technical scheme of the accelerated life test device and the technical scheme of the accelerated life test method described above are of the same concept, and the details not described in detail in the technical scheme of the accelerated life test device can be found in the description of the technical scheme of the accelerated life test method described above.

[0061] Figure 5 The structure block diagram of a computing device 500 provided according to an embodiment of the present specification is shown. The components of the computing device 500 include but are not limited to a memory 510 and a processor 520. The processor 520 is connected to the memory 510 via a bus 530, and the database 550 is used to store data.

[0062] The computing device 500 also includes an access device 540 that enables the computing device 500 to communicate via one or more networks 560. Examples of these networks include a public switched telephone network (PSTN), a local area network (LAN), a wide area network (WAN), a personal area network (PAN), or a combination of communication networks such as the Internet. The access device 540 may include one or more of any type of network interface (e.g., a network interface card (NIC)) that is wired or wireless, such as an IEEE 802.11 wireless local area network (WLAN) wireless interface, a world-wide interoperability for microwave access (Wi-MAX) interface, an Ethernet interface, a universal serial bus (USB) interface, a cellular network interface, a Bluetooth interface, and a near field communication (NFC).

[0063] In one embodiment of the present specification, the above components of the computing device 500 and Figure 5 Other components not shown in the figure may also be connected to each other, for example, via a bus. It should be understood that Figure 5 The computing device structure block diagram shown is only for the purpose of illustration, and is not intended to limit the scope of this specification. Those skilled in the art can add or replace other components as needed.

[0064] The computing device 500 may be any type of stationary or mobile computing device, including a mobile computer or mobile computing device (e.g., a tablet computer, a personal digital assistant, a laptop computer, a notebook computer, a netbook, etc.), a mobile phone (e.g., a smart phone), a wearable computing device (e.g., a smart watch, smart glasses, etc.), or other types of mobile devices, or a stationary computing device such as a desktop computer or a personal computer (PC). The computing device 500 may also be a mobile or stationary server.

[0065] The processor 520 is used to execute the following computer executable instructions, which implement the steps of the above-mentioned accelerated life test method when executed by the processor. The above is a schematic scheme of a computing device of this embodiment. It should be noted that the technical scheme of the computing device and the technical scheme of the above-mentioned accelerated life test method belong to the same concept, and the details of the technical scheme of the computing device that are not described in detail can be found in the description of the technical scheme of the above-mentioned accelerated life test method.

[0066] An embodiment of the present specification also provides a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, implement the steps of the above-mentioned accelerated life test method.

[0067] The above is a schematic scheme of a computer-readable storage medium of this embodiment. It should be noted that the technical scheme of the storage medium and the technical scheme of the accelerated life test method described above are of the same concept, and the details not described in detail in the technical scheme of the storage medium can be referred to the description of the technical scheme of the accelerated life test method described above.

[0068] An embodiment of the present specification further provides a computer program, wherein when the computer program is executed in a computer, the computer is caused to execute the steps of the above-mentioned accelerated life test method.

[0069] The above is a schematic scheme of a computer program of this embodiment. It should be noted that the technical scheme of the computer program and the technical scheme of the accelerated life test method described above are of the same concept, and the details not described in detail in the technical scheme of the computer program can be found in the description of the technical scheme of the accelerated life test method described above.

[0070] The above is a description of a specific embodiment of the specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the processes depicted in the drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0071] The computer instructions include computer program codes, which may be in source code form, object code form, executable files or some intermediate forms, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium, etc. It should be noted that the content contained in the computer-readable medium may be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0072] It should be noted that, for the above-mentioned method embodiments, for the sake of simplicity of description, they are all expressed as a series of action combinations, but those skilled in the art should be aware that the embodiments of this specification are not limited by the order of the actions described, because according to the embodiments of this specification, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the embodiments of this specification.

[0073] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0074] The preferred embodiments of this specification disclosed above are only used to help explain this specification. The optional embodiments do not describe all the details in detail, nor do they limit the invention to only the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of the embodiments of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the embodiments of this specification, so that technicians in the relevant technical field can well understand and use this specification. This specification is only limited by the claims and their full scope and equivalents.

Claims

1. An accelerated life test method, characterized in that: include: Analyze the on-orbit mechanical environment of the vibration isolation device and determine the test parameters; Based on the test parameters, an accelerated life test system is built; Based on the accelerated life test system, an accelerated life test is performed to determine a life test result; A test evaluation is performed based on the life test result to determine the test evaluation result.

2. The method according to claim 1, characterized in that The analysis of the on-orbit mechanical environment of the vibration isolation device and determination of test parameters include: Analyze the on-orbit mechanical environment of the vibration isolation device and determine the torque parameters and life parameters; Determining a test duration based on the life parameters; determining an amplitude parameter and a frequency parameter based on the torque parameter; A test parameter is determined based on the test duration, the amplitude parameter and the frequency parameter.

3. The method according to claim 2, characterized in that The determining of the test parameters based on the test duration, the amplitude parameter and the frequency parameter comprises: Accelerate the test duration based on the frequency parameter to determine a first test duration and an accelerated frequency parameter; Accelerating the first test duration based on the amplitude parameter to determine a target test duration and an accelerated amplitude parameter; The test parameters are determined based on the acceleration frequency parameter, the target test duration and the acceleration amplitude parameter.

4. The method according to claim 1, characterized in that: The accelerated life test system is constructed based on the test parameters, including: Based on the test parameters, the force sensor and the control system, the vibration exciters located on both sides of the force-applying tooling are controlled to determine the accelerated life test system of the vibration isolation device.

5. The method according to claim 1, characterized in that The method of performing an accelerated life test based on the accelerated life test system and determining a life test result includes: Based on the accelerated life test system, an accelerated life test is performed to determine a characteristic curve; The life test results are determined based on the characteristic curve.

6. The method according to claim 1, characterized in that The performing test evaluation based on the life test result and determining the test evaluation result comprises: Extracting the main resonance frequency and the response peak value based on the life test results; Based on the main resonance frequency and the response peak, a test evaluation result is determined.

7. The method according to claim 1, characterized in that The performing test evaluation based on the life test result and determining the test evaluation result comprises: The modal frequencies and damping of the vibration isolation device in three directions are obtained by hammering method, the performance changes of the vibration isolation device are evaluated, and the frequency characteristics of the vibration isolation device are determined; A test evaluation result is determined based on the frequency characteristics of the vibration isolation device.

8. An accelerated life test device, characterized in that: include: A parameter determination module is configured to analyze the on-orbit mechanical environment of the vibration isolation device and determine test parameters; A system building module is configured to build an accelerated life test system based on the test parameters; A life test module, configured to perform an accelerated life test based on the accelerated life test system and determine a life test result; The result evaluation module is configured to perform a test evaluation based on the life test result and determine a test evaluation result.

9. A computing device, characterized in that include: Memory and processor; The memory is used to store computer executable instructions, and the processor is used to execute the computer executable instructions. When the computer executable instructions are executed by the processor, the steps of the accelerated life test method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium storing computer-executable instructions, wherein the computer-executable instructions, when executed by a processor, implement the steps of the accelerated life test method according to any one of claims 1 to 7.

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