Conduction performance testing device for Type-C female terminal

Abstract

The invention discloses a conduction performance testing device for a Type-C female terminal, and the device comprises a fixed frame, and a first fixed block, a second fixed block, a first testing mechanism, a second testing mechanism, a first driving mechanism and a second driving mechanism, which are disposed on the fixed frame, the first testing mechanism is fixedly connected with the first fixed block, and the second testing mechanism is fixedly connected with the second fixed block. The first testing mechanism is fixedly connected with the first fixing block, the second testing mechanism is fixedly connected with the second fixing block, a plurality of guide columns are arranged between the first fixing block and the second fixing block, the first fixing block and the second fixing block are both slidably connected with the guide columns, and the Type-C female end is located between the first testing mechanism and the second testing mechanism; the fixing frame comprises a vertical plate parallel to the guide columns and an insertion plate perpendicular to the vertical plate, one end of the insertion plate is located between the first fixing block and the second fixing block, and during testing, the bottom face of the first fixing block and the top face of the second fixing block are attached to the top face and the bottom face of the insertion plate respectively. The conduction performance testing device provided by the invention is beneficial to improving the stability of testing, thereby improving the accuracy of product detection and the utilization rate of equipment.

Description

Technical Field

[0001] The present invention belongs to the technical field of Type-C female terminal electrical testing, and in particular relates to a conduction performance testing device for a Type-C female terminal. Background Art

[0002] During the Type-C female terminal production process, the product must undergo a continuity test to confirm whether the product is qualified. Existing testing institutions mostly use probes on a single slide rail module to directly contact the product for testing. However, the single slide rail structure is not stable enough, which can easily lead to poor contact between the probe and the product, resulting in misjudgment and reduced machine utilization. Summary of the invention

[0003] In view of this, in order to overcome the defects of the prior art, the purpose of the present invention is to provide a Type-C female end conductivity performance test device, which can improve the test stability of the product and enhance the accuracy of product detection and equipment utilization rate.

[0004] In order to achieve the above object, the present invention adopts the following technical solutions:

[0005] A conduction performance test device for a Type-C female end, comprising a fixed frame and a first fixed block, a second fixed block, a first test mechanism, a second test mechanism, a first driving mechanism and a second driving mechanism arranged on the fixed frame, wherein the first testing mechanism is located above the second testing mechanism, the first testing mechanism is fixedly connected to the first fixed block, the second testing mechanism is fixedly connected to the second fixed block, a plurality of guide pillars are arranged between the first fixed block and the second fixed block, the first fixed block and the second fixed block are both slidably connected to the guide pillars, the first driving mechanism is used to drive the first fixed block to move up and down along the length direction of the guide pillars, the second driving mechanism is used to drive the second fixed block to move up and down along the length direction of the guide pillars, and the Type-C female end is located between the first testing mechanism and the second testing mechanism; the fixed frame comprises a vertical plate parallel to the guide pillars and an inserting plate arranged perpendicular to the vertical plate, one end of the inserting plate is located between the first fixed block and the second fixed block, and during testing, the bottom surface of the first fixed block and the top surface of the second fixed block are respectively in contact with the top surface and the bottom surface of the inserting plate.

[0006] According to a preferred embodiment of the present invention, the first testing mechanism includes a first connecting plate, a second connecting plate, a first plug block fixedly arranged on one side of the first connecting plate, and a first probe assembly fixedly arranged on one side of the second connecting plate, one side of the first connecting plate and one side of the second connecting plate are both fixedly connected to one side of the first fixed block, and the first connecting plate is located above the second connecting plate.

[0007] According to a preferred implementation aspect of the present invention, the first testing mechanism also includes a first connecting block, a first positioning assembly and a second positioning assembly, one side of the first connecting block is fixedly connected to the first connecting plate and the side of the second connecting plate away from the vertical plate, and the bottom surface of the first connecting block is flush with the bottom surface of the second connecting plate; a third connecting plate is fixedly provided on the other side of the first connecting block, and a second plug-in block is fixedly provided on the side of the third connecting plate close to the first connecting block.

[0008] According to a preferred embodiment of the present invention, the first positioning assembly includes two symmetrically arranged first positioning blocks and a first positioning pin connected to one end of the first positioning block by an elastic member, the first positioning block is fixedly connected to the top end of the first connecting block, and the two first positioning pins both penetrate the height direction of the first connecting block; the second positioning assembly includes a second connecting block and two second positioning pins fixedly connected to the second connecting block, the second connecting block is fixedly connected to a side of the first connecting block away from the first connecting plate, the two second positioning pins both penetrate the height direction of the second connecting block, and the third connecting plate is located above the second connecting block.

[0009] According to a preferred embodiment of the present invention, the first probe assembly includes a plurality of first probes penetrating the height direction of the first plug block, the first probes are parallel to the first positioning needles, and the first positioning needles and the second positioning needles are parallel to the guide pillars.

[0010] According to a preferred implementation aspect of the present invention, the first testing mechanism further includes a second probe assembly, the second probe assembly includes a plurality of second probes penetrating the height direction of the second plug block, and the second probes are parallel to the first probes.

[0011] According to a preferred embodiment of the present invention, the length of the first probe is greater than that of the second probe, and the bottom ends of the first probe and the second probe both extend downward from the bottom surface of the first connecting block. The first probe is used to contact the terminal of the Type-C female end, and the second probe is used to contact the SMT solder foot of the Type-C female end.

[0012] According to a preferred implementation aspect of the present invention, the second testing mechanism includes a fourth connecting plate, a third plug block and the first probe assembly, one side of the fourth connecting plate is fixedly connected to one side of the second fixed block, the other side of the fourth connecting plate is fixedly connected to the third plug block and the first probe assembly, and the first probe penetrates the height direction of the third plug block.

[0013] According to a preferred embodiment of the present invention, the multiple first probes of the second testing mechanism are arranged in one-to-one correspondence with the multiple first probes of the first testing mechanism, and a first probe of the second testing mechanism is symmetrically arranged with a first probe of the first testing mechanism located in the same vertical direction.

[0014] According to a preferred implementation aspect of the present invention, the first driving mechanism is located above the first fixing block, and the second driving mechanism is located below the second fixing block.

[0015] Compared with the prior art, the advantages of the present invention lie in that: a conduction performance test device for a Type-C female end of the present invention fixes the first test mechanism on the first fixed block, fixes the second test mechanism on the second fixed block, and sets a plurality of guide pillars between the first fixed block and the second fixed block to replace the single slide rail slider module, and sets an insert plate between the first fixed block and the second fixed block, which is beneficial to improve the stability of the tests of the first test mechanism and the second test mechanism, thereby improving the accuracy of product detection and the equipment utilization rate. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0017] Figure 1 A schematic diagram of the three-dimensional structure of a conduction performance test device according to an embodiment of the present invention;

[0018] Figure 2 It is a schematic diagram of the main structure of the conduction performance test device in an embodiment of the present invention;

[0019] Figure 3 is a schematic diagram of the three-dimensional structure of the first testing mechanism in the first viewing angle in an embodiment of the present invention;

[0020] Figure 4 It is a schematic diagram of the three-dimensional structure of the first testing mechanism in the embodiment of the present invention from a second viewing angle;

[0021] Figure 5 is a schematic diagram of the three-dimensional structure of the first testing mechanism in the embodiment of the present invention from a third viewing angle;

[0022] Figure 6 is a schematic diagram of the three-dimensional structure of the first connecting block in an embodiment of the present invention;

[0023] Figure 7 It is a three-dimensional structural diagram of a hidden part of the first testing mechanism in an embodiment of the present invention;

[0024] Figure 8 is a schematic diagram of the three-dimensional structure of the second testing mechanism in an embodiment of the present invention;

[0025] Wherein, the accompanying drawings are marked as follows:

[0026] Fixed frame-1, vertical plate-11, plug plate-12, first fixed block-2, second fixed block-3, first test mechanism-4, first connecting plate-411, second connecting plate-412, third connecting plate-413, first plug block-421, second plug block-422, first probe-431, first block body-432, first extension block-433, second block body-434, second extension block-435, first connecting block-44, first groove-441, second groove-442, third groove-443, first positioning block-451, first positioning needle-452, elastic member-453, second connecting Block -461, second positioning needle -462, second probe -471, third block body -472, third extension block -473, fourth block body -474, fourth extension block -475, first baffle -481, cover -482, second testing mechanism -5, fourth connecting plate -51, fifth block body -521, fifth extension block -522, first protrusion -53, second protrusion -54, channel -55, second baffle -56, first driving mechanism -6, first driver -61, first fixed seat -62, second driving mechanism -7, second driver -71, second fixed seat -72, guide column -8. DETAILED DESCRIPTION

[0027] In order to enable those skilled in the art to better understand the technical solution of the present invention, the technical solution in the embodiments of the present invention will be clearly and completely described below. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0028] Reference Figures 1 to 8, a conduction performance test device for a Type-C female end of this embodiment includes a fixing frame 1, a guide column 8, and a first fixing block 2, a second fixing block 3, a first test mechanism 4, a second test mechanism 5, a first drive mechanism 6, and a second drive mechanism 7 arranged on the fixing frame 1. Among them, the first test mechanism 4 is located above the second test mechanism 5, the first test mechanism 4 is fixedly connected to the first fixing block 2, the second test mechanism 5 is fixedly connected to the second fixing block 3, and the first test mechanism 4 and the second test mechanism 5 are both located on the same side of the first fixing block 2 and the second fixing block 3. A plurality of guide columns 8 are arranged between the first fixing block 2 and the second fixing block 3, and the first fixing block 2 and the second fixing block 3 are both slidably connected to the guide columns 8. In this embodiment, there are four guide columns 8, which are respectively located at the four corners of the first fixing block 2 and the second fixing block 3, and the guide columns 8 run through the height direction of the first fixing block 2 and the second fixing block 3.

[0029] The fixing frame 1 includes a vertical plate 11 parallel to the guide column 8 and a plug plate 12 arranged perpendicular to the vertical plate 11. The plug plate 12 is fixedly connected to the vertical plate 11 and penetrates the thickness direction of the vertical plate 11. One end of the plug plate 12 is located between the first fixed block 2 and the second fixed block 3. In addition, the first driving mechanism 6 is located above the first fixed block 2, and the second driving mechanism 7 is located below the second fixed block 3. The first driving mechanism 6 includes a first driver 61 and a first fixed seat 62. One side of the first fixed seat 62 is fixedly connected to one side of the vertical plate 11. The shell of the first driver 61 is fixedly connected to the first fixed seat 62. One end of the telescopic shaft of the first driver 61 is fixedly connected to the first fixed block 2. The second driving mechanism 7 includes a second driver 71 and a second fixed seat 72. One side of the second fixed seat 72 is fixedly connected to one side of the vertical plate 11. The shell of the second driver 71 is fixedly connected to the second fixed seat 72. One end of the telescopic shaft of the second driver 71 is fixedly connected to the second fixed block 3. The first driver 61 is used to drive the first fixed block 2 to move up and down along the length direction of the guide column 8, and the second driver 71 is used to drive the second fixed block 3 to move up and down along the length direction of the guide column 8. During the test, the Type-C female end is located between the first test mechanism 4 and the second test mechanism 5. Under the driving action of the first driver 61 and the second driver 71, the bottom surface of the first fixed block 2 and the top surface of the second fixed block 3 are respectively attached to the top surface and the bottom surface of the plugboard 12 to play a supporting and limiting role.

[0030] like Figures 1 to 7As shown, the first test mechanism 4 includes a first connecting plate 411, a second connecting plate 412, a third connecting plate 413, a first plug block 421 fixedly arranged on a side of the first connecting plate 411 away from the first fixed block 2, a first probe assembly fixedly arranged on a side of the second connecting plate 412 away from the first fixed block 2, a first connecting block 44, a second probe assembly, a first positioning assembly and a second positioning assembly. Among them, one side of the first connecting plate 411 and one side of the second connecting plate 412 are both fixedly connected to one side of the first fixed block 2, and the first connecting plate 411 is located above the second connecting plate 412. One side of the first connecting block 44 is fixedly connected to the first connecting plate 411 and the second connecting plate 412 away from the vertical plate 11, and the bottom surface of the first connecting block 44 is flush with the bottom surface of the second connecting plate 412; the other side of the first connecting block 44 is fixedly connected to the third connecting plate 413, the bottom surface of the third connecting plate 413 is fixedly connected to the second positioning assembly, and the second plug block 422 is fixedly arranged on the side of the third connecting plate 413 close to the first connecting block 44.

[0031] Specifically, the first connection block 44 is provided with a first groove 441 extending downward from the middle of the top surface thereof, the height of the first groove 441 being less than the height of the first connection block 44, and the length of the first groove 441 being less than the length of the first connection block 44; the first connection block 44 is provided with a second groove 442 and a third groove 443 on both sides thereof, respectively, the two second grooves 442 are both connected to the first groove 441, the second groove 442 on one side is connected to the third groove 443, and the length direction of the second groove 442 is perpendicular to the length direction of the third groove 443; the third groove 443 is located at one end of the first connection block 44 close to the second testing mechanism 5. The first plug-in block 421 is located in the second groove 442 on one side of the first connection block 44, and the second plug-in block 422 is located in the second groove 442 on the other side of the first connection block 44, and the widths of the first plug-in block 421 and the second plug-in block 422 are both equal to the width of the second groove 442.

[0032] like Figure 4 , Figure 5 and Figure 7As shown, the first probe assembly includes a first insulating block, two fourth plug blocks respectively fixedly connected to both sides of the first insulating block, and a plurality of first probes 431. The shape of the first insulating block is the same as that of the fourth plug block. The first insulating block and the fourth plug block are both located below the first plug block 421. The first probe 431 is fixedly connected to the first plug block 421 and penetrates the height direction of the first plug block 421. A portion of the first probes 431 penetrates one side of the first insulating block and one side of one fourth plug block along the length direction of the fourth plug block, and another portion of the first probes 431 penetrates the other side of the first insulating block and one side of another fourth plug block along the length direction of the fourth plug block. The fourth plug includes a first block body 432 and a first extension block 433 located in the middle of one end of the first block body 432, the first insulating block includes a second block body 434 and a second extension block 435 located in the middle of one end of the second block body 434, the two first block bodies 432 and one second block body 434 are both located in the third groove 443 on one side of the first connecting block 44, and the width of the first block body 432 and the width of the second block body 434 are both equal to the width of the third groove 443; the two first extension blocks 433 and one second extension block 435 are both located in the second groove 442 on one side of the first connecting block 44, and the length of the first extension block 433 and the length of the second extension block 435 are both equal to the width of the second groove 442.

[0033] Similarly, the second probe assembly includes a second insulating block, two fifth plug blocks fixedly connected to both sides of the second insulating block, and a plurality of second probes 471. The shape of the second insulating block is the same as that of the fifth plug block. The second insulating block and the fifth plug block are both located below the second plug block 422. The second probe 471 is fixedly connected to the second plug block 422 and penetrates the height direction of the second plug block 422. A portion of the second probes 471 penetrates one side of the second insulating block and one side of one fifth plug block along the length direction of the fifth plug block, and another portion of the second probes 471 penetrates the other side of the second insulating block and one side of another fifth plug block along the length direction of the fifth plug block. The fifth plug-in block includes a third block body 472 and a third extension block 473 located in the middle of one end of the third block body 472, the second insulating block includes a fourth block body 474 and a fourth extension block 475 located in the middle of one end of the fourth block body 474, the two third block bodies 472 and one fourth block body 474 are both located in the third groove 443 on the other side of the first connecting block 44, and the width of the third block body 472 and the width of the fourth block body 474 are both equal to the width of the third groove 443; the two third extension blocks 473 and one fourth extension block 475 are both located in the second groove 442 on the other side of the first connecting block 44, and the materials of the first insulating block and the second insulating block are both ceramic.

[0034] In addition, the second probe 471 is parallel to the first probe 431, the length of the first probe 431 is greater than the length of the second probe 471, the bottom ends of the first probe 431 and the second probe 471 are both extended downward from the bottom surface of the first connecting block 44, and in the first test mechanism 4, the bottom end of the first probe 431 is located below the bottom end of the second probe 471. The first probe 431 is used to contact the upper surface of the terminal of the Type-C female end, and the second probe 471 is used to contact the SMT solder foot of the Type-C female end for conduction testing.

[0035] like Figures 3 to 5 As shown, the first positioning assembly includes two symmetrically arranged first positioning blocks 451 and a first positioning pin 452 connected to one end of the first positioning block 451 through an elastic member 453. The first positioning block 451 is fixedly connected to the top of the first connecting block 44. The two first positioning pins 452 both penetrate the height direction of the first connecting block 44 and the top of the first positioning pin 452 is located in the first groove 441. The first positioning pin 452 is located between the first probe 431 and the second probe 471. The second positioning assembly includes a second connecting block 461 and two second positioning pins 462 fixedly connected to the second connecting block 461. The two second positioning pins 462 both penetrate the height direction of the second connecting block 461. The second connecting block 461 is fixedly connected to a side of the first connecting block 44 away from the first connecting plate 411 and the top surface of the second connecting block 461 is fixedly connected to the bottom surface of the third connecting plate 413. The second probe assembly is located between one side of the first connecting block 44 and one side of the second connecting block 461. The second connecting block 461 can simultaneously shield and protect the second probe assembly. The first probe 431 is parallel to the first positioning pin 452. The first positioning pin 452 and the second positioning pin 462 are both parallel to the guide column 8. The bottom end of the second positioning pin 462 is located below the bottom end of the first positioning pin 452. During the test, the second positioning pin 462 first positions the product strip. With the continuous driving of the first driver 61, the first test mechanism 4 continues to move downward until the first positioning pin 452 contacts the terminal of the Type-C female end. The two first positioning pins 452 are respectively located on both sides of the terminal to clamp the terminal, thereby fixing and limiting the position of the terminal to prevent it from shifting during the test; the setting of the elastic member 453 can avoid the hard contact between the first positioning pin 452 and the terminal, and play a buffering role. The elastic member 453 of this embodiment is preferably a spring.

[0036] The first testing mechanism 4 also includes a first baffle 481 and a cover plate 482. The first baffle 481 is fixedly connected to the side of the second connecting block 461 away from the first connecting block 44. The cover plate 482 is fixedly connected to the top of the first baffle 481. The bottom surface of the cover plate 482 is also in contact with the top of the second positioning pin 462 to prevent the top of the second positioning pin 462 from being directly exposed to the outside and possibly damaged.

[0037] like Figure 1 , Figure 2 and Figure 8 As shown, the second test mechanism 5 includes a fourth connecting plate 51, a third plug-in block and a first probe assembly. One side of the fourth connecting plate 51 is fixedly connected to one side of the second fixed block 3, and the other side of the fourth connecting plate 51 is fixedly connected to the third plug-in block and the first probe assembly. A first protrusion 53 and a second protrusion 54 are fixedly arranged on one side of the fourth connecting plate 51 away from the second fixed block 3. Two first protrusions 53 and two second protrusions 54 are symmetrically arranged. The first protrusion 53 is located above the second protrusion 54, and the first protrusion 53 is located on the top of the fourth connecting plate 51. The distance between the two first protrusions 53 is equal to the distance between the two second protrusions 54, and a channel 55 parallel to the first probe 431 is formed between the two first protrusions 53 and the two second protrusions 54. The first probe 431 in the second test mechanism 5 passes through the channel 55. In the first probe assembly of the second test mechanism 5, two first block bodies 432 and one second block body 434 are both located between the bottom surface of the first protrusion 53 and the top surface of the second protrusion 54, and the width of the first block body 432 and the width of the second block body 434 are both equal to the distance between the first protrusion 53 and the second protrusion 54; two first extension blocks 433 and one second extension block 435 are both located in the channel 55, and the length of the first extension block 433 and the length of the second extension block 435 are both equal to the width of the channel 55. The first probe 431 of the second test mechanism 5 is fixedly connected to the third plug-in block and passes through the height direction of the third plug-in block. The third plug-in block includes a fifth block body 521 and a fifth extension block 522 located in the middle of one end of the fifth block body 521. The fifth extension block 522 is also located in the channel 55 and the length of the fifth extension block 522 is equal to the width of the channel 55. The top surface of the fifth block body 521 is in contact with the bottom surface of the second protrusion 54.

[0038] The multiple first probes 431 of the second testing mechanism 5 are arranged in a one-to-one correspondence with the multiple first probes 431 of the first testing mechanism 4. In this embodiment, four first probes 431 are respectively arranged in the first testing mechanism 4 and the second testing mechanism 5. A first probe 431 of the second testing mechanism 5 is symmetrically arranged with a first probe 431 of the first testing mechanism 4 located in the same vertical direction. The first probe 431 in the second testing mechanism 5 is used to contact the lower surface of the terminal of the Type-C female end.

[0039] In addition, the second testing mechanism 5 further includes a second baffle 56 , one side of which is fixedly connected to the two first bumps 53 and the two second bumps 54 , and the second baffle 56 is used to shield a portion of the first probe 431 in the second testing mechanism 5 to prevent it from being damaged.

[0040] The above embodiments are only for illustrating the technical concept and features of the present invention, and their purpose is to enable people familiar with this technology to understand the contents of the present invention and implement them accordingly. They cannot be used to limit the protection scope of the present invention. Any equivalent changes or modifications made according to the spirit of the present invention should be included in the protection scope of the present invention.

Claims

1. A Type-C female end conduction performance test device, characterized in that: It includes a fixing frame and a first fixing block, a second fixing block, a first testing mechanism, a second testing mechanism, a first driving mechanism and a second driving mechanism arranged on the fixing frame, the first testing mechanism is located above the second testing mechanism, the first testing mechanism is fixedly connected to the first fixing block, the second testing mechanism is fixedly connected to the second fixing block, a plurality of guide posts are arranged between the first fixing block and the second fixing block, the first fixing block and the second fixing block are both slidably connected to the guide posts, the first driving mechanism is used to drive the first fixing block to move up and down along the length direction of the guide posts, the second driving mechanism is used to drive the second fixing block to move up and down along the length direction of the guide posts, and the Type-C female end is located between the first testing mechanism and the second testing mechanism; the fixing frame includes a vertical plate parallel to the guide posts and an inserting plate arranged perpendicular to the vertical plate, one end of the inserting plate is located between the first fixing block and the second fixing block, and during testing, the bottom surface of the first fixing block and the top surface of the second fixing block are respectively fitted with the top surface and the bottom surface of the inserting plate.

2. The conduction performance test device according to claim 1, characterized in that: The first testing mechanism includes a first connecting plate, a second connecting plate, a first plug block fixedly arranged on one side of the first connecting plate, and a first probe assembly fixedly arranged on one side of the second connecting plate. One side of the first connecting plate and one side of the second connecting plate are both fixedly connected to one side of the first fixed block, and the first connecting plate is located above the second connecting plate.

3. The conduction performance test device according to claim 2, characterized in that: The first testing mechanism also includes a first connecting block, a first positioning assembly and a second positioning assembly. One side of the first connecting block is fixedly connected to the first connecting plate and the side of the second connecting plate away from the vertical plate, and the bottom surface of the first connecting block is flush with the bottom surface of the second connecting plate. A third connecting plate is fixedly provided on the other side of the first connecting block, and a second plug-in block is fixedly provided on the side of the third connecting plate close to the first connecting block.

4. The conduction performance test device according to claim 3, characterized in that: The first positioning assembly includes two symmetrically arranged first positioning blocks and a first positioning pin connected to one end of the first positioning block by an elastic member, the first positioning block is fixedly connected to the top end of the first connecting block, and the two first positioning pins both penetrate the height direction of the first connecting block; the second positioning assembly includes a second connecting block and two second positioning pins fixedly connected to the second connecting block, the second connecting block is fixedly connected to a side of the first connecting block away from the first connecting plate, the two second positioning pins both penetrate the height direction of the second connecting block, and the third connecting plate is located above the second connecting block.

5. The conduction performance test device according to claim 3, characterized in that: The first probe assembly includes a plurality of first probes penetrating the first plug block in a height direction, the first probes are parallel to the first positioning pins, and the first positioning pins and the second positioning pins are both parallel to the guide pillars.

6. The conduction performance test device according to claim 3, characterized in that: The first testing mechanism further includes a second probe assembly, wherein the second probe assembly includes a plurality of second probes extending through the height direction of the second plug block, and the second probes are parallel to the first probes.

7. The conduction performance test device according to claim 6, characterized in that: The length of the first probe is greater than that of the second probe, and bottom ends of the first probe and the second probe both extend downward from the bottom surface of the first connecting block.

8. The conduction performance test device according to claim 5, characterized in that: The second testing mechanism includes a fourth connecting plate, a third plug block and the first probe assembly, one side of the fourth connecting plate is fixedly connected to one side of the second fixed block, the other side of the fourth connecting plate is fixedly connected to the third plug block and the first probe assembly, and the first probe penetrates the height direction of the third plug block.

9. The conduction performance test device according to claim 8, characterized in that: The multiple first probes of the second testing mechanism are arranged in one-to-one correspondence with the multiple first probes of the first testing mechanism, and one first probe of the second testing mechanism is symmetrically arranged with one first probe of the first testing mechanism located in the same vertical direction.

10. The conduction performance test device according to claim 1, characterized in that: The first driving mechanism is located above the first fixing block, and the second driving mechanism is located below the second fixing block.

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