BCU hardware board test method and system, medium and product

Abstract

The invention discloses a BCU hardware board testing method and system, a medium and a product, and relates to the technical field of automatic testing. The BCU hardware board testing method disclosed by the invention comprises the following steps: confirming a test item set, wherein the test item set comprises a communication function test, an IO function test, an acquisition function test, a storage function test and a watchdog function test; selecting a test item from the test item set; testing the BCU hardware board through the test board, the BCU hardware board and the tool board according to the test item, and recording a test result when the test is completed; and returning to the step of selecting the item to be tested from the test item set until all the test items in the test item set are tested. By means of the method, the problems that in the prior art, BCU hardware board testing content is incomplete, and procedures are complex are solved.

Description

Technical Field

[0001] The present invention relates to the field of automated testing technology, and in particular to a BCU hardware board testing method, system, medium and product. Background Art

[0002] With the rapid development of energy storage, energy storage battery management systems are increasingly being used in various industries. Energy storage battery management systems are used in homes, factories, farms and other indoor and outdoor scenarios.

[0003] The main control unit BCU is the control and management module of the energy storage battery management system. It plays a key role in the safe application of energy storage battery groups when used in groups and the extension of their life. The module provides real-time monitoring of battery parameters, fault diagnosis, SOC / SOH estimation, insulation detection, display alarm, remote monitoring and other functions of the energy storage system; it can detect the voltage and temperature of the battery cells through communication with the slave control unit BMU; and it can exchange information with the energy storage converter PCS and energy monitoring system EMS and other equipment through the CAN bus to ensure efficient, reliable and safe operation of the energy storage system.

[0004] In a set of energy storage battery management system, there are usually only 1 to 2 main control unit BCU modules. Therefore, the normal operation of the BCU is crucial; that is to say, the completeness of the factory test of the BCU hardware board directly affects whether the energy storage system can operate normally.

[0005] BCU includes multiple sampling, multiple communications, multiple dry contacts, clock and watchdog functions, etc., and needs to complete full-function testing when the hardware board is shipped out of the factory to ensure the normal operation of subsequent products. However, general factory test tools only test the voltage and communication of TP points, etc. The test content is incomplete and needs to go through multiple FCT processes. Summary of the invention

[0006] The main purpose of the present invention is to propose a BCU hardware board testing method, aiming to solve the problem that the prior art has incomplete testing content and complicated procedures for BCU hardware boards.

[0007] To achieve the above object, the present invention proposes a BCU hardware board testing method, the BCU hardware board testing method comprising:

[0008] Confirm the test item set, which includes: communication function test, IO function test, acquisition function test, storage function test and watchdog function test;

[0009] Selecting a test item from the test item set;

[0010] Test the BCU hardware board using the test board, BCU hardware board and tooling board according to the test items, and record the test results when the test is completed;

[0011] Return to the step of selecting items to be tested from the test item set until all test items in the test item set are tested.

[0012] In one embodiment, when the test item is the communication function test, the step of testing the BCU hardware board through the test board and the tooling board according to the test item specifically includes:

[0013] Outputting a first test signal to the test board so that the test board outputs a corresponding data frame to the BCU hardware board;

[0014] Receive the first feedback information output by the test board. If the first feedback information indicates that the test board receives the same data frame within a first preset time period, it is determined that the communication function of the BCU hardware board is normal; otherwise, it is determined that the communication function of the BCU hardware board is abnormal.

[0015] In one embodiment, when the test item is the IO function test, the step of testing the BCU hardware board through the test board and the tooling board according to the test item specifically includes:

[0016] Output the second test signal to the test board, so that the DO port of the test board outputs a level signal to the DI port of the BCU hardware board;

[0017] Detecting the second feedback information of the BCU hardware board, if the second feedback information indicates that the DI of the BCU hardware board is driven and the DI level changes, it is determined that the DI function of the BCU hardware board is normal, otherwise it is determined that the DI function of the BCU hardware board is abnormal;

[0018] Output the third test signal to the BCU hardware board, so that the DO port of the BCU hardware board outputs a level signal to the DI port of the test board;

[0019] The third feedback information output by the test board is detected. If the third feedback information indicates that the DI of the test board is driven and the DI level changes, it is determined that the DO function of the BCU hardware board is normal; otherwise, it is determined that the DO function of the BCU hardware board is abnormal.

[0020] In one embodiment, when the test item is the acquisition function test, the step of testing the BCU hardware board through the test board and the tooling board according to the test item specifically includes:

[0021] Output a fourth test signal to the tooling board, so that the tooling board outputs an analog voltage to the BCU hardware board, the board under test collects the analog voltage and transmits the collected data result to the test board, and the test board compares the collected data result with a preset interval;

[0022] Receive the fourth feedback information output by the BCU hardware board. If the fourth feedback information indicates that the collected data result is within a preset range, it is determined that the collection function of the BCU hardware board is normal; otherwise, it is determined that the collection function of the BCU hardware board is abnormal.

[0023] In one embodiment, when the test item is the storage function test, the step of testing the BCU hardware board through the test board and the tooling board according to the test item specifically includes:

[0024] Outputting a fifth test signal to the BCU hardware board so that the single-chip microcomputer of the BCU hardware board performs write and read operations on the internal storage module of the BCU hardware board;

[0025] Receive the fifth feedback information output by the BCU hardware board. If the fifth feedback information can be written and read normally, it is determined that the storage function of the BCU hardware board is normal; otherwise, it is determined that the storage function of the BCU hardware board is abnormal.

[0026] In one embodiment, when the test item is the watchdog function test, the step of testing the BCU hardware board through the test board and the tooling board according to the test item specifically includes:

[0027] Outputting a sixth test signal to the BCU hardware board to stop enabling the watchdog of the BCU hardware board, and enabling the watchdog of the BCU hardware board every second preset time period;

[0028] outputting a seventh test signal to the test board when the watchdog is enabled, so that the test board sends a corresponding data frame every third preset time length; the second preset time length is an integer multiple of the third preset time length;

[0029] Receive the sixth feedback information output by the test board. If the sixth feedback information is a data frame replied by the test board within the second preset time after sending the corresponding data frame, it is determined that the watchdog function of the BCU hardware board is normal; otherwise, it is determined that the watchdog function of the BCU hardware board is abnormal.

[0030] In one embodiment, after the step of testing the BCU hardware board by using the test board, the BCU hardware board and the tooling board and recording the test results when the test is completed, the step further includes:

[0031] The test results are transmitted to the tooling board so that the tooling board displays the test results.

[0032] In addition, to achieve the above-mentioned purpose, the present invention also proposes a BCU hardware board testing system, the BCU hardware board testing system comprising: a testing board, a tooling board and a host computer;

[0033] The test board is connected to the host computer, the tooling board and the BCU hardware board respectively, and the tooling board is connected to the host computer and the BCU hardware board respectively;

[0034] The BCU hardware board includes a BCU;

[0035] The host computer is used to output test signals to the test board, the tooling board and the board to be tested;

[0036] The test board, tooling board and board to be tested are used to test the BCU hardware board when receiving the test signal output by the host computer, and output feedback information to the host computer according to the test result;

[0037] The host computer is also used to determine the test result according to the feedback information;

[0038] The host computer is also used to save the test results after the determination;

[0039] The host computer is also used to transmit the determined test results to the tooling board;

[0040] The tooling board is also used to display the test result after receiving the determined test result.

[0041] In addition, to achieve the above-mentioned purpose, the present invention also proposes a storage medium, which is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by the processor, the steps of the BCU hardware board testing method described above are implemented.

[0042] In addition, to achieve the above-mentioned purpose, the present invention also proposes a computer program product, which includes a computer program, and when the computer program is executed by a processor, the steps of the BCU hardware board testing method described above are implemented.

[0043] The present invention discloses a BCU hardware board testing method, system, medium and product, and relates to the field of automated testing technology. The disclosed BCU hardware board testing method includes: confirming a test item set, the test item set includes: communication function test, IO function test, acquisition function test, storage function test and watchdog function test; selecting test items from the test item set; testing the BCU hardware board through a test board, a BCU hardware board and a tooling board according to the test items, and recording the test results when the test is completed; returning to the step of selecting items to be tested from the test item set until all test items in the test item set are tested. The present invention solves the problem of incomplete content and complicated procedures of BCU hardware board testing in the prior art through the above method. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying creative work.

[0045] Figure 1 This is a flow chart of a first embodiment of a BCU hardware board testing method of the present invention;

[0046] Figure 2 A schematic diagram of a flow chart of a second embodiment of a BCU hardware board testing method of the present invention;

[0047] Figure 3 A schematic diagram of a flow chart of a third embodiment of a BCU hardware board testing method of the present invention;

[0048] Figure 4 A schematic diagram of a flow chart of a fourth embodiment of a BCU hardware board testing method of the present invention;

[0049] Figure 5 A schematic diagram of a flow chart of a fifth embodiment of a BCU hardware board testing method according to the present invention;

[0050] Figure 6 A schematic diagram of a sixth embodiment of a BCU hardware board testing method according to the present invention;

[0051] Figure 7 A flowchart of a seventh embodiment of a BCU hardware board testing method according to the present invention;

[0052] Figure 8 It is a structural schematic diagram of the BCU hardware board testing system according to an embodiment of the present invention.

[0053] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0054] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0055] It should be noted that if the embodiments of the present invention involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative position relationship, movement status, etc. between the components in a certain specific posture. If the specific posture changes, the directional indication will also change accordingly.

[0056] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, the descriptions of "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features limited to "first" and "second" may explicitly or implicitly include at least one of the features. In addition, if "and / or" or "and / or" appears in the full text, its meaning includes three parallel solutions. Taking "A and / or B" as an example, it includes solution A, solution B, or solutions that satisfy both A and B. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in this field to implement. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0057] The present invention proposes a BCU hardware board testing method, referring to Figure 1 , Figure 1 It is a flowchart of the first embodiment of the BCU hardware board testing method of the present invention.

[0058] In one embodiment of the present invention, the BCU hardware board testing method includes steps S10 to S40;

[0059] S10: confirming a test item set, wherein the test item set includes: a communication function test, an IO function test, an acquisition function test, a storage function test, and a watchdog function test.

[0060] S20: Selecting a test item from the test item set.

[0061] S30: Testing the BCU hardware board through the test board, BCU hardware board and tooling board according to the test items, and recording the test results when the test is completed.

[0062] S40: Return to the step of selecting items to be tested from the test item set until all test items in the test item set are tested.

[0063] It should be noted that the test item set items may also include other test items, which is not limited in this embodiment.

[0064] It should be noted that the number of test items selected from the test item set may be one or more, and this embodiment does not impose any limitation on this.

[0065] The test items of this embodiment include: communication function test, IO function test, acquisition function test, storage function test and watchdog function test; compared with the general factory test tooling which only tests the voltage and communication of the TP point, the test content is incomplete and needs to go through multiple FCT processes. The test content of this embodiment is more comprehensive and does not need to go through multiple FCT processes.

[0066] In specific implementation, confirm the test item set, which includes: communication function test, IO function test, acquisition function test, storage function test and watchdog function test; select test items from the test item set; test the BCU hardware board through the test board, BCU hardware board and tooling board according to the test items, and record the test results when the test is completed; return to the step of selecting the items to be tested from the test item set until all test items in the test item set are tested.

[0067] The test items of this embodiment include: communication function test, IO function test, acquisition function test, storage function test and watchdog function test, and the test tools of this embodiment are test board, BCU hardware board and tooling board; compared with the general factory test tooling which only tests the voltage and communication of TP points, the test content is incomplete and needs to go through multiple FCT processes. The test content of this embodiment is more comprehensive and does not need to go through multiple FCT processes.

[0068] Based on the first embodiment of the present invention, in the second embodiment of the present invention, the same or similar contents as those in the first embodiment can refer to the above introduction, and will not be repeated in the following. Figure 2 , Figure 2 It is a flow chart of the second embodiment of the BCU hardware board testing method of the present invention.

[0069] In this embodiment, when the test item is the communication function test, the step S30 specifically includes S311 to S312;

[0070] S311: Output a first test signal to the test board so that the test board outputs a corresponding data frame to the BCU hardware board.

[0071] S312: Receive the first feedback information output by the test board. If the first feedback information indicates that the test board receives the same data frame within a first preset time period, it is determined that the communication function of the BCU hardware board is normal; otherwise, it is determined that the communication function of the BCU hardware board is abnormal.

[0072] It should be noted that the data frame may be a regular data frame, or a remote frame, an error frame, or other types of data frames, which is not limited in this embodiment.

[0073] It should be noted that the first preset duration can be changed according to actual needs, and this embodiment does not limit this.

[0074] It can be understood that the test board outputs data frames to the BCU hardware board. When the BCU receives the data frame, it will normally send the same data frame to the test board. If the test board does not receive the data frame sent by the BCU or receives an inconsistent data frame, it can be determined that the communication function of the BCU hardware board is abnormal.

[0075] In a specific implementation, a first test signal is output to the test board so that the test board outputs a corresponding data frame to the BCU hardware board; and a first feedback information output by the test board is received. If the first feedback information indicates that the test board receives the same data frame within a first preset time period, then the communication function of the BCU hardware board is determined to be normal; otherwise, the communication function of the BCU hardware board is determined to be abnormal.

[0076] Based on the second embodiment of the present invention, in the third embodiment of the present invention, the same or similar contents as those in the second embodiment can refer to the above introduction, and will not be described in detail later. Figure 3 , Figure 3 It is a flowchart of the third embodiment of the BCU hardware board testing method of the present invention.

[0077] In this embodiment, when the test item is the IO function test, the step S30 specifically includes S321 to S324;

[0078] S321: Output a second test signal to the test board, so that the DO port of the test board outputs a level signal to the DI port of the BCU hardware board.

[0079] S322: Detect the second feedback information of the BCU hardware board. If the second feedback information indicates that the DI of the BCU hardware board is driven and the DI level changes, it is determined that the DI function of the BCU hardware board is normal; otherwise, it is determined that the DI function of the BCU hardware board is abnormal.

[0080] S323: Output the third test signal to the BCU hardware board, so that the DO port of the BCU hardware board outputs a level signal to the DI port of the test board.

[0081] S324: Detect the third feedback information output by the test board. If the third feedback information indicates that the DI of the test board is driven and the DI level changes, it is determined that the DO function of the BCU hardware board is normal; otherwise, it is determined that the DO function of the BCU hardware board is abnormal.

[0082] It should be noted that the level signal can be a high level or a low level, which is not limited in this embodiment.

[0083] It can be understood that the test board outputs a level signal to the DI port of the BCU hardware board, and the BCU hardware board receives the level signal. Under normal circumstances, the DI of the BCU hardware board will be driven and the DI level will change. If the DI of the BCU hardware board is not driven or the DI level does not change, it can be determined that the DI function of the BCU hardware board is abnormal. Correspondingly, the DO port of the BCU hardware board outputs a level signal to the DI port of the test board, and the test board receives the level signal. Under normal circumstances, the DI of the test board will be driven and the DI level will change. If the DI of the test board is not driven or the DI level does not change, it can be determined that the DO function of the BCU hardware board is abnormal.

[0084] In a specific implementation, a second test signal is output to the test board so that the DO port of the test board outputs a level signal to the DI port of the BCU hardware board; the second feedback information of the BCU hardware board is detected, and if the second feedback information is that the DI of the BCU hardware board is driven and the DI level changes, then the DI function of the BCU hardware board is determined to be normal, otherwise the DI function of the BCU hardware board is determined to be abnormal; a third test signal is output to the BCU hardware board so that the DO port of the BCU hardware board outputs a level signal to the DI port of the test board; the third feedback information output by the test board is detected, and if the third feedback information is that the DI of the test board is driven and the DI level changes, then the DO function of the BCU hardware board is determined to be normal, otherwise the DO function of the BCU hardware board is determined to be abnormal.

[0085] Based on the third embodiment of the present invention, in the fourth embodiment of the present invention, the same or similar contents as those in the third embodiment can refer to the above introduction, and will not be repeated in the following. Figure 4 , Figure 4It is a flowchart of the fourth embodiment of the BCU hardware board testing method of the present invention.

[0086] In this embodiment, when the test item is the acquisition function test, the step S30 specifically includes S331 to S332;

[0087] S331: Output the fourth test signal to the tooling board so that the tooling board outputs an analog voltage to the BCU hardware board. The board under test collects the analog voltage and transmits the collected data results to the test board. The test board compares the collected data results with a preset interval.

[0088] S332: Receive the fourth feedback information output by the BCU hardware board. If the fourth feedback information indicates that the collected data result is within a preset range, it is determined that the collection function of the BCU hardware board is normal; otherwise, it is determined that the collection function of the BCU hardware board is abnormal.

[0089] It should be noted that the analog voltage may be a sine wave, a square wave, or other types of analog voltages, which is not limited in this embodiment.

[0090] It should be noted that the preset interval can be changed according to actual needs, and this embodiment does not limit this.

[0091] It can be understood that the tooling board outputs an analog voltage to the BCU hardware board. When the test board receives the analog voltage, it collects the analog voltage and transmits the collected data results to the test board. Under normal circumstances, the data results should be in a preset range. If the data results are not in the preset range, it can be determined that the collection function of the BCU hardware board is abnormal.

[0092] In a specific implementation, the fourth test signal is output to the tooling board, so that the tooling board outputs an analog voltage to the BCU hardware board. The board under test collects the analog voltage and transmits the collected data results to the test board, and the test board compares the collected data results with a preset interval; the fourth feedback information output by the BCU hardware board is received. If the fourth feedback information indicates that the collected data results are within the preset interval, it is determined that the collection function of the BCU hardware board is normal; otherwise, it is determined that the collection function of the BCU hardware board is abnormal.

[0093] Based on the fourth embodiment of the present invention, in the fifth embodiment of the present invention, the same or similar contents as those in the fourth embodiment can be referred to the above introduction, and will not be described in detail later. Figure 5 , Figure 5 Schematic diagram of the flow chart of the fifth embodiment of the BCU hardware board testing method of the present invention.

[0094] In this embodiment, when the test item is the storage function test, the step S30 specifically includes S341 to S342;

[0095] S341: Output the fifth test signal to the BCU hardware board so that the single chip microcomputer of the BCU hardware board performs write and read operations on the internal storage module of the BCU hardware board.

[0096] S342: Receive the fifth feedback information output by the BCU hardware board. If the fifth feedback information can be written and read normally, it is determined that the storage function of the BCU hardware board is normal; otherwise, it is determined that the storage function of the BCU hardware board is abnormal.

[0097] It should be noted that the single chip microcomputer may be a RAM type single chip microcomputer, or a ROM type single chip microcomputer or a FLASH type single chip microcomputer, and this embodiment does not impose any limitation on this.

[0098] It should be noted that the internal storage module may be a read-only memory, or a volatile memory or other devices with storage functions, which is not limited in this embodiment.

[0099] It is understandable that, under normal circumstances, the single-chip microcomputer of the BCU hardware board can normally write and read the internal storage module of the BCU hardware board. If the single-chip microcomputer of the BCU hardware board cannot normally write and read the internal storage module of the BCU hardware board, it can be determined that the storage function of the BCU hardware board is abnormal.

[0100] In a specific implementation, the fifth test signal is output to the BCU hardware board so that the single-chip microcomputer of the BCU hardware board performs write and read operations on the internal storage module of the BCU hardware board. The fifth feedback information output by the BCU hardware board is received. If the fifth feedback information is able to be written and read normally, it is determined that the storage function of the BCU hardware board is normal, otherwise it is determined that the storage function of the BCU hardware board is abnormal.

[0101] Based on the fifth embodiment of the present invention, in the sixth embodiment of the present invention, the same or similar contents as those in the fifth embodiment can refer to the above introduction, and will not be described in detail later. Figure 6 , Figure 6 It is a flowchart of the sixth embodiment of the BCU hardware board testing method of the present invention.

[0102] In this embodiment, when the test item is the watchdog function test, the step S30 specifically includes S351 to S353;

[0103] S351: outputting a sixth test signal to the BCU hardware board to stop enabling the watchdog of the BCU hardware board, and enabling the watchdog of the BCU hardware board every second preset time period;

[0104] S352: Outputting a seventh test signal to the test board when the watchdog is enabled, so that the test board sends a corresponding data frame every third preset time length; the second preset time length is an integer multiple of the third preset time length.

[0105] S353: Receive the sixth feedback information output by the test board. If the sixth feedback information is a data frame replied by the test board within the second preset time after sending the corresponding data frame, it is determined that the watchdog function of the BCU hardware board is normal; otherwise, it is determined that the watchdog function of the BCU hardware board is abnormal.

[0106] It should be noted that the second preset time length and the third preset time length can be changed according to actual needs, and this embodiment does not limit this.

[0107] It can be understood that, the second preset time length is set to 1 second, and the third preset time length is set to 5 seconds, so that the watchdog of the BCU hardware board is stopped and enabled, and the watchdog of the BCU hardware board is enabled every 5 seconds, and when the watchdog is enabled, the test board sends the corresponding data frame every 1 second; under normal circumstances, during the time period when the watchdog is stopped being enabled, the BCU hardware board stops working, and the test board outputs data frames and will not receive data frames replied by the BCU hardware board. At the 5th second, the watchdog is enabled, and the test board outputs data frames, and the BCU hardware board will receive the data frames and reply with corresponding data frames.

[0108] In a specific implementation, when the watchdog is enabled, the seventh test signal is output to the test board, so that the test board sends the corresponding data frame every third preset time; the second preset time is an integer multiple of the third preset time; the sixth feedback information output by the test board is received, and if the sixth feedback information is a data frame replied by the test board at the second preset time after sending the corresponding data frame, it is determined that the watchdog function of the BCU hardware board is normal, otherwise it is determined that the watchdog function of the BCU hardware board is abnormal.

[0109] Based on the sixth embodiment of the present invention, in the seventh embodiment of the present invention, the same or similar contents as those in the sixth embodiment can refer to the above introduction, and will not be described in detail later. Figure 7 , Figure 7 It is a flowchart of the sixth embodiment of the BCU hardware board testing method of the present invention.

[0110] In this embodiment, step S40 further includes step S50;

[0111] S50: Transmit the test result to the tooling board so that the tooling board displays the test result.

[0112] It should be noted that the test results may be displayed in the form of pictures, lights, texts or other forms, and this embodiment does not limit this.

[0113] In a specific implementation, the test results are transmitted to the tooling board so that the tooling board displays the test results.

[0114] This embodiment displays the test results through the tooling board, which is conducive to the user receiving the test results more intuitively and conveniently.

[0115] It should be noted that the above examples are only used to understand the present invention and do not constitute a limitation on the BCU hardware board testing method of the present invention. More simple transformations based on this technical concept are all within the protection scope of the present invention.

[0116] Please refer to Figure 8 , Figure 8 It is a structural schematic diagram of the BCU hardware board testing system according to an embodiment of the present invention.

[0117] The present invention also provides a BCU hardware board testing system, the BCU hardware board testing system comprising: a testing board, a tooling board and a host computer;

[0118] The test board is connected to the host computer, the tooling board and the BCU hardware board respectively, and the tooling board is connected to the host computer and the BCU hardware board respectively;

[0119] The BCU hardware board includes a BCU;

[0120] The host computer is used to output test signals to the test board, the tooling board and the board to be tested;

[0121] The test board, tooling board and board to be tested are used to test the BCU hardware board when receiving the test signal output by the host computer, and output feedback information to the host computer according to the test result;

[0122] The host computer is also used to determine the test result according to the feedback information;

[0123] The host computer is also used to save the test results after the determination;

[0124] The host computer is also used to transmit the determined test results to the tooling board;

[0125] The tooling board is also used to display the test result after receiving the determined test result.

[0126] It should be noted that the host computer may be a personal computer, a workstation, or a server, a PLC, an HMI, etc., and this embodiment does not impose any limitation on this.

[0127] The BCU hardware board testing system provided by the present invention adopts the BCU hardware board testing method in the above embodiment, which can solve the problem that the BCU hardware board testing content is incomplete and the process is complicated in the prior art. Compared with the prior art, the beneficial effects of the BCU hardware board testing system provided by the present invention are the same as the beneficial effects of the BCU hardware board testing method provided by the above embodiment, and the other technical features of the BCU hardware board testing system are the same as the features disclosed in the method of the previous embodiment, which will not be repeated here.

[0128] It should be understood that the various parts disclosed in the present invention can be implemented by hardware, software, firmware or a combination thereof. In the description of the above embodiments, specific features, structures, materials or characteristics can be combined in any one or more embodiments or examples in a suitable manner.

[0129] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

[0130] The present invention provides a computer-readable storage medium having computer-readable program instructions (ie, computer programs) stored thereon, wherein the computer-readable program instructions are used to execute the BCU hardware board testing method in the above-mentioned embodiment.

[0131] The computer-readable storage medium provided by the present invention may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, systems or devices, or any combination thereof. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program that may be used by or in combination with an instruction execution system, system or device. The program code contained on the computer-readable storage medium may be transmitted using any suitable medium, including but not limited to: wires, optical cables, RF (Radio Frequency), etc., or any suitable combination thereof.

[0132] The above-mentioned computer-readable storage medium may be included in the BCU hardware board test system; or it may exist independently without being assembled into the BCU hardware board test system. The computer program code for performing the operation of the present invention may be written in one or more programming languages ​​or a combination thereof, and the above-mentioned programming languages ​​include object-oriented programming languages, such as Java, Smalltalk, C++, and conventional procedural programming languages, such as "C" language or similar programming languages. The program code may be executed entirely on the user's computer, partially on the user's computer, as an independent software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or it may be connected to an external computer (for example, using an Internet service provider to connect through the Internet).

[0133] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present invention. In this regard, each square box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the square box can also occur in a sequence different from that marked in the accompanying drawings. For example, two square boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each square box in the block diagram and / or flow chart, and the combination of the square boxes in the block diagram and / or flow chart can be implemented with a dedicated hardware-based system that performs the specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0134] The modules involved in the embodiments of the present invention may be implemented by software or hardware, wherein the name of the module does not limit the unit itself in some cases.

[0135] The readable storage medium provided by the present invention is a computer-readable storage medium, which stores computer-readable program instructions (i.e., computer programs) for executing the above-mentioned BCU hardware board testing method, and can solve the problem of incomplete content and complicated procedures for BCU hardware board testing in the prior art. Compared with the prior art, the beneficial effects of the readable storage medium provided by the present invention being a computer-readable storage medium are the same as the beneficial effects of the BCU hardware board testing method provided by the above-mentioned embodiment, and will not be elaborated here.

[0136] The present invention also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the steps of the BCU hardware board testing method as described above are implemented.

[0137] The computer program product provided by the present invention is used to execute the computer-readable program instructions of the above-mentioned BCU hardware board testing method, which can solve the problem of incomplete content and complicated procedures of BCU hardware board testing in the prior art. Compared with the prior art, the beneficial effects of the computer program product provided by the present invention are the same as the beneficial effects of the BCU hardware board testing method provided by the above-mentioned embodiment, which will not be described in detail here.

[0138] The above descriptions are only some embodiments of the present invention, and are not intended to limit the patent scope of the present invention. All equivalent structural changes made using the contents of the present invention's specification and drawings under the technical concept of the present invention, or directly / indirectly applied in other related technical fields, are included in the patent protection scope of the present invention.

Claims

1. A BCU hardware board testing method, characterized in that: The BCU hardware board testing method comprises: Confirm the test item set, which includes: communication function test, IO function test, acquisition function test, storage function test and watchdog function test; Selecting a test item from the test item set; Test the BCU hardware board using the test board, BCU hardware board and tooling board according to the test items, and record the test results when the test is completed; Return to the step of selecting items to be tested from the test item set until all test items in the test item set are tested.

2. The BCU hardware board testing method according to claim 1, characterized in that: When the test item is the communication function test, the step of testing the BCU hardware board through the test board and the tooling board according to the test item specifically includes: Outputting a first test signal to the test board so that the test board outputs a corresponding data frame to the BCU hardware board; Receive the first feedback information output by the test board. If the first feedback information indicates that the test board receives the same data frame within a first preset time period, it is determined that the communication function of the BCU hardware board is normal; otherwise, it is determined that the communication function of the BCU hardware board is abnormal.

3. The BCU hardware board testing method according to claim 2, characterized in that: When the test item is the IO function test, the step of testing the BCU hardware board through the test board and the tooling board according to the test item specifically includes: Output the second test signal to the test board, so that the DO port of the test board outputs a level signal to the DI port of the BCU hardware board; Detecting the second feedback information of the BCU hardware board, if the second feedback information indicates that the DI of the BCU hardware board is driven and the DI level changes, it is determined that the DI function of the BCU hardware board is normal, otherwise it is determined that the DI function of the BCU hardware board is abnormal; Output the third test signal to the BCU hardware board, so that the DO port of the BCU hardware board outputs a level signal to the DI port of the test board; The third feedback information output by the test board is detected. If the third feedback information indicates that the DI of the test board is driven and the DI level changes, it is determined that the DO function of the BCU hardware board is normal; otherwise, it is determined that the DO function of the BCU hardware board is abnormal.

4. The BCU hardware board testing method according to claim 3, when the test item is the acquisition function test, the step of testing the BCU hardware board through the test board and the tooling board according to the test item specifically comprises: Output a fourth test signal to the tooling board, so that the tooling board outputs an analog voltage to the BCU hardware board, the board under test collects the analog voltage and transmits the collected data result to the test board, and the test board compares the collected data result with a preset interval; Receive the fourth feedback information output by the BCU hardware board. If the fourth feedback information indicates that the collected data result is within a preset range, it is determined that the collection function of the BCU hardware board is normal; otherwise, it is determined that the collection function of the BCU hardware board is abnormal.

5. The BCU hardware board testing method according to claim 4, characterized in that: When the test item is the storage function test, the step of testing the BCU hardware board through the test board and the tooling board according to the test item specifically includes: Outputting a fifth test signal to the BCU hardware board so that the single-chip microcomputer of the BCU hardware board performs write and read operations on the internal storage module of the BCU hardware board; Receive the fifth feedback information output by the BCU hardware board. If the fifth feedback information can be written and read normally, it is determined that the storage function of the BCU hardware board is normal; otherwise, it is determined that the storage function of the BCU hardware board is abnormal.

6. The BCU hardware board testing method according to claim 5, characterized in that: When the test item is the watchdog function test, the step of testing the BCU hardware board through the test board and the tooling board according to the test item specifically includes: Outputting a sixth test signal to the BCU hardware board to stop enabling the watchdog of the BCU hardware board, and enabling the watchdog of the BCU hardware board every second preset time period; outputting a seventh test signal to the test board when the watchdog is enabled, so that the test board sends a corresponding data frame every third preset time length; the second preset time length is an integer multiple of the third preset time length; Receive the sixth feedback information output by the test board. If the sixth feedback information is a data frame replied by the test board within the second preset time after sending the corresponding data frame, it is determined that the watchdog function of the BCU hardware board is normal; otherwise, it is determined that the watchdog function of the BCU hardware board is abnormal.

7. The BCU hardware board testing method according to claim 1, characterized in that: After the step of testing the BCU hardware board by using the test board, the BCU hardware board and the tooling board and recording the test results when the test is completed, the following steps are also included: The test results are transmitted to the tooling board so that the tooling board displays the test results.

8. A BCU hardware board testing system, characterized in that: The BCU hardware board test system includes: a test board, a tooling board and a host computer; The test board is connected to the host computer, the tooling board and the BCU hardware board respectively, and the tooling board is connected to the host computer and the BCU hardware board respectively; The BCU hardware board includes a BCU; The host computer is used to output test signals to the test board, the tooling board and the board to be tested; The test board, tooling board and board to be tested are used to test the BCU hardware board when receiving the test signal output by the host computer, and output feedback information to the host computer according to the test result; The host computer is also used to determine the test result according to the feedback information; The host computer is also used to save the test results after the determination; The host computer is also used to transmit the determined test results to the tooling board; The tooling board is also used to display the test result after receiving the determined test result.

9. A storage medium, characterized in that: The storage medium is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the BCU hardware board testing method according to any one of claims 1 to 7 are implemented.

10. A computer program product, characterized in that The computer program product comprises a computer program, and when the computer program is executed by a processor, the steps of the BCU hardware board testing method according to any one of claims 1 to 7 are implemented.

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