Probe unit and charge / discharge inspection device

Abstract

Provided are a probe unit and the like capable of more effectively inspecting a plurality of types of secondary batteries. A probe unit (1) is provided with: a first probe holding plate (10) on which one or more positive electrode probes (P1) are arranged; and a second probe holding plate (20) which faces the first probe holding plate (10) and is arranged so that the one or more negative electrode probes (P2) correspond to the one or more positive electrode probes (P1). The first probe holding plate (10) and / or the second probe holding plate (20) are mounted so as to be movable in a direction in which the first probe holding plate (10) and / or the second probe holding plate (20) approach each other and away from each other. It is particularly preferable that the probe unit (1) has a first movable mechanism (30) that moves the first probe holding plate (10) and / or the second probe holding plate (20) in the approaching direction and the separating direction.

Description

Technical Field

[0001] The present invention relates to a probe unit and a charge and discharge inspection device using the probe unit. The probe unit is a probe unit installed in the charge and discharge inspection device of a secondary battery during charge and discharge inspection, and can change the distance between the positive probe (contact piece) and the negative probe (contact piece) (hereinafter referred to as "probe spacing"). Background Art

[0002] When performing a charge and discharge inspection, the probes (positive and negative electrodes) of the charge and discharge inspection device contact the electrodes (positive and negative electrodes) of the secondary battery to be inspected, and power is supplied from the charge and discharge inspection device to the secondary battery. In addition, the probes are generally arranged in a manner corresponding to the secondary battery to be inspected, and if the type of the secondary battery to be inspected changes, the probe unit is replaced together.

[0003] In the charge and discharge inspection, it is inevitably required to inspect a plurality of types of secondary batteries, and therefore a technology capable of more efficiently inspecting a plurality of types of secondary batteries is required.

[0004] For example, Patent Document 1 describes a charge and discharge inspection system and an attachment and detachment unit for inspecting a secondary battery.

[0005] The charge and discharge inspection system is a charge and discharge inspection device for a secondary battery, and is characterized in that it comprises: a charge and discharge inspection device, the charge and discharge inspection device comprising a power source, a battery inspection unit having a connecting portion, and a contact unit having a contact for supplying power from the power source to the secondary battery; and a moving mechanism for moving the contact unit for installation and removal relative to the connecting portion, the moving mechanism comprising a reaction force transmission unit for transmitting the reaction force generated when the contact unit is installed and removed relative to the connecting portion to a bearing portion of the battery inspection unit.

[0006] Furthermore, the moving mechanism is characterized in that it has: a conveying device for conveying the secondary battery to be inspected to the battery inspection unit; and an assembly and disassembly unit installed on the conveying device, so that the contact unit moves in the battery inspection unit for assembly and disassembly relative to the connecting part, and a reaction force transmission unit is arranged in the assembly and disassembly unit.

[0007] On the other hand, the assembly and disassembly unit is used to assemble and disassemble the contact unit relative to the battery inspection unit of the charging and discharging inspection device. The assembly and disassembly unit is characterized in that it comprises: an assembly and disassembly mechanism for moving the contact unit for assembly and disassembly relative to the battery inspection unit; and a reaction force transmission unit for transmitting the reaction force generated during assembly and disassembly to the battery inspection unit.

[0008] Prior art literature

[0009] Patent Literature

[0010] Patent Document 1: Japanese Patent Application Publication No. 2014-174049 Summary of the invention

[0011] However, the charge and discharge inspection system and the mounting and disassembly unit described in Patent Document 1 enable the contact unit (probe unit) to be mounted and disassembled relative to the battery inspection unit of the charge and discharge inspection device. Therefore, if the type of the secondary battery to be inspected changes, the probe unit needs to be replaced, and a mechanism for mounting and disassembling the probe unit relative to the battery inspection unit is required. In addition, since the probe unit is mounted and disassembled using a conveying device, the production rhythm (production plan) in the charge and discharge inspection may be affected by failure or degradation of the conveying device.

[0012] Therefore, an object of the present invention is to provide a probe unit and a charge and discharge inspection device capable of more efficiently inspecting various types of secondary batteries.

[0013] The probe unit of the present invention comprises: a first probe holding plate, on which one or more positive pole probes are arranged and configured; and a second probe holding plate, opposite to the first probe holding plate, in which one or more negative pole probes are arranged and configured corresponding to one or more positive pole probes. In the probe unit of the charge and discharge inspection device, the first probe holding plate and / or the second probe holding plate are installed so as to be able to move in directions approaching and moving away from each other.

[0014] Thus, the first probe holding plate and the second probe holding plate are movable in a direction approaching each other and in a direction moving away from each other.

[0015] Furthermore, it is preferable that the probe unit includes a first movable mechanism that enables the first probe holding plate and / or the second probe holding plate to move in a direction of approaching and a direction of moving away from each other.

[0016] Thus, the first movable mechanism allows the first probe holding plate and the second probe holding plate to move toward each other, or allows the first probe holding plate and the second probe holding plate to move away from each other.

[0017] It is particularly preferred that the probe unit has a movable supporting portion between the first probe holding plate and the second probe holding plate so as to extend in the direction in which the positive probe or the negative probe is configured, and the first movable mechanism connects the supporting portion and the first probe holding plate and the supporting portion and the second probe holding plate respectively through a frame, and by making the supporting portion movable, the connecting portion between the frame and the first probe holding plate or / and the connecting portion between the frame and the second probe holding plate are movable in the direction connecting the first probe holding plate and the second probe holding plate.

[0018] Thus, by making the support portion movable, the first probe holding plate and the second probe holding plate connected via the frame can be moved so as to approach each other, or the first probe holding plate and the second probe holding plate can be moved so as to move away from each other.

[0019] In addition, preferably, the first probe holding plate includes multiple probe holding plates each having a positive probe, the second probe holding plate includes multiple probe holding plates each having a negative probe, and the probe unit has a second movable mechanism that enables the multiple first probe holding plates and the multiple second probe holding plates to move toward and away from each other.

[0020] Thereby, the plurality of first probe holding plates and the plurality of second probe holding plates are also movable in directions approaching and moving away from each other.

[0021] It is particularly preferred that the second movable mechanism is movable along the direction in which the support portion extends by respectively connecting the multiple first probe holding plates and the frames of the multiple second probe holding plates corresponding to the first probe holding plates, so that the multiple first probe holding plates relative to each other and the multiple second probe holding plates relative to each other are movable along the direction in which the multiple positive probes or the multiple negative probes are configured.

[0022] Thus, the first movable mechanism and the second movable mechanism can be simultaneously realized by the support portion.

[0023] On the other hand, the charge and discharge inspection device of the present invention comprises: a probe unit, which comprises: a first probe holding plate, on which one or more positive pole probes are arranged; a second probe holding plate, opposite to the first probe holding plate, in which one or more negative pole probes are arranged corresponding to one or more positive pole probes; and a guide portion, respectively arranged on the first probe holding plate and the second probe holding plate, wherein in the probe unit of the charge and discharge inspection device, the first probe holding plate and / or the second probe holding plate are installed to be able to move in directions approaching and moving away from each other; and a partition portion, which is arranged on the secondary battery and engages with the guide portion, and is arranged to match the length of the secondary battery in the lateral direction.

[0024] Thus, the first probe holding plate and the second probe holding plate are movable toward and away from each other, and when the probe unit is installed on the secondary battery, the guide portion provided on the probe unit side and the partition portion provided on the secondary battery side are engaged in coordination with the lateral length of the secondary battery.

[0025] In addition, preferably, the first probe holding plate includes a plurality of probe holding plates each equipped with a positive electrode probe, the second probe holding plate includes a plurality of probe holding plates each equipped with a negative electrode probe, and the probe unit comprises: a first movable mechanism that enables the first probe holding plate and / or the second probe holding plate to be movable in a direction of approaching and moving away from each other; and a second movable mechanism that enables the plurality of first probe holding plates to be movable in a direction of approaching and moving away from each other, and the partition portion is also arranged to cooperate with the length of the secondary battery in the thickness direction.

[0026] Thus, through the first movable mechanism, the first probe holding plate and the second probe holding plate can be moved in a manner of approaching each other, or the first probe holding plate and the second probe holding plate can be moved in a manner of moving away from each other. In addition, through the second movable mechanism, the plurality of first probe holding plates and the plurality of second probe holding plates can also be moved in a direction of approaching each other or moving away from each other, and when the secondary battery is installed with the probe unit, the guide portion provided on the probe unit side and the partition portion provided on the secondary battery side are also engaged in coordination with the length in the thickness direction of the secondary battery.

[0027] (1) The probe unit of the present invention comprises: a first probe holding plate, on which one or more positive electrode probes are arranged; and a second probe holding plate, which is opposite to the first probe holding plate and arranged in a manner that one or more negative electrode probes correspond to one or more positive electrode probes. In the probe unit of the charge and discharge inspection device, the first probe holding plate and / or the second probe holding plate are installed to be movable in a direction approaching each other and in a direction away from each other. Through the above structure, the first probe holding plate and the second probe holding plate are movable in a direction approaching each other and in a direction away from each other, so that the distance between the positive electrode probe and the negative electrode probe, that is, the distance between the probes, can be easily adjusted. As a result, even when inspecting multiple secondary batteries with different lengths in the lateral direction, it is not necessary to assemble or detach the contact probe unit relative to the battery inspection unit, or to replace the probe unit itself, so that more effective charge and discharge inspection can be achieved.

[0028] (2) In addition, the probe unit has the first movable mechanism as described above, and can move the first probe holding plate and the second probe holding plate so as to approach each other, or move the first probe holding plate and the second probe holding plate so as to move away from each other, or move the supporting portion, thereby moving the first probe holding plate and the second probe holding plate connected via the frame so as to approach each other, or move the first probe holding plate and the second probe holding plate so as to move away from each other, thereby achieving more precise adjustment of the distance between the probes.

[0029] (3) In addition, the first probe holding plate includes a plurality of probe holding plates each having a positive electrode probe, the second probe holding plate includes a plurality of probe holding plates each having a negative electrode probe, and the probe unit has a second movable mechanism that enables the plurality of first probe holding plates and the plurality of second probe holding plates to move toward and away from each other. Through the above structure, the plurality of first probe holding plates and the plurality of second probe holding plates can also move toward and away from each other, so that the distance between the positive electrode probes and the distance between the negative electrode probes of the probe unit can be easily adjusted. As a result, even when inspecting a plurality of secondary batteries with different thicknesses, it is not necessary to install or remove the contact probe unit relative to the battery inspection unit, or to replace the probe unit itself, and effective charge and discharge inspection can be further achieved. In addition, even when the secondary battery expands (changes in thickness) in the charge and discharge inspection device, the secondary battery and the probe unit can be prevented from being compressed.

[0030] (4) In addition, the second movable mechanism is movable along the direction in which the support portion extends by respectively connecting the plurality of first probe holding plates and the frames of the plurality of second probe holding plates corresponding to the first probe holding plates, so that the plurality of first probe holding plates relative to each other and the plurality of second probe holding plates relative to each other are movable along the direction in which the plurality of positive probes or the plurality of negative probes are arranged. Through the above structure, the first movable mechanism and the second movable mechanism can be simultaneously realized through the support portion, thereby preventing the structure from being complicated, and achieving cost reduction and ease of maintenance.

[0031] (5) On the other hand, the charge and discharge inspection device of the present invention comprises: a probe unit, which comprises: a first probe holding plate, on which one or more positive electrode probes are arranged; a second probe holding plate, opposite to the first probe holding plate, in which one or more negative electrode probes are arranged corresponding to one or more positive electrode probes; and a guide portion, respectively provided on the first probe holding plate and the second probe holding plate, wherein in the probe unit of the charge and discharge inspection device, the first probe holding plate and / or the second probe holding plate are installed to be movable in a direction approaching each other and in a direction moving away from each other; and a partition portion, provided on the secondary battery and engaged with the guide portion, and provided in coordination with the length in the lateral direction of the secondary battery. Through the above structure, the first probe holding plate and the second probe holding plate are movable in a direction approaching each other and in a direction moving away from each other, and when the probe unit is installed on the secondary battery, the guide portion provided on the probe unit side and the partition portion provided on the secondary battery side are engaged in coordination with the length in the lateral direction of the secondary battery. Therefore, there is no need to pre-adjust the distance between the probes or the power for adjusting the distance between the probes, thereby enabling more effective charge and discharge inspection.

[0032] (6) In addition, the first probe holding plate includes a plurality of probe holding plates each having a positive electrode probe, and the second probe holding plate includes a plurality of probe holding plates each having a negative electrode probe. The probe unit comprises: a first movable mechanism that enables the first probe holding plate and / or the second probe holding plate to move toward and away from each other; and a second movable mechanism that enables the plurality of first probe holding plates to move toward and away from each other, and the plurality of second probe holding plates to move toward and away from each other. The partition portion is also arranged to cooperate with the length of the secondary battery in the thickness direction. Through the above structure, through the first movable mechanism, the first probe holding plate and the second probe holding plate can be moved in a manner of approaching each other, or the first probe holding plate and the second probe holding plate can be moved in a manner of moving away from each other. In addition, through the second movable mechanism, the multiple first probe holding plates and the multiple second probe holding plates are also movable in the direction of approaching each other and moving away from each other, and when the secondary battery is installed with a probe unit, the guide portion provided on the probe unit side and the partition portion provided on the secondary battery side are also engaged in coordination with the length in the thickness direction of the secondary battery. Therefore, during the charge and discharge inspection, the spacing between the probes and the distance between the probes can be adjusted by the first movable mechanism and the second movable mechanism, or the spacing between the probes and the distance between the probes can be adjusted by the guide portion and the partition portion. Therefore, the most efficient charge and discharge inspection method according to various inspection contents can be selected and implemented. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 It is a schematic plan view of a probe unit according to an embodiment of the present invention.

[0034] Figure 2 It is a schematic plan view of a probe unit according to an embodiment of the present invention.

[0035] Figure 3 yes Figure 2 A schematic front view of the probe unit is shown.

[0036] Figure 4 yes Figure 2 A schematic right side view of the probe unit is shown.

[0037] Figure 5 It is a schematic plan view of the probe unit when the pitch between probes is shortened.

[0038] Figure 6 This is a schematic front view of the probe unit when the pitch between probes is shortened.

[0039] Figure 7 It is a schematic plan view of the probe unit showing a modified example of the first movable mechanism.

[0040] Figure 8It is a schematic plan view of the probe unit showing a modified example of the first movable mechanism.

[0041] Fig. 9 It is a schematic plan view of a probe unit according to another embodiment of the present invention.

[0042] Fig.10 It is a schematic right side view of a probe unit according to another embodiment of the present invention.

[0043] Fig.11 It is a partial schematic front view of the charge and discharge inspection device according to the embodiment of the present invention.

[0044] Fig.12 It is a partial schematic right side view of the charge and discharge inspection device according to the embodiment of the present invention.

[0045] Fig.13 It is a partial schematic right side view of the charge and discharge inspection device according to the embodiment of the present invention. DETAILED DESCRIPTION

[0046] Hereinafter, an embodiment of the present invention will be described in detail. However, the description of the constituent elements described below is an example (representative example) of the embodiment of the present invention, and the present invention is not limited to the following contents unless the gist of the invention is changed.

[0047] [Probe unit]

[0048] Figure 1 It is a schematic plan view of a probe unit according to an embodiment of the present invention.

[0049] The probe unit 1 includes a first probe holding plate 10 and a second probe holding plate 20 disposed opposite to the first probe holding plate 10. The first probe holding plate 10 and / or the second probe holding plate 20 are attached to the probe unit 1 so as to be movable toward and away from each other.

[0050] One or more positive electrode probes P1 are arranged in parallel on the first probe holding plate 10. Figure 1 In the embodiment shown in the figure, four positive electrode probes P11, P12, P13, and P14 are arranged in parallel. In addition, one or more negative electrode probes P2 are arranged in parallel on the second probe holding plate 20. Figure 1 In the illustrated embodiment, four negative electrode probes P21 , P22 , P23 , and P24 are arranged side by side.

[0051] These probes are not limited to needle-shaped ones, but may be appropriately used in a clip-shaped or a shape matching the secondary battery electrode of the inspection device.

[0052] The probe unit 1 is mounted on a secondary battery to be inspected during a charge and discharge inspection. Figure 1 Specifically, the positive electrode probe P11 contacts the electrode (positive electrode) of the secondary battery, and the negative electrode probe P21 contacts the other electrode (negative electrode) of the secondary battery. Figure 4 ) supplies power to the secondary battery via the probe unit 1.

[0053] In addition, in the present embodiment, four positive electrode probes P1 and four negative electrode probes P2 are arranged on the first probe holding plate 10 and the second probe holding plate 20 , respectively. Therefore, four secondary batteries can be mounted on the probe unit 1 at a time.

[0054] In addition, as described above, the first probe holding plate 10 and / or the second probe holding plate 20 are installed so as to be able to move toward and away from each other. Figure 1 As shown, the first probe holding plate 10 and the second probe holding plate 20 are disposed on a guide plate, and the first probe holding plate 10 and the second probe holding plate 20 are installed to be able to slide and move on the guide plate.

[0055] Thus, the first probe holding plate 10 can slide on the guide plate and move toward the direction approaching the second probe holding plate 20 ( Figure 1 or can move in a direction away from the second probe holding plate 20 ( Figure 1 The second probe holding plate 20 is also the same.

[0056] Therefore, one or more positive probes P1 are arranged on the first probe holding plate 10, and one or more negative probes P2 are arranged on the second probe holding plate 20. Therefore, when the first probe holding plate 10 and / or the second probe holding plate 20 move toward each other, the positive probes P1 and the negative probes P2 also approach each other.

[0057] On the other hand, when the first probe holding plate 10 and / or the second probe holding plate 20 move in directions away from each other, the positive electrode probe P1 and the negative electrode probe P2 also move away from each other.

[0058] If the type of secondary battery changes, the length between the positive electrode and the negative electrode of the secondary battery, that is, the horizontal length of the secondary battery (hereinafter referred to as "the horizontal length") also changes. In contrast, the probe unit 1 can make the positive probe P1 and the negative probe P2 approach or move away from each other through the above-mentioned structure, so that the distance between the positive probe P1 and the negative probe P2, that is, the inter-probe spacing P, can be easily adjusted in accordance with the horizontal length of the secondary battery to be inspected.

[0059] [First movable mechanism]

[0060] Figure 2 is a schematic top view of a probe unit according to an embodiment of the present invention. Figure 2 In the illustrated embodiment, the probe unit 1 has a first movable mechanism 30 instead of a guide plate.

[0061] The first movable mechanism 30 is a mechanism that allows the first probe holding plate 10 and the second probe holding plate 20 to move in a direction of approaching and a direction of moving away from each other. One or more positive probes P1 are arranged on the first probe holding plate 10, and one or more negative probes P2 are arranged on the second probe holding plate 20. Therefore, when the first movable mechanism 30 moves the first probe holding plate 10 and the second probe holding plate 20 in a direction of approaching each other, the positive probes P1 and the negative probes P2 also approach each other.

[0062] On the other hand, when the first movable mechanism 30 moves the first probe holding plate 10 and the second probe holding plate 20 in directions away from each other, the positive electrode probe P1 and the negative electrode probe P2 also move away from each other.

[0063] Thus, the probe unit 1 can move the positive probe P1 and the negative probe P2 closer to or farther away from each other through the first movable mechanism 30, so that the distance between the positive probe P1 and the negative probe P2, that is, the inter-probe pitch P, can be easily adjusted in accordance with the lateral length of the secondary battery to be inspected.

[0064] also, Figure 3 yes Figure 2 A schematic front view of the probe unit shown, Figure 4 yes Figure 2 A schematic right side view of the probe unit is shown.

[0065] like Figure 2 to Figure 4 As shown, the first movable mechanism 30 includes support portions 12 , 22 , frames 11 , 21 , and rotating portions G1 , G2 .

[0066] The support parts 12 and 22 are arranged along the direction in which one or more positive electrode probes P1 or one or more negative electrode probes P2 are arranged ( Figure 2The support parts 12 and 22 are arranged between the first probe holding plate 10 and the second probe holding plate 20 in a manner extending in the left-right direction (in the right-left direction) (in a manner extending in a right angle direction relative to the frames 11 and 12). In addition, the support parts 12 and 22 are movable. In the present embodiment, the support parts 12 and 22 are so-called rotation axes that can rotate around the axial direction (extension direction).

[0067] One end of the support part 12, 22 is movably (rotatably) held on a holding member (not shown) provided on the probe unit 1. On the other hand, the other end of the support part 12, 22 is attached to the power device 50 (see Figure 2 , Figure 4 ). In addition, the support parts 12 and 22 are provided with rotating parts G1 and G2 (see Figure 3 ).

[0068] The frame 11 connects the support portion 12 and the first probe holding plate 10. The frame 11 and the first probe holding plate 10 are joined by welding or screws. In contrast, the frame 11 and the support portion 12 are connected via a rotating portion G1 such as a gear (see Figure 3 ). In addition, in the present embodiment, two frames 11 (frames 111 and 112) are provided. Therefore, the frames 111 and 112 are connected to the support portion 12 via the rotating portions G12 and G13, respectively.

[0069] On the other hand, the frame 21 connects the support part 22 and the second probe holding plate 20. The frame 21 and the second probe holding plate 20 are joined by welding or screws. On the other hand, the frame 21 and the support part 22 are connected via a rotating part G2 such as a gear (see Figure 3 ). In addition, in the present embodiment, two frames 21 (frames 211 and 212) are provided. Therefore, the frames 211 and 212 are also connected to the support portion 22 via the rotating portions G22 and G23, respectively.

[0070] In addition, the support parts 12 and 22 are arranged in parallel with each other and connected by the rotating parts G11 and G21 (see Figure 3 ).

[0071] Here, if Figure 3 As shown in FIG. 1 , the frames 11 and 21 are rack gears with concave and convex surfaces, for example. Therefore, if the support portion 12 as the rotation axis is oriented Figure 3 If the rotating part G11 rotates in the direction of the curved arrow shown in FIG. 1 , the rotating part G21 engaged with the rotating part G11 also rotates in the same direction. Figure 3 As a result, the frames 11 (112), 21 (212) engaged with the rotating parts G11, G21 are rotated in the direction of the curved arrow shown. Figure 3Therefore, the first probe holding plate 10 and the second probe holding plate 20 connected to the frames 11 (112) and 21 (212) also move in the direction of the arrows, that is, in the direction away from each other. Of course, the support part 22 may be rotated instead of the support part 12.

[0072] Figure 5 is a schematic top view of a probe unit when the distance between probes is shortened. Figure 6 This is a schematic front view of the probe unit when the pitch between probes is shortened.

[0073] Here, with the use of Figure 2 to Figure 4 The same reference numerals are used for parts with the same structure and function as those described above, and their detailed description is omitted.

[0074] like Figure 6 As shown, if the support portion 12 as the rotating shaft is used Figure 3 If the first probe holding plate 10 and the second probe holding plate 20 are rotated in the opposite direction to the direction described above, the first probe holding plate 10 and the second probe holding plate 20 move toward each other. Figure 5 As shown, the distance P between the probes becomes shorter.

[0075] In this way, the probe unit 1 can increase or decrease the inter-probe pitch P by the first movable mechanism 30 , and can easily adjust the length thereof.

[0076] [Modification of the first movable mechanism]

[0077] Figure 7 , Figure 8 It is a schematic plan view of the probe unit showing a modified example of the first movable mechanism.

[0078] like Figure 7 As shown, the first movable mechanism 30 may also be a connecting rod structure composed of connecting rods L. Specifically, there is a connecting rod L1 corresponding to a supporting portion between the first probe holding plate 10 and the second probe holding plate 20, and connecting rods L11, L12 corresponding to a frame and one end of connecting rods L21, L22 are connected to the connecting rod L1. In addition, the other ends of the connecting rods L11, L12 are connected to the first probe holding plate 10, respectively, and the other ends of the connecting rods L21, L22 are connected to the second probe holding plate 20, respectively.

[0079] By making the first movable mechanism 30 such a structure, Figure 8 As shown, when the link L1 is moved in the direction where the positive electrode probe P1 or the negative electrode probe P2 is arranged in parallel, the first probe holding plate 10 and the second probe holding plate 20 move toward each other. That is, the inter-probe pitch P becomes shorter.

[0080] On the other hand, if the connecting rod L1 is moved from Figure 8 If the state shown is movable in the direction opposite to the arrow direction, the first probe holding plate 10 and the second probe holding plate 20 move away from each other. That is, the inter-probe pitch P becomes longer.

[0081] As described above, the structure of the first movable mechanism 30 can be appropriately changed in design without departing from the gist of the present invention.

[0082] [Second movable mechanism]

[0083] Fig. 9 is a schematic top view of a probe unit according to another embodiment of the present invention, Fig.10 It is a schematic right side view of a probe unit according to another embodiment of the present invention.

[0084] The probe unit 2 according to another embodiment of the present invention further includes a second movable mechanism 40 .

[0085] like Fig. 9 As shown, the second movable mechanism 40 is capable of moving the plurality of positive electrode probes P1 and the plurality of negative electrode probes P2 toward and away from each other.

[0086] Specifically, the probe unit 2 includes a plurality of first probe holding plates 10a on which a plurality of positive electrode probes P1 are arranged. A plurality of positive electrode probes P1 (P11, P12, P13, P14) are arranged one by one on each of the plurality of first probe holding plates 10a (10a1, 10a2, 10a3, 10a4).

[0087] The relationship between the plurality of second probe holding plates 20 a ( 20 a 1 , 20 a 2 , 20 a 3 , 20 a 4 ) and the plurality of negative electrode probes P2 ( P21 , P22 , P23 , P24 ) is also the same.

[0088] Furthermore, since the plurality of first probe holding plates 10a (10a1, 10a2, 10a3, 10a4) are independent, for example, 10a1 and 10a2, 10a2 and 10a3, and 10a3 and 10a4 can move in a direction of approaching and a direction of moving away from each other.

[0089] The same applies to the plurality of second probe holding plates 20a (20a1, 20a2, 20a3, 20a4).

[0090] Here, in this embodiment, for the sake of convenience of explanation, the structure of the plurality of first probe holding plates 10a and the plurality of second probe holding plates 20a is separated from the first probe holding plates 10 and the second probe holding plates 20. That is, the structure in which the positive electrode probes P1 and the negative electrode probes P2 are arranged on the plurality of first probe holding plates 10a and the plurality of second probe holding plates 20a instead of the first probe holding plates 10 and the second probe holding plates 20 is not limited to this structure as long as the plurality of positive electrode probes P1 arranged in an array and the plurality of negative electrode probes P2 can move in a direction close to each other and a direction away from each other.

[0091] In this embodiment, the plurality of first probe holding plates 10a are connected to the corresponding plurality of second probe holding plates 20a via the plurality of frames 41 (411, 412, 413, 414). For example, the first probe holding plate 10a1 is connected to the second probe holding plate 20a1 via the frame 411.

[0092] Furthermore, each frame 411 to 414 is connected to the support parts 12 and 22 via a sliding part 42 (421, 422, 423, 424) provided near the center thereof. For example, the sliding part 42 slides on the support parts 12 and 22 to move along the support parts 12 and 22. Fig. 9 Therefore, when the slide portion 42 slides on the support portions 12 and 22 in the left-right direction, the first probe holding plate 10a and the second probe holding plate 20a located at both ends of the frame 41 also move in the left-right direction.

[0093] Such an action is performed by the second movable mechanism 40, such as Fig.10 As shown, the distance between the negative electrode probes P2 (and the positive electrode probes P1 ) can be easily changed in accordance with the thickness of the secondary batteries attached to the negative electrode probes P21 , P22 , P23 , and P24 (and the positive electrode probes P11 , P12 , P13 , and P14 ).

[0094] [Powerplant]

[0095] The first movable mechanism 30 and the second movable mechanism 40 described above can be moved using a power device 50 such as a servo motor or an air cylinder. For example, a servo motor is used as the power device 50, and the support parts 12 and 22 as the rotation axis can be rotated.

[0096] For example, when using rack gears as the frames 11 and 21 of the probe unit 1, the rotation speed of the supporting parts 12 and 22 (how much and in which direction) can be controlled by using a servo motor, and the moving distance of the frames 11 and 21 can be adjusted arbitrarily. Therefore, the moving distance of the first probe holding plate 10 and the second probe holding plate 20, that is, the distance P between the probes, can be adjusted arbitrarily and accurately.

[0097] In particular, when gears are used as the rotating parts G1 and G2, the force from the power device can be effectively transmitted to the probe holding plate, etc., and the inter-probe pitch P can be automatically and accurately adjusted. Of course, the first movable mechanism 30 and the second movable mechanism 40 can also be moved manually without using a power device.

[0098] [Guide and partition]

[0099] On the other hand, the guide portion T and the spacer portion S may be used to arbitrarily adjust the inter-probe pitch P.

[0100] Fig.11 It is a partial schematic front view of the charge and discharge inspection device according to the embodiment of the present invention.

[0101] like Fig.11 As shown, the charge and discharge inspection device 100 is provided with a secondary battery 60 installed in the probe unit 1, and a partition portion S (S60) is provided in the secondary battery 60 to be inspected for determining the lateral length (lateral position) of the secondary battery 60. On the other hand, in the probe unit 1, a conical guide portion T (T0) is provided in the first probe holding plate 10 and the second probe holding plate 20, respectively.

[0102] In addition, an elastic portion B, for example, as a spring, is provided between the first probe holding plate 10 and the second probe holding plate 20 of the probe unit 1. The elastic portion B urges the first probe holding plate 10 and the second probe holding plate 20 in directions of approaching each other.

[0103] By providing such guide portion T and spacer portion S, when the secondary battery 60 is mounted on the probe unit 1 , the guide portion T0 engages with the spacer portion S60 , thereby adjusting the distance between the first probe holding plate 10 and the second probe holding plate 20 in accordance with the inter-probe pitch of the secondary battery 60 .

[0104] When the charge and discharge inspection is completed and the secondary battery 60 is removed from the probe unit 1 , the elastic portion B returns the distance between the first probe holding plate 10 and the second probe holding plate 20 to the original state (before the secondary battery 60 is attached).

[0105] By providing the above-described structure of the guide portion and the spacer portion, the secondary battery can be automatically introduced into the probe unit and positioned relative to the probe unit, so that a device for moving the first movable mechanism 30 is not required.

[0106] In addition, the structures of the guide portion and the partition portion can also be used for the second movable mechanism 40 .

[0107] Fig.12 , Fig.13 It is a partial schematic right side view of the charge and discharge inspection device according to the embodiment of the present invention when the structure of the guide portion and the spacer portion is used for the second movable mechanism.

[0108] like Fig.12 As shown, when the probe unit 2 is equipped with four secondary batteries 60 as inspection objects, a partition portion S (S61, S62, S63, S64, S65) is provided on each secondary battery 60 for determining the length H (thickness position) in the thickness direction of the secondary battery 60. In addition, in the probe unit 2, guide portions T (T1, T2, T3, T4) are also provided on the plurality of second probe holding plates 20a (20a1, 20a2, 20a3, 20a4), respectively.

[0109] By providing such guide portion T and partition portion S, when the secondary battery 60 is mounted on the probe unit 2, the partition portions S61 to S65 are respectively engaged with the guide portions T1 to T4 (for example, the guide portion T1 is engaged with the groove formed between the partition portion S61 and the partition portion S62), so that the distance between the second probe holding plates 20a is also adjusted in accordance with the length H in the thickness direction of the secondary battery 60. For example, Fig.13 As shown in the secondary battery 60, Fig.12 Compared with the secondary battery 60 shown in FIG. 1 , even if the length H in the thickness direction is longer (thicker), the distance between the negative electrode probes P2 can be easily changed.

[0110] Although not shown, the first probe holding plate 10a side of the probe unit 2 has the same structure and can change the distance between the positive electrode probes P1. Of course, the guide portion T and the spacer portion S may be provided on either side (for example, only on the second probe holding plate 20a side).

[0111] By providing the above-described structure of the guide portion and the spacer portion, the secondary battery can be automatically introduced into the probe unit and positioned relative to the probe unit, so that a device for moving the second movable mechanism 40 is not required.

[0112] Moreover, as a result, it is possible to achieve cost reduction, ease of maintenance, or effectively select and implement the most efficient charging and discharging inspection method according to various inspection contents, such as the case where it is better to use the first movable mechanism 30 and the second movable mechanism 40, or the case where it is better not to use them.

[0113] The present embodiment described above is merely an example, and the structure of the second movable mechanism 40 , the guide portion T, and the partition portion S may be appropriately changed in design without departing from the gist of the present invention.

[0114] Industrial Applicability

[0115] The present invention can be utilized as a probe unit and a charge and discharge inspection device capable of more efficiently inspecting various types of secondary batteries, and is therefore industrially useful.

[0116] Description of Reference Numerals

[0117] 1.2 Probe unit

[0118] 10, 10a, 10a1, 10a2, 10a3, 10a4 first probe holding plate

[0119] 11, 111, 112 frame (first probe holding plate side)

[0120] 12 Supporting portion (first probe holding plate side)

[0121] 20, 20a, 20a1, 20a2, 20a3, 20a4 second probe holding plate

[0122] 21, 211, 212 Frame (second probe holding plate side)

[0123] 22 Supporting portion (second probe holding plate side)

[0124] 30 First movable mechanism

[0125] 40 Second movable mechanism

[0126] 41, 411, 412, 413, 414 frames

[0127] 42, 421, 422, 423, 424 sliding part

[0128] 50 Power Plant

[0129] 60 Secondary battery

[0130] 100 Charge and discharge inspection device

[0131] P Probe spacing

[0132] P1, P11, P12, P13, P14 positive probe

[0133] P2, P21, P22, P23, P24 negative probe

[0134] H Length in thickness direction

[0135] B Elastic part

[0136] C cable

[0137] G1, G11, G12, G13 Rotating part (first probe holding plate side)

[0138] G2, G21, G22, G23 Rotating part (second probe holding plate side)

[0139] L1 support part (connecting rod)

[0140] L11, L12 frame (link / first probe holding plate side)

[0141] L21, L22 frame (link / second probe holding plate side)

[0142] T, T0, T1, T2, T3, T4 guide

[0143] S, S60, S61, S62, S63, S64, S65 partition

Claims

1. A probe unit, comprising: A first probe holding plate having one or more positive electrode probes arranged thereon; and The second probe holding plate is opposite to the first probe holding plate and is arranged so that one or more negative electrode probes correspond to the one or more positive electrode probes. In the probe unit of the charge and discharge inspection device, the first probe holding plate and / or the second probe holding plate are mounted so as to be movable in a direction approaching and a direction moving away from each other. 2 . The probe unit according to claim 1 , further comprising a first movable mechanism that enables the first probe holding plate and / or the second probe holding plate to move in a direction of approaching and a direction of moving away from each other.

3. The probe unit according to claim 2, further comprising a movable support portion provided between the first probe holding plate and the second probe holding plate so as to extend in a direction in which the positive electrode probe or the negative electrode probe is arranged, The first movable mechanism connects the supporting part and the first probe holding plate and the supporting part and the second probe holding plate respectively through a frame. By making the supporting part movable, the connecting part between the frame and the first probe holding plate or / and the connecting part between the frame and the second probe holding plate are movable along the direction connecting the first probe holding plate and the second probe holding plate.

4. The probe unit according to claim 3, wherein the first probe holding plate comprises a plurality of probe holding plates each provided with a positive probe, The second probe holding plate includes a plurality of probe holding plates each having a negative electrode probe. The probe unit includes a second movable mechanism that allows the plurality of first probe holding plates and the plurality of second probe holding plates to move in a direction in which the plurality of first probe holding plates approach each other and in a direction in which the plurality of second probe holding plates move away from each other.

5. According to the probe unit according to claim 4, the second movable mechanism is movable along the direction in which the supporting portion extends by respectively connecting the plurality of first probe holding plates and the frames of the plurality of second probe holding plates corresponding to the first probe holding plates, so that the plurality of first probe holding plates relative to each other and the plurality of second probe holding plates relative to each other are movable along the direction in which the plurality of positive probes or the plurality of negative probes are configured. 6 . The probe unit according to claim 5 , further comprising a power device for moving the first movable mechanism and / or the second movable mechanism.

7. A charge and discharge inspection device, comprising: A probe unit having: A first probe holding plate is provided with one or more positive electrode probes arranged therein; a second probe holding plate, facing the first probe holding plate, and arranged so that one or more negative electrode probes correspond to the one or more positive electrode probes; and guide parts are respectively provided on the first probe holding plate and the second probe holding plate, In the probe unit of the charge and discharge inspection device, the first probe holding plate and / or the second probe holding plate are installed to be movable in a direction approaching and a direction moving away from each other; and The partition part is provided on the secondary battery and is engaged with the guide part, and is provided in coordination with the length in the lateral direction of the secondary battery.

8. The charge and discharge inspection device according to claim 7, wherein the first probe holding plate comprises a plurality of probe holding plates each having a positive electrode probe disposed thereon, The second probe holding plate includes a plurality of probe holding plates each having a negative electrode probe. The probe unit has: a first movable mechanism that enables the first probe holding plate and / or the second probe holding plate to move toward and away from each other; and The second movable mechanism enables the plurality of first probe holding plates and the plurality of second probe holding plates to move toward and away from each other. The partition portion is also provided to match the length of the secondary battery in the thickness direction.

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