Sample detection system and assembly line rotation scheduling method

Abstract

The invention discloses a sample detection system and an assembly line rotation scheduling method. The sample detection system comprises at least one sample analyzer, a first buffer area, a second buffer area, a conveying mechanism and a control unit. The conveying mechanism is used for conveying the test tube racks, the control unit is used for receiving scanning information of the test tube racks and state information of the sample analyzers, and then the matching degree of the multiple test tube racks in the second buffer area and the corresponding sample analyzers is obtained; the matching degree of the front test tube rack is smaller than that of the rear test tube rack, and the front test tube rack with the smaller matching degree is conveyed back to the first buffer area so as to avoid the test tube rack with the higher matching degree. Therefore, the conveying mechanism can preferentially deliver the test tube racks with high matching degrees to the corresponding sample analyzers, the test tube rack delivery efficiency of the sample detection system is improved, and the use experience of a user on the sample detection system is improved.

Description

Technical Field

[0001] The present application relates to the field of in vitro diagnostic technology, and in particular to a sample detection system and a method for assembly line rotation scheduling. Background Art

[0002] Currently, in the assembly line for allocating test tube racks to sample analyzers, the scheduling system transports the test tube racks in the buffer to the sample analyzers in sequence according to the arrangement order of the test tube racks in the buffer. After the test tube racks in the buffer are dispatched, the user fills the buffer with test tube racks by machine or manually, and the scheduling system dispatches the test tube racks in sequence according to the arrangement order of the test tube racks in the buffer.

[0003] However, when the delivery conditions are not met, for example, the corresponding sample analyzer is not yet ready, the scheduling system cannot deliver the test tube rack. The test tube rack stays in the buffer waiting, blocking the test tube rack that meets the delivery conditions and is at the back of the arrangement order. The scheduling efficiency of the scheduling system is too low. Summary of the invention

[0004] The present application provides a sample detection system and a method for pipeline rotation scheduling to solve the above technical problems. The sample detection system includes:

[0005] At least one sample analyzer;

[0006] A first buffer zone and a second buffer zone, wherein the first buffer zone, the second buffer zone and at least one sample analyzer are sequentially arranged along an extension direction of the sample detection system, and the second buffer zone is arranged between the first buffer zone and at least one sample analyzer;

[0007] a conveying mechanism, the conveying mechanism being used to move the test tube rack between the first buffer zone, the second buffer zone and the at least one sample analyzer;

[0008] A control unit is connected to the transmission mechanism, the second buffer zone and at least one sample analyzer, respectively, and the control unit is used to execute:

[0009] Obtain scanning information of the plurality of test tube racks in the second buffer zone, and obtain status information of all the sample analyzers; based on the scanning information and the status information, obtain a first matching degree between a first test tube rack in the second buffer zone and the corresponding sample analyzer, and obtain a second matching degree between a plurality of second test tube racks in the second buffer zone and the corresponding sample analyzers; in response to the first matching degree being less than any of the second matching degrees, control the conveying mechanism to convey the first test tube rack from the second buffer zone to the first buffer zone, so that the second test tube rack located behind the first test tube rack and having the second matching degree higher than the first matching degree is preferentially dispatched to the corresponding sample analyzer; or control the conveying mechanism to directly move the first test tube rack from the second buffer zone to the corresponding sample analyzer;

[0010] The first test tube rack is a test tube rack located at the first position along the moving direction of the plurality of test tube racks in the second buffer zone, and the plurality of second test tube racks are other test tube racks in the second buffer zone.

[0011] The system further includes a code scanning unit disposed opposite to the second buffer, and the code scanning unit is used to scan the test tube rack to obtain the scanning information corresponding to the plurality of test tube racks transmitted from the first buffer to the second buffer.

[0012] Wherein, the transmission mechanism comprises:

[0013] a first conveying mechanism, used for moving the test tube rack in the first buffer area to the second buffer area;

[0014] A second conveying mechanism, used to move the test tube rack in the second buffer area to the corresponding sample analyzer, and the second conveying mechanism is also used to move the test tube in the second buffer area to the first buffer area;

[0015] The third conveying mechanism is located on a side of the first buffer away from the first conveying mechanism, and is used to receive the test tube rack moved by the second buffer so that the test tube rack received from the second buffer avoids the third conveying mechanism or re-enters the test tube rack received from the second buffer into the first buffer.

[0016] In order to solve the above technical problems, the present application also provides a method for pipeline rotation scheduling, which is applied to the sample detection system as described above, comprising:

[0017] Obtaining scanning information of a plurality of the test tube racks and obtaining status information of all the sample analyzers;

[0018] Based on the scanning information and the status information of the sample analyzer, obtaining the matching degree between the plurality of the test tube racks and the corresponding sample analyzers; the matching degree includes a first matching degree between the first test tube rack and the corresponding sample analyzer and a second matching degree between the plurality of the second test tube racks and the corresponding sample analyzers;

[0019] Determining whether a first matching degree between the first test tube rack and the corresponding sample analyzer is greater than all second matching degrees;

[0020] If not, a test tube rack rotation plan is generated, and based on the test tube rack rotation plan, the conveying mechanism is controlled to convey the first test tube rack from the second buffer zone to the first buffer zone, so that the second test tube rack located behind the first test tube rack and with the second matching degree higher than the first matching degree is preferentially dispatched to the corresponding sample analyzer; or, the conveying mechanism is controlled to move the first test tube rack directly from the second buffer zone to the corresponding sample analyzer.

[0021] Wherein, the step of obtaining the matching degree between the plurality of test tube racks and the sample analyzer based on the scanning information and the status information of the sample analyzer comprises:

[0022] Based on the scanning information of the test tube rack, obtaining the sample analyzer corresponding to the test tube rack;

[0023] Based on the status information of the sample analyzer and the scanning information of the test tube rack, obtaining the matching degree between the test tube rack and the corresponding sample analyzer;

[0024] The status information of the sample analyzer includes the idleness of the sample analyzer, and the matching degree between the test tube rack and the corresponding sample analyzer is positively correlated with the idleness of the sample analyzer.

[0025] Wherein, the step of controlling the conveying mechanism to convey the first test tube rack from the second buffer zone to the first buffer zone based on the test tube rack rotation scheme, so that the second test tube rack located behind the first test tube rack and having the second matching degree higher than the first matching degree is preferentially dispatched to the corresponding sample analyzer, further includes:

[0026] Based on the test tube rack rotation scheme, the conveying mechanism is controlled to convey the first test tube rack from the second buffer zone to the first buffer zone, and the second test tube rack with the highest matching degree with the corresponding sample analyzer is controlled to move to the first position in the moving direction of multiple test tube racks in the second buffer zone, so as to be preferentially dispatched to the corresponding sample analyzer.

[0027] Wherein, the step of controlling the conveying mechanism to convey the first test tube rack from the second buffer zone to the first buffer zone based on the test tube rack rotation scheme so that the second test tube rack located behind the first test tube rack and having the second matching degree higher than the first matching degree is preferentially dispatched to the corresponding sample analyzer includes:

[0028] Based on the test tube rack rotation plan, an estimated cost value after the test tube rack is moved is obtained; wherein the estimated cost value includes an estimated time cost value of moving all the test tube racks in the second buffer area to the corresponding sample analyzer assuming that the test tube rack rotation plan is implemented; the estimated cost value is the sum of cost weights obtained based at least on the arrangement order of the test tube racks and the matching degree corresponding to the test tube racks;

[0029] Determining whether the cost estimate meets the scheduling efficiency improvement index;

[0030] If so, the test tube rack rotation plan is executed to control the second test tube rack with the highest matching degree with the corresponding sample analyzer to move to the first position in the moving direction of multiple test tube racks in the second buffer zone, and before the step of moving the second test tube rack with the highest matching degree to the first position in the moving direction of multiple test tube racks in the second buffer zone, the second conveying mechanism of the sample detection system is also controlled to move multiple test tube racks that are located in the second buffer zone and are before the second test tube rack with the highest matching degree to the first buffer zone.

[0031] The step of determining whether the cost estimate meets the scheduling efficiency improvement index includes:

[0032] If not, the test tube rack rotation plan is abandoned, and the second conveying mechanism is controlled to transport the first test tube rack to the corresponding sample analyzer.

[0033] The step of determining whether the first matching degree between the first test tube rack and the corresponding sample analyzer is greater than all second matching degrees includes:

[0034] If yes, the second transport mechanism is controlled to directly transport the first test tube rack to the corresponding sample analyzer.

[0035] Wherein, the matching degree is obtained based on at least the sum of matching weights of the state information of the sample analyzer and the scanning information of the test tube rack;

[0036] The scanning information also includes the remaining sample turnover time of the test tube rack. The obtaining of the matching degree between the test tube rack and the corresponding sample analyzer based on the status information of the sample analyzer and the scanning information of the test tube rack also includes:

[0037] Determining whether the remaining sample turnover time of the test tube rack is greater than a preset time threshold;

[0038] If not, the weight value corresponding to the remaining sample turnover time of the test tube rack is increased, and based on the increased weight value of the remaining sample cycle time of the test tube rack, the status information of the sample analyzer and the scanning information of the test tube rack, the matching degree between the test tube rack and the corresponding sample analyzer is obtained.

[0039] Beneficial effects of the present application: Different from the prior art, the sample detection system of the present application includes at least one sample analyzer, a first buffer zone and a second buffer zone, a conveying mechanism and a control unit. The conveying mechanism is used to move the test tube rack between the first buffer zone, the second buffer zone and at least one sample analyzer. The control unit is used to receive the scanning information of the test tube rack and the status information of the sample analyzer, and then obtain the matching degree of multiple test tube racks in the second buffer zone and the corresponding sample analyzer. If the matching degree of the test tube rack arranged in the front along the test tube rack transportation direction in the second buffer zone is smaller than that of the test tube rack arranged in the back, then the test tube rack arranged in the front with a smaller matching degree is rotated and transported to the first buffer zone to avoid the test tube rack with a higher matching degree. Thereby, the conveying mechanism can preferentially dispatch the test tube rack with a high matching degree to the corresponding sample analyzer, improve the efficiency of the sample detection system in dispatching the test tube rack, and enhance the user experience of the sample detection system. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0041] in:

[0042] Figure 1 It is a structural schematic diagram of the first embodiment of the sample detection system of the present application;

[0043] Figure 2 It is a structural diagram of the first embodiment of the second buffer zone of the present application;

[0044] Figure 3 It is a structural schematic diagram of the second embodiment of the sample detection system of the present application;

[0045] Figure 4 It is a flowchart of the first embodiment of the method for pipeline rotation scheduling of the present application;

[0046] Figure 5 This is a flow chart of the first embodiment of step S4 of the present application;

[0047] Figure 6 It is a flow chart of the second embodiment of the method for pipeline rotation scheduling of the present application.

[0048] Figure numbers: sample detection system A; sample analyzer 1; first buffer zone 2; second buffer zone 3; conveying mechanism 4; first conveying mechanism 41; second conveying mechanism 42; third conveying mechanism 43; first sub-track segment 401; second sub-track segment 402; third sub-track segment 403; code scanning unit 5; first test tube rack 11; second test tube rack 12; first direction X, second direction Y. DETAILED DESCRIPTION

[0049] The present application is further described in detail below in conjunction with the accompanying drawings and examples. It is particularly noted that the following examples are only used to illustrate the present application, but are not intended to limit the scope of the present application. Similarly, the following examples are only some embodiments of the present application rather than all embodiments, and all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present application.

[0050] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0051] In the description of this application, it is necessary to explain that, unless otherwise clearly specified and limited, the terms "install", "set", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or connected through an intermediate medium. For ordinary technicians in this field, the above-mentioned specific meanings belonging to this application can be connected according to specific circumstances.

[0052] See also Figure 1 , Figure 1 The sample detection system A provided in the embodiment of the present application comprises at least one sample analyzer 1, a first buffer 2, a second buffer 3, a transmission mechanism 4 and a control unit (not shown).

[0053] The first buffer zone 2, the second buffer zone 3 and at least one sample analyzer 1 are sequentially arranged along the extension direction of the sample detection system A. In this embodiment, all the sample analyzers 1, the first buffer zone 2 and the second buffer zone 3 are arranged on the transmission mechanism 4, so Figure 1The first direction X in the figure can also be considered as the length direction of the conveying mechanism 4. The conveying mechanism 4 is used to move the test tube rack in the first buffer zone 2 to the second buffer zone 3, and / or to move the test tube rack in the second buffer zone 3 to the sample analyzer 1, and / or to move the test tube rack in the second buffer zone to the first buffer zone. That is, the conveying mechanism 4 is responsible for the transportation of the test tube rack in the sample detection system A.

[0054] The first buffer 2 may be a loading buffer for loading a test tube rack, and the second buffer 3 may be a code scanning buffer, where the test tube rack moves from the loading buffer to the code scanning buffer to prepare for the test tube rack to be dispatched to the sample analyzer 1 .

[0055] The control unit is connected to the conveying mechanism 4, the second buffer zone 3 and the sample analyzer 1 respectively, and is used to control the transportation of the test tube rack on the conveying mechanism 4. The control unit is used to execute:

[0056] Obtain scanning information of multiple test tube racks in the second buffer zone 3, and obtain status information of all sample analyzers 1; based on the scanning information and status information, obtain a first matching degree between a first test tube rack in the second buffer zone 3 and the corresponding sample analyzer 1, and obtain a second matching degree between multiple second test tube racks in the second buffer zone 3 and the corresponding sample analyzers 1; in response to the first matching degree being less than any second matching degree, control the conveying mechanism 4 to convey the first test tube rack from the second buffer zone 3 to the first buffer zone, so that the second test tube rack located behind the first test tube rack and having a second matching degree higher than the first matching degree is preferentially dispatched to the corresponding sample analyzer 1, or control the conveying mechanism 4 to move the first test tube rack directly from the second buffer zone 3 to the corresponding sample analyzer 1.

[0057] like Figure 2 As shown, Figure 2 1 is a schematic diagram of the structure of the first embodiment of the second buffer zone of the present application. The test tube rack enters the second buffer zone 3 from the first buffer zone 2 and is ready to be sent to the sample analyzer 1. According to the order in which the test tube rack enters the second buffer zone 3, the test tube rack will move in the second buffer zone 3 along the moving direction of multiple test tube racks in the second buffer zone 3, that is, Figure 2 For the convenience of description, in this embodiment, the test tube rack located at the first position along the second direction Y in the second buffer zone 3 is named as the first test tube rack 11; the first test tube rack 11 is the test tube rack closest to the conveying mechanism 4 in the second buffer zone 3. Any test tube rack other than the first test tube rack 11 in the second buffer zone 3 is named as the second test tube rack 12, wherein the second test tube rack 12 can be a test tube rack arranged adjacent to the first test tube rack 11, or a test tube rack separated from the first test tube rack 11 by multiple test tube racks.

[0058] Multiple test tube racks in the second buffer 3 can be dispatched to one of the sample analyzers 1 in the sample detection system A. For example, if one of the test tube racks in the second buffer 3 is a test tube rack for RET (reticulocyte) detection, the control unit controls the conveying mechanism 4 to convey the test tube rack to the sample analyzer 1 capable of performing RET inspection; if one of the test tube racks in the second buffer 3 is a test tube rack for PLT (platelet) detection, the control unit controls the conveying mechanism 4 to convey the test tube rack to the sample analyzer 1 capable of performing PLT detection. Thus, the control unit controls the conveying mechanism 4 to dispatch multiple test tube racks in the second buffer 3 to the corresponding sample analyzers 1. It can be understood that when two test tube racks need to perform the same detection item, the sample analyzers 1 corresponding to the two test tube racks can be the same sample analyzer, or different sample analyzers capable of performing the same detection item function.

[0059] In the prior art, the delivery of the test tube racks in the second buffer 3 can only be carried out in order according to the arrangement order of the test tube racks in the second buffer 3. When the delivery conditions of the test tube racks are not met, for example, the sample analyzer 1 corresponding to the test tube rack is not in an idle state and cannot receive the test tube rack, at this time, the test tube rack cannot be delivered and can only stay in the second buffer 3 or on the conveying mechanism 4, blocking the delivery of subsequent test tube racks in the second buffer 3, or occupying the track of the conveying mechanism 4, affecting the delivery of the test tube racks in the idle state of the corresponding sample analyzer 1, thereby reducing the efficiency of the delivery of the test tube racks. In the prior art, the user can manually adjust the arrangement order of the test tube racks in the second buffer 3, and advance the arrangement order of the test tube racks in the idle state of the corresponding sample analyzer 1, but this operation requires the user to monitor the status of the sample analyzer 1 at any time, which is too inefficient and will greatly reduce the user experience.

[0060] Based on the above problems, the embodiment of the present application proposes that the control unit is used to obtain the scanning information of the test tube rack and the status information of the corresponding sample analyzer 1, wherein the scanning information of the test tube rack may include the type of test items to be performed by the test tube rack, and the status information of the sample analyzer 1 may be whether the sample analyzer 1 is in an idle state, or the time required for the sample analyzer 1 to be restored to an idle state when it is in a working state. Then, the control unit obtains the matching degree between the test tube rack and the corresponding sample analyzer 1 through the scanning information and the status information.

[0061] In one embodiment, the control unit obtains the type of test item that needs to be performed on the test tube rack based on the scanning information of the test tube rack, and then obtains the information of the sample analyzer 1 corresponding to the test tube rack, and obtains the status information of the sample analyzer 1. According to the status information of the sample analyzer 1, for example, it takes 2 minutes for the sample analyzer 1 to restore to an idle state, the matching degree between the test tube rack and the corresponding sample analyzer 1 is assigned a value. For example, if it takes 2 minutes for the sample analyzer 1 to restore to an idle state, the matching degree between the test tube rack and the corresponding sample analyzer 1 is 30%; if it takes 1 minute for the sample analyzer 1 to restore to an idle state, the matching degree between the test tube rack and the corresponding sample analyzer 1 is 70%; if the sample analyzer 1 is in an idle state, the matching degree between the test tube rack and the corresponding sample analyzer 1 is 100%.

[0062] Thus, the control unit can obtain the matching degree between the test tube rack in the second buffer zone 3 and the corresponding sample analyzer 1, and then give priority to dispatching the test tube rack with a high matching degree, thereby improving the dispatch efficiency of the test tube rack. The specific rule is: the control unit obtains the first matching degree between the first test tube rack 11 and the corresponding sample analyzer 1, and the second matching degree between the plurality of second test tube racks 12 and the corresponding sample analyzer 1. In response to the first matching degree being less than any second matching degree, the control unit controls the conveying mechanism 4 to convey the first test tube rack 11 to the first buffer zone 2, so that the second test tube rack 12 located behind the first test tube rack 11 and having a second matching degree higher than the first matching degree is preferentially dispatched to the corresponding sample analyzer 1. That is, the control unit compares the matching degree of each test tube rack in the second buffer zone 3 with the corresponding sample analyzer 1, and when it is determined that the matching degree of the test tube rack arranged at the front is less than the matching degree of the test tube rack arranged at the back, it is possible that the sample analyzer 1 corresponding to the test tube rack arranged at the front is in working state and cannot receive the test tube rack immediately. If the test tube rack corresponding to the sample analyzer 1 in working state is not moved to the first buffer zone 2 to make delivery space for the test tube rack corresponding to the sample analyzer 1 in idle state, the test tube rack corresponding to the sample analyzer 1 in working state will occupy the delivery path, resulting in that all the test tube racks arranged after the test tube rack cannot be delivered, and they need to wait until the test tube rack is delivered before they can be delivered normally, which reduces the delivery efficiency of the test tube racks.

[0063] Therefore, when it is determined that the first matching degree of the first test tube rack 11 is less than the second matching degree of the second test tube rack 12, the control unit controls the conveying mechanism 14 to convey the first test tube rack 11 to the first buffer zone 2, and moves the arrangement order of the second test tube rack 12 with a higher matching degree in the second buffer zone 3 forward, so as to give priority to the dispatch of the second test tube rack 12, thereby improving the test tube rack dispatching efficiency of the sample detection system A.

[0064] In another embodiment, when the control unit determines that transferring the first test tube rack 11 back to the first buffer zone 2 and giving priority to dispatching the second test tube rack 12 with a high matching degree cannot improve the dispatch efficiency of all the test tube racks in the second buffer zone 3, the control unit will control the conveying mechanism 4 to move the first test tube rack 11 directly from the second buffer zone 3 to the corresponding sample analyzer 1 without rotating the first test tube rack 11 back to the first buffer zone 2.

[0065] For further information, see Figure 3 , Figure 3 The sample detection system A provided in the embodiment of the present application further includes a code scanning unit 5 .

[0066] The code scanning unit 5 is arranged opposite to the second buffer zone 3, and is used to scan the test tube rack to obtain the scanning information corresponding to the multiple test tube racks transmitted from the first buffer zone 2 to the second buffer zone 3. Then, the code scanning unit 5 can upload the acquired scanning information to the control unit, and the control unit is also used to receive the scanning information.

[0067] Optionally, see Figure 3 The conveying mechanism 4 provided in the embodiment of the present application includes a first conveying mechanism 41 , a second conveying mechanism 42 and a third conveying mechanism 43 .

[0068] The first conveying mechanism 41 is connected to the first buffer zone 2 and the second buffer zone 3, and is used to move the test tube rack in the first buffer zone 2 to the second buffer zone 3. Specifically, the code scanning unit 5 is arranged at the connection between the first conveying mechanism 41 and the second buffer zone 3. Thus, the test tube rack can be transported to the second buffer zone 3 through the first conveying mechanism 41 in the first buffer zone 2, and the code scanning unit 5 scans the test tube rack, and after obtaining the scanning information of the test tube rack, the test tube rack enters the queue in the second buffer zone 3 along the second direction Y, and is ready to be dispatched to the sample analyzer 1.

[0069] The second conveying mechanism 42 is used to move the test tube rack in the second buffer zone 3 to the corresponding sample analyzer 1. The second conveying mechanism 42 is also used to move the test tubes in the second buffer zone 3 to the first buffer zone 2. Specifically, the control unit receives the scanning information uploaded by the code scanning unit 5, and can obtain the corresponding sample analyzer 1 of each test tube rack, and then the control unit controls the second conveying mechanism 42 to dispatch the test tube rack to each corresponding sample analyzer 1.

[0070] The third conveying mechanism 43 is located on the side of the first buffer zone 2 away from the first conveying mechanism 41, and is used to receive the test tube rack moved by the second buffer zone 3, so as to avoid the test tube rack received from the second buffer zone 3 at the third conveying mechanism 43 or make the test tube rack received from the second buffer zone 3 re-enter the first buffer zone 2. Specifically, the control unit determines, based on the scanning information of the test tube rack and the status information of the sample analyzer 1 corresponding to the test tube rack, that the test tube rack at the first position along the second direction Y in the second buffer zone 3 has a low matching degree, wherein the first position is the position closest to the track of the conveying mechanism on the second buffer zone, and the control unit controls the second conveying mechanism 42 to move the test tube rack with a lower matching degree and arranged in the front to the first buffer zone 2, and the second buffer zone 3 moves the arrangement order of the test tube rack with a higher matching degree forward, so as to facilitate the second conveying mechanism 42 to preferentially dispatch the test tube rack with a higher matching degree, thereby improving the dispatch efficiency of the sample detection system A to the test tube rack.

[0071] In one embodiment, please continue to refer to Figure 3 , the conveying mechanism 4 may include a plurality of sub-track segments, such as Figure 3 The first sub-track segment 401, the second sub-track segment 402 and the third sub-track segment 403.

[0072] The first sub-track segment 401 is arranged at a corresponding position of the sample analyzer 1 in the sample detection system A, that is, when the sample detection system A includes a plurality of sample analyzers 1, the conveying mechanism 4 has a plurality of first sub-track segments 401 accordingly. The second sub-track segment 402 is arranged at a corresponding position of the second buffer zone 3 in the sample detection system A, and the second sub-track segment 402 corresponds to the second conveying mechanism 42. The third sub-track segment 403 is arranged at a corresponding position of the first buffer zone 2 in the sample detection system A, and the third sub-track segment 403 corresponds to the third conveying mechanism 43. The transport directions of the second sub-track segment 402 and the third sub-track segment 403 are both changeable. When the test tube rack in the second buffer zone 3 is to be sent to the sample analyzer 1, the transport direction of the second sub-track segment 402 is the first direction X; when the test tube rack in the second buffer zone 3 is to be transported back to the first buffer zone 2, the transport direction of the second sub-track segment 402 is the opposite direction of the first direction X.

[0073] The conveying mechanism 4 is divided into a plurality of sub-track segments, and the transport direction of the sub-track segments can be changed, so that the sample detection system A does not need to set up a plurality of tracks according to the transmission path, and the sub-track segments can be reused, thereby reducing the volume of the conveying mechanism 4 in the sample detection system A. At the same time, it also reduces the difficulty of users to repair the conveying mechanism 4.

[0074] In summary, the sample detection system A provided in the embodiment of the present application includes at least one sample analyzer 1, a first buffer zone 2 and a second buffer zone 3, a conveying mechanism 4, a control unit and a code scanning unit 5. The code scanning unit 5 acquires scanning information of the test tube rack entering the second buffer zone 3 from the first buffer zone 2, and transmits it to the control unit. The control unit receives the scanning information and further acquires the status information of the sample analyzer 1 corresponding to the test tube rack in the second buffer zone 3, thereby obtaining the matching degree between the test tube rack in the second buffer zone 3 and the corresponding sample analyzer 1. By comparing multiple matching degrees, the control unit controls the conveying mechanism 4 to transfer the test tube rack from the second buffer zone 3 to the sample analyzer 1 or the first buffer zone 2, thereby improving the delivery efficiency of the test tube rack.

[0075] The present application also provides a method for pipeline rotation scheduling, which is applied to a sample detection system A and is used to preferentially dispatch a test tube rack with a high degree of matching with a sample analyzer 1 to the corresponding sample analyzer 1. Figure 4 , Figure 4 : is a flow chart of the first embodiment of the method for pipeline rotation scheduling of the present application. The method provided in the embodiment of the present application specifically includes the following steps:

[0076] S1: Obtain scanning information of multiple test tube racks and obtain status information of all sample analyzers 1.

[0077] Before the test tube rack moves from the first buffer zone 2 to the second buffer zone 3, it will pass through the code scanning unit 5, which scans the test tube rack. In this embodiment, a barcode including the test tube rack information may be attached to the test tube rack, so that the code scanning unit 5 obtains the test tube rack information. The test tube rack information (scanning information) may include the test item information required by the test tube rack, the sample analyzer 1 information corresponding to the test tube rack (to which specific sample analyzer 1 the test tube rack is moved for detection), etc. After the code scanning unit 5 obtains the scan information, it uploads the scan information to the control unit, and the control unit directly obtains the information of the sample analyzer 1 corresponding to the test tube rack based on the scan information.

[0078] At the same time, the control unit can also obtain the status information of all sample analyzers 1 in the sample detection system A. The status information of the sample analyzer 1 can be the idleness of the sample analyzer 1, which is divided into 1-10. When the sample analyzer 1 is in an idle state, the idleness of the sample analyzer 1 is 10. When the sample analyzer 1 has completed half of its working state, the idleness of the sample analyzer 1 is 5. When the sample analyzer 1 has just entered the working state, the idleness of the sample analyzer 1 is 1.

[0079] S2: Based on the scanning information and the status information of the sample analyzer 1 , the matching degree between the plurality of test tube racks and the corresponding sample analyzers 1 is obtained.

[0080] Furthermore, the control unit determines the sample analyzer 1 bound to the test tube rack based on the scan information of the test tube rack, that is, determines which specific sample analyzer 1 the test tube rack is dispatched to. Then, the control unit obtains the status information of the sample analyzer 1 corresponding to the test tube rack, and the status information of the sample analyzer 1 includes the idleness of the sample analyzer 1, wherein the matching degree between the test tube rack and the corresponding sample analyzer 1 is positively correlated with the idleness of the sample analyzer 1. For example, if the idleness of the sample analyzer 1 corresponding to the test tube rack is 2, then the matching degree between the test tube rack and the sample analyzer 1 is 20%; if the idleness of the sample analyzer 1 corresponding to the test tube rack is 6, then the matching degree between the test tube rack and the sample analyzer 1 is 60%. By analogy, the higher the idleness of the sample analyzer 1, the higher the matching degree between the test tube rack and the corresponding sample analyzer 1.

[0081] The higher the matching degree between the test tube rack and the sample analyzer 1 , the shorter the time required for the sample analyzer 1 to recover the idle state, and the shorter the waiting time required for the test tube rack to be dispatched from the second buffer 3 to the corresponding sample analyzer 1 .

[0082] Furthermore, the status information of the sample analyzer 1 may also include whether the sample analyzer 1 is in a controlled state. In one embodiment, if the sample analyzer 1 is in an uncontrolled state, that is, the sample analyzer 1 cannot normally perform the detection function, or the sample analyzer 1 cannot obtain accurate detection results after performing the detection function, in this case, the control unit directly assigns the minimum value to the matching degree between the test tube rack and the corresponding sample analyzer 1, for example, the matching degree between the test tube rack and the corresponding sample analyzer 1 is 0.

[0083] The control unit obtains the matching degree between all the test tube racks in the second buffer 3 and the corresponding sample analyzers 1 based on the scanning information and the status information of the sample analyzer 1, wherein the matching degree includes the first matching degree between the first test tube rack 11 and the corresponding sample analyzer 1 and the second matching degree between the plurality of second test tube racks 12 and the corresponding sample analyzers 1. Then, the process proceeds to step S3.

[0084] S3: Determine whether the first matching degree between the first test tube rack 11 and the corresponding sample analyzer 1 is greater than all the second matching degrees.

[0085] Please combine Figure 2After the control unit obtains the first matching degree between the first test tube rack 11 and the corresponding sample analyzer 1 and the second matching degrees between the plurality of second test tube racks 12 and the corresponding sample analyzers 1, the control unit compares the first matching degree with all the second matching degrees. In this example, the first matching degree between the first test tube rack 11 and the corresponding sample analyzer 1 may be compared with the second matching degrees between other test tube racks in the second buffer zone 3 and the corresponding sample analyzers 1 in sequence. If there is at least one test tube rack in the second buffer zone 3 whose matching degree between the test tube rack 11 and the corresponding sample analyzer 1 is greater than the matching degree between the first test tube rack 11 and the corresponding sample analyzer 1, the matching degree between the first test tube rack 11 and the corresponding sample analyzer 1 is not the highest matching degree, and the process proceeds to step S4.

[0086] If the second matching degree between all the second test tube racks 12 in the second buffer zone 3 and the corresponding sample analyzers 1 is less than the first matching degree between the first test tube rack 11 and the corresponding sample analyzer 1 , the matching degree between the first test tube rack 11 and the corresponding sample analyzer 1 is the highest matching degree, and the process goes to step S5 .

[0087] S4: Generate a test tube rack rotation plan, and preferentially dispatch the second test tube rack 12 to the corresponding sample analyzer 1 based on the test tube rack rotation plan, or control the conveying mechanism 4 to directly move the first test tube rack 11 from the second buffer 3 to the corresponding sample analyzer 1 .

[0088] In one embodiment, the control unit is further used to determine the priority of the test tube rack dispatch according to the matching degree between the test tube rack and the corresponding sample analyzer 1. The higher the matching degree between the test tube rack and the corresponding sample analyzer 1, the higher the dispatch priority of the test tube rack. When the control unit determines that the first matching degree between the first test tube rack 11 and the corresponding sample analyzer 1 is less than any second matching degree, the first matching degree is not the highest matching degree, that is, the dispatch priority of the first test tube rack 11 is not the highest, it means that at this time, there is a second test tube rack 12 with a higher matching degree (higher dispatch priority) in the second buffer zone 3. Based on the principle of giving priority to the dispatch of the test tube rack with a higher dispatch priority, the control unit needs to first move the test tube rack (including the first test tube rack 11) located in front of the second test tube rack 12 along the second direction Y to the first buffer zone 2 to make room for the dispatch of the second test tube rack 12.

[0089] In response to the first matching degree between the first test tube rack 11 and the corresponding sample analyzer 1 being less than any second matching degree, the control unit generates a test tube rack rotation plan, controls the conveying mechanism 4 to convey the first test tube rack 11 from the second buffer zone 3 to the first buffer zone 2, so that the second test tube rack 12 located behind the first test tube rack 11 and having a second matching degree higher than the first matching degree is preferentially dispatched to the sample analyzer 1. After all the test tube racks located in front of the second test tube rack 12 along the second direction Y are moved to the first buffer zone 2, the second test tube rack 12 with the highest matching degree will move to the first position in the second direction Y in the second buffer zone 3, that is, a position closest to the second conveying mechanism 42, and the control unit controls the second conveying mechanism 42 to transport the second test tube rack 12 to the corresponding sample analyzer 1, so as to realize the priority dispatch of the test tube racks with high matching degree and high dispatch priority, and improve the dispatch efficiency of the test tube racks by the sample detection system A.

[0090] Furthermore, after generating the test tube rack rotation plan, the control unit does not necessarily execute the test tube rack rotation plan. In another embodiment, if the control unit determines that rotating and moving the first test tube rack 11 to the first buffer zone 2 and prioritizing the second test tube rack 12 cannot improve the delivery efficiency of all the test tube racks in the second buffer zone 3, the control unit abandons executing the test tube rack rotation plan and controls the conveying mechanism 4 to move the first test tube rack directly from the second buffer zone 3 to the corresponding sample analyzer 1.

[0091] S5 : controlling the second transport mechanism 42 to directly transport the first test tube rack 11 to the corresponding sample analyzer 1 .

[0092] In another embodiment, if the control unit determines that the first matching degree between the first test tube rack 11 and the corresponding sample analyzer 1 is greater than all the second matching degrees, that is, the first matching degree is the highest matching degree in the second buffer zone 3, the first test tube rack 11 is the test tube rack with the highest dispatch priority in the second buffer zone 3, and the first test tube rack 11 is located at the first position along the second direction Y in the second buffer zone 3, there is no need for the control unit to make room for the dispatch of the first test tube rack 11, and the control unit directly controls the second conveying mechanism 42 to transport the first test tube rack 11 to the corresponding sample analyzer 1.

[0093] In summary, the embodiment of the present application provides a method for pipeline rotation scheduling, wherein the control unit compares the first matching degree of the first test tube rack 11 located at the first position in the second buffer zone 3 with the second matching degrees of all the second test tube racks 12 in the second buffer zone 3, and when it is determined that the first matching degree of the first test tube rack 11 is greater than all the second matching degrees and the dispatch priority of the first test tube rack 11 is the highest, the first test tube rack 11 is directly dispatched to the corresponding sample analyzer 1. If the matching degree of the first test tube rack 11 is less than any second matching degree, and there is a second test tube rack 12 with the highest matching degree and the highest dispatch priority in the second buffer zone 3, the control unit will transfer at least one test tube rack arranged in front of the second test tube rack 12 along the second direction Y back to the first buffer zone 2, to ensure the smooth dispatch path of the second test tube rack 12, and then dispatch the second test tube rack 12 with the highest dispatch priority to the corresponding sample analyzer 1, so that the sample detection system A preferentially dispatches the test tube rack with a high matching degree, and improves the dispatch efficiency of the sample detection system A to the test tube rack.

[0094] In addition, the control unit will consider the delivery efficiency of all the test tube racks in the second buffer zone 3. When it is determined that preferentially dispatching the second test tube rack 12 to the corresponding sample analyzer 1 will only improve the delivery efficiency of the second test tube rack 12, but affect the delivery efficiency of all the test tube racks in the second buffer zone 3, and the delivery efficiency of all the test tube racks in the second buffer zone 3 remains unchanged or decreases, the control unit will give up preferentially dispatching the second test tube rack 12 and directly dispatch the first test tube rack 11.

[0095] For example, after the control unit generates a test tube rack rotation plan, the test tube rack rotation plan may be executed. The test tube rack at the first position along the second direction Y in the second buffer zone 3 has the lowest matching degree, while the test tube rack at the last position has the highest matching degree. At this time, if the test tube rack at the last position is moved to the first position based on the test tube rack rotation plan, and the test tube racks other than the test tube rack at the last position are returned to the second buffer zone 3 through the first buffer zone 2 in the arrangement order and arranged again, that is, at this time, except for the test tube rack at the last position, the arrangement order of all the other test tube racks is moved to the first position, and the arrangement order of all the other test tube racks in the second buffer zone 3 is one position later. After the control unit controls the conveying mechanism 4 to dispatch the test tube rack currently at the first position, the test tube rack that enters the first position again still has the lowest matching degree. If the test tube racks are dispatched directly according to the arrangement order of the test tube racks, the other test tube racks in the second buffer zone 3 need to wait for the test tube rack with the lowest matching degree to be dispatched before entering the dispatching step. The waiting time for multiple test tube racks to be dispatched is too long, and the dispatching efficiency is low.

[0096] Based on the above problem, after the test tube rack with the highest matching degree is dispatched for the first time, a test tube rack rotation plan can be regenerated, and the test tube rack with the highest matching degree among the remaining test tube racks can continue to be moved to the first position for dispatch. However, in the most extreme case, that is, the test tube rack at the first position has the lowest matching degree at the beginning, and the test tube rack at the last position has the highest matching degree. If there are N test tube racks in the second buffer 3, the control unit must generate N-1 test tube rack rotation plans to achieve the priority dispatch of the test tube rack with the highest matching degree. The computing power requirements of the control unit are extremely high, and the data that the control unit needs to process is too large, which is not conducive to the working life and response speed of the control unit. At the same time, it affects the dispatch efficiency of the sample detection system for all the test tube racks in the second buffer 3.

[0097] Therefore, please refer to Figure 2 and Figure 5 , Figure 5 This is a flow chart of the first embodiment of step S4 of the present application. After the control unit generates a test tube rack rotation plan, before moving the second test tube rack 12 to the first position, the following steps are also included:

[0098] S41: Based on the test tube rack rotation plan, obtain an estimated cost after the test tube rack is moved.

[0099] The estimated cost value may be the estimated time cost value of the control unit moving all the test tube racks in the second buffer 3 to the corresponding sample analyzer 1 after the test tube rack rotation scheme is assumed to be implemented, which is the result after the control unit assumes to execute the test tube rack rotation scheme. The control unit first assumes to execute the scheme, and if the execution of the scheme can improve the delivery efficiency of all test tube racks by the sample detection system A, the control unit executes the test tube rack rotation scheme; if the sample detection system A assumes that the implementation of the scheme does not significantly improve or even reduces the delivery efficiency of the test tube racks, the control unit abandons the execution of the scheme.

[0100] In this embodiment, the control unit can evaluate the delivery efficiency of the test tube rack from the cost estimate value, and the cost estimate value is the sum of the cost weights obtained based on at least the arrangement order of the test tube racks and the matching degree corresponding to the test tube racks. For example, in the second buffer zone 3, there are test tube racks 1, 2, 3, 4, and 5, and the five test tube racks are arranged in sequence in the opposite direction of the second direction Y, wherein the matching degree of test tube rack 1 is 50%, the matching degree of test tube rack 2 is 40%, the matching degree of test tube rack 3 is 60%, the matching degree of test tube rack 4 is 20%, and the matching degree of test tube rack 5 is 35%. According to the arrangement order of the test tube racks in the second buffer zone, the test tube rack in the first position has a matching degree of 50%, a matching degree of 40%, a matching degree of 60%, a matching degree of 20%, and a matching degree of 35%. The proportion is 30%, the test tube rack in the second position accounts for 25% of the estimated cost, the test tube rack in the third position accounts for 20% of the estimated cost, the test tube rack in the fourth position accounts for 15% of the estimated cost, and the test tube rack in the fifth position accounts for 10% of the estimated cost. Assuming that the estimated cost before implementing the test tube rack rotation plan is 30%*50%+25%*40%+20%*60%+15%*20%+10%*35%=0.435.

[0101] Based on the above calculation method, the test tube rack rotation plan moves the test tube rack with the highest matching degree to the first position. That is, assuming that after the test tube rack rotation plan is implemented, the arrangement order of the five test tube racks in the second buffer zone 3 is test tube rack 3, test tube rack 4, test tube rack 5, test tube rack 1, and test tube rack 2. Assuming that the estimated cost after the test tube rack rotation plan is implemented is 30%*60%+25%*20%+20%*35%+15%*50%+10%*40%=0.415.

[0102] Through the above calculation method, the cost estimate before and after the test tube rack is moved can be visualized and calculated to obtain the cost estimate, and then the test tube rack delivery efficiency can be more intuitively displayed based on the cost estimate.

[0103] S42: Determine whether the estimated cost value meets the scheduling efficiency improvement index.

[0104] In this embodiment, the scheduling efficiency improvement index can be the estimated value of the acceptance cost set in the control unit in advance by the user. The estimated value of the acceptance cost must be less than the estimated value of the cost before the test tube rack rotation plan is implemented, that is, the test tube rack delivery efficiency represented by the estimated value of the acceptance cost is higher than the test tube rack delivery efficiency before the implementation of the plan. When it is assumed that the estimated value of the cost after the test tube rack rotation plan is implemented is less than or equal to the estimated value of the acceptance cost, it is judged that the estimated value of the cost meets the scheduling efficiency improvement index. For example, the estimated value of the acceptance cost is 0.42, which is less than the estimated value of the cost before the implementation of the plan, 0.435, and assuming that the estimated value of the cost after the test tube rack rotation plan is implemented is 0.413, then the estimated value of the cost after the test tube rack rotation plan is implemented is less than the estimated value of the acceptance cost, indicating that the estimated value of the cost meets the scheduling efficiency improvement index. Assuming that the delivery efficiency of the test tube rack after the test tube rack rotation plan is significantly improved compared with the delivery efficiency before the implementation of the plan, enter step S43.

[0105] In another embodiment, if the acceptance cost estimate is 0.41, and the cost estimate after implementing the plan is 0.413, 0.413 is greater than 0.41, assuming that the cost estimate after implementing the plan is greater than the acceptance cost estimate, the cost estimate does not meet the scheduling efficiency improvement index. That is, although it is assumed that the delivery efficiency of the test tube rack after the implementation of the plan is improved to a certain extent compared with the non-implementation of the plan, the improvement effect is not obvious. Considering the energy consumed by scheduling the test tube rack, the improved delivery efficiency is not enough to offset the energy cost consumed by implementing the plan, and step S44 is entered.

[0106] S43 : executing the test tube rack rotation plan, controlling the third conveying mechanism 43 to move the multiple test tube racks to the first buffer zone 2 , and moving the second test tube rack 12 to the first position in the second direction Y in the second buffer zone 3 .

[0107] In this embodiment, in response to the cost estimate satisfying the scheduling efficiency improvement index, that is, in the assumption of the control unit, the sample detection system A that implements the test tube rack rotation scheme has a significant improvement in the delivery efficiency of the test tube rack. Therefore, the control unit executes the test tube rack rotation scheme, controls the third conveying mechanism 43 to move multiple test tube racks to the first buffer zone 2, and ensures the smooth delivery path of the second test tube rack 12 with the highest matching degree. And move the second test tube rack 12 with the highest matching degree with the corresponding sample analyzer 1 to the first position along the second direction Y in the second buffer zone 3, and after reaching the first position, the control unit controls the second conveying mechanism 42 to transfer the second test tube rack 12 to the corresponding sample analyzer 1.

[0108] S44 : Abandon the test tube rack rotation plan, and control the second conveying mechanism 42 to transport the first test tube rack 11 to the corresponding sample analyzer 1 .

[0109] In another embodiment, in response to the cost estimate not satisfying the scheduling efficiency improvement index, that is, in the assumption of the control unit, after the sample detection system A implements the test tube rack rotation plan, the sample detection system A does not improve the test tube rack delivery efficiency, or the delivery efficiency is not significantly improved. Therefore, the control unit abandons the test tube rack rotation plan and transfers the test tube rack to the corresponding sample analyzer 1 according to the original arrangement order of multiple test tube racks entering the second buffer zone 3. That is, the control unit abandons the test tube rack rotation plan and delivers the first test tube rack 11 to the corresponding sample analyzer 1.

[0110] Through steps S41 to S44, after the control unit generates the test tube rack rotation plan, the control unit will not directly execute the test tube rack rotation plan, but first obtain the estimated cost of the sample detection system A before and after the test tube rack rotation plan is implemented, and evaluate whether the delivery efficiency of the test tube rack is significantly improved after the sample detection system A implements the test tube rack rotation plan based on the estimated cost. After evaluating that the delivery efficiency has been significantly improved, the control unit executes the test tube rack rotation plan, moves the second test tube rack 12 with the highest matching degree to the first position in the second buffer zone 3, and controls the conveying mechanism 4 to give priority to delivering the test tube rack with a high matching degree. This ensures that the control unit executes the test tube rack rotation plan as an optimized plan for delivering the test tube rack to the sample detection system A, improves the intelligent control level of the control unit, and enhances the user experience of the sample detection system A.

[0111] In actual applications, since most of the samples loaded in the test tube rack are biological samples, they have a certain suitable detection time. If the control unit implements the test tube rack rotation plan, it is very likely that the test tube rack that is about to exceed the suitable detection time will be moved to a rear position in the second buffer zone 3. When the test tube rack is waiting for delivery, the suitable detection time of the test tube will be exceeded, which may lead to inaccurate subsequent test results, or cause the sample to take too long to enter the sample detection system for detection, resulting in low detection efficiency.

[0112] Based on the above, please refer to Figure 2 and Figure 6 , Figure 6It is a flow chart of the second embodiment of the method for pipeline rotation scheduling of the present application. The scanning information of the test tube rack can also include the remaining sample turnover time of the test tube rack. After the control unit obtains the remaining sample turnover time of the test tube rack, the remaining sample turnover time of the test tube rack can be updated and saved in real time in the form of a countdown inside the control unit, wherein the sample turnover time is the time from when the sample information is entered into the server to when the sample test report is obtained. If the remaining sample turnover time of the sample in the sample detection system A is too short, that is, the sample turnover time of the sample in the sample detection system is about to time out, and it also means that the test tube rack stays in the sample detection system A for too long, which indirectly reflects the low efficiency of the sample detection system A in delivering the test tube rack.

[0113] In one embodiment, the method for pipeline rotation scheduling further includes the following steps:

[0114] S61: Determine whether the remaining sample turnover time of the test tube rack is greater than a preset time threshold.

[0115] Among them, the preset time threshold can be set by the user in the control unit based on the sample turnover time (Turn Around Time, TAT) of the samples in the test tube rack and the time from the samples in the test tube rack circulating in the sample detection system A for detection to the output of the sample detection report.

[0116] When the control unit determines that the remaining sample turnover time of the test tube rack is less than or equal to the preset time threshold, that is, the sample turnover time of the test tube rack is about to time out, or the delivery efficiency of the sample detection system A to the test tube rack is about to reach the minimum delivery efficiency acceptable to the user, the sample detection system A needs to immediately deliver the test tube rack to the sample analyzer 1 for testing to avoid the test tube rack expiring while waiting for delivery, resulting in waste of reagents, or too low delivery efficiency for a single test tube rack. At this time, enter step S72.

[0117] When the control unit determines that the remaining sample turnover time of the test tube rack is greater than the preset time threshold, that is, the test tube rack still has time before timeout, or the test tube rack has just entered the sample detection system A, the control unit can change the arrangement order of the test tube racks in the second buffer 3 according to the principle of giving priority to the test tube racks with high matching degree, and dispatch the test tube racks according to the new arrangement order. Enter steps S1-S5.

[0118] S72: If the remaining sample turnover time of multiple test tube racks is less than a preset time threshold, the weight value corresponding to the remaining sample turnover time of the test tube rack is increased, and based on the increased weight value of the remaining sample cycle time of the test tube rack, the status information of the sample analyzer 1 and the scanning information of the test tube rack, the matching degree between the test tube rack and the corresponding sample analyzer 1 is obtained.

[0119] Among them, if the control unit responds that the remaining sample turnover time of the test tube rack is less than or equal to the preset time threshold, the weight value corresponding to the remaining sample turnover time of the test tube rack is increased. As can be seen from the foregoing, the matching degree between the test tube rack and the corresponding sample analyzer 1 can be represented by at least the scanning information of the test tube rack and the status information of the corresponding sample analyzer 1. In this embodiment, the assignment of the matching degree between the test tube rack and the corresponding sample analyzer 1 needs to further consider the weight value corresponding to the remaining sample turnover time of the test tube rack.

[0120] For example, the idleness of the sample analyzer 1 corresponding to the test tube rack is 70%, and the remaining sample turnover time of the test tube rack is 2 minutes. At this time, the weight of the remaining sample turnover time of the test tube rack is 50%, that is, the matching degree between the test tube rack and the corresponding sample analyzer 1 is 70%*50%=35%.

[0121] The test tube rack has stayed in the sample detection system A for 50 seconds. At this time, the remaining sample turnover time of the test tube rack is 1.1 minutes, the weight of the remaining sample turnover time of the test tube rack is 70%, and the matching degree between the test tube rack and the corresponding sample analyzer 1 is 70%*70%=49%.

[0122] When the preset time threshold is 1 minute, the test tube rack stays in the sample detection system A for another 10 seconds. At this time, the remaining sample turnover time of the test tube rack is 1 minute. In response to the remaining sample turnover time of the test tube rack being equal to the preset time threshold, the control unit immediately increases the weight of the remaining sample turnover time of the test tube rack to 100%. At this time, the matching degree between the test tube rack and the corresponding sample analyzer 1 suddenly increases to 70%.

[0123] The control unit then generates a test tube rack rotation plan according to the matching degree between the new test tube rack and the corresponding sample analyzer 1 .

[0124] It can be understood that the control unit directly increases the weight of the remaining sample turnover time of the test tube rack in response to the remaining sample turnover time of the test tube rack being less than or equal to the preset time threshold, that is, the control unit directly increases the dispatch priority of the test tube rack. In one embodiment, if the control unit directly increases the weight of the remaining sample turnover time of the test tube rack to 100% in response to the remaining sample turnover time of the test tube rack being less than or equal to the preset time threshold, it can also be considered that the control unit directly sets the dispatch priority of the test tube rack whose remaining sample turnover time is less than the preset time threshold to the highest dispatch priority.

[0125] Through the above method, the control unit obtains the matching degree of each test tube rack and the corresponding sample analyzer 1, and generates a test tube rack rotation plan according to the matching degree relationship of multiple test tube racks. After the control unit simulates that the sample detection system A implements the test tube rack rotation plan, when the delivery efficiency of the test tube rack is significantly improved, the control unit executes the test tube rack rotation plan, thereby improving the delivery efficiency of the test tube rack by the sample detection system A. At the same time, the control unit detects the remaining turnover time of the sample of the test tube rack in real time. When the remaining turnover time of the sample of the test tube rack is less than the preset time threshold, the control unit increases the delivery priority of the test tube rack to avoid the inaccurate subsequent test results caused by the overdue turnover time of the sample in the test tube rack, or the problem of the sample entering the sample detection system for detection for too long and the low detection efficiency, thereby improving efficiency, saving costs, or avoiding the sample detection system A only considering the overall delivery efficiency of all test tube racks and ignoring the delivery efficiency of a single test tube rack. Improve the user's experience of the method provided in the embodiment of the present application.

[0126] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A sample detection system, characterized in that: include: At least one sample analyzer; A first buffer zone and a second buffer zone, wherein the first buffer zone, the second buffer zone and at least one sample analyzer are sequentially arranged along an extension direction of the sample detection system, and the second buffer zone is arranged between the first buffer zone and at least one sample analyzer; a conveying mechanism, the conveying mechanism being used to move the test tube rack between the first buffer zone, the second buffer zone and the at least one sample analyzer; A control unit is connected to the transmission mechanism, the second buffer zone and at least one sample analyzer, respectively, and the control unit is used to execute: Obtain scanning information of the plurality of test tube racks in the second buffer zone, and obtain status information of all the sample analyzers; based on the scanning information and the status information, obtain a first matching degree between a first test tube rack in the second buffer zone and the corresponding sample analyzer, and obtain a second matching degree between a plurality of second test tube racks in the second buffer zone and the corresponding sample analyzers; in response to the first matching degree being less than any of the second matching degrees, control the conveying mechanism to convey the first test tube rack from the second buffer zone to the first buffer zone, so that the second test tube rack located behind the first test tube rack and having the second matching degree higher than the first matching degree is preferentially dispatched to the corresponding sample analyzer; or control the conveying mechanism to directly move the first test tube rack from the second buffer zone to the corresponding sample analyzer; The first test tube rack is a test tube rack located at the first position along the moving direction of the plurality of test tube racks in the second buffer zone, and the plurality of second test tube racks are other test tube racks in the second buffer zone.

2. The system according to claim 1, characterized in that The system further includes a code scanning unit disposed opposite to the second buffer, and the code scanning unit is used to scan the test tube rack to obtain the scanning information corresponding to the plurality of test tube racks transmitted from the first buffer to the second buffer.

3. The system according to claim 1, characterized in that The transmission mechanism comprises: a first conveying mechanism, used for moving the test tube rack in the first buffer area to the second buffer area; A second conveying mechanism, used to move the test tube rack in the second buffer area to the corresponding sample analyzer, and the second conveying mechanism is also used to move the test tube in the second buffer area to the first buffer area; The third conveying mechanism is located on a side of the first buffer away from the first conveying mechanism, and is used to receive the test tube rack moved by the second buffer so that the test tube rack received from the second buffer avoids the third conveying mechanism or re-enters the test tube rack received from the second buffer into the first buffer.

4. A method for pipeline scheduling, characterized in that: The method is applied to the sample detection system according to any one of claims 1 to 3, comprising: Obtaining scanning information of a plurality of the test tube racks and obtaining status information of all the sample analyzers; Based on the scanning information and the status information of the sample analyzer, obtaining the matching degree between the plurality of the test tube racks and the corresponding sample analyzers; the matching degree includes a first matching degree between the first test tube rack and the corresponding sample analyzer and a second matching degree between the plurality of the second test tube racks and the corresponding sample analyzers; Determining whether a first matching degree between the first test tube rack and the corresponding sample analyzer is greater than all second matching degrees; If not, a test tube rack rotation plan is generated, and based on the test tube rack rotation plan, the conveying mechanism is controlled to convey the first test tube rack from the second buffer zone to the first buffer zone, so that the second test tube rack located behind the first test tube rack and with the second matching degree higher than the first matching degree is preferentially dispatched to the corresponding sample analyzer; or, the conveying mechanism is controlled to move the first test tube rack directly from the second buffer zone to the corresponding sample analyzer.

5. The method according to claim 4, characterized in that The step of obtaining the matching degree between the plurality of test tube racks and the sample analyzer based on the scanning information and the status information of the sample analyzer comprises: Based on the scanning information of the test tube rack, obtaining the sample analyzer corresponding to the test tube rack; Based on the status information of the sample analyzer and the scanning information of the test tube rack, obtaining the matching degree between the test tube rack and the corresponding sample analyzer; The status information of the sample analyzer includes the idleness of the sample analyzer, and the matching degree between the test tube rack and the corresponding sample analyzer is positively correlated with the idleness of the sample analyzer.

6. The method according to claim 4, characterized in that The step of controlling the conveying mechanism to convey the first test tube rack from the second buffer zone to the first buffer zone based on the test tube rack rotation scheme, so that the second test tube rack located behind the first test tube rack and having the second matching degree higher than the first matching degree is preferentially dispatched to the corresponding sample analyzer, further includes: Based on the test tube rack rotation scheme, the conveying mechanism is controlled to convey the first test tube rack from the second buffer zone to the first buffer zone, and the second test tube rack with the highest matching degree with the corresponding sample analyzer is controlled to move to the first position in the moving direction of multiple test tube racks in the second buffer zone, so as to be preferentially dispatched to the corresponding sample analyzer.

7. The method according to claim 4, characterized in that The step of controlling the conveying mechanism to convey the first test tube rack from the second buffer zone to the first buffer zone based on the test tube rack rotation scheme, so that the second test tube rack located behind the first test tube rack and having the second matching degree higher than the first matching degree is preferentially dispatched to the corresponding sample analyzer, comprises: Based on the test tube rack rotation plan, an estimated cost value after the test tube rack is moved is obtained; wherein the estimated cost value includes an estimated time cost value of moving all the test tube racks in the second buffer area to the corresponding sample analyzer assuming that the test tube rack rotation plan is implemented; the estimated cost value is the sum of cost weights obtained based at least on the arrangement order of the test tube racks and the matching degree corresponding to the test tube racks; Determining whether the cost estimate meets the scheduling efficiency improvement index; If so, the test tube rack rotation plan is executed to control the second test tube rack with the highest matching degree with the corresponding sample analyzer to move to the first position in the moving direction of multiple test tube racks in the second buffer zone, and before the step of moving the second test tube rack with the highest matching degree to the first position in the moving direction of multiple test tube racks in the second buffer zone, the second conveying mechanism of the sample detection system is also controlled to move multiple test tube racks that are located in the second buffer zone and are before the second test tube rack with the highest matching degree to the first buffer zone.

8. The method according to claim 7, characterized in that The step of determining whether the cost estimate meets the scheduling efficiency improvement index includes: If not, the test tube rack rotation plan is abandoned, and the second conveying mechanism is controlled to transport the first test tube rack to the corresponding sample analyzer.

9. The method according to claim 4, characterized in that The step of determining whether the first matching degree between the first test tube rack and the corresponding sample analyzer is greater than all second matching degrees comprises: If yes, the second transport mechanism is controlled to directly transport the first test tube rack to the corresponding sample analyzer.

10. The method according to claim 5, characterized in that The matching degree is obtained based on at least the sum of matching weights of the state information of the sample analyzer and the scanning information of the test tube rack; The scanning information also includes the remaining sample turnover time of the test tube rack. The obtaining of the matching degree between the test tube rack and the corresponding sample analyzer based on the status information of the sample analyzer and the scanning information of the test tube rack also includes: Determining whether the remaining sample turnover time of the test tube rack is greater than a preset time threshold; If not, the weight value corresponding to the remaining sample turnover time of the test tube rack is increased, and based on the increased weight value of the remaining sample cycle time of the test tube rack, the status information of the sample analyzer and the scanning information of the test tube rack, the matching degree between the test tube rack and the corresponding sample analyzer is obtained.

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