A multi-cycle long-term energized test method and related device suitable for high voltage direct current GIS

Abstract

The application provides a multi-cycle long-term electrification test method and related device suitable for high-voltage direct-current GIS, and belongs to the technical field of power transmission and distribution insulation equipment. The method comprises the following steps: obtaining a time parameter of high-voltage direct-current GIS reaching insulation stability; determining test cycles of each sub-test of the high-voltage direct-current GIS under different load conditions and voltage polarity conditions according to the time parameter; determining a test sequence of each sub-test according to a preset combination principle, wherein the combination principle is determined according to the load conditions and the voltage polarity conditions; and performing long-term electrification test on the high-voltage direct-current GIS based on the test sequence and the test cycles. The application can be used for high-voltage direct-current GISs of different voltage grades and structures, and can perform long-term electrification test by determining differentiated test cycles and sequences, so as to effectively and reliably evaluate long-term insulation reliability.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of power transmission and distribution insulation equipment, and particularly relates to a multi-cycle long-term energized test method suitable for high-voltage direct-current GIS and a related device. BACKGROUND

[0002] The high-voltage direct-current gas insulated metal enclosed switchgear (high-voltage direct-current GIS) can greatly reduce the land occupation space and equipment weight of the offshore wind power converter platform. Compared with the direct-current field using air insulation equipment, the space of the direct-current field using the direct-current GIS can be reduced by 70% to 95%, and has higher reliability because the high-voltage components are not affected by the external dust, salt-containing air, rain and snow and other environments. Therefore, the high-voltage direct-current GIS has become a key electrical equipment to promote large-scale and high-quality development of offshore wind power.

[0003] Under direct-current voltage, due to the long-term action of unipolar electric field, the carriers in the insulation material of the direct-current GIS gradually transfer to the gas-solid interface under the action of tangential electric field and normal electric field at the insulation interface, resulting in a significant accumulation of interface charges on the surface of the insulator, causing distortion of the electric field at the gas-solid interface, easily inducing surface flashover of the insulator, and seriously affecting the safe and stable operation of the direct-current GIS. However, there is still no relevant standard for the design standard and performance test of the direct-current GIS, and the long-term insulation stability of the high-voltage direct-current GIS cannot be evaluated. SUMMARY

[0004] Therefore, the application aims to provide a multi-cycle long-term energized test method suitable for high-voltage direct-current GIS and a related device, which can effectively and accurately test and evaluate the long-term insulation reliability of the high-voltage direct-current GIS.

[0005] In order to achieve the above-mentioned purpose, the technical scheme provided by the application is as follows:

[0006] In a first aspect, the application provides a multi-cycle long-term energized test method suitable for high-voltage direct-current GIS, comprising the following steps:

[0007] Obtaining a time parameter of the high-voltage direct-current GIS reaching insulation stability;

[0008] According to the time parameter, determining the test cycle of each sub-test of the high-voltage direct-current GIS under different load conditions and voltage polarity conditions;

[0009] According to the preset combination principle, determining the test sequence of each sub-test, and the combination principle is determined according to the load condition and the voltage polarity condition;

[0010] Based on the test sequence and the test cycle, performing long-term energized test on the high-voltage direct-current GIS.

[0011] Further, the voltage value of each sub-test is in the range of 1-1.5 times of the rated voltage of the high-voltage DC GIS under different voltage polarity conditions.

[0012] Further, the test period of each sub-test is determined according to the following formula:

[0013]

[0014] In the formula, represents the test period of the sub-test under the load condition of and the voltage polarity condition of represents the redundancy coefficient of the i-th sub-test, represents the electric field stabilization time of the high-voltage DC GIS under the load condition of and the voltage polarity condition of

[0015] Further, the electric field stabilization time is determined according to the following formula,

[0016]

[0017] In the formula, represents the time saturation coefficient, represents the theoretical calculation time required for the electric field inside the GIS to transit from the capacitive field to the resistive field after the DC voltage excitation is added, is the vacuum dielectric constant, is the dielectric constant of SF6 gas, is the dielectric constant of solid insulation material, is the conductivity of SF6 gas, is the volume conductivity of solid insulation material, is the surface conductivity of solid insulation material, is a characteristic coefficient related to the radius of the insulator.

[0018] Further, the load conditions include no load and load, the voltage polarity conditions include positive polarity and negative polarity, and the combination principles include: opposite polarity principle and no load and load alternation principle;

[0019] The opposite polarity principle is to arrange the sub-tests according to positive polarity and negative polarity alternately;

[0020] The no load and load alternation principle is to arrange the sub-tests according to no load and load alternately.

[0021] Further, the sub-tests of the high-voltage DC GIS under different load conditions and voltage polarity conditions include:

[0022] ​​​The sub-test under no-load positive polarity voltage, the sub-test under no-load negative polarity voltage, the sub-test under load positive polarity voltage, and the sub-test under load negative polarity voltage.

[0023] Further, the test conditions of each sub-test include:

[0024] The voltage value, the voltage polarity, whether the load, and the test period.

[0025] In a second aspect, the present application provides a multi-period long-term energized test system suitable for high-voltage direct-current GIS, comprising:

[0026] A time parameter acquisition unit is configured to acquire a time parameter of the high-voltage direct-current GIS reaching insulation stability;

[0027] A test period determination unit is configured to determine, according to the time parameter, test periods of each sub-test of the high-voltage direct-current GIS under different load conditions and voltage polarity conditions;

[0028] A test sequence determination unit is configured to determine, according to a preset combination principle, a test sequence of each sub-test, wherein the combination principle is determined according to the load condition and the voltage polarity condition;

[0029] An energized test unit is configured to perform long-term energized test on the high-voltage direct-current GIS based on the test sequence and the test period.

[0030] In a third aspect, the present application provides a computer device, comprising a processor and a memory:

[0031] The memory is configured to store a computer program and send instructions of the computer program to the processor;

[0032] The processor is configured to execute the computer program to perform the multi-period long-term energized test method suitable for high-voltage direct-current GIS according to the instructions of the computer program.

[0033] In a fourth aspect, the present application provides a computer readable storage medium, wherein the computer readable storage medium stores a computer program, and the computer program is executed by a processor to implement the multi-period long-term energized test method suitable for high-voltage direct-current GIS according to the first aspect.

[0034] In summary, the application provides a multi-cycle long-term energized test method and related device suitable for high-voltage direct-current GIS, which comprises obtaining a time parameter of high-voltage direct-current GIS reaching insulation stability; determining test cycles of each sub-test of high-voltage direct-current GIS under different load conditions and voltage polarity conditions according to the time parameter; determining a test sequence of each sub-test according to a preset combination principle, and the combination principle is determined according to the load conditions and the voltage polarity conditions; and performing long-term energized test on the high-voltage direct-current GIS based on the test sequence and the test cycles. The application can be used for high-voltage direct-current GIS of different voltage grades and structures, and can perform long-term energized test by determining differentiated test cycles and sequences, thereby effectively and reliably evaluating long-term insulation reliability. BRIEF DESCRIPTION OF DRAWINGS

[0035] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or the prior art description. Obviously, the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor.

[0036] Figure 1 A flowchart of a multi-cycle long-term energized test method suitable for high-voltage direct-current GIS provided by the embodiment of the present application;

[0037] Figure 2 A long-term energized test cycle diagram of direct-current ±550kV direct-current GIS provided by the embodiment of the present application;

[0038] Figure 3 A composition block diagram of a multi-cycle long-term energized test device suitable for high-voltage direct-current GIS provided by the embodiment of the present application;

[0039] Figure 4 A composition block diagram of a computer device provided by the embodiment of the present application. DETAILED DESCRIPTION

[0040] In order to make the objectives, features and advantages of the present application more obvious and easy to understand, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings of the embodiments of the present application. Obviously, the following described embodiments are only some of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.

[0041] Please refer to Figure 1 The embodiment provides a multi-cycle long-term energized test method suitable for high-voltage direct-current GIS, which comprises the following steps:

[0042] S1: Obtain the time parameter for high-voltage DC GIS to reach insulation stability.

[0043] It should be noted that the purpose of this step is to determine the time required for high-voltage DC GIS to reach insulation stability. "Insulation stability" here refers to the state in which the insulation performance of the device's insulation material under the action of an electric field reaches a stable state and no longer changes significantly. Obtaining the time parameter is crucial for the design of subsequent tests, as it ensures that the tests are conducted after the device has reached a stable state, thereby improving the accuracy of the test results.

[0044] S2: Determine the test cycle of each sub-test of high-voltage DC GIS under different load conditions and voltage polarity conditions based on the time parameter.

[0045] It should be noted that this step determines the test cycle of each sub-test based on the time parameter obtained in step S1, combined with different load conditions (i.e., different current or power levels that the device may experience during operation) and voltage polarity conditions (i.e., positive or negative voltage that the device may face). The test cycle refers to the length of time each sub-test lasts, which needs to be long enough to accurately assess the insulation performance of the device under different conditions.

[0046] S3: Determine the test order of each sub-test based on the preset combination principle, which is determined based on the load conditions and voltage polarity conditions.

[0047] It should be noted that the test order refers to the execution order of each sub-test. The determination of the test order is based on the preset combination principle, which takes into account the load conditions and voltage polarity conditions. A reasonable test order can ensure the logicality and systematicness of the test, avoid repeated testing, and improve test efficiency. For example, tests under low load conditions can be performed first, then the load can be gradually increased, or tests under positive polarity voltage can be performed first, then tests under negative polarity voltage can be performed.

[0048] S4: Perform long-term live testing on high-voltage DC GIS based on the test order and test cycle.

[0049] It should be noted that long-term live testing refers to applying voltage to the device over a long period of time to simulate actual operating conditions and evaluate the reliability and stability of the insulation material in long-term operation. This step performs long-term live testing on high-voltage DC GIS according to the test order determined in step S3 and the test cycle determined in step S2.

[0050] The embodiment provides a multi-cycle long-term electrification test method suitable for high-voltage direct-current GIS, which can be used for long-term electrification test of high-voltage direct-current GIS with different voltage grades and structures by determining different test cycles and sequences, so as to effectively and reliably evaluate long-term insulation reliability.

[0051] In one embodiment, the voltage value of each sub-test ranges from 1 to 1.5 times of the rated voltage of the high-voltage direct-current GIS under different voltage polarity conditions.

[0052] In one embodiment, a calculation method of the test cycle is provided. In the method, the test cycle of each sub-test is determined according to the following formula:

[0053] (1)

[0054] In the formula, T represents the test cycle of the sub-test under the load condition of U and the voltage polarity condition of V, k represents the redundancy coefficient of the i-th sub-test, and t represents the electric field stabilization time of the high-voltage direct-current GIS under the load condition of U and the voltage polarity condition of V.

[0055] Based on the test cycle provided in the foregoing embodiment, in a further embodiment, a calculation method of the electric field stabilization time is provided, in which the electric field stabilization time is determined according to the following formula,

[0056] (2)

[0057] In the formula, t represents the electric field stabilization time, k represents the time saturation coefficient, t represents the theoretical calculation time required for the electric field inside the GIS to transit from the capacitive field to the resistive field after the direct-current voltage excitation is added, ε0 represents the vacuum dielectric constant, εr represents the dielectric constant of SF6 gas, εs represents the dielectric constant of solid insulation material, σ0 represents the conductivity of SF6 gas, σs represents the volume conductivity of solid insulation material, σs represents the surface conductivity of solid insulation material, and a represents the characteristic coefficient related to the radius of the insulator.

[0058] In one embodiment, the load conditions include no load and load, the voltage polarity conditions include positive polarity and negative polarity, and the combination principle includes the opposite polarity principle and the no load and load alternation principle. ​​​​​​​​​​​​​​​​​

[0059] The principle of opposite polarity is to arrange the sub-tests in an alternating order of positive polarity and negative polarity;

[0060] The principle of alternating between no-load and load is to arrange the sub-tests in an alternating order of no-load and load.

[0061] In this embodiment, the principle of opposite polarity is to arrange the sub-tests in an alternating order of positive polarity and negative polarity, that is, when a sub-test is performed under positive polarity, the next sub-test will be performed under negative polarity, and so on. For example, the test sub-period can be , or , and the like.

[0062] The principle of alternating between no-load and load is to arrange the sub-tests in an alternating order of no-load (ZL) and load (hl), that is, when a sub-test is performed under no-load, the next sub-test will be performed under load, and so on. For example, the test sub-period can be , or , and the like.

[0063] Based on the load conditions proposed in the foregoing embodiments, in one embodiment, the sub-tests of the high-voltage DC GIS under different load conditions and voltage polarity conditions include:

[0064] Sub-test under no-load positive polarity voltage, sub-test under no-load negative polarity voltage, sub-test under load positive polarity voltage, and sub-test under load negative polarity voltage.

[0065] In one embodiment, the test conditions of each sub-test include:

[0066] Voltage value, voltage polarity, whether loaded, and test period.

[0067] Taking a certain DC ±550kV DC GIS as an example, the test period and test order of the foregoing sub-tests are introduced in combination with the foregoing embodiments.

[0068] In the DC ±550kV DC GIS, ε0 is 8.85E -12 -12 F / m, ε SF6 is 1.002, ε epoxy is 5.3, σ SF6 is 1.00E -21 -11 S / m, σ V is 7.20E -16 -11 S / m, σ S is 9.10E -16 -11 S / m, and R0 is 80. Calculation gives t mThe time is 152515s, approximately 42.3 hours (1.8 days). Due to the temperature rise effect, the electric field transition time under no-load conditions is longer than that under load conditions under DC voltage. Ignoring the influence of slightly non-uniform field polarity effects, it is assumed that the transition times of positive and negative voltages are the same under the same conditions. Taking all factors into consideration, the transition time of this ±550kV DC GIS is taken as... It is 0.95. The value is 0.98. The simulation calculation yields the temperature rise stabilization time t. w It takes about 16 hours.

[0069] The sub-cycles and their cycles of the DC GIS multi-cycle long-term live-line test procedure include: no-load positive polarity voltage. The following test cycle (recorded as) Open-circuit negative polarity voltage The following test cycle (recorded as) ), load positive voltage The following test cycle (recorded as) ), load negative polarity voltage The following test cycle (recorded as) ).

[0070] Test cycle under no-load positive polarity voltage of high voltage DC GIS By t ij It is confirmed that at this point, i represents the no-load ZL, j represents the DC voltage + polarity, i.e., t ij for . Depend on The determination and calculation relationship are shown in formula (3). k1 is the redundancy coefficient, which is generally not less than 2.

[0071] (3)

[0072] Substituting the parameters into formulas (1) and (2), we get Hours (1.7 days), k1 is 10, according to formula (3) we get It lasts for 17 days.

[0073] Test cycle under no-load positive polarity voltage of high voltage DC GIS By t ij It is determined that at this point, i represents the no-load ZL, j represents the DC voltage polarity, i.e., t ij for . Depend on The determination and calculation relationship are shown in formula (4). k2 is the redundancy coefficient, which is generally not less than 2.

[0074] (4)

[0075] Substitute the parameters into formula (1) and (2), we get hours (1.7 days), k2 is 10, according to formula (4), we get 17 days.

[0076] Test cycle of high voltage DC GIS under no-load positive polarity voltage Determined by t ij , at this time i represents the load HL, j represents the DC voltage + polarity, that is, t ij . . Determined by , the calculation relationship is shown in formula (5). k3 is a redundancy coefficient, which is generally not less than 2.

[0077] (5)

[0078] Substitute the parameters into formula (1) and (2), we get hours (1.7 days), k1 is 10, according to formula (5), we get 17 days.

[0079] Test cycle of high voltage DC GIS under no-load positive polarity voltage Determined by t ij , at this time i represents the load HL, j represents the DC voltage polarity, that is, t ij . . Determined by , the calculation relationship is shown in formula (6). k4 is a redundancy coefficient, which is generally not less than 2.

[0080] (6)

[0081] Substitute the parameters into formula (1) and (2), we get hours (1.7 days), k1 is 10, according to formula (6), we get 17 days.

[0082] Take .

[0083] Through the above formula, we get four pairs of data of loading voltage and corresponding time (each pair is a sub-cycle), that is, [+660kV no-load, 17 days], [-660kV no-load, 17 days], [+660kV load, 18 days], [-660kV load, 18 days]. Among them, no-load means no current is applied, and load means 5000A current (5000A DC current or effective value 5000A AC current) is applied.

[0084] In this example, the sequence of each sub-period test of the DC ±550kV DC GIS is: [+660kV no-load, 17 days] → [-660kV no-load, 17 days] → [+660kV load, 18 days] → [-660kV load, 18 days].

[0085] Based on the above four pairs of data and test sequence, the long-term charged test procedure of the DC ±550kV DC GIS is formed, as shown in the following table. Figure 2 During the implementation of each sub-period, it should be ensured that the DC GIS sample is consistent, the internal SF6 gas and spare parts are not replaced. After the end of the whole experiment, the sample should be checked to meet the insulation requirements.

[0086] Based on the same inventive concept, the embodiments of the present application also provide a multi-cycle long-term charged test system for high-voltage DC GIS for implementing the above-mentioned multi-cycle long-term charged test method for high-voltage DC GIS. The implementation scheme of the system for solving the problem is similar to the implementation scheme described in the above method, so the specific limitations in the following multi-cycle long-term charged test system for high-voltage DC GIS embodiments can be referred to the limitations of the multi-cycle long-term charged test method for high-voltage DC GIS in the above, which will not be repeated here.

[0087] Please refer to Figure 3 , the embodiments of the present application provide a multi-cycle long-term charged test system for high-voltage DC GIS, comprising:

[0088] A time parameter acquisition unit is configured to acquire a time parameter of the high-voltage DC GIS reaching insulation stability;

[0089] A test cycle determination unit is configured to determine test cycles of each sub-test of the high-voltage DC GIS under different load conditions and voltage polarity conditions according to the time parameter;

[0090] A test sequence determination unit is configured to determine a test sequence of each sub-test according to a preset combination principle, and the combination principle is determined according to the load condition and the voltage polarity condition;

[0091] A charged test unit is configured to perform long-term charged test on the high-voltage DC GIS based on the test sequence and the test cycle.

[0092] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the division of the above functional units and modules is exemplified, and in actual application, the above functions can be completed by different functional units and modules according to needs, that is, the internal structure of the system is divided into different functional units or modules to complete all or part of the functions described above. Each functional unit or module in the embodiment can be integrated in one processing unit, or each unit can be physically present separately, or two or more units can be integrated in one unit. The integrated unit can be realized in the form of hardware or in the form of software functional unit. In addition, the specific names of each functional unit or module are only for the convenience of mutual distinction, and do not limit the protection scope of the present application. The specific working process of the unit or module in the system can refer to the corresponding process in the foregoing method embodiment, and will not be repeated here.

[0093] With reference to Figure 4 The embodiment of the present application also provides a computer device, which comprises a memory and a processor and a computer program stored in the memory, and when the computer program is executed on the processor, the method of the multi-cycle long-term charged test system suitable for high-voltage DC GIS is realized.

[0094] The computer device can be a desktop computer, a notebook computer, a palm computer and a cloud server, etc. The computer device can comprise, but is not limited to, a processor and a memory. Those skilled in the art can understand that, Figure 4 The computer device is only an example and does not constitute a limitation on the computer device, and can comprise more or fewer components than those shown, or combine certain components or different components, for example, can also comprise an input / output device, a network access device, etc.

[0095] The processor can be a central processing unit (CPU), and the processor can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor.

[0096] The memory can be an internal storage unit of the computer device in some embodiments, such as a hard disk or a memory of the computer device. The memory can also be an external storage device of the computer device in other embodiments, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, and the like. Further, the memory can include both an internal storage unit and an external storage device of the computer device. The memory is used to store an operating system, an application program, a boot loader, data, and other programs, such as program codes of the computer program. The memory can also be used to temporarily store data that has been output or is to be output.

[0097] The embodiment of the present application further provides a computer readable storage medium, which stores a computer program. When the computer program is run by a processor, the method for a multi-cycle long-term charging test system suitable for a high-voltage direct-current GIS is implemented.

[0098] In the embodiment, the integrated unit, if realized in the form of a software functional unit and sold or used as an independent product, can be stored in a computer readable storage medium. Based on such understanding, the present application can implement all or part of the processes in the above-mentioned embodiment methods by a computer program to instruct related hardware, and the computer program can be stored in a computer readable storage medium. The computer program can implement the steps of the above-mentioned method embodiments when executed by a processor. The computer program includes computer program codes, which can be in the form of source code, object code, an executable file, or some intermediate form, etc. The computer readable medium can at least include any entity or device capable of carrying the computer program code to a photographing device / terminal device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium. For example, a U disk, a mobile hard disk, a magnetic disk or an optical disk, etc. In some jurisdictions, according to legislation and patent practice, the computer readable medium can not be an electrical carrier signal and a telecommunication signal.

[0099] In the above-mentioned embodiments, the description of each embodiment has its own focus, and the parts not described or recorded in detail in a certain embodiment can be referred to the relevant description of other embodiments.

[0100] Those skilled in the art can understand that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be realized by electronic hardware or a combination of computer software and electronic hardware. Whether the functions are realized in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to realize the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0101] In the embodiments disclosed in the present application, it should be understood that the disclosed apparatus / terminal device and method can be implemented in other ways. For example, the apparatus / terminal device embodiments described above are merely schematic, for example, the division of the modules or units is merely a logical function division, and actual implementation can have another division manner, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the displayed or discussed each other can be indirect coupling or communication connection through some interfaces, devices or units, and can be electrical, mechanical or other forms.

[0102] The above embodiments are only used to illustrate the technical solutions of the present application, rather than limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that the technical solutions recorded in the foregoing embodiments can be modified, or some technical features can be replaced by equivalents; and these modifications or replacements do not make the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A multi-cycle long-term energized test method suitable for high voltage direct current GIS, characterized in that, The method comprises the following steps: obtaining a time parameter of high-voltage direct-current GIS reaching insulation stability; determining a test cycle of each sub-test of high-voltage direct-current GIS under different load conditions and voltage polarity conditions according to the time parameter; determining a test sequence of each sub-test according to a preset combination principle, the combination principle being determined according to the load conditions and the voltage polarity conditions; performing long-term live testing on high-voltage direct-current GIS based on the test sequence and the test cycle; the test cycle of each sub-test is determined according to the following formula: ； In the formula, represents the test cycle of the sub-test with the load condition , the voltage polarity condition , represents the redundancy coefficient of the th sub-test, represents the electric field stability time of the high-voltage direct-current GIS when the load condition is , the voltage polarity condition is . the electric field stabilization time is determined according to the following formula, ； wherein, denotes the time saturation coefficient, denotes the theoretically calculated time required for the internal electric field of the GIS after the DC voltage excitation addition to transit from the capacitive field to the resistive field, is the vacuum permittivity, is the permittivity of SF6 gas, is the permittivity of the solid insulating material, is the conductivity of SF6 gas, is the volume conductivity of the solid insulating material, is the surface conductivity of the solid insulating material, is the characteristic coefficient related to the radius of the insulator.

2. The multi-cycle long-term partial discharge test method for high voltage DC GIS according to claim 1, characterized in that, the voltage value of each sub-test under different voltage polarity conditions ranges from 1 to 1.5 times of the rated voltage of high-voltage direct-current GIS.

3. The multi-cycle long-term partial discharge test method for high voltage DC GIS according to claim 1, characterized in that, The load conditions include no load and load, the voltage polarity conditions include positive polarity and negative polarity, and the combination principle includes the opposite polarity principle and the no load and load alternation principle. The opposite polarity principle is to sort the sub-tests according to positive polarity and negative polarity alternately. The no load and load alternation principle is to sort the sub-tests according to no load and load alternation.

4. The multi-cycle long-term partial discharge test method for high voltage DC GIS according to claim 3, characterized in that, The sub-tests of high-voltage direct-current GIS under different load conditions and voltage polarity conditions include: sub-tests under no load positive polarity voltage, sub-tests under no load negative polarity voltage, sub-tests under load positive polarity voltage, and sub-tests under load negative polarity voltage.

5. The multi-cycle long-term partial discharge test method suitable for HVDC GIS according to claim 1, characterized in that, The test conditions of each sub-test include: voltage value, voltage polarity, whether loaded, and the test cycle.

6. A multi-cycle long-term energized test system suitable for high voltage DC GIS, characterized in that, The method comprises: a time parameter obtaining unit for obtaining a time parameter of high-voltage direct-current GIS reaching insulation stability; a test cycle determining unit for determining a test cycle of each sub-test of high-voltage direct-current GIS under different load conditions and voltage polarity conditions according to the time parameter; a test sequence determining unit for determining a test sequence of each sub-test according to a preset combination principle, the combination principle being determined according to the load conditions and the voltage polarity conditions; a live testing unit for performing long-term live testing on high-voltage direct-current GIS based on the test sequence and the test cycle; the test cycle of each sub-test is determined according to the following formula: ； In the formula, represents the test cycle of the sub-test with the load condition , the voltage polarity condition , represents the first term sub-test redundancy coefficient, represents the electric field stability time of the high-voltage direct-current GIS when the load condition is , the voltage polarity condition is ; the electric field stabilization time is determined according to the following formula, ； wherein, denotes the time saturation coefficient, denotes the theoretically calculated time required for the internal electric field of the GIS after the DC voltage excitation addition to transit from the capacitive field to the resistive field, is the vacuum permittivity, is the permittivity of SF6 gas, is the permittivity of solid insulating material, is the conductivity of SF6 gas, is the volume conductivity of solid insulating material, is the surface conductivity of solid insulating material, is the characteristic coefficient related to the insulator radius.

7. A computer device, comprising: The device comprises a processor and a memory: The memory is used to store a computer program and send instructions of the computer program to the processor; The processor executes the instructions of the computer program to perform the multi-cycle long-term live testing method for high-voltage direct-current GIS according to any one of claims 1-5.

8. A computer-readable storage medium, characterized in that, The computer program is stored on the computer readable storage medium and is executed by the processor to implement the multi-cycle long-term live testing method for high-voltage direct-current GIS according to any one of claims 1-5.

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