Spacecraft and product magnetic field measurement method thereof, electronic equipment and storage medium

Abstract

The invention provides a spacecraft and a product magnetic field measurement method thereof, electronic equipment and a storage medium, and the method comprises the steps: arranging a product magnetometer sensor and a background magnetometer sensor in a test region, and taking background measurement values of first background magnetic field data and second background magnetic field data at the same moment in each direction as input; fitting coefficients of background measured values and product measured values at the same moment in each direction are obtained through linear regression, a linear regression equation in each direction is constructed, background magnetic field interference is calculated according to the linear regression equations, the background magnetic field interference is eliminated from product magnetic field data, and the real magnetic induction intensity of the spacecraft and the product of the spacecraft is obtained. And calculating the magnetic moment of the spacecraft and the product thereof according to the real magnetic induction intensity. Based on the above mode, the influence of environmental fluctuation on the magnetic measurement of the spacecraft is reduced, and the purpose of accurately calculating the magnetic moment of the spacecraft and the product thereof is achieved.

Description

Technical Field

[0001] The present invention mainly relates to the field of magnetic field measurement technology, and in particular to a spacecraft and its product magnetic field measurement method, electronic equipment and storage medium. Background Art

[0002] At present, the common method for measuring the magnetic field of spacecraft and its products in the geomagnetic environment is to use a magnetometer to monitor the environmental magnetic field of the spacecraft and its products, and then subtract the environmental magnetic field value or the average value from the measurement value of other magnetometers as the magnetic field generated by the spacecraft itself. This method does not take into account the influence of the environmental magnetic field gradient, which leads to large errors in the calculation of magnetic moment under environmental fluctuations. Summary of the invention

[0003] The purpose of the present invention is to provide a method, electronic equipment and storage medium for measuring the magnetic field of a spacecraft and its products, which can calculate the background magnetic field interference through a linear regression model to achieve accurate measurement of the magnetic moment of the spacecraft and its products.

[0004] To achieve the above objectives, in a first aspect, the present application provides a method for measuring the magnetic field of a spacecraft and its products, comprising:

[0005] Arrange product magnetometer sensors and background magnetometer sensors in the test area, collect first background magnetic field data, set the state of the spacecraft and its products, place the spacecraft and its products on a non-magnetic turntable, rotate the non-magnetic turntable, collect product magnetic field data, move the spacecraft and its products out of the test area, and collect second background magnetic field data;

[0006] Taking the background measurement values ​​of the first background magnetic field data and the second background magnetic field data at the same time in each direction as input, obtaining the fitting coefficient of the background measurement value and the product measurement value at the same time in each direction through linear regression, and constructing a linear regression equation in each direction, wherein the directions include X, Y and Z directions;

[0007] The background magnetic field interference is calculated according to the linear regression equation, and the background magnetic field interference is eliminated from the product magnetic field data to obtain the true magnetic induction intensity of the spacecraft and its products. The magnetic moment of the spacecraft and its products is calculated based on the true magnetic induction intensity.

[0008] In some embodiments, arranging a product magnetometer sensor and a background magnetometer sensor in a test zone includes:

[0009] On the east and west axes of the geomagnetic field in the test area, six magnetometer sensors are placed linearly on both sides of the non-magnetic turntable. On the same side, from near to far, the distance between the center of the first magnetometer sensor and the center of the non-magnetic turntable is r1, the distance between the center of the second magnetometer sensor and the center of the non-magnetic turntable is r2, the distance between the center of the third magnetometer sensor and the center of the non-magnetic turntable is r3, the distance between the center of the fourth magnetometer sensor and the center of the non-magnetic turntable is r4, the distance between the center of the fifth magnetometer sensor and the center of the non-magnetic turntable is r5, and the distance between the center of the sixth magnetometer sensor and the center of the non-magnetic turntable is r6;

[0010] in, D represents the envelope diameter of the spacecraft and its products; r4-r3≥0.1m, r5-r4≥0.1m, r6-r5≥0.1m.

[0011] In some embodiments, on the same side, from near to far, the first magnetometer sensor, the second magnetometer sensor, and the third magnetometer sensor are product magnetometer sensors; the fourth magnetometer sensor, the fifth magnetometer sensor, and the sixth magnetometer sensor are background magnetometer sensors.

[0012] In some embodiments, collecting first background magnetic field data includes:

[0013] Connect the product magnetometer sensor and the background magnetometer sensor to the multi-channel data acquisition instrument to preheat the instrument;

[0014] The multi-channel data acquisition instrument is turned on to collect the measurement values ​​of the product magnetometer sensor and the background magnetometer sensor within five minutes as the first background magnetic field data.

[0015] In some embodiments, rotating the non-magnetic turntable to collect product magnetic field data includes:

[0016] The non-magnetic turntable rotates around the Z axis every 10° around the cylinder, and reads the measurement value of the background magnetometer sensor at each measurement point and the measured values ​​of the product magnetometer sensor

[0017] in, It includes three components, It includes three components, r represents the distance from the center of the corresponding sensor to the center of the spacecraft and its products; i = 1, 2, ..., 6 is the number of the product magnetometer sensor; k = 7, 8, ..., 12 is the number of the background magnetometer sensor; j = 1, 2, ..., 36 represents the serial number of the measurement point of the spacecraft and its products rotating drum; Indicates the angle through which the spacecraft and its products have turned.

[0018] In some embodiments, the linear regression equation in the X direction is expressed as:

[0019] B X (r i )=B(r k )A X (r i )+β X (r i )+ε

[0020] A X (r i ) represents the regression coefficient vector in the X direction; B(r k ) represents the background measurement value of the background magnetometer sensor at the same time in all directions; β X (r i ) represents the intercept in the X direction; ε is the error term; i=1,2,…,6 is the number of the product magnetometer sensor, k=7,8,…,12 is the number of the background magnetometer sensor;

[0021] The linear regression equation in the Y direction is expressed as:

[0022] B Y (r i )=B(r k )A Y (r i )+β Y (r i )+ε

[0023] A Y (r i ) represents the regression coefficient vector in the Y direction; B(r k ) represents the background measurement value of the background magnetometer sensor at the same time in all directions; β Y (r i ) represents the intercept in the Y direction; ε is the error term; i=1,2,…,6 is the number of the product magnetometer sensor, k=7,8,…,12 is the number of the background magnetometer sensor;

[0024] The linear regression equation in the Z direction is expressed as:

[0025] B Z (r i)=B(r k )A Z (r i )+β Z (r i )+ε

[0026] A Z (r i ) represents the regression coefficient vector in the Z direction; B(r k ) represents the background measurement value of the background magnetometer sensor at the same time in all directions; β z (r i ) represents the intercept in the Z direction; ε is the error term; i=1,2,…,6 is the number of the product magnetometer sensor, and k=7,8,…,12 is the number of the background magnetometer sensor.

[0027] In some embodiments, the expression of the background magnetic field interference in the X direction is:

[0028]

[0029] represents the background magnetic field interference in the X direction, Represents the measurement value of the background magnetometer sensor, A X (r i ) represents the regression coefficient vector in the X direction; β X (r i ) represents the intercept in the X direction;

[0030] The expression of the background magnetic field interference in the Y direction is:

[0031]

[0032] represents the background magnetic field interference in the Y direction, Represents the measurement value of the background magnetometer sensor, A Y (r i ) represents the regression coefficient vector in the Y direction; β Y (r i ) represents the intercept in the Y direction;

[0033] The expression of the background magnetic field interference in the Z direction is:

[0034]

[0035] represents the background magnetic field interference in the Z direction, Represents the measurement value of the background magnetometer sensor, A Z (r i ) represents the regression coefficient vector in the Z direction; β Z (ri ) represents the intercept in the Z direction.

[0036] In some embodiments, the expression of the real magnetic induction intensity in the X direction is:

[0037]

[0038] represents the real magnetic induction intensity in the X direction, Indicates the measurement value of the product magnetometer sensor in the X direction, Indicates the background magnetic field interference in the X direction;

[0039] The expression of the true magnetic induction intensity in the Y direction is:

[0040]

[0041] Indicates the true magnetic induction intensity in the Y direction, Indicates the measurement value of the product magnetometer sensor in the Y direction. Indicates the background magnetic field interference in the Y direction;

[0042] The expression of the true magnetic induction intensity in the Z direction is:

[0043]

[0044] Indicates the true magnetic induction intensity in the Z direction, Indicates the measured value of the product magnetometer sensor in the Z direction. Represents the background magnetic field interference in the Z direction.

[0045] In a second aspect, the present application provides an electronic device, including a memory and a processor, wherein instructions are stored in the memory, and when the instructions are called by the processor, the processor executes any method as described in the first aspect above.

[0046] In a third aspect, the present application provides a storage medium comprising computer program instructions, wherein the computer program instructions are used to enable a computer to execute any method of the first aspect.

[0047] Compared with the prior art, the present invention has the following advantages:

[0048] The present application provides a method, electronic device and storage medium for measuring the magnetic field of a spacecraft and its products. The method fits the geomagnetic environment in a test area, arranges product magnetometer sensors and background magnetometer sensors in the geomagnetic environment to collect magnetic field data, constructs a linear regression equation using a linear regression fitting method, and eliminates background magnetic field interference from the magnetic field data based on the linear regression equation, thereby reducing the impact of environmental fluctuations on the magnetic measurement of the spacecraft and achieving the purpose of accurately calculating the magnetic moment of the spacecraft and its products. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] The accompanying drawings are included to provide a further understanding of the present application. They are included and constitute a part of the present application. The accompanying drawings illustrate embodiments of the present application and together with the present specification serve to explain the principles of the present application. In the accompanying drawings:

[0050] Figure 1 This is a flow chart of a method for measuring the magnetic field of a spacecraft and its products provided by the present application as an example;

[0051] Figure 2 is a schematic diagram of an arrangement of a magnetometer sensor exemplarily provided in the present application;

[0052] Figure 3 This is a schematic diagram of the maximum difference of an experiment provided by the present application as an example;

[0053] Figure 4 This is a schematic diagram of an electronic device provided as an example in this application. DETAILED DESCRIPTION

[0054] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for the description of the embodiments. Obviously, the drawings described below are only some examples or embodiments of the present application. For ordinary technicians in this field, the present application can also be applied to other similar scenarios based on these drawings without creative work. Unless it is obvious from the language environment or otherwise explained, the same reference numerals in the figures represent the same structure or operation.

[0055] As shown in this application and claims, unless the context clearly indicates an exception, the words "a", "an", "an" and / or "the" do not refer to the singular and may also include the plural. Generally speaking, the terms "include" and "comprise" only indicate the inclusion of the steps and elements that have been clearly identified, and these steps and elements do not constitute an exclusive list. The method or device may also include other steps or elements.

[0056] In this embodiment, reference Figure 1 , a method for measuring magnetic field of a spacecraft and its products is provided, comprising:

[0057] S101, arrange product magnetometer sensors and background magnetometer sensors in the test area, collect first background magnetic field data, set the status of the spacecraft and its products, place the spacecraft and its products on a non-magnetic turntable, rotate the non-magnetic turntable, collect product magnetic field data, move the spacecraft and its products out of the test area, and collect second background magnetic field data.

[0058] In some embodiments, arranging a product magnetometer sensor and a background magnetometer sensor in a test zone includes:

[0059] On the east and west axes of the geomagnetic field in the test area, six magnetometer sensors are placed linearly on both sides of the non-magnetic turntable. On the same side, from near to far, the distance between the center of the first magnetometer sensor and the center of the non-magnetic turntable is r1, the distance between the center of the second magnetometer sensor and the center of the non-magnetic turntable is r2, the distance between the center of the third magnetometer sensor and the center of the non-magnetic turntable is r3, the distance between the center of the fourth magnetometer sensor and the center of the non-magnetic turntable is r4, the distance between the center of the fifth magnetometer sensor and the center of the non-magnetic turntable is r5, and the distance between the center of the sixth magnetometer sensor and the center of the non-magnetic turntable is r6;

[0060] in, D represents the envelope diameter of the spacecraft and its products; r4-r3≥0.1m, r5-r4≥0.1m, r6-r5≥0.1m.

[0061] Preferably, on the same side, from near to far, the first magnetometer sensor, the second magnetometer sensor, and the third magnetometer sensor are product magnetometer sensors; the fourth magnetometer sensor, the fifth magnetometer sensor, and the sixth magnetometer sensor are background magnetometer sensors.

[0062] refer to Figure 2 , taking the geomagnetic west axis as an example, the center of the non-magnetic turntable is taken as the origin of the coordinate system, and the center of the spacecraft and its products roughly coincides with the center position of the non-magnetic turntable. The directions of the coordinate system include X, Y and Z directions, where the Z direction is consistent with the direction of the geomagnetic west axis. The envelope diameter of the spacecraft and its products is D, and 6 magnetometer sensors are placed from near to far. The distances from the center of the 6 magnetometer sensors to the center of the non-magnetic turntable are r1-r6 respectively. On the geomagnetic west axis, the first magnetometer sensor, the second magnetometer sensor, and the third magnetometer sensor are product magnetometer sensors; the fourth magnetometer sensor, the fifth magnetometer sensor, and the sixth magnetometer sensor are background magnetometer sensors.

[0063] S102, taking the background measurement values ​​of the first background magnetic field data and the second background magnetic field data at the same time in each direction as input, obtaining the fitting coefficients of the background measurement values ​​and the product measurement values ​​at the same time in each direction through linear regression, and constructing a linear regression equation in each direction.

[0064] The directions include X, Y and Z directions.

[0065] In some embodiments, collecting first background magnetic field data includes: connecting a product magnetometer sensor and a background magnetometer sensor to a multi-channel data acquisition instrument, then preheating the instrument, turning on the multi-channel data acquisition instrument, and collecting measurement values ​​of the product magnetometer sensor and the background magnetometer sensor within five minutes as the first background magnetic field data.

[0066] In some embodiments, rotating the non-magnetic turntable to collect product magnetic field data includes:

[0067] The non-magnetic turntable rotates around the Z axis every 10° around the cylinder, and reads the measurement value of the background magnetometer sensor at each measurement point and the measured values ​​of the product magnetometer sensor

[0068] It includes three components, It includes three components, r represents the distance from the center of the corresponding sensor to the center of the spacecraft and its products; i = 1, 2, ..., 6 is the number of the product magnetometer sensor; k = 7, 8, ..., 12 is the number of the background magnetometer sensor; j = 1, 2, ..., 36 represents the serial number of the measurement point of the spacecraft and its products rotating drum; Indicates the angle through which the spacecraft and its products have turned.

[0069] In some embodiments, the linear regression equation in the X direction is expressed as follows (1):

[0070] B X (r i )=B(r k )A X (r i )+β X (r i )+ε (1)

[0071] A X (r i ) represents the regression coefficient vector in the X direction; B(r k ) represents the background measurement value of the background magnetometer sensor at the same time in all directions; β X (r i) represents the intercept in the X direction; ε is the error term; i=1,2,…,6 is the number of the product magnetometer sensor, and k=7,8,…,12 is the number of the background magnetometer sensor.

[0072] The linear regression equation in the Y direction is expressed as follows:

[0073] B Y (r i )=B(r k )A Y (r i )+β Y (r i )+ε (2)

[0074] A Y (r i ) represents the regression coefficient vector in the Y direction; B(r k ) represents the background measurement value of the background magnetometer sensor at the same time in all directions; β Y (r i ) represents the intercept in the Y direction; ε is the error term; i=1,2,…,6 is the number of the product magnetometer sensor, and k=7,8,…,12 is the number of the background magnetometer sensor.

[0075] The linear regression equation in the Z direction is expressed as follows:

[0076] B Z (r i )=B(r k )A Z (r i )+β Z (r i )+ε (3)

[0077] A Z (r i ) represents the regression coefficient vector in the Z direction; B(r k ) represents the background measurement value of the background magnetometer sensor at the same time in all directions; β Z (r i ) represents the intercept in the Z direction; ε is the error term; i=1,2,…,6 is the number of the product magnetometer sensor, and k=7,8,…,12 is the number of the background magnetometer sensor.

[0078] Expressions (1)-(3) can be summarized into the general form of linear regression equation, as shown in equation (4):

[0079] y=XA+ε (4)

[0080] The linear regression model can be fitted by minimizing the residual squares ‖y-XA‖2 To determine the regression coefficient A.

[0081] S103, calculating the background magnetic field interference according to the linear regression equation, eliminating the background magnetic field interference from the product magnetic field data, obtaining the real magnetic induction intensity of the spacecraft and its products, and calculating the magnetic moment of the spacecraft and its products according to the real magnetic induction intensity.

[0082] In some embodiments, the expression of the background magnetic field interference in the X direction is shown in the following formula (5):

[0083]

[0084] represents the background magnetic field interference in the X direction, Represents the measurement value of the background magnetometer sensor, A X (r i ) represents the regression coefficient vector in the X direction; β X (r i ) represents the intercept in the X direction. The expression of the background magnetic field interference in the Y direction is shown in the following formula (6):

[0085]

[0086] represents the background magnetic field interference in the Y direction, Represents the measurement value of the background magnetometer sensor, A Y (r i ) represents the regression coefficient vector in the Y direction; β Y (r i ) represents the intercept in the Y direction;

[0087] The expression of the background magnetic field interference in the Z direction is shown in the following equation (7):

[0088]

[0089] represents the background magnetic field interference in the Z direction, Represents the measurement value of the background magnetometer sensor, A Z (r i ) represents the regression coefficient vector in the Z direction; β Z (r i ) represents the intercept in the Z direction.

[0090] Eliminating the background magnetic field interference, the expression of the real magnetic induction intensity in the X direction is shown in the following formula (8):

[0091]

[0092] represents the real magnetic induction intensity in the X direction, Indicates the measurement value of the product magnetometer sensor in the X direction, Indicates the background magnetic field interference in the X direction;

[0093] The expression of the true magnetic induction intensity in the Y direction is shown in the following formula (9):

[0094]

[0095] Indicates the true magnetic induction intensity in the Y direction, Indicates the measurement value of the product magnetometer sensor in the Y direction. Indicates the background magnetic field interference in the Y direction;

[0096] The expression of the true magnetic induction intensity in the Z direction is shown in the following formula (10):

[0097]

[0098] Indicates the true magnetic induction intensity in the Z direction, Indicates the measured value of the product magnetometer sensor in the Z direction. Represents the background magnetic field interference in the Z direction.

[0099] Furthermore, the magnetic moment (M X ,M Y ,M Z ).

[0100] As shown in Table 1, the random error of the magnetic moment is evaluated given the error analysis parameters in Table 1. The magnetic moment is obtained using the steps S101-S103 mentioned above.

[0101] Table 1

[0102] parameter Numeric <![CDATA[Uniaxial component M of the magnetic dipole moment x,y,z > <![CDATA[1A·m 2 ]]> <![CDATA[Measure the distance r1]]> 1.5m <![CDATA[Measure the distance r2]]> 2m <![CDATA[Measure the distance r3]]> 2.5m <![CDATA[Magnetometer measures the bottom noise ΔBP noise > 10pT <![CDATA[Environmental gradient magnetic field ΔBP gradient > 0.5nT <![CDATA[Environmental fluctuating magnetic field ΔBP fluctuation > 5nT <![CDATA[Random error Δr of distance measurement random > 0

[0103] The random error of the magnetic moment is calculated using the following formula (11):

[0104]

[0105] Indicates the angle that the turntable rotates at the jth measuring point.

[0106] By comparison, the above steps can reduce the interference of the geomagnetic environment fluctuation magnetic field to less than 5nT. The error of magnetic moment calculation is 8.15%, which is only 4.47% higher than the error without geomagnetic environment fluctuation.

[0107] The robustness of the above method was tested in a factory environment. 70 sets of experiments were conducted at different times of the day, and the maximum difference between the predicted value and the actual value of the background magnetic field at the product magnetometer sensor in each experiment was recorded. Figure 3 The maximum difference between different experiments is shown, with the horizontal axis representing the number of experimental groups and the vertical axis representing the random error of the magnetic moment. Figure 3 It can be seen that in most experiments, the maximum difference is below T, which shows that the magnetic field measurement method proposed in this application is highly robust, does not require setting a threshold, and is not limited by the magnetic test time.

[0108] Further, if Figure 4 An exemplary embodiment of the present application further provides an electronic device, including a memory 401 and a processor 402, wherein the memory 401 stores instructions, and when the instructions are executed by the processor 402, the processor 402 executes any method of the first aspect.

[0109] It should be understood that the processor mentioned in the embodiments of the present application may be a CPU, or other general-purpose processors, DSPs, ASICs, FPGAs or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or the processor may be any conventional processor, etc.

[0110] It should also be understood that the memory mentioned in the embodiments of the present application may be a volatile memory or a non-volatile memory, or may include both volatile and non-volatile memories. Among them, the non-volatile memory may be a read-only memory (ROM), a programmable read-only memory, an erasable programmable read-only memory, an electrically erasable programmable read-only memory, or a flash memory. The volatile memory may be a random access memory (RAM), which is used as an external cache. By way of example but not limitation, many forms of RAM are available, such as static random access memory, dynamic random access memory, synchronous dynamic random access memory, double data rate synchronous dynamic random access memory, enhanced synchronous dynamic random access memory, synchronously connected dynamic random access memory, and direct memory bus random access memory.

[0111] The present application also provides a storage medium storing computer program instructions, which, when executed by a processor of a computer, enables the computer to execute the steps of any of the methods mentioned above.

[0112] A computer-readable medium may include a propagated data signal containing computer program code, such as in baseband or as part of a carrier wave. The propagated signal may have a variety of manifestations, including electromagnetic, optical, etc., or a suitable combination. A computer-readable medium may be any computer-readable medium other than a computer-readable storage medium, which may be connected to an instruction execution system, device or apparatus to communicate, propagate or transmit a program for use. The program code on the computer-readable medium may be propagated via any suitable medium, including radio, cable, fiber optic cable, radio frequency signal, or similar medium, or any combination of the above mediums.

[0113] The basic concepts have been described above. Obviously, for those skilled in the art, the above invention disclosure is only used as an example and does not constitute a limitation of the present application. Although not explicitly stated herein, those skilled in the art may make various modifications, improvements and amendments to the present application. Such modifications, improvements and amendments are suggested in the present application, so such modifications, improvements and amendments still belong to the spirit and scope of the exemplary embodiments of the present application.

[0114] At the same time, the present application uses specific words to describe the embodiments of the present application. For example, "one embodiment", "an embodiment", and / or "some embodiments" refer to a certain feature, structure or characteristic related to at least one embodiment of the present application. Therefore, it should be emphasized and noted that "one embodiment" or "an embodiment" or "an alternative embodiment" mentioned twice or more in different positions in this specification does not necessarily refer to the same embodiment. In addition, some features, structures or characteristics in one or more embodiments of the present application can be appropriately combined.

[0115] Some aspects of the present application may be performed entirely by hardware, entirely by software (including firmware, resident software, microcode, etc.), or by a combination of hardware and software. The above hardware or software may be referred to as "data blocks", "modules", "engines", "units", "components" or "systems". The processor may be one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DAPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), processors, controllers, microcontrollers, microprocessors, or combinations thereof. In addition, various aspects of the present application may be expressed as computer products located in one or more computer-readable media, which include computer-readable program codes. For example, computer-readable media may include, but are not limited to, magnetic storage devices (e.g., hard disks, floppy disks, tapes ...), optical disks (e.g., compact disks CDs, digital versatile disks DVDs ...), smart cards, and flash memory devices (e.g., cards, sticks, key drives ...).

[0116] A computer-readable medium may include a propagated data signal containing computer program code, such as in baseband or as part of a carrier wave. The propagated signal may have a variety of manifestations, including electromagnetic, optical, etc., or a suitable combination. A computer-readable medium may be any computer-readable medium other than a computer-readable storage medium, which may be connected to an instruction execution system, device or apparatus to communicate, propagate or transmit a program for use. The program code on the computer-readable medium may be propagated via any suitable medium, including radio, cable, fiber optic cable, radio frequency signal, or similar medium, or any combination of the above mediums.

[0117] Similarly, it should be noted that in order to simplify the description of the disclosure of this application and thus help understand one or more embodiments of the invention, in the above description of the embodiments of this application, multiple features are sometimes combined into one embodiment, figure or description thereof. However, this disclosure method does not mean that the features required by the object of this application are more than the features mentioned in the claims. In fact, the features of the embodiments are less than all the features of the single embodiment disclosed above.

[0118] In some embodiments, numbers describing the number of components and attributes are used. It should be understood that such numbers used in the description of the embodiments are modified by the modifiers "about", "approximately" or "substantially" in some examples. Unless otherwise specified, "about", "approximately" or "substantially" indicate that the numbers are allowed to vary by ±20%. Accordingly, in some embodiments, the numerical parameters used in the specification and claims are approximate values, which may change according to the required features of individual embodiments. In some embodiments, the numerical parameters should take into account the specified significant digits and adopt the general method of retaining digits. Although the numerical domains and parameters used to confirm the breadth of their range in some embodiments of the present application are approximate values, in specific embodiments, the setting of such numerical values ​​is as accurate as possible within the feasible range.

[0119] Although the present application has been described with reference to the current specific embodiments, ordinary technicians in this technical field should recognize that the above embodiments are only used to illustrate the present application, and various equivalent changes or substitutions may be made without departing from the spirit of the present application. Therefore, as long as the changes and modifications to the above embodiments are within the essential spirit of the present application, they will fall within the scope of the claims of the present application.

Claims

1. A method for measuring magnetic field of a spacecraft and its products, characterized in that: include: Arranging a product magnetometer sensor and a background magnetometer sensor in a test area, collecting first background magnetic field data, setting a state of a spacecraft and its product, placing the spacecraft and its product on a non-magnetic turntable, rotating the non-magnetic turntable, collecting product magnetic field data, moving the spacecraft and its product out of the test area, and collecting second background magnetic field data; Taking the background measurement values ​​of the first background magnetic field data and the second background magnetic field data at the same time in each direction as input, obtaining the fitting coefficient of the background measurement value and the product measurement value at the same time in each direction through linear regression, and constructing a linear regression equation in each direction, wherein the directions include X, Y and Z directions; The background magnetic field interference is calculated according to the linear regression equation, and the background magnetic field interference is eliminated from the product magnetic field data to obtain the true magnetic induction intensity of the spacecraft and its products, and the magnetic moment of the spacecraft and its products is calculated according to the true magnetic induction intensity.

2. The method according to claim 1, characterized in that The step of arranging a product magnetometer sensor and a background magnetometer sensor in a test area includes: On the geomagnetic east and west axes of the test area, six magnetometer sensors are linearly placed on both sides of the non-magnetic turntable, wherein on the same side, from near to far, the distance between the center of the first magnetometer sensor and the center of the non-magnetic turntable is r1, the distance between the center of the second magnetometer sensor and the center of the non-magnetic turntable is r2, the distance between the center of the third magnetometer sensor and the center of the non-magnetic turntable is r3, the distance between the center of the fourth magnetometer sensor and the center of the non-magnetic turntable is r4, the distance between the center of the fifth magnetometer sensor and the center of the non-magnetic turntable is r5, and the distance between the center of the sixth magnetometer sensor and the center of the non-magnetic turntable is r6; in, D represents the envelope diameter of the spacecraft and its products; r4-r3≥0.1m, r5-r4≥0.1m, r6-r5≥0.1m.

3. The method according to claim 2, characterized in that On the same side, from near to far, the first magnetometer sensor, the second magnetometer sensor, and the third magnetometer sensor are the product magnetometer sensors; the fourth magnetometer sensor, the fifth magnetometer sensor, and the sixth magnetometer sensor are the background magnetometer sensors.

4. The method according to claim 3, characterized in that The collecting of first background magnetic field data includes: Connecting the product magnetometer sensor and the background magnetometer sensor to a multi-channel data acquisition instrument to preheat the instrument; The multi-channel data acquisition instrument is turned on to collect measurement values ​​of the product magnetometer sensor and the background magnetometer sensor within five minutes as the first background magnetic field data.

5. The method according to claim 3, characterized in that The rotating the non-magnetic turntable to collect product magnetic field data includes: The non-magnetic turntable is rotated around the Z axis every 10° around the cylinder, and the measurement value of the background magnetometer sensor is read at each measurement point. and the measured values ​​of the product magnetometer sensor in, It includes three components, It includes three components, r represents the distance from the center of the corresponding sensor to the center of the spacecraft and its products; i=1, 2, ..., 6 is the number of the product magnetometer sensor; k=7, 8, ..., 12 is the number of the background magnetometer sensor; j=1, 2, ..., 36 represents the serial number of the measurement point of the spacecraft and its products rotating drum; Indicates the angle through which the spacecraft and its products have turned.

6. The method according to claim 3, characterized in that The linear regression equation in the X direction is expressed as: B X (r i )=B(r k )A X (r i )+b X (r i )+e A X (r i ) represents the regression coefficient vector in the X direction; B(r k ) represents the background measurement value of the background magnetometer sensor at the same time in all directions; β X (r i ) represents the intercept in the X direction; ε is the error term; i=1,2,…,6 is the number of the product magnetometer sensor; k=7,8,…,12 is the number of the background magnetometer sensor; The linear regression equation in the Y direction is expressed as: B Y (r i )=B(r k )A Y (r i )+b Y (r i )+e A Y (r i ) represents the regression coefficient vector in the Y direction; B(r k ) represents the background measurement value of the background magnetometer sensor at the same time in all directions; β Y (r i ) represents the intercept in the Y direction; ε is the error term; i=1,2,…,6 is the number of the product magnetometer sensor, k=7,8,…,12 is the number of the background magnetometer sensor; The linear regression equation in the Z direction is expressed as: B Z (r i )=β(r k )A z (r i )+b Z (r i )+e A Z (r i ) represents the regression coefficient vector in the Z direction; B(r k ) represents the background measurement value of the background magnetometer sensor at the same time in all directions; β Z (r i ) represents the intercept in the Z direction; ε is the error term; i=1,2,…,6 is the serial number of the product magnetometer sensor, and k=7,8,…,12 is the serial number of the background magnetometer sensor.

7. The method according to claim 3, characterized in that The expression of the background magnetic field interference in the X direction is: represents the background magnetic field interference in the X direction, represents the measurement value of the background magnetometer sensor, A X (r i ) represents the regression coefficient vector in the X direction; β x (r i ) represents the intercept in the X direction; The expression of the background magnetic field interference in the Y direction is: represents the background magnetic field interference in the Y direction, represents the measurement value of the background magnetometer sensor, A Y (r i ) represents the regression coefficient vector in the Y direction; β Y (r i ) represents the intercept in the Y direction; The expression of the background magnetic field interference in the Z direction is: represents the background magnetic field interference in the Z direction, represents the measurement value of the background magnetometer sensor, A Z (r i ) represents the regression coefficient vector in the Z direction; β z (r i ) represents the intercept in the Z direction.

8. The method according to claim 3, characterized in that The expression of the true magnetic induction intensity in the X direction is: represents the real magnetic induction intensity in the X direction, Indicates the measurement value of the product's magnetometer sensor in the X direction, Indicates the background magnetic field interference in the X direction; The expression of the true magnetic induction intensity in the Y direction is: Indicates the true magnetic induction intensity in the Y direction, Indicates the measurement value of the product's magnetometer sensor in the Y direction, Indicates the background magnetic field interference in the Y direction; The expression of the true magnetic induction intensity in the Z direction is: Indicates the true magnetic induction intensity in the Z direction, Indicates the measurement value of the product's magnetometer sensor in the Z direction, Represents the background magnetic field interference in the Z direction.

9. An electronic device, characterized in that: The method comprises a memory and a processor, wherein the memory stores instructions, and when the instructions are called by the processor, the processor executes the method according to any one of claims 1 to 8.

10. A storage medium, characterized in that: The method comprises computer program instructions, wherein the computer program instructions are used to cause a computer to execute the method according to any one of claims 1 to 8.

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