A polishing device for thickness gauge production

Abstract

The present invention relates to the technical field of equipment polishing. The present invention discloses a polishing device for producing thickness gauges, including a polishing machine, wherein a rotatable outer rotating disk is installed on the upper end of the polishing machine, a stationary inner fixed disk is installed inside the outer rotating disk, a polishing belt for polishing is arranged inside the inner fixed disk, and a clamping part is also installed on the upper end of the polishing machine, wherein the clamping part has a telescopic effect and is used to clamp the thickness gauge and fit it on the polishing belt; a wavy ring layer is fixed on the inner side of the outer rotating disk, and the wavy ring layer is used to control the undulating movement of the thickness gauge on the polishing belt. The present invention uses a wavy rod to rise and fall along the wavy ring layer, so that the thickness gauge can be separated from the polishing belt at intervals, and the original polishing liquid on the opposite surface of the thickness gauge and the polishing belt is flushed away, and the new polishing liquid is located between the thickness gauge and the polishing belt, so that the effective components in the polishing liquid are maintained, and impurities and abrasive debris are flushed away, and the polishing liquid fully acts on the surface of the thickness gauge.

Description

Technical Field

[0001] The invention relates to the technical field of equipment polishing, in particular to a polishing device for thickness gauge production. Background Art

[0002] The main function of the thickness gauge is to measure and inspect. It is also called a feeler gauge or a gap gauge. It is a sheet gauge used to inspect the size of the gap between two joint surfaces. The main function of the thickness gauge is to check the gap or gap size between two joint surfaces. This is particularly important in the fields of benchwork, automobile repair, etc. By selecting a suitable gauge (ruler) and inserting it into the gap, the size of the gap can be read intuitively.

[0003] Polishing the thickness gauge is a delicate process. It is necessary to ensure that the polished surface is flat, smooth and scratch-free. Since the thickness gauge has a relatively high precision, it is necessary to apply uniform force during the polishing process to avoid excessive wear. When polishing, apply an appropriate amount of polishing liquid on the polishing cloth, then wrap the polishing cloth on the thickness gauge and polish it with a polishing machine or manually. It is difficult to polish the entire surface of the thickness gauge together using a polishing machine or manually, resulting in a certain difference in thickness at different positions of the thickness gauge, which will affect the accuracy when testing precision instruments;

[0004] During the thickness gauge polishing process, it is impossible to detect the thickness of the entire surface at the same time. The range of equipment for thickness detection is limited, resulting in differences in accuracy at different positions during polishing.

[0005] There is also the problem that polishing liquid is added during the polishing of the thickness gauge. The polishing liquid needs to be located between the thickness gauge and the polishing setting. Machine polishing can polish the entire surface of the thickness gauge, but during the polishing process, it is difficult to add the polishing liquid between the thickness gauge and the polishing setting. At the same time, as the polishing process proceeds, the effective ingredients in the polishing liquid will gradually be consumed. At the same time, some impurities and abrasive chips will also accumulate in the polishing liquid. The impurities and abrasive chips need to be cleaned up. For the machine, it needs to control the thickness gauge for polishing, and it also needs to clean up the impurities and abrasive chips, which is difficult. Summary of the invention

[0006] The object of the present invention is to provide a polishing device for thickness gauge production to solve the problems raised in the above-mentioned background technology.

[0007] In order to solve the above technical problems, the present invention provides the following technical solutions: A polishing device for thickness gauge production, comprising a polishing machine, wherein a rotatable outer rotating disk is installed at the upper end of the polishing machine, a stationary inner fixed disk is installed inside the outer rotating disk, a polishing belt for polishing is arranged inside the inner fixed disk, and a clamping part is also installed at the upper end of the polishing machine, wherein the clamping part has a telescopic effect and is used to clamp the thickness gauge and fit it on the polishing belt;

[0008] A wave layer is fixed on the inner side of the outer rotating disk, and the wave layer is used to control the undulating movement of the thickness gauge on the polishing belt.

[0009] Furthermore, the inner fixed disk and the outer rotating disk have axes that coincide with each other and fit closely together. A fixed shaft is fixed to the upper end of the inner fixed disk, and the outer end of the fixed shaft is inserted into the polishing machine to fix the inner fixed disk.

[0010] Furthermore, a polishing cavity is provided on the inner fixed disk, a driving source is installed inside the inner fixed disk, two rotating shafts extend from the outside of the driving source, the polishing belt transmission is installed between the two rotating shafts, and the two rotating shafts are used to drive the polishing belt to run.

[0011] Furthermore, a liquid infusion tube is fixed to the upper end of the inner fixed plate, the end of the liquid infusion tube faces the polishing belt, and the liquid infusion tube is used to transport the polishing liquid.

[0012] Furthermore, the clamping part includes a fixed part and a moving part, the fixed part is detachably arranged for removing the moving part and the thickness gauge, and the moving part has telescopic elasticity for controlling the extrusion of the thickness gauge and the polishing belt.

[0013] Furthermore, the fixing part includes a support sleeve, a threaded shaft, a first buckling sheet metal and a second buckling sheet metal;

[0014] The threaded shaft sleeve is arranged in the support sleeve, and the threaded shaft is threadedly connected to the upper end surface of the polishing machine, and the threaded shaft is rotated into the polishing machine so that the support sleeve is limited at the upper end of the polishing machine;

[0015] The snap-fit ​​sheet metal 1 is fixed to the support sleeve, and the snap-fit ​​sheet metal 2 is snap-fitted to the outside of the snap-fit ​​sheet metal 1. The snap-fit ​​sheet metal 2 is used for up and down adjustment. The outer end of the snap-fit ​​sheet metal 2 is threadedly connected with a fixing bolt, and the fixing bolt passes through the snap-fit ​​sheet metal 2 and abuts against the snap-fit ​​sheet metal 1, so as to fix the snap-fit ​​sheet metal 2.

[0016] Further, the moving part includes a sleeve 1, an inner support spring, a sleeve 2 and a clamping assembly;

[0017] The first sleeve is fixed to the second buckled sheet metal, the second sleeve is slidably sleeved in the first sleeve, the inner support spring is located in the first sleeve, and the inner support spring is used to support the second sleeve;

[0018] The clamping assembly is arranged at the lower end of the second sleeve and is used for clamping the thickness gauge.

[0019] Furthermore, an inner channel is integrally formed on the inner side of the first sleeve, and an outer channel cooperating with the inner channel is formed on the outer side of the second sleeve, and the inner channel and the outer channel are respectively convex and concave.

[0020] Furthermore, the clamping assembly includes a clamping rod, a clamping plate, a clamping block and a clamping spring;

[0021] A clamping opening is provided at the lower end of the second sleeve, and two groups of clamping plates are provided. The two groups of clamping plates are fixed in the second sleeve, and the two groups of clamping plates are respectively located on both sides of the clamping opening. Two groups of clamping rods, clamping blocks and clamping springs are also provided. The clamping rods are fixed at the lower end of the clamping blocks, and the clamping blocks are slidably arranged between the two groups of clamping plates. The clamping springs are fixed on the outside of the clamping blocks. The two groups of clamping rods, clamping blocks and clamping springs are symmetrically arranged so that the two groups of clamping rods clamp the thickness gauge.

[0022] Furthermore, an installation box is fixed to the outside of the second sleeve, and a wavy rod is transversely arranged in the installation box. The wavy rod slides in the installation box and is used to slide in the up and down directions. The wavy rod extends transversely to the wavy ring layer. The wavy ring layer rotates to drive the wavy rod to move up and down, and causes the second sleeve to move up and down.

[0023] Compared with the prior art, the beneficial effects achieved by the present invention are:

[0024] 1. The wave rod rises and falls along the wave layer, and the thickness gauge can be separated from the polishing belt at intervals, so that the original polishing liquid on the opposite surface of the thickness gauge and the polishing belt is flushed away. The new polishing liquid is located between the thickness gauge and the polishing belt, so that the effective ingredients in the polishing liquid are maintained, and impurities and grinding chips are flushed away, so that the polishing liquid fully acts on the surface of the thickness gauge.

[0025] 2. The movement direction of the polishing belt is perpendicular to the thickness gauge and contacts the entire end surface of the thickness gauge to ensure that the entire end surface of the thickness gauge is polished to avoid differences in thickness at different positions of the thickness gauge.

[0026] 3. The clamping part can be completely removed to directly observe the polishing degree of the thickness gauge, adjust the matching degree of the buckled sheet metal 1 and the buckled sheet metal 2, and compress the internal support spring to adjust the extrusion force when polishing the thickness gauge to ensure the accuracy of the thickness gauge.

[0027] 4. The folding rod can move up and down in the installation box and has an adjustable state. When the thickness gauges of different thicknesses are clamped, the folding rod is still located on the wave circle layer to ensure the ups and downs movement. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0029] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0030] Figure 2 It is a schematic diagram of the structure of the outer rotating disk and the inner fixed disk of the present invention;

[0031] Figure 3 It is a schematic diagram of a half-section structure of an outer rotating disk and an inner fixed disk of the present invention;

[0032] Figure 4 It is a schematic diagram of the planar structure of the clamping part of the present invention;

[0033] Figure 5 It is a schematic diagram of the partial exploded structure of the clamping part of the present invention;

[0034] Figure 6 It is a schematic diagram of the two-half section structure of the casing of the present invention;

[0035] Figure 7 It is a schematic diagram of the structure of the clamping assembly of the present invention.

[0036] In the figure: 1. polishing machine; 2. outer rotating disk; 21. wave ring layer; 3. inner fixed disk; 31. fixed shaft; 32. polishing chamber; 33. driving source; 34. rotating shaft; 35. polishing belt; 4. clamping part; 41. supporting sleeve; 42. threaded shaft; 43. buckling sheet metal one; 44. buckling sheet metal two; 45. fixing bolt; 46. sleeve one; 47. inner support spring; 48. sleeve two; 49. inner channel; 401. outer channel; 5. infusion tube; 6. clamping assembly; 61. clamping rod; 62. clamping mouth; 63. clamping plate; 64. clamping block; 65. clamping spring; 7. wavy rod; 71. installation box. DETAILED DESCRIPTION

[0037] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0038] See also Figure 1-Figure 7 The present invention provides a technical solution: during the polishing process of the thickness gauge, uniform force needs to be applied, and the applied force needs to be precisely controlled. During polishing, the entire surface of the thickness gauge needs to be polished together to avoid affecting the accuracy of the thickness gauge. In addition, when the thickness is polished by machine, it is necessary to avoid always keeping the polishing state. The thickness gauge needs to be separated for observation and polishing liquid is added. A polishing device for thickness gauge production is proposed, such as Figure 1As shown, it includes a polishing machine 1, a rotatable outer rotating disk 2 is installed on the upper end of the polishing machine 1, a stationary inner fixed disk 3 is installed inside the outer rotating disk 2, a polishing belt 35 for polishing is arranged inside the inner fixed disk 3, and a clamping part 4 is also installed on the upper end of the polishing machine 1. The clamping part 4 has a telescopic effect, and is used to clamp the thickness gauge and fit it on the polishing belt 35, squeeze one side of the thickness gauge with the polishing belt 35, and polish the thickness gauge. The clamping part 4 realizes the clamping effect and controls the squeezing force of the thickness gauge. It should be noted that the polishing belt 35 is a diamond polishing belt, which can realize transmission and polishing at the same time, so as to realize high-precision and high-efficiency polishing;

[0039] like Figure 3 As shown, the thickness gauge needs to be separated from the polishing belt 35, and polishing liquid needs to be added. A wavy ring layer 21 is fixed on the inner side of the outer rotating disk 2. The wavy ring layer 21 is used to control the undulating movement of the thickness gauge on the polishing belt 35, so that the thickness gauge can be separated from the polishing belt 35, and polishing liquid is added between the thickness gauge and the polishing belt 35. It should be noted that the polishing liquid plays multiple roles in the polishing process, such as lubrication, cooling, cleaning and chemical reaction. It can help remove the unevenness and oxide layer on the surface of the workpiece to make the surface smoother. As the polishing process proceeds, the effective ingredients in the polishing liquid will gradually be consumed, and at the same time, some impurities and abrasives will accumulate in the polishing liquid, and new polishing liquid needs to be added.

[0040] Although the polishing liquid can penetrate into the contact area through the micropores or surface of the polishing belt 35 and react with the surface of the thickness gauge, the thickness gauge is precise and in order to avoid excessive wear, the polishing belt 35 is also made relatively smooth, so the amount of penetration is limited, which can easily affect the polishing quality of the polishing belt 35.

[0041] like Figure 3 As shown, the axis of the inner fixed disk 3 coincides with that of the outer rotating disk 2, and the two are in close contact. A fixed shaft 31 is fixed to the upper end of the inner fixed disk 3, and the outer end of the fixed shaft 31 is inserted into the polishing machine 1 to fix the inner fixed disk 3 and keep the inner fixed disk 3 fixed while the outer rotating disk 2 rotates.

[0042] like Figure 3 As shown, a polishing cavity 32 is also provided on the inner fixed disk 3, a driving source 33 is installed inside the inner fixed disk 3, two rotating shafts 34 extend from the outside of the driving source 33, and a polishing belt 35 is transmission-installed between the two rotating shafts 34. The two rotating shafts 34 are used to drive the polishing belt 35 to run and realize the driving force. The driving source 33 is a motor to transmit the polishing belt 35.

[0043] like Figure 3As shown, in order to transfer the polishing liquid to the polishing belt 35, an infusion tube 5 is also fixed to the upper end of the inner fixed plate 3, and the end of the infusion tube 5 faces the polishing belt 35. The infusion tube 5 is used to transport the polishing liquid, and the polishing liquid is transferred to the polishing belt 35 through the action of a water pump.

[0044] like Figure 5 As shown, in order to facilitate the removal of the thickness gauge for observation, the clamping part 4 needs to be removed, and when the thickness gauge is polished, the thickness gauge and the polishing belt 35 need to be squeezed to control the squeezing force of the thickness gauge. The clamping part 4 includes a fixed part and a moving part. The fixed part is detachably arranged to remove the moving part and the thickness gauge. The moving part has telescopic elasticity to control the squeezing of the thickness gauge and the polishing belt 35.

[0045] like Figure 5 As shown, the fixed part includes a support sleeve 41, a threaded shaft 42, a buckling sheet metal 1 43 and a buckling sheet metal 2 44;

[0046] The threaded shaft 42 is sleeved in the support sleeve 41, and the threaded shaft 42 is threadedly connected to the upper end surface of the polishing machine 1. The threaded shaft 42 rotates into the polishing machine 1, so that the support sleeve 41 is limited at the upper end of the polishing machine 1, so that the support sleeve 41 can be disassembled and is easy to install under the action of the threaded shaft 42;

[0047] The snap-fit ​​sheet metal 1 43 is fixed to the support sleeve 41, and the snap-fit ​​sheet metal 2 44 is snap-fitted to the outer side of the snap-fit ​​sheet metal 1 43. The snap-fit ​​sheet metal 2 44 is used for up and down adjustment. The outer end of the snap-fit ​​sheet metal 2 44 is threadedly connected with a fixing bolt 45, and the fixing bolt 45 passes through the snap-fit ​​sheet metal 2 44 and abuts against the snap-fit ​​sheet metal 1 43, and is used to fix the snap-fit ​​sheet metal 2 44. The snap-fit ​​sheet metal 1 43 cooperates with the snap-fit ​​sheet metal 2 44 to enable the snap-fit ​​sheet metal 2 44 to slide up and down, thereby changing the position of the moving part, thereby squeezing the thickness gauge and the polishing belt 35.

[0048] like Figure 5 As shown, the moving part includes a sleeve 1 46, an inner support spring 47, a sleeve 2 48 and a clamping assembly 6;

[0049] The sleeve 1 46 is fixed to the buckled sheet metal 2 44, and the sleeve 2 48 is slidably sleeved in the sleeve 1 46. The inner support spring 47 is located in the sleeve 1 46. The inner support spring 47 is used to support the sleeve 2 48. Under the action of the inner support spring 47, the sleeve 1 46 and the sleeve 2 48 have telescopic elasticity. After the degree of matching between the buckled sheet metal 1 43 and the buckled sheet metal 2 44 changes, the distance between the clamping component 6 and the polishing belt 35 remains unchanged, and the extrusion degree of the inner support spring 47 changes, so that the extrusion force between the polishing belt 35 and the thickness gauge changes, and the extrusion degree of the thickness gauge is controlled, thereby achieving precise control;

[0050] The clamping assembly 6 is arranged at the lower end of the sleeve 48 and is used to clamp the thickness gauge.

[0051] like Figure 5 As shown, an inner track 49 is integrally formed on the inner side of the first sleeve 46, and an outer track 401 cooperating with the inner track 49 is formed on the outer side of the second sleeve 48. The inner track 49 and the outer track 401 are respectively convex and concave to avoid rotation and ensure that the thickness gauge is perpendicular to the polishing belt 35.

[0052] like Figure 6 and Figure 7 As shown, the clamping assembly 6 includes a clamping rod 61, a clamping plate 63, a clamping block 64 and a clamping spring 65;

[0053] A clamping opening 62 is provided at the lower end of the second sleeve 48, and two groups of clamping plates 63 are provided. The two groups of clamping plates 63 are fixed in the second sleeve 48, and the two groups of clamping plates 63 are respectively located on both sides of the clamping opening 62. There are also two groups of clamping rods 61, clamping blocks 64 and clamping springs 65. The clamping rod 61 is fixed at the lower end of the clamping block 64, and the clamping block 64 is slidably set between the two groups of clamping plates 63. The clamping spring 65 is fixed on the outside of the clamping block 64. The two groups of clamping rods 61, clamping blocks 64 and clamping springs 65 are symmetrically arranged, so that the two groups of clamping rods 61 clamp the thickness gauge.

[0054] like Figure 7 As shown, a mounting box 71 is also fixed to the outer side of the sleeve 48, and a wavy rod 7 is transversely arranged in the mounting box 71. The wavy rod 7 slides in the mounting box 71 and is used to slide in the up and down directions. The wavy rod 7 extends transversely to the wavy ring layer 21, and the wavy ring layer 21 rotates to drive the wavy rod 7 to move up and down, and the sleeve 48 moves up and down. It should be noted that the different thicknesses of the thickness gauges make the distance between the clamping rod 61 and the polishing belt 35 different, and the wavy rod 7 needs to always rest on the outer side of the wavy ring layer 21, wherein the wavy rod 7 can be located in the mounting box 71 and move up and down to a certain extent, even if the clamping rod 61 clamps different thickness gauges, the wavy rod 7 can still rest on the upper end of the wavy ring layer 21. It should also be noted that the undulating height of the wavy ring layer 21 is greater than the height of the mounting box 71, to ensure that the clamping rod 61 can push the mounting box 71 upward when it fluctuates.

[0055] The working principle of the present invention is as follows: the thickness gauge is clamped between two clamping rods 61, and the clamping part 4 is adjusted to squeeze the thickness gauge and the polishing belt 35, and the polishing belt 35 is controlled to be transmitted under the action of the driving source 33 to polish the thickness gauge.

[0056] The outer rotating disk 2 rotates, and the inner wavy circle layer 21 rotates, so that the wavy rod 7 rises and falls along the wavy circle layer 21, and the sleeve 2 48 in the clamping assembly 6 is controlled to rise and fall, so that the thickness gauge can be separated from the polishing belt 35 at intervals, and the polishing liquid can enter between the thickness gauge and the polishing belt 35. When the fluidity of the polishing liquid is large, the original polishing liquid on the opposite surface of the thickness gauge and the polishing belt 35 can be flushed away, so that the new polishing liquid is located between the thickness gauge and the polishing belt 35, so that the effective ingredients in the polishing liquid are maintained, and impurities and grinding chips are flushed away. If polishing is performed directly, since the thickness gauge is relatively precise, it is difficult to move the external polishing liquid between the thickness gauge and the polishing belt 35, and the polishing liquid cannot fully act on the surface of the thickness gauge. Long-term continuous contact and friction may cause scratches, pits or microcracks on the surface of the thickness gauge.

[0057] Secondly, during polishing, the movement direction of the polishing belt 35 is perpendicular to the thickness gauge and contacts the entire end surface of the thickness gauge, ensuring that the entire end surface of the thickness gauge is polished to avoid thickness differences at different positions of the thickness gauge.

[0058] In addition, by removing the threaded shaft 42, the clamping part 4 can be completely removed, which is convenient for directly observing the polishing degree of the thickness gauge. The threaded shaft 42 is tightened, the clamping part 4 is completely installed, and other positions remain unchanged. The thickness gauge continues to be polished, which is convenient for observing the thickness gauge at all times to avoid damage to the thickness gauge.

[0059] By adjusting the degree of fit between the snap-fit ​​sheet metal 1 43 and the snap-fit ​​sheet metal 2 44, the moving part of the clamping part 4 can be moved up and down to achieve adjustment. It is fastened by the fixing bolt 45. The internal support spring 47 is used to control the telescopic state of the sleeve 1 46 and the sleeve 2 48. Since the forces interact with each other, the snap-fit ​​sheet metal 2 44 drives the sleeve 1 46 to move downward, the thickness gauge and the polishing belt 35 are squeezed, and the internal support spring 47 is compressed. The squeezing force between the thickness gauge and the polishing belt 35 will increase. On the contrary, the squeezing force between the thickness gauge and the polishing belt 35 will decrease. The squeezing force can be adjusted when the thickness gauge is polished to ensure the accuracy of the thickness gauge.

[0060] The folding rod 7 can be located in the installation box 71 and move up and down, and has an adjustable state. When a thickness gauge with a larger thickness is clamped in the clamping assembly 6, the distance between the clamping rod 61 and the polishing belt 35 will increase, so that the sleeve 2 48 will move upward to a certain extent, and the folding rod 7 will slide downward along the installation box 71 for a distance, keeping the folding rod 7 in contact with the upper end surface of the wave circle layer 21. When passing the upward undulating point of the wave circle layer 21, the folding rod 7 is pushed upward and against the inner wall of the upper end of the installation box 71, pushing the entire installation box 71 and the sleeve 2 48 upward, thereby completing the separation of the thickness gauge and the polishing belt 35. Therefore, even when thickness gauges of different thicknesses are clamped, the folding rod 7 is still located on the wave circle layer 21 to ensure the undulating movement.

[0061] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0062] Finally, it should be noted that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A polishing device for thickness gauge production, comprising a polishing machine (1), characterized in that: The polishing machine (1) has a rotatable outer rotating disk (2) mounted on its upper end, a stationary inner fixed disk (3) mounted inside the outer rotating disk (2), a polishing belt (35) for polishing being arranged inside the inner fixed disk (3), and a clamping portion (4) mounted on the upper end of the polishing machine (1), the clamping portion (4) having a telescopic function and being used to clamp the thickness gauge and fit it onto the polishing belt (35); A wave layer (21) is fixed on the inner side of the outer rotating disk (2), and the wave layer (21) is used to control the thickness gauge to move up and down on the polishing belt (35); The clamping portion (4) comprises a fixed portion and a moving portion, the fixed portion being detachably arranged and used for removing the moving portion and the thickness gauge, the moving portion having telescopic elasticity and used for controlling the extrusion of the thickness gauge and the polishing belt (35); The fixing part comprises a support sleeve (41), a threaded shaft (42), a first buckling sheet metal (43) and a second buckling sheet metal (44); The threaded shaft (42) is sleeved in the support sleeve (41), and the threaded shaft (42) is threadedly connected to the upper end surface of the polishing machine (1). The threaded shaft (42) is rotated into the polishing machine (1) so that the support sleeve (41) is limited at the upper end of the polishing machine (1); The first buckling sheet metal (43) is fixed to the support sleeve (41), the second buckling sheet metal (44) is buckled on the outer side of the first buckling sheet metal (43), the second buckling sheet metal (44) is used for upward and downward adjustment, the outer end of the second buckling sheet metal (44) is threadedly connected with a fixing bolt (45), the fixing bolt (45) passes through the second buckling sheet metal (44) and abuts against the first buckling sheet metal (43), and is used to fix the second buckling sheet metal (44); The moving part comprises a sleeve 1 (46), an inner support spring (47), a sleeve 2 (48) and a clamping assembly (6); The first sleeve (46) is fixed to the second buckled sheet metal (44), the second sleeve (48) is slidably sleeved in the first sleeve (46), the inner support spring (47) is located in the first sleeve (46), and the inner support spring (47) is used to support the second sleeve (48); The clamping assembly (6) is arranged at the lower end of the second sleeve (48) and is used to clamp the thickness gauge.

2. The polishing equipment for thickness gauge production according to claim 1 is characterized in that: The inner fixed disk (3) and the outer rotating disk (2) have axes that coincide with each other and fit closely together; a fixed shaft (31) is fixed to the upper end of the inner fixed disk (3); the outer end of the fixed shaft (31) is inserted into the polishing machine (1) to fix the inner fixed disk (3).

3. The polishing equipment for thickness gauge production according to claim 1 is characterized in that: A polishing cavity (32) is also provided on the inner fixed disk (3). A driving source (33) is installed inside the inner fixed disk (3). Two rotating shafts (34) extend from the outside of the driving source (33). The polishing belt (35) is installed between the two rotating shafts (34). The two rotating shafts (34) are used to drive the polishing belt (35) to run.

4. The polishing equipment for thickness gauge production according to claim 1 is characterized in that: A liquid infusion tube (5) is also fixed to the upper end of the inner fixed plate (3), the end of the liquid infusion tube (5) faces the polishing belt (35), and the liquid infusion tube (5) is used to transport polishing liquid.

5. The polishing equipment for thickness gauge production according to claim 1 is characterized in that: The first sleeve (46) has an inner channel (49) integrally formed on its inner side, and the second sleeve (48) has an outer channel (401) formed on its outer side to match the inner channel (49), wherein the inner channel (49) and the outer channel (401) are convex and concave, respectively.

6. The polishing equipment for thickness gauge production according to claim 1 is characterized in that: The clamping assembly (6) comprises a clamping rod (61), a clamping plate (63), a clamping block (64) and a clamping spring (65); A clamping opening (62) is provided at the lower end of the second sleeve (48), and two groups of clamping plates (63) are provided. The two groups of clamping plates (63) are fixed in the second sleeve (48), and the two groups of clamping plates (63) are respectively located on both sides of the clamping opening (62). Two groups of clamping rods (61), clamping blocks (64) and clamping springs (65) are also provided. The clamping rods (61) are fixed at the lower end of the clamping blocks (64), and the clamping blocks (64) are slidably arranged between the two groups of clamping plates (63). The clamping springs (65) are fixed on the outer sides of the clamping blocks (64). The two groups of clamping rods (61), clamping blocks (64) and clamping springs (65) are symmetrically arranged so that the two groups of clamping rods (61) clamp the thickness gauge.

7. The polishing equipment for thickness gauge production according to claim 1 is characterized in that: A mounting box (71) is also fixed on the outer side of the second sleeve (48). A wavy rod (7) is transversely arranged in the mounting box (71). The wavy rod (7) slides in the mounting box (71) and is used to slide in the up and down directions. The wavy rod (7) extends transversely to the wavy ring layer (21). The wavy ring layer (21) rotates to drive the wavy rod (7) to move up and down, and the second sleeve (48) to move up and down.

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