Electromagnetic compatibility comprehensive test system

Abstract

The electromagnetic compatibility comprehensive test system provided by the embodiment of the invention comprises a direct-current voltage source, a combined wave generator, waveform detection equipment, a correction circuit and a control module, in the correction mode, the control module controls the combination wave generator to be connected to the correction circuit for correction test, and meanwhile, waveform information is used for determining correction parameters of the combination wave generator; wherein the correction parameter represents a test deviation degree caused by an error of the combined wave generator; and in the actual measurement mode, the control module controls the combined wave generator to be connected to the tested equipment to perform a surge immunity test to obtain an initial test result, and the control module determines a corrected test result according to the correction parameter and the initial test result to complete an electromagnetic compatibility comprehensive test. According to the invention, the correction circuit is arranged, one-time online correction is carried out before each test, correction parameters are measured, and the result obtained in the actual measurement process is corrected, so that the influence of errors on the electromagnetic compatibility comprehensive test result is avoided.

Description

Technical Field

[0001] The invention belongs to the technical field of power electronics, and in particular relates to an electromagnetic compatibility comprehensive testing system. Background Art

[0002] With the continuous development of semiconductor technology and electronic technology, electronic equipment has gradually tended to be miniaturized and highly integrated, which has increased the electromagnetic sensitivity of electronic components and reduced their overvoltage resistance. Transient overvoltage (or current) caused by switching and operating overvoltage can cause direct or indirect damage to electronic equipment and semiconductor devices. Surge protection devices are widely used in circuits to protect circuits because of their ability to limit overvoltage and release current. Therefore, surge (impact) immunity tests are used to test the performance of these electronic equipment and protection devices when they are subjected to surge (impact) overvoltage, which provides a guarantee for the safe use of these devices. In the field of electromagnetic compatibility (EMC), the unipolar surge simulation generator caused by switching and transient overvoltage is called a combination wave generator (CWG). The standard surge wave of the combination wave generator is defined by an open circuit voltage waveform and a short circuit current waveform.

[0003] The combination wave generator or surge generator is the main standard for implementing surge tests. In order to ensure the quality of the surge generator and its accuracy and reliability during use, it is very necessary to calibrate it scientifically and effectively. Therefore, it is particularly important to study the calibration method of the surge generator and design the corresponding automatic calibration system.

[0004] Since the calibration process is relatively complicated, it usually requires the calibration of hundreds of parameters, and manual debugging and repeated calculations are required to complete a complete test process. Therefore, in the prior art, the combination wave generator is usually calibrated once every few months or years. If errors occur in this process, it will affect the electromagnetic test and cause inaccurate tests. Summary of the invention

[0005] In view of this, the present invention provides an electromagnetic compatibility comprehensive test system, aiming to solve the problem that the prior art cannot perform online calibration, resulting in inaccurate testing.

[0006] A first aspect of the present invention provides an electromagnetic compatibility comprehensive test system, comprising: a DC voltage source, a combination wave generator, a waveform detection device, a correction circuit and a control module;

[0007] The DC voltage source is connected to the combination wave generator; the waveform detection device is connected to the control module; the control module is connected to the combination wave generator and the correction circuit;

[0008] The control module is provided with a calibration mode and a measurement mode;

[0009] In the correction mode, the control module controls the combination wave generator to connect to the correction circuit for correction test, and the waveform detection device records the waveform information of the actual surge wave generated. The control module determines the correction parameter of the combination wave generator according to the recorded waveform information; wherein the correction parameter indicates the degree of test deviation caused by the error of the combination wave generator;

[0010] In the actual measurement mode, the control module controls the combination wave generator to connect to the test equipment to perform a surge immunity test and obtain the initial test results. The control module determines the corrected test results based on the correction parameters and the initial test results to complete the comprehensive electromagnetic compatibility test.

[0011] In a possible implementation, in the calibration mode, the control module is used to:

[0012] The control combination wave generator is connected to the correction circuit;

[0013] Controlling the combination wave generator to perform open circuit voltage test and short circuit current test in sequence, and measuring the open circuit voltage under preset working conditions and the short circuit current corresponding to the open circuit voltage;

[0014] According to the open circuit voltage and the short circuit current, the actual surge wave under the preset working condition is determined, and the waveform information of the actual surge wave is recorded.

[0015] In a possible implementation, the waveform information includes wavefront time, pulse duration, pulse amplitude, and adjustment rise time; in the correction mode, the control module is used to:

[0016] The wavefront time, pulse duration, pulse amplitude, and adjustment rise time are input into the neural network to determine the correction parameters.

[0017] In a possible implementation, the method further includes:

[0018] Conduct calibration tests on multiple combination wave generators, record the theoretical surge waves required for each test, and measure the actual surge waves under each test;

[0019] The wavefront time, pulse duration, pulse amplitude, and adjustment rise time of the actual surge wave in each test are used as inputs, and the correction parameters in the test are used as outputs to train the neural network.

[0020] The correction parameters in the test are calculated based on the difference sequence of each waveform information of the theoretical surge wave required for each test and the actual surge wave in each test.

[0021] In a possible implementation, in the actual measurement mode, the control module is used to:

[0022] The control module controls the combination wave generator to be connected to the device under test, and simultaneously connects the waveform detection device to the device under test;

[0023] Control the combined wave generator to apply different target surge waves to the equipment under test, and determine the state of the equipment under test under different target surge waves according to the surge response of the equipment under test recorded by the waveform detection device as the initial test result;

[0024] According to each target surge wave and correction parameter, the correction wave of each target surge wave is determined, and each correction wave and its corresponding state of the tested equipment are used as the corrected test result to complete the comprehensive electromagnetic compatibility test.

[0025] In a possible implementation, in the actual measurement mode, the control module is specifically used to:

[0026] The waveform information of each target surge wave and the corresponding value in the correction parameter are used to obtain the correction value of each waveform information;

[0027] According to the correction value of each waveform information of each target surge wave, each target surge signal is reconstructed to obtain a correction wave of each target surge wave.

[0028] In a possible implementation, the correction circuit includes a coupling network and a correction resistor.

[0029] In one possible implementation, the combination wave generator includes an energy storage circuit and a combination wave forming circuit; a DC voltage source is connected to the energy storage circuit; the energy storage circuit is connected to the combination wave forming circuit; and the combination wave forming circuit is connected to a correction circuit or a test device.

[0030] In a possible implementation, the energy storage circuit and the combined wave forming circuit are connected via a mercury switch.

[0031] In a possible implementation, the DC voltage source is a 0-100V DC voltage generating circuit.

[0032] An electromagnetic compatibility comprehensive test system provided by an embodiment of the present invention comprises: a direct current voltage source, a combination wave generator, a waveform detection device, a correction circuit and a control module; the direct current voltage source is connected to the combination wave generator; the waveform detection device is connected to the control module; the control module is connected to the combination wave generator and the correction circuit; the control module is provided with a correction mode and a measurement mode; in the correction mode, the control module controls the combination wave generator to be connected to the correction circuit for a correction test, and the waveform detection device records the waveform information of the actual surge wave generated, and the control module determines the correction parameter of the combination wave generator according to the recorded waveform information; wherein the correction parameter indicates the degree of test deviation caused by the error of the combination wave generator; in the measurement mode, the control module controls the combination wave generator to be connected to the tested device for a surge immunity test, obtains the initial test result, and the control module determines the corrected test result according to the correction parameter and the initial test result, and completes the electromagnetic compatibility comprehensive test. The present invention performs an online correction before each test by setting a correction circuit, measures the correction parameter, and corrects the result obtained in the measurement process by using it, so as to avoid the error affecting the electromagnetic compatibility comprehensive test result. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0034] Figure 1 It is a schematic diagram of the structure of an electromagnetic compatibility comprehensive test system provided by an embodiment of the present invention;

[0035] Figure 2 is a schematic diagram of the structure of a correction circuit provided by an embodiment of the present invention;

[0036] Figure 3 It is a schematic diagram of the structure of a combination wave generator provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0037] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present invention. However, it should be clear to those skilled in the art that the present invention may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present invention.

[0038] Figure 1Schematic diagram of the structure of the electromagnetic compatibility comprehensive test system provided by the embodiment of the present invention. Figure 1 As shown, the electromagnetic compatibility comprehensive test system includes: a DC voltage source 11, a combination wave generator 12, a waveform detection device 13, a correction circuit 14 and a control module 15.

[0039] The DC voltage source 11 is connected to the combination wave generator 12 ; the waveform detection device 13 is connected to the control module 15 ; the control module 15 is connected to the combination wave generator 12 and the correction circuit 14 .

[0040] The control module 15 is provided with a calibration mode and a measurement mode;

[0041] In the correction mode, the control module 15 controls the combination wave generator 12 to connect to the correction circuit 14 to perform a correction test, and the waveform detection device 13 records the waveform information of the actual surge wave generated. The control module 15 determines the correction parameters of the combination wave generator 12 according to the recorded waveform information; wherein the correction parameters represent the degree of test deviation caused by the error of the combination wave generator 12;

[0042] In the actual measurement mode, the control module 15 controls the combination wave generator 12 to connect to the test equipment to perform a surge immunity test to obtain initial test results. The control module 15 determines the corrected test results based on the correction parameters and the initial test results to complete the comprehensive electromagnetic compatibility test.

[0043] In the embodiment of the present invention, the waveform detection device 13 can be an oscilloscope, a video waveform monitor, etc., which is not limited here. The control module 15 includes a calculation unit and an execution unit. The calculation unit is used to complete the above-mentioned waveform information recording, correction parameter calculation, test result correction and other operations, and the execution unit completes the execution operations such as device connection by controlling devices such as switches.

[0044] Figure 2 1 is a schematic diagram of the structure of the correction circuit 14 provided in an embodiment of the present invention. Figure 2 As shown, in some embodiments, the correction circuit 14 includes a coupling network and a correction resistor.

[0045] Figure 2 In the correction circuit shown in the figure, CA and CB connected in parallel form a coupling network, and Rn is a correction resistor. When the switch is connected to the b end, the oscilloscope is connected to both ends of Rn to measure the open circuit voltage. When the switch is connected to the a end, the oscilloscope is connected to both ends of the switch to measure the short circuit current. Figure 2 The correction current in the embodiment is only an example of the present invention and is not intended to be limiting. The structure is replaceable. For example, the coupling network can be adaptively changed to a coupling network composed of capacitors and resistors to simulate the common mode coupling impedance.

[0046] Figure 3Schematic diagram of the structure of the combination wave generator provided by the embodiment of the present invention. Figure 3 As shown, in some embodiments, the combination wave generator 12 includes an energy storage circuit and a combination wave forming circuit; the DC voltage source 11 is connected to the energy storage circuit; the energy storage circuit is connected to the combination wave forming circuit; and the combination wave forming circuit is connected to the correction circuit 14 or the device under test.

[0047] In some embodiments, the energy storage circuit and the combined wave forming circuit are connected via a mercury switch.

[0048] In the embodiment of the present invention, the switch of the present invention is a mercury switch, which has high sensitivity, rapid response, convenient control, and the internal mercury on-off reed is almost free of jitter. It is also miniature, light, highly sensitive, and rapid in response. The maximum opening voltage can reach 500V, but because the instantaneous current of the combination wave generator is too large when the switch is on and off, the mercury wet reed switch will be broken down, so the maximum voltage of the PCB board-level test combination wave generator is limited to 100V. Figure 3 In the combination wave generator shown in the figure, the energy storage circuit is composed of a rectifier diode D, a charging resistor R and an energy storage capacitor C. The rectifier diode D is used to prevent the energy storage circuit from being charged and discharged at the same time and causing harm; the combination wave forming circuit is composed of an impedance matching resistor Rm, pulse duration forming resistors RS1 and RS2, and a rise time forming inductor Lr.

[0049] When the circuit is working, the DC voltage source charges the energy storage capacitor C through the charging resistor R. The voltage across the energy storage capacitor is monitored in real time using a multimeter until the expected voltage value is reached and charging stops. When the switch s is closed, the energy storage capacitor C discharges through the combined wave to form a loop, and the impulse combined wave is output and acts on the device under test on the test board through the transmission line.

[0050] Figure 3 The combination wave generator shown in the figure is a PCB board-level test combination wave generator with a 1.2 / 50μs open-circuit voltage waveform, a 8 / 20μs short-circuit current waveform, and an output impedance of 2Ω.

[0051] Figure 3 The combination wave generator shown in is only an example of the present invention. The present invention may also adopt combination wave generators of other structures, for example, a combination wave generator with an open circuit voltage waveform of 10 / 700 μs and a short circuit current waveform of 5 / 320) μs.

[0052] In some embodiments, the DC voltage source 11 is a 0-100V DC voltage generating circuit.

[0053] In an embodiment of the present invention, the working platform of the present invention is a printed circuit board, and the voltage level of the combined wave waveform is 0-100V (current 0-50A), which is suitable for measuring PCB board-level low-voltage surge protection devices.

[0054] In some embodiments, in the correction mode, the control module 15 is used to: control the combination wave generator 12 to be connected to the correction circuit 14; control the combination wave generator 12 to perform open circuit voltage test and short circuit current test in sequence, and measure the open circuit voltage under preset working conditions and the short circuit current corresponding to the open circuit voltage; determine the actual surge wave under preset working conditions based on the open circuit voltage and the short circuit current, and record the waveform information of the actual surge wave.

[0055] In an embodiment of the present invention, the expected voltage at both ends of the energy storage capacitor is different, and the surge signal generated is also different. Therefore, a multimeter is used to monitor the voltage at both ends of the energy storage capacitor in real time until different expected voltage values ​​are reached as different preset working conditions. Under each working condition, a set of open circuit voltage and short circuit current can be measured, thereby obtaining multiple sets of actual surges. Since the theoretical parameters of each device in the combination wave generator are fixed, when the expected voltage at both ends of the energy storage capacitor is known, the output waveform is theoretically fixed, and then each device usually has random errors, aging, temperature drift, etc., and the output waveform is usually different from the theoretical waveform. The present invention is designed based on this difference to perform correction by the following correction parameters.

[0056] In some embodiments, the waveform information includes wavefront time, pulse duration, pulse amplitude, and adjusted rise time; in the correction mode, the control module 15 is used to: input the wavefront time, pulse duration, pulse amplitude, and adjusted rise time into the neural network to determine the correction parameters.

[0057] In an embodiment of the present invention, the neural network may be a convolutional neural network, a deep learning model, etc., which is not limited herein. Wavefront time: refers to the time for the pulse current to rise to the amplitude. This time determines the rate of change of the current rise over time, that is, the steepness. The steepness has a direct impact on the overvoltage. Pulse duration: refers to the time interval from the start to the end of the pulse waveform. This parameter reflects the duration length of the pulse. Pulse amplitude: refers to the highest value reached by the pulse current. This parameter determines the intensity of the pulse. Adjusting the rise time: In a combination wave generator, adjusting the rise time usually refers to the time for adjusting the pulse waveform from the start to reaching the set amplitude. This parameter can be changed by adjusting the settings of the generator.

[0058] The above waveform information is affected by the performance of each device in the circuit. For example, the smaller the inductance value of the combined wave generator, the shorter the wavefront time and the steeper the wave head; the larger the inductance value, the longer the wavefront time and the gentler the wave head. Therefore, the present invention trains a neural network to learn the relationship between these waveforms and deviations. After the training is completed, it is only necessary to judge the existing deviation based on the waveform, so as to correct the test results. The following is the training process of the neural network.

[0059] In some embodiments, the method further includes: conducting calibration tests on multiple combination wave generators 12, recording the theoretical surge wave required for each test, and measuring the actual surge wave in each test; using the wavefront time, pulse duration, pulse amplitude, and adjustment rise time of the actual surge wave in each test as input, and using the correction parameters in the test as output, to train the neural network; wherein the correction parameters in the test are calculated based on the difference sequence of each waveform information of the theoretical surge wave required for each test and the actual surge wave in each test.

[0060] In an embodiment of the present invention, the wavefront time, pulse duration, pulse amplitude, and adjustment rise time are subtracted from the values ​​in the theoretical surge wave and the actual surge wave to obtain a difference sequence. Each combination wave generator is tested at least twice, that is, each combination wave generator can obtain at least two difference sequences, and then the deviation curves of various waveform information can be fitted based on the values ​​in these difference sequences. Taking the wavefront time as an example, the wavefront time difference is extracted from each difference sequence obtained, and the expected voltage across the energy storage capacitor is used as the horizontal axis, and the wavefront time difference is used as the vertical axis, so as to fit the deviation curve corresponding to the wavefront time. The curve parameters of the deviation curve are the correction parameters corresponding to the wavefront time.

[0061] In some embodiments, in the actual measurement mode, the control module 15 is used for: the control module 15 controls the combination wave generator 12 to connect to the test device, and at the same time connects the waveform detection device 13 to the test device; controls the combination wave generator 12 to apply different target surge waves to the test device, and at the same time determines the state of the test device under different target surge waves according to the surge response of the test device recorded by the waveform detection device 13 as the initial test result; determines the correction wave of each target surge wave according to each target surge wave and correction parameter, and uses each correction wave and its corresponding state of the test device as the corrected test result to complete the comprehensive electromagnetic compatibility test.

[0062] In some embodiments, in the actual measurement mode, the control module 15 is specifically used to: obtain the corrected value of each waveform information of each target surge wave and the corresponding value in the correction parameter; reconstruct each target surge signal according to the corrected value of each waveform information of each target surge wave to obtain the corrected wave of each target surge wave.

[0063] In the embodiment of the present invention, the voltage across the energy storage capacitor in the actual measurement process is input into the curve corresponding to the correction parameter to obtain the deviation of each waveform information, and the corresponding deviation is added to each waveform information of the target surge wave to obtain the correction value of each waveform information. The waveform can be reconstructed according to the correction value. The reconstructed waveform is the actual surge signal input into the device under test.

[0064] It should be understood that the order of execution of the steps in the above embodiment does not necessarily mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the present invention.

[0065] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0066] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0067] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0068] In the embodiments provided by the present invention, it should be understood that the disclosed devices / controllers and methods can be implemented in other ways. For example, the device / controller embodiments described above are only schematic, for example, the division of modules or units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0069] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0070] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0071] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present invention implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. Computer-readable media may include: any entity or device capable of carrying computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), electrical carrier signal, telecommunication signal and software distribution medium, etc.

[0072] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention, and should be included in the protection scope of the present invention.

Claims

1. An electromagnetic compatibility comprehensive test system, characterized in that: include: DC voltage source, combination wave generator, waveform detection equipment, correction circuit and control module; The DC voltage source is connected to the combination wave generator; the waveform detection device is connected to the control module; the control module is connected to the combination wave generator and the correction circuit; The control module is provided with a calibration mode and a measurement mode; In the correction mode, the control module controls the combination wave generator to connect to the correction circuit to perform a correction test, and the waveform detection device records the waveform information of the actual surge wave generated. The control module determines the correction parameter of the combination wave generator according to the recorded waveform information; wherein the correction parameter indicates the degree of test deviation caused by the error of the combination wave generator; In the actual measurement mode, the control module controls the combination wave generator to connect to the test equipment to perform a surge immunity test to obtain an initial test result. The control module determines the corrected test result based on the correction parameters and the initial test result to complete the comprehensive electromagnetic compatibility test.

2. The electromagnetic compatibility comprehensive test system according to claim 1, characterized in that: In the calibration mode, the control module is used to: Controlling the combination wave generator to be connected to the correction circuit; Controlling the combination wave generator to perform an open circuit voltage test and a short circuit current test in sequence, and measuring the open circuit voltage under a preset working condition and the short circuit current corresponding to the open circuit voltage; According to the open circuit voltage and the short circuit current, an actual surge wave under the preset working condition is determined, and waveform information of the actual surge wave is recorded.

3. The electromagnetic compatibility comprehensive test system according to claim 1, characterized in that: The waveform information includes wavefront time, pulse duration, pulse amplitude, and adjustment rise time; in the calibration mode, the control module is used to: The wavefront time, the pulse duration, the pulse amplitude, and the adjustment rise time are input into a neural network to determine correction parameters.

4. The electromagnetic compatibility comprehensive test system according to claim 1, characterized in that: The method further comprises: Conduct calibration tests on multiple combination wave generators, record the theoretical surge waves required for each test, and measure the actual surge waves under each test; The wavefront time, pulse duration, pulse amplitude, and adjustment rise time of the actual surge wave in each test are used as inputs, and the correction parameters in the test are used as outputs to train the neural network. The correction parameters in the test are calculated based on the difference sequence of each waveform information of the theoretical surge wave required for each test and the actual surge wave in each test.

5. The electromagnetic compatibility comprehensive test system according to claim 1, characterized in that: In the actual measurement mode, the control module is used to: The control module controls the combination wave generator to be connected to the device under test, and simultaneously connects the waveform detection device to the device under test; Controlling the combined wave generator to apply different target surge waves to the device under test, and determining the state of the device under test under different target surge waves according to the surge response of the device under test recorded by the waveform detection device as an initial test result; According to each target surge wave and correction parameter, the correction wave of each target surge wave is determined, and each correction wave and its corresponding state of the tested equipment are used as the corrected test result to complete the comprehensive electromagnetic compatibility test.

6. The electromagnetic compatibility comprehensive test system according to claim 5, characterized in that: In the actual measurement mode, the control module is specifically used to: The waveform information of each target surge wave and the corresponding value in the correction parameter are used to obtain the correction value of each waveform information; According to the correction value of each waveform information of each target surge wave, each target surge signal is reconstructed to obtain a correction wave of each target surge wave.

7. The electromagnetic compatibility comprehensive test system according to claim 1, characterized in that: The correction circuit includes a coupling network and a correction resistor.

8. The electromagnetic compatibility comprehensive test system according to claim 1, characterized in that: The combination wave generator comprises an energy storage circuit and a combination wave forming circuit; the DC voltage source is connected to the energy storage circuit; the energy storage circuit is connected to the combination wave forming circuit; the combination wave forming circuit is connected to the correction circuit or the device under test.

9. The electromagnetic compatibility comprehensive test system according to claim 8, characterized in that: The energy storage circuit and the combined wave forming circuit are connected via a mercury switch.

10. The electromagnetic compatibility comprehensive test system according to any one of claims 1 to 9, characterized in that: The DC voltage source is a 0-100V DC voltage generating circuit.

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