Intelligent wire changing and connecting method based on switch state and related device

Abstract

The invention discloses an intelligent wire changing and connecting method based on a switch state and a related device, and belongs to the technical field of capacity test systems. The method comprises the following steps: firstly, generating a plurality of feasible wire changing and connecting schemes through state parameters of a target test loop and a current test loop, then evaluating and scoring an expected switching-on and switching-off state table through an evaluation model, and finally obtaining an optimal wire changing and connecting scheme. According to the method, when the loop switching scheme is calculated, the switching-on and switching-off states and the intact state of the current disconnecting switch are fully considered, the scheme that switching of the switching-on and switching-off states of the disconnecting switch is least, especially the disconnecting switch with fault hidden dangers is not operated as far as possible is selected, and compared with manual or formula operation which uses familiar or common lines, the operation efficiency is greatly improved. The operation frequency of the disconnecting switch is reduced, the mechanical life of the switch is prolonged, and the risk that the switch is not switched in place is reduced.

Description

Technical Field

[0001] The invention belongs to the technical field of capacity test systems and relates to an intelligent wiring replacement method based on switch status and a related device. Background Art

[0002] The large-capacity test system simulates various working conditions of the power grid system to detect the ability of high-voltage electrical appliances to withstand fault currents and open and close various currents. Its main circuit changes the topology of the circuit through various switches, and connects or shorts resistors, capacitors, and reactors through the closing and opening of the isolation switch, thereby changing the resistance value, capacitance value, reactance value, and other parameters of regulating equipment in the circuit.

[0003] In order to meet the needs of various tests, the main circuit wiring schemes of the capacity test system are numerous. Each test parameter and type has one or more wiring methods. Different test methods, test parameters, and tested products use different power supplies, and the main circuit structure is different, so the wiring scheme is also different. For a long time, the wiring scheme has been changed by manual calculation. That is, the test personnel first calculate the parameters of the main circuit components based on experience according to the test items and test parameters, and then manually convert the parameters into the status scheme of the knife switch. Since there are many switching schemes with the same or similar parameters, they need to be evaluated and selected manually. For example Figure 3 As shown, the frequency modulation resistor R 01 It consists of 10 resistors, which can be connected in series or in parallel, and 11 isolation switches R1-R 11 Control, so there are 2 11 Nearly 2000 kinds of connection methods.

[0004] Another example Figure 4 As shown, the capacitor tower Z1 has ten floors, with a total of Z1K1-Z1K between the floors. 10 , Z1L1-Z1L9, a total of 19 disconnectors determine the series-parallel relationship between capacitor layers. When it is necessary to connect capacitors in parallel for three times in a row (two in parallel and three in series) after every two layers, the unused four layers need to be short-circuited. The selected number of layers is different, and the states of the 19 disconnectors are also different, so there will be multiple switching schemes. When Z1 needs to set the parameter to 3μF, the capacitor can be selected from 1-10 layers, and the capacitors of each layer can be connected (through the closing and opening of Z1C1-Z1C6) 3-30μF, and the selected number of layers is different, corresponding to Z1K1-Z1K 10 , Z1L1-Z1L9, and Z1C1-Z1C6 are all different. Even if the same number of layers is selected, as mentioned above, Z1K1-Z1K 10 , Z1L1-Z1L9 also have multiple options. Capacitor tower Z1 has 25 isolating switches, theoretically 2 25 About 30 million switching options.

[0005] In addition, due to the frequent operation of each disconnector, the large number of disconnectors, and the lack of maintenance time, the failure rate (such as inadequate closing and opening of the switch, abnormal status display) is high. In order to ensure the normal progress of the test and improve the test efficiency and safety, it is necessary to select the optimal switching scheme according to the on-site switch status, reduce the operation frequency of all switches, and try not to operate switches with faults (manual closing and opening operations are required) or hidden dangers (manual on-site confirmation of switch status is required). For example, when the number of Z1 switching layers is 8-10, if the number of capacitor access layers in the current circuit is exactly within the range of 8-10 layers, it is only necessary to close and open Z1C1-Z1C6. However, if the closing and opening status of one of Z1C1-Z1C6 needs to be changed, and the closing and opening status cannot be normally identified, it is necessary to change the number of layers to reduce the workload of on-site confirmation or manual operation and improve the efficiency of line switching.

[0006] In order to achieve fast switching, common solutions include: 1) using the recipe component of the configuration software to complete simple switching, and using the script tool to obtain the status of the disconnector to achieve simple calculation of the circuit parameters. Similarly, different types of operation tickets are established to describe the operation of each switch; but the script operation efficiency is limited, and it is difficult to use in situations where the combination logic is complex and the number of recipes is too large. 2) Using a table to store the switch status and corresponding parameter information (such as capacitance value, number of layers used, number of short-circuit layers, etc.), through query, to obtain the switching status of the switch; but when there are many switching schemes, if an operation ticket corresponds to a closing and opening state table, the number is too large, and the table building and query efficiency are low. If only the parameter information (such as the capacitance value of Z1) is described, other means are still needed to determine the expected state table of each disconnector. 3) Manual switching, with the help of personnel to manually judge and select the switching scheme. However, the manual operation proficiency requires high proficiency, and it is difficult to select the optimal scheme, which increases the frequency of switch operation and the operation of faulty switches. Summary of the invention

[0007] The purpose of the present invention is to provide an intelligent wiring replacement method and related devices based on switch status, so as to solve the technical problems in the prior art that the wiring replacement method is difficult to adapt to occasions with many solutions and complex lines, cannot obtain the optimal solution, and has low wiring replacement efficiency.

[0008] In order to achieve the above object, the present invention adopts the following technical solutions: In a first aspect, the present invention provides a method for intelligently switching wiring based on a switch state, comprising the following steps: Obtain the specific parameters of each device in the target test loop; Obtain the status of all isolating switches in the current test circuit and calculate the access parameters of the current circuit equipment; Based on the access parameters of the current circuit equipment and the specific parameters of each device in the target test circuit, several wiring replacement schemes are obtained; Calculate the expected closing and opening status table of all disconnectors in several wiring replacement schemes; The evaluation model is used to evaluate and score the expected closing and opening status tables of several wiring switching schemes, and the wiring switching operation of the test circuit is performed according to the wiring switching scheme with the highest score.

[0009] Furthermore, the step of obtaining specific parameters of each device in the target test loop specifically includes: obtaining the specific parameters of each device in the target test loop by querying a loop expert database or by simulation calculation.

[0010] Furthermore, the step of obtaining several wiring replacement schemes based on the access parameters of the current loop device and the specific parameters of each device in the target test loop specifically includes: Compare the access parameters of the current loop device with the specific parameters of each device in the target test loop to obtain several wiring replacement schemes; match the specific parameters of each device in the target test loop with the loop expert database. If the same case exists in the loop expert database, directly select the wiring replacement scheme of the same case to perform the wiring replacement operation of the test loop; if the same case does not exist in the loop expert database, calculate several wiring replacement schemes and proceed to the next step.

[0011] Furthermore, the step of calculating the expected closing and opening state table of all disconnectors in the plurality of wiring changeover schemes specifically includes: The node analysis method is used to calculate the expected closing and opening state table of all disconnectors in the wiring replacement scheme, and the nodes at the inlet and outlet ends of all devices or components are numbered one by one according to the order before and after the devices are connected, and saved as the first data table in the database; The connection position information of the isolating switch is saved as a second data table in a database; Calculate the state of the disconnector through the first data table and the second data table, and update the entry and exit node numbers of the grouped elements, and store them in the first data table; When all components in the group are calculated, the node numbers of their external connections will be obtained, the solution is calculated, and the number of state transition switches and the switch operation information table are saved.

[0012] Furthermore, the step of using the evaluation model to evaluate and score the expected closing and opening state tables of several wiring switching schemes specifically includes: using the evaluation model to score each evaluation indicator according to the expected closing and opening state table of each wiring switching scheme, and finally weightedly summarizing the score of each evaluation indicator to obtain the final score of the wiring switching scheme.

[0013] Furthermore, the evaluation indicators specifically include parameter matching, intact state of operating equipment, number of operating disconnectors involved, insulation safety factor of access equipment, safety level of current withstand of access equipment and number of equipment involved.

[0014] Furthermore, it also includes: saving the wiring replacement scheme with the highest score, current test circuit related parameters, target test circuit related parameters and switch fault status into the circuit expert database.

[0015] In a second aspect, the present invention provides an intelligent wiring switching system based on switch status, comprising: A target parameter acquisition module is used to obtain specific parameters of each device in the target test loop; The current parameter calculation module is used to obtain the status of all disconnectors in the current test circuit and calculate the access parameters of the current circuit equipment; A scheme acquisition module is used to obtain several wiring replacement schemes based on the access parameters of the current loop device and the specific parameters of each device in the target test loop; A state table calculation module is used to calculate the expected closing and opening state tables of all disconnectors in several wiring replacement schemes; The evaluation module is used to evaluate and score the expected closing and opening state tables of several wiring switching schemes using an evaluation model, and perform wiring switching operations on the test circuit according to the wiring switching scheme with the highest score.

[0016] In a third aspect, the present invention provides a computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above method when executing the computer program.

[0017] In a fourth aspect, the present invention provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the above method are implemented.

[0018] Compared with the prior art, the present invention has the following beneficial effects: The present invention discloses an intelligent wiring switching method based on switch status and related devices. The method first generates multiple feasible wiring switching schemes through the state parameters of the target test circuit and the current test circuit, and then evaluates and scores the expected closing and opening state table through an evaluation model, and finally obtains the optimal wiring switching scheme; when calculating the circuit switching scheme, the present invention fully considers the closing and opening state and intact state of the current disconnector, and selects a scheme with the least closing and opening state transitions of the disconnector, especially the disconnector with potential faults that is not operated as much as possible. Compared with manual or formula operation, familiar or commonly used lines are used, the operation frequency of the disconnector is reduced, the mechanical life of the switch is increased, and the risk of the switch not being converted into place is reduced.

[0019] Furthermore, the evaluation model of the present invention is provided with six evaluation indicators, which evaluate multiple line-changing execution plans from six dimensions, such as safety, accuracy, and number of conversions, and select the optimal plan, thereby improving the scientific nature of line-changing.

[0020] Furthermore, the present invention adopts a node analysis method, whereby a computer completes the calculation of the circuit equipment access parameters and the calculation of the expected closing and opening state table of the disconnector according to the closing and opening states of each disconnector, instead of using a table or recipe to save the state table. This improves the flexibility and calculation efficiency of the wiring change, and avoids the problems of low efficiency, heavy workload, and poor flexibility in inputting and querying a large number of tables and recipes.

[0021] Furthermore, the present invention saves the switching scheme and description to the expert database, thereby ensuring that when the same scenario occurs again, simplified steps can be used to switch the line, thereby improving the switching efficiency and ensuring that the system continues to learn and gradually improve. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0023] Figure 1 is a flow chart of the method of the present invention; Figure 2 is a schematic diagram of the system of the present invention; Figure 3 is the frequency modulation resistor R 01 Electrical topology diagram; Figure 4 This is the topological diagram of the capacitor tower Z1 circuit; Figure 5 This is a flow chart of automatic loop switching according to an embodiment of the present invention; Figure 6 This is the embodiment R of the present invention 01 Schematic diagram of node marking; Figure 7 This is a typical circuit topology diagram for capacity test; Figure 8 This is a schematic diagram of node marking of the Z1 capacitor tower according to an embodiment of the present invention; Fig. 9 It is a schematic diagram of the computer device structure of the present invention. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0025] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0026] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0027] In the description of the embodiments of the present invention, it should be noted that if the terms "upper", "lower", "horizontal", "inner", etc. indicate an orientation or positional relationship based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship in which the product of the invention is usually placed when in use, it is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the terms "first", "second", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0028] In addition, if the term "horizontal" appears, it does not mean that the component must be absolutely horizontal, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", which does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0029] In the description of the embodiments of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal connection of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0030] The present invention is further described in detail below in conjunction with the accompanying drawings: See also Figure 1 The embodiment of the present invention discloses a smart wiring method based on switch state, which is characterized by comprising the following steps: S1, obtaining the specific parameters of each device in the target test loop; By querying the loop expert database or through simulation calculation, the specific parameters of each device in the target test loop can be obtained.

[0031] S2, obtain the status of all isolating switches in the current test circuit and calculate the access parameters of the current circuit equipment; S3, based on the access parameters of the current loop device and the specific parameters of each device in the target test loop, obtain several wiring replacement schemes; Compare the access parameters of the current loop equipment with the specific parameters of each device in the target test loop to obtain several wiring replacement schemes; match the specific parameters of each device in the target test loop with the loop expert database. If the same case exists in the loop expert database, directly select the wiring replacement scheme of the same case to perform the wiring replacement operation of the test loop; if the same case does not exist in the loop expert database, proceed to the next step.

[0032] S4, calculate the expected closing and opening state tables of all disconnectors in several wiring replacement schemes; adopt the node analysis method, as follows: S401, numbering the nodes at the inlet and outlet ends of all devices or components one by one according to the order before and after the devices are connected, and saving them as a first data table in a database; S402, saving the connection position information of the disconnector as a second data table in a database; S403, calculating the state of the disconnector through the first data table and the second data table, and updating the entry and exit node numbers of the grouped elements, and storing them in the first data table; S404, when all components in the group are calculated, the node numbers of their external wiring are obtained, the solution is calculated, and the number of state transition switches and the switch operation information table are saved. Similarly, the expected closing and opening state tables of other wiring change solutions are calculated.

[0033] S5, using the evaluation model, evaluates and scores the expected closing and opening state tables of several wiring switching schemes, and performs wiring switching operations on the test circuit according to the wiring switching scheme with the highest score.

[0034] The evaluation model is used to score each evaluation indicator according to the expected closing and opening state table of each wiring replacement scheme. Finally, the score of each evaluation indicator is weighted and summarized to obtain the final score of the wiring replacement scheme.

[0035] The evaluation indicators specifically include parameter matching, intact state of operating equipment, number of operating disconnectors involved, insulation safety factor of access equipment, safety level of current withstand of access equipment and number of equipment involved.

[0036] S6, save the wiring replacement scheme with the highest score, the current test circuit related parameters, the target test circuit related parameters and the switch fault status to the circuit expert database, so that when the same situation occurs later, a simplified procedure can be adopted.

[0037] See also Figure 2 The embodiment of the present invention discloses an intelligent wiring switching system based on switch state, including a target parameter acquisition module, a current parameter calculation module, a solution acquisition module, a state table calculation module and an evaluation module.

[0038] Among them, the target parameter acquisition module is used to obtain the specific parameters of each device in the target test circuit; the current parameter calculation module is used to obtain the status of all disconnectors in the current test circuit and calculate the access parameters of the current circuit equipment; the scheme acquisition module is used to obtain several wiring schemes based on the access parameters of the current circuit equipment and the specific parameters of each device in the target test circuit; the state table calculation module is used to calculate the expected closing and opening state tables of all disconnectors in several wiring schemes; the evaluation module is used to use the evaluation model to evaluate and score the expected closing and opening state tables of several wiring schemes, and perform wiring operations on the test circuit according to the wiring scheme with the highest score.

[0039] Example: This solution uses the established equipment health status database, circuit expert database, and automatic simulation system, and with the help of the circuit evaluation model and internal algorithm, calculates the status of each switch in the main circuit, realizes the selection of circuit solutions, and reduces the operation frequency of the main circuit isolation switch, the workload of manual selection, and the risk of errors. The process is shown in Figure 5 , the specific steps are as follows: 1) According to the test parameters, query the loop expert database or perform simulation calculations to obtain the specific parameters of each device in the test loop, such as the capacitance value of the capacitor and the resistance value of the resistor.

[0040] 2) Obtain the status of all current disconnectors through communication with the lower computer, calculate the access parameters of the current circuit equipment (such as capacitance value, number of layers, number of series and parallel resistors), compare them with step 1), and obtain multiple preliminary solutions for switch switching. When the current equipment parameters match the required values ​​or there is an identical case in the expert system, enter the simplified procedure and directly execute step 5. When there are no completely matching parameters, calculate the circuit switching solution. The equipment safety factor of each solution (see items d and e in step 4) should be able to meet the most basic requirements of the definition, and the number of switch state transitions required should be as small as possible. For example, when step 1 calculates that the Z1 capacitor access value requirement is 3μF, the capacitor charging voltage is 600kV. If the single-layer withstand voltage of the capacitor tower is 100kV, in order to meet the withstand voltage safety factor, the number of capacitor layers can be selected from 8 to 10 layers, and the single-layer access values ​​are 24μF, 27μF, and 30μF, respectively. There is only one solution for accessing 10 layers, and for accessing 9 layers, you can choose to short-circuit one of 1-10 layers, and there are 10 solutions. For example Figure 3 If the middle resistor is connected to two resistors in parallel, there are 9 solutions.

[0041] 3) The node method is used to calculate the expected closing and opening state table of all disconnectors in each scheme. The basic principle and method are as follows: a. Number the nodes at the inlet and outlet of all devices or components such as transformers, capacitors, resistors, disconnectors, etc. one by one according to the order before and after the devices are connected, and save them to the database, such as Figure 6 As shown, the input and output terminals of resistor R1 are 2 and 3, and the input and output terminals of resistor R2 are 3 and 4. When the input and output terminals are connected to the main branch at the same time, the device is connected. Devices with the same input and output line numbers are connected in parallel.

[0042] b. Save the disconnection position information in the database. For example, when D1 is closed upward, the inlet and outlet are connected to node 1 and node 2 (12 is merged into one node), and when D1 is closed downward, node 1 and node 3 are connected. When D2 is closed, node 2 and node 3 are connected, and when D2 is opened, node 2 and node 4 are disconnected.

[0043] c. According to the solution of step 2, by querying the two data tables described in a) and b) above, calculate the state of the disconnector and update the in / out node numbers of the grouped components. For example, when R1 and R2 need to be connected in parallel as a group, since the two nodes of R1 are 2 and 3, and the nodes of R2 are 4 and 3, the node numbers of the two resistors are compared, and the two nodes 2 and 4 need to be combined into one node, then D2 needs to be closed, and the in / out numbers of the group of components are 24 and 3 (the information of both ends needs to be retained for parallel connection).

[0044] If R1 and R2 need to be connected in series as a group, since the two resistors have the same node 3, D1 is opened to keep nodes 2 and 4 disconnected. At this time, the components in this group are numbered 2 and 4 (when connected in series, 3 is an internal node and is not saved).

[0045] d. Save the node numbers of the grouped components calculated in c) to the table in a), and continue to calculate the subsequent component switching plan according to step c).

[0046] For example, when the group number of R1R2 in c) is 24 and 3, since the node number of R3 is 4 and 5, if it needs to be merged into R3, D3 is closed, nodes 3 and 5 are connected, R1, R2, and R3 are grouped, and the node numbers of this group are 24 and 35. If R3 is connected in series, nodes 3 and 5 cannot be connected, so D3 is opened, and the group number is updated to 3 and 5 (nodes 2 and 4 become internal nodes). If R3 is not connected, nodes 4 and 5 cannot be connected to the main branch, so D3 is opened (disconnected 3 and 5), 4 becomes an internal node, D4 ​​is closed (connected 4 and 6), and the group number is updated to 3 and 6.

[0047] By the same token, we can infer the status of the subsequent component isolation switches and the input and output line numbers of each component after it is grouped.

[0048] e. Determine the incoming and outgoing lines of grouped components When all components in the group are calculated, the node number of their external wiring will be obtained. For example, if R1 / / R2+ R3 is connected, the group numbers should be 2 and 11, D1 should be closed, and D 11 The next step is to update the group numbers to 1 and 11, indicating that the solution has been calculated, and save the number of state transition switches and the switch operation information table.

[0049] f. Continue to calculate the switching methods of other solutions, such as connecting R2 and R3 in parallel.

[0050] g. Continue to determine the main circuit ( Figure 7 ) Other types of components (such as C s ) wiring scheme, if Cs adopts Z1 ( Figure 4 ), each layer of capacitors can be connected in parallel as a component, and its structure is as follows Figure 8 shown. 4) Query the equipment health status database, collect the closing and opening status of each switch in the circuit, and evaluate the suitability of each table in step 3) through the circuit evaluation model. The circuit evaluation model mainly includes the following 6 dimensions: a. Parameter matching degree. The smaller the relative difference between the parameter and the parameter value obtained in step 1), the higher the score; b. The intact state of the operating equipment is scored according to the product of the number and the degree of fault. The fault status is divided into the status that cannot be remotely identified (identifiable on site and remotely operable), can only be operated on site, can only be operated manually, and cannot be operated, and the scores are assigned from high to low; c. The number of disconnectors involved in the operation, that is, the number of switch states that need to be changed calculated in step 3), is scored. The smaller the number, the higher the score.

[0051] d. Insulation safety factor of the connected equipment (such as the ratio of the charging voltage to the rated voltage of the capacitor tower. The higher the safety factor, the higher the score (after reaching a certain upper limit, the score will no longer increase and remain the same); e. The safety level of the current withstand of the connected equipment (the ratio of the resistance thermal capacity to the rated thermal capacity). The higher the safety factor, the higher the score (after reaching a certain upper limit, such as 1.3, the score will no longer increase and remain the same); f. The number of devices involved (such as the number of connected capacitors). The smaller the number, the higher the score, which reduces the circuit failure rate.

[0052] The above factors can be assigned weighted coefficients according to their importance, such as the weighted coefficient of a) is 0.35, the weighted coefficient of b) is 0.25, the weighted coefficient of c) is 0.15, the weighted coefficient of d) is 0.1, the weighted coefficient of e) is 0.1, and the weighted coefficient of f) is 0.05.

[0053] According to the above model evaluation, the scores of each switching table in step 3) are calculated.

[0054] 5) Compare the scores of the switching tables in step 4, select the switching table with the highest score, and perform the switch closing and opening operations according to the corresponding switch closing and opening expected closing and opening state table saved in step 3.

[0055] 6) Save the wiring rewiring results and the scenario faced in step 2 (such as current device parameters, switch fault status, and required access values) to the expert database so that a simplified procedure can be used when the same situation occurs later.

[0056] In one embodiment of the present invention, a computer device is provided. Figure 6, the computer device includes a processor and a memory, the memory is used to store a computer program, the computer program includes program instructions, and the processor is used to execute the program instructions stored in the computer storage medium. The processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc. It is the computing core and control core of the terminal, which is suitable for implementing one or more instructions, and is specifically suitable for loading and executing one or more instructions in a computer storage medium to implement a corresponding method flow or a corresponding function; the processor described in the embodiment of the present invention can be used for the operation of a capacity test intelligent wiring method based on a switch state.

[0057] The present invention also provides a storage medium, specifically a computer-readable storage medium (Memory), which is a memory device in a computer device for storing programs and data. It is understandable that the computer-readable storage medium here can include both built-in storage media in a computer device and, of course, extended storage media supported by the computer device. The computer-readable storage medium provides a storage space, which stores the operating system of the terminal. In addition, one or more instructions suitable for being loaded and executed by a processor are also stored in the storage space, and these instructions can be one or more computer programs (including program codes). It should be noted that the computer-readable storage medium here can be a high-speed RAM memory or a non-volatile memory (non-volatile memory), such as at least one disk memory. The processor can load and execute one or more instructions stored in the computer-readable storage medium to implement the corresponding steps of the intelligent wiring method for capacity test based on switch state in the above embodiment.

[0058] It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0059] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0060] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0061] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0062] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. An intelligent wiring replacement method based on switch status, characterized in that: The following steps are involved: Obtain the specific parameters of each device in the target test loop; Obtain the status of all isolating switches in the current test circuit and calculate the access parameters of the current circuit equipment; Based on the access parameters of the current circuit equipment and the specific parameters of each device in the target test circuit, several wiring replacement schemes are obtained; Calculate the expected closing and opening status table of all disconnectors in several wiring replacement schemes; The evaluation model is used to evaluate and score the expected closing and opening status tables of several wiring switching schemes, and the wiring switching operation of the test circuit is performed according to the wiring switching scheme with the highest score.

2. The intelligent wiring replacement method based on switch status according to claim 1 is characterized in that: The step of obtaining the specific parameters of each device in the target test loop specifically includes: obtaining the specific parameters of each device in the target test loop by querying a loop expert database or by simulation calculation.

3. The intelligent wiring replacement method based on switch status according to claim 1 is characterized in that: The step of obtaining several wiring replacement schemes based on the access parameters of the current loop device and the specific parameters of each device in the target test loop specifically includes: Compare the access parameters of the current loop device with the specific parameters of each device in the target test loop to obtain several wiring replacement schemes; match the specific parameters of each device in the target test loop with the loop expert database. If the same case exists in the loop expert database, directly select the wiring replacement scheme of the same case to perform the wiring replacement operation of the test loop; if the same case does not exist in the loop expert database, calculate several wiring replacement schemes and proceed to the next step.

4. The intelligent wiring replacement method based on switch status according to claim 1 is characterized in that: The step of calculating the expected closing and opening state table of all disconnectors in a plurality of wiring replacement schemes specifically includes: The node analysis method is used to calculate the expected closing and opening state table of all disconnectors in the wiring replacement scheme, and the nodes at the inlet and outlet ends of all devices or components are numbered one by one according to the order before and after the devices are connected, and saved as the first data table in the database; The connection position information of the isolating switch is saved as a second data table in a database; Calculate the state of the disconnector through the first data table and the second data table, and update the entry and exit node numbers of the grouped elements, and store them in the first data table; When all components in the group are calculated, the node numbers of their external connections will be obtained, the solution is calculated, and the number of state transition switches and the switch operation information table are saved.

5. The intelligent wiring replacement method based on switch status according to claim 1 is characterized in that: The step of using the evaluation model to evaluate and score the expected closing and opening state tables of several wiring switching schemes specifically includes: using the evaluation model to score each evaluation indicator according to the expected closing and opening state table of each wiring switching scheme, and finally weightedly summarizing the score of each evaluation indicator to obtain the final score of the wiring switching scheme.

6. The intelligent wiring replacement method based on switch status according to claim 5, characterized in that: The evaluation indicators specifically include parameter matching, intact state of operating equipment, number of operating disconnectors involved, insulation safety factor of access equipment, safety level of current withstand of access equipment and number of equipment involved.

7. The intelligent wiring replacement method based on switch status according to claim 1 is characterized in that: Also includes: The wiring replacement scheme with the highest score, the current test circuit related parameters, the target test circuit related parameters and the switch fault status are saved to the circuit expert database.

8. An intelligent wiring replacement system based on switch status, characterized in that: include: A target parameter acquisition module is used to obtain specific parameters of each device in the target test loop; The current parameter calculation module is used to obtain the status of all disconnectors in the current test circuit and calculate the access parameters of the current circuit equipment; A scheme acquisition module is used to obtain several wiring replacement schemes based on the access parameters of the current loop device and the specific parameters of each device in the target test loop; A state table calculation module is used to calculate the expected closing and opening state tables of all disconnectors in several wiring replacement schemes; The evaluation module is used to evaluate and score the expected closing and opening state tables of several wiring switching schemes using an evaluation model, and perform wiring switching operations on the test circuit according to the wiring switching scheme with the highest score.

9. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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