Water purifier low-temperature sealing qualified rate prediction method and water purifier low-temperature sealing failure reason tracing method

Abstract

The invention relates to a water purifier low-temperature sealing qualified rate prediction method and a water purifier low-temperature sealing failure reason tracing method, and the method comprises the steps: obtaining a first hardware parameter and at least one second hardware parameter, the first hardware parameter is the maximum flow specification of an electromagnetic valve, and the second hardware parameter is the maximum flow specification of the electromagnetic valve; the second hardware parameter is the wall thickness or the length of a quartz tube in the ultraviolet lamp; before the water purifier is assembled, independently carrying out a low-temperature vibration test on the quartz tube to obtain a first test parameter, and independently carrying out a normal-temperature performance test on the electromagnetic valve to obtain a second test parameter; and at least based on the obtained second hardware parameter, the first hardware parameter, the first test parameter and the second test parameter, judging the low-temperature sealing qualification rate of the assembled water purifier.

Description

Technical Field

[0001] The invention relates to the field of water purifier sealing test, and in particular to a method for predicting the qualified rate of low-temperature sealing of a water purifier and a method for tracing the cause of low-temperature sealing failure of a water purifier. Background Art

[0002] If the water purifier is located in an extremely cold area, the drinking water will quickly cool and expand as soon as it stops heating the drinking water inside. However, once it is reheated, the drinking water will shrink again. Every time the drinking water cools, the water purifier will be damaged due to the volume expansion. This requires the water purifier to have good sealing in a low temperature environment to ensure a sufficient service life.

[0003] The low-temperature sealing test of the water purifier is conducted on a large number of assembled water purifiers. For water purifiers that fail the test, they need to be disassembled again, and then all the parts in the unqualified water purifiers need to be checked and replaced one by one. If the qualified rate of the low-temperature sealing of the water purifier is too low, a large number of assembled water purifiers need to be disassembled again and all the internal parts need to be checked and replaced, which is a lot of work. Summary of the invention

[0004] Based on this, it is necessary to provide a method for predicting the pass rate of low-temperature sealing of water purifiers and a method for tracing the cause of low-temperature sealing failure of water purifiers to address the problem of large rework workload when the pass rate of low-temperature sealing test of water purifiers is low.

[0005] A method for predicting the qualified rate of low-temperature sealing performance of a water purifier, comprising:

[0006] Acquire a first hardware parameter and at least one second hardware parameter, wherein the first hardware parameter is a maximum flow specification of the solenoid valve, and the second hardware parameter is a wall thickness or a length of a quartz tube in the ultraviolet lamp;

[0007] Before assembling the water purifier, the quartz tube is subjected to a low-temperature vibration test to obtain a first test parameter, and the solenoid valve is subjected to a normal-temperature performance test to obtain a second test parameter;

[0008] The low-temperature sealing pass rate of the assembled water purifier is determined based at least on the acquired second hardware parameter, the first hardware parameter, the first test parameter and the second test parameter.

[0009] The present invention sets a normal temperature qualified rate threshold of the solenoid valve. If the second test parameter is higher than the normal temperature qualified rate threshold of the solenoid valve, a low temperature performance test is performed on the solenoid valve separately to obtain a third test parameter.

[0010] The low-temperature sealing pass rate of the assembled water purifier is determined based at least on the third test parameter.

[0011] The present invention obtains a third hardware parameter, wherein the third hardware parameter is the material of the filter bottle;

[0012] Before assembling the water purifier, the filter bottle is individually tested for low-temperature sealing properties to obtain a fourth test parameter, and the low-temperature sealing pass rate of the assembled water purifier is determined based at least on the third hardware parameter and the fourth test parameter.

[0013] The present invention sets a first filter bottle low temperature qualified rate threshold and a second filter bottle low temperature qualified rate threshold, wherein the first filter bottle low temperature qualified rate threshold is higher than the second filter bottle low temperature qualified rate threshold;

[0014] When the third hardware parameter is PA and the fourth test parameter is lower than the low temperature qualified rate threshold of the first filter bottle, the low temperature sealing qualified rate of the assembled water purifier does not meet the standard;

[0015] When the third hardware parameter is PP and the fourth test parameter is lower than the low-temperature qualified rate threshold of the second filter bottle, the low-temperature sealing qualified rate of the assembled water purifier does not meet the standard.

[0016] According to the present invention, both the first filter bottle low temperature qualified rate threshold and the second filter bottle low temperature qualified rate threshold are greater than 80%.

[0017] There are two types of the second hardware parameters obtained by the present invention;

[0018] If the wall thickness of the quartz tube is not less than 2 mm and the length of the quartz tube is not less than 180 mm, a fourth hardware parameter is obtained, where the fourth hardware parameter is the installation direction of the quartz tube. The low-temperature sealing pass rate of the assembled water purifier is determined at least based on the fourth hardware parameter.

[0019] The present invention obtains a fifth hardware parameter, which is the shape of the bottom wall of the quartz tube, and determines the low-temperature sealing pass rate of the assembled water purifier at least based on the fifth hardware parameter.

[0020] A method for tracing the cause of low-temperature seal failure of a water purifier, comprising:

[0021] Acquire a first hardware parameter and at least one second hardware parameter, wherein the first hardware parameter is a maximum flow specification of the solenoid valve, and the second hardware parameter is a wall thickness or a length of a quartz tube in the ultraviolet lamp;

[0022] Obtain the low-temperature sealing qualification rate of the water purifier;

[0023] The faulty parts of the water purifier are determined based at least on the acquired second hardware parameter, the first hardware parameter and the low-temperature sealing pass rate of the water purifier.

[0024] The present invention obtains a third hardware parameter, wherein the third hardware parameter is the material of the filter bottle;

[0025] A faulty part of the water purifier is determined based at least on the third hardware parameter.

[0026] There are two types of the second hardware parameters obtained by the present invention.

[0027] The beneficial effects of the present invention are:

[0028] The method for predicting the qualified rate of low-temperature sealing of a water purifier provided by the present invention predicts the qualified rate of low-temperature sealing of the water purifier in advance by random inspection before assembling the solenoid valve and the ultraviolet lamp into the water purifier. If the predicted qualified rate of low-temperature sealing is too low, the solenoid valve and the ultraviolet lamp are directly repaired or replaced, thereby reducing the number of subsequent disassembly and repair of the water purifier. Therefore, the present invention can maintain the actual qualified rate of low-temperature sealing of the water purifier at a high level with a low workload. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 This is a flow chart of the method for predicting the low-temperature sealing qualification rate of a water purifier in Example 1 of the present invention;

[0030] Figure 2 This is a flow chart of the method for tracing the cause of low-temperature seal failure of a water purifier in Example 2 of the present invention. DETAILED DESCRIPTION

[0031] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific embodiments of the present invention are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.

[0032] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0033] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0034] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0035] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0036] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used herein are for illustrative purposes only and are not intended to be the only implementation method.

[0037] Embodiment 1:

[0038] For a water purifier, its main components include an ultraviolet lamp (containing a quartz tube), a solenoid valve, and a filter bottle. Correspondingly, the water purifier has a first hardware parameter, two second hardware parameters, a third hardware parameter, and a fourth hardware parameter. Among them, the first hardware parameter is the maximum flow specification of the solenoid valve, and the common ones are 3L / min and 5L / min. The two second hardware parameters are the wall thickness of the quartz tube in the ultraviolet lamp and the length of the quartz tube. The common wall thickness of the quartz tube is 1mm and 2mm, and the common length of the quartz tube is 160mm and 180mm. The third hardware parameter is the material of the filter bottle, which usually has two specifications: PA and PP. The fourth hardware parameter is the installation direction of the quartz tube, which usually has two specifications: horizontal and vertical. The horizontal direction means parallel to the horizontal plane, and the vertical direction means perpendicular to the horizontal plane.

[0039] For water purifiers from the same batch, the ultraviolet lamps, solenoid valves and filter bottles used are all from the same batch, so as to have a unified first hardware parameter, two second hardware parameters, a third hardware parameter and a fourth hardware parameter.

[0040] This embodiment provides a method for predicting the low-temperature sealing pass rate of a water purifier, which is intended to prejudge the low-temperature sealing pass rate of the water purifier before assembling the ultraviolet lamp, the solenoid valve and the filter bottle into a water purifier. If it is judged that the low-temperature sealing pass rate of the water purifier meets expectations, the ultraviolet lamp, the solenoid valve and the filter bottle are assembled normally. If it is judged that the low-temperature sealing pass rate of the water purifier is not as expected, one of the ultraviolet lamp, the solenoid valve and the filter bottle is replaced in advance to ensure that the final assembled water purifier has a sufficiently high pass rate and reduce the number of water purifiers that need to be reworked and repaired.

[0041] See also Figure 1 Specifically, the method for predicting the qualified rate of low-temperature sealing of water purifiers includes the following steps:

[0042] Step 101: Obtain the first hardware parameter, two second hardware parameters, the third hardware parameter and the fourth hardware parameter corresponding to the incoming UV lamp (containing a quartz tube), the solenoid valve and the filter bottle.

[0043] Step 102: Before assembling the ultraviolet lamp, the solenoid valve and the filter bottle into a water purifier, a low-temperature vibration test is performed on the quartz tubes individually by random sampling to obtain a first test parameter. The first test parameter is the undamaged rate of the randomly sampled quartz tubes after the low-temperature vibration test.

[0044] The low-temperature vibration test method of the quartz tube is as follows: inject 1mL-10mL of pure water into the UV lamp through the water inlet of the UV lamp, fix the UV lamp on the bracket according to the fourth hardware parameter, and put the UV lamp into the environmental chamber. The temperature of the environmental chamber is reduced from 25°C to -20°C within 2 hours, and the freezing is continued for 2 hours. Then take out the UV lamp and the bracket and fix them on the vibration table, and then perform a vibration test to simulate the actual state of the water purifier being shipped from the warehouse in a low temperature environment in winter and bumping on the road. The frequency of the vibration table is set to 15Hz, the amplitude is 4mm, and the vibration is 45min. After the vibration, use a tool to take out the quartz tube and visually inspect whether the quartz tube is broken.

[0045] Step 103: Before assembling the ultraviolet lamp, the solenoid valve and the filter bottle into a water purifier, a normal temperature performance test is performed on the solenoid valve by random sampling to obtain a second test parameter. The second test parameter is the normal working rate of the randomly sampled solenoid valve after the normal temperature performance test.

[0046] The normal temperature performance test method of the solenoid valve is as follows: the water inlet of the solenoid valve is connected to a PE pipe and a ball valve, and the water outlet is connected to a PE pipe and a ball valve, where the length of the PE pipe is 300mm. The solenoid valve is powered on, and municipal tap water is introduced from the water inlet ball valve. The solenoid valve is tested to see whether it can discharge water normally under high voltage, low voltage, high water pressure and low water pressure conditions.

[0047] Among them, only the solenoid valve that can discharge water normally under the conditions of high voltage, low voltage, high water pressure and low water pressure can be regarded as working normally, otherwise it is regarded as not working normally.

[0048] In this embodiment, the high water pressure is 0.4MPa, the low water pressure is 0.1MPa, the water flow rate is 3L / min, the high voltage is 220V, and the low voltage is 24V.

[0049] Step 104: Before assembling the ultraviolet lamp, the solenoid valve and the filter bottle into a water purifier, the solenoid valve is subjected to a low temperature performance test again by random sampling to obtain a third test parameter. The third test parameter is the normal working rate of the randomly sampled solenoid valve after the low temperature performance test.

[0050] The low temperature performance test method of the solenoid valve is as follows: connect the solenoid valve to the static pressure test equipment, connect the solenoid valve to 2.07MPa water pressure and maintain it for 15 minutes for static pressure sealing test, and observe whether the solenoid valve has water seepage or leakage. Then put the solenoid valve after the static pressure test horizontally on the plastic plate in the environmental chamber, and reduce the temperature of the environmental chamber from 25℃ to -20℃ within 2 hours, and continue freezing for 24 hours. Under the low temperature of -20℃, the water in the inner cavity of the solenoid valve will freeze and increase in volume. If there are defects in the structure of the solenoid valve, some solenoid valves will expand and arch due to water freezing, resulting in the separation of the electrode sleeve and the bracket, increasing the magnetic resistance and weakening the suction. Take out the solenoid valve and thaw it at 25℃ for 4 hours to simulate the user's thawing scene. Repeat the above freezing and thawing steps 10 times. Finally, check whether the solenoid valve can work normally under high voltage, low voltage, high water pressure and low water pressure conditions, and whether the solenoid valve has problems such as structural seepage and leakage.

[0051] Step 105: Before assembling the ultraviolet lamp, the solenoid valve and the filter bottle into a water purifier, a low-temperature sealing test is performed on the filter bottle individually by random sampling to obtain a fourth test parameter. The fourth test parameter is the undamaged rate of the randomly sampled filter bottle after the low-temperature sealing test.

[0052] The method for testing the low-temperature sealing performance of the filter bottle is as follows: tighten the filter bottle cap onto the filter bottle shell, and connect the water inlet and outlet of the filter bottle cap to the PE pipe and the ball valve. First, inject 25°C municipal tap water into the filter bottle until water flows out of the ball valve at the outlet. At this time, the air in the filter bottle shell is completely discharged, and then close the ball valves at the water inlet and outlet. Place the filter bottle in an environmental chamber, and reduce the temperature of the environmental chamber from 25°C to -20°C within 2 hours, and continue freezing for 24 hours. Then take out the filter bottle and thaw it at 25°C for 4 hours to simulate the user's thawing scenario. Repeat the above freezing and thawing steps 10 times.

[0053] Step 106: Determine the low-temperature sealing pass rate of the assembled water purifier based on at least the first hardware parameter, the second hardware parameter, the first test parameter, and the second test parameter. If the low-temperature sealing pass rate is determined to be too low, the water purifier is not assembled first, but one or more of the ultraviolet lamp (including the quartz tube), the solenoid valve, and the filter bottle are directly repaired and replaced as a whole.

[0054] Reference Examples:

[0055] In this reference example, multiple batches of UV lamps, solenoid valves and filter bottles are selected, and steps 101 to 105 in Example 1 are performed for each batch, with 30 samples sampled each time. The remaining UV lamps, solenoid valves and filter bottles are then assembled into water purifiers, and a low-temperature sealing test is performed on all assembled water purifiers to obtain the low-temperature sealing pass rate of the assembled water purifiers.

[0056] The low temperature performance test method of the water purifier is as follows: let water flow into the water purifier and store it, put the water purifier into the environmental box, reduce the temperature of the environmental box from 25℃ to -20℃ within 2 hours, keep freezing for 24 hours, then take it out and thaw it in a 25℃ environment for 4 hours. Repeat the above freezing and thawing steps 10 times. Finally, check whether the water purifier is leaking.

[0057] The second test parameter (normal working rate of the solenoid valve after a single normal temperature performance test) and the third test parameter (normal working rate of the solenoid valve after a single low temperature performance test) corresponding to different first hardware parameters (maximum flow specifications of the solenoid valve) of this reference embodiment are shown in Table 1.

[0058] Table 1

[0059]

[0060] It can be seen from Table 1 that no matter the first hardware parameter is 5 L / min or 3 L / min, the third test parameter is smaller than the second test parameter.

[0061] In addition, the second test parameter and the third test parameter when the first hardware parameter is 5 L / min are significantly better than the second test parameter and the third test parameter when the first hardware parameter is 3 L / min.

[0062] The first test parameter (the unbreakage rate of the quartz tube after a low-temperature vibration test alone) corresponding to different second hardware parameters (quartz tube wall thickness and quartz tube length) and fourth hardware parameters (quartz tube installation direction) of this reference embodiment is shown in Table 2.

[0063] Table 2

[0064]

[0065] It can be seen from Table 2 that, under the conditions of the same quartz tube length and the fourth hardware parameter, the first test parameter when the quartz tube wall thickness is 2 mm is significantly better than the first test parameter when the quartz tube wall thickness is 1 mm; under the conditions of the same quartz tube wall thickness and the fourth hardware parameter, the first test parameter when the quartz tube length is 180 mm is significantly better than the first test parameter when the quartz tube length is 160 mm; under the conditions of the same quartz tube wall thickness and quartz tube length, the first test parameter when the first test parameter is horizontal is significantly better than the first test parameter when the first test parameter is longitudinal.

[0066] The fourth test parameter (the rate of undamaged filter bottles after a low-temperature sealing test) corresponding to different third hardware parameters (material of the filter bottle) of this reference embodiment is shown in Table 3.

[0067] Table 3

[0068]

[0069] It can be seen from Table 3 that the fourth test parameter under the condition that the third hardware parameter is PA is better than the fourth test parameter under the condition that the third hardware parameter is PP, indicating that PA has better heat deformation resistance than PP. However, it is worth noting that regardless of whether the third hardware parameter is PA or PP, the fourth test parameter is not less than 90%, indicating that the filter bottle material has no significant effect on the final qualified rate of the water purifier.

[0070] The number of water purifiers with each specific combination of the first hardware parameter, the second hardware parameter, the third hardware parameter and the fourth hardware parameter is 30. The low-temperature sealing pass rates of the water purifiers with the specific combination of the first hardware parameter, the second hardware parameter, the third hardware parameter and the fourth hardware parameter are separately counted, and the results are shown in Table 4.

[0071] The low-temperature sealing pass rates of different water purifiers in this reference example are shown in Table 4.

[0072] Table 4

[0073]

[0074]

[0075] Combined with Table 4, it can be seen that the main determinants of the low-temperature sealing pass rate of the water purifier are the maximum flow specification of the solenoid valve, the wall thickness of the quartz tube and the length of the quartz tube. The installation direction of the quartz tube and the material of the filter bottle have only a small impact. The low-temperature sealing pass rate of the water purifier is roughly equal to the product of the third test parameter and the first test parameter. Therefore, the low-temperature sealing pass rate of the assembled water purifier can be judged at least based on the first hardware parameter, the second hardware parameter, the first test parameter and the third test parameter. Among them, only when the wall thickness of the quartz tube is ≥2mm and the length of the quartz tube is ≥180mm, the low-temperature sealing pass rate of the water purifier can be >50%.

[0076] Since the test conditions and test methods of the third test parameter are more demanding and complex than those of the second test parameter, a threshold value of the normal temperature pass rate of the solenoid valve can be set, such as 70%. If the second test parameter is higher than the normal temperature pass rate threshold of the solenoid valve, a low temperature performance test is performed on the solenoid valve alone to obtain the third test parameter. If the second test parameter is lower than the normal temperature pass rate threshold of the solenoid valve, it means that the low temperature sealing pass rate of the water purifier after final assembly will be very low, and the solenoid valves of this batch need to be replaced and repaired as a whole mechanically and cannot be directly used to assemble the water purifier, so there is no need to test the third test parameter.

[0077] Based on Table 4, it can also be found that under the same maximum flow specification of the solenoid valve, the wall thickness of the quartz tube, the length of the quartz tube and the installation direction of the quartz tube, the low-temperature sealing qualified rate of the water purifier when the material of the filter bottle is PA is equal to or slightly greater than the low-temperature sealing qualified rate of the water purifier when the material of the filter bottle is PP, and under the same maximum flow specification of the solenoid valve, the wall thickness of the quartz tube, the length of the quartz tube and the material of the filter bottle, the low-temperature sealing qualified rate of the water purifier when the quartz tube is installed in the horizontal direction is equal to or slightly greater than the low-temperature sealing qualified rate of the water purifier when the quartz tube is installed in the vertical direction. Therefore, based on the third hardware parameter, the fourth test parameter and the fourth hardware parameter, the estimated value of the low-temperature sealing qualified rate of the assembled water purifier can be corrected and fine-tuned.

[0078] It is not difficult to understand that the filter bottle should have a very obvious impact on the low-temperature sealing pass rate of the water purifier. However, in this reference embodiment, the filter bottle material has little effect on the low-temperature sealing pass rate of the water purifier. The reason is probably that the fourth test parameter is relatively high, close to 100%. Therefore, the low-temperature sealing pass rate of the water purifier can be considered as the product of the third test parameter, the first test parameter and the fourth test parameter.

[0079] Considering that the fourth test parameter when the third hardware parameter is PA is greater than the fourth test parameter when the third hardware parameter is PP, and the above difference has little effect on the low-temperature sealing qualification rate of the final water purifier. Therefore, in Example 1, the low-temperature qualification rate threshold of the first filter bottle and the low-temperature qualification rate threshold of the second filter bottle can be set to respectively target the situations when the third hardware parameter is PA and PP. Among them, the low-temperature qualification rate threshold of the first filter bottle is higher than the low-temperature qualification rate threshold of the second filter bottle. For example, the low-temperature qualification rate threshold of the first filter bottle is 95%, and the low-temperature qualification rate threshold of the second filter bottle is 90%. In all embodiments, the low-temperature qualification rate threshold of the first filter bottle and the low-temperature qualification rate threshold of the second filter bottle are both greater than 80% to ensure that the low-temperature sealing qualification rate of the water purifier after final assembly is not less than 60%.

[0080] Taking Example 1 as an example, when the third hardware parameter is PA and the fourth test parameter is lower than the low temperature qualified rate threshold of the first filter bottle, the low temperature sealing qualified rate of the assembled water purifier is likely to be lower than 60%, which is difficult to meet the standard. Similarly, when the third hardware parameter is PP and the fourth test parameter is lower than the low temperature qualified rate threshold of the second filter bottle, the low temperature sealing qualified rate of the assembled water purifier is likely to be lower than 60%, which is difficult to meet the standard.

[0081] It is easy to understand that when the wall thickness of the quartz tube is not less than 2mm and the length of the quartz tube is not less than 180mm, the low-temperature sealing qualification rate of the assembled water purifier is likely to be higher than 60% to meet the qualification rate requirement. On this basis, the predicted low-temperature sealing qualification rate of the assembled water purifier can be revised upward based on the fourth hardware parameter to make the predicted low-temperature sealing qualification rate of the assembled water purifier more accurate.

[0082] In some other embodiments, a fifth hardware parameter may also be obtained, where the fifth hardware parameter is the shape of the bottom wall of the quartz tube, and the low-temperature sealing pass rate of the assembled water purifier is determined based on the fifth hardware parameter.

[0083] Embodiment 2:

[0084] Based on the data analysis in the reference embodiment, this embodiment provides a method for tracing the cause of failure of low-temperature seal of a water purifier, aiming to quickly find the cause of failure for a batch of water purifiers whose low-temperature sealing qualification rate does not meet the standard.

[0085] See also Figure 2 The method for tracing the cause of failure of low-temperature seal of the water purifier in this embodiment includes:

[0086] Step 201: Obtain a first hardware parameter, two second hardware parameters and a third hardware parameter, wherein the first hardware parameter is the maximum flow specification of the solenoid valve, the two second hardware parameters are the wall thickness and length of the quartz tube in the ultraviolet lamp, and the third hardware parameter is the material of the filter bottle.

[0087] Step 202: Obtain the low-temperature sealing qualification rate of the water purifier.

[0088] Step 203: Determine the faulty parts of the water purifier based on at least the acquired third hardware parameter, the second hardware parameter, the first hardware parameter and the low-temperature sealing pass rate of the water purifier.

[0089] Combined with Table 4, for example, for a batch of water dispensers with a maximum flow specification of 3L / min for the solenoid valve, a wall thickness of 2mm for the quartz tube, and a length of 180mm for the quartz tube, if the low-temperature sealing pass rate of the water purifier is less than 50%, the most likely cause of the poor low-temperature sealing is the poor low-temperature performance of the solenoid valve or the quartz tube, and the water leakage failure is likely to occur in the solenoid valve or the quartz tube. On the contrary, if the low-temperature sealing pass rate of the water purifier is between 50% and 60%, the water leakage failure is likely to occur not only in the solenoid valve or the quartz tube, but also in the filter bottle.

[0090] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0091] The above-mentioned embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the attached claims.

Claims

1. A method for predicting the qualified rate of low-temperature sealing performance of a water purifier, characterized in that: include: Acquire a first hardware parameter and at least one second hardware parameter, wherein the first hardware parameter is a maximum flow specification of the solenoid valve, and the second hardware parameter is a wall thickness or a length of a quartz tube in the ultraviolet lamp; Before assembling the water purifier, the quartz tube is subjected to a low-temperature vibration test to obtain a first test parameter, and the solenoid valve is subjected to a normal-temperature performance test to obtain a second test parameter; The low-temperature sealing pass rate of the assembled water purifier is determined based at least on the acquired second hardware parameter, the first hardware parameter, the first test parameter and the second test parameter.

2. The method for predicting the qualified rate of low-temperature sealing performance of a water purifier according to claim 1, characterized in that: A normal temperature qualified rate threshold of the solenoid valve is set. If the second test parameter is higher than the normal temperature qualified rate threshold of the solenoid valve, a low temperature performance test is performed on the solenoid valve alone to obtain a third test parameter. The low-temperature sealing pass rate of the assembled water purifier is determined based at least on the third test parameter.

3. The method for predicting the qualified rate of low-temperature sealing performance of a water purifier according to claim 1, characterized in that: Acquire a third hardware parameter, where the third hardware parameter is the material of the filter bottle; Before assembling the water purifier, the filter bottle is individually tested for low-temperature sealing properties to obtain a fourth test parameter, and the low-temperature sealing pass rate of the assembled water purifier is determined based at least on the third hardware parameter and the fourth test parameter.

4. The method for predicting the qualified rate of low-temperature sealing performance of a water purifier according to claim 3, characterized in that: Set a first filter bottle low temperature qualified rate threshold and a second filter bottle low temperature qualified rate threshold, wherein the first filter bottle low temperature qualified rate threshold is higher than the second filter bottle low temperature qualified rate threshold; When the third hardware parameter is PA and the fourth test parameter is lower than the low temperature qualified rate threshold of the first filter bottle, the low temperature sealing qualified rate of the assembled water purifier does not meet the standard; When the third hardware parameter is PP and the fourth test parameter is lower than the low-temperature qualified rate threshold of the second filter bottle, the low-temperature sealing qualified rate of the assembled water purifier does not meet the standard.

5. The method for predicting the qualified rate of low-temperature sealing performance of a water purifier according to claim 4, characterized in that: The first filter bottle low temperature qualified rate threshold and the second filter bottle low temperature qualified rate threshold are both greater than 80%.

6. The method for predicting the qualified rate of low-temperature sealing performance of a water purifier according to claim 1, characterized in that: There are two types of the second hardware parameters obtained; If the wall thickness of the quartz tube is not less than 2 mm and the length of the quartz tube is not less than 180 mm, a fourth hardware parameter is obtained, where the fourth hardware parameter is the installation direction of the quartz tube. The low-temperature sealing pass rate of the assembled water purifier is determined at least based on the fourth hardware parameter.

7. The method for predicting the qualified rate of low-temperature sealing performance of a water purifier according to claim 1, characterized in that: A fifth hardware parameter is obtained, where the fifth hardware parameter is the shape of the bottom wall of the quartz tube, and a low-temperature sealing pass rate of the assembled water purifier is determined at least based on the fifth hardware parameter.

8. A method for tracing the cause of low-temperature seal failure of a water purifier, characterized in that: include: Acquire a first hardware parameter and at least one second hardware parameter, wherein the first hardware parameter is a maximum flow specification of the solenoid valve, and the second hardware parameter is a wall thickness or a length of a quartz tube in the ultraviolet lamp; Obtain the low-temperature sealing qualification rate of the water purifier; The faulty parts of the water purifier are determined based at least on the acquired second hardware parameter, the first hardware parameter and the low-temperature sealing pass rate of the water purifier.

9. The method for tracing the cause of failure of low-temperature seal of a water purifier according to claim 8, characterized in that: Acquire a third hardware parameter, where the third hardware parameter is the material of the filter bottle; A faulty part of the water purifier is determined based at least on the third hardware parameter.

10. The method for tracing the cause of failure of low-temperature seal of a water purifier according to claim 8, characterized in that: There are two types of the second hardware parameters obtained.

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