Eddy current array probe, eddy current array detection system and eddy current array detection system calibration method

Abstract

The invention discloses an eddy current array probe, an eddy current array detection system and an eddy current array detection system calibration method.The eddy current array probe adopts a magnetic shielding shell to shield part of electromagnetic interference of an array element to an external array element and electromagnetic interference of the external array element to the array element, the detection accuracy can be improved, a magnetic core is arranged to improve the induced magnetic field intensity, and the detection precision is improved. And the defect signal amplitude is improved. The eddy current array detection system can balance the detection signal of each array element by adjusting the strength of the signal of the auxiliary excitation coil, remove the interference magnetic field of other array elements, the background noise generated by the magnetic field difference caused by the inconsistency of the array elements and the like, and improve the sensitivity and accuracy of defect detection. According to the eddy current array detection system calibration method, the detection signal of each array element can be balanced by adjusting the strength of the signal of the auxiliary excitation coil, background noise generated by magnetic field difference caused by interference of other array elements and inconsistency of the array elements is removed, and the sensitivity and accuracy of defect detection are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of eddy current detection, and in particular to an eddy current array probe, an eddy current array detection system and an eddy current array detection system calibration method. Background Art

[0002] Eddy current nondestructive testing technology is a testing method based on the principle of electromagnetic induction. It can evaluate the performance of conductive materials or discover potential defects without damaging the surface of the material. This technology is widely used in many fields, including aviation, aerospace, metallurgy, machinery, chemical industry and nuclear power, especially in the in-service testing of nuclear power, which is crucial to ensure the safe operation of nuclear power. Eddy current testing technology has many advantages, such as fast testing speed, high detection sensitivity for defects on the surface or near the surface of the workpiece, and can be tested at high temperature.

[0003] The related eddy current detection technology has multiple array elements, each of which has multiple eddy current coils. The magnetic fields generated by these eddy current coils are likely to affect each other, resulting in poor detection sensitivity and accuracy. Summary of the invention

[0004] The technical problem to be solved by the present invention is to provide an eddy current array probe, an eddy current array detection system and an eddy current array detection system calibration method.

[0005] The technical solution adopted by the present invention to solve the technical problem is: construct an eddy current array probe, including a circuit board, a plurality of array elements are arranged on the circuit board, each of the array elements includes a magnetic shielding shell and a main body installed in the magnetic shielding shell, and the main body includes a skeleton, a main excitation coil, an auxiliary excitation coil and a magnetic core;

[0006] The skeleton has a hollow accommodating cavity, the magnetic core is installed in the accommodating cavity, the main excitation coil and the auxiliary excitation coil are both hollow cylindrical coils, the main excitation coil and the auxiliary excitation coil are sleeved on the outer periphery of the skeleton, and the main excitation coil, the auxiliary excitation coil and the magnetic core are coaxially arranged.

[0007] In some embodiments, the main excitation coil and the auxiliary excitation coil are arranged up and down along the height direction of the skeleton.

[0008] In some embodiments, a limiting portion is provided on the periphery of the skeleton, and the main excitation coil and the auxiliary excitation coil are respectively located on both sides of the limiting portion.

[0009] In some embodiments, the number of the main excitation coils is two, and the number of the auxiliary excitation coil is one;

[0010] The two main excitation coils are arranged at intervals in the vertical direction of the frame, the auxiliary excitation coil is located inside the two main excitation coils, and the main excitation coil and the auxiliary excitation coil are arranged coaxially.

[0011] In some embodiments, the circuit board includes a flexible circuit board.

[0012] In some embodiments, the number of turns of the main excitation coil is 1 to 2 times the number of turns of the auxiliary excitation coil.

[0013] In some embodiments, the relative magnetic permeability of the magnetic core is greater than 25,000.

[0014] In some embodiments, the bottom of the magnetic shielding shell is fixed to the circuit board by epoxy resin glue.

[0015] The implementation of the present invention has the following beneficial effects: the eddy current array probe adopts a magnetic shielding shell to shield a part of the electromagnetic interference of the array element to the external array element and the external array element to the array element, which can improve the detection accuracy. The provision of a magnetic core can increase the induced magnetic field strength, thereby increasing the defect signal amplitude.

[0016] The present application also discloses an eddy current array detection system, comprising the eddy current array probe described in any of the above embodiments, the eddy current array detection system also comprising a signal source module, a multiplexing module, a multiplexing and signal acquisition module and a microcontroller; the signal source module is connected to the multiplexing module, the multiplexing module is connected to the auxiliary excitation coils of all array elements in the eddy current array probe; the multiplexing and signal acquisition module is connected to the main excitation coils of all array elements in the eddy current array probe; the microcontroller is connected to the multiplexing module and the multiplexing and signal acquisition module; the microcontroller is used to control the signal strength of the auxiliary excitation coils of all array elements in the eddy current array probe;

[0017] Wherein, during excitation, the multiplexing and signal acquisition module transmits signals to the main excitation coil of the target array element; during acquisition, the multiplexing and signal acquisition module is used to acquire detection signals of the target array element.

[0018] In some embodiments, the eddy current array detection system further includes a power amplifier module, a programmable attenuation module, a pre-amplifier module, a phase-locked amplifier module, and an A / D conversion module; the power amplifier module is connected to the signal source module, and the programmable attenuation module is connected to the power amplifier module, the multiplexing module, and the microcontroller;

[0019] The pre-amplification module is connected to the multiplexing and signal acquisition module and the phase-locked amplification module, the phase-locked amplification module is connected to the signal source module and the A / D conversion module; the A / D conversion module is connected to the microcontroller;

[0020] The microcontroller is used to control the programmable attenuation module to control the signal strength of the auxiliary excitation coils of all array elements in the eddy current array probe.

[0021] The implementation of the present invention has the following beneficial effects: the eddy current array detection system can balance the detection signal of each array element by adjusting the strength of the auxiliary excitation coil signal, remove the background noise generated by the interference magnetic field of other array elements, the magnetic field difference caused by the inconsistency of the array elements, etc., and improve the sensitivity and accuracy of defect detection.

[0022] The present application also discloses a calibration method for an eddy current array detection system, which is applied to the eddy current array detection system described in the above embodiment. The calibration method for an eddy current array detection system comprises:

[0023] Calibration is performed at a defect-free location of the test sample, and the sizes of the detection signals of all array elements of the eddy current array probe are compared to select a suitable signal strength. The strength of the auxiliary excitation coil signal of the array element of the eddy current array probe is adjusted to balance the detection signal of each array element and obtain a suitable coupling excitation magnetic field.

[0024] The implementation of the present invention has the following beneficial effects: the eddy current array detection system calibration method is applied to the eddy current array detection system, which can balance the detection signal of each array element by adjusting the strength of the auxiliary excitation coil signal, remove the background noise generated by the interference magnetic field of other array elements, the magnetic field difference caused by the inconsistency of the array elements, etc., and improve the sensitivity and accuracy of defect detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solution of the present invention, the present invention will be further described below in conjunction with the accompanying drawings and embodiments. It should be understood that the following drawings only show certain embodiments of the present invention and should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work. In the drawings:

[0026] Figure 1 is one of the structural schematic diagrams of the eddy current array probe in some embodiments of the present invention;

[0027] Figure 2 is the second structural schematic diagram of the eddy current array probe in some embodiments of the present invention;

[0028] Figure 3is a partial structural cross-sectional view of an eddy current array probe in some embodiments of the present invention;

[0029] Figure 4 is a schematic diagram of the structure of an eddy current array detection system in some embodiments of the present invention;

[0030] Figure 5 It is a schematic diagram of the structure of the detection sample in some embodiments of the present invention. DETAILED DESCRIPTION

[0031] In order to have a clearer understanding of the technical features, purposes and effects of the present invention, the specific embodiments of the present invention are now described in detail with reference to the accompanying drawings. In the following description, it should be understood that the directions or positional relationships indicated by "front", "back", "up", "down", "left", "right", "longitudinal", "horizontal", "vertical", "horizontal", "top", "bottom", "inside", "outside", "head", "tail", etc. are based on the directions or positional relationships shown in the accompanying drawings, are constructed and operated in a specific direction, and are only for the convenience of describing the present technical solution, rather than indicating that the device or element referred to must have a specific direction, and therefore cannot be understood as a limitation to the present invention.

[0032] It should also be noted that, unless otherwise clearly specified and limited, the terms such as "installed", "connected", "connected", "fixed", "set" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral one; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. When an element is referred to as being "on" or "under" another element, the element can be "directly" or "indirectly" located on the other element, or there may be one or more intermediate elements. The terms "first", "second", "third", etc. are only for the convenience of describing the present technical solution, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first", "second", "third", etc. can explicitly or implicitly include one or more of the features. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to the specific circumstances.

[0033] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present invention. However, it should be clear to those skilled in the art that the present invention may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present invention.

[0034] See also Figures 1 to 3 The present invention shows an eddy current array probe 10. Eddy current array (ECA) detection technology is a development of eddy current detection technology. It drives multiple eddy current coils electronically, which can provide a larger scanning area while maintaining high resolution and reducing the complexity of mechanical and automatic scanning systems.

[0035] The eddy current array probe 10 includes a circuit board 11, on which a plurality of array elements 12 are arranged. Each of the array elements 12 includes a magnetic shielding shell 121 and a main body 122 installed in the magnetic shielding shell 121. The magnetic shielding shell 121 is roughly cylindrical. The entire magnetic shielding shell 121 can be made of magnetic shielding materials, which include but are not limited to iron, silicon steel sheets, Permalloy and μ metal.

[0036] The main body 122 includes a frame 1221 , a main excitation coil 1222 , an auxiliary excitation coil 1223 and a magnetic core 1224 .

[0037] The skeleton 1221 has a hollow accommodating cavity, and the magnetic core 1224 is installed in the accommodating cavity. The main excitation coil 1222 and the auxiliary excitation coil 1223 are both hollow cylindrical coils, and the main excitation coil 1222 and the auxiliary excitation coil 1223 are wound separately. The main excitation coil 1222 and the auxiliary excitation coil 1223 are sleeved on the outer periphery of the skeleton 1221, and the main excitation coil 1222, the auxiliary excitation coil 1223 and the magnetic core 1224 are coaxially arranged.

[0038] The eddy current array probe 10 uses a magnetic shielding shell 121 to shield a portion of the electromagnetic interference of the array element 12 to the external array element 12 and the external array element 12 to the array element 12, which can improve the detection accuracy. The magnetic core 1224 is provided to increase the induced magnetic field strength, thereby increasing the defect signal amplitude. In some embodiments, the relative magnetic permeability of the magnetic core 1224 is greater than 25000. It can be understood that the relative magnetic permeability of the magnetic core 1224 is above 25000, which can enhance the internal magnetic flux density of the metal material being tested, thereby increasing the defect signal amplitude.

[0039] In some embodiments, the main excitation coil 1222 and the auxiliary excitation coil 1223 are arranged up and down along the height direction of the skeleton 1221. The main excitation coil 1222 may be on the lower side in the height direction of the skeleton 1221, and the auxiliary excitation coil 1223 may be on the upper side in the height direction of the skeleton 1221. Alternatively, the main excitation coil 1222 may be on the upper side in the height direction of the skeleton 1221, and the auxiliary excitation coil 1223 may be on the lower side in the height direction of the skeleton 1221.

[0040] In some embodiments, a limiting portion 12211 is disposed on the periphery of the skeleton 1221 , and the main excitation coil 1222 and the auxiliary excitation coil 1223 are respectively located on two sides of the limiting portion 12211 .

[0041] In some embodiments, the number of the main excitation coils 1222 is two, the number of the auxiliary excitation coil 1223 is one, the two main excitation coils 1222 are arranged at intervals in the height direction of the frame 1221, the auxiliary excitation coil 1223 is located inside the two main excitation coils 1222, and the main excitation coil 1222 is coaxially arranged with the auxiliary excitation coil 1223. Understandably, three coils can be arranged in a single array element 12, two coils are for excitation, and the third coil is for reception, and the receiving coil is coaxial with the two excitation coils and is located inside the two excitation coils.

[0042] In some embodiments, the circuit board 11 includes a flexible circuit board (FPCB). Each array element 12 is welded and fixed on the flexible circuit board (FPCB) to form a semi-flexible eddy current array probe, which can be applied to detection scenarios of different surfaces with larger curvatures without redesigning and manufacturing the probe. During calibration, the eddy current array detection system and the eddy current array detection system calibration method are used to adjust and realize active removal of background noise.

[0043] In some embodiments, the bottom of the magnetic shielding shell 121 is fixed to the circuit board 11 by epoxy resin glue 123 , and the ends of the main excitation coil 1222 and the auxiliary excitation coil 1223 may be electrically connected to the circuit board 11 .

[0044] In some embodiments, the number of turns of the main excitation coil 1222 is 1 to 2 times the number of turns of the auxiliary excitation coil 1223, and the other parts are the same. For example, the material and wire diameter of the main excitation coil 1222 and the auxiliary excitation coil 1223 are the same.

[0045] In some embodiments, the main excitation coil 1222 is both an excitation coil and a detection coil, and two ends of the main excitation coil 1222 can be connected to a multiplexing and signal acquisition module.

[0046] In some embodiments, the two ends of the auxiliary excitation coil 1223 can be connected to a multiplexing module. The main excitation coil 1222 and the auxiliary excitation coil 1223 can be respectively fed with excitation signals with opposite directions. In the present application, the coil excitation loading and coil configuration scheme of each array element 12 can be as shown in the following table. If the auxiliary excitation coil 1223 and the main excitation coil 1222 have the same winding direction, the auxiliary excitation coil 1223 and the main excitation coil 1222 are loaded with excitation signals of opposite phases; if the auxiliary excitation coil 1223 and the main excitation coil 1222 have opposite winding directions, the auxiliary excitation coil 1223 and the main excitation coil 1222 are loaded with excitation signals of the same phase.

[0047]

[0048] Among them, when the multiplexing and signal acquisition module is turned on, the main excitation coil 1222 generates an excitation magnetic field. On the one hand, the excitation magnetic field induces eddy currents in the measured component for detection, and on the other hand, its radial component will also affect the main excitation coil 1222 (detection coil) of the adjacent array element 12, generating an electromagnetic coupling effect. When the multiplexing module and the multiplexing and signal acquisition module are turned on at the same time, the auxiliary excitation coil 1223 is opposite to the excitation magnetic field generated by the main excitation coil 1222, and decays rapidly in the axial direction. This magnetic field can greatly offset the radial component of the excitation magnetic field generated by the excitation coil outside the array element 12, and has little effect on the axial magnetic field that excites eddy currents in the measured component, thereby weakening the electromagnetic coupling between the main excitation coils 1222 (detection coils) of adjacent array elements 12, and will not affect the detection capability of the eddy current array probe 10.

[0049] like Figure 4 As shown, the present application also discloses an eddy current array detection system, which includes the eddy current array probe 10 of the above embodiment. The eddy current array detection system also includes a signal source module, a multiplexing module, a multiplexing and signal acquisition module and a microcontroller.

[0050] The signal source module is connected to the multiplexing module, the multiplexing module is connected to the auxiliary excitation coils 1223 of all array elements 12 in the eddy current array probe 10, and the multiplexing module is connected to the two ends of the auxiliary excitation coils 1223 of all array elements 12 in the eddy current array probe 10; the multiplexing and signal acquisition module is connected to the main excitation coils 1222 of all array elements 12 in the eddy current array probe 10, and the multiplexing and signal acquisition module is connected to the two ends of the main excitation coils 1222 of all array elements 12 in the eddy current array probe 10; the microcontroller is connected to the multiplexing module and the multiplexing and signal acquisition module; the microcontroller is used to control the signal strength of the auxiliary excitation coils 1223 of all array elements 12 in the eddy current array probe 10.

[0051] During excitation, the multiplexing and signal acquisition module receives the signal of the power amplification module and transmits it to the main excitation coil 1222 of the target array element 12; during acquisition, the multiplexing and signal acquisition module is used to acquire the detection signal of the target array element 12.

[0052] In some embodiments, the eddy current array detection system further includes a power amplifier module, a programmable attenuation module, a preamplifier module, a phase-locked amplifier module, and an A / D conversion module; the power amplifier module is connected to the signal source module, the programmable attenuation module is connected to the power amplifier module, the multiplexing module, and the microcontroller. The preamplifier module is connected to the multiplexing and signal acquisition module and the phase-locked amplifier module, the phase-locked amplifier module is connected to the signal source module and the A / D conversion module; the A / D conversion module is connected to the microcontroller.

[0053] The microcontroller is used to control the programmable attenuation module to control the signal strength of the auxiliary excitation coils 1223 of all array elements 12 in the eddy current array probe 10 .

[0054] During excitation, the multiplexing and signal acquisition module receives the signal of the power amplification module and transmits it to the main excitation coil 1222 of the target array element 12; during acquisition, the multiplexing and signal acquisition module is used to acquire the detection signal of the target array element 12.

[0055] Understandably, the programmable attenuation module is connected to the multiplexing module, the multiplexing module is connected to the auxiliary excitation coil 1223 of the array element 12 in the eddy current array probe 10, and the microcontroller controls the programmable attenuation module to control the signal strength in the auxiliary excitation coil 1223 of all the array elements 12. The multiplexing and signal acquisition module can realize the transmission of bidirectional signals and is connected to the main excitation coil 1222 of the array element 12 in the eddy current array probe 10.

[0056] During excitation, the multiplexing and signal acquisition module can receive the signal of the power amplifier module and transmit it to the main excitation coil of the target array element under the control of the microcontroller. During acquisition, the multiplexing and signal acquisition module can realize the acquisition of the detection signal of the target array element 12 under the control of the microcontroller.

[0057] The eddy current array detection system can balance the detection signal of each array element 12 by adjusting the strength of the auxiliary excitation coil 1223 signal, remove the background noise caused by the interference magnetic field of other array elements 12, the magnetic field difference caused by the inconsistency of the array elements 12, and improve the sensitivity and accuracy of defect detection. It can effectively improve the detection consistency between the array elements 12, and improve the detection sensitivity, accuracy, detection efficiency, and defect recognition ability.

[0058] In some embodiments, in addition to the microcontroller, other microprocessors, digital signal processors, microcomputers, central processing units, field programmable gate arrays, programmable logic devices, state machines, logic circuits, analog circuits, digital circuits and / or any devices that operate signals (analog and / or digital) based on operating instructions can also be selected, without specific limitation here.

[0059] The present application also discloses a calibration method for an eddy current array detection system, which is applied to the eddy current array detection system of the above embodiment. The calibration method for an eddy current array detection system includes:

[0060] Calibration is performed at a defect-free location of the test sample, and the sizes of the detection signals of all array elements 12 of the eddy current array probe 10 are compared to select a suitable signal strength, and the strength of the signal of the auxiliary excitation coil 1223 of the array element 12 of the eddy current array probe 10 is adjusted to balance the detection signal of each array element 12 to obtain a suitable coupling excitation magnetic field.

[0061] Preferably, the test sample (such as Figure 5 The eddy current array detection system (such as a microcontroller) generates a calibration signal internally. By comparing the output signal of the main excitation coil 1222 (detection coil) of each array element 12 with the calibration signal, it can be determined whether the detection signals of each array element 12 are consistent, and the strength of the signal of the auxiliary excitation coil 1223 is adjusted accordingly to balance the detection signal of each array element 12, and obtain a suitable coupling excitation magnetic field, so as to actively remove background noise and compensate for the inconsistency of each array element, improve the sensitivity and accuracy of detection, and after one calibration, each array element 12 can be used for accurate detection of the same curvature surface. The suitable coupling excitation magnetic field is the detection signal excitation magnetic field of each array element 12 after balancing. Specifically, the determination of the appropriate signal size is based on the situation when the impedance plane diagram occupies about 80% of the entire display window.

[0062] The eddy current array detection system calibration method can balance the detection signal of each array element 12 by adjusting the strength of the auxiliary excitation coil 1223 signal, remove the background noise generated by the interference magnetic field of other array elements 12, the magnetic field difference caused by the inconsistency of the array elements 12, and improve the sensitivity and accuracy of defect detection. It can effectively improve the detection consistency between the array elements 12, and improve the detection sensitivity, accuracy, detection efficiency, and defect recognition ability.

[0063] It can be understood that the above embodiments only express the preferred implementation modes of the present invention, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the patent scope of the present invention. It should be pointed out that, for ordinary technicians in this field, without departing from the concept of the present invention, the above technical features can be freely combined, and several deformations and improvements can be made, which all belong to the protection scope of the present invention. Therefore, all equivalent changes and modifications made to the scope of the claims of the present invention should belong to the scope covered by the claims of the present invention.

Claims

1. An eddy current array probe, characterized in that: The invention comprises a circuit board (11), wherein a plurality of array elements (12) are arranged on the circuit board (11), each of the array elements (12) comprises a magnetic shielding shell (121) and a main body (122) installed in the magnetic shielding shell (121), and the main body (122) comprises a skeleton (1221), a main excitation coil (1222), an auxiliary excitation coil (1223) and a magnetic core (1224); The skeleton (1221) has a hollow accommodating cavity, the magnetic core (1224) is installed in the accommodating cavity, the main excitation coil (1222) and the auxiliary excitation coil (1223) are both hollow cylindrical coils, the main excitation coil (1222) and the auxiliary excitation coil (1223) are sleeved on the outer periphery of the skeleton (1221), and the main excitation coil (1222), the auxiliary excitation coil (1223) and the magnetic core (1224) are coaxially arranged.

2. The eddy current array probe according to claim 1, characterized in that: The main excitation coil (1222) and the auxiliary excitation coil (1223) are arranged up and down along the height direction of the skeleton (1221).

3. The eddy current array probe according to claim 2, characterized in that: A limiting portion (12211) is provided on the outer periphery of the skeleton (1221), and the main excitation coil (1222) and the auxiliary excitation coil (1223) are respectively located on both sides of the limiting portion (12211).

4. The eddy current array probe according to claim 1, characterized in that: The number of the main excitation coils (1222) is two, and the number of the auxiliary excitation coil (1223) is one; The two main excitation coils (1222) are arranged at intervals in the vertical direction of the frame (1221), the auxiliary excitation coil (1223) is located inside the two main excitation coils (1222), and the main excitation coil (1222) and the auxiliary excitation coil (1223) are coaxially arranged.

5. The eddy current array probe according to claim 1, characterized in that: The circuit board (11) comprises a flexible circuit board.

6. The eddy current array probe according to claim 1, characterized in that: The number of turns of the main excitation coil (1222) is 1 to 2 times the number of turns of the auxiliary excitation coil (1223).

7. The eddy current array probe according to claim 1, characterized in that: The relative magnetic permeability of the magnetic core (1224) is greater than 25,000.

8. The eddy current array probe according to claim 1, characterized in that: The bottom of the magnetic shielding shell (121) and the circuit board (11) are fixed by epoxy resin glue (123).

9. An eddy current array detection system, characterized in that: The eddy current array probe comprises the eddy current array detection system according to any one of claims 1 to 8, and the eddy current array detection system further comprises a signal source module, a multiplexing module, a multiplexing and signal acquisition module and a microcontroller; the signal source module is connected to the multiplexing module, and the multiplexing module is connected to the auxiliary excitation coils (1223) of all array elements (12) in the eddy current array probe; the multiplexing and signal acquisition module is connected to the main excitation coils (1222) of all array elements (12) in the eddy current array probe; the microcontroller is connected to the multiplexing module and the multiplexing and signal acquisition module; the microcontroller is used to control the signal strength of the auxiliary excitation coils (1223) of all array elements (12) in the eddy current array probe; During excitation, the multiplexing and signal acquisition module transmits a signal to a main excitation coil (1222) of the target array element (12); during acquisition, the multiplexing and signal acquisition module is used to acquire a detection signal of the target array element (12).

10. The eddy current array detection system according to claim 9, characterized in that: The eddy current array detection system also includes a power amplifier module, a programmable attenuation module, a pre-amplifier module, a phase-locked amplifier module, and an A / D conversion module; the power amplifier module is connected to the signal source module, and the programmable attenuation module is connected to the power amplifier module, the multiplexing module, and the microcontroller; The pre-amplification module is connected to the multiplexing and signal acquisition module and the phase-locked amplification module, the phase-locked amplification module is connected to the signal source module and the A / D conversion module; the A / D conversion module is connected to the microcontroller; The microcontroller is used to control the programmable attenuation module to control the signal strength of the auxiliary excitation coils (1223) of all array elements (12) in the eddy current array probe.

11. A method for calibrating an eddy current array detection system, applied to the eddy current array detection system according to claim 9 or 10, characterized in that: The eddy current array detection system calibration method comprises: Calibration is performed at a defect-free location of the test sample, the magnitudes of the detection signals of all array elements (12) of the eddy current array probe are compared to select a suitable signal strength, the strength of the signal of the auxiliary excitation coil (1223) of the array element (12) of the eddy current array probe is adjusted to balance the detection signal of each array element (12), and a suitable coupling excitation magnetic field is obtained.

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