A method and system for testing offset voltage of a current detection amplifier

Abstract

The present invention relates to the technical field of current detection amplifiers, and in particular to a current detection amplifier offset voltage test method and system. The method comprises: obtaining a voltage sequence obtained by testing the current detection amplifier each time; selecting a voltage sequence with the smallest volatility as a basic voltage sequence; establishing a window with a peak point in the basic voltage sequence as the center; calculating the first fluctuation characteristic value of the peak point in the center of the window according to the peak point in the window and other voltage data; calculating the second fluctuation characteristic value of the peak point according to a peak point in the basic voltage sequence, voltage data at the same time as the peak point in other voltage sequences, and the peak point in the window corresponding to the peak point; calculating the authenticity of the peak point based on the first and second fluctuation characteristic values ​​of the peak point in the basic voltage sequence, and then screening the peak point to obtain the real peak point; obtaining the real offset voltage according to the real peak point. The present invention can obtain accurate real offset voltage.

Description

Technical Field

[0001] The present invention relates to the technical field of current detection amplifiers, and in particular to a current detection amplifier offset voltage testing method and system. Background Art

[0002] A current sense amplifier is an electronic device designed to measure and amplify current signals. Offset voltage refers to the difference between the voltage measured at the output of an amplifier and the ideal voltage (which should be zero) when there is no input signal. Testing the amplifier for offset voltage ensures the accuracy of the amplifier and the reliability of the current sense amplifier during use.

[0003] At present, the existing technology for testing the offset voltage of the current detection amplifier mostly adopts differential input testing, that is, applying two identical current signals to the two input terminals of the amplifier, measuring the voltage value at the output terminal, and obtaining the offset voltage based on the difference between the measured output voltage and zero. However, this test method is very susceptible to external interference factors, such as power supply fluctuations, temperature changes, and other electromagnetic signal influences, which leads to inaccurate offset voltage obtained by the test. Summary of the invention

[0004] In order to solve the above technical problems, the purpose of the present invention is to provide a current detection amplifier offset voltage test method and system, the technical solution adopted is as follows:

[0005] In a first aspect, an embodiment of the present invention provides a method for testing an offset voltage of a current detection amplifier, the method comprising:

[0006] Testing the current detection amplifier a preset number of times, obtaining voltage data of the output end of the current detection amplifier in each test, and forming a voltage sequence for each test;

[0007] Calculate the volatility of each voltage sequence respectively, and select the voltage sequence with the smallest volatility as the basic voltage sequence; obtain the peak points in the basic voltage sequence, and establish windows with each peak point as the center; calculate the first fluctuation characteristic value of the peak point at the center of the window based on the peak points in the window and other voltage data;

[0008] Calculate the second fluctuation characteristic value of the peak point according to a peak point in the basic voltage sequence, voltage data at the same time as the peak point in other voltage sequences, and the peak point in the window corresponding to the peak point;

[0009] The authenticity of the peak point is calculated based on the first and second fluctuation characteristic values ​​of the peak point in the basic voltage sequence; the peak point is screened according to the authenticity of the peak point to obtain the real peak point; and the real offset voltage is obtained according to the real peak point.

[0010] Preferably, the testing of the current detection amplifier for a preset number of times includes:

[0011] Each time the current detection amplifier is tested, the current signals input to the two input terminals are of the same magnitude, and as the number of tests increases, the current signals input to the two input terminals increase at a set step size; wherein the test duration of each test is a preset duration.

[0012] Preferably, the step of calculating the volatility of each voltage sequence respectively and selecting the voltage sequence with the smallest volatility as the basic voltage sequence comprises:

[0013] The variance of each voltage sequence is calculated, and the voltage sequence with the smallest variance is selected as the basic voltage sequence. The variance is the volatility of the power industry sequence.

[0014] Preferably, the calculation formula of the first fluctuation characteristic value is:

[0015] ,

[0016] in, Represents the first fluctuation characteristic value of the qth peak point in the basic voltage sequence; represents the number of peak points in the window centered at the qth peak point in the basic voltage sequence; represents the i-th peak point in the window centered at the q-th peak point; Indicates the qth peak point in the basic voltage sequence; Represents the variance of the voltage data within the window centered at the qth peak point; and They respectively represent the q-1th peak point and the q+1th peak point in the basic voltage sequence; norm represents the normalization operation; | | represents the absolute value.

[0017] Preferably, the calculation formula of the second fluctuation characteristic value is:

[0018] ,

[0019] in, Represents the second fluctuation characteristic value of the qth peak point in the basic voltage sequence; Indicates the number of other voltage sequences besides the basic voltage sequence; represents the qth peak point in the jth voltage sequence; Indicates the qth peak point in the basic voltage sequence; represents the number of data points in the window centered at the qth peak point in the basic voltage series; and They respectively represent the i-th peak point and the i+1-th peak point in the window centered on the q-th peak point; norm represents the normalization operation; exp() represents the exponential function with a natural constant as the base.

[0020] Preferably, calculating the authenticity of the peak point based on the first and second fluctuation characteristic values ​​of the peak point in the basic voltage sequence comprises:

[0021] The ratio of the second fluctuation characteristic value to the first fluctuation characteristic value of the peak point in the basic voltage sequence is the authenticity of the peak point.

[0022] Preferably, the peak points are screened according to the authenticity of the peak points to obtain the true peak points, including:

[0023] A threshold is set. When the authenticity of a peak point in the basic voltage sequence is greater than or equal to the threshold, the peak point is a true voltage point.

[0024] Preferably, obtaining the real offset voltage according to the real peak point includes:

[0025] Calculate the average of the voltage data of all real voltage points in the basic voltage sequence as the real offset voltage of the current sensing amplifier.

[0026] In a second aspect, the present invention also provides a current detection amplifier offset voltage testing system, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the computer program is executed by the processor, the steps of a current detection amplifier offset voltage testing method are implemented.

[0027] The embodiments of the present invention have at least the following beneficial effects: the present invention performs multiple tests on the current detection amplifier to obtain the voltage data at the output end of each test of the current detection amplifier for subsequent analysis. The data obtained through multiple tests can improve the accuracy of subsequent calculation of the true offset voltage; further, the voltage sequence is screened according to the volatility of the voltage sequence to obtain the voltage sequence with the smallest volatility as the basis for calculating the offset voltage, thereby reducing the error of the offset voltage; at the same time, the fluctuation of the peak point is analyzed to obtain the influence characteristics of the environment on the voltage fluctuation, and the first fluctuation characteristic value of the peak point is obtained, and the second fluctuation characteristic value is obtained by combining the correlation of the data between the multiple tests, thereby reducing the error of the peak point analysis and improving the accuracy of calculating the authenticity of the peak point according to the first and second fluctuation characteristic values ​​of the peak point; finally, the possibility that the peak point in the basic voltage sequence is caused by environmental abnormality is judged by the authenticity, most of the environmental influences are eliminated, the true peak point is obtained, and a more accurate measurement of the offset voltage value is obtained. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0029] Figure 1 A method flow chart of a current detection amplifier offset voltage testing method provided by an embodiment of the present invention;

[0030] Figure 2 A schematic diagram of a current detection amplifier of a current detection amplifier offset voltage testing method and system provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0031] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of a current detection amplifier offset voltage test method and system proposed by the present invention, its specific implementation, structure, features and effects, in conjunction with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures, or characteristics in one or more embodiments may be combined in any suitable form.

[0032] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0033] The specific scheme of a current detection amplifier offset voltage testing method and system provided by the present invention is described in detail below with reference to the accompanying drawings.

[0034] Exemplary methods:

[0035] The main application scenarios of the present invention are:

[0036] When testing the offset voltage of a current detection amplifier, it is easily affected by power supply fluctuations, temperature changes, other electromagnetic signal interference and other factors, resulting in inaccurate offset voltage. The present invention analyzes these interference factors to obtain the characteristics shown in the output voltage data, calculates the authenticity of the output voltage data, and then calculates the accurate offset voltage value, eliminating the influence of external interference factors on the offset voltage test results.

[0037] See also Figure 1 , which shows a method flow chart of a current detection amplifier offset voltage test method provided by an embodiment of the present invention, the method comprising the following steps:

[0038] Step S1, testing the current detection amplifier for a preset number of times, obtaining voltage data of the output end of the current detection amplifier in each test, and forming a voltage sequence for each test;

[0039] Step S2, respectively calculating the volatility of each voltage sequence, selecting the voltage sequence with the smallest volatility as the basic voltage sequence; obtaining the peak points in the basic voltage sequence, and establishing windows with each peak point as the center; calculating the first fluctuation characteristic value of the peak point at the center of the window based on the peak points in the window and other voltage data;

[0040] Step S3, calculating a second fluctuation characteristic value of a peak point according to a peak point in the basic voltage sequence, voltage data at the same time as the peak point in other voltage sequences, and peak points in a window corresponding to the peak point;

[0041] Step S4, calculating the authenticity of the peak point based on the first and second fluctuation characteristic values ​​of the peak point in the basic voltage sequence; screening the peak points according to the authenticity of the peak points to obtain the real peak points; and obtaining the real offset voltage according to the real peak points.

[0042] Specifically, in step S1, a current detection amplifier is tested for a preset number of times, and voltage data of the output terminal of the current detection amplifier is obtained in each test, which respectively constitutes a voltage sequence for each test.

[0043] When testing a current detection amplifier, you first need to set up a differential input test circuit, then adjust the current signal size of the two input terminals of the current detection amplifier, perform multiple tests, and monitor the voltage data at the output terminal. Figure 2 As shown, the two input terminals are input terminal 1 and input terminal 2.

[0044] Specifically, the current detection amplifier is tested for a preset number of times, and the current signals input to the two input terminals of the current detection amplifier are the same in magnitude each time the test is performed, and the current signals input to the two input terminals increase with a set step size each time the test is performed; preferably, in an embodiment of the present invention, the value of the preset number of times is 5 times, the set step size is 1mA, the current signal size of the two input terminals in the first test is 1mA, the current signal size of the two input terminals in the second test is 2mA, the current signal size of the two input terminals in the third test is 3mA, the current signal size of the two input terminals in the fourth test is 4mA, and the current signal size of the two input terminals in the fifth test is 5mA, and each test increases by 1mA. It should be noted that the values ​​of the preset number of times and the set step size can be determined by the implementer according to actual conditions. The test duration of each test is the preset duration, which is 1min in the embodiment of the present invention.

[0045] During each test, the voltage data of the output end of the current detection amplifier is collected at a frequency of 10 Hz, thereby obtaining the voltage data of the output end during each test, wherein the voltage data of the output end of each test constitutes a voltage sequence, and each test corresponds to a voltage sequence.

[0046] Step S2, respectively calculate the volatility of each voltage sequence, select the voltage sequence with the smallest volatility as the basic voltage sequence; obtain the peak points in the basic voltage sequence, and establish windows with each peak point as the center; calculate the first fluctuation characteristic value of the peak point at the center of the window based on the peak points in the window and other voltage data.

[0047] Ideally, when current signals of the same magnitude are input into the two input terminals, the voltage at the output terminal of the current detection amplifier is very stable. Therefore, a voltage sequence needs to be screened out from the five voltage sequences obtained as the basis for subsequent analysis. When selecting, a voltage sequence with the smallest volatility needs to be selected for subsequent analysis. The variance of each voltage sequence is further calculated, and the volatility of each voltage sequence is represented by the variance. The voltage sequence with the smallest variance is selected as the basic voltage sequence. If there are multiple minimum variances, any one can be selected.

[0048] Under normal interference-free conditions, the monitored output voltage should be relatively stable, that is, it only fluctuates within a small range. However, when the test is interfered by other signals in the external environment, such as the switching of other equipment, noise in the environment, etc., or when it is affected by abnormal fluctuations in the power supply, it will show obvious spike signals or irregular fluctuations. Therefore, the fluctuation characteristics of the voltage data can reflect the abnormal situation of the voltage.

[0049] The AMPD peak search algorithm is used to obtain the peak points in the basic voltage sequence and the other four voltage sequences, and then the peak points are analyzed to obtain voltage data points with abnormal characteristics from the peak points. This is because both the voltage fluctuation caused by environmental interference and the fluctuation corresponding to the offset voltage are presented in the form of fluctuations, so the peak of each fluctuation is obtained here to represent each corresponding fluctuation (because the abnormality or imbalance is presented in the form of fluctuations, and the peak represents the fluctuation here, so there is no need to consider other data points that are not peaks).

[0050] Since normal voltage data should be relatively stable, that is, the voltage will not fluctuate greatly within a certain period of time, in order to show the fluctuation characteristics of each fluctuating voltage data, a window is established with the monitoring time of the peak point in the basic voltage sequence as the center, where the length of the window is a set length. The set length of the window in the embodiment of the present invention is 1s. According to the fluctuation of the data in the window, the fluctuation characteristic value of the peak point in the center of the window is calculated.

[0051] When other equipment is turned on or off during the test, the voltage data will have an obvious peak value, that is, the voltage data is significantly different from other voltage data in the corresponding time period. Therefore, the difference between the voltage data and other voltage data in the corresponding time period can reflect the abnormal fluctuation characteristics of the voltage data.

[0052] In addition, when the test process is disturbed by power fluctuations or continuous noise, there will be no obvious abnormal values, but irregular fluctuations, which are manifested as obvious voltage fluctuations and large differences in fluctuation amplitudes. The obviousness of voltage fluctuations is calculated based on the difference between adjacent voltage data. At the same time, the standard deviation of the voltage value in the corresponding time period is obtained. According to the standard deviation of the voltage value in the corresponding time period, the difference in the voltage fluctuation amplitude in the time period is reflected. The larger the difference, the more obvious the voltage fluctuation is, which can represent the voltage data with abnormal characteristics.

[0053] Furthermore, the first fluctuation characteristic value of the peak point at the center of the window is calculated according to the peak point and other voltage data in the window, wherein the calculation formula of the first fluctuation characteristic value is:

[0054] ,

[0055] in, Represents the first fluctuation characteristic value of the qth peak point in the basic voltage sequence; represents the number of peak points in the window centered at the qth peak point in the basic voltage sequence; represents the i-th peak point in the window centered at the q-th peak point; Indicates the qth peak point in the basic voltage sequence; Represents the variance of the voltage data within the window centered at the qth peak point; and They respectively represent the q-1th peak point and the q+1th peak point in the basic voltage sequence; norm represents the normalization operation; | | represents the absolute value.

[0056] It is the cumulative sum of the differences between the qth peak point and other peak points in the window. The larger the value, the greater the difference between the qth peak point and other voltage data in the corresponding time period, and the stronger the abnormal fluctuation characteristics. The larger it is, the more frequent and larger the fluctuation of the data in the front and back fields at the qth peak point is; It is the mean value of the difference between the qth peak point and the adjacent peak points before and after it. On the basis that the more frequent the data fluctuations before and after the peak, the greater the fluctuation amplitude. The greater the difference between the qth peak point and the adjacent peak points before and after it, the more obvious the fluctuation of the qth peak point is, and the more it has the abnormal fluctuation characteristics caused by continuous interference noise.

[0057] In this way, the first fluctuation characteristic value of all peak voltage data points in the basic voltage sequence can be obtained, and the data distribution characteristics at the peak points can be comprehensively distributed to obtain peak characteristic points that can more accurately describe abnormal environmental fluctuations. The larger the characteristic value, the more abnormal environmental characteristics the fluctuation of the corresponding data point has.

[0058] Step S3, calculating the second fluctuation characteristic value of the peak point according to a peak point in the basic voltage sequence, voltage data at the same time as the peak point in other voltage sequences, and the peak points in the window corresponding to the peak point.

[0059] Since the output voltage will fluctuate to a certain extent under normal conditions, it is necessary to determine whether the voltage fluctuation is caused by an abnormal external environment based on the fluctuation characteristic values ​​of the output voltage in multiple tests.

[0060] Here, the second fluctuation characteristic value is constructed according to the fluctuation correlation characteristics of the voltage values ​​of multiple tests. In normal measurements, since the current values ​​of the two input terminals are the same in multiple tests, the offset voltage fluctuations in multiple measurements should be similar, and the external environment interference is different in each measurement. Here, the voltage value of the peak point at the same time in other measurements is obtained. The more similar the voltage value of the corresponding multiple tests is to the value of the current test, the more the fluctuation of the peak point in the current test conforms to the normal offset voltage fluctuation. Otherwise, on the contrary, it is more likely to be a fluctuation caused by environmental abnormalities, which is caused by the uncertainty of environmental abnormalities.

[0061] There is a certain possibility that the test will be disturbed by the temperature in the environment. In a high or low temperature environment, the voltage will gradually rise or fall due to thermal drift. This will cause a certain regularity in the abnormal fluctuation value. Therefore, the abnormal environmental fluctuation may appear similar in different tests. In order to exclude this type of fluctuation data, it is necessary to further check the continuous change characteristics of the peak point neighborhood. If the peak point in the peak point neighborhood shows a trend of continuous growth or continuous decline, the correlation between the corresponding peak and the normal offset voltage fluctuation is weaker.

[0062] Furthermore, the second fluctuation characteristic value of the peak point is calculated according to a peak point in the basic voltage sequence, voltage data at the same time as the peak point in other voltage sequences, and the peak point in the window corresponding to the peak point. The calculation formula of the second fluctuation characteristic value is:

[0063] ,

[0064] in, Represents the second fluctuation characteristic value of the qth peak point in the basic voltage sequence; Indicates the number of other voltage sequences besides the basic voltage sequence; represents the qth peak point in the jth voltage sequence; Indicates the qth peak point in the basic voltage sequence; represents the number of data points in the window centered at the qth peak point in the basic voltage series; and They respectively represent the i-th peak point and the i+1-th peak point in the window centered on the q-th peak point; norm is the linear normalization uniform magnitude; exp() represents an exponential function with a natural constant as the base.

[0065] It indicates the voltage value difference between the qth peak point in the current test and other tests at the same time. The smaller the difference, the stronger the similarity between the qth peak point and other tests at the same time, and the stronger the correlation with normal offset voltage fluctuation. It represents the difference between the i-th peak point and the i+1-th peak point in the window centered on the q-th peak point, that is, the difference between the previous peak and the next peak. The difference between all peaks and the next peak is combined and the absolute value is taken. The larger the value, the more likely the data distribution is caused by thermal drift, and the weaker the correlation. The larger it is, the more the qth peak point is consistent with the offset voltage.

[0066] Step S4, calculating the authenticity of the peak point based on the first and second fluctuation characteristic values ​​of the peak point in the basic voltage sequence; screening the peak points according to the authenticity of the peak points to obtain the real peak points; and obtaining the real offset voltage according to the real peak points.

[0067] In step S2 and step S3, the first fluctuation characteristic value and the second fluctuation characteristic value of each peak point in the basic voltage sequence are calculated respectively, and then the first fluctuation characteristic value and the second fluctuation characteristic value are integrated to obtain the true degree of each peak point in the basic voltage sequence, wherein the ratio of the second fluctuation characteristic value to the first fluctuation characteristic value of the peak point in the basic voltage sequence is the true degree of the peak point, and the specific calculation formula is:

[0068] ,

[0069] in, Indicates the true degree of the qth peak point in the basic voltage sequence; It represents the first fluctuation characteristic value of the qth peak point in the basic voltage sequence. The larger the characteristic value, the more abnormal environmental characteristics the fluctuation of the corresponding data point has, which is inversely proportional to the degree of truth. It represents the second fluctuation characteristic value of the qth peak point in the basic voltage sequence, that is, the fluctuation correlation feature of the qth data point. The stronger the correlation feature is, the more it conforms to the data distribution feature of normal offset voltage fluctuation. By combining the two parts of the features and eliminating various environmental interference factors, the authenticity of the voltage data can be obtained more accurately. Finally, it is also necessary to Normalization is performed to facilitate subsequent calculations.

[0070] Furthermore, a threshold is set. Preferably, in the embodiment of the present invention, the threshold is 0.7. When the authenticity of the peak point in the basic voltage sequence is greater than or equal to the threshold, the peak point is considered to be a true voltage point. It should be noted that the implementer can adjust the threshold according to actual conditions.

[0071] Finally, the real offset voltage is obtained according to the real peak point, that is, the offset voltage of the current detection amplifier is obtained by fitting the peak voltage points obtained by all non-environmental factors. The specific calculation formula is:

[0072] ,

[0073] Where U is the true offset voltage of the current sense amplifier; Indicates the number of real voltage points in the basic voltage series; Indicates the zth real voltage point in the basic voltage sequence; thereby eliminating the interference of environmental factors and obtaining a relatively more accurate offset voltage test value.

[0074] Exemplary Systems :

[0075] This embodiment provides a current detection amplifier offset voltage test system, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program implements the steps of a current detection amplifier offset voltage test method when executed by the processor. Since the above exemplary method has already described a current detection amplifier offset voltage test in detail, it will not be described in detail here.

[0076] In summary, this scheme proposes a current detection amplifier offset voltage test method and system, which analyzes the characteristics of these interference factors on the output voltage data, calculates the authenticity of the output voltage data, eliminates the influence of external interference factors on the offset voltage test results, and then calculates the accurate true offset voltage value.

[0077] It should be noted that the sequence of the above embodiments of the present invention is only for description and does not represent the advantages and disadvantages of the embodiments. The above is a description of a specific embodiment of this specification. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0078] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

[0079] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A current detection amplifier offset voltage test method, characterized in that: The method includes: Testing the current detection amplifier a preset number of times, obtaining voltage data of the output end of the current detection amplifier in each test, and forming a voltage sequence for each test; Calculate the volatility of each voltage sequence respectively, and select the voltage sequence with the smallest volatility as the basic voltage sequence; obtain the peak points in the basic voltage sequence, and establish windows with each peak point as the center; calculate the first fluctuation characteristic value of the peak point at the center of the window based on the peak points in the window and other voltage data; Calculate the second fluctuation characteristic value of the peak point according to a peak point in the basic voltage sequence, voltage data at the same time as the peak point in other voltage sequences, and the peak point in the window corresponding to the peak point; Calculate the authenticity of the peak point based on the first and second fluctuation characteristic values ​​of the peak point in the basic voltage sequence; screen the peak point according to the authenticity of the peak point to obtain the real peak point; and obtain the real offset voltage according to the real peak point; The calculation formula of the first fluctuation characteristic value is: ， in, Represents the first fluctuation characteristic value of the qth peak point in the basic voltage sequence; represents the number of peak points in the window centered at the qth peak point in the basic voltage sequence; represents the i-th peak point in the window centered at the q-th peak point; Indicates the qth peak point in the basic voltage sequence; Represents the variance of the voltage data within the window centered at the qth peak point; and They represent the q-1th peak point and the q+1th peak point in the basic voltage sequence respectively; norm represents the normalization operation; | | represents the absolute value; The calculation formula of the second fluctuation characteristic value is: ， in, Represents the second fluctuation characteristic value of the qth peak point in the basic voltage sequence; Indicates the number of other voltage sequences besides the basic voltage sequence; represents the qth peak point in the jth voltage sequence; Indicates the qth peak point in the basic voltage sequence; represents the number of peak points in the window centered at the qth peak point in the basic voltage sequence; and They represent the i-th peak point and the i+1-th peak point in the window centered at the q-th peak point respectively; norm represents the normalization operation; exp() represents the exponential function with a natural constant as the base; The ratio of the second fluctuation characteristic value to the first fluctuation characteristic value of the peak point in the basic voltage sequence is the authenticity of the peak point.

2. A current detection amplifier offset voltage testing method according to claim 1, characterized in that: The testing of the current detection amplifier for a preset number of times includes: Each time the current detection amplifier is tested, the current signals input to the two input terminals are of the same magnitude, and as the number of tests increases, the current signals input to the two input terminals increase at a set step size; wherein the test duration of each test is a preset duration.

3. The current detection amplifier offset voltage testing method according to claim 1, characterized in that: The step of calculating the volatility of each voltage sequence respectively and selecting the voltage sequence with the smallest volatility as the basic voltage sequence includes: The variance of each voltage sequence is calculated, and the voltage sequence with the smallest variance is selected as the basic voltage sequence. The variance is the volatility of the voltage sequence.

4. The current detection amplifier offset voltage testing method according to claim 1, characterized in that: The step of screening the peak points according to the authenticity of the peak points to obtain the true peak points includes: A threshold is set. When the authenticity of a peak point in the basic voltage sequence is greater than or equal to the threshold, the peak point is a true voltage point.

5. The current detection amplifier offset voltage testing method according to claim 1, characterized in that: The method of obtaining the real offset voltage according to the real peak point includes: Calculate the average of the voltage data of all real voltage points in the basic voltage sequence as the real offset voltage of the current sensing amplifier.

6. A current detection amplifier offset voltage test system, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the computer program is executed by a processor, the steps of a current detection amplifier offset voltage testing method as described in any one of claims 1 to 5 are implemented.

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