Zero setting test device and method

Abstract

The invention is suitable for the technical field of test equipment, and provides a zero setting test device and method, and the zero setting test device comprises a test support, a supporting platform deck, a probe installation seat, a driving mechanism, a rheostat, and a plurality of connection probes. During detection, the sensor is placed on the supporting platform deck and is connected with an external test circuit. And the driving mechanism drives the probe mounting seat to approach the supporting platform deck along the first direction until the connecting probe is in contact with the sensor. The resistance value of the rheostat is adjusted until the zero point output value of the sensor meets the requirement, and the resistance value of the rheostat is the resistance value of the zeroing resistor matched with the sensor. Compared with a zero setting test device in the prior art, the zero setting test device is simple in structure and convenient to operate and use, the resistance value of the zero setting resistor of the sensor can be rapidly measured, and the production efficiency of sensor products is improved.

Description

Technical Field

[0001] The invention belongs to the technical field of testing equipment, and in particular relates to a zeroing test device and method. Background Art

[0002] With the continuous advancement of science and technology and the continuous expansion of the market, high-precision, low-loss closed-loop Hall current sensors will become the mainstream trend. Closed-loop Hall current sensors (hereinafter referred to as sensors) are mainly based on the Hall effect and are prepared using circuit design technology. They are mainly used to convert the measured current signal into an electrical signal or other required signal output in accordance with a certain rule that meets certain standards. Among them, the core component of the sensor, the Hall element, is prepared using a semiconductor process. During the production process of the Hall element, it is affected by factors such as process deviation and packaging stress, resulting in the inevitable Hall offset voltage of the sensor, which leads to a deviation in the zero-point output of the sensor. In order to reduce the zero-point output deviation of the sensor, it is usually necessary to connect a corresponding zero-adjustment resistor in parallel to the peripheral circuit of the Hall element to adjust the zero-point offset voltage of the sensor. However, most of the existing sensors have the problem of low resistance detection efficiency of the zero-adjustment resistor during production, which seriously affects the production efficiency of the sensor and the product. Summary of the invention

[0003] The object of the present invention is to provide a zero adjustment test device and method, aiming to solve the technical problem of low resistance detection efficiency of zero adjustment resistors in sensor production in the prior art.

[0004] The present invention is implemented as follows. In the first aspect, a zeroing test device is provided. The zeroing test device comprises a test bracket, a support platform, a probe mounting seat, a driving mechanism, a variable resistor and a plurality of connecting probes. The support platform is used to place a sensor. The probe mounting seat is movably arranged on the test bracket. The driving mechanism is arranged on the test bracket, and the driving end of the driving mechanism is connected to the probe mounting seat. The driving mechanism is used to drive the probe mounting seat to approach or move away from the support platform along a first direction. A plurality of connecting probes are arranged on the probe mounting seat at intervals. One end of the connecting probe is electrically connected to the variable resistor, and the other end is used to abut against the connecting end of the sensor when the probe mounting seat is close to the support platform.

[0005] In an optional embodiment, the probe mounting base includes a main body and a rotating assembly, wherein the main body is slidably disposed on the test bracket and is connected to the driving end of the driving mechanism, the rotating assembly is disposed on the main body, and the rotating assembly has the freedom to rotate around its own axis relative to the main body, and the connecting probe is disposed on the rotating assembly.

[0006] In an optional embodiment, the rotating assembly includes a rotating member and a sliding block, the rotating member is rotatably connected to the main body, the number of the sliding blocks is multiple and matches the number of the connecting probes, the sliding blocks are all slidably arranged on the side of the rotating member facing the supporting platform, and the multiple connecting probes are respectively arranged on the sliding blocks.

[0007] In an optional embodiment, a sliding guide column is further provided on the rotating member, and a sliding guide through hole penetrating the sliding block is also provided on the sliding block. The sliding guide column is inserted into the sliding guide through hole, and the sliding guide column and the sliding block are both slidably connected.

[0008] In an optional embodiment, the driving mechanism includes a driving base, a driving push rod, a hinge assembly and a pushing handle, the driving base is arranged on the test bracket, the hinge assembly is hinged to the driving base, one end of the pushing handle is connected to the hinge assembly, the driving push rod is arranged on the driving base and has the freedom to slide along its own axis, one end of the driving push rod is hinged to the hinge assembly and the other end is connected to the main body.

[0009] In an optional embodiment, the variable resistor includes a resistance adjusting part and a resistance display module, the resistance adjusting part is used to be electrically connected to the connection probe and can adjust its own resistance, and the resistance display module is used to display the resistance of the resistance adjusting part.

[0010] In an optional embodiment, the supporting platform includes a fixing component and an adjusting mechanism, the fixing component is used to fix the sensor, a driving end of the adjusting mechanism is connected to the fixing component, and the adjusting mechanism is used to adjust the position of the fixing component.

[0011] In an optional embodiment, the adjustment mechanism includes an adjustment base, a first sliding seat, a second sliding seat, a first adjustment part and a second adjustment part, the first sliding seat is slidably set on the adjustment base, the second sliding seat is slidably set on the first sliding seat, the first adjustment part is located between the first sliding seat and the adjustment base, the first adjustment part is used to adjust the position of the first sliding seat along the second direction, the second adjustment part is located between the second sliding seat and the first sliding seat, the second adjustment part is used to adjust the position of the second sliding seat along the third direction, and the second direction and the third direction are both set at an angle.

[0012] In an optional embodiment, the fixing component is provided with a fixing groove for fixing the sensor, and the fixing groove matches the shape of the sensor.

[0013] In a second aspect, a sensor zeroing test method is provided, using any of the above zeroing test devices, comprising the following steps:

[0014] Place the sensor on a supporting platform and connect the sensor to an external test circuit;

[0015] The probe mounting seat is driven by a driving mechanism to approach the supporting platform along a first direction, and the probe mounting seat stops moving after the distance between the end of the connecting probe and the sensor reaches a preset range;

[0016] Adjust the distance between the connection probes according to the size of the sensor, and after the adjustment is completed, the driving mechanism drives the probe mounting seat to approach the support platform until the connection probe contacts the sensor;

[0017] Adjust the resistance of the variable resistor until the zero point output of the sensor meets the preset requirements.

[0018] The technical effect of the present invention relative to the prior art is: by setting a support platform on which the sensor can be placed, and movably connecting the probe mounting seat to the test bracket, a connection probe electrically connected to the variable resistor is also provided on the probe mounting seat. In addition, a driving mechanism can also drive the probe mounting seat to approach or move away from the support platform along a first direction, and when the probe mounting seat approaches the support platform, the connection probe can abut against the connection end of the sensor. When performing detection, the sensor is placed on the support platform and the sensor is connected to an external test circuit. The driving mechanism drives the probe mounting seat to approach the support platform along a first direction until the connection probe contacts the sensor. The resistance value of the variable resistor is adjusted until the zero-point output value of the sensor meets the requirements, and at this time, the resistance value of the variable resistor is the resistance value of the zero-adjusting resistor matched with the sensor. Compared with the zero-adjusting test device in the prior art, the structure is simple and easy to operate and use, and the resistance value of the zero-adjusting resistor of the sensor can be quickly measured, thereby improving the production efficiency of the sensor product.

[0019] It can be understood that the beneficial effects of the second aspect mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments of the present invention or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0021] Figure 1 is a structural schematic diagram of a zero adjustment test device provided by an embodiment of the present invention;

[0022] Figure 2 is a schematic structural diagram of a probe mounting base used in an embodiment of the present invention;

[0023] Figure 3 is a schematic structural diagram of a support platform used in an embodiment of the present invention;

[0024] Figure 4 is a flow chart of a zeroing test method provided by an embodiment of the present invention;

[0025] Figure 5 is a circuit diagram of a test circuit used in an embodiment of the present invention.

[0026] Description of reference numerals:

[0027] 1. Test bracket; 2. Support platform; 21. Fixed component; 22. Adjustment mechanism; 221. Adjustment base; 222. First sliding seat; 223. Second sliding seat; 23. Fixed groove; 3. Probe mounting seat; 31. Main body; 32. Rotating assembly; 321. Rotating member; 322. Sliding block; 323. Sliding guide column; 4. Driving mechanism; 41. Driving base; 42. Driving push rod; 43. Articulated assembly; 44. Push handle; 5. Variable resistor; 51. Resistance adjustment part; 52. Resistance display module; 6. Connecting probe; 7. Sensor; 8. Multimeter; 9. Excitation power supply. DETAILED DESCRIPTION

[0028] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present invention, and should not be construed as limiting the present invention.

[0029] In the description of the present invention, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0030] In this embodiment, according to Figure 1 The XYZ rectangular coordinate system established in the definition is: the side located in the positive direction of the X axis is defined as the front, and the side located in the negative direction of the X axis is defined as the back; the side located in the positive direction of the Y axis is defined as the left, and the side located in the negative direction of the Y axis is defined as the right; the side located in the positive direction of the Z axis is defined as the top, and the side located in the negative direction of the Z axis is defined as the bottom.

[0031] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0032] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0033] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments.

[0034] Please refer to Figures 1 to 3 As shown, in an embodiment of the present invention, a zeroing test device is provided, which includes a test bracket 1, a support platform 2, a probe mounting seat 3, a driving mechanism 4, a variable resistor 5 and a plurality of connecting probes 6. The support platform 2 is used to place a sensor, the probe mounting seat 3 is movably arranged on the test bracket 1, the driving mechanism 4 is arranged on the test bracket 1, and the driving end of the driving mechanism 4 is connected to the probe mounting seat 3. The driving mechanism 4 is used to drive the probe mounting seat 3 to approach or move away from the support platform 2 along a first direction. A plurality of connecting probes 6 are arranged on the probe mounting seat 3 at intervals, one end of the connecting probe 6 is electrically connected to the variable resistor 5, and the other end of the connecting probe 6 is used to abut against the connecting end of the sensor when the probe mounting seat 3 is close to the support platform 2.

[0035] Specifically, the test bracket 1 refers to a support component with a certain height. The test bracket 1 can be plate-shaped, column-shaped, block-shaped, etc., and the test bracket 1 can also be a combination of multiple shapes. The support platform 2 refers to a support component with a certain height. The support platform 2 can be provided with a working surface for placing a sensor, and a fixed structure can be provided on the working surface to fix the sensor. The fixed structure can be a vacuum adsorption structure, a clamping structure, or a groove limit structure. The probe mounting seat 3 refers to a component or assembly with a certain volume. The probe mounting seat 3 as a whole can be a block, a plate, or a combination of multiple shapes.

[0036] The driving mechanism 4 refers to a component or assembly that can drive an object to move in a straight line. The driving structure can be a cylinder, a hydraulic cylinder or an electric push rod, etc. The driving structure can also be driven by a manual structure. The rheostat 5 refers to a component or assembly that can change its own resistance value. The rheostat 5 can be a sliding rheostat 5, or a knob rheostat 5, etc. The connecting probe 6 refers to a component with a certain length. The connecting probe 6 can be a column or a strip, etc., wherein the connecting probe 6 is usually made of a material with good conductive properties such as metal.

[0037] The zeroing test device provided by the embodiment of the present invention is provided with a support platform 2 on which a sensor can be placed, and a probe mounting seat 3 is movably connected to a test bracket 1, and a connection probe 6 electrically connected to a variable resistor 5 is also provided on the probe mounting seat 3. In addition, a driving mechanism 4 can be used to drive the probe mounting seat 3 to approach or move away from the support platform 2 in a first direction, and when the probe mounting seat 3 approaches the support platform 2, the connection probe 6 can abut against the connection end of the sensor. When performing detection, the sensor is placed on the support platform 2 and the sensor is connected to an external test circuit. The probe mounting seat 3 is driven by the driving mechanism 4 to approach the support platform 2 in a first direction until the connection probe 6 contacts the sensor. The resistance value of the variable resistor 5 is adjusted until the zero-point output value of the sensor meets the requirements, and the resistance value of the variable resistor 5 is the resistance value of the zeroing resistor matched with the sensor. Compared with the zeroing test device in the prior art, the structure is simple and easy to operate and use, and the resistance value of the zeroing resistor of the sensor can be quickly measured, thereby improving the production efficiency of the sensor product.

[0038] In one embodiment, see Figure 2The probe mounting seat 3 includes a main body 31 and a rotating assembly 32. The main body 31 is slidably arranged on the test bracket 1 and is connected to the driving end of the driving mechanism 4. The rotating assembly 32 is arranged on the main body 31. The rotating assembly 32 has the freedom to rotate around its own axis relative to the main body 31. The connecting probe 6 is arranged on the rotating assembly 32. Specifically, the main body 31 refers to a block component with a certain volume. The main body 31 can be a block, a plate, or a combination of multiple shapes. The main body 31 can be slidably connected to the test bracket 1 through a slide rail slider structure. The rotating assembly 32 refers to a component or assembly with a certain volume. By slidingly connecting the main body 31 to the test bracket 1 and connecting it to the driving end of the driving mechanism 4, the main body 31 can be driven to move along the first direction under the action of the driving structure. At the same time, a rotating component 32 is provided on the main body 31, and the rotating component 32 has the freedom to rotate around its own axis relative to the main body 31. By arranging the connecting probe 6 on the rotating component 32, the position of the connecting probe 6 in the direction around the axis of the rotating component 32 can be adjusted by rotating the rotating component 32, so that the connecting probe 6 can be better matched with the sensor, making the test operation of the sensor more convenient.

[0039] In an alternative embodiment, see Figure 2 A rotating hole may be provided on the main body 31, and a rotating cylinder matching the diameter of the rotating hole may be provided on the rotating assembly 32. By inserting the rotating cylinder into the rotating hole on the main body 31, a rotating connection between the rotating assembly 32 and the main body 31 is achieved.

[0040] In one embodiment, see Figure 2 The rotating assembly 32 includes a rotating member 321 and a sliding block 322. The rotating member 321 is rotatably connected to the main body 31. The number of sliding blocks 322 is multiple and matches the number of connection probes 6. The sliding blocks 322 are all slidably arranged on the side of the rotating member 321 facing the support platform 2, and multiple connection probes 6 are respectively arranged on the sliding blocks 322. Specifically, the rotating member 321 refers to a component with a certain volume. The rotating member 321 can be block-shaped, column-shaped or plate-shaped, and the sliding block 322 also refers to a component with a certain volume. By slidingly arranging multiple sliding blocks 322 on the rotating member 321, and arranging multiple connection probes 6 on different sliding blocks 322, on the basis of adjusting the position of the connection probe 6 by rotating the rotating assembly 32, the distance between the connection probes 6 can also be adjusted by adjusting the position of the sliding block 322, so that the connection probe 6 can be better matched with the sensor.

[0041] In one embodiment, see Figure 2, a sliding guide post 323 is also provided on the rotating member 321, and a sliding guide hole penetrating the sliding block 322 is also provided on the sliding block 322, the sliding guide post 323 is inserted into the sliding guide hole, and the sliding guide post 323 and the sliding block 322 are both slidably connected. Specifically, the sliding guide post 323 refers to a columnar component with a certain length, and by fixing at least one end of the sliding guide post 323 to the rotating member 321, and inserting the sliding guide post 323 into the sliding guide hole, and the sliding guide post 323 and the sliding block 322 are both slidably connected, the sliding installation of the sliding block 322 can be made more stable.

[0042] In one embodiment, see Figure 1 The driving mechanism 4 includes a driving base 41, a driving push rod 42, a hinge assembly 43 and a pushing handle 44. The driving base 41 is arranged on the test bracket 1, the hinge assembly 43 is hinged on the driving base 41, one end of the pushing handle 44 is connected to the hinge assembly 43, the driving push rod 42 is arranged on the driving base 41, and has the freedom to slide along its own axis, one end of the driving push rod 42 is hinged to the hinge assembly 43, and the other end is connected to the main body 31. Specifically, the driving base 41 refers to a supporting component with a certain height, and the driving base 41 can be a block, a plate or a combination of multiple shapes. The hinge assembly 43 refers to a component composed of two components hinged to each other, the two components are hinged to each other, one of the components is hinged to the driving base 41, and the other component is hinged to the end of the driving push rod 42. The driving push rod 42 refers to a rod-shaped component with a certain length. A support portion may be provided on the driving base 41, and a sliding hole is provided on the support portion. The driving push rod 42 is inserted into the sliding hole, thereby realizing the sliding connection of the driving push rod 42. The pushing handle 44 refers to a rod-shaped component with a certain length. By connecting one end of the pushing handle 44 to the hinge assembly 43, the hinge assembly 43 can be driven to move by pulling the pushing handle 44, thereby driving the driving push rod 42 to slide along its own axis. Since the end of the driving push rod 42 is connected to the main body 31, when the driving push rod 42 slides, the main body 31 can be pushed to slide with the driving push rod 42, making it more convenient to adjust the main body 31.

[0043] In one embodiment, see Figure 1The variable resistor 5 includes a resistance adjusting part 51 and a resistance display module 52. The resistance adjusting part 51 is used to be electrically connected to the connection probe 6 and can adjust its own resistance. The resistance display module 52 is used to display the resistance of the resistance adjusting part 51. Specifically, the resistance adjusting part 51 refers to a component that can change the resistance value output by itself. The resistance adjusting part 51 can be a sliding variable resistance structure or a knob variable resistance structure. The resistance display module 52 refers to a component that can display the resistance of the resistance adjusting part 51, and can usually include a resistance measurement unit and a digital display unit. By forming the variable resistor 5 by the resistance adjusting part 51 and the resistance display module 52, the resistance of the variable resistor 5 can be adjusted while the resistance can be displayed in real time.

[0044] In one embodiment, see Figure 3 The support platform 2 includes a fixing component 21 and an adjusting mechanism 22. The fixing component 21 is used to fix the sensor. The driving end of the adjusting mechanism 22 is connected to the fixing component 21. The adjusting mechanism 22 is used to adjust the position of the fixing component 21. Specifically, the fixing component 21 refers to a component with a certain volume. The fixing component 21 can be a block, a plate or a combination of multiple shapes. A fixing structure for fixing the sensor can be provided on the fixing component 21. The fixing structure can fix the sensor by vacuum adsorption, adhesive fixation, clamping fixation and groove limiting. The adjusting mechanism 22 refers to a component or assembly that can adjust the position of an object. By connecting the driving end of the adjusting mechanism 22 to the fixing component 21 and fixing the sensor on the fixing component 21, the position of the fixing component 21 and the sensor can be adjusted by the adjusting mechanism 22, so that the position of the sensor can better match the connection probe 6, thereby making the detection of the sensor more convenient.

[0045] In one embodiment, see Figure 3The adjustment mechanism 22 includes an adjustment base 221, a first sliding base 222, a second sliding base 223, a first adjustment part and a second adjustment part. The first sliding base 222 is slidably arranged on the adjustment base 221, the second sliding base 223 is slidably arranged on the first sliding base 222, the first adjustment part is located between the first sliding base 222 and the adjustment base 221, the first adjustment part is used to adjust the position of the first sliding base 222 along the second direction, the second adjustment part is located between the second sliding base 223 and the first sliding base 222, the second adjustment part is used to adjust the position of the second sliding base 223 along the third direction, and the second direction and the third direction are both arranged at an angle. Specifically, the adjustment base 221 refers to a component with a certain volume, and the adjustment base 221 can be a block or a plate. The first sliding base 222 and the second sliding base 223 are also components with a certain volume, and the first sliding base 222 and the second sliding base 223 can be a block or a plate. The first adjustment part and the second adjustment part refer to parts or components that can drive an object to move in a straight line. The first adjustment part and the second adjustment part can be a cylinder, a hydraulic cylinder or an electric push rod, etc. The first adjustment part and the second adjustment part can also be a position adjustment knob, which drives the object to move along the axis of the knob through the thread action. The first sliding seat 222 is slidably set on the adjustment base 221, the second sliding seat 223 is slidably set on the first sliding seat 222, and the fixed component 21 is set on the second sliding seat 223. The first adjustment part adjusts the position of the first sliding seat 222 along the second direction, and the second adjustment part adjusts the position of the second sliding seat 223 along the third direction, so that the fixed component 21 can be adjusted in multiple directions, making the sensor position adjustment more convenient.

[0046] In one embodiment, see Figure 3 The fixing part 21 is provided with a fixing groove 23 for fixing the sensor, and the fixing groove 23 matches the shape of the sensor. Specifically, the fixing groove 23 refers to a part with a certain depth, and the shape of the fixing groove 23 matches the shape of the sensor, and the opening of the fixing groove 23 can be set upward, so that when the sensor is placed on the top of the fixing part 21, at least part of the sensor is located in the fixing groove 23, and the fixing groove 23 can be used to limit the sensor in the horizontal direction, making it more convenient to fix the sensor.

[0047] Second, see Figure 4 , a sensor zeroing test method is provided, using any of the above zeroing test devices, comprising the following steps:

[0048] S1, placing the sensor on the support platform 2, and connecting the sensor to the external test circuit;

[0049] Specifically, the sensor can be fixed to the support platform 2 by a fixing structure, and the connection of the external test circuit is as follows: Figure 5 As shown, the sensor is mainly connected in series with the multimeter and the power supply. During the adjustment of the variable resistor 5, the zero-point output value of the sensor can be detected by the multimeter in the test circuit.

[0050] S2, driving the probe mounting seat 3 to approach the supporting stage 2 along the first direction through the driving mechanism 4, and after the distance between the end of the connecting probe 6 and the sensor reaches a preset range, the probe mounting seat 3 stops moving;

[0051] S3, adjusting the distance between the connection probes 6 according to the size of the sensor, and after the adjustment is completed, the driving mechanism 4 drives the probe mounting seat 3 to approach the supporting platform 2 until the connection probes 6 are in contact with the sensor;

[0052] S4, adjusting the resistance of the variable resistor 5 until the zero-point output value of the sensor meets the preset requirement.

[0053] Specifically, during the measurement process, after the zero-point output value of the sensor meets the preset requirement, the resistance value of the variable resistor 5 can be recorded to facilitate matching the corresponding zero adjustment resistor for the sensor in subsequent processes.

[0054] It can be understood that the beneficial effects of the second aspect mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here.

[0055] The above are only preferred embodiments of the present invention, and only specifically describe the technical principles of the present invention. These descriptions are only for explaining the principles of the present invention and cannot be interpreted as limiting the scope of protection of the present invention in any way. Based on the explanations here, any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention, and other specific implementations of the present invention that can be associated with by technicians in this field without creative labor, should be included in the scope of protection of the present invention.

Claims

1. A zero adjustment test device, characterized in that: It includes a test bracket, a support platform, a probe mounting seat, a driving mechanism, a variable resistor and a plurality of connecting probes, wherein the support platform is used to place a sensor, the probe mounting seat is movably arranged on the test bracket, the driving mechanism is arranged on the test bracket, and the driving end of the driving mechanism is connected to the probe mounting seat, the driving mechanism is used to drive the probe mounting seat to approach or move away from the support platform along a first direction, a plurality of connecting probes are arranged on the probe mounting seat at intervals, one end of the connecting probe is electrically connected to the variable resistor, and the other end is used to abut against the connecting end of the sensor when the probe mounting seat is close to the support platform.

2. The zero adjustment test device according to claim 1, characterized in that: The probe mounting seat includes a main body and a rotating assembly. The main body is slidably arranged on the test bracket and is connected to the driving end of the driving mechanism. The rotating assembly is arranged on the main body. The rotating assembly has the freedom to rotate around its own axis relative to the main body. The connecting probe is arranged on the rotating assembly.

3. The zero adjustment test device according to claim 2, characterized in that: The rotating assembly includes a rotating member and a sliding block, the rotating member is rotatably connected to the main body, the sliding blocks are multiple in number and match the number of the connection probes, the sliding blocks are all slidably arranged on the side of the rotating member facing the supporting platform, and the multiple connection probes are respectively arranged on the sliding blocks.

4. The zero adjustment test device according to claim 3, characterized in that: The rotating member is also provided with a sliding guide post, and the sliding block is also provided with a sliding guide through hole penetrating the sliding block. The sliding guide post is inserted into the sliding guide through hole, and the sliding guide post and the sliding block are both slidably connected.

5. The zero adjustment test device according to claim 2, characterized in that: The driving mechanism includes a driving base, a driving push rod, a hinge assembly and a pushing handle. The driving base is arranged on the test bracket, the hinge assembly is hinged to the driving base, one end of the pushing handle is connected to the hinge assembly, the driving push rod is arranged on the driving base and has the freedom to slide along its own axis, one end of the driving push rod is hinged to the hinge assembly and the other end is connected to the main body.

6. The zero adjustment test device according to claim 1, characterized in that: The variable resistor includes a resistance adjusting part and a resistance value display module. The resistance adjusting part is used to be electrically connected to the connection probe and can adjust its own resistance value. The resistance value display module is used to display the resistance value of the resistance adjusting part.

7. The zero adjustment test device according to claim 1, characterized in that: The supporting platform comprises a fixing component and an adjusting mechanism, wherein the fixing component is used to fix the sensor, a driving end of the adjusting mechanism is connected to the fixing component, and the adjusting mechanism is used to adjust the position of the fixing component.

8. The zero adjustment test device according to claim 7, characterized in that: The adjustment mechanism includes an adjustment base, a first sliding seat, a second sliding seat, a first adjustment portion and a second adjustment portion, the first sliding seat being slidably disposed on the adjustment base, the second sliding seat being slidably disposed on the first sliding seat, the first adjustment portion being located between the first sliding seat and the adjustment base, the first adjustment portion being used to adjust a position of the first sliding seat along a second direction, the second adjustment portion being located between the second sliding seat and the first sliding seat, the second adjustment portion being used to adjust a position of the second sliding seat along a third direction, and the second direction and the third direction are both arranged at an angle.

9. The zero adjustment test device according to claim 7, characterized in that: The fixing component is provided with a fixing groove for fixing the sensor, and the fixing groove matches the shape of the sensor.

10. A sensor zeroing test method, characterized in that: Using the zeroing test device according to any one of claims 1 to 9 comprises the following steps: Place the sensor on a supporting platform and connect the sensor to an external test circuit; The probe mounting seat is driven by a driving mechanism to approach the supporting platform along a first direction, and the probe mounting seat stops moving after the distance between the end of the connecting probe and the sensor reaches a preset range; Adjust the distance between the connection probes according to the size of the sensor, and after the adjustment is completed, the driving mechanism drives the probe mounting seat to approach the support platform until the connection probes are in contact with the sensor; Adjust the resistance of the variable resistor until the zero point output of the sensor meets the preset requirements.

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