Storage test device and test method

Abstract

The invention provides a storage test device and method, and the device comprises a processor which is electrically connected with a to-be-tested machine through a plurality of channels, and a temperature control module is used for controlling the placement environment temperature of the storage test device; the working chain control module is used for configuring and calling a working chain of the to-be-tested machine, and the working chain at least comprises a starting step of the to-be-tested machine, a read-write step of the to-be-tested machine, a power failure processing step of the to-be-tested machine and a working state adjusting step of the to-be-tested machine; the power consumption calculation module is electrically connected to the plurality of to-be-tested machines, records the power supply current of the main controller as a first power supply current at each node of the working chain, records the power supply current of the flash memory chip as a second power supply current, and calculates the power consumption of the to-be-tested machines according to the first power supply current, the second power supply current and the power supply voltage of the to-be-tested machines; and obtaining power consumption data of the to-be-tested machine at each node of the working chain. The performance of the storage device can be accurately and efficiently evaluated.

Description

Technical Field

[0001] The present invention relates to the technical field of storage testing, and in particular to a storage testing device and a testing method. Background Art

[0002] Embedded Multi Media Card (eMMC) is widely used in terminal products such as TVs, set-top boxes, tablets or mobile phones. Users have higher requirements for the performance and reliability of eMMC storage chips. Among them, the performance stability of eMMC storage particles is an important indicator for measuring storage products. The performance of eMMC storage particles is directly related to the user experience of the client.

[0003] However, it is difficult to balance the performance of eMMC storage particles, the standby time of eMMC storage particles, and the power consumption requirements of eMMC storage particles. In addition, storage products are of various types and application scenarios. Storage chips will make firmware or parameter adjustments many times, and there are many interference factors in the test. Therefore, it is difficult to fully detect eMMC storage chips. Accurately locating and judging the quality of storage chips is a difficult test requirement. Summary of the invention

[0004] The object of the present invention is to provide a storage testing device and a testing method, which can accurately and efficiently evaluate the performance of a storage device.

[0005] In order to solve the above technical problems, the present invention is achieved through the following technical solutions: The present invention provides a storage test device, comprising: A processor, wherein the processor is electrically connected to a machine under test through a plurality of channels, wherein the machine under test includes a main controller and a flash memory chip, wherein the processor includes: A temperature control module, the temperature control module is used to control the placement environment temperature of the storage test device; and A work chain control module, used for configuring and calling the work chain of the machine under test, wherein the work chain at least includes a startup step of the machine under test, a reading and writing step of the machine under test, a power-off processing step of the machine under test, and a working state adjustment step of the machine under test; The power consumption calculation module is electrically connected to the plurality of machines under test, records the power supply current to the main controller as the first power supply current at each node of the working chain, and records the power supply current to the flash memory chip as the second power supply current, and obtains the power consumption data of the machine under test at each node of the working chain based on the first power supply current and the second power supply current, as well as the power supply voltage to the machine under test.

[0006] In one embodiment of the present invention, the storage testing device includes a power supply module, which is electrically connected to the processor, the power consumption calculation module and the multiple machines under test, and provides a first power supply voltage for the main controller and a second power supply voltage for the flash memory chip.

[0007] In one embodiment of the present invention, the storage testing device includes a plurality of sockets, the sockets allowing the machine to be tested to be inserted, and the sockets having a first power supply port, a second power supply port and a data transmission port, wherein the first power supply port is electrically connected to the power module and the main controller, the second power supply port is electrically connected to the power module and the flash memory chip, and the data transmission port is electrically connected to the main controller and the processor, wherein the current of the first power supply port is the first power supply current, and the current of the second power supply port is the second power supply current.

[0008] In an embodiment of the present invention, the location types of the multiple machines under test located in the same storage testing device are the same.

[0009] In one embodiment of the present invention, the work chain control module outputs a call control instruction of the work chain to start the working steps of the machine under test in the work chain. According to the calling order of the call control instruction, the work chain sequentially includes: a power-on step of the machine under test, a step of switching the machine under test to a standby state, a read and write step of the machine under test, a step of switching the machine under test to a sleep state, a step of waking up the machine under test from a sleep state, a step of short-term power-off of the machine under test, a step of long-term power-off of the machine under test and a step of powering off the machine under test.

[0010] In one embodiment of the present invention, the processor includes a judgment module, which stores the number of node switching times of the working chain and the number of temperature switching times of the placement ambient temperature. After the current power consumption data is output, if the number of node switching times or the number of temperature switching times is less than a preset value, the test continues until the number of node switching times or the number of temperature switching times is greater than or equal to the preset value.

[0011] In one embodiment of the present invention, the storage testing device comprises: Incubator; and A temperature sensor is installed in the incubator, and the temperature sensor is electrically connected to the temperature control module, wherein the temperature control module stores multiple test temperatures, and before each test starts, the temperature control module adjusts the temperature of the incubator to the test temperature.

[0012] In one embodiment of the present invention, the processor includes an evaluation module, which is electrically connected to the power consumption calculation module and outputs a visual chart according to the association between the machine under test and the power consumption data.

[0013] The present invention provides a storage test method, based on the storage test device as described above, comprising the following steps: Acquire a plurality of machines to be tested, and install the plurality of machines to be tested on the storage testing device, wherein the machines to be tested include a flash memory chip and a main controller; Set multiple test temperatures and configure the placement environment temperature of the machine to be tested; Configure and call the working chain of the machine to be tested, record the power supply current to the main controller as the first power supply current at each node of the working chain, and record the power supply current to the flash memory chip as the second power supply current, wherein the working chain at least includes a startup step of the machine to be tested, a reading and writing step of the machine to be tested, a power-off processing step of the machine to be tested, and a working state adjustment step of the machine to be tested; and Power consumption data of the machine under test at each node of the working chain is acquired according to the first power supply current and the second power supply current, and the power supply voltage to the machine under test.

[0014] In one embodiment of the present invention, after the power consumption data is acquired, the placement environment temperature is adjusted, and the power consumption data is acquired again until all the test temperatures are traversed.

[0015] As described above, the present invention provides a storage testing device and a testing method, which can simultaneously test a variety of chips to be tested in the same testing environment. Combined with the influence of temperature factors and location factors, it can test the power consumption of the chip to be tested in various links, thereby accurately and efficiently testing the actual power consumption of the chip to be tested, thereby evaluating the actual power consumption of the chip and accurately expressing the performance of the storage device.

[0016] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for describing the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0018] Figure 1 It is a structural schematic diagram of a storage test device in one embodiment of the present invention.

[0019] Figure 2 Schematic diagram of the position types of the machine to be tested in one embodiment of the present invention.

[0020] Figure 3 FIG. 1 is a schematic diagram of the internal functional structure of a processor in an embodiment of the present invention.

[0021] Figure 4 Schematic diagram of a working chain in one embodiment of the present invention.

[0022] Figure 5 A schematic diagram of an evaluation visualization chart in one embodiment of the present invention.

[0023] Figure 6 Schematic diagram of a computer control interface in one embodiment of the present invention.

[0024] Figure 7 The figure is a flow chart of a storage test method in one embodiment of the present invention.

[0025] Figure 8 FIG. 5 is a flow chart of step S500 in an embodiment of the present invention.

[0026] In the figure: 100, storage test device; 200, power module; 300, processor; 310, temperature control module; 320, test configuration module; 330, work chain control module; 340, judgment module; 350, evaluation module; 400, memory chip; 500, temperature sensor; 600, power consumption calculation module; 700, socket; 800, USB interface; 900, memory. DETAILED DESCRIPTION

[0027] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0028] The storage test device provided by the present invention is used to test flash memory, and is specifically used to test embedded memory. In the present invention, the machine to be tested is an eMMC chip. The machine to be tested includes a main controller and a flash memory chip. In the present embodiment, the main controller is a RISC microprocessor, and can specifically be an ARM processor. In the present embodiment, the flash memory chip is a NAND flash memory particle. The machine to be tested stores firmware, and the main controller calls the running control firmware and controls the running process of the firmware to implement functions such as bad block management, garbage collection (GC), early warning and performance control, thereby improving the reliability and performance of the machine to be tested. The main controller can read and write data on the flash memory chip through the eMMC protocol.

[0029] See also Figure 1 As shown, the present invention provides a storage test device 100, which includes a power module 200, a processor 300, a memory chip 400, a temperature sensor 500, a power consumption calculation module 600, at least two sockets 700, a USB interface 800 and a memory 900. Wherein, the power module 200 is electrically connected to the power ports of the processor 300, the memory chip 400 and the socket 700, and supplies power to the processor 300, the memory chip 400 and the socket 700. Wherein, the processor 300 is a central processing unit (CPU), and the processor 300 is electrically connected to the memory chip 400, the temperature sensor 500, the power consumption calculation module 600, at least two sockets 700, the USB interface 800 and the memory 900 to regulate the test resources and the test process. Wherein, the memory chip 400 is used to store the test firmware of the processor 300, wherein the test firmware includes a program code statement for implementing the storage test method provided by the present invention. The temperature sensor 500 is installed in the incubator and is used to monitor the temperature of the test environment. In this embodiment, the power consumption calculation module 600 is used to obtain the current condition in the power supply circuit during the test of the machine under test, and calculate the power consumption of the machine under test in the current test environment. Among them, the machine under test is electrically connected to the socket 700, and specifically, the machine under test is plugged into the socket 700. Among them, the USB interface 800 is used to output test data. In this embodiment, the memory 900 is used to archive test data. The multiple cores of the processor 300 respectively and independently perform the reading and writing of the machine under test data, the power supply data calculation of the main controller, the power supply data calculation of the flash memory chip, the distribution collection and processing of the overall power consumption calculation data of the machine under test, etc.

[0030] See also Figure 1As shown, in one embodiment of the present invention, the socket 700 has a plurality of power ports, and specifically, the socket 700 includes a first power supply port, a second power supply port and a data transmission port. Among them, the first power supply port is electrically connected to the main controller of the machine under test and the power module 200, and the power module 200 provides the first power supply voltage Vcc for the main controller of the machine under test. The second power supply port is electrically connected to the flash memory chip of the machine under test and the power module 200, and the power module 200 provides the second power supply voltage Vccq for the flash memory chip. In this embodiment, the number of sockets 70 is equal to the number of cores of the processor 300. And there are at least 2 sockets 700. In this embodiment, the number of sockets 700 is, for example, 4. In other embodiments of the present invention, the number of sockets 700 can also be 8, 16, etc. In this embodiment, the data transmission port of the socket 700 is electrically connected to the processor 300 and the main controller to transmit test data and test instructions of the processor 300 and the main controller. In this embodiment, the power consumption calculation module 600 is electrically connected to the first power port and the second power port to monitor the current flowing through the first power port and the second power port.

[0031] See also Figure 1 As shown, in one embodiment of the present invention, the storage test device 100 includes a power module 200, a processor 300, a memory chip 400, a temperature sensor 500, a power consumption calculation module 600, at least two sockets 700, a USB interface 800 and a memory 900 integrated on the same test circuit board. In this embodiment, the storage test device includes a temperature box, wherein the test circuit board is placed in the temperature box, and the temperature box provides the placement environment temperature of the test circuit board. In this embodiment, the temperature sensor 500 is installed in the temperature box to monitor the temperature of the temperature box. In this embodiment, the processor 300 includes a temperature control module 310, and the temperature control module 310 is electrically connected to the temperature sensor 500. According to the temperature data provided by the temperature sensor 500, the temperature control module 310 adjusts the temperature of the temperature box. In this embodiment, multiple test temperatures are set, for example, 5 test temperatures are set, and they can be -40°C, 25°C, 45°C, 75°C and 105°C respectively. After the test of the first test temperature is completed, the temperature of the temperature box is adjusted by the temperature control module 310 to the second test temperature, and the test is continued. And so on, until the tests at all test temperatures are completed.

[0032] See also Figure 1 and Figure 2As shown, in one embodiment of the present invention, multiple test groups are set, and the machines under test in the same test group belong to different series or different sources, and the machines under test in the same test group are of the same position type. In this embodiment, the machines under test in the same group are tested simultaneously. The number of machines under test in one test group is equal to or less than the number of sockets 70. Specifically, according to the difference between the operating speed of the NMOS tube of the machine under test and the operating speed of the PMOS tube, five types of machines under test are set. Figure 2 As shown, the first chip is a TT chip, and the PMOS tube speed and NMOS tube speed of the TT chip are moderate, which can be specifically reflected in that the PMOS tube speed and the NMOS tube speed are within the threshold range, where the threshold range is Figure 2 The elliptical range shown. The threshold range is set by the designer. The chip at the second position is the SF chip, and the PMOS tube speed of the SF chip is fast, while the NMOS tube speed is slow. The chip at the third position is the SS chip, and the PMOS tube speed and NMOS tube speed of the SS chip are both slow. The chip at the fourth position is the FF chip, and the PMOS tube speed and NMOS tube speed of the FF chip are both fast. The chip at the fifth position is the FS chip, and the PMOS tube speed of the FS chip is slow, while the NMOS tube speed is fast. In the present invention, for each test, the machines to be tested located in the same storage test device 100 are the machines to be tested at the same position. For example, the machines to be tested in the same storage test device 100 are all FF chips. And so on. Five groups of machines to be tested are tested separately to improve the accuracy of the test data.

[0033] See also Figure 2As shown, in one embodiment of the present invention, the speed of the MOS tube is determined by a set speed threshold, specifically, a first speed threshold and a second speed threshold are set, wherein the first speed threshold is greater than the second speed threshold. In this embodiment, when the speed of the MOS tube is greater than the first speed threshold, the MOS tube speed is fast. When the speed of the MOS tube is less than the second speed threshold, the MOS tube speed is slow. When the speed of the MOS tube is greater than or equal to the second speed threshold and less than or equal to the first speed threshold, the speed of the MOS tube is moderate. In another embodiment of the present invention, the speed of the MOS tube is determined according to the graph. Specifically, the MOS tube located in the elliptical area is a TT chip. Four quadrants are formed with the center of the elliptical area as the origin, the chip located in the first quadrant, i.e., located in the upper right corner, is an FS chip, the chip located in the second quadrant, i.e., located in the upper left corner, is an SF chip, the chip located in the third quadrant, i.e., located in the lower left corner, is an SS chip, and the chip located in the fourth quadrant, i.e., located in the lower right corner, is an FF chip. In this embodiment, when sampling the machine to be tested, for the same series of machines to be tested, the machines to be tested in the series of five positions are obtained respectively, and grouped for testing. Among them, the machines to be tested of different series and the same position type are placed in the same group of test environments. In this embodiment, the machines to be tested in multiple test groups are tested in sequence until all test groups are traversed.

[0034] See also Figure 1 , Figure 3 and Figure 4 As shown, in one embodiment of the present invention, the processor 300 also includes a test configuration module 320 and a work chain control module 330. The test configuration module 320 is used to configure the work chain of the machine to be tested. Specifically, the test configuration module 320 stores the node call instructions of the work chain, and multiple node call instructions are arranged in a preset order. During the test, the work chain control module 330 sends multiple node call instructions to the machine to be tested in a preset order, thereby calling the work chain in the machine to be tested in sequence. Among them, according to the instruction execution order, the work chain includes the power-on step of the machine to be tested, the step of switching the machine to be tested to the standby state, the reading and writing step of the machine to be tested, the step of switching the machine to the sleep state, the step of waking up the machine to be tested from the sleep state, the step of short-term power-off of the machine to be tested and the step of long-term power-off of the machine to be tested, as well as the power-off step or sleep step of the machine to be tested.

[0035] See also Figure 1 , Figure 3 and Figure 4As shown, in one embodiment of the present invention, at each node of the working chain, the power consumption calculation module 600 monitors the current of the first power supply port as the first power supply current. And the power consumption calculation module 600 monitors the current of the second power supply port as the second power supply current. According to the first power supply current and the first power supply voltage Vcc, the power consumption data of the main controller at the current node can be calculated and obtained as the first power consumption data. According to the second power supply current and the second power supply voltage Vccq, the power consumption data of the flash memory chip at the current node can be calculated and obtained as the second power consumption data.

[0036] See also Figure 1 , Figure 3 and Figure 4 As shown, in one embodiment of the present invention, the processor 300 includes a judgment module 340. The judgment module 340 is electrically connected to the temperature control module 310 and the work chain control module 330. The judgment module 340 stores a temperature switching number threshold and a node switching number threshold. The difference between the temperature switching number threshold and the preset number of test temperatures is 1, and the difference between the node switching number threshold and the preset number of work chain nodes is 1. For example, if 5 test temperatures are set, the number of temperature switches to complete the test is 4 times. For example, if the work chain includes 8 nodes, the number of node switches is 7. The judgment module 340 obtains the temperature switching number of the temperature control module 310 and the number of instructions issued by the work chain control module 330, wherein the number of instructions issued corresponds to the number of node switches, and the specific number of instructions issued is equal to the number of node switches. When the temperature switching number is less than the temperature switching number threshold, or the node switching number is less than the node switching number threshold, the judgment module 340 determines that the current test is not over and continues the test. When the number of temperature switching times is greater than or equal to the temperature switching times threshold, and the number of node switching times is greater than or equal to the node switching times threshold, the judgment module 340 determines that the current test is over and ends the test. In this embodiment, if the judgment module 340 determines that the current test is not over, a first indication signal can be output, under which the temperature control module 310 switches the test temperature, or the work chain control module 330 issues a control instruction for the next node. If the judgment module 340 determines that the current test is not over, a second indication signal can be output, under which the power consumption test ends.

[0037] See also Figure 1 , Figures 3 to 6 As shown, in one embodiment of the present invention, the processor 300 includes an evaluation module 350. At each node of the working chain, the evaluation module 350 obtains the current temperature, the first power consumption data and the second power consumption data at the current node from the power consumption calculation module 600, and processes the first power consumption data and the second power consumption data to form a visual chart. The visual chart can be expressed as a line chart, such as Figure 5As shown, the horizontal axis of the line graph can be the power supply voltage data, the vertical axis of the line graph can be the power supply current data, and the multiple lines in the line graph represent the power consumption lines at different temperatures. The visualization chart can be presented as a data table, such as Figure 6 As shown, the horizontal column of the data table includes the number of the machine to be tested and the current test temperature, and the vertical column includes the working chain node, wherein the data in the table represents the first power consumption data or the second power consumption data of the current node at the current temperature.

[0038] See also Figures 1 to 6 As shown, in one embodiment of the present invention, the processor 300 calls and executes the test firmware to implement the storage test method provided by the present invention. In another embodiment of the present invention, the storage test device is electrically connected to the computer, and the storage test method provided by the present invention is implemented by the computer control. The computer has a control interface, and a power consumption monitoring interface is designed in the computer through the interface design (User Interface, UI). The power consumption monitoring interface includes a plurality of operable buttons. The operable buttons include firmware version, download, temperature, machine number to be tested, monitoring, debugging configuration, analysis and calculation, and summary and evaluation. Clicking the firmware version button can call the firmware version selection interface so that the tester can select the adapted version of the test firmware. Clicking the download button is used to download test data, which can be specifically used to download the following: Figure 5 and Figure 6 The test chart shown. Click the temperature button to manually adjust the temperature of the oven. Click the test machine number button to select the number of the test machine. Click the monitoring button to obtain the current state of the test machine. Click the debug configuration button to set the work chain and start the corresponding work node. Click the analysis calculation button to calculate the power consumption data of the current node at the current temperature. Click the summary evaluation button to obtain Figure 5 and Figure 6 The evaluation results are shown.

[0039] See also Figure 1 and Figure 7 As shown, the present invention provides a testing method for a storage testing device 100 , and the testing method includes steps S100 to S600 .

[0040] Step S100: Acquire multiple machines to be tested, and install the multiple machines to be tested on a storage test device.

[0041] Step S200: setting a plurality of test temperatures and configuring the placement environment temperature of the machine to be tested.

[0042] Step S300, configure and call the working chain of the machine to be tested, record the power supply current to the main controller at each node of the working chain as the first power supply current, and record the power supply current to the flash memory chip as the second power supply current.

[0043] Step S400: acquiring power consumption data of each node of the working chain of the machine under test according to the first power supply current, the second power supply current, and the power supply voltage of the machine under test.

[0044] Step S500: After acquiring the power consumption data, adjust the placement environment temperature, and reacquire the power consumption data until all test temperatures are traversed.

[0045] Step S600: Generate and output a visual chart based on the correlation between the machine under test and the power consumption data.

[0046] See also Figure 1 and Figure 7 As shown, in one embodiment of the present invention, in step S100, a test group is set, and the machine to be tested of the test group is inserted into the socket 700. After the machine to be tested is installed, the adapted version of the test firmware is configured in the power consumption monitoring interface. It should be noted that, in the present invention, the processor 300 is electrically connected to the computer via the USB interface 800, or is electrically connected to the computer via remote communication, so that the computer can obtain test data and control the test process. In the present embodiment, it should also be noted that multiple versions of test firmware are stored in the memory chip 400. The present invention does not limit the number of specific versions of the test firmware. Since the test version is constantly updated, in the present embodiment, the latest test version is selected or the specified version of the test firmware is selected. Among them, running the test firmware can implement the test method provided by the present invention.

[0047] See also Figure 1 and Figure 2 As shown, in one embodiment of the present invention, after step 100, in step S200, after the machine to be tested is installed, the test environment temperature of the storage test device 100 is configured. Specifically, the storage test device 100 is placed in a temperature-adjustable incubator. The temperature adjustment range of the incubator is set to, for example, 40°C~105°C. In this embodiment, multiple test temperatures are set, and steps S100 to S500 are performed at multiple test temperatures to obtain multiple groups of test data at different temperatures to improve the accuracy of the test data. The present invention does not limit the number of test temperature groups. Each time the test temperature is adjusted, the current temperature switching number is recorded to facilitate the judgment module 340 to adjust the test process.

[0048] See also Figure 1 and Figure 3 , Figure 4 and Figure 7As shown, in one embodiment of the present invention, in step S300, the working chain of the machine to be tested is set and started. Among them, instructions are issued to the main controller of the machine to be tested in turn, and according to the feedback of the main controller, when the feedback of the current node is obtained, the next node is continued. At the end of the current node, the power consumption calculation module 600 can calculate the first power consumption data under the first power supply voltage and the second power consumption data under the second power supply voltage according to the monitored first power supply current Icc and second power supply current Iccq. Among them, the instruction to control the standby of the machine to be tested is, for example, CMD0 / 1 / 2 / 3. The instruction to control the machine to be tested to read and write normally is, for example, CMD7 / 13. The instruction to control the machine to be tested to sleep is, for example, CMD5. The instruction to control the awakening of the machine to be tested is, for example, to send CMD5 again. The instruction to control the machine to be tested to power off is, for example, CMD6. Combined with a timer, for example, combined with watchdog software, short-term power off and long-term power off can be achieved, wherein the specific power off time is set by the tester. Next, in step S400, in this embodiment, the instructions of the processor 300 can be matched to the power consumption calculation module 600 through multiple channels, for example, by matching the power consumption calculation module 600 through 8 channels, so as to calculate the first power consumption data and the second power consumption data of each current machine under test. The processor 300 reads the first power consumption data and the second power consumption data of each machine under test, and sends the first power consumption data and the second power consumption data of each machine under test to the power consumption monitoring interface of the computer through the USB interface 800, and records them as follows: Figure 6 The table shown.

[0049] See also Figure 1 , Figure 3 and Figure 4 , Figure 7 and Figure 8 As shown, in one embodiment of the present invention, step S500 includes steps S510 to S550.

[0050] Step S510: Determine whether the work chain node has been traversed.

[0051] Step S520: When the working chain node is not traversed, switch to the next node to continue acquiring the first power consumption data and the second power consumption data of each machine to be tested.

[0052] Step S530: When the working chain node has been traversed, determine whether the test temperature has been traversed.

[0053] Step S540: When the test temperature is not traversed, adjust the test temperature, and continue to obtain the first power consumption data and the second power consumption data of each machine to be tested.

[0054] Step S550: When the test temperature has been traversed, the power consumption test ends.

[0055] See also Figure 1 , Figure 3 and Figure 4 , Figure 7 and Figure 8 As shown, in one embodiment of the present invention, in step S400, at each work chain node, the first power consumption data and the second power consumption data of the current node and the current machine under test are recorded. In step S600, the evaluation module 350 outputs a visualization chart of the first power consumption data and the second power consumption data of the current node and the current machine under test at the current temperature, such as Figure 5 and Figure 6 According to the visual chart output by the evaluation module 350, the tester can adjust the product design of the machine under test according to the power consumption of the machine under test, or modify and debug the storage firmware of the machine under test to truly improve the performance of the machine under test.

[0056] The embodiments of the present invention disclosed above are only used to help illustrate the present invention. The embodiments do not describe all the details in detail, nor do they limit the invention to the specific embodiments described. Obviously, many modifications and changes can be made according to the content of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that those skilled in the art can understand and use the present invention well. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A storage test device, characterized in that: include: A processor, wherein the processor is electrically connected to a machine under test through a plurality of channels, wherein the machine under test includes a main controller and a flash memory chip, wherein the processor includes: A temperature control module, the temperature control module is used to control the placement environment temperature of the storage test device; and A work chain control module, used for configuring and calling the work chain of the machine under test, wherein the work chain at least includes a startup step of the machine under test, a reading and writing step of the machine under test, a power-off processing step of the machine under test, and a working state adjustment step of the machine under test; The power consumption calculation module is electrically connected to the plurality of machines under test, records the power supply current to the main controller as the first power supply current at each node of the working chain, and records the power supply current to the flash memory chip as the second power supply current, and obtains the power consumption data of the machine under test at each node of the working chain based on the first power supply current and the second power supply current, as well as the power supply voltage to the machine under test.

2. A storage test device according to claim 1, characterized in that: The storage testing device includes a power supply module, which is electrically connected to the processor, the power consumption calculation module and the plurality of the tested machines, and provides a first power supply voltage for the main controller and a second power supply voltage for the flash memory chip.

3. A storage test device according to claim 2, characterized in that: The storage testing device includes a plurality of sockets, wherein the sockets allow the machine to be tested to be inserted, and the sockets have a first power supply port, a second power supply port, and a data transmission port, wherein the first power supply port is electrically connected to the power module and the main controller, the second power supply port is electrically connected to the power module and the flash memory chip, and the data transmission port is electrically connected to the main controller and the processor, wherein the current of the first power supply port is the first power supply current, and the current of the second power supply port is the second power supply current.

4. A storage test device according to claim 1, characterized in that: The location types of the multiple machines under test located in the same storage test device are the same.

5. A storage test device according to claim 1, characterized in that: The work chain control module outputs the calling control instruction of the work chain to start the working steps of the machine under test in the work chain. According to the calling order of the calling control instruction, the work chain includes in sequence: a power-on step of the machine under test, a step of switching the machine under test to a standby state, a reading and writing step of the machine under test, a step of switching the machine under test to a sleep state, a step of waking up the machine under test from a sleep state, a step of short-term power-off of the machine under test, a step of long-term power-off of the machine under test and a step of powering off the machine under test.

6. A storage test device according to claim 1, characterized in that: The processor includes a judgment module, which stores the number of node switching times of the working chain and the number of temperature switching times of the placement environment temperature. After the current power consumption data is output, if the number of node switching times or the number of temperature switching times is less than a preset value, the test continues until the number of node switching times or the number of temperature switching times is greater than or equal to the preset value.

7. A storage test device according to claim 1, characterized in that: The storage test device comprises: Incubator; and A temperature sensor is installed in the incubator, and the temperature sensor is electrically connected to the temperature control module, wherein the temperature control module stores multiple test temperatures, and before each test starts, the temperature control module adjusts the temperature of the incubator to the test temperature.

8. The storage test device according to claim 1, characterized in that: The processor includes an evaluation module, which is electrically connected to the power consumption calculation module and outputs a visual chart according to the association between the machine to be tested and the power consumption data.

9. A storage test method, based on the storage test device according to claim 1, characterized in that: The following steps are involved: Acquire a plurality of machines to be tested, and install the plurality of machines to be tested on the storage testing device, wherein the machines to be tested include a flash memory chip and a main controller; Set multiple test temperatures and configure the placement environment temperature of the machine to be tested; Configure and call the working chain of the machine to be tested, record the power supply current to the main controller as the first power supply current at each node of the working chain, and record the power supply current to the flash memory chip as the second power supply current, wherein the working chain at least includes a startup step of the machine to be tested, a reading and writing step of the machine to be tested, a power-off processing step of the machine to be tested, and a working state adjustment step of the machine to be tested; as well as Power consumption data of the machine under test at each node of the working chain is acquired according to the first power supply current and the second power supply current, and the power supply voltage to the machine under test.

10. A storage test method according to claim 9, characterized in that: After acquiring the power consumption data, the placement environment temperature is adjusted, and the power consumption data is acquired again until all the test temperatures are traversed.

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