High-temperature reverse bias aging test method and system, terminal and medium

Abstract

The invention relates to the technical field of high-temperature reverse-bias aging testing, in particular to a high-temperature reverse-bias aging testing method and system, a terminal and a medium. Obtaining product information of the to-be-tested device according to the test instruction; acquiring a test duration, a test environment and a corresponding test voltage based on the product information of the to-be-tested device; starting to test the to-be-tested device based on the test time, the test environment and the corresponding test voltage, and obtaining a test result; and if the test result does not meet the high-temperature aging standard condition, outputting warning information. According to the invention, the test precision and reliability can be improved.

Description

Technical Field

[0001] The present application relates to the field of high temperature reverse bias aging test technology, and in particular to a high temperature reverse bias aging test method, system, terminal and medium. Background Art

[0002] High Temperature Reverse Bias test (HTRB) refers to the continuous provision of 80% or other specifications of reverse voltage to the power semiconductor device under test under high temperature conditions. Under long-term operation, the reverse leakage current of the test sample is required to remain stable within the range of values.

[0003] In the existing high temperature aging test methods, the commonly used methods include: manually setting the aging test conditions, such as temperature, voltage and other parameters, and manually recording the test results; or using a semi-automatic method, manually inputting the test parameters, and letting the equipment automatically test and partially record the results. Another method is to use a computer for automatic control, automatically adjust the test environment according to the preset test conditions, and realize automatic data acquisition and analysis.

[0004] However, the manual or semi-automatic methods in the prior art have problems such as low test efficiency and test results that are easily biased by human factors. Even if computer automatic control is adopted, there are still deficiencies such as the test process is not intelligent enough and the analysis of test data is not comprehensive and accurate enough. Especially in the high-temperature reverse bias aging test process, it is difficult to achieve real-time monitoring and evaluation of test results, thus affecting the test accuracy and reliability. Summary of the invention

[0005] In a first aspect, in order to improve the accuracy and reliability of the test, the present application provides a high temperature reverse bias aging test method.

[0006] The present application provides a high temperature reverse bias aging test method, which adopts the following technical solution: A high temperature reverse bias aging test method, comprising: Get test instructions; Obtain product information of the device to be tested according to the test instructions; Acquire test duration, test environment, and corresponding test voltage based on product information of the device to be tested; Starting testing the device to be tested and obtaining test results based on the test time, test environment and corresponding test voltage; If the test result does not meet the high temperature aging standard conditions, a warning message will be output.

[0007] By adopting the above technical solution, through clear steps (obtaining instructions, product information, test parameter settings, etc.), the test process is made more standardized, the possibility of operational errors is reduced, and the test duration, environment and voltage are dynamically adjusted according to the specific information of the device to be tested (such as materials, design parameters) to ensure the adaptability of the test conditions, improve the accuracy and effectiveness of the test, monitor and evaluate the test results in real time, and output warning information to provide real-time feedback on test results that do not meet the standards, thereby improving the accuracy and reliability of the test.

[0008] Preferably, the step of starting testing the device to be tested and obtaining the test result based on the test time, the test environment and the corresponding test voltage includes: Adjust ambient temperature and humidity based on the test environment and obtain real-time environmental information; If the real-time environment information is not synchronized with the set environment information within the set time, a fault message will be output and the test will be stopped; If the real-time environment information is synchronized with the set environment information within the set time, the test duration is set based on the test time and the input reverse voltage is set based on the test voltage; Based on the set test time and reverse voltage, start testing the device to be tested under the set environment and obtain real-time current information and real-time resistance information of the device to be tested; Generate test results based on real-time current information and real-time resistance information.

[0009] By adopting the above technical solution, by adjusting the ambient temperature and humidity, it is ensured that the test conditions are consistent with the actual application environment, thereby improving the reliability and relevance of the test results. When the environmental conditions do not reach the set values, fault information is output in time and the test is stopped, which can effectively avoid testing under inappropriate conditions, thereby protecting the devices to be tested and reducing potential damage risks.

[0010] Preferably, after the step of outputting a warning message if the test result does not meet the high temperature aging standard conditions, the method further includes: Get retest instructions; Check the device status based on the retest instruction and generate retest product information; If the device status meets the retest standard, retest parameters are set based on the retest product information. The retest parameters include test duration, test environment, and test voltage. Retest the device based on the retest parameters and output retest results; If the retest result does not meet the retest conditions, output unqualified information.

[0011] By adopting the above technical solution, through retest instructions and status checks, the reliability of the initial test results can be confirmed, misjudgment due to accidental factors can be avoided, and the accuracy of the final results can be ensured; retesting is only performed when the retest standards are met, which can save test resources and time and improve overall test efficiency.

[0012] Preferably, the step of outputting fault information and stopping the test if the real-time environment information is not synchronized with the set environment information within the set time further includes: If the real-time environmental information is not synchronized with the set environmental information within the set time, the temperature change curve and the humidity change curve are obtained; Analyze curve characteristics based on temperature change curve and humidity change curve; Fault information is determined based on curve characteristics.

[0013] By adopting the above technical solutions, real-time monitoring and recording of environmental changes can help identify potential sources of problems, such as equipment failure or external influences; obtaining temperature and humidity change curves can help gain a deeper understanding of fluctuations in environmental conditions, provide more information to support fault analysis, and improve the accuracy of fault diagnosis.

[0014] Preferably, after the step of starting to test the device to be tested and obtaining the test result based on the test time, the test environment and the corresponding test voltage, the step includes: Establish a historical database based on product information and test results; Calculate the qualified rate of the current device to be tested based on the historical database; Compare this pass rate to a set standard; If the pass rate does not meet the set standard, the tested device is judged to be unqualified and a quality report is output.

[0015] By adopting the above technical solution, a historical database can be established to accumulate test data over a long period of time, and the pass rate can be calculated based on historical data, so that the pass standard can reflect the actual production situation, which is helpful to timely discover potential problems. By comparing the pass rate with the set standard, unqualified products can be quickly identified, ensuring the effectiveness of quality control and reducing the risk of unqualified products entering the market.

[0016] Preferably, the method further comprises: Obtain historical test data of the same product based on the product information of the device to be tested; Compare and analyze based on historical test data and real-time test results, and generate comparison results; Based on the comparison results, feedback information is dynamically generated and displayed on the human-computer interaction interface.

[0017] By adopting the above technical solution, real-time test results are compared with historical data, which can identify abnormal situations, discover potential problems in a timely manner, and improve the accuracy of the test; feedback information is dynamically generated and displayed on the interface, so that testers can quickly obtain test results and analysis information, and support real-time adjustments.

[0018] Preferably, the product information includes product model, product material, rated withstand voltage, use environment and use specifications.

[0019] By adopting the above technical solutions, detailed product information can ensure that the test conditions match the product characteristics, improve the relevance and effectiveness of the test, and thus obtain more accurate test results; when non-conformance or failure occurs, the problem can be quickly located based on information such as product model and material, facilitating fault analysis and improvement.

[0020] In the second aspect, in order to improve the accuracy and reliability of the test, the present application provides a high temperature reverse bias aging test system, which adopts the following technical solutions: A high temperature reverse bias aging test system, comprising: An instruction acquisition module is used to acquire test instructions; A product information reading module is used to obtain product information of the device to be tested according to the test instruction; A test parameter acquisition module is used to acquire the test duration, test environment and corresponding test voltage based on the product information of the device to be tested; A test module, used to start testing the device to be tested and obtain test results based on the test time, test environment and corresponding test voltage; The warning module is used to output a warning message if the test result does not meet the high temperature aging standard conditions.

[0021] In a third aspect, the present application provides a smart terminal, which adopts the following technical solution: An intelligent terminal comprises a memory and a processor, wherein the memory stores a computer program which can be loaded by the processor and execute the above-mentioned high-temperature reverse bias aging test method.

[0022] In a fourth aspect, the present application provides a computer-readable storage medium, which adopts the following technical solution: A computer-readable storage medium stores a computer program that can be loaded by a processor and execute the above-mentioned high-temperature reverse bias aging test method.

[0023] In summary, the present application includes at least one of the following beneficial technical effects: 1. Through clear steps (obtaining instructions, product information, test parameter settings, etc.), the test process is more standardized and the possibility of operating errors is reduced. According to the specific information of the device to be tested (such as materials, design parameters), the test duration, environment and voltage are dynamically adjusted to ensure the adaptability of the test conditions, improve the accuracy and effectiveness of the test, monitor and evaluate the test results in real time, and output warning information to provide real-time feedback on test results that do not meet the standards, thereby improving the accuracy and reliability of the test; 2. By adjusting the ambient temperature and humidity, ensure that the test conditions are consistent with the actual application environment, thereby improving the reliability and relevance of the test results. When the environmental conditions do not reach the set values, timely output fault information and stop the test, which can effectively avoid testing under inappropriate conditions, thereby protecting the device under test and reducing potential damage risks; 3. Real-time monitoring and recording of environmental changes can help identify potential sources of problems, such as equipment failure or external influences; obtaining temperature and humidity change curves can help gain a deeper understanding of fluctuations in environmental conditions, provide more information to support fault analysis, and improve the accuracy of fault diagnosis. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a method flow chart of a high-temperature reverse bias aging test method according to an embodiment of the present application, mainly showing steps S100-S500.

[0025] Figure 2 It is a method flow chart of a high-temperature reverse bias aging test method according to an embodiment of the present application, mainly showing steps S410-S450.

[0026] Figure 3 It is a method flow chart of a high-temperature reverse bias aging test method according to an embodiment of the present application, mainly showing steps S510-S550. DETAILED DESCRIPTION

[0027] The present application is further described in detail below in conjunction with all the accompanying drawings.

[0028] The command can be obtained by mechanical button triggering or virtual button triggering. In the mechanical button triggering method, the command can be automatically obtained after turning on the power by pressing the power button, or the current behavior information can be obtained by pressing the corresponding trigger button again after turning on the power. In the virtual button triggering method, the command can be obtained by pressing the relevant virtual trigger button in the interface of the corresponding software.

[0029] The present application embodiment discloses a high temperature reverse bias aging test method. Figure 1 , a high temperature reverse bias aging test method includes: Step S100: Get a test instruction.

[0030] Specifically, the host computer receives instructions from the tester by connecting to the test equipment. The tester can trigger the test instructions by triggering the human-computer interaction interface of the host computer. The host computer can use the eBOX560-522-FL model industrial computer, which supports high-speed data acquisition and real-time monitoring, provides powerful data recording and report generation functions, and supports interface docking with a variety of sensors and test equipment; the test equipment can use the T / 60 / V2 model high-temperature test box and the aging board placed in the high-temperature test box. The aging board is provided with multiple contact points or slots for connecting the items under test of different packaging types. These contact points usually include pads, pins, terminal blocks or quick connectors to establish electrical connections with the items under test.

[0031] Step S200: Obtain product information of the device to be tested according to the test instruction.

[0032] Specifically, according to the obtained test instructions, the host computer reads the product information stored in the database, including: product model, product material, rated withstand voltage, operating environment (such as temperature, humidity), and usage specifications (such as power and size). The data in the database can be obtained through the Internet or uploaded by the tester. The engineer enters the basic information of the device to be tested, such as product model, product material, rated withstand voltage, operating environment (such as temperature, humidity), and usage specifications (such as power and size) through the operation interface.

[0033] Step S300: Acquire test duration, test environment, and corresponding test voltage based on product information of the device to be tested.

[0034] Specifically, the test standards are defined for each product, including: test duration (e.g., several hours to several days), test environment (e.g., high temperature, humidity control), and test voltage (voltage set according to the rated withstand voltage).

[0035] Step S400: Starting testing of the device to be tested based on the test time, test environment and corresponding test voltage and obtaining test results.

[0036] Reference Figure 2 The specific steps of the test include: Step S410: adjusting the ambient temperature and ambient humidity based on the test environment and obtaining real-time environmental information; Step S420: If the real-time environment information is not synchronized with the set environment information within the set time, output a fault message and stop the test; Step S430: If the real-time environment information is synchronized with the set environment information within the set time, the test duration is set based on the test time and the input reverse voltage is set based on the test voltage; Step S440: starting to test the device to be tested under a set environment based on the set test duration and reverse voltage and obtaining real-time current information and real-time resistance information of the device to be tested; Step S450: Generate test results based on real-time current information and real-time resistance information. Specifically, the host computer automatically matches and obtains the above test standards based on the product information, automatically inputs the target environmental temperature and humidity values, and gradually adjusts the test environment by controlling the test equipment to ensure that the host computer can monitor the real-time temperature and humidity information. During this period, temperature and humidity sensors can be installed in the test environment to collect data in real time. The sensor data is regularly read through the data acquisition module (such as Arduino, Raspberry Pi, etc.) and sent to the main control system. The designer sets a time window according to the specifications of the environmental test chamber, and continuously compares the real-time temperature and humidity information with the target value within the set time. If the target value is not reached within the set time, a fault message is output and an instruction to stop the test is triggered. If the real-time environmental information meets the requirements, the system sets the test parameters according to the preset test time and voltage value, and uses the control interface of the test equipment to set the input reverse voltage to start the test. The equipment applies the reverse voltage within the set test duration. During the test, the current and resistance data are collected in real time. You can use a data acquisition card or test instrument to read real-time data, store the collected real-time current and resistance information in a database or file, analyze the current and resistance changes according to the preset calculation formula (such as Ohm's law), and finally generate a test report, including: test time, test environment information (temperature, humidity), test voltage, real-time current and resistance information, and the result compared with the standard (qualified / unqualified). The current can record the real-time current and maximum current, and the resistance can record the real-time resistance and maximum resistance.

[0037] Step S500: If the test result does not meet the high temperature aging standard conditions, a warning message is output.

[0038] Specifically, the test results are compared with the predefined high temperature aging standards, and thresholds (such as maximum allowable current, temperature, etc.) are set. If the test results do not meet the standards, a warning message is automatically generated and notified to the operator. This can be prompted through the interface, that is, a warning character with a red border is displayed on the human-computer interaction page.

[0039] For example, during the test, the item to be tested is a semiconductor diode. The tester enters the model of the product and the test command. The industrial computer automatically retrieves the product information of the device to be tested according to the input command, and determines the test duration, test environment and corresponding test voltage according to the product information (diode SF58G: test duration: 1 hour, test environment: ambient temperature: 150°C, ambient humidity: 50%, reverse voltage: 420V). By controlling the temperature in the high temperature box, the device to be tested is gradually heated to 150°C and the humidity is adjusted to 50%. During this period, the system continuously monitors the real-time environmental information. Assuming that the ambient temperature and humidity sensors deviate, within the set time range (for example, within 3 minutes), if the system fails to successfully adjust to the set environment, the system will output fault information and stop the test. The fault information may include: fault type: the environment does not meet the standard or the environment is unstable; fault time: the specific time when the fault occurs; fault description: the ambient temperature and humidity do not meet the set conditions. After ensuring that the temperature and humidity are stable, the test system begins to apply a reverse voltage of 420 to the device to be tested to simulate the electrical load under long-term high temperature. During the test, the system monitors the key parameters of the device in real time, such as the reverse current, the forward resistance and reverse resistance of the diode, temperature changes, and performance changes, collects and records these data, and the system determines these data. For example, under normal working conditions, the reverse current should be kept within a certain range (for example, less than 1μA); the resistance should remain stable without obvious drift. During the test, the system detects that the reverse current exceeds the set safety range at a certain point in time, or the resistance changes abnormally. At this time, the system will output a warning message, including: Warning type: high temperature aging test results are unqualified; Abnormal description: Out of current range / resistance drift is too large; Recommended operation: Stop the test and check the device. If it meets the high temperature aging standard conditions, it can also be tested multiple times to avoid errors.

[0040] Reference Figure 3 If the test results do not meet the high temperature aging standard conditions, retesting is required. The specific steps include: Step S510: obtaining a retest instruction; Step S520: Checking the device status based on the retest instruction and generating retest product information; Step S530: If the device status meets the retest standard, retest parameters are set based on the retest product information, and the retest parameters include test duration, test environment and test voltage; Step S540: retesting the device based on the retest parameters and outputting the retest results; Step S550: If the retest result does not meet the retest conditions, output unqualified information. Specifically, the operator inputs the retest instruction through a button or command. After receiving the retest instruction, the system queries the status of the device to be retested according to the previous test records, including: test results (qualified / unqualified), environmental conditions (temperature, humidity, etc.), and voltage information. The relevant status information is integrated into the retest product information, including the following: product ID, last test result, current environmental information, parameters required for retest, etc. The retest standard is defined according to the product standard, such as: current, voltage range; environmental condition restrictions, and the standard can be obtained from multiple experiments. The current device status is compared with the retest standard to confirm whether it meets the standard. If the device status meets the retest standard, the retest parameters are extracted and set from the retest product information, including: Test duration: set according to previous test experience or product specifications. Test environment: readjust or keep consistent as needed, which may include temperature and humidity settings (the standard can be lowered when the product ages to a certain extent). Test voltage: set the reverse voltage according to previous tests or product specifications. Connect the device to be retested to the test equipment and start the retest procedure. Apply retest voltage within the set test duration, monitor current and resistance in real time, and record real-time current and resistance information in the database. Analyze the collected data and generate retest results, including: retest current and resistance information; pass / fail judgment basis. Display the retest results through the user interface, including: retest current and resistance value, judgment result (pass / fail). If the retest results do not meet the retest conditions, the system will automatically output unqualified information, which can be notified to the operator through pop-up windows on the interface, email notifications, etc., and mark the device with the ID as unqualified in the database for subsequent distinction.

[0041] In addition, if the real-time environment information is not synchronized with the set environment information within the set time, a fault analysis is required. The specific steps include: Step SA1: If the real-time environmental information is not synchronized with the set environmental information within the set time, the temperature change curve and the humidity change curve are obtained; Step SA2: Analyze curve characteristics according to the temperature change curve and the humidity change curve; Step SA3: Determine fault information based on curve characteristics.

[0042] Specifically, monitor environmental data within a set time. If the temperature or humidity does not reach the set value, the fault handling process is triggered. When the environmental conditions do not meet the standards, the temperature and humidity data within the time window are collected. These data are organized into time series to draw curves. Use data visualization tools (such as Matplotlib or Excel) to draw the collected temperature and humidity data into a curve graph, and analyze the curve characteristics, including: peak and valley values ​​(maximum and minimum values), rising and falling trends, and time periods that continue to deviate from the set values ​​to determine whether there are abnormal conditions, such as: temperature or humidity continues to be higher or lower than the set range; sudden fluctuations or sharp changes. Machine learning algorithms (such as classification algorithms) can also be used to help determine the cause of the fault. Based on the extracted features, fault information is generated. The fault information includes the location of the damaged temperature adjustment device and humidity adjustment device and repair suggestions.

[0043] It is also possible to establish a historical database to calculate the product qualification rate. The specific steps include: Step SB1: Establish a historical database based on product information and test results; Step SB2: Calculate the qualified rate of the current device to be tested based on the historical database; Step SB3: comparing the pass rate with the set standard; Step SB4: If the pass rate does not meet the set standard, the test device is determined to be unqualified and output a quality report. Specifically, the device to be tested is tested using the corresponding test voltage at the set test time and environment. The test results of each device are collected, including the qualified or unqualified status, and a historical database is designed, which contains the following fields: product information (such as model, version, etc.), test results (qualified / unqualified), test time, test environment (such as temperature, humidity, etc.), and test voltage. The results and related information of each test are recorded in the database. A relational database (such as MySQL, PostgreSQL) or a non-relational database (such as MongoDB) can be used. A query script is written to extract all test records of the current device to be tested from the historical database, and the number of qualified and unqualified data is counted according to the extracted data. A qualified rate standard is set, which is entered in advance by the designer. Exceeding this qualified rate affects the product yield, and the calculated qualified rate is compared with the set standard. If the qualified rate is lower than the set standard, the test device is judged to be unqualified. If the qualified rate meets or exceeds the standard, it is judged to be qualified. If it is judged to be unqualified, a quality report is generated, and the content should include: product information, test results, qualified rate, comparison standard, and judgment result (qualified / unqualified). Finally, the quality report of each test is archived for subsequent query and analysis.

[0044] It also includes steps for real-time feedback, including: Step SC1: acquiring historical test data of the same product based on the product information of the device to be tested; Step SC2: Compare and analyze the historical test data and the real-time test results, and generate a comparison result; Step SC3: Based on the comparison results, dynamically generate feedback information and display the feedback information on the human-computer interaction interface. Specifically, when testing a batch of products again, query the test records of the same product in the historical database through the product information of the device to be tested (such as model, version, etc.). You can use SQL query or similar database access tools to extract relevant historical test data. Get real-time test results and format them into the same structure as historical data for easy comparison. Select appropriate comparison indicators, such as: pass rate, test result distribution (pass / fail number), performance indicators (such as voltage, power consumption, etc.). Based on the results of the comparative analysis, generate a detailed comparison report, including: real-time test results of the device to be tested, historical test results of the same product, difference analysis (such as pass rate changes, performance fluctuations, etc.), and generate feedback information based on the comparison results. The content may include: whether the performance of the test device is in line with historical trends, recommended areas for improvement (such as adjusting test parameters), and expectations for future tests (such as estimated pass rate), and display them on the human-computer interaction page in the form of tables and charts.

[0045] The embodiment of the present application discloses a high-temperature reverse bias aging test system.

[0046] A high temperature reverse bias aging test system, comprising: An instruction acquisition module is used to acquire test instructions; A product information reading module is used to obtain product information of the device to be tested according to the test instruction; A test parameter acquisition module is used to acquire the test duration, test environment and corresponding test voltage based on the product information of the device to be tested; A test module, used to start testing the device to be tested and obtain test results based on the test time, test environment and corresponding test voltage; The warning module is used to output a warning message if the test result does not meet the high temperature aging standard conditions.

[0047] The present application provides a smart terminal.

[0048] An intelligent terminal comprises a memory and a processor, wherein the memory stores a computer program which can be loaded by the processor and execute the above-mentioned high-temperature reverse bias aging test method.

[0049] The present application provides a computer-readable storage medium, A computer-readable storage medium stores a computer program that can be loaded by a processor and execute the above-mentioned high-temperature reverse bias aging test method.

[0050] The implementation principle of a high-temperature reverse-bias aging test method, system, terminal and medium in an embodiment of the present application is as follows: through clear steps (obtaining instructions, product information, test parameter settings, etc.), the test process is made more standardized, the possibility of operational errors is reduced, and the test duration, environment and voltage are dynamically adjusted according to the specific information of the device to be tested (such as materials, design parameters) to ensure the adaptability of the test conditions, improve the accuracy and effectiveness of the test, monitor and evaluate the test results in real time, and output warning information to provide real-time feedback on test results that do not meet the standards, thereby improving the accuracy and reliability of the test.

[0051] The above are all preferred embodiments of the present application, and the protection scope of the present application is not limited thereto. Therefore, any equivalent changes made according to the structure, shape, and principle of the present application should be included in the protection scope of the present application.

Claims

1. A high temperature reverse bias aging test method, characterized in that: include: Get test instructions; Obtain product information of the device to be tested according to the test instructions; Acquire test duration, test environment, and corresponding test voltage based on product information of the device to be tested; Starting testing the device to be tested and obtaining test results based on the test time, test environment and corresponding test voltage; The steps of starting testing the device to be tested and obtaining the test results based on the test time, the test environment and the corresponding test voltage include: Adjust ambient temperature and humidity based on the test environment and obtain real-time environmental information; If the real-time environment information is not synchronized with the set environment information within the set time, a fault message will be output and the test will be stopped; If the real-time environment information is synchronized with the set environment information within the set time, the test duration is set based on the test time and the input reverse voltage is set based on the test voltage; Based on the set test time and reverse voltage, start testing the device to be tested under the set environment and obtain real-time current information and real-time resistance information of the device to be tested; Generate test results based on real-time current information and real-time resistance information; If the test result does not meet the high temperature aging standard conditions, a warning message will be output.

2. A high temperature reverse bias aging test method according to claim 1, characterized in that: After the step of outputting a warning message if the test result does not meet the high temperature aging standard conditions, the method further includes: Get retest instructions; Check the device status based on the retest instruction and generate retest product information; If the device status meets the retest standard, retest parameters are set based on the retest product information. The retest parameters include test duration, test environment, and test voltage. Retest the device based on the retest parameters and output retest results; If the retest result does not meet the retest conditions, output unqualified information.

3. A high temperature reverse bias aging test method according to claim 1, characterized in that: The step of outputting fault information and stopping the test if the real-time environment information fails to synchronize with the set environment information within the set time also includes: If the real-time environmental information is not synchronized with the set environmental information within the set time, the temperature change curve and the humidity change curve are obtained; Analyze curve characteristics based on temperature change curve and humidity change curve; Fault information is determined based on curve characteristics.

4. A high temperature reverse bias aging test method according to claim 1, characterized in that: After the step of starting to test the device to be tested and obtaining the test result based on the test time, the test environment and the corresponding test voltage, the following steps are included: Establish a historical database based on product information and test results; Calculate the qualified rate of the current device to be tested based on the historical database; Compare this pass rate to a set standard; If the pass rate does not meet the set standard, the tested device is judged to be unqualified and a quality report is output.

5. A high temperature reverse bias aging test method according to claim 1, characterized in that: The method further comprises: Obtain historical test data of the same product based on the product information of the device to be tested; Compare and analyze based on historical test data and real-time test results, and generate comparison results; Based on the comparison results, feedback information is dynamically generated and displayed on the human-computer interaction interface.

6. A high temperature reverse bias aging test method according to claim 1, characterized in that: The product information includes product model, product material, rated withstand voltage, operating environment and usage specifications.

7. A high temperature reverse bias aging test system, characterized in that: include, An instruction acquisition module is used to acquire test instructions; A product information reading module is used to obtain product information of the device to be tested according to the test instruction; A test parameter acquisition module is used to acquire the test duration, test environment and corresponding test voltage based on the product information of the device to be tested; A test module, used to start testing the device to be tested and obtain test results based on the test time, test environment and corresponding test voltage; The warning module is used to output a warning message if the test result does not meet the high temperature aging standard conditions.

8. An intelligent terminal, characterized in that: The method comprises a memory and a processor, wherein the memory stores a computer program that can be loaded by the processor and execute the high-temperature reverse bias aging test method according to any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that: A computer program is stored which can be loaded by a processor and execute the high temperature reverse bias aging test method according to any one of claims 1 to 6.

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