Laser LIV test threshold calculation method and system based on triangular threshold method

Abstract

The invention discloses a laser LIV test threshold calculation method and system based on a triangular threshold method, and the method comprises the steps: 1, obtaining the output power data of a laser under different currents through laser LIV test equipment; 2, the data collected in the step 1 are drawn into a scatter diagram, the abscissa represents a current value, and the ordinate represents an output power value; 3, analyzing the scatter diagram by using a triangular threshold method to find a segmentation threshold; and step 4, according to the determined segmentation threshold, calculating to obtain the threshold current of the laser. According to the method, the calculation process is simplified, and the accuracy of a calculation result is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of laser performance testing, and in particular to a method and system for calculating a laser LIV test threshold based on a triangular threshold method. Background Art

[0002] As an important optoelectronic device, the accurate measurement of the performance parameters of the laser is crucial for quality control and performance evaluation. Among them, the threshold current of the laser refers to the minimum current value at which the laser begins to produce stable laser. The existing LIV test threshold calculation methods, such as linear fitting method, two-segment fitting method, first-order derivative method and second-order derivative method, can calculate the threshold current, but there are problems such as complex calculation process, high data requirements and limited scope of application. Therefore, it is necessary to propose a new calculation method to improve the calculation efficiency and accuracy. Summary of the invention

[0003] In view of the technical defects and technical drawbacks in the prior art, the embodiments of the present invention provide a method and system for calculating the laser LIV test threshold based on the triangular threshold method to overcome the above problems or at least partially solve the above problems. The specific scheme is as follows:

[0004] As a first aspect of the present invention, a method for calculating a laser LIV test threshold based on a triangular threshold method is provided, the method comprising:

[0005] Step 1, using laser LIV test equipment to obtain output power data of the laser at different currents;

[0006] Step 2, plotting the data collected in step 1 into a scatter plot, wherein the abscissa represents the current value and the ordinate represents the output power value;

[0007] Step 3, apply the triangular threshold method to analyze the scatter plot and find the segmentation threshold;

[0008] Step 4: Calculate the threshold current of the laser according to the determined segmentation threshold.

[0009] Furthermore, step 2 also includes: preprocessing the scatter plot, including removing abnormal data points and smoothing the data to reduce noise interference.

[0010] Furthermore, step 3 specifically includes:

[0011] Step 301, identifying the maximum peak in the scatter plot, which peak corresponds to the maximum output power of the laser;

[0012] Step 302, taking the maximum peak as the vertex, finding the lowest point in the scatter plot to the left, and connecting the vertex and the lowest point to form the base of a triangle;

[0013] Step 303, calculating the straight-line distance from each point between the vertex and the lowest point to the bottom edge, finding the maximum straight-line distance, and the current value corresponding to the maximum straight-line distance is the segmentation threshold.

[0014] Furthermore, in step 4, the current value corresponding to the segmentation threshold is the threshold current.

[0015] As a second aspect of the present invention, a laser LIV test threshold calculation system based on a triangular threshold method is provided, the system comprising a data collection module, a drawing module and a data analysis module;

[0016] The data collection module is used to obtain the output power data of the laser at different currents using the laser LIV test equipment;

[0017] The drawing module is used to draw the data collected by the data collection module into a scatter plot, wherein the abscissa represents the current value and the ordinate represents the output power value;

[0018] The data analysis module is used to analyze the scatter plot using a triangular threshold method to find a segmentation threshold, and calculate the threshold current of the laser according to the determined segmentation threshold.

[0019] Furthermore, the drawing module is also used to pre-process the scatter plot, including removing abnormal data points and smoothing the data to reduce noise interference.

[0020] Furthermore, the data analysis module is specifically used for:

[0021] Identify the largest peak in the scatter plot, which corresponds to the maximum output power of the laser;

[0022] Taking the maximum peak as the vertex, find the lowest point in the scatter plot to the left, and connect the vertex and the lowest point to form the base of the triangle;

[0023] The straight-line distance from each point between the vertex and the lowest point to the bottom edge is calculated to find the maximum straight-line distance, and the current value corresponding to the maximum straight-line distance is the segmentation threshold.

[0024] Furthermore, the current value corresponding to the segmentation threshold is the threshold current.

[0025] The present invention has the following beneficial effects:

[0026] 1. The calculation process is simple and easy to implement, which reduces the calculation complexity;

[0027] 2. Improved the accuracy of threshold current calculation, which helps to more accurately evaluate laser performance;

[0028] 3. Suitable for lasers of different types and specifications, with wide applicability;

[0029] 4. Improved the testing efficiency in the laser production process and reduced production costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0031] Figure 1 The present invention provides a flowchart of a method for calculating a laser LIV test threshold based on a triangular threshold method. DETAILED DESCRIPTION

[0032] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0033] Reference Figure 1 As shown, a method for calculating a laser LIV test threshold based on a triangular threshold method provided by an embodiment of the present invention mainly includes:

[0034] Step 1, using laser LIV test equipment to obtain output power data of the laser at different currents;

[0035] Step 2, plotting the data collected in step 1 into a scatter plot, in which the horizontal axis represents the current value and the vertical axis represents the output power value;

[0036] Step 3, apply the triangular threshold method to analyze the scatter plot and find the segmentation threshold;

[0037] Step 4: Calculate the threshold current of the laser according to the determined segmentation threshold.

[0038] The present invention creatively calculates the threshold current through the triangular threshold method, which improves the accuracy of the threshold current calculation and helps to more accurately evaluate the laser performance. The calculation process is simple and easy to implement, which reduces the calculation complexity. It is suitable for lasers of different types and specifications and has a wide range of applicability.

[0039] In some embodiments, step 2 also includes: preprocessing the scatter plot, including removing abnormal data points, smoothing the data, etc., to reduce noise interference and improve data quality. After preprocessing the data, the scatter plot is updated. In step 3, the preprocessed scatter plot is analyzed using a triangular threshold method.

[0040] In some embodiments, step 3 specifically includes:

[0041] Step 301, identifying the maximum peak in the scatter plot, which peak corresponds to the maximum output power of the laser;

[0042] Step 302, taking the maximum peak as the vertex, finding the lowest point in the scatter plot to the left, and connecting the vertex and the lowest point to form the base of a triangle;

[0043] Step 303, calculating the straight-line distance from each point between the vertex and the lowest point to the bottom edge, finding the maximum straight-line distance, and the current value corresponding to the maximum straight-line distance is the segmentation threshold.

[0044] Wherein, in step 4, the current value corresponding to the segmentation threshold is determined as the threshold current of the laser.

[0045] The embodiment of the present invention also provides a laser LIV test threshold calculation system based on the triangular threshold method, characterized in that the system includes a data collection module, a drawing module and a data analysis module;

[0046] The data collection module is used to obtain the output power data of the laser at different currents using the laser LIV test equipment;

[0047] The drawing module is used to draw the data collected by the data collection module into a scatter plot, wherein the abscissa represents the current value and the ordinate represents the output power value;

[0048] The data analysis module is used to analyze the scatter plot using a triangular threshold method to find a segmentation threshold, and calculate the threshold current of the laser according to the determined segmentation threshold.

[0049] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for calculating the laser LIV test threshold based on the triangular threshold method, characterized in that: The method comprises: Step 1, using laser LIV test equipment to obtain output power data of the laser at different currents; Step 2, plotting the data collected in step 1 into a scatter plot, wherein the abscissa represents the current value and the ordinate represents the output power value; Step 3, apply the triangular threshold method to analyze the scatter plot and find the segmentation threshold; Step 4: Calculate the threshold current of the laser according to the determined segmentation threshold.

2. The laser LIV test threshold calculation method based on the triangular threshold method according to claim 1 is characterized in that: Step 2 also includes: preprocessing the scatter plot, including removing abnormal data points and smoothing the data to reduce noise interference, and updating the scatter plot.

3. The laser LIV test threshold calculation method based on the triangular threshold method according to claim 1, characterized in that: Step 3 specifically includes: Step 301, identifying the maximum peak in the scatter plot, which peak corresponds to the maximum output power of the laser; Step 302, taking the maximum peak as the vertex, finding the lowest point in the scatter plot to the left, and connecting the vertex and the lowest point to form the base of a triangle; Step 303, calculating the straight-line distance from each point between the vertex and the lowest point to the bottom edge, finding the maximum straight-line distance, and the current value corresponding to the maximum straight-line distance is the segmentation threshold.

4. The laser LIV test threshold calculation method based on the triangular threshold method according to claim 1 is characterized in that: In step 4, the current value corresponding to the segmentation threshold is the threshold current.

5. A laser LIV test threshold calculation system based on the triangular threshold method, characterized in that: The system includes a data collection module, a drawing module and a data analysis module; The data collection module is used to obtain the output power data of the laser at different currents using the laser LIV test equipment; The drawing module is used to draw the data collected by the data collection module into a scatter plot, wherein the abscissa represents the current value and the ordinate represents the output power value; The data analysis module is used to analyze the scatter plot using a triangular threshold method to find a segmentation threshold, and calculate the threshold current of the laser according to the determined segmentation threshold.

6. The laser LIV test threshold calculation system based on the triangular threshold method according to claim 5, characterized in that: The drawing module is also used to pre-process the scatter plot, including removing abnormal data points and smoothing the data to reduce noise interference, and update the scatter plot.

7. The laser LIV test threshold calculation system based on the triangular threshold method according to claim 5, characterized in that: The data analysis module is specifically used for: Identify the largest peak in the scatter plot, which corresponds to the maximum output power of the laser; Taking the maximum peak as the vertex, find the lowest point in the scatter plot to the left, and connect the vertex and the lowest point to form the base of the triangle; The straight-line distance from each point between the vertex and the lowest point to the bottom edge is calculated to find the maximum straight-line distance, and the current value corresponding to the maximum straight-line distance is the segmentation threshold.

8. The laser LIV test threshold calculation system based on the triangular threshold method according to claim 5, characterized in that: The current value corresponding to the segmentation threshold is the threshold current.

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