Test data updating method and device, equipment and storage medium

The existence of the configuration file is determined by connecting the mobile hard disk to the USB interface, and the test database is updated according to the configuration file, which solves the inefficiency problem caused by manual dialing or solidifying download in the existing technology, realizes dynamic upgrades and parameter compatibility, and improves the chip Test efficiency.

CN119493804APending Publication Date: 2025-02-21XIAMEN UNISOC TECH CO LTD
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Patent Information

Application Number
CN202411523581.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-10-29
Publication Date
2025-02-21

AI Technical Summary

Technical Problem

In the prior art, it is necessary to manually toggle the dial switch or solidify the download configuration file, resulting in inefficient chip testing, especially when the configuration file is upgraded, the configuration file needs to be downloaded again.

Method used

Connect the mobile hard disk to the USB interface of the chip to be tested to determine whether there is a configuration file. If it exists, read and update the test database. If it does not exist, use the current database. Determine the matching test data based on the updated database and screen identifier, and Perform screen testing.

Benefits of technology

It realizes dynamic upgrade of configuration files and is compatible with different test screen parameters, improving the chip's test efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The embodiment of the invention provides a test data updating method and device, equipment and a storage medium, and the method comprises the steps: responding to the connection operation of a mobile hard disk and a USB interface, judging whether a configuration file exists in the mobile hard disk, if yes, reading the configuration file, and carrying out the updating processing of a current test database according to the configuration file, and if not, determining the current test database as the target test database, determining matched test data according to the target test database and the screen identifier of the test screen, and performing screen test on the test screen according to the matched test data. According to the method provided by the invention, the test efficiency of the chip is improved.
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Description

Technical Field

[0001] The present application belongs to the technical field of data processing, and specifically relates to a test data updating method, device, equipment and storage medium. Background Art

[0002] Chips can have different product forms according to the needs of different manufacturers. Each product form can be matched with screens with different parameters. According to the single-soft and multi-hard chip level, it is necessary to be compatible with the actual product form requirements of different manufacturers. When the chip is manufactured and tested on the production line, it is necessary to match it with display screens with different parameters for testing. Display screens with different parameters need to be configured differently during initialization and display.

[0003] Currently, the display screen can be configured differently in the following ways: initializing a specific screen by controlling a dip switch, and testing the display screen after initialization; or downloading a configuration file in a test chip first, and testing the display screen according to the configuration file.

[0004] In the above configuration process, it is necessary to manually turn the DIP switch, or download the configuration file to the chip. If the configuration file is upgraded, it is necessary to re-download the configuration file for testing, resulting in low chip testing efficiency. Summary of the invention

[0005] The embodiments of the present application relate to a test data updating method, apparatus, device and storage medium, which are used to solve the defect in the prior art that a dip switch needs to be manually turned, or a configuration file needs to be fixed and downloaded to a chip. If the configuration file is upgraded, the configuration file needs to be downloaded again for testing, resulting in low chip testing efficiency.

[0006] In a first aspect, an embodiment of the present application provides a method for updating test data, which is applied to a chip to be tested, wherein the chip to be tested includes a universal serial bus (USB) interface, and the chip to be tested is connected to a test screen, and the method includes:

[0007] In response to the connection operation between the mobile hard disk and the USB interface, determining whether there is a configuration file in the mobile hard disk;

[0008] If yes, read the configuration file, and update the current test database according to the configuration file to obtain the target test database; if no, determine the current test database as the target test database;

[0009] Determining matching test data according to the target test database and the screen identifier of the test screen;

[0010] Performing a screen test on the test screen according to the matching test data.

[0011] In a possible implementation, performing a screen test on the test screen according to the matching test data includes:

[0012] Determine, according to the matching test data, a plurality of project data and first identifiers respectively corresponding to the plurality of project data;

[0013] According to the screen identifier, determining at least one first target identifier among a plurality of first identifiers;

[0014] Determine, among the plurality of project data, target project data corresponding to each of the at least one first target identifier;

[0015] A screen test is performed on the test screen according to at least one target project data.

[0016] In a possible implementation manner, the target project data includes identification display data, and performing a screen test on the test screen according to at least one target project data includes:

[0017] According to the screen identifier, determining a target display identifier in the identifier display data;

[0018] According to the target display logo, a logo display test is performed on the test screen.

[0019] In a possible implementation manner, determining matching test data according to the target test database and the screen identifier of the test screen includes:

[0020] Determine second identifiers respectively corresponding to a plurality of test data to be selected in the target test database;

[0021] Determine, among the plurality of second identifiers, a second target identifier that is identical to the screen identifier;

[0022] The candidate test data corresponding to the second target identifier is determined as the matching test data.

[0023] In a possible implementation manner, the configuration file includes an enable flag and an update file, and updating the current test database according to the configuration file to obtain a target test database includes:

[0024] Determining whether the enabling flag is a preset flag;

[0025] If yes, update the current test database according to the update file to obtain the target test database;

[0026] If not, the current test database is determined as the target test database.

[0027] In a possible implementation, updating the current test database according to the update file to obtain a target test database includes:

[0028] Performing mirror processing on the update file by means of a boot component to obtain a mirror database;

[0029] The mirror database is written into the target storage space of the chip to be tested to obtain a target test database.

[0030] In a possible implementation manner, before determining whether there is a configuration file in the mobile hard disk in response to the connection operation between the mobile hard disk and the USB interface, the method further includes:

[0031] In response to a power-on operation on the chip to be tested, loading a boot program through an initialization component;

[0032] Through the boot program, multiple system components are loaded and verified to achieve initialization of the chip to be tested.

[0033] In a second aspect, an embodiment of the present application provides a test data updating device, which is applied to a chip to be tested, wherein the chip to be tested includes a universal serial bus USB interface, and the chip to be tested is connected to a test screen, and the device includes:

[0034] A determination module, configured to determine whether a configuration file exists in the mobile hard disk in response to a connection operation between the mobile hard disk and the USB interface;

[0035] If yes, the first determination module is used to read the configuration file and update the current test database according to the configuration file to obtain the target test database; if no, the first determination module is used to determine the current test database as the target test database;

[0036] A second determination module, configured to determine matching test data according to the target test database and the screen identifier of the test screen;

[0037] A testing module is used to perform a screen test on the test screen according to the matching test data.

[0038] In a possible implementation, the test module is specifically used for:

[0039] Determine, according to the matching test data, a plurality of project data and first identifiers respectively corresponding to the plurality of project data;

[0040] According to the screen identifier, determining at least one first target identifier among a plurality of first identifiers;

[0041] Determine, among the plurality of project data, target project data corresponding to each of the at least one first target identifier;

[0042] A screen test is performed on the test screen according to at least one target project data.

[0043] In a possible implementation manner, the target project data includes identification display data, and the test module is specifically used to:

[0044] According to the screen identifier, determining a target display identifier in the identifier display data;

[0045] According to the target display logo, a logo display test is performed on the test screen.

[0046] In a possible implementation manner, the second determining module is specifically configured to:

[0047] Determine second identifiers respectively corresponding to a plurality of test data to be selected in the target test database;

[0048] Determine, among the plurality of second identifiers, a second target identifier that is identical to the screen identifier;

[0049] The candidate test data corresponding to the second target identifier is determined as the matching test data.

[0050] In a possible implementation manner, the configuration file includes an enabling flag and an update file, and according to the configuration file, the first determining module is specifically configured to:

[0051] Determining whether the enabling flag is a preset flag;

[0052] If yes, update the current test database according to the update file to obtain the target test database;

[0053] If not, the current test database is determined as the target test database.

[0054] In a possible implementation manner, the first determining module is specifically configured to:

[0055] Performing mirror processing on the update file by means of a boot component to obtain a mirror database;

[0056] The mirror database is written into the target storage space of the chip to be tested to obtain a target test database.

[0057] In a possible implementation, in response to the connection operation between the mobile hard disk and the USB interface, before determining whether there is a configuration file in the mobile hard disk, the device further includes an initialization module, the initialization module being configured to:

[0058] In response to a power-on operation on the chip to be tested, loading a boot program through an initialization component;

[0059] Through the boot program, multiple system components are loaded and verified to achieve initialization of the chip to be tested.

[0060] In a third aspect, the present application provides a chip having a computer program stored thereon, wherein when the computer program is executed by the chip, the test data updating method as described in any one of the first aspects is implemented.

[0061] In a fourth aspect, the present application provides a chip module having a computer program stored thereon, and when the computer program is executed by the chip module, the test data updating method as described in any one of the first aspects is implemented.

[0062] In a fifth aspect, an embodiment of the present application provides an electronic device, including: a memory, a processor, and a transceiver;

[0063] The memory stores computer-executable instructions;

[0064] The processor executes the computer-executable instructions stored in the memory to implement the test data updating method as described in any one of the first aspects.

[0065] In a sixth aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer execution instructions, which, when executed by a processor, are used to implement the test data updating method described in any one of the first aspects.

[0066] In a seventh aspect, an embodiment of the present application provides a computer program product, including a computer program, which, when executed by a processor, implements the test data updating method described in any one of the first aspects.

[0067] The embodiment of the present application provides a test data update method, device, equipment and storage medium. In the method, by responding to the connection operation between the mobile hard disk and the USB interface, it is determined whether there is a configuration file in the mobile hard disk. If so, the configuration file is read, and the current test database is updated according to the configuration file to obtain the target test database. If not, the current test database is determined as the target test database, and matching test data is determined according to the target test database and the screen identifier of the test screen, and the test screen is screen tested according to the matching test data. In this way, the configuration file can be dynamically upgraded, and different test screen parameters can be compatible, thereby improving the test efficiency of the chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0068] In order to more clearly illustrate the technical solutions in the present application, the following is a brief introduction to the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0069] Figure 1 A schematic diagram of an application scenario provided for an embodiment of the present application;

[0070] Figure 2 A flowchart of a method for updating test data provided in an embodiment of the present application;

[0071] Figure 3 A schematic diagram of a process for initializing a chip to be tested provided in an embodiment of the present application;

[0072] Figure 4 A flowchart of another test data updating method provided in an embodiment of the present application;

[0073] Figure 5 A schematic diagram of the structure of a test data updating device provided in an embodiment of the present application;

[0074] Figure 6 A schematic diagram of the structure of another test data updating device provided in an embodiment of the present application;

[0075] Figure 7 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application.

[0076] The above drawings have shown clear embodiments of the present application, which will be described in more detail later. These drawings and text descriptions are not intended to limit the scope of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0077] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0078] It should be noted that, although the terms "first", "second", etc. are used to describe various information in the embodiments of the present application, such information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. Optionally, without departing from the scope of the present application, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information.

[0079] It should be understood that the terms "comprises" and "includes" indicate the presence of the previously mentioned features, steps, operations, but do not exclude the presence, occurrence or addition of one or at least one other feature, step, operation. The terms "and / or" and the like used in this application may be interpreted as inclusive, or mean any one or any combination. Optionally, "A and / or B" means "any of the following: A; B; A and B". In addition, the character " / " in this article generally indicates that the objects associated before and after are in an "or" relationship.

[0080] Chips can have different product forms according to the needs of different manufacturers. Each product form can be matched with screens with different parameters. According to the single-soft and multi-hard chip level, it is necessary to be compatible with the actual product form requirements of different manufacturers. When the chip is manufactured and tested on the production line, it is necessary to match it with display screens with different parameters for testing. Display screens with different parameters need to be configured differently during initialization and display.

[0081] In the related art, the display screen can be differentially configured in the following ways: initializing a specific screen by controlling a dip switch, and testing the display screen after initialization; or first downloading a configuration file in a test chip, and testing the display screen according to the configuration file.

[0082] In the above configuration process, it is necessary to manually turn the DIP switch, or download the configuration file to the chip. If the configuration file is upgraded, it is necessary to re-download the configuration file for testing, resulting in low chip testing efficiency.

[0083] In order to solve the above technical problems, the embodiment of the present application provides a method for updating test data, which judges whether there is a configuration file in the mobile hard disk in response to the connection operation between the mobile hard disk and the USB interface of the chip to be tested. If so, read the configuration file, and update the current test database according to the configuration file to obtain the target test database. If not, determine the current test database as the target test database, determine the matching test data according to the target test database and the screen identifier of the test screen, and perform screen test on the test screen according to the matching test data. In this way, the configuration file can be dynamically upgraded, and different test screen parameters can be compatible, thereby improving the test efficiency of the chip.

[0084] Next, combine Figure 1, an example is given to illustrate the application scenario of this application.

[0085] Figure 1 This is a schematic diagram of an application scenario provided by the embodiment of this application. Figure 1 , Figure 1 A chip to be tested 101 and a test screen 102 may be included.

[0086] The chip to be tested 101 may include a universal serial bus USB interface. The mobile hard disk and the chip to be tested 101 may be connected via the USB interface. After the mobile hard disk is connected to the USB interface, the AC power supply is powered on, and the chip to be tested performs operations such as initialization and screen testing.

[0087] The test screen 102 may be connected to the chip to be tested 101, and the test screen 102 may be any one of a plurality of test screens. Different test screens may have different corresponding screen parameters.

[0088] The technical solution shown in the present application is described in detail below through specific embodiments. It should be noted that the following embodiments can exist independently or in combination with each other, and the same or similar contents will not be described repeatedly in different embodiments.

[0089] Figure 2 A flowchart of a method for updating test data provided in an embodiment of the present application. The execution subject of the embodiment of the present application can be a chip to be tested or a processor in the chip to be tested. Figure 2 , the method comprising:

[0090] S201 , in response to the connection operation between the mobile hard disk and the USB interface, determining whether there is a configuration file in the mobile hard disk.

[0091] The connect operation can be used to indicate that the mobile hard disk is physically connected to the USB interface.

[0092] The chip to be tested may be initialized, and in response to the connection operation between the mobile hard disk and the USB interface, it is determined whether there is a configuration file in the mobile hard disk.

[0093] Optionally, the chip under test may be initialized in the following manner: in response to a power-on operation of the chip under test, a boot program is loaded through an initialization component; and through the boot program, multiple system components are loaded and verified to initialize the chip under test.

[0094] The initialization component may be the first part activated during the system startup process and load the boot program.

[0095] The boot program can be used to load the operating system kernel and multiple system components into memory for execution.

[0096] The plurality of system components may include a first system component, a second system component, a loader and a mode test program, wherein the first system component may be used to provide services related to power management, and the second system component may be used to provide services related to security operations, and the like.

[0097] Next, combine Figure 3 , the process of initializing the chip to be tested is explained.

[0098] Figure 3 A schematic diagram of a process flow for initializing a chip to be tested provided in an embodiment of the present application. Figure 3 , Figure 3 It may include an initialization component 301 , a boot program 302 , a first system component 303 , a second system component 304 , a loader 305 and a mode test program 306 .

[0099] The initialization component 301 can load the boot program 302, the boot program 302 can load the first system component 303, the second system component 304 and the loader 305 and verify the images corresponding to the multiple system components respectively, and then jump to the first system component 303. The first system component 303 will first jump to the second system component 304 to complete the initialization of the second system component 304, then return to the first system component 303 from the second system component 304, and then jump from the first system component 303 to the loader 305. After the loader 305 is initialized, the mode test program 306 is loaded to realize the initialization of the chip to be tested.

[0100] S202: If yes, read the configuration file, and update the current test database according to the configuration file to obtain the target test database; if no, determine the current test database as the target test database.

[0101] The configuration file may include an enable flag and an update file.

[0102] The update file can be used to update the test database.

[0103] The update file may include multiple second identifiers and the test data to be selected corresponding to each second identifier.

[0104] The second identifier can be used to indicate identifiers corresponding to different product forms, and each product form corresponds to different test data to be selected.

[0105] The update process may be to update the test data in the current test database.

[0106] The target test database may be a database against which screen testing is performed.

[0107] If yes, the configuration file can be read, and the current test database can be updated according to the enable flag and update file in the configuration file to obtain the target test database. If no, the current test database can be determined as the target test database.

[0108] Optionally, the configuration file includes an enable flag and an update file. According to the configuration file, the current test database is updated to obtain a target test database: determine whether the enable flag is a preset flag; if so, update the current test database according to the update file to obtain the target test database; if not, determine the current test database as the target test database.

[0109] The enable flag may be used to indicate whether the update file is activated.

[0110] The enable flag may include an activation flag and an inactivation flag.

[0111] The preset identifier may be an activation identifier.

[0112] Optionally, the current test database may be updated according to the update file to obtain a target test database by mirroring the update file through a boot component to obtain a mirror database; and the mirror database is written into a target storage space of the chip to be tested to obtain a target test database.

[0113] Optionally, the update file may be mirrored by the boot component to obtain a mirrored database in the following manner: the boot component may be called by a preset instruction to perform mirroring and signature verification to obtain a mirrored database.

[0114] S203: Determine matching test data according to the target test database and the screen identifier of the test screen.

[0115] The screen ID can be used to indicate the type of test screen.

[0116] The matching test data may be used to represent test data required when performing a screen test on a test screen.

[0117] A screen identifier of the test screen may be determined, and matching test data may be determined in a target test database based on the screen identifier.

[0118] Optionally, matching test data can be determined based on the target test database and the screen identifier of the test screen in the following manner: determine the second identifiers corresponding to multiple test data to be selected in the target test database; determine a second target identifier that is identical to the screen identifier among the multiple second identifiers; and determine the test data to be selected corresponding to the second target identifier as the matching test data.

[0119] The second identifier may be used to indicate a screen identifier of a screen to which the test data to be selected is applicable.

[0120] S204: Perform a screen test on the test screen according to the matching test data.

[0121] Screen testing may include color accuracy testing, contrast testing, resolution and clarity testing, response time testing, etc., without limitation here.

[0122] At least one target item data may be determined based on the matching test data, and a screen test may be performed on the test screen based on the at least one target item data.

[0123] The test data updating method provided in this embodiment judges whether there is a configuration file in the mobile hard disk in response to the connection operation between the mobile hard disk and the USB interface. If so, the configuration file is read, and the current test database is updated according to the configuration file to obtain the target test database. If not, the current test database is determined as the target test database, and matching test data is determined according to the target test database and the screen identifier of the test screen, and the test screen is screen tested according to the matching test data. In this way, the configuration file can be dynamically upgraded, and different test screen parameters can be compatible, thereby improving the test efficiency of the chip.

[0124] Next, combine Figure 4 , the process (S204) of performing screen testing on the test screen according to the matching test data is explained.

[0125] Figure 4 A flowchart of another test data updating method provided in an embodiment of the present application. Based on the above embodiment, see Figure 4 , the method comprising:

[0126] S401. Determine, according to matching test data, a plurality of project data and first identifiers respectively corresponding to the plurality of project data.

[0127] Project data can be used to represent data corresponding to a test project.

[0128] The first identifier may be used to indicate a screen identifier corresponding to a test screen parameter to which the project data is applicable.

[0129] The matching test data may be parsed to determine a plurality of project data and first identifiers respectively corresponding to the plurality of project data.

[0130] For example, assume a project data, which has a corresponding first identifier projectid_001.

[0131] S402: Determine at least one first target identifier from a plurality of first identifiers according to the screen identifier.

[0132] The first target identifier may be used to represent a first identifier that is the same as the screen identifier.

[0133] At least one first target identifier that is the same as the screen identifier may be determined from among the plurality of first identifiers.

[0134] S403: Determine, among the plurality of project data, target project data corresponding to at least one first target identifier.

[0135] The target item data may be used to represent the data of the test item corresponding to the current test screen.

[0136] For example, at least one first target identifier is projectid_001, and the project data corresponding to projectid_001 is determined, and the project data is determined as the target project data.

[0137] S404: Perform screen testing on the test screen according to at least one target project data.

[0138] At least one test item may be determined according to at least one target item data, and a screen test may be performed on the test screen according to the at least one test item in turn.

[0139] Optionally, the target project data includes identification display data, and the test screen can be tested according to at least one target project data in the following manner: according to the screen identification, determine the target display identification in the identification display data; according to the target display identification, perform the identification display test on the test screen.

[0140] There is a mapping relationship between the screen identifier and the display identifier, and the mapping relationship may include multiple screen identifiers and a display identifier corresponding to each screen identifier.

[0141] For example, the mapping relationship can be expressed by the following code:

[0142]

[0143] Among them, project_001, project_002, and project_003 may represent screen identifiers.

[0144] <logo_index_1> ,<logo_index_2> Can represent display identification.

[0145] The target display identifier may be used to indicate the display identifier corresponding to the screen identifier.

[0146] The implementation content of each step in the embodiment of the present application can refer to the description of the corresponding steps or operations in the above method embodiment, and repeated content will not be repeated.

[0147] The test data updating method provided in this embodiment determines a plurality of project data and first identifiers respectively corresponding to the plurality of project data according to matching test data; determines at least one first target identifier among the plurality of first identifiers according to the screen identifier; determines target project data respectively corresponding to the at least one first target identifier among the plurality of project data; and performs screen testing on the test screen according to the at least one target project data. In this way, the configuration file can be dynamically upgraded, and different test screen parameters can be compatible, thereby improving the test efficiency of the chip.

[0148] Figure 5 This is a schematic diagram of the structure of a test data updating device provided in an embodiment of the present application. Figure 5 , applied to a chip to be tested, the chip to be tested includes a universal serial bus USB interface, the chip to be tested is connected to a test screen, the test data updating device 500 includes a judgment module 501, a first determination module 502, a second determination module 503 and a test module 504, wherein,

[0149] A determination module 501 is used to determine whether there is a configuration file in the mobile hard disk in response to the connection operation between the mobile hard disk and the USB interface;

[0150] If yes, the first determination module 502 is used to read the configuration file and update the current test database according to the configuration file to obtain the target test database. If no, the first determination module 502 is used to determine the current test database as the target test database.

[0151] A second determination module 503, configured to determine matching test data according to the target test database and the screen identifier of the test screen;

[0152] The testing module 504 is used to perform a screen test on the test screen according to the matching test data.

[0153] In a possible implementation, the testing module 504 is specifically used to:

[0154] Determine, according to the matching test data, a plurality of project data and first identifiers respectively corresponding to the plurality of project data;

[0155] According to the screen identifier, determining at least one first target identifier among a plurality of first identifiers;

[0156] Determine, among the plurality of project data, target project data corresponding to each of the at least one first target identifier;

[0157] A screen test is performed on the test screen according to at least one target project data.

[0158] In a possible implementation, the target project data includes identification display data, and the testing module 504 is specifically used to:

[0159] According to the screen identifier, determining a target display identifier in the identifier display data;

[0160] According to the target display logo, a logo display test is performed on the test screen.

[0161] In a possible implementation manner, the second determining module 503 is specifically configured to:

[0162] Determine second identifiers respectively corresponding to a plurality of test data to be selected in the target test database;

[0163] Determine, among the plurality of second identifiers, a second target identifier that is identical to the screen identifier;

[0164] The candidate test data corresponding to the second target identifier is determined as the matching test data.

[0165] In a possible implementation manner, the configuration file includes an enabling identifier and an update file. According to the configuration file, the first determining module 502 is specifically configured to:

[0166] Determining whether the enabling flag is a preset flag;

[0167] If yes, update the current test database according to the update file to obtain the target test database;

[0168] If not, the current test database is determined as the target test database.

[0169] In a possible implementation manner, the first determining module 502 is specifically configured to:

[0170] Performing mirror processing on the update file by means of a boot component to obtain a mirror database;

[0171] The mirror database is written into the target storage space of the chip to be tested to obtain a target test database.

[0172] Figure 6 A schematic diagram of the structure of another test data updating device provided in an embodiment of the present application. Figure 5 Based on the examples shown, see Figure 6 The test data updating device 500 also includes an initialization module 505 .

[0173] The initialization module 505 is used to:

[0174] In response to a power-on operation on the chip to be tested, loading a boot program through an initialization component;

[0175] Through the boot program, multiple system components are loaded and verified to achieve initialization of the chip to be tested.

[0176] Figure 7 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. Figure 7 , the electronic device 700 may include: a memory 701 , a processor 702 , and a transceiver 703 .

[0177] The memory 701 is used to store program instructions;

[0178] The processor 702 is used to execute the program instructions stored in the memory, so as to enable the electronic device 700 to execute any of the test data updating methods shown above.

[0179] The transceiver 703 may include: a transmitter and / or a receiver. The transmitter may also be referred to as a transmitter, a transmitter, a transmission port, a transmission interface, or the like, and the receiver may also be referred to as a receiver, a reception port, a reception interface, or the like. Exemplarily, the memory 701, the processor 702, and the transceiver 703 are interconnected via a bus 704.

[0180] The present application also provides a chip having a computer program stored thereon. When the computer program is executed by the chip, the above-mentioned test data updating method is implemented. The corresponding content and effects can be referred to in the method embodiment part, which will not be described in detail.

[0181] The present application also provides a chip module, on which a computer program is stored. When the computer program is executed by the chip module, the above-mentioned test data updating method is implemented. The corresponding content and effects can be referred to the method embodiment part, which will not be repeated here.

[0182] The embodiment of the present application also provides a computer program product, which can be executed by a processor. When the computer program product is executed, the above-mentioned test data updating method can be implemented.

[0183] The test data updating device, electronic device, computer-readable storage medium and computer program product of the embodiments of the present application can execute the technical solutions shown in the above-mentioned test data updating method embodiments, and their implementation principles and beneficial effects are similar, which will not be repeated here.

[0184] All or part of the steps of the above-mentioned method embodiments can be completed by hardware related to program instructions. The aforementioned program can be stored in a readable memory. When the program is executed, the steps of the above-mentioned method embodiments are executed; and the aforementioned memory (storage medium) includes: read-only memory (ROM), random access memory (RAM), flash memory, hard disk, solid state drive, magnetic tape, floppy disk, optical disc and any combination thereof.

[0185] The embodiments of the present application are described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer executable instructions. These computer executable instructions can be provided to a processing unit of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable test data update device to generate a machine, so that the instructions executed by the processing unit of the computer or other programmable test data update device generate instructions for implementing the process in the flowchart. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0186] These computer executable instructions may also be stored in a computer readable memory capable of directing a computer or other programmable test data update device to operate in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture including an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0187] These computer executable instructions may also be loaded onto a computer or other programmable test data updating device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for executing on the computer or other programmable device to implement the process. Figure 1 A process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.

[0188] Obviously, those skilled in the art can make various changes and modifications to the embodiments of the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the embodiments of the present application fall within the scope of the claims of the present application and their equivalents, the present application is also intended to include these modifications and variations.

Claims

1. A method for updating test data, characterized in that: Applied to a chip to be tested, the chip to be tested includes a universal serial bus USB interface, the chip to be tested is connected to a test screen, and the method includes: In response to the connection operation between the mobile hard disk and the USB interface, determining whether there is a configuration file in the mobile hard disk; If yes, read the configuration file, and update the current test database according to the configuration file to obtain the target test database; if no, determine the current test database as the target test database; Determining matching test data according to the target test database and the screen identifier of the test screen; Performing a screen test on the test screen according to the matching test data.

2. The method according to claim 1, characterized in that Performing a screen test on the test screen according to the matching test data includes: Determine, according to the matching test data, a plurality of project data and first identifiers respectively corresponding to the plurality of project data; According to the screen identifier, determining at least one first target identifier among a plurality of first identifiers; Determine, among the plurality of project data, target project data corresponding to each of the at least one first target identifier; A screen test is performed on the test screen according to at least one target project data.

3. The method according to claim 2, characterized in that The target project data includes identification display data, and the test screen is subjected to screen testing according to at least one target project data, including: According to the screen identifier, determining a target display identifier in the identifier display data; According to the target display logo, a logo display test is performed on the test screen.

4. The method according to any one of claims 1 to 3, characterized in that: Determining matching test data according to the target test database and the screen identifier of the test screen includes: Determine second identifiers respectively corresponding to a plurality of test data to be selected in the target test database; Determine, among the plurality of second identifiers, a second target identifier that is identical to the screen identifier; The candidate test data corresponding to the second target identifier is determined as the matching test data.

5. The method according to any one of claims 1 to 4, characterized in that: The configuration file includes an enabling identifier and an update file. According to the configuration file, the current test database is updated to obtain a target test database, including: Determining whether the enabling flag is a preset flag; If yes, update the current test database according to the update file to obtain the target test database; If not, the current test database is determined as the target test database.

6. The method according to claim 5, characterized in that According to the update file, the current test database is updated to obtain the target test database, including: Performing mirror processing on the update file by means of a boot component to obtain a mirror database; The mirror database is written into the target storage space of the chip to be tested to obtain a target test database.

7. The method according to any one of claims 1 to 6, characterized in that: In response to the connection operation between the mobile hard disk and the USB interface, before determining whether there is a configuration file in the mobile hard disk, the method further includes: In response to a power-on operation on the chip to be tested, loading a boot program through an initialization component; Through the boot program, multiple system components are loaded and verified to achieve initialization of the chip to be tested.

8. A device for updating test data, characterized in that: Applied to a chip to be tested, the chip to be tested includes a universal serial bus USB interface, the chip to be tested is connected to a test screen, and the device includes: A determination module, configured to determine whether a configuration file exists in the mobile hard disk in response to a connection operation between the mobile hard disk and the USB interface; If yes, the first determination module is used to read the configuration file and update the current test database according to the configuration file to obtain the target test database; if no, the first determination module is used to determine the current test database as the target test database; A second determination module, configured to determine matching test data according to the target test database and the screen identifier of the test screen; A testing module is used to perform a screen test on the test screen according to the matching test data.

9. An electronic device, characterized in that: include: memory, processors, and transceivers; Wherein, the memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory to implement the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions, which are used to implement the method according to any one of claims 1 to 7 when executed by a processor.

Citation Information

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