A Chip Production Spacing Control Method and System

Abstract

The present invention relates to the technical field of manufacturing process control, and discloses a method and system for controlling the chip production spacing. The method includes: extracting corresponding historical welding records from the historical welding record library based on the pad state data and the welding spacing threshold, and analyzing the historical welding records, and calculating the historical deviation coefficient of the welding spacing threshold based on the analysis results; judging whether it is necessary to correct the welding spacing threshold according to the historical deviation coefficient, if so, setting a correction coefficient corresponding to the welding spacing threshold, and obtaining a corrected welding spacing threshold; collecting the environmental parameters and process parameters during the welding process, and parsing the environmental parameters and process parameters, and generating a compensation control algorithm based on the parsing results; performing chip welding according to the corrected welding spacing threshold, and using an SPC tool to control the welding process based on the compensation control algorithm; The present invention can effectively improve the welding quality in the chip production process and reduce welding defects caused by improper spacing.

Description

Technical Field

[0001] The present invention relates to the technical field of manufacturing process control, and more particularly, to a method and system for controlling the spacing in chip production. Background Art

[0002] In the semiconductor industry, especially in the chip manufacturing process, the control of pad spacing is of particular importance. The accuracy of pad spacing directly determines the performance and reliability of the chip. If the pad spacing is too large or too small, it will have a negative impact on the normal operation of the chip and even cause the chip to fail. Therefore, the precise control of pad spacing is an essential part of the chip manufacturing process.

[0003] However, traditional pad spacing control methods have many limitations. Firstly, the control accuracy of these methods is often insufficient and difficult to meet the high-precision requirements of modern chip manufacturing. Secondly, the degree of automation of these methods is relatively low, requiring a large amount of manual intervention, thus increasing the production cost and the probability of errors. In addition, the production efficiency of traditional methods is not high and difficult to meet the needs of mass production.

[0004] Therefore, it is necessary to design a method and system for controlling the spacing in chip production to solve the technical problems existing in the prior art. Summary of the Invention

[0005] In view of this, the present invention proposes a method and system for controlling the spacing in chip production, aiming to solve the problem that the existing pad spacing control methods are difficult to meet the high-precision requirements of modern chip manufacturing.

[0006] On the one hand, the present invention proposes a method for controlling the spacing in chip production, including the following steps:

[0007] S100: Determine the pads to be monitored and obtain the pad status data of the pads to be monitored;

[0008] S200: Obtain the welding requirement data and component characteristic data, and determine the welding spacing threshold according to the pad status data, welding requirement data and component characteristic data;

[0009] S300: Extract the corresponding historical welding records from the historical welding record library based on the pad status data and the welding spacing threshold, analyze the historical welding records, and calculate the historical deviation coefficient of the welding spacing threshold based on the analysis results;

[0010] S400: Judge whether it is necessary to correct the welding spacing threshold according to the historical deviation coefficient. If so, set the correction coefficient corresponding to the welding spacing threshold and obtain the corrected welding spacing threshold;

[0011] S500: Collect the environmental parameters and process parameters during the welding process, analyze the environmental parameters and process parameters, and generate a compensation control algorithm based on the analysis results. Among them, the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature, and welding pressure.

[0012] S600: Perform chip welding according to the corrected welding spacing threshold, and use the SPC tool to control the welding process based on the compensation control algorithm.

[0013] Further, the determination of the welding spacing threshold according to the pad status data, welding requirement data, and component characteristic data includes:

[0014] Obtain the welding spacing threshold through the following formula:

[0015]

[0016] Among them, D is the welding spacing threshold, D p is the pad diameter, T p is the pad thickness, C p is the pad surface flatness factor, T w is the required welding temperature, P w is the required welding pressure, t w is the required welding time, S c is the component size factor, W c is the component weight factor, K is an empirical coefficient, K includes K1 and K2, K1 < K2. When K = K1, D is the first welding spacing threshold, and when K = K2, D is the second welding spacing threshold.

[0017] Further, the analysis of the historical welding records and the calculation of the historical deviation coefficient of the welding spacing threshold based on the analysis results include:

[0018] Determine the welding influence factor corresponding to each abnormal welding behavior and construct a welding influence factor sequence;

[0019] Count the first quantity of normal welding behaviors and the second quantity of abnormal welding behaviors;

[0020] Calculate the historical deviation coefficient of the welding spacing threshold according to the welding influence factor sequence, the first quantity, and the second quantity;

[0021] The historical deviation coefficient is obtained through the following formula:

[0022]

[0023] Among them, HDC is the historical deviation coefficient, F iis the i-th welding influence factor in the welding influence factor sequence, A i is the quantity of the i-th abnormal welding behavior, N is the first quantity, M is the second quantity, and λ is the weight coefficient.

[0024] Further, the determining the welding influence factor corresponding to each abnormal welding behavior includes:

[0025] Extracting the actual welding time corresponding to the abnormal welding behavior, obtaining the preset ideal welding time, and calculating the first welding time difference according to the actual welding time and the ideal welding time;

[0026] Analyzing all normal welding behaviors, determining the welding time corresponding to each normal welding behavior, and extracting the minimum welding time;

[0027] Calculating the second welding time difference according to the actual welding time and the minimum welding time;

[0028] Calculating the welding influence factor corresponding to each abnormal welding behavior based on the first welding time difference and the second welding time difference;

[0029] The calculation formula of the welding influence factor is:

[0030] F = α1×△T1 + α2×△T2;

[0031] Wherein, F is the welding influence factor, △T1 is the first welding time difference, △T2 is the second welding time difference, α1 and α2 are time difference coefficients, and α1 + α2 = 1.

[0032] Further, the determining whether to correct the welding spacing threshold according to the historical deviation coefficient includes:

[0033] Obtaining the preset historical deviation coefficient. When the historical deviation coefficient is less than or equal to the preset historical deviation coefficient, it is determined that there is no need to correct the welding spacing threshold;

[0034] When the historical deviation coefficient is greater than the preset historical deviation coefficient, it is determined that the welding spacing threshold needs to be corrected.

[0035] Further, the setting the correction coefficient corresponding to the welding spacing threshold and obtaining the corrected welding spacing threshold includes:

[0036] Presetting a correction coefficient range, wherein the correction coefficient range includes a first correction coefficient, a second correction coefficient, and a third correction coefficient;

[0037] Calculating the coefficient ratio of the historical deviation coefficient and the preset historical deviation coefficient;

[0038] When the coefficient ratio is greater than 1 and less than or equal to 1.2, select the first correction coefficient as the correction coefficient corresponding to the welding spacing threshold, and take the product value of the first correction coefficient and the welding spacing threshold as the corrected welding spacing threshold;

[0039] When the coefficient ratio is greater than 1.2 and less than or equal to 1.4, select the second correction coefficient as the correction coefficient corresponding to the welding spacing threshold, and take the product value of the second correction coefficient and the welding spacing threshold as the corrected welding spacing threshold;

[0040] When the coefficient ratio is greater than 1.4, select the third correction coefficient as the correction coefficient corresponding to the welding spacing threshold, and take the product value of the third correction coefficient and the welding spacing threshold as the corrected welding spacing threshold;

[0041] Among them, the corrected welding spacing threshold includes the first corrected welding spacing threshold and the second corrected welding spacing threshold.

[0042] Further, collect the environmental parameters and process parameters during the welding process, parse the environmental parameters and process parameters, and generate a compensation control algorithm based on the parsing results, including:

[0043] Determine the real-time environmental standard value, and calculate the environmental parameter identification compensation amount according to the environmental parameters and the real-time environmental standard value. The environmental parameter identification compensation amount is obtained by the following formula:

[0044] T A = r1×(m n - m r ) + r2×(H n - H r );

[0045] Among them, T A is the environmental parameter identification compensation amount, m n is the real-time environmental temperature, m r is the environmental temperature standard value, r1 is the temperature compensation coefficient, H n is the real-time environmental humidity, H r is the environmental humidity standard value, and r2 is the humidity compensation coefficient;

[0046] Calculate the welding process parameter identification compensation amount. The welding process parameter identification compensation amount is obtained by the following formula:

[0047] T B = g1×9T n - T w ) + g2×(P n - P w );

[0048] Among them, T B is the identification compensation amount of process parameters, and T n is the welding temperature, and T w is the required welding temperature, P n is the welding pressure, and P w is the required welding pressure, g1 is the welding temperature compensation coefficient, and g2 is the welding pressure compensation coefficient.

[0049] Furthermore, collecting the environmental parameters and process parameters during the welding process, parsing the environmental parameters and process parameters, and generating a compensation control algorithm based on the parsing results further includes:

[0050] After correcting the identification compensation amount of environmental parameters and the identification compensation amount of welding process parameters, collect the real-time pad spacing, compare the real-time pad spacing with the first corrected welding spacing threshold and the second corrected welding spacing threshold, and compensate the real-time pad spacing according to the comparison result;

[0051] When the real-time pad spacing is less than the first corrected welding spacing threshold, select the first compensation coefficient to compensate the real-time pad spacing;

[0052] When the real-time pad spacing is between the first corrected welding spacing threshold and the second corrected welding spacing threshold, no compensation is performed;

[0053] When the real-time pad spacing is greater than the second corrected welding spacing threshold, select the second compensation coefficient to compensate the real-time pad spacing.

[0054] Furthermore, welding the chip according to the corrected welding spacing threshold, and using the SPC tool to control the welding process based on the compensation control algorithm includes:

[0055] Using sensors to collect the environmental parameters and process parameters in real time, and inputting the data into the SPC tool for analysis;

[0056] And set the control limits. When the key parameters exceed the control limits, correct the environmental parameters and process parameters. The control limits include the upper control limit threshold and the lower control limit threshold of each environmental parameter and process parameter, and always control the environmental parameters and process parameters to be between the upper control limit threshold and the lower control limit threshold.

[0057] Compared with the prior art, the beneficial effects of the present invention are as follows: The chip production pitch control method provided by the present invention can effectively improve the welding quality during the chip production process and reduce welding defects caused by improper pitch. In addition, by monitoring and adjusting the welding parameters in real time, this method can adapt to changes in different environmental and material conditions, ensuring the stability and reliability of the welding process. Ultimately, this will help improve the overall production efficiency, reduce production costs, and enhance the market competitiveness of the product.

[0058] On the other hand, the present invention also proposes a chip production pitch control system, including:

[0059] A determination module, configured to determine the pads to be monitored and obtain the pad status data of the pads to be monitored;

[0060] A pitch threshold module, configured to obtain welding requirement data and component characteristic data, and determine a welding pitch threshold according to the pad status data, welding requirement data, and component characteristic data;

[0061] A historical deviation coefficient calculation module, configured to extract corresponding historical welding records from the historical welding record library based on the pad status data and the welding pitch threshold, analyze the historical welding records, and calculate the historical deviation coefficient of the welding pitch threshold based on the analysis results;

[0062] A correction module, configured to determine whether it is necessary to correct the welding pitch threshold according to the historical deviation coefficient. If so, set a correction coefficient corresponding to the welding pitch threshold and obtain a corrected welding pitch threshold;

[0063] An algorithm generation module, configured to collect environmental parameters and process parameters during the welding process, parse the environmental parameters and process parameters, and generate a compensation control algorithm based on the parsing results; wherein, the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature, and welding pressure;

[0064] A control module, configured to perform chip welding according to the corrected welding pitch threshold, and use SPC tools to control the welding process based on the compensation control algorithm.

[0065] It can be understood that the above chip production pitch control method and system have the same beneficial effects, which will not be elaborated here. Description of the Drawings

[0066] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the embodiments. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0067] Figure 1 It is a flowchart of the chip production pitch control method provided by the embodiment of the present invention;

[0068] Figure 2 It is a structural block diagram of the chip production pitch control system provided by the embodiment of the present invention. Detailed implementation manners

[0069] The following will describe the exemplary embodiments of the present disclosure in more detail with reference to the drawings. Although the exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided so that the present disclosure can be more thoroughly understood and the scope of the present disclosure can be completely conveyed to those skilled in the art. It should be noted that, without conflict, the embodiments in the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the drawings and in combination with the embodiments.

[0070] Refer to Figure 1 As shown, in some embodiments of the present application, this embodiment provides a chip production pitch control method, including the following steps:

[0071] S100: Determine the pads to be monitored and obtain the pad status data of the pads to be monitored;

[0072] In this embodiment, the pad status data includes pad diameter, pad thickness, pad shape, and pad surface flatness.

[0073] S200: Obtain the welding requirement data and component characteristic data, and determine the welding pitch threshold according to the pad status data, welding requirement data, and component characteristic data;

[0074] In this embodiment, the welding requirement data includes welding requirement temperature, welding requirement pressure, and welding requirement time; the component characteristic data includes component size and component weight.

[0075] In this embodiment, the pad pitch threshold includes a first corrected welding pitch threshold and a second corrected welding pitch threshold. The first corrected welding pitch threshold is used to determine whether the pad pitch is too small, while the second corrected welding pitch threshold is used to determine whether the pad pitch is too large. Through such a setting, it can be ensured that the pad pitch during the welding process remains within an ideal range, thereby improving the welding quality and the production efficiency of the chip.

[0076] S300: Extract the corresponding historical welding records from the historical welding record library based on the pad status data and the welding pitch threshold, analyze the historical welding records, and calculate the historical deviation coefficient of the welding pitch threshold based on the analysis results;

[0077] In this embodiment, the historical welding record library is a database that pre-stores a large amount of historical welding data, and these data include but are not limited to key parameters such as pad pitch, welding temperature, and welding pressure under different welding conditions.

[0078] S400: Determine whether it is necessary to correct the welding pitch threshold according to the historical deviation coefficient. If so, set the correction coefficient corresponding to the welding pitch threshold and obtain the corrected welding pitch threshold;

[0079] S500: Collect the environmental parameters and process parameters during the welding process, parse the environmental parameters and process parameters, and generate a compensation control algorithm based on the parsing results; among them, the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature, and welding pressure;

[0080] S600: Perform chip welding according to the corrected welding pitch threshold, and use the SPC tool to control the welding process based on the compensation control algorithm.

[0081] In this embodiment, SPC (Statistical Process Control) is statistical process control, which is a method used to monitor and control the production process to ensure that the product meets the quality standards. By real-time monitoring of key parameters, the SPC tool can timely detect abnormalities in the process, thereby taking measures for adjustment to avoid the production of non-conforming products. In the present invention, the combination of the SPC tool and the compensation control algorithm can more precisely control the welding process and ensure the accuracy and consistency of the chip pitch.

[0082] It can be understood that the chip production pitch control method provided in this embodiment can effectively improve the welding quality in the chip production process and reduce welding defects caused by improper pitch. In addition, by real-time monitoring and adjusting the welding parameters, this method can adapt to changes in different environmental and material conditions, ensuring the stability and reliability of the welding process. Finally, this will help to improve the overall production efficiency, reduce the production cost, and enhance the market competitiveness of the product.

[0083] Specifically, when determining the welding spacing threshold based on the pad status data, welding requirement data, and component characteristic data, it includes:

[0084] The welding spacing threshold is obtained through the following formula:

[0085]

[0086] where D is the welding spacing threshold, D p is the pad diameter, T p is the pad thickness, C p is the pad surface flatness factor, T w is the required welding temperature, P w is the required welding pressure, t w is the required welding time, S c is the component size factor, W c is the component weight factor, K is an empirical coefficient, K includes K1 and K2, K1 < K2, when K = K1, D is the first welding spacing threshold, and when K = K2, D is the second welding spacing threshold.

[0087] It can be understood that the selection of the empirical coefficients K1 and K2 depends on the specific production environment and welding process requirements.

[0088] Specifically, when analyzing the historical welding records and calculating the historical deviation coefficient of the welding spacing threshold based on the analysis results, it includes:

[0089] Determine the welding impact factor corresponding to each abnormal welding behavior and construct a welding impact factor sequence;

[0090] Statistically count the first quantity of normal welding behaviors and the second quantity of abnormal welding behaviors;

[0091] Calculate the historical deviation coefficient of the welding spacing threshold according to the welding impact factor sequence, the first quantity, and the second quantity;

[0092] The historical deviation coefficient is obtained through the following formula:

[0093]

[0094] where HDC is the historical deviation coefficient, F i is the i-th welding impact factor in the welding impact factor sequence, A i is the quantity of the i-th abnormal welding behavior, N is the first quantity, M is the second quantity, and λ is the weight coefficient.

[0095] It is understandable that the determination of the weight coefficient λ is based on the evaluation of the impact on the stability and reliability of the welding process. In practical applications, the value of λ can be adjusted according to the specific requirements of the production environment and welding process to ensure that the historical deviation coefficient HDC can accurately reflect the degree of deviation from the welding spacing threshold. In this way, it can be ensured that the correction of the welding spacing threshold is more accurate, thereby improving the welding quality.

[0096] Specifically, the determination of the welding impact factor corresponding to each abnormal welding behavior includes:

[0097] Extract the actual welding time corresponding to the abnormal welding behavior, obtain the preset ideal welding time, and calculate the first welding time difference according to the actual welding time and the ideal welding time;

[0098] Analyze all normal welding behaviors, determine the welding time corresponding to each normal welding behavior, and extract the minimum welding time;

[0099] Calculate the second welding time difference according to the actual welding time and the minimum welding time;

[0100] Calculate the welding impact factor corresponding to each abnormal welding behavior based on the first welding time difference and the second welding time difference;

[0101] The calculation formula for the welding impact factor is:

[0102] F = α1×△T1 + α2×△T2;

[0103] Where, F is the welding impact factor, △T1 is the first welding time difference, △T2 is the second welding time difference, α1 and α2 are time difference coefficients, and α1 + α2 = 1.

[0104] It is understandable that the selection of the time difference coefficients α1 and α2 depends on the specific welding process and production environment. In practical applications, the values of α1 and α2 can be dynamically adjusted according to the real-time feedback during the welding process to ensure that the welding impact factor can accurately reflect the degree of influence of the abnormal welding behavior on the welding quality. By accurately calculating the welding impact factor, the setting of the welding spacing threshold can be further optimized, thereby achieving a higher quality welding effect during the production process. In addition, by real-time monitoring the key parameters during the welding process and combining with the compensation control algorithm, welding defects can be effectively reduced, and the overall efficiency and product quality of chip production can be improved.

[0105] Specifically, when judging whether it is necessary to correct the welding spacing threshold according to the historical deviation coefficient, it includes:

[0106] Obtain the preset historical deviation coefficient. When the historical deviation coefficient is less than or equal to the preset historical deviation coefficient, it is determined that there is no need to correct the welding spacing threshold;

[0107] When the historical deviation coefficient is greater than the preset historical deviation coefficient, it is determined that the welding spacing threshold needs to be corrected.

[0108] It can be understood that the setting of the preset historical deviation coefficient is based on the consideration of the long-term stability of the welding process and the comprehensive analysis of historical data. In actual production, the setting of this coefficient needs to consider factors such as the volatility of the production environment, the changes in material properties, and the performance of the welding equipment. By setting a reasonable preset historical deviation coefficient, it can be ensured that the adjustment of the welding spacing threshold is neither too frequent nor lag behind the actual production requirements, thereby improving production efficiency and reducing costs while ensuring welding quality. In addition, by real-time monitoring and analyzing the key parameters in the welding process and combining with the compensation control algorithm, the dynamic adjustment of the welding spacing threshold can be realized, further improving the accuracy and reliability of chip welding.

[0109] Specifically, when setting the correction coefficient corresponding to the welding spacing threshold and obtaining the corrected welding spacing threshold, it includes:

[0110] Preset the correction coefficient interval in advance, where the correction coefficient interval includes the first correction coefficient, the second correction coefficient, and the third correction coefficient;

[0111] Calculate the coefficient ratio of the historical deviation coefficient and the preset historical deviation coefficient;

[0112] When the coefficient ratio is greater than 1 and less than or equal to 1.2, select the first correction coefficient as the correction coefficient corresponding to the welding spacing threshold, and use the product value of the first correction coefficient and the welding spacing threshold as the corrected welding spacing threshold;

[0113] When the coefficient ratio is greater than 1.2 and less than or equal to 1.4, select the second correction coefficient as the correction coefficient corresponding to the welding spacing threshold, and use the product value of the second correction coefficient and the welding spacing threshold as the corrected welding spacing threshold;

[0114] When the coefficient ratio is greater than 1.4, select the third correction coefficient as the correction coefficient corresponding to the welding spacing threshold, and use the product value of the third correction coefficient and the welding spacing threshold as the corrected welding spacing threshold;

[0115] Among them, the corrected welding spacing threshold includes the first corrected welding spacing threshold and the second corrected welding spacing threshold.

[0116] It is understandable that the selection of the correction coefficients is based on an in-depth understanding of the impact on welding quality and the optimization requirements for production efficiency. In actual applications, the values of the first correction coefficient, the second correction coefficient, and the third correction coefficient can be dynamically adjusted according to real-time data during the welding process, where the first correction coefficient < the second correction coefficient < the third correction coefficient. Such a setting ensures that the adjustment of the welding spacing threshold can flexibly respond to the degree of deviation during the actual welding process, neither affecting the welding quality due to excessive correction nor failing to correct the deviation in the welding process in a timely manner due to insufficient correction. In this way, it can be ensured that the correction of the welding spacing threshold not only meets the actual production requirements but also has no negative impact on the welding quality. In addition, by real-time monitoring of key parameters during the welding process and combining with the compensation control algorithm, welding defects can be effectively reduced, and the overall efficiency and product quality of chip production can be improved.

[0117] Specifically, when collecting the environmental parameters and process parameters during the welding process, parsing the environmental parameters and process parameters, and generating the compensation control algorithm based on the parsing results, it includes:

[0118] Determine the real-time environmental standard value, and calculate the environmental parameter identification compensation amount according to the environmental parameters and the real-time environmental standard value. The environmental parameter identification compensation amount is obtained through the following formula:

[0119] T A =r1×(m n -m r )+r2×(H n -H r );

[0120] Where, T A is the environmental parameter identification compensation amount, m n is the real-time environmental temperature, m r is the environmental temperature standard value, r1 is the temperature compensation coefficient, H n is the real-time environmental humidity, H r is the environmental humidity standard value, and r2 is the humidity compensation coefficient;

[0121] Calculate the welding process parameter identification compensation amount. The welding process parameter identification compensation amount is obtained through the following formula:

[0122] T B =g1×(T n -T w )+g2×9P n -P w );

[0123] Where, T B is the process parameter identification compensation amount, T n is the welding temperature, T w is the welding required temperature, Pn is the welding pressure, P w is the required welding pressure, g1 is the welding temperature compensation coefficient, and g2 is the welding pressure compensation coefficient.

[0124] It can be understood that by accurately calculating the compensation amounts of environmental parameters and process parameters, the welding process can be effectively adjusted to adapt to environmental changes and ensure welding quality. The setting of the temperature compensation coefficient and humidity compensation coefficient, as well as the compensation coefficients of welding temperature and pressure, are all based on a deep understanding of the welding process and strict requirements for welding quality. In actual production, these compensation coefficients need to be dynamically adjusted according to the real-time monitored environmental and process parameters to ensure the stability of the welding process and the consistency of the welding results. In this way, the accuracy and reliability of chip welding can be further improved, welding defects caused by environmental changes or improper operations can be reduced, thereby enhancing the overall production efficiency and product quality.

[0125] Specifically, when collecting the environmental parameters and process parameters in the welding process and parsing the environmental parameters and process parameters, and generating a compensation control algorithm based on the parsing results, it also includes:

[0126] After correcting the environmental parameter recognition compensation amount and the welding process parameter recognition compensation amount, collect the real-time pad pitch, compare the real-time pad pitch with the first corrected welding pitch threshold and the second corrected welding pitch threshold, and compensate the real-time pad pitch according to the comparison result;

[0127] When the real-time pad pitch is less than the first corrected welding pitch threshold, select the first compensation coefficient to compensate the real-time pad pitch;

[0128] When the real-time pad pitch is between the first corrected welding pitch threshold and the second corrected welding pitch threshold, no compensation is performed;

[0129] When the real-time pad pitch is greater than the second corrected welding pitch threshold, select the second compensation coefficient to compensate the real-time pad pitch.

[0130] It can be understood that by compensating the real-time pad spacing, it is possible to ensure that the spacing during the soldering process always remains within the ideal range, thereby avoiding soldering defects caused by excessive or too small spacing. The selection of the first compensation coefficient and the second compensation coefficient is based on in-depth analysis of the impact on soldering quality and the optimization requirements for production efficiency. In practical applications, these two compensation coefficients can be dynamically adjusted according to the real-time monitored pad spacing data to adapt to different production conditions and material characteristics. In this way, soldering defects can be effectively reduced, and the overall efficiency and product quality of chip production can be improved. In addition, by real-time monitoring the key parameters during the soldering process and combining with the compensation control algorithm, the accuracy and reliability of chip soldering can be further improved, ensuring soldering quality while increasing production efficiency and reducing costs.

[0131] Specifically, when performing chip soldering according to the corrected soldering spacing threshold and using the SPC tool to control the soldering process based on the compensation control algorithm, it includes:

[0132] Using sensors to collect environmental parameters and process parameters in real time, and inputting the data into the SPC tool for analysis;

[0133] And setting control limits. When the key parameters exceed the control limits, the environmental parameters and process parameters are corrected. The control limits include the upper control limit threshold and the lower control limit threshold for each environmental parameter and process parameter, and always control the environmental parameters and process parameters to be between the upper control limit threshold and the lower control limit threshold.

[0134] It can be understood that the use of the SPC tool can real-time monitor the key parameters during the soldering process and ensure the stability of soldering quality. The setting of the control limits is to prevent the parameter fluctuations during the soldering process from exceeding the acceptable range, thereby avoiding the generation of unqualified soldering results. The setting of the upper control limit threshold and the lower control limit threshold is based on in-depth research on the soldering process and historical data analysis to ensure that each link of the soldering process operates in the best state. When it is detected that the parameters exceed the control limits, the system will automatically adjust the environmental parameters and process parameters to quickly return to the normal working state. This real-time monitoring and automatic adjustment mechanism not only improves the reliability of the soldering process but also reduces the need for manual intervention, further enhancing production efficiency and product quality.

[0135] Refer to Figure 2 As shown, in some embodiments of the present application, this embodiment provides a chip production spacing control system, including:

[0136] A determination module, configured to determine the pads to be monitored and obtain the pad status data of the pads to be monitored;

[0137] A spacing threshold module, configured to obtain welding requirement data and component characteristic data, and determine a welding spacing threshold according to pad status data, welding requirement data, and component characteristic data;

[0138] A historical deviation coefficient calculation module, configured to extract corresponding historical welding records from a historical welding record library based on the pad status data and the welding spacing threshold, analyze the historical welding records, and calculate a historical deviation coefficient of the welding spacing threshold based on the analysis results;

[0139] A correction module, configured to determine whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient. If so, set a correction coefficient corresponding to the welding spacing threshold and obtain a corrected welding spacing threshold;

[0140] An algorithm generation module, configured to collect environmental parameters and process parameters during the welding process, parse the environmental parameters and process parameters, and generate a compensation control algorithm based on the parsing results; wherein, the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature, and welding pressure;

[0141] A control module, configured to perform chip welding according to the corrected welding spacing threshold, and use an SPC tool to control the welding process based on the compensation control algorithm.

[0142] It can be understood that the chip production spacing control system provided in this embodiment can effectively adapt to various production environments, ensuring the stability of the welding process and the consistency of welding quality. Through real-time monitoring and dynamic adjustment, welding defects caused by environmental changes or improper operations can be significantly reduced, thereby improving the overall production efficiency and product quality. In addition, this method can also use an SPC tool to monitor key parameters during the welding process in real time, ensuring the stability of welding quality. The setting of control limits is to prevent parameter fluctuations during the welding process from exceeding the acceptable range, thereby avoiding the generation of unqualified welding results. The setting of the upper control limit threshold and the lower control limit threshold is based on in-depth research on the welding process and historical data analysis to ensure that each link of the welding process operates in the best state. When it is detected that the parameters exceed the control limits, the system will automatically adjust the environmental parameters and process parameters to quickly return to the normal working state. This real-time monitoring and automatic adjustment mechanism not only improves the reliability of the welding process but also reduces the need for manual intervention, further enhancing the production efficiency and product quality.

[0143] Those skilled in the art should understand that the embodiments of the present application can be provided as a method, a system, or a computer program product. Therefore, the present application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present application can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that contain computer-usable program code.

[0144] The present application is described with reference to the flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each flow and / or block in the flowchart and / or block diagram can be implemented by computer program instructions, and the combination of the flows and / or blocks in the flowchart and / or block diagram can also be implemented by computer program instructions. These computer program instructions can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing devices generate a device for implementing the functions specified in one Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0145] These computer program instructions can also be stored in a computer-readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer-readable memory generate a manufactured article including an instruction device, and the instruction device implements the functions specified in one Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0146] These computer program instructions can also be loaded onto a computer or other programmable data processing device, so that a series of operation steps are executed on the computer or other programmable device to generate a computer-implemented process. Therefore, the instructions executed on the computer or other programmable device provide steps for implementing the functions specified in one Figure 1 one flow or multiple flows and / or blocks Figure 1 one block or multiple blocks.

[0147] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them. Although the present invention has been described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that: still can modify the specific implementation manners of the present invention or make equivalent replacements, and any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the protection scope of the claims of the present invention.

Claims

1. A chip production spacing control method, characterized in that: include: Determine a pad to be monitored, and obtain pad status data of the pad to be monitored; Acquire welding requirement data and component characteristic data, and determine a welding spacing threshold value according to the pad status data, welding requirement data and component characteristic data; When determining the welding spacing threshold according to the pad status data, welding requirement data and component characteristic data, it includes: The welding spacing threshold is obtained by the following formula: ； in, is the weld spacing threshold, is the pad diameter, is the pad thickness, is the pad surface flatness factor, is the welding temperature required, is the welding pressure requirement, Is the welding time required, is the component size factor, is the component weight factor, K is the empirical coefficient, K includes K1 and K2, K1<K2, when K=K1, is the first welding spacing threshold, when K=K2, is the second welding spacing threshold; Extracting corresponding historical welding records from a historical welding record library based on the pad status data and the welding spacing threshold, analyzing the historical welding records, and calculating a historical deviation coefficient of the welding spacing threshold based on the analysis result; Determining whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient, and if so, setting a correction coefficient corresponding to the welding spacing threshold to obtain a corrected welding spacing threshold; Collecting environmental parameters and process parameters during the welding process, analyzing the environmental parameters and process parameters, and generating a compensation control algorithm based on the analysis results; wherein the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature and welding pressure; Chip bonding is performed according to the modified bonding pitch threshold, and the bonding process is controlled using an SPC tool based on a compensation control algorithm.

2. The chip production spacing control method according to claim 1, characterized in that: Analyzing the historical welding records and calculating the historical deviation coefficient of the welding spacing threshold based on the analysis results includes: Determine the welding influencing factors corresponding to each abnormal welding behavior and construct a welding influencing factor sequence; Counting a first number of normal welding behaviors and a second number of abnormal welding behaviors; Calculate the historical deviation coefficient of the welding spacing threshold value according to the welding influencing factor sequence, the first quantity and the second quantity; The historical deviation coefficient is obtained by the following formula: ； in, is the historical deviation coefficient, is the ith welding influence factor in the welding influence factor sequence, is the number of abnormal welding behaviors of the ith type, is the first quantity, is the second quantity, is the weight coefficient.

3. The chip production spacing control method according to claim 2, characterized in that: When determining the welding influencing factors corresponding to each abnormal welding behavior, it includes: Extracting the actual welding time corresponding to the abnormal welding behavior, obtaining a preset ideal welding time, and calculating a first welding time difference according to the actual welding time and the ideal welding time; Analyze all normal welding behaviors, determine the welding time corresponding to each normal welding behavior, and extract the minimum welding time; Calculate a second welding time difference according to the actual welding time and the minimum welding time; Calculating a welding influence factor corresponding to each abnormal welding behavior based on the first welding time difference and the second welding time difference; The calculation formula of the welding influence factor is: ； in, is the welding influencing factor, is the first welding time difference, is the second welding time difference, and is the time difference coefficient and satisfies α1+α2=1.

4. The chip production spacing control method according to claim 3, characterized in that: When judging whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient, it includes: Obtaining a preset historical deviation coefficient, and when the historical deviation coefficient is less than or equal to the preset historical deviation coefficient, determining that the welding spacing threshold does not need to be corrected; When the historical deviation coefficient is greater than the preset historical deviation coefficient, it is determined that the welding spacing threshold needs to be corrected.

5. The chip production spacing control method according to claim 4, characterized in that: The correction coefficient corresponding to the welding spacing threshold is set, and the correction welding spacing threshold is obtained, including: Presetting a correction coefficient interval, wherein the correction coefficient interval includes a first correction coefficient, a second correction coefficient and a third correction coefficient; Calculating a coefficient ratio of the historical deviation coefficient and the preset historical deviation coefficient; When the coefficient ratio is greater than 1 and less than or equal to 1.2, the first correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the first correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold; When the coefficient ratio is greater than 1.2 and less than or equal to 1.4, the second correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the second correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold; When the coefficient ratio is greater than 1.4, the third correction coefficient is selected as the correction coefficient corresponding to the welding spacing threshold, and the product value of the third correction coefficient and the welding spacing threshold is used as the corrected welding spacing threshold; The corrected welding spacing threshold includes a first corrected welding spacing threshold and a second corrected welding spacing threshold.

6. The chip production spacing control method according to claim 5, characterized in that: Collecting environmental parameters and process parameters during welding, analyzing the environmental parameters and process parameters, and generating a compensation control algorithm based on the analysis results, including: Determine the real-time environmental standard value, and calculate the environmental parameter identification compensation amount according to the environmental parameter and the real-time environmental standard value, wherein the environmental parameter identification compensation amount is obtained by the following formula: ； in, is the compensation amount for environmental parameter identification, is the real-time ambient temperature, is the standard value of ambient temperature, is the temperature compensation coefficient, is the real-time ambient humidity, is the standard value of ambient humidity, is the humidity compensation coefficient; Calculate the welding process parameter identification compensation amount, which is obtained by the following formula: ； in, is the process parameter identification compensation, is the welding temperature, is the welding temperature required, is the welding pressure, is the welding pressure requirement, is the welding temperature compensation coefficient, is the welding pressure compensation coefficient.

7. The chip production spacing control method according to claim 6, characterized in that: Collecting environmental parameters and process parameters during the welding process, analyzing the environmental parameters and process parameters, and generating a compensation control algorithm based on the analysis results, also includes: After the environmental parameter identification compensation amount and the welding process parameter identification compensation amount are corrected, the real-time pad spacing is collected, the real-time pad spacing is compared with the first corrected welding spacing threshold and the second corrected welding spacing threshold, and the real-time pad spacing is compensated according to the comparison result; When the real-time pad spacing is less than the first corrected welding spacing threshold, selecting a first compensation coefficient to compensate the real-time pad spacing; When the real-time pad spacing is between the first corrected welding spacing threshold and the second corrected welding spacing threshold, no compensation is performed; When the real-time pad spacing is greater than the second corrected pad spacing threshold, a second compensation coefficient is selected to compensate for the real-time pad spacing.

8. The chip production spacing control method according to claim 7, characterized in that: When performing chip welding according to the modified welding spacing threshold, using the SPC tool and controlling the welding process based on the compensation control algorithm, it includes: Using sensors to collect the environmental parameters and process parameters in real time, and inputting the data into the SPC tool for analysis; And set control limits. When the key parameters exceed the control limits, correct the environmental parameters and process parameters. The control limits include the upper control limit threshold and the lower control limit threshold of each of the environmental parameters and process parameters. Always control the environmental parameters and process parameters to be between the upper control limit threshold and the lower control limit threshold.

9. A chip production spacing control system, applied to the chip production spacing control method according to any one of claims 1 to 8, characterized in that: include: A determination module is configured to determine a pad to be monitored and obtain pad status data of the pad to be monitored; A spacing threshold module is configured to obtain welding requirement data and component characteristic data, and determine a welding spacing threshold according to the pad state data, welding requirement data and component characteristic data; When determining the welding spacing threshold according to the pad status data, welding requirement data and component characteristic data, it includes: The welding spacing threshold is obtained by the following formula: ； in, is the weld spacing threshold, is the pad diameter, is the pad thickness, is the pad surface flatness factor, is the welding temperature required, is the welding pressure requirement, Is the welding time required, is the component size factor, is the component weight factor, K is the empirical coefficient, K includes K1 and K2, K1<K2, when K=K1, is the first welding spacing threshold, when K=K2, is the second welding spacing threshold; A historical deviation coefficient calculation module is configured to extract corresponding historical welding records from a historical welding record library based on the pad status data and the welding spacing threshold, analyze the historical welding records, and calculate the historical deviation coefficient of the welding spacing threshold based on the analysis result; a correction module, configured to determine whether the welding spacing threshold needs to be corrected according to the historical deviation coefficient, and if so, set a correction coefficient corresponding to the welding spacing threshold to obtain a corrected welding spacing threshold; An algorithm generation module is configured to collect environmental parameters and process parameters during the welding process, analyze the environmental parameters and process parameters, and generate a compensation control algorithm based on the analysis results; wherein the environmental parameters include real-time temperature data and real-time humidity data, and the process parameters include welding time, welding temperature and welding pressure; The control module is configured to perform chip bonding according to the modified bonding pitch threshold, and control the bonding process using an SPC tool and based on a compensation control algorithm.

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