Semiconductor thermoelectric material resistance testing machine

Abstract

The invention relates to the technical field of resistance testing, in particular to a semiconductor thermoelectric material resistance testing machine which comprises a rack, a control mechanism is installed on the rack, a feeding mechanism is installed on the control mechanism, a discharging mechanism is installed on the control mechanism, and a testing mechanism is installed on the control mechanism. The testing mechanism is provided with an identification mechanism, a material taking mechanism and an adjusting mechanism; the feeding mechanism and the discharging mechanism are installed through the control mechanism, conveying testing and storage of materials are achieved, the testing mechanism is matched with the control mechanism, the conveyed materials can be tested, products of different models can be tested through control of the adjusting mechanism, and through cooperation of the recognition mechanism and the material taking mechanism, the testing efficiency is improved. And the positions of the products can be identified, so that the testing mechanism can test the products conveniently, and unqualified products can be sucked to the discharging mechanism to be recycled.

Description

Technical Field

[0001] The invention relates to the technical field of resistance testing, in particular to a semiconductor thermoelectric material resistance testing machine. Background Art

[0002] Semiconductor thermoelectric materials refer to semiconductor materials with a large thermoelectric effect, also known as thermoelectric materials. They can directly convert thermal energy into electrical energy, or directly generate cooling from electrical energy. During the production of semiconductor materials, it is necessary to test the resistance of semiconductor electrothermal materials to facilitate product quality control and subsequent processing and use in other processes.

[0003] At present, in the process of testing the resistance of semiconductor materials, multiple processes are required for division of labor. The operation is complicated and inefficient, occupies a large amount of space, increases costs, and is inconvenient to identify the position information of the product. As a result, during the test, errors are prone to occur in the position where the probe and the resistor touch each other, thus affecting the test effect. It is also inconvenient to quickly extract and store unqualified products, thus affecting the efficiency of subsequent classification. At the same time, it is not convenient to clean the probe well after the test is completed, so that the conductivity of the probe is poor after contacting the resistor during subsequent tests, which also affects the test effect. Summary of the invention

[0004] In view of the problems in the prior art, the present invention provides a semiconductor thermoelectric material resistance testing machine.

[0005] The technical solution adopted by the present invention to solve its technical problems is: a semiconductor thermoelectric material resistance testing machine, comprising a frame, a control mechanism is installed on the frame, a loading mechanism is installed on the control mechanism, a discharging mechanism is installed on the control mechanism, a testing mechanism is installed on the control mechanism, an identification mechanism is installed on the testing mechanism, a material taking mechanism is installed on the testing mechanism, and an adjusting mechanism is installed on the testing mechanism.

[0006] Specifically, the control mechanism includes a table panel, the frame is equipped with the table panel, two supporting members are vertically connected to the table panel, a horizontal slide is connected between the two supporting members, and a control panel is installed on one side of the frame.

[0007] Specifically, the testing mechanism includes a connecting plate, the two ends of the top of the horizontal slide are respectively connected with connecting plates, the tops of the two connecting plates are respectively equipped with longitudinal slides, the longitudinal slides are respectively equipped with mounting frames, an upper and lower slides are installed on one end of the mounting frame, the upper and lower slides are equipped with a control plate, a fixed plate is installed at the bottom of the control plate, a rotating motor is installed on the fixed plate, the output shaft of the rotating motor is connected to a connecting seat, and two parallel probes are installed at the bottom of the connecting seat.

[0008] Specifically, the adjustment mechanism includes a mounting block, and two mounting blocks are detachably connected to one side of the bottom of the connecting seat by bolts. The tops of the two probes are respectively engaged with the two mounting blocks, and one of the mounting blocks is provided with two elliptical mounting grooves, and the mounting block is slidably connected to one side of the connecting seat through the mounting groove.

[0009] Specifically, the identification mechanism includes an upper CCD, and an upper CCD is respectively installed on the top of one side of the two control boards, a lens is installed at the bottom of the upper CCD, a cover is installed at the bottom of one side of the two control boards, a coaxial light source is installed on the inner side of the bottom of the cover, and the coaxial light source is located at the center of the bottom of the lens.

[0010] Specifically, the material picking mechanism includes a driving cylinder, and the driving cylinders are respectively installed on the opposite ends of one side of the two connecting plates. The output shaft at the bottom of the driving cylinder is connected to a suction rod, and the suction rod is located on one side of the probe. Vacuum filters are respectively installed on the two mounting frames, and vacuum generators are respectively installed on the opposite sides of the two mounting frames.

[0011] Specifically, the feeding mechanism includes a mounting plate, parallel mounting plates are respectively installed at both ends of the top of the table panel, rodless cylinders are respectively installed on the two mounting plates, and the rodless cylinders are connected to a placing table, which is slidably connected to the mounting plate through a slider and a guide rail.

[0012] Specifically, the discharge mechanism includes a support plate, support plates are respectively installed at both ends of the top of the table panel, the bottom of one end of the two support plates is connected to the table panel through a plurality of support rods, the two support plates are respectively located on the opposite sides of the two mounting plates, and the bottom plates at the other ends of the two support plates are respectively installed with rotating cylinders, the output shafts at the top of the rotating cylinders extend to the outer side of the top of the support plates, the output shafts at the top of the rotating cylinders are connected to cover plates, the other ends of the tops of the two support plates are installed with alcohol boxes, and the tops of the two support plates are respectively installed with NG boxes.

[0013] The beneficial effects of the present invention are: (1) The semiconductor thermoelectric material resistance testing machine described in the present invention facilitates the installation of the feeding mechanism and the unloading mechanism through the installation of the control mechanism, thereby facilitating the transportation and feeding of materials for testing, as well as the removal and storage of unqualified products.

[0014] (2) The semiconductor thermoelectric material resistance testing machine described in the present invention is convenient for testing the delivered materials through the coordinated installation of the testing mechanism and the control mechanism, thereby controlling the quality of the product.

[0015] (3) The semiconductor thermoelectric material resistance testing machine described in the present invention facilitates the adjustment of the angle of the testing mechanism through the installation of the adjustment mechanism, thereby facilitating the testing of products of different models.

[0016] (4) The semiconductor thermoelectric material resistance testing machine described in the present invention is conducive to identifying the position of the product through the cooperation of the identification mechanism and the material taking mechanism, thereby facilitating the testing of the testing mechanism, and sucking up unqualified products and placing them on the material discharge mechanism for recycling. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The present invention is further described below in conjunction with the accompanying drawings and embodiments.

[0018] Figure 1 A schematic diagram of the overall structure provided by the present invention; Figure 2 It is a schematic diagram of the connection structure between the table panel and the frame of the present invention; Figure 3 It is a schematic diagram of the connection structure between the transverse slide and the table panel of the present invention; Figure 4 It is a schematic diagram of the connection structure of the longitudinal slide, the upper and lower slides and the connection plate of the present invention; Figure 5 It is a schematic diagram of the connection structure between the probe and the connection base of the present invention; Figure 6 It is a schematic diagram of the connection structure between the placement table and the rodless cylinder of the present invention; Figure 7 It is a schematic diagram of the connection structure of the NG box fish support plate of the present invention.

[0019] In the figure: 1, frame; 2, control mechanism; 201, table panel; 202, control panel; 203, horizontal slide; 204, support; 3, feeding mechanism; 301, mounting plate; 302, rodless cylinder; 303, placing table; 304, slider; 305, guide rail; 4, testing mechanism; 401, connecting plate; 402, longitudinal slide; 403, mounting frame; 404, upper and lower slide; 405, fixing plate; 406, rotating motor; 407, connecting seat; 408, probe; 409, Control panel; 5. Adjustment mechanism; 501. Mounting block; 502. Mounting slot; 503. Bolt; 6. Identification mechanism; 601. Cover; 602. Coaxial light source; 603. Upper CCD; 604. Lens; 7. Discharging mechanism; 701. Support rod; 702. NG box; 703. Rotating cylinder; 704. Support plate; 705. Alcohol box; 706. Cover plate; 8. Removing mechanism; 801. Vacuum filter; 802. Vacuum generator; 803. Driving cylinder; 804. Suction rod. DETAILED DESCRIPTION

[0020] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further explained below in conjunction with specific implementation methods.

[0021] like Figure 1 , Figure 4 , Figure 5 , Figure 6 and Figure 7 As shown, a semiconductor thermoelectric material resistance testing machine described in the present invention includes a frame 1, a control mechanism 2 is installed on the frame 1, a loading mechanism 3 is installed on the control mechanism 2, a discharging mechanism 7 is installed on the control mechanism 2, a testing mechanism 4 is installed on the control mechanism 2, an identification mechanism 6 is installed on the testing mechanism 4, a picking mechanism 8 is installed on the testing mechanism 4, and an adjusting mechanism 5 is installed on the testing mechanism 4.

[0022] Specifically, Figure 1 , Figure 2 and Figure 3 As shown, the control mechanism 2 includes a table panel 201, the table panel 201 is installed on the frame 1, two support members 204 are vertically connected to the table panel 201, a horizontal slide 203 is connected between the two support members 204, and a control panel 202 is installed on one side of the frame 1. The installation of the table panel 201 facilitates the connection of the support members 204, thereby realizing the support installation of the horizontal slide 203, which is convenient for subsequent flexible testing of the product. The installation of the control panel 202 facilitates the input of the program, thereby intelligently controlling the equipment.

[0023] Specifically, Figure 2 , Figure 4 and Figure 5As shown, the testing mechanism 4 includes a connecting plate 401, the two ends of the top of the horizontal slide 203 are respectively connected with the connecting plates 401, the tops of the two connecting plates 401 are respectively installed with longitudinal slides 402, the longitudinal slides 402 are connected with mounting brackets 403, one end of the mounting bracket 403 is installed with an upper and lower slide 404, the upper and lower slides 404 are connected with a control board 409, the bottom of the control board 409 is installed with a fixing plate 405, the fixing plate 405 is installed with a rotating motor 406, the output shaft of the rotating motor 406 is connected with a connecting seat 407, the bottom of the connecting seat 407 is installed Two parallel probes 408 are installed. The installation of the connecting plate 401 facilitates the installation of the longitudinal slide 402 and the upper and lower slides 404, thereby realizing the connection of the probes 408. The drive control of the transverse slide 203 realizes the free movement of the two connecting plates 401, which facilitates the adjustment of the positions of the probes 408. The cooperation of the longitudinal slide 402 and the upper and lower slides 404 facilitates the testing of the products by the probes 408. With the cooperation of the rotating motor 406, the angle of the probe 408 can be adjusted conveniently, thereby facilitating the testing of products at different angles.

[0024] Specifically, Figure 5 As shown, the adjustment mechanism 5 includes a mounting block 501, and two mounting blocks 501 are detachably connected to one side of the bottom of the connecting seat 407 through bolts 503. The tops of the two probes 408 are respectively engaged with the two mounting blocks 501, and one of the mounting blocks 501 is provided with two elliptical mounting grooves 502. The mounting block 501 is slidably connected to one side of the connecting seat 407 through the mounting grooves 502. The installation of the mounting block 501 facilitates the connection of the probe 408. The cooperation of the bolts 503 facilitates the disassembly and maintenance of the mounting block 501. The opening of the mounting grooves 502 facilitates the position adjustment of the mounting block 501 and the adjustment of the distance of the probe 408 as needed, so as to realize the testing of products of different sizes.

[0025] Specifically, Figure 2 and Figure 4As shown, the identification mechanism 6 includes an upper CCD603, and the upper CCD603 is respectively installed on the top of one side of the two control boards 409, and a lens 604 is installed at the bottom of the upper CCD603. A cover 601 is installed at the bottom of one side of the two control boards 409, and a coaxial light source 602 is installed on the inner side of the bottom of the cover 601. The coaxial light source 602 is located at the bottom center of the lens 604. Through the cooperation of the upper CCD603 and the lens 604, it is convenient to take pictures and identify the product. Under the action of the coaxial light source 602, the upper CCD603 can take pictures of the product more clearly. After identifying the position information, the probe 408 performs an accurate resistance test on the product, and the operation is more convenient and flexible.

[0026] Specifically, Figure 4 As shown, the material picking mechanism 8 includes a driving cylinder 803, and the driving cylinders 803 are respectively installed at the opposite ends of one side of the two connecting plates 401, and the bottom output shaft of the driving cylinder 803 is connected to the suction rod 804, and the suction rod 804 is located on one side of the probe 408. Vacuum filters 801 are respectively installed on the two mounting frames 403, and vacuum generators 802 are respectively installed on the opposite sides of the two mounting frames 403. After the product test, when there is a failure, after position identification, the driving cylinder 803 works, and the driving cylinder 803 drives the suction rod 804 to slide down, which is conducive to the suction rod 804 to resist the product. With the cooperation of the vacuum generator 802 and the vacuum filter 801, the suction rod 804 lifts the product after sucking it, and extracts the product and stores it for subsequent recycling.

[0027] Specifically, Figure 1 , Figure 2 and Figure 6 As shown, the feeding mechanism 3 includes a mounting plate 301, and parallel mounting plates 301 are respectively installed at both ends of the top of the table panel 201, and rodless cylinders 302 are respectively installed on the two mounting plates 301. The rodless cylinder 302 is cooperatively connected with a placing table 303, and the placing table 303 is slidably connected to the mounting plate 301 through a slider 304 and a guide rail 305. The installation of the mounting plate 301 facilitates the connection of the rodless cylinder 302. With the cooperation of the guide rail 305 and the slider 304, the rodless cylinder 302 drives the placing table 303 to slide on the mounting plate 301. The installation of the placing table 303 facilitates the installation of different types of material trays, thereby realizing the transportation of materials and facilitating subsequent testing.

[0028] Specifically, Figure 2 and Figure 7As shown, the discharge mechanism 7 includes a support plate 704, and support plates 704 are respectively installed at both ends of the top of the table panel 201. The bottom of one end of the two support plates 704 is connected to the table panel 201 through a plurality of support rods 701. The two support plates 704 are respectively located on the opposite sides of the two mounting plates 301. The bottom plates of the other ends of the two support plates 704 are respectively installed with rotating cylinders 703. The output shaft of the top of the rotating cylinder 703 extends to the outer side of the top of the support plate 704. The output shaft of the top of the rotating cylinder 703 is connected with a cover plate 706. The other ends of the tops of the two support plates 704 are installed with Alcohol box 705, NG boxes 702 are respectively installed on the top of the two support plates 704. Through the installation of multiple support rods 701, it is convenient to support and connect the support plates 704. Through the installation of the NG box 702, it is convenient to store unqualified products. Through the installation of the alcohol box 705, it is convenient to store alcohol cotton and clean the probe 408, which is convenient for better subsequent testing. Through the operation of the rotating cylinder 703, it is convenient to drive and control the cover plate 706, so that the cover plate 706 can control the opening and closing of the alcohol box 705, thereby reducing the volatilization of alcohol.

[0029] When the present invention is in use, firstly, the installation of the table panel 201 facilitates the connection of the support member 204, thereby realizing the support and installation of the horizontal slide 203, which is conducive to the subsequent flexible testing of the product. The installation of the control panel 202 facilitates the input of the program, thereby intelligently controlling the equipment. The installation of the mounting plate 301 facilitates the connection of the rodless cylinder 302. With the cooperation of the guide rail 305 and the slider 304, the rodless cylinder 302 drives the placement table 303 to slide on the mounting plate 301. The installation of the placement table 303 facilitates the installation of different types of material trays, thereby realizing the transportation of materials and facilitating subsequent testing. The installation of multiple support rods 701 is conducive to supporting and connecting the support plate 704. The installation of the NG box 702 is conducive to storing unqualified products. The installation of the alcohol box 705 is conducive to storing alcohol cotton and cleaning the probe 408, which is convenient for subsequent better testing. The operation of the rotating cylinder 703 is conducive to driving and controlling the cover plate 706, so that the cover plate 706 can control the opening and closing of the alcohol box 705, thereby reducing the volatilization of alcohol. The installation of the connecting plate 401 is conducive to the installation of the longitudinal slide 402 and the upper and lower slides 404, thereby realizing the connection of the probe 408. The driving control of the horizontal slide 203 is realized. The two connecting plates 401 can now move freely, which is conducive to adjusting the position of the probe 408. The cooperation of the longitudinal slide 402 and the upper and lower slides 404 is conducive to the probe 408 to test the product. With the cooperation of the rotating motor 406, it is convenient to adjust the angle of the probe 408, so as to facilitate the testing of products at different angles. The installation of the mounting block 501 is conducive to the connection of the probe 408. The cooperation of the bolt 503 is convenient for the disassembly and maintenance of the mounting block 501. The opening of the mounting slot 502 is conducive to the position adjustment of the mounting block 501, and the distance adjustment of the probe 408 is conducive to the testing of products of different sizes. The test work is carried out. Through the cooperation of the upper CCD603 and the lens 604, it is convenient to take pictures and identify the product. Under the action of the coaxial light source 602, the upper CCD603 can take pictures of the product more clearly. After identifying the position information, the probe 408 performs precise resistance test on the product. The operation is more convenient and flexible. After the product test, if there is an unqualified product, after position identification, the drive cylinder 803 works, and the drive cylinder 803 drives the suction rod 804 to slide down, which is conducive to the suction rod 804 to resist the product. With the cooperation of the vacuum generator 802 and the vacuum filter 801, the suction rod 804 absorbs the product and lifts it, and the product is extracted and stored for subsequent recycling.

[0030] It will be apparent to those skilled in the art that the invention is not limited to the details of the exemplary embodiments described above and that the invention can be implemented in other specific forms without departing from the spirit or essential features of the invention. Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of the invention is defined by the appended claims rather than the foregoing description, and it is intended that all variations falling within the meaning and scope of the equivalent elements of the claims be included in the invention. Any reference numeral in a claim should not be considered as limiting the claim to which it relates.

[0031] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. A semiconductor thermoelectric material resistance testing machine, characterized in that: The invention comprises a frame (1), a control mechanism (2) being mounted on the frame (1), a feeding mechanism (3) being mounted on the control mechanism (2), a discharging mechanism (7) being mounted on the control mechanism (2), a testing mechanism (4) being mounted on the control mechanism (2), an identification mechanism (6) being mounted on the testing mechanism (4), a taking mechanism (8) being mounted on the testing mechanism (4), and an adjusting mechanism (5) being mounted on the testing mechanism (4).

2. A semiconductor thermoelectric material resistance testing machine according to claim 1, characterized in that: The control mechanism (2) comprises a table panel (201), the table panel (201) is mounted on the frame (1), two support members (204) are vertically connected to the table panel (201), a horizontal slide (203) is connected between the two support members (204), and a control panel (202) is mounted on one side of the frame (1).

3. A semiconductor thermoelectric material resistance testing machine according to claim 2, characterized in that: The testing mechanism (4) comprises a connecting plate (401), the two ends of the top of the transverse slide (203) are respectively connected to the connecting plates (401), the tops of the two connecting plates (401) are respectively installed with longitudinal slides (402), the longitudinal slides (402) are connected to the mounting frame (403), one end of the mounting frame (403) is installed with an upper and lower slide (404), the upper and lower slides (404) are connected to the control board (409), the bottom of the control board (409) is installed with a fixing plate (405), the fixing plate (405) is installed with a rotating motor (406), the output shaft of the rotating motor (406) is connected to a connecting seat (407), and the bottom of the connecting seat (407) is installed with two parallel probes (408).

4. A semiconductor thermoelectric material resistance testing machine according to claim 3, characterized in that: The adjustment mechanism (5) comprises a mounting block (501), one side of the bottom of the connecting seat (407) is detachably connected to two mounting blocks (501) via bolts (503), the tops of the two probes (408) are respectively engaged with the two mounting blocks (501), one of the mounting blocks (501) is provided with two elliptical mounting grooves (502), and the mounting block (501) is slidably connected to one side of the connecting seat (407) via the mounting grooves (502).

5. The semiconductor thermoelectric material resistance testing machine according to claim 3, characterized in that: The identification mechanism (6) comprises an upper CCD (603), the upper CCD (603) being respectively mounted on the top of one side of the two control boards (409), a lens (604) being mounted on the bottom of the upper CCD (603), a cover (601) being mounted on the bottom of one side of the two control boards (409), a coaxial light source (602) being mounted on the inner side of the bottom of the cover (601), and the coaxial light source (602) being located at the center of the bottom of the lens (604).

6. The semiconductor thermoelectric material resistance testing machine according to claim 3, characterized in that: The material taking mechanism (8) comprises a driving cylinder (803), and the driving cylinders (803) are respectively installed at opposite ends of one side of the two connecting plates (401), and the output shaft at the bottom of the driving cylinder (803) is connected to a suction rod (804), and the suction rod (804) is located on one side of the probe (408), and vacuum filters (801) are respectively installed on the two mounting frames (403), and vacuum generators (802) are respectively installed on opposite sides of the two mounting frames (403).

7. A semiconductor thermoelectric material resistance testing machine according to claim 2, characterized in that: The feeding mechanism (3) comprises a mounting plate (301), parallel mounting plates (301) are respectively mounted on the two ends of the top of the table panel (201), rodless cylinders (302) are respectively mounted on the two mounting plates (301), a placement table (303) is matched and connected to the rodless cylinder (302), and the placement table (303) is slidably connected to the mounting plate (301) via a slider (304) and a guide rail (305).

8. The semiconductor thermoelectric material resistance testing machine according to claim 7, characterized in that: The material discharge mechanism (7) comprises a support plate (704), and support plates (704) are respectively installed at both ends of the top of the table panel (201), and the bottom of one end of the two support plates (704) is connected to the table panel (201) through a plurality of support rods (701), and the two support plates (704) are respectively located on the opposite sides of the two mounting plates (301), and NG boxes (702) are respectively installed on the top of the two support plates (704).

9. A semiconductor thermoelectric material resistance testing machine according to claim 8, characterized in that: A rotating cylinder (703) is respectively installed on the bottom plates at the other ends of the two support plates (704), the top output shaft of the rotating cylinder (703) extends to the outside of the top of the support plate (704), the top output shaft of the rotating cylinder (703) is connected to a cover plate (706), and an alcohol box (705) is installed on the other ends of the tops of the two support plates (704).

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