Low-level sweep current test system and low-level sweep current test method

Abstract

The invention relates to a low-level sweep current test system and a low-level sweep current test method. The low-level swept current test system comprises a computer device, a signal analyzer and a transceiver. The signal analyzer is used for sending low-level sweep frequency signals to the transceiver based on the plurality of output frequency points under the control of the computer equipment; the transceiver is used for radiating electromagnetic waves based on the low-level sweep-frequency signals and detecting induced current of a cable in the detected electronic equipment under the electromagnetic waves to obtain a plurality of target current signals; the signal analyzer is also used for automatically following the output frequency point to receive a plurality of target current signals; and the computer equipment is used for acquiring the target current signal and determining a target transfer function value of the cable based on the target current signal. According to the embodiment of the invention, the output signal and the receiving signal in the signal analyzer are synchronized through the phase-locked loop, the target current signal is received by automatically following the output frequency point, and the frequency offset error of the output frequency point and the receiving frequency point can be avoided.

Description

Technical Field

[0001] The present application relates to the technical field of electromagnetic wave testing, and in particular to a low-level sweep current testing system and a low-level sweep current testing method. Background Art

[0002] The electromagnetic environment caused by human activities is becoming increasingly harsh, so electronic equipment is exposed to high-intensity radiated fields (HIRF) during normal operation. External electromagnetic fields act on electronic equipment through cable coupling or direct radiation, causing them to have the risk of failure, thus affecting the safe operation of electronic equipment. In order to protect the effective operation of electronic equipment, it is necessary to carry out radiation sensitivity tests in HIRF environments. For example, electronic equipment can be aircraft, aircraft, ships, etc.

[0003] Taking the aircraft as an example, due to the high electric field strength in the HIRF environment, the test is difficult to implement. Currently, the low-level scanning method is used to obtain the transfer function of the aircraft in the HIRF environment. The low-level scanning method is divided into low-level swept current, low-level swept field and low-level direct drive according to the test frequency band.

[0004] At present, in the test program control of low-level sweep current, the signal source can only output a single frequency point, and the computer equipment can only control the signal source to output the frequency point and then control the spectrum analyzer to receive the same frequency point, and then switch to the next frequency to achieve the purpose of frequency sweep. However, this method has the problem of frequency deviation error. Summary of the invention

[0005] Based on this, it is necessary to provide a low-level swept current test system and a low-level swept current test method that can solve the frequency offset error and improve the test efficiency in response to the above technical problems.

[0006] In a first aspect, the present application provides a low-level swept current test system, the system comprising a computer device, a signal analyzer and a transceiver device; the signal analyzer is connected to the computer device and the transceiver device respectively;

[0007] The signal analyzer is used to send a low-level frequency sweep signal to the transceiver device based on a plurality of output frequency points under the control of the computer device;

[0008] The transceiver is used to radiate electromagnetic waves based on the low-level sweep frequency signal, and detect the induced current of the cable in the electronic device under test under the electromagnetic wave to obtain multiple target current signals;

[0009] The signal analyzer is further used to automatically follow the output frequency point to receive a plurality of the target current signals;

[0010] The computer device is used to obtain the target current signal and determine a target transfer function value of the cable based on the target current signal.

[0011] In one of the embodiments, the transceiver device includes a transmitting antenna and a current clamp, and the current clamp is connected to the cable;

[0012] The transmitting antenna is used to radiate the electromagnetic wave based on the low-level frequency sweep signal; the electromagnetic wave includes electromagnetic waves radiated by the transmitting antenna at multiple radiation angles in each polarization direction;

[0013] The current caliper is used to detect the induced current of the cable under the electromagnetic wave to obtain a plurality of target current signals.

[0014] In one of the embodiments, the transceiver device further includes a receiving antenna;

[0015] The receiving antenna is used to receive the electromagnetic wave to obtain an initial electric field signal, and send the initial electric field signal to the signal analyzer; the initial electric field signal is used to calibrate the electric field at each test position in the test area to obtain a calibrated electric field signal, and the calibrated electric field signal is used to determine the target transfer function value of the cable with the target current signal.

[0016] In one embodiment, the computer device is used to determine the multipath reflection result of the test area and the first electric field strength of each test position based on the electric field strength spectrum curve corresponding to the initial electric field signal of each test position, and to use any of the initial electric field signals as the calibration electric field signal when the multipath reflection result indicates that there is no multipath reflection phenomenon in the test area and the difference in the first electric field strength of each test position is less than a preset strength difference.

[0017] In one of the embodiments, the computer device is used to determine the time domain gate start time and the time domain gate end time of the signal analyzer according to the first time when the direct wave of the electromagnetic wave reaches the signal analyzer and the second time when the reflected wave of the electromagnetic wave reaches the signal analyzer when the multi-path reflection junction indicates that the test area has a multi-path reflection phenomenon; the first time and the second time are determined by the signal analyzer according to the initial electric field signal and sent to the computer device;

[0018] The signal analyzer is used to filter the electric field signal corresponding to the reflected wave in each of the initial electric field signals according to the start time of the time domain gate and the end time of the time domain gate to obtain each intermediate electric field signal;

[0019] The computer device is used to determine the second electric field strength of each test position based on the electric field strength spectrum curve corresponding to each intermediate electric field signal, and when the difference between the second electric field strengths is less than the preset strength difference, use any of the intermediate electric field signals as the calibration electric field signal.

[0020] In one embodiment, the computer device is used to obtain the maximum induced current at the same output frequency for each of the polarization directions according to the induced current test curves corresponding to the multiple target current signals, and determine the initial transfer function value corresponding to each of the output frequencies at the same polarization direction according to the maximum induced current and the third electric field strength at the same output frequency; the maximum value of each of the initial transfer function values ​​at different polarization directions is used as the target transfer function value of the cable at each of the output frequencies; wherein the third electric field strength is determined according to the electric field strength spectrum curve corresponding to the calibration electric field signal.

[0021] In one embodiment, the system further comprises a power amplifier; the power amplifier is connected to the signal analyzer and the transmitting antenna;

[0022] The power amplifier is used to amplify the low-level swept-frequency signal output by the signal analyzer, and send the amplified low-level swept-frequency signal to the transmitting antenna.

[0023] In one embodiment, the system further comprises an optical fiber transmission device, the optical fiber transmission device comprises an optical fiber transmitting end and an optical fiber receiving end, the optical fiber transmitting end is connected to the receiving antenna or the current clamp, and the optical fiber receiving end is connected to the signal analyzer;

[0024] The optical fiber transmitting end is used to convert the target current signal sent by the current caliper and the initial electric field signal sent by the receiving antenna into an optical signal;

[0025] The optical fiber receiving end is used to convert the optical signal into an electrical signal and send it to a signal analyzer, so as to send the target current signal and the initial electric field signal to the signal analyzer.

[0026] In one embodiment, the electronic device under test includes a plurality of cables, the transceiver device includes a plurality of current clamps, the cables and the current clamps are connected one by one; the optical fiber transmitting end includes a plurality of input channels, the plurality of input channels are connected to corresponding current clamps, and the optical fiber receiving end is connected to the computer device;

[0027] The computer device is further used to determine a target current caliper from the plurality of current calipers by controlling the optical fiber receiving end to switch the input channel.

[0028] In a second aspect, the present application provides a low-level sweep current testing method, comprising:

[0029] Control the signal analyzer to send a low-level frequency sweep signal to the transceiver device based on multiple output frequency points;

[0030] Receive multiple target current signals sent by the signal analyzer, and determine the target transfer function value of the cable in the electronic device under test based on the multiple target current signals; wherein the multiple target current signals are the electromagnetic waves radiated by the transceiver based on the low-level swept frequency signal, and the induced current signal of the cable under the electromagnetic wave is detected, and the signal analyzer automatically receives the signal from the transceiver following the output frequency point.

[0031] In a third aspect, the present application also provides a low-level sweep current test device, comprising:

[0032] A control module, used for controlling the signal analyzer to send a low-level frequency sweep signal to a transceiver device based on multiple output frequency points;

[0033] A receiving module is used to receive multiple target current signals sent by the signal analyzer, and determine the target transfer function value of the cable in the electronic device under test according to the multiple target current signals; wherein the multiple target current signals are electromagnetic waves radiated by the transceiver based on the low-level swept frequency signal, and the induced current signal of the cable under the electromagnetic wave is detected, and the signal analyzer automatically receives the signal from the transceiver following the output frequency point.

[0034] In a fourth aspect, the present application further provides a computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements the method steps of the second aspect when executing the computer program.

[0035] In a fifth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program implements the method steps of the second aspect when executed by a processor.

[0036] In a sixth aspect, the present application further provides a computer program product, comprising a computer program, which implements the method steps of the second aspect when executed by a processor.

[0037] The above-mentioned low-level swept current test system and low-level swept current test method, the low-level swept current test system includes a computer device, a signal analyzer and a transceiver device; the signal analyzer is connected to the computer device and the transceiver device respectively; the signal analyzer is used to send a low-level swept frequency signal to the transceiver device based on multiple output frequency points under the control of the computer device; the transceiver device is used to radiate electromagnetic waves based on the low-level swept frequency signal, and detect the induced current of the cable in the electronic device under test under the electromagnetic wave to obtain multiple target current signals; the signal analyzer is also used to automatically follow the output frequency point to receive multiple target current signals; the computer device is used to obtain the target current signal and determine the target transfer function value of the cable based on the target current signal. Since the existing signal source and spectrum analyzer are two independent devices, it is necessary to control the signal source to output a certain frequency point signal, and set the spectrum analyzer to receive the same frequency point signal at the same time, and it is inevitable that there are respective frequency deviation errors between the two devices. In the embodiment of the present application, a signal analyzer is used to send a low-level sweep signal and receive a target current signal. The output and received signals in the signal analyzer are synchronized through a phase-locked loop, and the target current signal is automatically received following the output frequency. When the computer device is controlled, only multiple output frequencies need to be set to automatically complete the test, which can avoid frequency deviation errors in the output frequency and the receiving frequency. There is no need to control two instruments for each frequency, and wait for the two instruments to switch and respond before switching to the next frequency, thereby improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0039] FIG1 is a first structural schematic diagram of a low-level swept current test system in one embodiment;

[0040] FIG2 is a second structural schematic diagram of a low-level swept current test system in one embodiment;

[0041] FIG3 is a third structural schematic diagram of a low-level swept current test system in one embodiment;

[0042] FIG4 is a schematic diagram of a flow chart of a low-level sweep current testing method in one embodiment;

[0043] FIG5 is a first schematic diagram of a test area in one embodiment;

[0044] FIG6 is a second schematic diagram of a test area in one embodiment;

[0045] FIG7 is a first schematic diagram of an electric field intensity spectrum curve in one embodiment;

[0046] FIG8 is a second schematic diagram of an electric field intensity spectrum curve in one embodiment;

[0047] FIG9 is a third schematic diagram of a test area in one embodiment;

[0048] FIG10 is a time domain signal diagram of a direct wave and a reflected wave in one embodiment;

[0049] FIG11 is a third schematic diagram of an electric field intensity spectrum curve in one embodiment;

[0050] FIG12 is a fourth schematic diagram of an electric field intensity spectrum curve in one embodiment;

[0051] FIG13 is a schematic flow chart of a low-level sweep current testing method in another embodiment;

[0052] FIG14 is a block diagram of a low-level sweep current test device according to an embodiment;

[0053] FIG. 15 is a diagram showing the internal structure of a computer device in one embodiment.

[0054] Description of reference numerals:

[0055] 100. Low level sweep current test system; 11. Computer equipment;

[0056] 12. Signal analyzer; 13. Transceiver equipment;

[0057] 200. Electronic equipment under test; 21. Cables;

[0058] 131. transmitting antenna; 132. current clamp; 133. receiving antenna;

[0059] 14. Power amplifier; 15. Optical fiber transmission equipment; 151. Optical fiber transmitting end;

[0060] 152. Fiber optic receiving end. DETAILED DESCRIPTION

[0061] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0062] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0063] In this application, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, "plurality" means at least two, for example, two, three, etc., unless otherwise clearly and specifically defined.

[0064] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0065] In the present application, unless otherwise clearly specified and limited, a first feature being “above” or “below” a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being “above”, “above”, and “above” a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being “below”, “below”, and “below” a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0066] Electronic equipment is exposed to HIRF during normal operation. External electromagnetic fields act on electronic equipment through cable coupling or direct radiation, causing them to have the risk of failure. For example, during the normal operation of an aircraft, especially during takeoff and landing, external electromagnetic fields act on aircraft electronic equipment through cable coupling or direct radiation, causing them to have the risk of failure, thus affecting the safety of aircraft operation. In 2006, the Civil Aviation Administration of my country promulgated the relevant regulations AC-21-1317 "Aircraft High Intensity Radiated Field (HIRF) Protection Requirements", which clearly stated that HIRF testing is a necessary part of the aircraft airworthiness compliance assessment project. In order to protect aircraft electronic equipment, radiation sensitivity testing in a HIRF environment is required.

[0067] Due to the high electric field strength and high power in the HIRF environment, the current high-level radiation sensitivity tests include the reverberation chamber method and the outdoor high-power direct irradiation method. The reverberation chamber is a closed cavity composed of a well-conductive wall, equipped with a stirrer, which has the characteristics of generating high field strength with low power and statistically uniform field strength. However, the operating frequency of the reverberation chamber is related to its size. Due to the limited size, it is difficult to conduct low-frequency (below 100MHz) radiation sensitivity tests, and it is impossible to carry out full-aircraft level tests. The outdoor high-power direct irradiation method uses a power amplifier to amplify the output signal of the signal source and directly irradiate the test product through an antenna. This method is simple and direct, but it has high requirements on the power amplifier, high test cost, inconvenient transportation, and serious electromagnetic pollution. Therefore, this application conducts radiation sensitivity tests on the basis of low levels.

[0068] FIG1 is a first structural schematic diagram of a low-level swept current test system in an embodiment. As shown in FIG1 , the low-level swept current test system 100 includes a computer device 11, a signal analyzer 12 and a transceiver device 13; the signal analyzer 12 is connected to the computer device 11 and the transceiver device 13 respectively; the signal analyzer 12 is used to send a low-level swept frequency signal to the transceiver device 13 based on multiple output frequency points under the control of the computer device 11; the transceiver device 13 is used to radiate electromagnetic waves based on the low-level swept frequency signal, and detect the induced current of the cable 21 in the electronic device 200 under test under the electromagnetic wave to obtain multiple target current signals; the signal analyzer 12 is also used to automatically follow the output frequency points to receive multiple target current signals; the computer device 11 is used to obtain the target current signal, and determine the target transfer function value of the cable based on the target current signal.

[0069] In the embodiment of the present application, the computer device 11 is communicatively connected to the signal analyzer 12 , the signal analyzer 12 is connected to the transceiver device 13 , and the transceiver device 13 is connected to the cable 21 in the electronic device 200 under test.

[0070] The purpose of the low-level swept current test is to obtain the transfer function relationship between the external radiation field and the induced current of the cable in the electronic device under test. Under the control of the computer device, the output port of the signal analyzer 12 sweeps and outputs a low-level swept frequency signal with multiple output frequencies. The transceiver device 13 is used to radiate electromagnetic waves based on the low-level swept frequency signal and detect the induced current of the cable 21 in the electronic device under test 200 under the electromagnetic wave to obtain multiple target current signals. The computer device 11 obtains the target transfer function value of the cable 21 at each output frequency based on the target current signal and the pre-calibrated calibration electric field signal.

[0071] Optionally, the signal analyzer 12 can be a vector network analyzer. The signal analyzer 12 includes two modules, a signal source and a receiver. The frequency range of the signal source and the receiver is the same, generally covering 100kHz~18GHz. The receiver frequency sweep test process ensures frequency synchronization scanning with the signal source through a phase-locked loop. Optionally, the signal source has the function of point frequency output and sweep frequency output low-level sweep frequency signal, with an output amplitude of -60dBm~10dBm; the receiver usually uses a tuned receiver to obtain good test sensitivity and dynamic range, and has signal analysis windowing and time domain gate functions.

[0072] Optionally, the multiple output frequency points can be multiple independent output frequencies or frequency intervals. In the existing test based on the signal source and the spectrum analyzer, the signal source can only output a single frequency point, and the computer device can only control the signal source output frequency point and then control the spectrum analyzer to receive the same frequency point. The computer device then controls the signal source to switch to the next output frequency point to achieve the purpose of frequency scanning. During the frequency scanning process, each frequency point requires program control of two instruments (signal source and spectrum analyzer), and waits for the two instruments to switch and respond before switching to the next frequency point, which reduces the test efficiency. The output and reception of the signal analyzer of the present application are integrated into one machine, and there is no need for repeated program control. The frequency scanning speed is fast, the test efficiency is high, and the residence time of each output frequency point is short, which reduces spatial electromagnetic pollution.

[0073] Since the output and reception of the signal analyzer 12 of the present application are integrated, and the output circuit and the receiving circuit share a common ground, the anti-electromagnetic interference performance can be improved, and the measurement results can be prevented from being affected by the radiation interference of the transmitting antenna under unshielded external field conditions.

[0074] Optionally, the transceiver device 13 may be a transmitting antenna and a current caliper, the transmitting antenna radiates electromagnetic waves based on a low-level sweep frequency signal, the current caliper detects the induced current of the electronic device under test under electromagnetic wave radiation, and sends the induced current signal to the signal analyzer 12.

[0075] Optionally, the electronic device under test 200 may be a large device such as an aircraft, a car, a ship, or a small device such as a mobile phone, that is, the embodiment of the present application does not specifically limit the electronic device under test 200.

[0076] In an embodiment of the present application, a low-level swept current test system includes a computer device, a signal analyzer and a transceiver device; the signal analyzer is connected to the computer device and the transceiver device respectively; the signal analyzer is used to send a low-level swept frequency signal to the transceiver device based on multiple output frequency points under the control of the computer device; the transceiver device is used to radiate electromagnetic waves based on the low-level swept frequency signal, and detect the induced current of the cable in the electronic device under test under the electromagnetic wave to obtain multiple target current signals; the signal analyzer is also used to automatically follow the output frequency point to receive multiple target current signals; the computer device is used to obtain the target current signal and determine the target transfer function value of the cable based on the target current signal. Since the existing signal source and spectrum analyzer are two independent devices, it is necessary to control the signal source to output a certain frequency point signal, and at the same time set the spectrum analyzer to receive the same frequency point signal, and it is inevitable that there are respective frequency deviation errors between the two devices. In the embodiment of the present application, a signal analyzer is used to send a low-level sweep signal and receive a target current signal. The output and received signals in the signal analyzer are synchronized through a phase-locked loop, and the target current signal is automatically received following the output frequency. When the computer device is controlled, only multiple output frequencies need to be set to automatically complete the test, which can avoid frequency deviation errors in the output frequency and the receiving frequency. There is no need to control two instruments for each frequency, and wait for the two instruments to switch and respond before switching to the next frequency, thereby improving the test efficiency.

[0077] Figure 2 is a second structural schematic diagram of a low-level swept current test system in an embodiment. As shown in Figure 2, the transceiver device 13 includes a transmitting antenna 131 and a current clamp 132, and the current clamp 132 is connected to the cable 21; the transmitting antenna 131 is used to radiate electromagnetic waves based on a low-level swept frequency signal; the current clamp 132 is used to detect the induced current of the cable 21 under the electromagnetic wave to obtain multiple target current signals; the electromagnetic wave includes electromagnetic waves radiated by the transmitting antenna 131 at multiple radiation angles in each polarization direction.

[0078] The transmitting antenna 131 is used to convert the low-level frequency sweep signal into an electric field signal and radiate electromagnetic waves outward. The current caliper 132 is a coupling device that converts the current flowing through the cable 21 into a voltage in proportion. It is essentially a broadband transformer with a toroidal core. The core material is usually ferrite. It is used to measure the induced current of the cable inside the electronic device 200 under test. The frequency range of the current caliper 132 covers 10kHz~400MHz, and has a flat frequency response in the passband.

[0079] Optionally, the transmitting antenna 131 may include a low-frequency transmitting antenna and a high-frequency transmitting antenna. The frequency range of the low-frequency transmitting antenna is 500kHz~30MHz. Since the low-frequency wavelength of the low-frequency transmitting antenna is long and the size of the low-frequency transmitting antenna is large, the low-frequency transmitting antenna can be divided into a vertically polarized antenna (monopole antenna) and a horizontally polarized antenna (dipole antenna). A matching balun is used to allow the low-frequency transmitting antenna to transmit with maximum efficiency. The frequency range of the high-frequency transmitting antenna is 30MHz~1GHz.

[0080] Move the electronic device 200 under test to the designated test area, clamp the cable 21 with the current clamp 132 (5 cm away from the port of the electronic device 200 under test), and the output port of the current clamp 132 can be connected to the signal analyzer 12 through a radio frequency cable. The position and height of the transmitting antenna 131 are consistent with those during the electric field calibration. The signal analyzer 12 outputs the same electric field strength as during the electric field calibration, and sweeps the output with the same output frequency and output power. The induced current of the cable 21 is obtained by using the current clamp 132 to obtain the induced current spectrum curve corresponding to the target current signal.

[0081] The polarization direction of the transmitting antenna 131 is changed, and the frequency is scanned again to obtain the induced current of the cable under two polarization directions. The induced current of the two polarizations is measured for all the cables 21 .

[0082] Optionally, the output port of the current clamp 132 is connected to the transmitting end of the optical fiber transmission device 15 through a radio frequency line that is as short as possible. The optical fiber transmission device 15 is adjusted to a suitable gain to ensure measurement accuracy while also ensuring that the target current signal input to the signal analyzer 12 is not too large to damage the signal analyzer.

[0083] In the embodiment of the present application, considering that the high-intensity radiation field HIRF environment to which the electronic device under test 200 is exposed during application is irradiated in more than one direction, it is necessary to perform irradiation tests at multiple radiation angles, rotate the electronic device under test 200 or move the position of the transmitting antenna 131, irradiate the electronic device under test 200 at multiple angles, obtain the induced current of the cable at multiple radiation angles, and obtain multiple target current signals. The target current signal includes current signals of multiple polarization directions and multiple radiation angles.

[0084] In an embodiment of the present application, a transmitting antenna is used to radiate electromagnetic waves based on a low-level sweep frequency signal, and a current caliper is used to detect the induced current of the cable under the electromagnetic wave to obtain multiple target current signals, thereby laying a foundation for subsequently determining the target transfer function value based on the induced current test curve corresponding to the target current signal.

[0085] Figure 3 is a third structural schematic diagram of a low-level swept current test system in an embodiment. As shown in Figure 3, the transceiver device 13 also includes a receiving antenna 133; the receiving antenna 133 is used to receive electromagnetic waves to obtain an initial electric field signal, and send the initial electric field signal to the signal analyzer; the initial electric field signal is used to calibrate the electric field at each test position in the test area to obtain a calibration electric field signal, and the calibration electric field signal is used to determine the target transfer function value of the cable with the target current signal.

[0086] When performing a low-level sweep current test, first use the signal analyzer 12 to generate a uniform low-intensity electric field in the test area where the electronic device 200 is pre-placed, use the receiving antenna 133 to measure the electric field strength at each test position, and calibrate the electric field in the test area. Then move the electronic device 200 to the specified test position of the calibrated electric field, apply the same electric field as when calibrating the electric field, measure the induced current of the cable inside the electronic device under test, and thus obtain the target transfer function value of the cable. Therefore, after determining the test area where the electronic device 200 is pre-placed, the height of the transmitting antenna 131 is raised to the center height of the electronic device 200 under test, the transmitting antenna 131 is moved to a distance far enough from the test area, the receiving antenna 133 is placed in the middle of the test area, the height of the receiving antenna 133 is raised to the same height as the transmitting antenna 131, and the receiving antenna 133 is connected to the signal analyzer 12 through a radio frequency line that is as short as possible. Optionally, the distance is at least 1.5 times the length of the electronic device 200 under test. This distance makes the test area located in the far field of the transmitting antenna 131, ensuring that when the transmitting antenna 131 transmits electromagnetic waves, the first electric field strength of each test position point in the test area does not differ by more than 6dB, indicating that the electric field calibration is completed.

[0087] Among them, the receiving antenna 133 is used to receive electromagnetic waves and convert the electromagnetic waves into initial electric field signals; optionally, the receiving antenna 133 includes a low-frequency receiving antenna and a high-frequency receiving antenna, the low-frequency receiving antenna adopts an active biconical antenna, and the high-frequency receiving antenna adopts a passive biconical antenna. The frequency range of the low-frequency receiving antenna and the high-frequency receiving antenna covers 500kHz~400MHz, the size is as small as possible, and horizontal polarization and vertical polarization can be switched.

[0088] In one embodiment, a computer device is used to determine the multipath reflection result of the test area and the first electric field strength of each test position based on the electric field strength spectrum curve corresponding to the initial electric field signal of each test position, and to use any initial electric field signal as a calibration electric field signal when the multipath reflection result indicates that there is no multipath reflection phenomenon in the test area and the difference in the first electric field strength of each test position is less than a preset strength difference.

[0089] As shown in Figure 4, Figure 4 is a flow chart of a low-level swept current test method in an embodiment, in which the polarization directions of the receiving antenna and the transmitting antenna are set, a computer device controls a signal analyzer to output a swept frequency test of multiple output frequency points, obtains the electric field strength spectrum curve at the current position, changes the position and height of the receiving antenna, continues the swept frequency test, and obtains the electric field strength spectrum curve at the center and edge positions of the test area.

[0090] Then, the polarization directions of the receiving antenna and the transmitting antenna are changed to obtain the electric field intensity spectrum curve of each test position, so as to obtain the electric field intensity spectrum curve of each test position under different polarization directions.

[0091] Compare the electric field intensity spectrum curves at each test position. If the electric field intensity spectrum curve fluctuates and the frequencies of the peaks and valleys at each test position are inconsistent, it indicates that multipath reflection exists. If there is no frequency inconsistency and / or fluctuation, it proves that there is no multipath reflection.

[0092] Directly based on the initial electric field strength spectrum curve, the first electric field strength of each test position is obtained. If the difference between the first electric field strengths is less than the preset strength, it proves that the electric field in the test area is uniform. Any initial electric field signal is used as a calibration electric field signal, that is, any initial electric field signal is a calibration electric field strength.

[0093] Furthermore, if the difference between the first electric field strengths is not less than the preset strength, it is necessary to check the test site conditions and the test system in the test area, and then obtain the electric field strength spectrum curve of each test position under each polarization direction.

[0094] In an embodiment of the present application, a computer device is used to determine the multipath reflection result of the test area and the first electric field strength of each test position based on the initial electric field strength spectrum curve of each test position, and when the multipath reflection result indicates that there is no multipath reflection phenomenon in the test area and the difference in the first electric field strength of each test position is less than a preset strength difference, any initial electric field signal is used as a calibration electric field signal, thereby laying a foundation for subsequent low-level swept current testing of the electronic device under test based on the electric field strength spectrum curve corresponding to the calibration electric field signal, thereby improving the accuracy of the low-level swept current test.

[0095] In one embodiment, a computer device is used to determine a time domain gate start time and a time domain gate end time of a signal analyzer according to a first time when a direct wave of an electromagnetic wave reaches the signal analyzer and a second time when a reflected wave of the electromagnetic wave reaches the signal analyzer when a multipath reflection phenomenon exists in a test area characterized by a multipath reflection junction; the first time and the second time are determined by the signal analyzer according to an initial electric field signal and sent to the computer device; the signal analyzer is used to filter the electric field signal corresponding to the reflected wave in each initial electric field signal according to the time domain gate start time and the time domain gate end time to obtain each intermediate electric field signal; the computer device is used to determine the second electric field strength of each test position based on an electric field strength spectrum curve corresponding to each intermediate electric field signal, and when the difference between the second electric field strengths is less than a preset strength difference, use any intermediate electric field signal as a calibration electric field signal.

[0096] In the embodiments of the present application, as shown in Figures 5 and 6, when performing a low-level swept current test, a place with no large buildings or trees around as reflective objects is usually selected as the test area. However, in actual testing, considering the placement and ease of use of the electronic equipment under test, some reflectors are inevitable, and ground reflections always exist and cannot be eliminated. Therefore, when performing electric field calibration, when the path difference between the direct path and the reflected path is greater than the wavelength of the electromagnetic wave, a multipath effect will occur, affecting the electric field calibration result. Therefore, when the antenna height is high, the test distance needs to be very far, or additional methods need to be used to eliminate the multipath effect.

[0097] When the reflected wave and the direct wave in the electromagnetic wave differ in phase by 180°, the electric field measured at this time is minimum, and the spectrum curve shows the existence of a trough phenomenon. Figure 7 is an electric field strength spectrum curve under 1MHz~30MHz vertical polarization in a low-level sweep current test in one embodiment. Due to the presence of a nearby factory building, the electric field strength spectrum curve fluctuates, that is, the electric field strength spectrum curve under the test environment corresponding to Figure 5. Figure 8 is an electric field strength spectrum curve under 30MHz~400MHz horizontal polarization in a low-level sweep current test in one embodiment. Due to the high height of the transmitting antenna and the receiving antenna, and the short distance between the transmitting antenna and the receiving antenna, the path difference between the ground reflected wave and the direct wave is large, and the trough frequency point during superposition falls within the test frequency band, resulting in a trough phenomenon, that is, the electric field strength spectrum curve under the test environment corresponding to Figure 6.

[0098] The time domain gate technology is a function that mathematically eliminates unnecessary responses in the time domain. The function performs time domain transformation, selects an area in the time domain, deletes responses outside the area, and then transforms back to the frequency domain after deletion. The signal analyzer has a time domain mode measurement function. In the time domain mode measurement, since the reflected wave and the direct wave travel different paths and have different distances, there is a delay in reaching the receiving port of the signal analyzer, and the first time when the direct wave arrives and the second time when the reflected wave arrives can be clearly seen. According to the first time and the second time, set the appropriate time domain gate start time and time domain gate end time. Opening the time domain gate according to the time domain gate start time and time domain gate end time can eliminate the reflected wave and only allow the direct wave to pass. The electric field intensity spectrum curve obtained by opening the time domain gate is the electric field intensity spectrum curve of the direct wave. Figure 9 is a schematic diagram of the test area in an embodiment.

[0099] The initial electric field signal received by the signal analyzer can obtain the vector intensity of each output frequency point within the entire frequency band. If there are multiple signals of direct waves and reflected waves in the test frequency band, the electric field intensity spectrum curve corresponding to the initial electric field signal is the result of the joint action of multiple signals, and it is impossible to distinguish between direct waves and reflected waves. The electric field intensity spectrum curve corresponding to the initial electric field signal is inversely Fourier transformed to the time domain. Several peak signals can be clearly seen in the time domain. Usually, the first peak has the largest amplitude, which is a direct wave, and the subsequent peaks are reflected waves, and the peaks are lower than the direct wave amplitude, as shown in Figure 10. Figure 10 is a time domain signal diagram of direct waves and reflected waves in an embodiment. This is because the direct wave has the shortest path and arrives the fastest. It is displayed as the first peak in the time domain mode. The reflected wave path is longer than the direct wave, and the arrival time is later than the direct wave, which is displayed as a subsequent peak. And due to spatial attenuation and reflective material medium reasons, the subsequent peak amplitude will be lower than the direct wave peak, so in the time domain, the direct wave and the reflected wave can be clearly distinguished. In order to filter out the reflected wave, a "gate" is added to the time domain mode of the signal analyzer to allow the electric field signal corresponding to the direct wave to pass through and filter out the electric field signal corresponding to the reflected wave, similar to a bandpass filter that only allows the specified signal to pass through. In mathematical calculations, the time domain signal is multiplied by a "gate" function. After the time domain gate is turned on, Fourier transform is performed into the frequency domain to obtain a spectrum curve with only the direct wave signal. Figure 11 is the electric field intensity spectrum curve without turning on the time domain gate mode (the electric field intensity spectrum curve corresponding to the initial electric field signal). Figure 12 is the electric field intensity spectrum curve with the time domain gate mode turned on (the electric field intensity spectrum curve corresponding to the intermediate electric field signal). It can be seen that the electric field intensity spectrum curve has been smoothed without fluctuations, and the reflected wave in the electromagnetic wave has been filtered out.

[0100] Specifically, the time domain gate parameters only need to set the time domain gate start time and the time domain gate end time. Assuming that in the time domain mode, the first time when the direct wave arrives is T0, and the second time when the reflected wave arrives is T1, then the time domain gate start time Tbegin and the time domain gate end time T end The calculation is as follows:

[0101] ;

[0102] ;

[0103] Furthermore, the computer device is used to determine the second electric field strength at each test position based on the electric field strength spectrum curve corresponding to the intermediate electric field signal. If the difference between the second electric field strengths is less than a preset strength, any intermediate electric field signal is used as a calibration electric field signal, that is, the electric field strength corresponding to any intermediate electric field signal is used as the calibration electric field strength.

[0104] It should be noted that during the low-level swept current test, the cable is measured inside the electronic device under test. The interior of the electronic device under test is a reverberant environment. The internal electric field itself is obtained after multiple reflections in the cavity. The cable coupling current is also the result of the combined action of multiple signals. There is no need to open the time domain gate to eliminate the reflected wave. A normal swept frequency test can be performed to obtain the induced current test curve.

[0105] In an embodiment of the present application, a computer device is used to determine the start time of the time domain gate of the signal analyzer and the end time of the time domain gate according to the first time when the direct wave of the electromagnetic wave arrives at the signal analyzer and the second time when the reflected wave of the electromagnetic wave arrives at the signal analyzer when the multipath reflection junction represents the presence of multipath reflection phenomenon in the test area; the signal analyzer is used to filter the electric field signal corresponding to the reflected wave in each initial electric field signal according to the start time of the time domain gate and the end time of the time domain gate to obtain each intermediate electric field signal; the computer device is used to determine the second electric field intensity of each test position based on the electric field intensity spectrum curve corresponding to each intermediate electric field signal, and when the difference between the second electric field intensity is less than the preset intensity difference, any intermediate electric field signal is used as a calibration electric field signal. In an embodiment of the present application, the arrival time of the direct wave and the reflected wave is obtained by using a signal analyzer to obtain the start time of the time domain gate and the end time of the time domain gate, which can eliminate the superposition effect of various reflected waves during electric field calibration, reduce the influence of the surrounding environment of the test area on the test results, and improve the accuracy of electric field calibration.

[0106] In one embodiment, a computer device is used to obtain, for each polarization direction, a maximum induced current at the same output frequency according to an induced current test curve corresponding to multiple target current signals, and determine an initial transfer function value corresponding to each output frequency under the same polarization direction according to the maximum induced current and a third electric field strength at the same output frequency; and use the maximum value of each initial transfer function value under different polarization directions as the target transfer function value of the cable at each output frequency; wherein the third electric field strength is determined according to an electric field strength spectrum curve corresponding to a calibration electric field signal.

[0107] In the embodiment of the present application, the induced current test curve is a curve with the horizontal axis being the frequency and the vertical axis being the current amplitude. Based on the induced current test curves of multiple radiation angles under the same polarization direction, the maximum induced current corresponding to each output frequency point can be obtained. The sum of the electric field strength spectrum curve corresponding to the calibration electric field signal has the horizontal axis being the frequency and the vertical axis being the electric field strength amplitude. Based on the electric field strength spectrum curve corresponding to the calibration electric field signal, the third electric field strength of each output frequency point can be obtained.

[0108] Due to the radiation in multiple polarization directions and multiple angles, a cable has multiple groups of induced currents, that is, target current signals at multiple radiation angles under multiple polarization directions are obtained. First, for each output frequency point under each polarization direction, the ratio of the maximum induced current to the third electric field strength is used as the initial transfer function value of the output frequency point under the same polarization direction. For example, the transmitting antenna and the receiving antenna include two polarization directions, horizontal polarization and vertical polarization, then for each output frequency point, two initial transfer function values ​​will be obtained. Furthermore, the maximum transfer function value is obtained from the two initial transfer function values ​​as the target transfer function value at the output frequency point, thereby obtaining the target transfer function value of each cable at each output frequency point. Target transfer function value F use It can be expressed in the following ways:

[0109]

[0110] Among them, E H is the third electric field strength under polarization direction H, E V is the third electric field strength under the polarization direction V, n is the number of radiation angles, and I is the induced current under each radiation angle.

[0111] In an embodiment of the present application, the maximum induced current at the same output frequency is obtained according to the induced current test curves corresponding to multiple target current signals; the initial transfer function value corresponding to each output frequency at the same polarization direction is determined according to the maximum induced current and the third electric field strength at the same output frequency; the maximum value of each initial transfer function value at different polarization directions is used as the target transfer function value of the cable at each output frequency. The embodiment of the present application first processes the induced current test curves of multiple radiation angles to obtain the initial transfer function value, and then processes the initial transfer function values ​​of different polarization directions to obtain the target transfer function value, so that the obtained target transfer function value can cope with the most severe radiation environment, thereby improving the reliability of the low-level swept current test.

[0112] Continuing as shown in Figures 2 and 3 above, the low-level swept current test system also includes a power amplifier 14; the power amplifier 14 is connected to the signal analyzer 12 and the transmitting antenna 131; the power amplifier 14 is used to amplify the low-level swept frequency signal output by the signal analyzer 11, and send the amplified low-level swept frequency signal to the transmitting antenna 131.

[0113] In the embodiment of the present application, the input end of the power amplifier 14 is connected to the signal analyzer 12, and the output end is connected to the transmitting antenna 131. The power amplifier 14 is used to amplify the amplitude of the low-level swept frequency signal output by the signal analyzer 12, and send the amplified low-level swept frequency signal to the transmitting antenna 131.

[0114] Optionally, the power amplifier 14 may be a broadband radio frequency power amplifier. For example, the power amplifier 14 has a gain of 50 dB, a maximum input of 0 dBm, and a frequency range of 10 kHz to 400 MHz.

[0115] In an embodiment of the present application, a power amplifier is used to amplify the low-level swept frequency signal output by the signal analyzer, and send the amplified low-level swept frequency signal to the transmitting antenna, thereby avoiding the situation where the transmitting antenna cannot detect the low-level swept frequency signal output by the signal analyzer when the amplitude is small, thereby ensuring the reliability of the low-level swept current test.

[0116] Continuing as shown in the above-mentioned Figures 2 and 3, the low-level swept current test system also includes an optical fiber transmission device 15, and the optical fiber transmission device 15 includes an optical fiber transmitting end 151 and an optical fiber receiving end 152, the optical fiber transmitting end 151 is connected to the receiving antenna 133 or the current clamp 132, and the optical fiber receiving end 152 is connected to the signal analyzer 12; the optical fiber transmitting end 151 is used to convert the target current signal sent by the current clamp 132 and the initial electric field signal sent by the receiving antenna 133 into an optical signal; the optical fiber receiving end 152 is used to convert the optical signal into an electrical signal and send it to the signal analyzer 12, so as to send the target current signal and the initial electric field signal to the signal analyzer 12.

[0117] In the embodiment of the present application, the optical fiber transmission device 15 includes an optical fiber transmitting end 151 and an optical fiber receiving end 152. When performing electric field calibration, as shown in Figure 3 above, the optical fiber transmitting end 151 converts the initial electric field signal generated by the receiving antenna into an optical signal, which is transmitted using optical fiber, and the optical fiber receiving end 152 converts the optical signal into an electrical signal and transmits it to the signal analyzer 12.

[0118] When performing a low-level sweep current test, as shown in FIG. 2 above, the current clamp 132 detects the induced current of the cable 21 to obtain a target current signal, the optical fiber transmitting end 151 converts the target current signal into an optical signal, which is transmitted using optical fiber, and the optical fiber receiving end 152 converts the optical signal into an electrical signal and transmits it to the signal analyzer 12.

[0119] Optionally, the frequency response of the optical fiber transmission device 15 is 50 Hz to 1.5 GHz, the gain range is -60 dB to +55 dB, and the dynamic range is 150 dB at a bandwidth of 1 Hz.

[0120] In the embodiment of the present application, the optical fiber transmission device includes a transmitting end and a receiving end. The transmitting end is used to convert the target current signal sent by the current clamp and the initial electric field signal sent by the receiving antenna into an optical signal; the receiving end is used to convert the optical signal into an electrical signal and send it to the signal analyzer to send the target current signal and the initial electric field signal to the signal analyzer. In the embodiment of the present application, the optical fiber transmission device signal is used for transmission. The optical fiber transmission signal has strong anti-interference ability and low insertion loss, and is suitable for long-distance signal transmission in large test sites.

[0121] In one embodiment, the electronic device under test includes multiple cables, the transceiver device includes multiple current calipers, and the cables and current calipers are connected one-to-one; the optical fiber transmitting end includes multiple input channels, the multiple input channels are connected to the corresponding current calipers, and the optical fiber receiving end is connected to the computer device; the computer device is also used to determine the target current caliper from the multiple current calipers by controlling the optical fiber receiving end to switch the input channels.

[0122] In the embodiment of the present application, the transmitting end includes multiple input channels, that is, the optical fiber transmitting end has multiple electrical inputs and one optical output, and the input channels, cables, and current clamps are connected one by one. The computer device is connected to the optical fiber receiving end in communication, and the optical fiber receiving end is controlled by software each time to switch and select a target input channel, determine a target current clamp from multiple current clamps, and determine a target cable from multiple cables.

[0123] In an embodiment of the present application, the computer device is also used to switch the input channel through the optical fiber receiving end to determine the target current caliper from multiple current calipers, and to determine the target cable from multiple cables. When the electronic device under test includes multiple cables, there is no need to frequently connect the current calipers and cables, thereby improving the efficiency of low-level swept current testing.

[0124] In an exemplary embodiment, as shown in FIG13 , a low-level swept current test method is provided, which is described by taking the method applied to the computer device in FIG1 as an example, and includes the following steps: S301, controlling the signal analyzer to send a low-level swept frequency signal to the transceiver device based on multiple output frequency points; S302, receiving multiple target current signals sent by the signal analyzer, and determining the target transfer function value of the cable in the electronic device under test according to the multiple target current signals; wherein the multiple target current signals are electromagnetic waves radiated by the transceiver device based on the low-level swept frequency signal, and the induced current signal of the cable under the electromagnetic wave is detected, and the signal analyzer automatically receives the signal from the transceiver device following the output frequency point.

[0125] Since the existing signal source and spectrum analyzer are two independent devices, it is necessary to control the signal source to output a certain frequency signal, and set the spectrum analyzer to receive the same frequency signal, and it is inevitable that there are frequency deviation errors between the two devices. In the embodiment of the present application, a signal analyzer is used to send a low-level sweep signal and receive a target current signal. The output and receiving signals in the signal analyzer are synchronized through a phase-locked loop, and the target current signal is automatically received following the output frequency. When the computer device is controlled, only multiple output frequencies need to be set to automatically complete the test, which can avoid frequency deviation errors in the output frequency and the receiving frequency, and there is no need to control two instruments at each frequency, and wait for the two instruments to switch and respond before switching to the next frequency, thereby improving the test efficiency.

[0126] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0127] Based on the same inventive concept, the embodiment of the present application also provides a low-level sweep current test device for implementing the low-level sweep current test method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations of one or more low-level sweep current test device embodiments provided below can refer to the limitations of the low-level sweep current test method above, and will not be repeated here.

[0128] In an exemplary embodiment, as shown in FIG. 14 , a low-level sweep current test device is provided, including: a control module 41 and a receiving module 42, wherein:

[0129] A control module 41, used to control the signal analyzer to send a low-level frequency sweep signal to the transceiver device based on multiple output frequency points;

[0130] The receiving module 42 is used to receive multiple target current signals sent by the signal analyzer, and determine the target transfer function value of the cable in the electronic device under test based on the multiple target current signals; wherein the multiple target current signals are electromagnetic waves radiated by the transceiver based on the low-level sweep frequency signal, and the induced current signal of the cable under the electromagnetic wave is detected, and the signal analyzer automatically receives it from the transceiver following the output frequency point.

[0131] Each module in the above-mentioned low-level sweep current test device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each of the above modules.

[0132] In an exemplary embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be shown in FIG15. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. The processor, the memory and the input / output interface are connected via a system bus, and the communication interface is connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store low-level sweep current test related data. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a low-level sweep current test method is implemented.

[0133] Those skilled in the art will understand that the structure shown in FIG. 15 is merely a block diagram of a partial structure related to the scheme of the present application, and does not constitute a limitation on the computer device to which the scheme of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0134] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps of any of the above method embodiments when executing the computer program.

[0135] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above method embodiments are implemented.

[0136] In one embodiment, a computer program product is provided, including a computer program, which implements the steps of any of the above method embodiments when executed by a processor.

[0137] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0138] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0139] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0140] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A low level sweep current test system, characterized in that: The system includes a computer device, a signal analyzer and a transceiver device; the signal analyzer is connected to the computer device and the transceiver device respectively; The signal analyzer is used to send a low-level frequency sweep signal to the transceiver device based on a plurality of output frequency points under the control of the computer device; The transceiver is used to radiate electromagnetic waves based on the low-level sweep frequency signal, and detect the induced current of the cable in the electronic device under test under the electromagnetic wave to obtain multiple target current signals; The signal analyzer is further used to automatically follow the output frequency point to receive a plurality of the target current signals; The computer device is used to obtain the target current signal and determine a target transfer function value of the cable based on the target current signal.

2. The system according to claim 1, characterized in that The transceiver device includes a transmitting antenna and a current clamp, and the current clamp is connected to the cable; The transmitting antenna is used to radiate the electromagnetic wave based on the low-level frequency sweep signal; the electromagnetic wave includes electromagnetic waves radiated by the transmitting antenna at multiple radiation angles in each polarization direction; The current caliper is used to detect the induced current of the cable under the electromagnetic wave to obtain a plurality of target current signals.

3. The system according to claim 2, characterized in that The transceiver device also includes a receiving antenna; The receiving antenna is used to receive the electromagnetic wave to obtain an initial electric field signal, and send the initial electric field signal to the signal analyzer; The initial electric field signal is used to calibrate the electric field at each test position in the test area to obtain a calibration electric field signal, and the calibration electric field signal is used to determine the target transfer function value of the cable with the target current signal.

4. The system according to claim 3, characterized in that The computer device is used to determine the multipath reflection result of the test area and the first electric field strength of each test position based on the electric field strength spectrum curve corresponding to the initial electric field signal of each test position, and to use any of the initial electric field signals as the calibration electric field signal when the multipath reflection result indicates that there is no multipath reflection phenomenon in the test area and the difference in the first electric field strength of each test position is less than a preset strength difference.

5. The system according to claim 4, characterized in that The computer device is used to determine the time domain gate start time and the time domain gate end time of the signal analyzer according to the first time when the direct wave of the electromagnetic wave reaches the signal analyzer and the second time when the reflected wave of the electromagnetic wave reaches the signal analyzer when the multi-path reflection node indicates that the test area has a multi-path reflection phenomenon; the first time and the second time are determined by the signal analyzer according to the initial electric field signal and sent to the computer device; The signal analyzer is used to filter the electric field signal corresponding to the reflected wave in each of the initial electric field signals according to the start time of the time domain gate and the end time of the time domain gate to obtain each intermediate electric field signal; The computer device is used to determine the second electric field strength of each test position based on the electric field strength spectrum curve corresponding to each intermediate electric field signal, and when the difference between the second electric field strengths is less than the preset strength difference, use any of the intermediate electric field signals as the calibration electric field signal.

6. The system according to claim 3, characterized in that The computer device is used for obtaining, for each of the polarization directions, a maximum induced current at the same output frequency point according to the induced current test curves corresponding to the multiple target current signals, and determining, according to the maximum induced current and the third electric field strength at the same output frequency point, an initial transfer function value corresponding to each of the output frequencies at the same polarization direction; The maximum value of each of the initial transfer function values ​​under different polarization directions is used as the target transfer function value of the cable at each of the output frequency points; wherein the third electric field strength is determined according to the electric field strength spectrum curve corresponding to the calibration electric field signal.

7. The system according to any one of claims 2 to 6, characterized in that: The system further comprises a power amplifier; the power amplifier is connected to the signal analyzer and the transmitting antenna; The power amplifier is used to amplify the low-level swept-frequency signal output by the signal analyzer, and send the amplified low-level swept-frequency signal to the transmitting antenna.

8. The system according to any one of claims 3 to 6, characterized in that: The system further comprises an optical fiber transmission device, wherein the optical fiber transmission device comprises an optical fiber transmitting end and an optical fiber receiving end, wherein the optical fiber transmitting end is connected to the receiving antenna or the current clamp, and the optical fiber receiving end is connected to the signal analyzer; The optical fiber transmitting end is used to convert the target current signal sent by the current caliper and the initial electric field signal sent by the receiving antenna into an optical signal; The optical fiber receiving end is used to convert the optical signal into an electrical signal and send it to a signal analyzer, so as to send the target current signal and the initial electric field signal to the signal analyzer.

9. The system according to claim 8, characterized in that The electronic device under test includes a plurality of cables, the transceiver device includes a plurality of current clamps, and the cables and the current clamps are connected one by one; the optical fiber transmitting end includes a plurality of input channels, and the plurality of input channels are connected to corresponding current clamps, and the optical fiber receiving end is connected to the computer device; The computer device is further used to determine a target current caliper from the plurality of current calipers by controlling the optical fiber receiving end to switch the input channel.

10. A low level sweep current test method, characterized in that: The method is applied to a computer device in a low-level swept current test system according to any one of claims 1 to 9, and the method comprises: Control the signal analyzer to send a low-level frequency sweep signal to the transceiver device based on multiple output frequency points; Receive multiple target current signals sent by the signal analyzer, and determine the target transfer function value of the cable in the electronic device under test based on the multiple target current signals; wherein the multiple target current signals are the electromagnetic waves radiated by the transceiver based on the low-level swept frequency signal, and the induced current signal of the cable under the electromagnetic wave is detected, and the signal analyzer automatically receives the signal from the transceiver following the output frequency point.

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