Uplink error code improvement method and device and computer readable storage medium

Abstract

The invention discloses an uplink error code improvement method and device and a computer readable storage medium. The method comprises the following steps: for each PON interface of OLT equipment, determining a target ONU of which the uplink bit error rate is greater than a first bit error rate in a statistical period from ONUs hung under the PON interface; for each target ONU, determining a to-be-measured parameter range; determining a target parameter for improving the uplink bit error rate of the target ONU from the to-be-measured parameter range; and configuring an uplink receiving parameter corresponding to the target ONU based on the target parameter. According to the invention, the uplink error code problem is solved by automatically adjusting the receiving parameters at the OLT side, the expenditure of manpower and material resources is effectively reduced, and the efficiency is improved; besides, for each target ONU, appropriate uplink receiving parameters are configured on the OLT side, so that the adaptability and compatibility of the OLT to different target ONUs are enhanced.

Description

Technical Field

[0001] The present application relates to the field of optical communication technology, and in particular to an uplink bit error improvement method, device and computer-readable storage medium. Background Art

[0002] In the field of optical communications, the PON (Passive Optical Network) system consists of an OLT (Optical Line Terminal), an ODN (Optical Distribution Network) and an ONU (Optical Network Unit).

[0003] As a central office device, each PON port of OLT needs to manage a large number of ONUs. However, due to some unfavorable factors, the uplink bit error problem from ONU to OLT in the PON system may occur. Among them, unfavorable factors include:

[0004] The existing network optical link environment is complex and requires the use of multi-level optical splitters and connectors, which can easily lead to fiber end face contamination or fiber bending, causing optical link degradation. The existing network ONU models are diverse, and the optical modules or optical transmitting and receiving components used have differences in performance. ONUs and OLTs and other equipment will age to a certain extent after long-term operation.

[0005] For the upstream bit error problem from ONU to OLT in the PON system, the existing solution is mainly to have operation and maintenance personnel analyze the PON interface bit error statistics, locate the specific ONU with serious bit error problems, and then arrange operation and maintenance personnel to check the optical link environment where the ONU is located or replace the equipment until the bit error problem is improved.

[0006] The above solution requires human intervention to adjust the optical path environment or equipment, and starts from the ODN or ONU side to try to solve the uplink bit error problem by adjusting the optical link environment. However, due to the complexity of the existing network environment and the diversity of ONU types, the above method requires a lot of manpower and material resources and is not efficient. Summary of the invention

[0007] The present application provides an uplink bit error improvement method, device and computer-readable storage medium, which can solve the technical problem that the solution used in the prior art to solve the uplink bit error problem consumes a lot of manpower and material resources and is inefficient.

[0008] In a first aspect, an embodiment of the present application provides an uplink bit error improvement method, the uplink bit error improvement method comprising:

[0009] For each PON interface of the OLT device, determine a target ONU whose uplink bit error rate is greater than a first bit error rate within a statistical period from ONUs connected to the PON interface;

[0010] For each target ONU, determine the parameter range to be tested;

[0011] Determine a target parameter for improving an upstream bit error rate of a target ONU from a range of parameters to be tested;

[0012] The uplink receiving parameters corresponding to the target ONU are configured based on the target parameters.

[0013] In combination with the first aspect, in one implementation, before determining the target parameter for improving the target ONU uplink bit error rate from the parameter range to be measured, the method further includes:

[0014] For each target ONU, detect whether the transmit optical power of the target ONU is within a preset range;

[0015] If it is not within the preset range, the transmit optical power of the target ONU is adjusted to be within the preset range.

[0016] In combination with the first aspect, in one implementation, determining a target parameter for improving an uplink bit error rate of a target ONU from a range of parameters to be measured includes:

[0017] Selecting a group of unselected parameters to be tested from the range of parameters to be tested, and adjusting uplink receiving parameters based on the selected group of parameters to be tested;

[0018] Sending multiple test authorization data frames to the target ONU, so that the target ONU can feed back an uplink data frame containing a specific data pattern within a time slot window specified by each test authorization data frame;

[0019] Perform bit error rate statistics on the uplink data frames fed back by the target ONU to obtain the bit error rate corresponding to the selected set of parameters to be tested;

[0020] In this way, all the parameters to be tested included in the parameter range to be tested are traversed to obtain the bit error rate corresponding to each group of parameters to be tested;

[0021] When the minimum bit error rate among the multiple bit error rates is less than the second bit error rate, the parameter to be measured corresponding to the minimum bit error rate is used as the target parameter, wherein the second bit error rate is less than or equal to the first bit error rate.

[0022] In combination with the first aspect, in one implementation, determining a target parameter for improving an uplink bit error rate of a target ONU from a range of parameters to be measured further includes:

[0023] Selecting a group of unselected parameters to be tested from the range of parameters to be tested, and adjusting uplink receiving parameters based on the selected group of parameters to be tested;

[0024] Sending multiple test authorization data frames to the target ONU, so that the target ONU can feed back an uplink data frame containing a specific data pattern within a time slot window specified by each test authorization data frame;

[0025] Perform bit error rate statistics on the uplink data frames fed back by the target ONU to obtain the bit error rate corresponding to the selected set of parameters to be tested;

[0026] Detecting whether the bit error rate is less than a third bit error rate, wherein the third bit error rate is less than the second bit error rate;

[0027] If it is less than the third bit error rate, taking the selected set of parameters to be measured as the target parameters;

[0028] If it is not less than the third bit error rate, then checking whether all parameters to be tested included in the range of parameters to be tested have been traversed;

[0029] If the traversal is not completed, the process returns to the step of selecting a group of unselected parameters to be measured from the range of parameters to be measured, and adjusting the uplink receiving parameters based on the selected group of parameters to be measured.

[0030] In combination with the first aspect, in one implementation, after detecting whether all parameters to be tested included in the parameter range to be tested have been traversed if the bit error rate is not less than the third bit error rate, the method further includes:

[0031] If the traversal is completed, the minimum bit error rate is determined from multiple bit error rates;

[0032] If the minimum bit error rate is less than the second bit error rate, the parameter to be measured corresponding to the minimum bit error rate is used as the target parameter.

[0033] In combination with the first aspect, in one implementation, the test authorization data frame is sent down by reusing reserved fields in the standard protocol or expanding the data value range of standard fields in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

[0034] In combination with the first aspect, in one implementation, after determining the range of the parameter to be measured for each target ONU, the method further includes:

[0035] When there is no target parameter in the parameter range to be measured that can be used to improve the uplink bit error rate of the target ONU, an operation and maintenance message is sent to the operation and maintenance terminal, where the operation and maintenance message includes the identity information of the target ONU.

[0036] In combination with the first aspect, in one implementation, determining the range of the parameter to be measured for each target ONU includes:

[0037] Determine the optical module type of the target ONU and the optical module type of the OLT device;

[0038] Determine the parameter range to be tested according to the optical module type of the target ONU and the optical module type of the OLT device.

[0039] In a second aspect, an embodiment of the present application provides an uplink bit error improvement device, the uplink bit error improvement device comprising:

[0040] A first determination module is used to determine, for each PON interface of the OLT device, a target ONU whose uplink bit error rate is greater than a first bit error rate within a statistical period from ONUs connected to the PON interface;

[0041] A second determination module is used to determine a range of parameters to be measured for each target ONU;

[0042] A third determination module is used to determine a target parameter for improving an uplink bit error rate of a target ONU from a range of parameters to be measured;

[0043] A configuration module is used to configure the uplink receiving parameters corresponding to the target ONU based on the target parameters.

[0044] In a third aspect, an embodiment of the present application provides a computer-readable storage medium, on which an uplink error improvement program is stored, wherein when the uplink error improvement program is executed by a processor, the steps of the uplink error improvement method described in the first aspect are implemented.

[0045] The beneficial effects brought by the technical solution provided in the embodiments of the present application include:

[0046] In an embodiment of the present application, for each PON interface of the OLT device, a target ONU whose uplink bit error rate is greater than a first bit error rate within a statistical period is determined from the ONUs hanging under the PON interface; for each target ONU, a parameter range to be measured is determined; from the parameter range to be measured, a target parameter for improving the uplink bit error rate of the target ONU is determined; and based on the target parameter, an uplink receiving parameter corresponding to the target ONU is configured. Through the embodiment of the present application, the target parameter for improving the uplink bit error rate of the target ONU is automatically determined, so that the uplink receiving parameter corresponding to the target ONU is configured, that is, the uplink bit error problem is solved by adjusting the receiving parameter on the OLT side, which effectively reduces the expenditure of manpower and material resources and improves the efficiency of solving the problem; in addition, for each target ONU, appropriate uplink receiving parameters are configured on the OLT side, which enhances the adaptability and compatibility of the OLT to different target ONUs. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] Figure 1A flowchart of an embodiment of an uplink bit error improvement method of the present application;

[0048] Figure 2 for Figure 1 A first detailed flow chart of step S30;

[0049] Figure 3 for Figure 1 A second detailed flow chart of step S30;

[0050] Figure 4 This is a functional module diagram of an embodiment of an uplink bit error improvement device of the present application;

[0051] Figure 5 This is a schematic diagram of the hardware structure of the uplink bit error improvement device involved in the embodiment of the present application. DETAILED DESCRIPTION

[0052] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0053] In order to make the objectives, technical solutions and advantages of the present application clearer, the implementation methods of the present application will be further described in detail below with reference to the accompanying drawings.

[0054] In a first aspect, an embodiment of the present application provides an uplink bit error improvement method.

[0055] In one embodiment, referring to Figure 1 , Figure 1 This is a flow chart of the first embodiment of the uplink bit error improvement method of the present application. Figure 1 As shown, the uplink bit error improvement method includes:

[0056] Step S10, for each PON interface of the OLT device, determining a target ONU whose uplink bit error rate is greater than a first bit error rate within a statistical period from the ONUs connected to the PON interface;

[0057] In this embodiment, an OLT device often has multiple PON interfaces, and a certain PON interface is taken as an example for description.

[0058] For example, in GPON (Gigabit-Capable PON, Gigabit Passive Optical Network), 64 ONUs are connected to one PON port of the OLT device, which are marked as ONU1 to ONU64. The uplink bit error rate of each ONU in the statistical period is counted, so as to determine the target ONU whose uplink bit error rate is greater than the first bit error rate in the statistical period. For example, if the uplink bit error rate of ONU1 to ONU8 in the statistical period is greater than the first bit error rate, ONU1 to ONU8 are determined as the target ONU.

[0059] The communication industry often uses bit error rate to determine the ratio of error codes to normal codes in a channel. A high bit error rate indicates poor channel quality, which affects the quality of service transmission. Bit error statistics for ONUs are generally implemented by hardware. The specific implementation method depends on different hardware and can be referred to conventional technologies. No limitation is made here.

[0060] The first bit error rate is set based on actual needs and can be flexibly set according to different usage scenarios and requirements. For example, it can be set lower for dedicated line services and higher for ordinary Internet services or scenarios that are not very sensitive to latency.

[0061] It is easy to understand that the above is an explanation of one PON interface, and each PON interface of the OLT device can be processed in the same way, that is, determining the target ONU among the ONUs connected to each PON interface.

[0062] Step S20, determining a parameter range to be measured for each target ONU;

[0063] Step S30, determining a target parameter for improving an uplink bit error rate of a target ONU from a range of parameters to be measured;

[0064] Step S40: configuring uplink receiving parameters corresponding to the target ONU based on the target parameters.

[0065] In this embodiment, if ONU1 to ONU8 are determined as target ONUs based on step S10, the above steps S20 to S40 are respectively performed for each target ONU. For example, the parameter range to be measured corresponding to ONU1 is determined, and then the target parameter for improving the uplink bit error rate of ONU1 is determined from the parameter range to be measured, and finally the uplink receiving parameter corresponding to ONU1 is configured based on the target parameter. Among them, improving the uplink bit error rate of ONU1 means reducing the uplink bit error rate of ONU1 to an expected value or below.

[0066] Among them, in engineering, the data output pin of the optical module of the OLT is generally directly connected to the PON Serdes pin of the PON MAC chip. The uplink receiving parameters referred to in this embodiment take the receiving parameters of PON Serdes as an example. The commonly used receiving parameters are: DC Offset Calibration (DC offset calibration), CTLE Peaking (continuous time linear equalizer peak value), CTLE Bandwidth (continuous time linear equalizer bandwidth), etc. Under different ONU and OLT optical module combinations, the parameter type and range that need to be adjusted are flexible and can be determined according to the characteristics of the optical module and historical adaptation experience values.

[0067] Furthermore, in one embodiment, step S20 includes:

[0068] Determine the optical module type of the target ONU and the optical module type of the OLT device; determine the parameter range to be measured according to the optical module type of the target ONU and the optical module type of the OLT device.

[0069] In this embodiment, the parameter range to be measured corresponding to the combination of optical module types of different ONUs and optical module types of OLT devices is pre-set; based on this, the parameter range to be measured can be determined according to the optical module type of the target ONU and the optical module type of the OLT device combined with the pre-set corresponding relationship.

[0070] In an embodiment of the present application, for each PON interface of the OLT device, a target ONU whose uplink bit error rate is greater than a first bit error rate within a statistical period is determined from the ONUs hanging under the PON interface; for each target ONU, a parameter range to be measured is determined; from the parameter range to be measured, a target parameter for improving the uplink bit error rate of the target ONU is determined; and based on the target parameter, an uplink receiving parameter corresponding to the target ONU is configured. Through the embodiment of the present application, the target parameter for improving the uplink bit error rate of the target ONU is automatically determined, so that the uplink receiving parameter corresponding to the target ONU is configured, that is, the uplink bit error problem is solved by adjusting the receiving parameter on the OLT side, which effectively reduces the expenditure of manpower and material resources and improves the efficiency of solving the problem; in addition, for each target ONU, appropriate uplink receiving parameters are configured on the OLT side, which enhances the adaptability and compatibility of the OLT to different target ONUs.

[0071] Furthermore, in one embodiment, before step S30, the method further includes:

[0072] For each target ONU, detect whether the transmit optical power of the target ONU is within a preset range;

[0073] If it is not within the preset range, the transmit optical power of the target ONU is adjusted to be within the preset range.

[0074] In this embodiment, after determining the target ONU, the optical module type used by the PON interface to which the target ONU belongs is obtained, and the normal range of the transmitted optical power corresponding to the optical module type used by the PON interface is determined as the preset range. For each target ONU, the transmitted optical power of the target ONU is read to detect whether the transmitted optical power of the target ONU is within the preset range; if it is not within the preset range, the transmitted optical power of the target ONU is adjusted to be within the preset range.

[0075] In this embodiment, the influence of the abnormal transmission optical power on the uplink bit error rate is eliminated before step S30, which is conducive to determining a target parameter more suitable for the target ONU, thereby better reducing the uplink bit error rate of the target ONU.

[0076] Further, in one embodiment, referring to Figure 2 , Figure 2 for Figure 1 The first detailed flow chart of step S30 in FIG. Figure 2 As shown, step S30 includes:

[0077] Step S3011, selecting a group of unselected parameters to be tested from the range of parameters to be tested, and adjusting uplink receiving parameters based on the selected group of parameters to be tested;

[0078] In this embodiment, referring to the above embodiment of step S20, it can be known that the optical module type of the ONU and the optical module type combination of the OLT device correspond to the range of parameters to be measured, that is, the range of parameters to be measured is different in different scenarios.

[0079] For example, in one scenario, the parameter to be measured is DC Offset Calibration, and the corresponding parameter range to be measured is offset_a to offset_b. At this time, an unselected value offset_i is selected from offset_a to offset_b as a selected set of parameters to be measured, and the DC offset calibration of the PON Serdes is set to offset_i.

[0080] In another scenario, the parameters to be measured are DC Offset Calibration, CTLE Peaking, and CTLE Bandwidth, and the corresponding parameter ranges to be measured are offset_c to offset_d, peaking_c to peaking_d, and bw_a to bw_b. At this time, a value is selected from offset_c to offset_d, peaking_c to peaking_d, and bw_a to bw_b, namely, offset_i, peaking_i, and bw_i, and offset_i, peaking_i, and bw_i are a combination that has not been selected, and the DC offset calibration of PON Serdes is set to offset_i, the continuous time linear equalizer peak of PON Serdes is set to peaking_i, and the continuous time linear equalizer bandwidth of PON Serdes is set to bw_i.

[0081] In another scenario, the parameters to be measured are DC Offset Calibration (DC offset calibration) and CTLEPeaking (continuous time linear equalizer peak value), and the corresponding parameter ranges to be measured are offset_c to offset_d, peaking_c to peaking_d.

[0082] At this time, a value is selected from offset_c to offset_d and peaking_c to peaking_d, namely offset_i and peaking_i, and offset_i and peaking_i are a combination that has not been selected, and the DC offset calibration of PON Serdes is set to offset_i and the continuous time linear equalizer peak of PON Serdes is set to peaking_i.

[0083] Step S3012, sending multiple test authorization data frames to the target ONU, so that the target ONU can feed back an uplink data frame containing a specific data pattern within a time slot window specified by each test authorization data frame;

[0084] Step S3013, performing bit error rate statistics on the uplink data frame fed back by the target ONU to obtain the bit error rate corresponding to the selected set of parameters to be measured;

[0085] And so on, return to step S3011 until all the parameters to be tested included in the parameter range to be tested are traversed to obtain the bit error rate corresponding to each group of parameters to be tested;

[0086] In this embodiment, after adjusting the uplink receiving parameters based on a selected set of parameters to be tested, multiple test authorization data frames are sent to the target ONU, wherein each time the target ONU receives a test authorization data frame, it feeds back an uplink data frame containing a specific data pattern within the time slot window specified by the test authorization data frame. The specific data pattern is set according to actual needs, for example, it is set to a data pattern that is convenient for bit error rate statistics. The "multiple" is set based on actual needs, for example, it is set to 8000.

[0087] The bit error rate statistics of the uplink data frame fed back by the target ONU can be performed by means of BIP verification, so as to obtain the bit error rate corresponding to a selected set of parameters to be tested.

[0088] By performing the same processing on each group of parameters to be tested, the bit error rate corresponding to each group of parameters to be tested included in the range of the parameters to be tested can be obtained.

[0089] Step S3014: when the minimum bit error rate among the multiple bit error rates is less than the second bit error rate, the parameter to be measured corresponding to the minimum bit error rate is used as the target parameter, wherein the second bit error rate is less than or equal to the first bit error rate.

[0090] In this embodiment, assuming that there are 10,000 groups of parameters to be measured, 10,000 bit error rates can be obtained, and the minimum value, ie, the minimum bit error rate, is determined from the 10,000 bit error rates.

[0091] If the minimum bit error rate is less than the second bit error rate, the parameter to be measured corresponding to the minimum bit error rate is used as the target parameter.

[0092] Further, in one embodiment, referring to Figure 3 , Figure 3 for Figure 1 The second detailed flow chart of step S30 in FIG. Figure 3 As shown, step S30 includes:

[0093] Step S3021, selecting a group of unselected parameters to be tested from the range of parameters to be tested, and adjusting uplink receiving parameters based on the selected group of parameters to be tested;

[0094] Step S3022, sending multiple test authorization data frames to the target ONU, so that the target ONU can feed back an uplink data frame containing a specific data pattern within a time slot window specified by each test authorization data frame;

[0095] Step S3023, performing bit error rate statistics on the uplink data frame fed back by the target ONU to obtain the bit error rate corresponding to the selected set of parameters to be measured;

[0096] In this embodiment, the specific implementation of steps S3021 to S3023 may refer to the implementation of the above-mentioned steps S3011 to S3013, and will not be described in detail here.

[0097] Step S3024, detecting whether the bit error rate is less than a third bit error rate, wherein the third bit error rate is less than the second bit error rate;

[0098] Step S3025, if it is less than the third bit error rate, taking the selected set of parameters to be tested as the target parameters;

[0099] Step S3026: If the bit error rate is not less than the third bit error rate, then detecting whether all the parameters to be tested included in the parameter range to be tested have been traversed;

[0100] If the traversal is not completed, return to step S3021.

[0101] In this embodiment, the bit error rate obtained in step S3023 is directly compared with the third bit error rate. If it is smaller than the third bit error rate, it means that the bit error problem is very slight under the current receiving parameter configuration, and the parameter to be tested corresponding to the currently obtained bit error rate is used as the target parameter.

[0102] On the contrary, if it is not less than the third bit error rate, when all the parameters to be tested included in the parameter range to be tested have not been traversed, the process returns to step S3021, that is, continues to search for the parameter to be tested that can make the bit error rate less than the third bit error rate.

[0103] Furthermore, in one embodiment, after step S3026, the method further includes:

[0104] If the traversal is completed, the minimum bit error rate is determined from multiple bit error rates;

[0105] If the minimum bit error rate is less than the second bit error rate, the parameter to be measured corresponding to the minimum bit error rate is used as the target parameter.

[0106] In this embodiment, if all bit error rates are not less than the third bit error rate, the target parameter may be determined with reference to the embodiment of step S3014, which will not be described in detail here.

[0107] Furthermore, in one embodiment, the test authorization data frame is sent down by reusing reserved fields in the standard protocol or expanding the data value range of standard fields in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

[0108] In this embodiment, different standard protocols are used in different scenarios, and the value ranges of the multiplexed reserved fields or the standard field data in the extended standard protocol are also different.

[0109] For example, in the GPON scenario, the GPON standard protocol is used between the OLT device and the target ONU. The reserved field of the flag field in the GPON Allocation Structure is reused on the basis of the compatible GPON standard protocol to implement the test authorization data frame delivery. Among them, the reserved field value x represents the error test authorization (that is, the reserved field value in the test authorization data frame is x), and the reserved field value y represents the regular authorization. The description of the value here is only to indicate that the value corresponding to the error test authorization is different from the value corresponding to the regular authorization. Here, the test authorization data frame is delivered by reusing the reserved field in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

[0110] For another example, in the XG(S)-PON scenario, the XG(S)PON standard protocol is used between the OLT device and the target ONU. On the basis of compatibility with the XG(S)PON standard protocol, the test authorization data frame is sent by increasing the value of the StartTime field in the XG(S)PON Allocation Structure. Among them, since the XG(S)PON standard protocol stipulates that the StartTime range corresponding to normal authorization is 0-9719 and 0xffff, in this embodiment, the StartTime value is x (x is not in the range of 0-9719 and 0xffff) to represent the error test authorization (that is, the reserved field value in the test authorization data frame is x). Here, the test authorization data frame is sent to expand the standard field data value range in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

[0111] For another example, in the EPON scenario, the EPON standard protocol is used between the OLT device and the target ONU. On the basis of compatibility with the existing EPON standard protocol, the test authorization data frame is sent by adding the EPON Gate MPCP message Pad field (13 to 39 bytes). Among them, since the EPON standard protocol stipulates that the EPON Gate MPCP message Pad field is not used and filled with 0, in this embodiment, the Pad field value x (x is not 0) represents the error test authorization (that is, the reserved field value in the test authorization data frame is x). Here, the test authorization data frame is sent to expand the standard field data value range in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

[0112] Furthermore, in one embodiment, after step S20, the method further includes:

[0113] When there is no target parameter in the parameter range to be measured that can be used to improve the uplink bit error rate of the target ONU, an operation and maintenance message is sent to the operation and maintenance terminal, where the operation and maintenance message includes the identity information of the target ONU.

[0114] In this embodiment, when there is no target parameter in the parameter range to be measured that can be used to improve the target ONU uplink bit error rate, it means that the target ONU uplink bit error rate cannot be improved by adjusting the uplink receiving parameters, and an operation and maintenance message is sent to the operation and maintenance terminal. The operation and maintenance terminal can be a mobile terminal equipped for the operation and maintenance personnel, and the operation and maintenance personnel can perform manual maintenance on the target ONU based on the operation and maintenance message, such as replacing the target ONU.

[0115] In a second aspect, an embodiment of the present application also provides an uplink bit error improvement device.

[0116] In one embodiment, referring to Figure 4 , Figure 4 This is a functional module diagram of an embodiment of an uplink bit error improvement device of the present application. Figure 4 As shown, the uplink bit error improvement device includes:

[0117] The first determination module 10 is used to determine, for each PON interface of the OLT device, a target ONU whose uplink bit error rate is greater than a first bit error rate within a statistical period from the ONUs connected to the PON interface;

[0118] A second determination module 20 is used to determine a range of parameters to be measured for each target ONU;

[0119] A third determination module 30 is used to determine a target parameter for improving an uplink bit error rate of a target ONU from a range of parameters to be measured;

[0120] The configuration module 40 is used to configure the uplink receiving parameters corresponding to the target ONU based on the target parameters.

[0121] Furthermore, in one embodiment, the uplink bit error improvement device further includes an optical power adjustment module, which is used to:

[0122] For each target ONU, detect whether the transmit optical power of the target ONU is within a preset range;

[0123] If it is not within the preset range, the transmit optical power of the target ONU is adjusted to be within the preset range.

[0124] Furthermore, in one embodiment, the third determining module 30 is configured to:

[0125] Selecting a group of unselected parameters to be tested from the range of parameters to be tested, and adjusting uplink receiving parameters based on the selected group of parameters to be tested;

[0126] Sending multiple test authorization data frames to the target ONU, so that the target ONU can feed back an uplink data frame containing a specific data pattern within a time slot window specified by each test authorization data frame;

[0127] Perform bit error rate statistics on the uplink data frames fed back by the target ONU to obtain the bit error rate corresponding to the selected set of parameters to be tested;

[0128] In this way, all the parameters to be tested included in the parameter range to be tested are traversed to obtain the bit error rate corresponding to each group of parameters to be tested;

[0129] When the minimum bit error rate among the multiple bit error rates is less than the second bit error rate, the parameter to be measured corresponding to the minimum bit error rate is used as the target parameter, wherein the second bit error rate is less than or equal to the first bit error rate.

[0130] Furthermore, in one embodiment, the third determining module 30 is configured to:

[0131] Selecting a group of unselected parameters to be tested from the range of parameters to be tested, and adjusting uplink receiving parameters based on the selected group of parameters to be tested;

[0132] Sending multiple test authorization data frames to the target ONU, so that the target ONU can feed back an uplink data frame containing a specific data pattern within a time slot window specified by each test authorization data frame;

[0133] Perform bit error rate statistics on the uplink data frames fed back by the target ONU to obtain the bit error rate corresponding to the selected set of parameters to be tested;

[0134] Detecting whether the bit error rate is less than a third bit error rate, wherein the third bit error rate is less than the second bit error rate;

[0135] If it is less than the third bit error rate, taking the selected set of parameters to be measured as the target parameters;

[0136] If it is not less than the third bit error rate, then checking whether all parameters to be tested included in the range of parameters to be tested have been traversed;

[0137] If the traversal is not completed, the process returns to the step of selecting a group of unselected parameters to be measured from the range of parameters to be measured, and adjusting the uplink receiving parameters based on the selected group of parameters to be measured.

[0138] Furthermore, in one embodiment, the third determining module 30 is further configured to:

[0139] If the traversal is completed, the minimum bit error rate is determined from multiple bit error rates;

[0140] If the minimum bit error rate is less than the second bit error rate, the parameter to be measured corresponding to the minimum bit error rate is used as the target parameter.

[0141] Furthermore, in one embodiment, the test authorization data frame is sent down by reusing reserved fields in the standard protocol or expanding the data value range of standard fields in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

[0142] Furthermore, in one embodiment, the uplink bit error improvement device further includes an operation and maintenance module, which is used to:

[0143] When there is no target parameter in the parameter range to be measured that can be used to improve the uplink bit error rate of the target ONU, an operation and maintenance message is sent to the operation and maintenance terminal, where the operation and maintenance message includes the identity information of the target ONU.

[0144] Furthermore, in one embodiment, the second determining module is used to:

[0145] Determine the optical module type of the target ONU and the optical module type of the OLT device;

[0146] Determine the parameter range to be tested according to the optical module type of the target ONU and the optical module type of the OLT device.

[0147] Among them, the functional implementation of each module in the above-mentioned uplink bit error improvement device corresponds to each step in the above-mentioned uplink bit error improvement method embodiment, and its functions and implementation processes are no longer repeated here.

[0148] In a third aspect, an embodiment of the present application provides an uplink bit error improvement device, which may be an OLT.

[0149] Reference Figure 5 , Figure 5 The hardware structure diagram of the uplink bit error improvement device involved in the embodiment of the present application is shown in FIG. In the embodiment of the present application, the uplink bit error improvement device may include a processor, a memory, a communication interface, and a communication bus.

[0150] The communication bus may be of any type and is used to interconnect the processor, the memory, and the communication interface.

[0151] The communication interface includes input / output (I / O) interface, physical interface and logical interface, etc., which are used to interconnect the devices inside the uplink error correction device, and the interface used to interconnect the uplink error correction device with other devices (such as other computing devices or user devices). The physical interface can be an Ethernet interface, a fiber optic interface, an ATM interface, etc.; the user device can be a display, a keyboard, etc.

[0152] The memory can be various types of storage media, such as random access memory (RAM), read-only memory (ROM), non-volatile RAM (NVRAM), flash memory, optical storage, hard disk, programmable ROM (PROM), erasable PROM (EPROM), electrically erasable PROM (EEPROM), etc.

[0153] The processor may be a general-purpose processor, and the general-purpose processor may call the uplink error improvement program stored in the memory and execute the uplink error improvement method provided by the embodiment of the present application. For example, the general-purpose processor may be a central processing unit (CPU). The method executed when the uplink error improvement program is called may refer to the various embodiments of the uplink error improvement method of the present application, and will not be described in detail here.

[0154] Those skilled in the art will understand that Figure 5 The hardware structure shown in the figure does not constitute a limitation on the present application, and may include more or less components than shown in the figure, or combine certain components, or arrange the components differently.

[0155] In a fourth aspect, an embodiment of the present application also provides a computer-readable storage medium.

[0156] An uplink error improvement program is stored on a computer-readable storage medium of the present application, wherein when the uplink error improvement program is executed by a processor, the steps of the uplink error improvement method described above are implemented.

[0157] Among them, the method implemented when the uplink error improvement program is executed can refer to the various embodiments of the uplink error improvement method of the present application, and will not be repeated here.

[0158] It should be noted that the serial numbers of the above-mentioned embodiments of the present application are only for description and do not represent the advantages or disadvantages of the embodiments.

[0159] The terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned drawings are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices. The terms "first", "second" and "third" are used to distinguish different objects, etc., and do not represent a sequence, nor do they limit "first", "second" and "third" to different types.

[0160] In the description of the embodiments of the present application, "exemplary", "for example" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary", "for example" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary", "for example" or "for example" is intended to present related concepts in a specific way.

[0161] In the description of the embodiments of the present application, unless otherwise specified, “ / ” means or, for example, A / B can mean A or B; the “and / or” in the text is merely a description of the association relationship of associated objects, indicating that three relationships may exist, for example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In addition, in the description of the embodiments of the present application, “multiple” refers to two or more than two.

[0162] In some processes described in the embodiments of the present application, multiple operations or steps that appear in a specific order are included, but it should be understood that these operations or steps may not be executed in the order in which they appear in the embodiments of the present application or in parallel, and the sequence number of the operation is only used to distinguish the different operations, and the sequence number itself does not represent any execution order. In addition, these processes may include more or fewer operations, and these operations or steps may be executed in sequence or in parallel, and these operations or steps may be combined.

[0163] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, disk, CD) as described above, and includes a number of instructions for a terminal device to execute the methods described in each embodiment of the present application.

[0164] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A method for improving uplink bit errors, characterized in that: The uplink bit error improvement method comprises: For each PON interface of the OLT device, determine a target ONU whose uplink bit error rate is greater than a first bit error rate within a statistical period from ONUs connected to the PON interface; For each target ONU, determine the parameter range to be tested; Determine a target parameter for improving an upstream bit error rate of a target ONU from a range of parameters to be tested; The uplink receiving parameters corresponding to the target ONU are configured based on the target parameters.

2. The uplink bit error improvement method according to claim 1, characterized in that: Before determining the target parameter for improving the target ONU uplink bit error rate from the parameter range to be measured, the method further includes: For each target ONU, detect whether the transmit optical power of the target ONU is within a preset range; If it is not within the preset range, the transmit optical power of the target ONU is adjusted to be within the preset range.

3. The uplink bit error improvement method according to claim 1, characterized in that: Determining the target parameter for improving the target ONU uplink bit error rate from the parameter range to be measured includes: Selecting a group of unselected parameters to be tested from the range of parameters to be tested, and adjusting uplink receiving parameters based on the selected group of parameters to be tested; Sending multiple test authorization data frames to the target ONU, so that the target ONU can feed back an uplink data frame containing a specific data pattern within a time slot window specified by each test authorization data frame; Perform bit error rate statistics on the uplink data frames fed back by the target ONU to obtain the bit error rate corresponding to the selected set of parameters to be tested; In this way, all the parameters to be tested included in the parameter range to be tested are traversed to obtain the bit error rate corresponding to each group of parameters to be tested; When the minimum bit error rate among the multiple bit error rates is less than the second bit error rate, the parameter to be measured corresponding to the minimum bit error rate is used as the target parameter, wherein the second bit error rate is less than or equal to the first bit error rate.

4. The uplink bit error improvement method according to claim 1, characterized in that: The target parameter for improving the uplink bit error rate of the target ONU is determined from the range of parameters to be measured and further comprises: Selecting a group of unselected parameters to be tested from the range of parameters to be tested, and adjusting uplink receiving parameters based on the selected group of parameters to be tested; Sending multiple test authorization data frames to the target ONU, so that the target ONU can feed back an uplink data frame containing a specific data pattern within a time slot window specified by each test authorization data frame; Perform bit error rate statistics on the uplink data frames fed back by the target ONU to obtain the bit error rate corresponding to the selected set of parameters to be tested; Detecting whether the bit error rate is less than a third bit error rate, wherein the third bit error rate is less than the second bit error rate; If it is less than the third bit error rate, taking the selected set of parameters to be measured as the target parameters; If it is not less than the third bit error rate, then checking whether all parameters to be tested included in the range of parameters to be tested have been traversed; If the traversal is not completed, the process returns to the step of selecting a group of unselected parameters to be measured from the range of parameters to be measured, and adjusting the uplink receiving parameters based on the selected group of parameters to be measured.

5. The uplink bit error improvement method according to claim 4, characterized in that: After the step of detecting whether all the parameters to be tested included in the parameter range to be tested have been traversed if the bit error rate is not less than the third bit error rate, the method further includes: If the traversal is completed, the minimum bit error rate is determined from multiple bit error rates; If the minimum bit error rate is less than the second bit error rate, the parameter to be measured corresponding to the minimum bit error rate is used as the target parameter.

6. The uplink bit error improvement method according to claim 3 or 4, characterized in that: The test authorization data frame is sent down by reusing the reserved fields in the standard protocol or expanding the data value range of the standard fields in the standard protocol based on the standard protocol used between the compatible OLT device and the target ONU.

7. The uplink bit error improvement method according to claim 1, characterized in that: After determining the range of the parameters to be measured for each target ONU, the method further includes: When there is no target parameter in the parameter range to be measured that can be used to improve the uplink bit error rate of the target ONU, an operation and maintenance message is sent to the operation and maintenance terminal, where the operation and maintenance message includes the identity information of the target ONU.

8. The uplink bit error improvement method according to claim 1, characterized in that: Determining the range of parameters to be tested for each target ONU includes: Determine the optical module type of the target ONU and the optical module type of the OLT device; Determine the parameter range to be tested according to the optical module type of the target ONU and the optical module type of the OLT device.

9. An uplink bit error improvement device, characterized in that: The uplink bit error improvement device comprises: A first determination module is used to determine, for each PON interface of the OLT device, a target ONU whose uplink bit error rate is greater than a first bit error rate within a statistical period from ONUs connected to the PON interface; A second determination module is used to determine a range of parameters to be measured for each target ONU; A third determination module is used to determine a target parameter for improving an uplink bit error rate of a target ONU from a range of parameters to be measured; A configuration module is used to configure the uplink receiving parameters corresponding to the target ONU based on the target parameters.

10. A computer-readable storage medium, characterized in that: An uplink error improvement program is stored on the computer-readable storage medium, wherein when the uplink error improvement program is executed by the processor, the steps of the uplink error improvement method according to any one of claims 1 to 8 are implemented.

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