Temperature control aging test seat
By designing a temperature-controlled aging test seat, the structure of the pressure gland and the rotary part can be used to achieve electrical connection without plugging, and a heating plate and a temperature control plate are installed on the installation board, which solves the problems of unstable plugging and difficulty in temperature control in the existing technology, and achieves a convenient and efficient testing process.
Patent Information
- Application Number
- CN202311092936.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-08-29
- Publication Date
- 2025-02-28
AI Technical Summary
When testing electronic components, existing aging test seats are prone to inconvenient testing or failure of pin plugs, resulting in inconvenient testing and difficult to effectively control the temperature of the test piece.
A temperature-controlled aging test seat is designed, using a structure of a gland and a rotating member. The pins of the part to be tested do not need to be plugged in. Electrically connected through the probe board, and a heating plate and a temperature control board are installed on the mounting board to achieve temperature control.
The pins of the part to be tested can be tested without plugging, avoiding the problem of unstable plugging or bad plugging. At the same time, it has the function of controlling the temperature, which improves the convenience and accuracy of the test.
Smart Images
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Abstract
Description
Technical Field
[0001] The invention relates to the field of semiconductor testing, and in particular to a temperature-controlled aging test socket. Background Art
[0002] There are more and more electronic components with pins (chips, capacitors, resistors, etc.). These components play an important role in the circuit. Quality testing of these components is very important in the electronics industry, especially aging testing.
[0003] To test these electronic components now, it is usually necessary to plug these electronic components into an aging test socket (aging socket), and then place the aging test socket in an aging box or directly perform aging tests on the electronic components.
[0004] This testing method is prone to inconvenience in testing due to unstable pin insertion, damaged pins, and aging sockets.
[0005] There are also a few aging sockets that do not require plug-in pins, but it is not convenient to control the temperature of the DUT (electronic components). Summary of the invention
[0006] In order to overcome the deficiencies of the prior art, the purpose of the present invention is to provide a temperature-controlled aging test socket, which does not require plugging of the pins of the test electronic components, resulting in inconvenience in testing, and can control the temperature of the test piece.
[0007] The purpose of the present invention is achieved by the following technical solutions: A temperature-controlled aging test seat comprises a base, a mounting seat, a rotating member, a probe plate and a pressure cover with a central hole, wherein the pressure cover is vertically slidably connected to the base, one end of the rotating member is rotatably connected to the pressure cover, the probe plate and the mounting seat are both arranged at the upper end of the base, the mounting seat comprises a base body and a mounting plate for mounting a piece to be tested, the mounting plate is slidably arranged on the base body, the mounting plate comprises a heating plate and a temperature control plate electrically connected to the heating plate; the probe plate comprises a first probe plate, the first probe plate comprises a plurality of probes for outputting test signals; when the pressure cover slides upward, after the piece to be tested is mounted on the mounting plate through the central hole, the other end of the rotating member abuts against the piece to be tested, and the pin of the piece to be tested abuts against one end of the probe; when the pressure cover slides downward, the other end of the rotating member is separated from the piece to be tested.
[0008] Preferably, the heating plate includes a heating rod, the temperature control plate includes a temperature sensor, the upper end surface of the heating rod is flush with the upper end surface of the temperature sensor, and the upper surface of the mounting plate is parallel to the upper surface of the first probe plate.
[0009] Preferably, the mounting seat further comprises an elastic member and a heat conducting plate for mounting the test piece, the heating rod and the temperature sensor are respectively located at two ends of the lower surface of the heat conducting plate, and the heat conducting plate is elastically connected to the heating plate via the elastic member.
[0010] Preferably, the base is further provided with a first mounting groove and a second mounting groove which are in communication with each other, the mounting seat is installed in the first mounting groove, and the first probe board is installed in the second mounting groove.
[0011] Preferably, a first mounting hole is provided in the first mounting groove, the mounting plate is provided in the first mounting hole, a second mounting hole is provided in the base body, and the heat conducting plate is slidably provided in the second mounting hole.
[0012] Preferably, the base includes a first slide groove and a first spring, the pressure cover includes a first slide plate, the first slide plate is slidably connected in the first slide groove, and the pressure cover is connected to the base through the first spring.
[0013] Preferably, the first slide groove and the first spring are provided at both ends of the base, the first slide plate is provided at both ends of the pressure cover, the lower end of the first slide plate is provided with a first buckling portion, and the upper end of the first slide groove is provided with a first protrusion corresponding to the first buckling portion.
[0014] Preferably, the probe board also includes a second probe board, the first probe board and the second probe board are vertically slidably connected, the first probe board is arranged on the upper end surface of the second probe board, the first probe board includes a plurality of first pinholes opposite to the pins of the device to be tested, the second probe board includes a plurality of second pinholes opposite to the first pinholes, and the probes pass through the second pinholes and the first pinholes to be electrically connected to the pins of the device to be tested.
[0015] Preferably, the probe board also includes a second spring, the first probe board and the second probe board are connected by the second spring, the first probe board also includes a second slide plate and a second slide groove, the second probe board also includes a third slide groove and a third slide plate, the second slide plate slides in the third slide groove, and the third slide plate slides in the second slide groove.
[0016] Preferably, a transfer portion and a first rotating shaft are provided at one end of the rotating member, a rotating hole is provided on the transfer portion, and a hooking portion is provided at the other end of the rotating member. The rotating member is rotatably connected to the pressure cover through the first rotating shaft, the first rotating shaft slides in the rotating hole, and the rotating member abuts against the test piece through the hooking portion.
[0017] Compared with the prior art, the present invention has the following beneficial effects: The temperature-controlled aging test socket disclosed in the present application has the following characteristics: when the pressure cover slides upward, the rotating part abuts against the piece to be tested (electronic component), and the pins of the piece to be tested abut against one end of the probe (electrically connected), without the need to plug the pins of the piece to be tested into the test socket, making the test very convenient; and the present application also discloses a temperature control board, which can control the temperature of the piece to be tested, further making the test more convenient. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] Figure 1 It is a schematic diagram of the three-dimensional structure of the temperature-controlled aging test seat of the present invention; Figure 2 It is a schematic diagram of the three-dimensional structure of the gland of the present invention; Figure 3 It is a schematic diagram of the three-dimensional structure of the base of the present invention; Figure 4 It is a schematic diagram of the three-dimensional structure of the seat body of the present invention; Figure 5 It is a schematic diagram of the three-dimensional structure of the mounting plate of the present invention; Figure 6 It is a schematic diagram of the three-dimensional structure of the heat conducting plate of the present invention; Figure 7 is a schematic diagram of the three-dimensional structure of the first probe card of the present invention; Figure 8 is a schematic diagram of the three-dimensional structure of the second probe card of the present invention; Fig. 9 It is a schematic diagram of the three-dimensional structure of the rotating part of the present invention.
[0019] In the figure: 100, temperature control aging test seat; 10, base; 11, first mounting groove; 111, first mounting hole; 12, second mounting groove; 13, first slide groove; 131, first protrusion; 14, first spring; 15, bottom plate; 20, gland; 21, middle hole; 22, first slide plate; 221, first buckle part; 23, transfer end; 24, rotating part; 241, transfer part; 242, hooking part; 243, rotating hole; 244, through hole; 30, mounting seat; 31, seat body; 311, second mounting hole; 32, mounting plate; 321, heating plate; 322, temperature control plate; 33, heat conducting plate; 331, jack; 40, probe plate; 41, first probe plate; 411, first pinhole; 412, second slide groove; 413, second slide plate; 414, second buckling portion; 42, second probe plate; 421, second pinhole; 422, third slide plate; 423, stopper; 424, third slide groove; 425, second protrusion; 50, piece to be tested; 51, pin. DETAILED DESCRIPTION
[0020] In order to more clearly understand the specific technical solutions, features and advantages of the present invention, the present invention is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.
[0021] In the description of the present invention, it should be noted that the terms "upper", "lower", "left", "right", "lateral", "longitudinal", "horizontal", "inner", "outer", etc. indicate the orientation or position relationship based on the orientation or position relationship shown in the drawings, or the orientation or position relationship in which the product of the invention is usually placed when in use. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.
[0022] like Figure 1-Figure 3 As shown, a temperature-controlled aging test seat 100 includes a base 10, a mounting seat 30, a rotating member 24, a probe plate 40 and a pressure cover 20 with a central hole 21, wherein the pressure cover 20 is vertically slidably connected to the base 10, one end of the rotating member 24 is rotatably connected to the pressure cover 20, the probe plate 40 and the mounting seat 30 are both arranged at the upper end of the base 10, the mounting seat 30 includes a seat body 31 and a mounting plate 32 for mounting a test piece 50, the mounting plate 32 is slidably arranged on the seat body 31, and the mounting plate 32 includes a The probe plate 40 includes a heating plate 321 and a temperature control plate electrically connected to the heating plate 321; the probe plate 40 includes a first probe plate 41, and the first probe plate 41 includes a plurality of probes for outputting test signals; when the pressure cover 20 slides upward, after the piece to be tested 50 passes through the middle hole 21 and is installed on the mounting plate 32, the other end of the rotating member 24 abuts against the piece to be tested 50, and the pin 51 of the piece to be tested 50 is electrically connected to one end of the probe; when the pressure cover 20 slides downward, the other end of the rotating member 24 is separated from the piece to be tested 50.
[0023] In the above-mentioned embodiment, the temperature-controlled aging test seat 100 disclosed in the present application, when the pressure cover 20 slides upward, the test piece 50 can be placed on the mounting plate 32 through the middle hole 21, and the rotating member 24 abuts against the test piece 50 (electronic component), and the pin 51 of the test piece 50 abuts against one end of the probe (electrically connected), without the need for the pin 51 of the test piece 50 to be plugged into the aging test seat 100, which will not cause unstable plugging or damage to the aging test seat 100, and make the test accurate and convenient; when the pressure cover 20 slides downward, the rotating member 24 releases the test piece 50, and it is convenient to disassemble the test piece 50. The temperature-controlled aging test seat 100 also includes a temperature control plate 322, which can control the temperature of the test piece 50, making the test more convenient.
[0024] The probe can transmit a test signal (generally a waveform signal sent by a power supply) to the pin 51 of the device under test 50, so as to test the device under test. Of course, the aging test socket 100 can also be inserted into an aging test device through the probe, and the aging test device sends a test signal to the device under test 50 and the temperature control board 322, so as to test the device under test 50. The mounting plate 32 is slidably arranged on the seat body 31, and the position of the mounting plate 32 can be adjusted, so as to facilitate the adjustment of the position of the device under test 50 and facilitate the electrical connection between the pin 51 of the device under test 50 and the probe.
[0025] like Figure 2-Figure 3 As shown, in a preferred embodiment, the base 10 includes a first slide groove 13 and a first spring 14, and the gland 20 includes a first slide plate 22, the first slide plate 22 is slidably connected in the first slide groove 13, and the gland 20 is elastically connected to the base 10 through the first spring 14. Both ends of the base 10 are provided with the first slide groove 13 and the first spring 14, and both ends of the gland 20 are provided with the first slide plate 22, which is more stable. The lower end of the first slide plate 22 is provided with a first buckling portion 221, and the upper end of the first slide groove 13 is provided with a first protrusion 131 corresponding to the first buckling portion 221.
[0026] In the above embodiment, the first slide plate 22 is slidably connected in the first slide groove 13, which facilitates the sliding of the pressure cover 20 up and down on the upper end of the base 10. The pressure cover 20 is elastically connected to the base 10 through the first spring 14, which facilitates the reset of the pressure cover 20. When the first slide plate 22 slides to the upper end of the first slide groove 13, the first buckling portion 221 buckles with the first protrusion, thereby limiting the first slide plate 22 and preventing the first slide plate 22 from falling off.
[0027] like Figure 3-Figure 4 As shown, in a preferred embodiment, the base 10 is further provided with a first mounting groove 11 and a second mounting groove 12 which are in communication, the mounting seat 30 is installed in the first mounting groove 11, and the first probe plate 41 is installed in the second mounting groove 12. A first mounting hole 111 is provided in the first mounting groove 11, the mounting plate 32 is provided in the first mounting hole 111, a second mounting hole 311 is provided in the seat body 31, and the heat conducting plate 33 is slidably provided in the second mounting hole 311.
[0028] In the above embodiment, the first mounting groove 11 and the second mounting groove 12 are connected, which is conducive to the pin of the test piece 50 extending into the second mounting groove 12 and contacting with the probe. In order to facilitate the sliding of the heat conducting plate 33 in the second mounting hole 311, the diameter of the second mounting hole 311 is larger than the diameter of the test piece, and the elastic member is a soft spring, so that the test piece 50 on the heat conducting plate 33 can be moved up and down and left and right to adjust the position, so as to better make the pin 51 electrically contact with the probe. In order to limit the heat conducting plate 33, a plug hole 331 is also provided on the heat conducting plate 33.
[0029] like Figure 5-Figure 6 As shown, in a preferred embodiment, the heating plate 321 includes a heating rod (not shown), the temperature control plate 322 includes a temperature sensor, the upper end surface of the heating rod is flush with the upper end surface of the temperature sensor, and the upper surface of the mounting plate 32 is parallel to the upper surface of the first probe plate 41. The mounting seat 30 also includes an elastic member (not shown) and a heat conducting plate 33 for mounting the test piece 50, the heating rod and the temperature sensor are respectively located at the two ends of the lower surface of the heat conducting plate 33, and the heat conducting plate 33 is elastically connected to the heating plate 321 through the elastic member.
[0030] In the above embodiment, the upper end surface of the heating rod is flush with the upper end surface of the temperature sensor, which is conducive to the horizontal arrangement of the heat conducting plate 33 on the heating rod, and the mounting plate 32 is parallel to the first probe plate 41, which is conducive to the extension of the pin 51 of the test piece to the first probe plate 41. The heating rod can heat, and the temperature sensor can detect the temperature. Both the heating rod and the temperature sensor can be connected to an external controller or PC, which is more conducive to controlling the temperature. The heat conducting plate 33 is conducive to the heating of the test piece 50, and the elastic member is conducive to the lifting and lowering of the heat conducting plate 33, and is conducive to the extension of the pin 51 of the test piece on the heat conducting plate 33 to the top of the first pinhole 411 on the first probe plate 41. In order to better extend the pin of the test piece 50 to the first probe plate 41, the upper surface of the heat conducting plate 33 is flush with the upper surface of the first probe plate 41.
[0031] like Figure 7-Figure 8As shown, in a preferred embodiment, the probe plate 40 also includes a second probe plate 42 and a second spring (not shown), the first probe plate 41 and the second probe plate 42 are vertically slidably connected, the first probe plate 41 is arranged on the upper end surface of the second probe plate 42, the first probe plate 41 includes a second slide plate 413, a second slide groove 412 and a plurality of first pinholes 411 opposite to the pins of the device to be tested, the second probe plate 42 includes a third slide groove 424, a third slide plate 422 and a plurality of second pinholes 421 opposite to the first pinhole 411, the probe passes through the second pinhole 421 and the first pinhole 411 and is electrically connected to the pin 51 of the device to be tested 50. The first probe plate 41 and the second probe plate 42 are connected by the second spring, the second slide plate 413 slides in the third slide groove 424, and the third slide plate 422 slides in the second slide groove 412.
[0032] In the above embodiment, the second slide groove 412 and the third slide groove 424 facilitate the sliding of the third slide plate 422 and the second slide plate 413 respectively, and facilitate the sliding of the first probe plate 41 above the second probe plate 42, so as to facilitate the adjustment of the length of the probe penetrating from the first pinhole 411, and facilitate the electrical connection with the pin 51. In order to facilitate the sliding of the first probe plate 41, a second spring is provided between the first probe plate 41 and the second probe plate 42. In order to limit the first probe plate 41, a second buckling portion 414 is provided at one end of the second slide plate 413, and a second protrusion 425 corresponding to the second buckling portion 414 is provided at one end of the third slide groove 424. When the second slide plate 413 slides to one end of the third slide groove 424, the second buckling portion 414 buckles on the second protrusion. In order to limit the position of the second probe plate 42 , a stopper 423 is disposed at the upper end of the third slide plate 422 . When the third slide plate 422 slides to the bottom, the stopper 423 abuts against the side wall of the second mounting groove 12 .
[0033] In addition, if Fig. 9 As shown, one end of the rotating member 24 is provided with a connecting portion 241 and a first rotating shaft, a rotating hole 243 is provided on the connecting portion 241, and the other end of the rotating member 24 is provided with a hooking portion 242. The rotating member 24 is rotatably connected to the pressure cover 20 through the first rotating shaft, the first rotating shaft slides in the rotating hole 243, and the rotating member 24 abuts against the test piece 50 through the hooking portion 242.
[0034] The pressure cover 20 is provided with a transfer end 23, and a first rotating shaft is provided on the transfer end 23. The first rotating shaft passes through the rotating hole 243, and the rotating member 24 is rotatably connected to the transfer end 23 through the first rotating shaft. In order to expand the range of motion of the rotating member 24, the first rotating shaft can slide in the rotating hole 243. In order to prevent the rotating member 24 from falling off, a through hole 244 is provided on the rotating member 24, and a second rotating shaft is provided in the through hole, and the second rotating shaft is rotatably connected to the base 10. In order to facilitate the placement of the temperature-controlled aging test seat 100, a bottom plate 15 is provided at the lower end of the base 10.
[0035] In summary, the temperature-controlled aging test socket 100 disclosed in the present application abuts against the test piece 50 through the rotating member 24, and the test piece 50 can adjust its position along with the heat conducting plate 33, so that the pin 51 is electrically connected to one end of the probe, and the pin 51 of the test piece 50 does not need to be plugged into the aging test socket 100, which will not cause unstable plugging or damage to the aging test socket 100, and the test is accurate and convenient; and the temperature-controlled aging test socket 100 also includes a temperature control board 322, which can control the temperature of the test piece 50, further making the test more convenient.
[0036] The basic principles, main features and advantages of the present invention are shown and described above. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and the description in the specification are only to illustrate the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention to be protected. The scope of protection of the present invention is defined by the attached claims and their equivalents.
Claims
1. A temperature-controlled aging test seat, comprising a base, a mounting seat, a rotating member, a probe plate and a gland with a central hole, wherein the gland is vertically slidably connected to the base, one end of the rotating member is rotatably connected to the gland, the probe plate and the mounting seat are both arranged at the upper end of the base, characterized in that: The mounting seat includes a seat body and a mounting plate for mounting the test piece, the mounting plate is slidably arranged on the seat body, the mounting plate includes a heating plate and a temperature control plate electrically connected to the heating plate; the probe plate includes a first probe plate, the first probe plate includes a plurality of probes for outputting test signals; when the pressure cover slides upward, after the test piece passes through the middle hole and is mounted on the mounting plate, the other end of the rotating member abuts against the test piece, and the pin of the test piece abuts against one end of the probe; when the pressure cover slides downward, the other end of the rotating member is separated from the test piece.
2. The temperature-controlled aging test socket according to claim 1, characterized in that: The heating plate includes a heating rod, the temperature control plate includes a temperature sensor, the upper end surface of the heating rod is flush with the upper end surface of the temperature sensor, and the upper surface of the mounting plate is parallel to the upper surface of the first probe plate.
3. The temperature-controlled aging test socket according to claim 2, characterized in that: The mounting seat also includes an elastic member and a heat conducting plate for mounting the test piece, the heating rod and the temperature sensor are respectively located at two ends of the lower surface of the heat conducting plate, and the heat conducting plate is elastically connected to the heating plate through the elastic member.
4. The temperature-controlled aging test socket according to claim 3, characterized in that: The base is further provided with a first mounting groove and a second mounting groove which are in communication with each other. The mounting seat is mounted in the first mounting groove, and the first probe plate is mounted in the second mounting groove.
5. The temperature-controlled aging test socket according to claim 4, characterized in that: A first mounting hole is arranged in the first mounting groove, the mounting plate is arranged in the first mounting hole, a second mounting hole is arranged in the seat body, and the heat conducting plate is slidably arranged in the second mounting hole.
6. The temperature-controlled aging test socket according to claim 1, characterized in that: The base includes a first slide groove and a first spring, the pressure cover includes a first slide plate, the first slide plate is slidably connected in the first slide groove, and the pressure cover is connected to the base through the first spring.
7. The temperature-controlled aging test socket according to claim 6, characterized in that: The first slide groove and the first spring are provided at both ends of the base, the first slide plate is provided at both ends of the pressure cover, the lower end of the first slide plate is provided with a first buckling portion, and the upper end of the first slide groove is provided with a first protrusion corresponding to the first buckling portion.
8. The temperature-controlled aging test socket according to claim 1, characterized in that: The probe board also includes a second probe board, the first probe board and the second probe board are vertically slidably connected, the first probe board is arranged on the upper end surface of the second probe board, the first probe board includes a plurality of first pinholes opposite to the pins of the device to be tested, and the second probe board includes a plurality of second pinholes opposite to the first pinholes, and the probes pass through the second pinholes and the first pinholes to be electrically connected to the pins of the device to be tested.
9. The temperature-controlled aging test socket according to claim 8, characterized in that: The probe board also includes a second spring, the first probe board and the second probe board are connected by the second spring, the first probe board also includes a second slide plate and a second slide groove, the second probe board also includes a third slide groove and a third slide plate, the second slide plate slides in the third slide groove, and the third slide plate slides in the second slide groove.
10. The temperature-controlled aging test socket according to claim 1, characterized in that: A transfer part and a first rotating shaft are provided at one end of the rotating member, a rotating hole is provided on the transfer part, a hooking part is provided at the other end of the rotating member, the rotating member is rotatably connected to the pressure cover through the first rotating shaft, the first rotating shaft slides in the rotating hole, and the rotating member abuts against the test piece through the hooking part.