ZYNQ chip ionization total dose irradiation experiment system and experiment method

Abstract

The invention discloses a ZYNQ chip ionization total dose irradiation experiment system and a ZYNQ chip ionization total dose irradiation experiment method. The system comprises a ZYNQ ionization total dose irradiation test board, a voltage-stabilized source, an oscilloscope and a control computer. The control computer is connected with the ZYNQ ionization total dose irradiation test board and is used for controlling related test programs of the ZYNQ ionization total dose irradiation test board in a test and receiving real-time test information data; the power supply is connected with the ZYNQ ionization total dose irradiation test board and monitors voltage and power consumption current; and the oscilloscope is connected with the ZYNQ ionization total dose irradiation test board and monitors an output waveform. And the irradiation capability of the ZYNQ chip can be tested before the ZYNQ chip is mounted on specific equipment, so that the influence on the application of the ZYNQ chip is avoided. On-line measurement is carried out outside an irradiation source, and accurate ZYNQ test parameters can be obtained.

Description

Technical Field

[0001] The present invention relates to the technical field of semiconductor chip radiation effect testing, and in particular to a ZYNQ chip total ionizing dose irradiation experimental system and an experimental method. Background Art

[0002] With the continuous development of nuclear energy technology, the demand for the application of large-scale integrated circuits in the nuclear energy field has gradually increased, and larger-scale and more highly integrated integrated circuits have become an indispensable part of nuclear energy systems. Among them, the ZYNQ chip, which combines field programmable gate arrays and processors, is an important large-scale integrated chip in nuclear energy control systems.

[0003] In order to ensure the reliability of ZYNQ chips in complex nuclear radiation environments and ensure that the chips can work stably and accurately in nuclear radiation environments, it is necessary to build a specific radiation environment on the ground before the chips are applied to nuclear energy systems to conduct sufficient radiation experimental testing and evaluation on the dedicated ZYNQ chips. Through systematic evaluation of various standards, the chip's radiation resistance performance is comprehensively determined to ensure that the ZYNQ chips used can meet the application requirements of nuclear energy environments.

[0004] Traditional ZYNQ irradiation boards are mostly commercial boards, and their design focuses on commercial applications. They have shortcomings when used for irradiation testing. One of the prominent problems is that it is difficult to completely shield the peripheral circuits during irradiation, and their circuits are complex, containing many circuits that are not related to irradiation. These peripheral circuits are affected during irradiation and generate interference signals, which seriously affect the accuracy and reliability of the experimental results. In order to overcome the drawbacks of traditional commercial boards and meet the requirements for accurately testing the irradiation performance of ZYNQ chips, the present invention optimizes its circuits, deletes circuits that are not related to irradiation, redesigns the peripheral circuits and keeps the peripheral circuits at least 4 cm away from the chip to be tested, so as to completely shield the peripheral circuits and avoid interference signals affecting the test results, providing reliable conditions for accurately evaluating the irradiation performance of chips.

[0005] A set of fully functional and targeted test programs were redesigned to achieve accurate evaluation of the irradiation performance of the ZYNQ chip. The new test program refined the testing of different functional units and achieved comprehensive and real-time data collection of each functional unit inside the ZYNQ chip. During the irradiation process, the data in the functional units inside the chip can be continuously read and transmitted to the control computer for analysis in a timely manner, so as to accurately evaluate the performance status of the chip after irradiation. Summary of the invention

[0006] The present invention aims to provide a ZYNQ chip total ionizing dose irradiation experimental system and an experimental method. The system consists of a test room and an irradiation room. A control computer, an oscilloscope and a voltage-stabilized power supply are arranged in the test room; a ZYNQ total ionizing dose irradiation test board and an irradiation source are arranged in the irradiation room; the ZYNQ total ionizing dose irradiation test board is composed of a shielding area and an irradiation area, and a power supply module, a joint test working group download interface, a communication module, a storage module, a clock module and an output port are arranged in the shielding area; a ZYNQ chip to be tested is arranged in the irradiation area, and a control computer and a ZYNQ total ionizing dose irradiation source are arranged in the irradiation area. The irradiation test board is connected to control the relevant test procedures of the ZYNQ total ionizing dose irradiation test board in the test and receive real-time test information data; the voltage-stabilized power supply is connected to the ZYNQ total ionizing dose irradiation test board and monitors the voltage and power consumption current; the oscilloscope is connected to the ZYNQ total ionizing dose irradiation test board and monitors the output waveform; the irradiation capability of the ZYNQ chip can be tested before being installed on the specific equipment to avoid affecting its application; online measurement outside the irradiation source can obtain accurate ZYNQ test parameters; it is used to realize the irradiation experiment and automatic control of the ZYNQ chip, and the operation is simple and fast.

[0007] The invention discloses a ZYNQ chip total ionizing dose irradiation experimental system, which consists of a test room and an irradiation room. The test room is provided with a control computer, an oscilloscope and a voltage-stabilized power supply. The irradiation room is provided with a ZYNQ total ionizing dose irradiation test board and an irradiation source. The control computer, the oscilloscope and the voltage-stabilized power supply in the test room are respectively connected to the ZYNQ total ionizing dose irradiation test board in the irradiation room, and the ZYNQ total ionizing dose irradiation test board is irradiated by the irradiation source. The ZYNQ total ionizing dose irradiation test board is composed of a shielding area and an irradiation area. The shielding area is provided with a power module, a joint test working group download interface, a communication module, a storage module, a clock module and an output port. The irradiation area is provided with a ZYNQ chip to be tested, and the power module, the communication module, the storage module, the clock module, the joint test working group download interface and the output port in the shielding area are all 4 cm away from the ZYNQ chip to be tested.

[0008] The ZYNQ chip integrates a dual-core ARM processor and an FPGA;

[0009] The power supply module is composed of a 3.3V input interface, a 1.8V input interface, a 1.35V input interface, a 1.0V input interface and a plurality of capacitor filter arrays, wherein the 3.3V input interface, the 1.8V input interface, the 1.35V input interface and the 1.0V input interface are respectively connected in parallel with the capacitor filter arrays, and the 3.3V input interface, the 1.8V input interface, the 1.35V input interface and the 1.0V input interface are respectively connected with the ZYNQ chip and the regulated power supply;

[0010] The joint test workgroup download interface is used to receive the test program sent by the control computer through the Xilinx downloader or to debug the program online, and to perform an irradiation experiment test on the ZYNQ chip according to the test program. During the irradiation process, the test program includes an online logic analyzer, and the online logic analyzer sends a running status signal to the control computer through the joint test workgroup interface. After the irradiation is completed, the configuration data in the ZYNQ chip is read back through the joint test workgroup interface and transmitted to the control computer;

[0011] The communication module includes a USB-to-serial port chip, a USB Type-C seat and a 6-pin pin header, provides an interface for communication between the ZYNQ chip and the control computer, converts the data signal sent by the control computer into a serial port signal, and the ZYNQ chip receives the serial port signal to obtain an instruction, and performs corresponding read and write operations and state control on the ZYNQ chip under test on the irradiation board according to the instruction; the ZYNQ chip sends the output data of the test program as a serial port signal, which is converted into a receiving data signal of the control computer through the USB-to-serial port chip, the USB Type-C seat and the 6-pin pin header; the 6-pin pin header switches the two serial port channels of the ZYNQ chip through a jumper cap;

[0012] The storage module includes a flash memory, which stores the startup image data of the ZYNQ chip, ensuring that the ZYNQ chip can continue to work after powering on again during the irradiation process;

[0013] The clock module is composed of a 50Mhz active crystal oscillator and a 33.333Mhz active crystal oscillator. The 50Mhz active crystal oscillator provides a clock for the FPGA, and the 50Mhz active crystal oscillator provides a clock for the dual-core ARM processor.

[0014] The output port includes two 40-pin connectors, which are connected to the ZYNQ chip. The test program selects two of the 40-pin connectors to connect to the oscilloscope.

[0015] The anti-radiation plate is a lead plate and has a thickness of 5 cm.

[0016] The test method of the ZYNQ chip total ionizing dose irradiation experimental system is carried out according to the following steps:

[0017] a. According to the voltage required for the operation of the ZYNQ chip under test, the output voltage of the voltage regulator is adjusted. The voltage regulator provides 3.3V, 1.8V, 1.35V and 1.0V voltages for the ZYNQ total ionizing dose irradiation test board, and monitors the power consumption current. Then the control computer is connected to the ZYNQ total ionizing dose irradiation test board through two USB optical fiber connection lines, including: an experimental operation control unit and an experimental data display unit. The experimental operation control unit is used to control the relevant test procedures of the ZYNQ total ionizing dose irradiation test board in the experiment. The experimental data display unit is used to dynamically display the real-time test information data results received from the ZYNQ total ionizing dose irradiation test board in the irradiation experiment; the oscilloscope is connected to the ZYNQ total ionizing dose irradiation test board through a coaxial cable, and the output waveform is monitored in real time;

[0018] b. At the beginning of the test, the power supply is turned on, and the control computer is turned on to output the test program to the ZYNQ chip, wherein the test program is specifically used to configure the internal functional units of the ZYNQ chip, and before irradiating the ZYNQ chip, the data in the functional units inside the ZYNQ chip are extracted as control test data;

[0019] c. During the irradiation process, the data in the functional unit inside the ZYNQ chip in step b is read as the readback test data; the readback test data is compared with the control test data, the number of errors is counted, and the number of errors is transmitted to the control computer; the voltage and current conditions are monitored by the regulated power supply; and the output waveform is monitored by the oscilloscope.

[0020] The test programs described in step b are respectively an on-chip memory read-write circuit, a trigger test program, a lookup table calculation program, a phase-locked loop frequency division circuit, and a ring oscillator physical unclonable function circuit; the on-chip memory read-write circuit configures the on-chip memory resources in the ZYNQ chip as a dual-port memory, writes all 0s or all 1s into the dual-port memory, and determines the failure of the storage area by detecting the output data. The test program occupies 98.93% of the on-chip memory resources; the trigger test program configures the trigger resources in the ZYNQ chip as a shift register chain, writes different initial values, including typical all 0s or all 1s, and determines its functional failure by detecting the output data of the shift register chain. The test program occupies 98.60% of the trigger The lookup table calculation program configures the lookup table resources in the ZYNQ chip as a multiplier, and determines the functional failure of the calculation unit by detecting the output data of the calculation unit. The test program occupies 96.80% of the lookup table resources; the phase-locked loop frequency division circuit configures the phase-locked loop in the ZYNQ chip into a four-frequency division circuit, and observes the output waveform of the ZYNQ chip; the ring oscillator physical unclonable function circuit configures the ZYNQ chip into a shaped oscillator physical unclonable function composed of 2 multiplexers, 1025 ring oscillators with exactly the same design, 2 counters and 1 comparator, determines the output of a 1024-bit bit string by frequency comparison, and compares the bit strings before and after irradiation to test the functional degradation and operation stability of the ZYNQ chip.

[0021] The ZYNQ chip total ionizing dose irradiation experimental system and experimental method described in the present invention have the following beneficial effects:

[0022] The present invention places the power module, communication module, storage module, clock module, joint test working group download interface and output port on the irradiation test board more than 4 cm away from the ZYNQ chip to be tested and covers them with an anti-radiation plate, and performs radiation shielding protection on the devices in the non-irradiated area. The device test module is exposed to the outside to receive the irradiation test, which can prevent the matching devices outside the test from being damaged, effectively reduce the test cost and reduce the interference items of the ZYNQ chip irradiation test. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 It is a schematic diagram of the test system of the present invention;

[0024] Figure 2 This is a schematic diagram of the irradiation test board of the present invention;

[0025] Figure 3 This is a schematic diagram of a power module of the present invention;

[0026] Figure 4 This is a schematic diagram of a communication module of the present invention;

[0027] Figure 5 This is a schematic diagram of the output port of the present invention;

[0028] Figure 6 The present invention is a flow chart of the test method. DETAILED DESCRIPTION

[0029] Example

[0030] The invention discloses a ZYNQ chip total ionizing dose irradiation experimental system, which is composed of a test room and an irradiation room. The test room is provided with a control computer, an oscilloscope and a voltage-stabilized power supply. The irradiation room is provided with a ZYNQ total ionizing dose irradiation test board and an irradiation source. The control computer, the oscilloscope and the voltage-stabilized power supply in the test room are respectively connected to the ZYNQ total ionizing dose irradiation test board in the irradiation room, and the ZYNQ total ionizing dose irradiation test board is irradiated by the irradiation source. The ZYNQ total ionizing dose irradiation test board is composed of a shielding area and an irradiation area. The shielding area is provided with a power module, a joint test working group download interface, a communication module, a storage module, a clock module and an output port. The irradiation area is provided with a ZYNQ chip to be tested, and the power module, the communication module, the storage module, the clock module, the joint test working group download interface and the output port in the shielding area are all 4 cm away from the ZYNQ chip to be tested.

[0031] The ZYNQ chip integrates a dual-core ARM processor and an FPGA;

[0032] The power supply module is composed of a 3.3V input interface, a 1.8V input interface, a 1.35V input interface, a 1.0V input interface and a plurality of capacitor filter arrays, wherein the 3.3V input interface, the 1.8V input interface, the 1.35V input interface and the 1.0V input interface are respectively connected in parallel with the capacitor filter arrays, and the 3.3V input interface, the 1.8V input interface, the 1.35V input interface and the 1.0V input interface are respectively connected with the ZYNQ chip and the regulated power supply;

[0033] The joint test workgroup download interface is used to receive the test program sent by the control computer through the Xilinx downloader or to debug the program online, and to perform an irradiation experiment test on the ZYNQ chip according to the test program. During the irradiation process, the test program includes an online logic analyzer, and the online logic analyzer sends a running status signal to the control computer through the joint test workgroup interface. After the irradiation is completed, the configuration data in the ZYNQ chip is read back through the joint test workgroup interface and transmitted to the control computer;

[0034] The communication module includes a USB-to-serial port chip, a USB Type-C seat and a 6-pin pin header, provides an interface for communication between the ZYNQ chip and the control computer, converts the data signal sent by the control computer into a serial port signal, and the ZYNQ chip receives the serial port signal to obtain an instruction, and performs corresponding read and write operations and state control on the ZYNQ chip under test on the irradiation board according to the instruction; the ZYNQ chip sends the output data of the test program as a serial port signal, which is converted into a receiving data signal of the control computer through the USB-to-serial port chip, the USB Type-C seat and the 6-pin pin header; the 6-pin pin header switches the two serial port channels of the ZYNQ chip through a jumper cap;

[0035] The storage module includes a flash memory, which stores the startup image data of the ZYNQ chip, ensuring that the ZYNQ chip can continue to work after powering on again during the irradiation process;

[0036] The clock module is composed of a 50Mhz active crystal oscillator and a 33.333Mhz active crystal oscillator. The 50Mhz active crystal oscillator provides a clock for the FPGA, and the 50Mhz active crystal oscillator provides a clock for the dual-core ARM processor.

[0037] The output port includes two 40-pin connectors, which are connected to the ZYNQ chip, and the test program selects two of the 40-pin connectors to connect to the oscilloscope;

[0038] The anti-radiation plate is a lead plate with a thickness of 5 cm;

[0039] The test method of the ZYNQ chip total ionizing dose irradiation experimental system is carried out according to the following steps:

[0040] a. According to the voltage required for the operation of the ZYNQ chip under test, the output voltage of the voltage regulator is adjusted. The voltage regulator provides 3.3V, 1.8V, 1.35V and 1.0V voltages for the ZYNQ total ionizing dose irradiation test board, and monitors the power consumption current. Then the control computer is connected to the ZYNQ total ionizing dose irradiation test board through two USB optical fiber connection lines, including: an experimental operation control unit and an experimental data display unit. The experimental operation control unit is used to control the relevant test procedures of the ZYNQ total ionizing dose irradiation test board in the experiment. The experimental data display unit is used to dynamically display the real-time test information data results received from the ZYNQ total ionizing dose irradiation test board in the irradiation experiment; the oscilloscope is connected to the ZYNQ total ionizing dose irradiation test board through a coaxial cable, and the output waveform is monitored in real time;

[0041] b. At the beginning of the test, the power supply is turned on, and the control computer is turned on to output the test program to the ZYNQ chip, wherein the test program is specifically used to configure the internal functional units of the ZYNQ chip, and before irradiating the ZYNQ chip, the data in the functional units inside the ZYNQ chip are extracted as control test data;

[0042] c. During the irradiation process, the data in the functional unit inside the ZYNQ chip in step b is read as the readback test data; the readback test data is compared with the control test data, the number of errors is counted, and the number of errors is transmitted to the control computer; the voltage and current are monitored by the regulated power supply; the output waveform is monitored by the oscilloscope;

[0043] The test programs described in step b are respectively an on-chip memory read-write circuit, a trigger test program, a lookup table calculation program, a phase-locked loop frequency division circuit, and a ring oscillator physical unclonable function circuit; the on-chip memory read-write circuit configures the on-chip memory resources in the ZYNQ chip as a dual-port memory, writes all 0s or all 1s into the dual-port memory, and determines the failure of the storage area by detecting the output data. The test program occupies 98.93% of the on-chip memory resources; the trigger test program configures the trigger resources in the ZYNQ chip as a shift register chain, writes different initial values, including typical all 0s or all 1s, and determines its functional failure by detecting the output data of the shift register chain. The test program occupies 98.60% of the trigger The lookup table calculation program configures the lookup table resources in the ZYNQ chip as a multiplier, and determines the functional failure of the calculation unit by detecting the output data of the calculation unit. The test program occupies 96.80% of the lookup table resources; the phase-locked loop frequency division circuit configures the phase-locked loop in the ZYNQ chip into a four-frequency division circuit, and observes the output waveform of the ZYNQ chip; the ring oscillator physical unclonable function circuit configures the ZYNQ chip into a shaped oscillator physical unclonable function composed of 2 multiplexers, 1025 ring oscillators with exactly the same design, 2 counters and 1 comparator, and determines the output of a 1024-bit bit string by frequency comparison, and compares the bit strings before and after irradiation to test the functional degradation and operation stability of the ZYNQ chip;

[0044] like Figure 1 As shown in FIG. 1 , a ZYNQ chip ionizing total dose irradiation experimental system is mainly composed of a ZYNQ ionizing total dose irradiation test board, a voltage regulator, an oscilloscope and a control computer. The system connection relationship is as follows: Figure 1 As shown; its core part is the ZYNQ total ionizing dose irradiation test board, which can be used to perform ionizing dose irradiation related tests on ZYNQ chips;

[0045] The control computer is used to control the operation of the ZYNQ total ionization dose irradiation test board. It is connected to the ZYNQ total ionization dose irradiation test board through two USB optical fiber cables to control the relevant test procedures of the ZYNQ total ionization dose irradiation test board in the test and receive real-time test information data; through specific settings, the control of the entire experimental process and the collection and analysis of data can be achieved; the voltage-stabilized power supply is connected to the ZYNQ total ionization dose irradiation test board through a red and black twisted pair cable and monitors the current in real time, providing stable power support for the ZYNQ total ionization dose irradiation test board and grasping the current state in real time; the oscilloscope is connected to the ZYNQ total ionization dose irradiation test board through a coaxial cable and monitors the output waveform in real time, so as to observe the changes in the output waveform of the test board during the test;

[0046] The ZYNQ total ionizing dose irradiation test board carries the ZYNQ chip to be tested, performs corresponding test operations on the ZYNQ chip according to the test requirements, uploads the experimental result data in real time, and collects relevant working status data in real time; its structure is mainly composed of the ZYNQ chip to be tested, the power module, the joint test working group download interface, the communication module, the storage module, the clock module and the output port. The structural block diagram is shown in the figure. Figure 2 As shown;

[0047] Power module:

[0048] The power module includes a 3.3V input interface, a 1.8V input interface, a 1.35V input interface, a 1.0V input interface and several capacitor filter arrays. The 3.3V input interface, the 1.8V input interface, the 1.35V input interface, and the 1.0V input interface are connected in parallel with the capacitor filter array; the 3.3V input interface, the 1.8V input interface, the 1.35V input interface, and the 1.0V input interface are connected with the ZYNQ chip and the voltage regulator. Its main functions are: providing stable different voltage values ​​for the ZYNQ chip, including 3.3V, 1.8V, 1.35V and 1.0V voltages, to meet the working requirements of different parts of the ZYNQ chip; during the irradiation process, the real-time working voltage and power consumption current of the ZYNQ total ionizing dose irradiation test board are displayed in conjunction with the voltage regulator, such as Figure 3 As shown;

[0049] Joint Test Working Group download interface:

[0050] The Joint Test Working Group download interface is used to receive the test program sent by the control computer through the Xilinx downloader or to debug the program online, and to perform irradiation experimental tests on the ZYNQ chip according to the test program. Its main functions include:

[0051] Program reception and debugging: Receive the test program sent by the control computer and debug the program online to ensure that the test program can run accurately on the ZYNQ chip;

[0052] Operation status feedback: During the irradiation process, the test program includes an online logic analyzer, which sends the operation status signal to the control computer through the joint test working group interface, so that the control computer can understand the operation status of the ZYNQ chip in real time;

[0053] Data readback: After the irradiation is completed, the configuration data in the ZYNQ chip is read back through the joint test working group interface and transmitted to the control computer, so as to analyze the status of the ZYNQ chip after irradiation;

[0054] Communication module:

[0055] The communication module includes a USB to serial port chip, a USB Type C socket and a 6-pin pin header. Its main functions are:

[0056] Signal conversion and transmission: The data signal sent by the control computer is converted into a serial port signal. The ZYNQ chip receives the serial port signal to obtain instructions, and performs corresponding read and write operations and status control on the ZYNQ under test on the irradiation board according to the instructions. At the same time, the ZYNQ chip sends the output data of the test program as a serial port signal, which is converted into the receiving data signal of the control computer through the USB to serial port chip, USB Type C seat and 6-pin pin header, realizing two-way communication between the ZYNQ chip and the control computer. Figure 4 As shown;

[0057] Serial port channel switching: The 6-pin header can switch the two serial port channels of the ZYNQ chip through a jumper cap, which is convenient for selecting and switching serial port channels according to different test requirements;

[0058] Storage Module:

[0059] The storage module includes a flash memory, and its main functions are: startup image data storage. The flash memory stores the startup image data of the ZYNQ chip, ensuring that the ZYNQ chip can continue to work after powering on again during the irradiation process, ensuring the normal operation of the ZYNQ chip during the test;

[0060] Clock module:

[0061] The clock module contains a 50Mhz active crystal oscillator and a 33.333Mhz active crystal oscillator. Its main functions are: the 50Mhz active crystal oscillator provides clock for the FPGA, the 50Mhz active crystal oscillator provides clock for the dual-core ARM processor, and provides accurate clock signals for different functional units in the ZYNQ chip to ensure that each unit can work normally;

[0062] Output Ports:

[0063] The output port includes two 40-pin connectors, whose main functions are: connecting to an oscilloscope. The two 40-pin connectors are connected to the ZYNQ chip. Select two of the pins to connect to the oscilloscope so that the oscilloscope can monitor the waveform output by the ZYNQ chip in real time. Figure 5 As shown;

[0064] The test method of the ZYNQ chip total ionizing dose irradiation experimental system is as follows: Figure 6 As shown, follow these steps:

[0065] Step 1: Before the test begins, Figure 1 The connection method shown is used to interconnect the various parts of the ZYNQ chip total ionization dose irradiation experiment system, and the control computer, voltage-stabilized power supply and oscilloscope are placed in the test room to ensure that each device is placed firmly and the environment is suitable for its normal operation; the ZYNQ total ionization dose irradiation test board is placed in the irradiation room, and a 5 cm thick anti-irradiation lead plate is covered on the ZYNQ chip to be tested to take radiation protection measures; the control computer is connected to the ZYNQ total ionization dose irradiation test board through two USB optical fiber cables; the voltage-stabilized power supply is connected to the ZYNQ total ionization dose irradiation test board through a red and black twisted pair cable; the oscilloscope is connected to the ZYNQ total ionization dose irradiation test board through a coaxial cable to complete the physical connection between the various devices;

[0066] Step 2: According to the voltage required by the tested ZYNQ chip, accurately adjust the output voltage on the voltage regulator so that it can provide 3.3V, 1.8V, 1.35V and 1.0V voltages to the ZYNQ total ionizing dose irradiation test board respectively. At the same time, check the communication settings between the devices to ensure that the control computer can send the test program to the ZYNQ total ionizing dose irradiation test board normally, and can receive and display the test data fed back from the test board; ensure that the voltage regulator can monitor the current normally; ensure that the oscilloscope can monitor the output waveform normally;

[0067] Step 3: At the beginning of the test, first turn on the voltage regulator to ensure that the ZYNQ total ionizing dose irradiation test board has a stable power supply. At the same time, open the control computer and output the pre-prepared test program to the ZYNQ chip. Before irradiating the ZYNQ chip, this test program will extract the data in the functional unit inside the ZYNQ chip and save it as control test data for subsequent comparative analysis;

[0068] Step 4: During the irradiation process, the control computer continuously reads the data in the functional unit inside the ZYNQ chip through the test program as the readback test data, compares the readback test data with the previously saved control test data, counts the number of errors, and transmits the number of errors to the control computer in real time, so as to timely grasp the functional state changes of the ZYNQ chip during the irradiation process; the voltage regulator continuously monitors the voltage and current of the ZYNQ total ionizing dose irradiation test board, and can timely detect and record relevant data in case of abnormal fluctuations (such as voltage drop, excessive current, etc.), and the oscilloscope continuously monitors the output waveform of the ZYNQ total ionizing dose irradiation test board to observe whether the waveform is distorted, the amplitude changes, and other abnormal conditions, and records relevant waveform data, so as to analyze the changes in the output signal of the ZYNQ chip;

[0069] Step 5: Execute specific test program functions:

[0070] On-chip memory read / write circuit: configure the on-chip memory resources as dual-port memory, write all 0 or all 1 data into it, and then determine whether the storage area is invalid by detecting the output data; this test program occupies up to 98.93% of the on-chip memory resources;

[0071] Trigger test program: Set the trigger resource as a shift register chain and write different initial values, including typical all-0 or all-1 situations. By testing the output data of the shift register chain, it is determined whether its function fails. This test program occupies 98.60% of the trigger resources;

[0072] Lookup table calculation program: configure the lookup table resources as a multiplier, and use the output data of the detection calculation unit to determine whether its function is working properly. This test program occupies 96.80% of the lookup table resources;

[0073] Phase-locked loop frequency division circuit: The phase-locked loop is configured as a four-frequency division circuit, and the changes in the output waveform of the ZYNQ chip are observed to determine whether the relevant functions are in a normal state;

[0074] Ring oscillator physical unclonable function circuit: It consists of 2 multiplexers, 1025 ring oscillators with exactly the same design, 2 counters and 1 comparator to form a ring oscillator physical unclonable function. It determines the output of a 1024-bit bit string by frequency comparison, and then compares the bit strings before and after irradiation to test the functional degradation degree and operational stability of the ZYNQ chip.

[0075] Step 6: After the irradiation is completed, the configuration data in the ZYNQ chip is read back through the joint test working group interface and transmitted to the control computer. The read-back configuration data and various monitoring data collected during the irradiation process (such as the number of errors, voltage and current data, waveform data, etc.) are comprehensively analyzed on the control computer to evaluate the performance changes of the ZYNQ chip under the total ionizing dose effect of the irradiation, including whether the function fails and whether the performance decreases, so as to fully understand the status of the ZYNQ chip after irradiation;

[0076] Step 7: Turn off the stabilized power supply, oscilloscope, control computer and other equipment in turn to ensure that the equipment is safely shut down to avoid data loss or equipment damage caused by abnormal shutdown; organize the experimental equipment, take out the ZYNQ total ionizing dose irradiation test board from the irradiation room (if necessary, subsequent inspection or maintenance can be carried out), and return all equipment to their original locations, organize and preserve the experimental records for subsequent review and reference.

Claims

1. A ZYNQ chip ionizing total dose irradiation experimental system, characterized in that: The system consists of a test room and an irradiation room. A control computer, an oscilloscope and a voltage-stabilized power supply are arranged in the test room. A ZYNQ total ionization dose irradiation test board and an irradiation source are arranged in the irradiation room. The control computer, the oscilloscope and the voltage-stabilized power supply in the test room are respectively connected to the ZYNQ total ionization dose irradiation test board in the irradiation room. The ZYNQ total ionization dose irradiation test board is irradiated by the irradiation source. The ZYNQ total ionization dose irradiation test board consists of a shielding area and an irradiation area. A power module, a joint test working group download interface, a communication module, a storage module, a clock module and an output port are arranged in the shielding area. A ZYNQ chip to be tested is arranged in the irradiation area. The power module, the communication module, the storage module, the clock module, the joint test working group download interface and the output port in the shielding area are all 4 cm away from the ZYNQ chip to be tested.

2. The ZYNQ chip total ionizing dose irradiation experimental system according to claim 1, characterized in that: The ZYNQ chip integrates a dual-core ARM processor and an FPGA; The power supply module is composed of a 3.3V input interface, a 1.8V input interface, a 1.35V input interface, a 1.0V input interface and a plurality of capacitor filter arrays, wherein the 3.3V input interface, the 1.8V input interface, the 1.35V input interface and the 1.0V input interface are respectively connected in parallel with the capacitor filter arrays, and the 3.3V input interface, the 1.8V input interface, the 1.35V input interface and the 1.0V input interface are respectively connected with the ZYNQ chip and the regulated power supply; The joint test workgroup download interface is used to receive the test program sent by the control computer through the Xilinx downloader or to debug the program online, and to perform an irradiation experiment test on the ZYNQ chip according to the test program. During the irradiation process, the test program includes an online logic analyzer, and the online logic analyzer sends a running status signal to the control computer through the joint test workgroup interface. After the irradiation is completed, the configuration data in the ZYNQ chip is read back through the joint test workgroup interface and transmitted to the control computer; The communication module includes a USB-to-serial port chip, a USB Type-C seat and a 6-pin pin header, provides an interface for communication between the ZYNQ chip and the control computer, converts the data signal sent by the control computer into a serial port signal, and the ZYNQ chip receives the serial port signal to obtain an instruction, and performs corresponding read and write operations and state control on the ZYNQ chip under test on the irradiation board according to the instruction; the ZYNQ chip sends the output data of the test program as a serial port signal, which is converted into a receiving data signal of the control computer through the USB-to-serial port chip, the USB Type-C seat and the 6-pin pin header; the 6-pin pin header switches the two serial port channels of the ZYNQ chip through a jumper cap; The storage module includes a flash memory, which stores the startup image data of the ZYNQ chip, ensuring that the ZYNQ chip can continue to work after powering on again during the irradiation process; The clock module is composed of a 50Mhz active crystal oscillator and a 33.333Mhz active crystal oscillator. The 50Mhz active crystal oscillator provides a clock for the FPGA, and the 50Mhz active crystal oscillator provides a clock for the dual-core ARM processor. The output port includes two 40-pin connectors, which are connected to the ZYNQ chip. The test program selects two of the 40-pin connectors to connect to the oscilloscope.

3. The ZYNQ chip total ionizing dose irradiation experimental system according to claim 1, characterized in that: The anti-radiation plate is a lead plate and has a thickness of 5 cm.

4. A test method for the ZYNQ chip total ionizing dose irradiation experimental system according to claim 1, characterized in that: Follow these steps: a. According to the voltage required for the operation of the ZYNQ chip under test, the output voltage of the voltage regulator is adjusted. The voltage regulator provides 3.3V, 1.8V, 1.35V and 1.0V voltages for the ZYNQ total ionizing dose irradiation test board, and monitors the power consumption current. Then the control computer is connected to the ZYNQ total ionizing dose irradiation test board through two USB optical fiber connection lines, including: an experimental operation control unit and an experimental data display unit. The experimental operation control unit is used to control the relevant test procedures of the ZYNQ total ionizing dose irradiation test board in the experiment. The experimental data display unit is used to dynamically display the real-time test information data results received from the ZYNQ total ionizing dose irradiation test board in the irradiation experiment; the oscilloscope is connected to the ZYNQ total ionizing dose irradiation test board through a coaxial cable, and the output waveform is monitored in real time; b. At the beginning of the test, the power supply is turned on, and the control computer is turned on to output the test program to the ZYNQ chip, wherein the test program is specifically used to configure the internal functional units of the ZYNQ chip, and before irradiating the ZYNQ chip, the data in the functional units inside the ZYNQ chip are extracted as control test data; c. During the irradiation process, the data in the functional unit inside the ZYNQ chip in step b is read as the readback test data; the readback test data is compared with the control test data, the number of errors is counted, and the number of errors is transmitted to the control computer; the voltage and current conditions are monitored by the regulated power supply, and the output waveform is monitored by the oscilloscope.

5. The test method of the ZYNQ chip total ionizing dose irradiation experimental system according to claim 4 is characterized in that: The test programs described in step b are respectively an on-chip memory read-write circuit, a trigger test program, a lookup table calculation program, a phase-locked loop frequency division circuit, and a ring oscillator physical unclonable function circuit; the on-chip memory read-write circuit configures the on-chip memory resources in the ZYNQ chip as a dual-port memory, writes all 0s or all 1s into the dual-port memory, and determines the failure of the storage area by detecting the output data. The test program occupies 98.93% of the on-chip memory resources; the trigger test program configures the trigger resources in the ZYNQ chip as a shift register chain, writes different initial values, including typical all 0s or all 1s, and determines its functional failure by detecting the output data of the shift register chain. The test program occupies 98.60% of the triggers. resources; the lookup table calculation program configures the lookup table resources in the ZYNQ chip as a multiplier, and determines the functional failure of the calculation unit by detecting the output data of the calculation unit. The test program occupies 96.80% of the lookup table resources; the phase-locked loop frequency division circuit configures the phase-locked loop in the ZYNQ chip as a four-frequency division circuit, and observes the output waveform of the ZYNQ chip; the ring oscillator physical unclonable function circuit configures the ZYNQ chip into a ring oscillator physical unclonable function composed of 2 multiplexers, 1025 ring oscillators with exactly the same design, 2 counters and 1 comparator, determines the output of a 1024-bit bit string by frequency comparison, and compares the bit strings before and after irradiation to test the functional degradation and operating stability of the ZYNQ chip.

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