Method and device for measuring leakage inductance of high-frequency transformer

Abstract

The invention is suitable for the technical field of power equipment measurement, and provides a high-frequency transformer leakage inductance measurement method and device, and the method comprises the steps: obtaining the number of turns of a primary winding, the number of turns of a secondary winding, the primary equivalent inductance and the secondary equivalent inductance of a target high-frequency transformer; connecting dotted terminals of a primary winding and a secondary winding of the target high-frequency transformer in a forward direction to obtain a first inductor; reversely connecting dotted terminals of the primary winding and the secondary winding of the target high-frequency transformer to obtain a second inductor; obtaining coupling inductance and coupling mutual inductance based on the first inductance and the second inductance; based on the coupling inductance, the number of turns of the primary winding, the primary equivalent inductance and the number of turns of the secondary winding, the primary leakage inductance of the target high-frequency transformer is obtained; and obtaining the secondary leakage inductance of the target high-frequency transformer based on the coupling mutual inductance, the number of turns of the primary winding, the secondary equivalent inductance and the number of turns of the secondary winding. According to the invention, the leakage inductance of the primary winding and the leakage inductance of the secondary winding of the transformer can be accurately measured.

Description

Technical Field

[0001] The present application belongs to the technical field of power equipment measurement, and in particular, to a method and device for measuring leakage inductance of a high-frequency transformer. Background Art

[0002] In recent years, power electronic transformers have received more and more attention. Power electronic transformers are a device that integrates information technology and power electronic conversion technology. They can achieve bidirectional transmission and efficient utilization of energy and are an ideal choice for distributed power system grid connection. In the application of power electronic transformers, the bidirectional active bridge (DAB) topology is often used, and the high-frequency transformer is one of the core components of DAB. When DAB adopts phase shift control, whether it is single phase shift control, extended phase shift control, double phase shift control, or triple phase shift control, its maximum transmittable power is certain and directly controlled by the leakage inductance of the high-frequency transformer. At the same time, the leakage inductance of the high-frequency transformer will affect the voltage, current stress, loss of the power module connected to it, as well as the energy transmission and voltage drop of the high-frequency transformer itself, thereby affecting the overall performance of the power electronic transformer. In addition, the leakage inductance of the high-frequency transformer can also form an oscillation loop with the capacitor in the power electronic topology or the distributed capacitance in the transformer, so that the circuit oscillates and radiates electromagnetic energy outward to cause electromagnetic interference. Therefore, when designing a power electronic transformer, it is necessary to accurately design the leakage inductance of the high-frequency transformer according to the maximum transmission power requirement. On the contrary, by accurately detecting the leakage inductance of the high-frequency transformer in the power electronic transformer, a preliminary judgment can be made on the performance of the transformer.

[0003] In the prior art, the leakage inductance of a high-frequency transformer is mainly measured by a short-circuit test method. In the short-circuit test, the secondary winding is first short-circuited, and excitation is applied to both ends of the primary winding to measure the inductance of the primary winding. The obtained inductance value is the leakage inductance from the primary to the secondary side. However, the short-circuit test can only measure the sum of the leakage inductance of the primary winding and the secondary winding converted to the primary side. By assuming that the leakage inductance of the primary coil is equal to that of the secondary coil, the leakage inductance value of the primary and secondary coils is preliminarily calculated, and the leakage inductance of the primary and secondary coils of the high-frequency transformer cannot be accurately obtained. In addition, since the leakage inductance of the transformer winding is usually small, the error of the leakage inductance directly measured by the short-circuit test is large, which cannot meet the high-precision requirements of the primary and secondary leakage inductances of the relevant control methods such as resonant soft switching control and predictive current control in power electronic transformers. Summary of the invention

[0004] The embodiments of the present application provide a method and device for measuring leakage inductance of a high-frequency transformer to accurately measure the leakage inductance of the primary winding and the leakage inductance of the secondary winding of the transformer.

[0005] This application is implemented through the following technical solutions:

[0006] In a first aspect, an embodiment of the present application provides a method for measuring leakage inductance of a high-frequency transformer, comprising:

[0007] Obtain the primary winding turns, secondary winding turns, primary equivalent inductance, and secondary equivalent inductance of the target high-frequency transformer.

[0008] The primary winding and the secondary winding of the target high-frequency transformer are connected forwardly to obtain the first inductor; the primary winding and the secondary winding of the target high-frequency transformer are connected reversely to obtain the second inductor.

[0009] Based on the first inductance and the second inductance, a coupled inductance and a coupled mutual inductance are obtained.

[0010] Based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns, the primary leakage inductance of the target high-frequency transformer is obtained; based on the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns, the secondary leakage inductance of the target high-frequency transformer is obtained.

[0011] In combination with the first aspect, in some possible implementations, obtaining the primary leakage inductance of the target high-frequency transformer based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance, and the number of secondary winding turns includes:

[0012] Based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns, combined with the first formula, the primary leakage inductance of the target high-frequency transformer is obtained.

[0013] The first formula is:

[0014]

[0015] Among them, L1 represents the primary equivalent inductance, N1 represents the number of turns of the primary winding, N2 represents the number of turns of the secondary winding, and M 21 Represents coupled inductance, L 1σ Represents the primary leakage inductance of the target high-frequency transformer.

[0016] In combination with the first aspect, in some possible implementations, based on the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns, the secondary leakage inductance of the target high-frequency transformer is obtained, including:

[0017] Based on the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns, combined with the second formula, the secondary leakage inductance of the target high-frequency transformer is obtained.

[0018] The second formula is:

[0019]

[0020] Among them, L2 represents the equivalent inductance of the secondary side, N1 represents the number of turns of the primary winding, N2 represents the number of turns of the secondary winding, and M 12 Represents coupled mutual inductance, L 2σ Represents the secondary leakage inductance of the target high-frequency transformer.

[0021] In combination with the first aspect, in some possible implementations, a coupled inductor is obtained based on the first inductor and the second inductor, including:

[0022] Based on the first inductance and the second inductance and in combination with the third formula, a coupled inductance is obtained.

[0023] The third formula is:

[0024]

[0025] Where, S1 represents the first inductor, S2 represents the second inductor, and M 21 Represents coupled inductance.

[0026] In combination with the first aspect, in some possible implementations, obtaining a coupled mutual inductance based on the first inductance and the second inductance includes:

[0027] Based on the first inductance and the second inductance and in combination with the fourth formula, the coupled mutual inductance is obtained.

[0028] The fourth formula is:

[0029]

[0030] Where, S1 represents the first inductor, S2 represents the second inductor, and M 12 Represents coupled mutual inductance.

[0031] In combination with the first aspect, in some possible implementations, obtaining the primary equivalent inductance of the target high-frequency transformer includes:

[0032] Place the target high-frequency transformer on the test bench, connect the impedance analyzer to both ends of the primary coil, open the secondary coil, apply excitation of the rated frequency, and measure the primary equivalent inductance of the target high-frequency transformer.

[0033] In combination with the first aspect, in some possible implementations, obtaining the secondary equivalent inductance of the target high-frequency transformer includes:

[0034] Place the target high-frequency transformer on the test bench, connect the impedance analyzer to both ends of the secondary coil, open the primary coil, apply excitation of the rated frequency, and measure the secondary equivalent inductance of the target high-frequency transformer.

[0035] In combination with the first aspect, in some possible implementations, the primary winding and the secondary winding of the target high-frequency transformer are connected in forward direction to obtain a first inductor, including:

[0036] The same-name ends of the primary winding and the secondary winding of the target high-frequency transformer are connected in forward direction, and an impedance analyzer is used to apply excitation to the remaining two ends of the coil after the forward connection, so as to measure the first inductance after the primary coil and the secondary coil of the target high-frequency transformer are connected in forward direction.

[0037] In combination with the first aspect, in some possible implementations, the primary winding and the secondary winding of the target high-frequency transformer are connected in reverse to obtain the second inductor, including:

[0038] The same-name ends of the primary winding and the secondary winding of the target high-frequency transformer are reversely connected, and an impedance analyzer is used to apply excitation to the remaining two ends of the reversely connected coil to measure the second inductance after the primary coil and the secondary coil of the target high-frequency transformer are reversely connected.

[0039] In a second aspect, an embodiment of the present application provides a high-frequency transformer leakage inductance measurement device, comprising:

[0040] The first acquisition module is used to acquire the number of primary winding turns, the number of secondary winding turns, the primary equivalent inductance and the secondary equivalent inductance of the target high-frequency transformer.

[0041] The second acquisition module is used to connect the same-name ends of the primary winding and the secondary winding of the target high-frequency transformer in forward direction to obtain a first inductance; and to connect the same-name ends of the primary winding and the secondary winding of the target high-frequency transformer in reverse direction to obtain a second inductance.

[0042] The data calculation module is used to obtain the coupled inductance and the coupled mutual inductance based on the first inductance and the second inductance.

[0043] The result output module is used to obtain the primary leakage inductance of the target high-frequency transformer based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns; and to obtain the secondary leakage inductance of the target high-frequency transformer based on the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns.

[0044] It can be understood that the beneficial effects of the second aspect mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here.

[0045] Compared with the prior art, the embodiments of the present invention have the following beneficial effects:

[0046] The present application directly calculates the primary leakage inductance by means of coupled inductance, primary winding turns, primary equivalent inductance and secondary winding turns, and directly calculates the secondary leakage inductance by means of coupled mutual inductance, primary winding turns, secondary equivalent inductance and secondary winding turns. The steps are simple and the calculated leakage inductance can be closer to the true value. In addition, the primary equivalent inductance, secondary equivalent inductance, coupled inductance and coupled mutual inductance are all data obtained after the rated excitation input. Some parameters will cancel each other out during the calculation process. Therefore, there is no need to consider the excitation source type of the rated excitation, so the application is wider.

[0047] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present specification. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0049] Figure 1 It is a flow chart of a method for measuring leakage inductance of a high-frequency transformer provided in one embodiment of the present application;

[0050] Figure 2 is a schematic diagram of a forward connection provided by an embodiment of the present application;

[0051] Figure 3 is a schematic diagram of a reverse link provided by an embodiment of the present application;

[0052] Figure 4 It is a structural schematic diagram of a high-frequency transformer leakage inductance measurement device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0053] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0054] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof.

[0055] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0056] As used in the specification and appended claims of this application, the term "if" can be interpreted as "when" or "uponce" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "uponce it is determined" or "in response to determining" or "uponce [described condition or event] is detected" or "in response to detecting [described condition or event]", depending on the context.

[0057] In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0058] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0059] The present application provides a method for measuring leakage inductance of a high-frequency transformer. Figure 1 is a schematic diagram of the process of measuring the leakage inductance of a high-frequency transformer provided in an embodiment of the present application, with reference to Figure 1 , the leakage inductance measurement method of the high-frequency transformer is described in detail as follows:

[0060] Step 101, obtaining the number of primary winding turns, the number of secondary winding turns, the primary equivalent inductance, and the secondary equivalent inductance of a target high-frequency transformer.

[0061] Exemplarily, obtaining the primary equivalent inductance of the target high-frequency transformer may include:

[0062] Place the target high-frequency transformer on the test bench, connect the impedance analyzer to both ends of the primary coil, open the secondary coil, apply excitation of the rated frequency, and measure the primary equivalent inductance of the target high-frequency transformer.

[0063] Exemplarily, obtaining the secondary equivalent inductance of the target high-frequency transformer may include:

[0064] Place the target high-frequency transformer on the test bench, connect the impedance analyzer to both ends of the secondary coil, open the primary coil, apply excitation of the rated frequency, and measure the secondary equivalent inductance of the target high-frequency transformer.

[0065] In some specific embodiments, the magnitude of the applied rated frequency excitation may be: 10 kHz.

[0066] Step 102: Connect the same-named ends of the primary winding and the secondary winding of the target high-frequency transformer in a forward direction to obtain a first inductor; and connect the same-named ends of the primary winding and the secondary winding of the target high-frequency transformer in a reverse direction to obtain a second inductor.

[0067] For example, Figure 2 As shown, the primary winding of the target high-frequency transformer is connected in forward direction with the same-name end of the secondary winding to obtain a first inductor, which may include:

[0068] The same-name ends of the primary winding and the secondary winding of the target high-frequency transformer are connected in forward direction, and an impedance analyzer is used to apply excitation to the remaining two ends of the coil after the forward connection, so as to measure the first inductance after the primary coil and the secondary coil of the target high-frequency transformer are connected in forward direction.

[0069] For example, Figure 3 As shown, the primary winding of the target high-frequency transformer is connected in reverse with the same-named ends of the secondary winding to obtain a second inductor, which may include:

[0070] The same-name ends of the primary winding and the secondary winding of the target high-frequency transformer are reversely connected, and an impedance analyzer is used to apply excitation to the remaining two ends of the reversely connected coil to measure the second inductance after the primary coil and the secondary coil of the target high-frequency transformer are reversely connected.

[0071] Step 103: obtaining a coupled inductance and a coupled mutual inductance based on the first inductance and the second inductance.

[0072] Exemplarily, obtaining a coupled inductor based on the first inductor and the second inductor may include:

[0073] Based on the first inductance and the second inductance and in combination with the third formula, a coupled inductance is obtained.

[0074] The third formula can be:

[0075]

[0076] Where, S1 represents the first inductor, S2 represents the second inductor, and M 21 Represents coupled inductance.

[0077] Exemplarily, obtaining the coupled mutual inductance based on the first inductance and the second inductance may include:

[0078] Based on the first inductance and the second inductance and in combination with the fourth formula, the coupled mutual inductance is obtained.

[0079] The fourth formula can be:

[0080]

[0081] Where, S1 represents the first inductor, S2 represents the second inductor, and M 12 Represents coupled mutual inductance.

[0082] In some specific embodiments, the coupled inductance and the coupled mutual inductance are equal in value.

[0083] In some specific embodiments, in order to study the relationship between the primary leakage inductance, the secondary leakage inductance and the above parameters, a mutual inductance equivalent circuit model of the transformer is constructed, and the Faraday electromagnetic induction law equations are written according to the coupled inductance circuit model:

[0084]

[0085] Where u1 is the primary voltage, u2 is the secondary voltage, L1 is the primary winding equivalent inductance, L2 is the secondary winding equivalent inductance, i1 is the primary current, i2 is the secondary current, M 12 is the primary-secondary coupling mutual inductance, M 21 is the primary-secondary coupling inductor.

[0086] According to the electromagnetic field reciprocity theorem, we know that M 12 =M 21 .

[0087] By splitting the difference terms of Faraday's law of electromagnetic induction, we can get:

[0088]

[0089] Where Ψ1 is the magnetic flux from the hinge to the primary side, Ψ 11 is the flux generated by the primary coil and hinged to itself, Ψ 12 is the flux from the secondary coil hinge to the primary coil, Ψ 22 is the flux generated by the secondary coil and hinged to itself, Ψ 21 is the flux from the primary coil hinge to the secondary coil, N1 is the number of turns of the primary coil, N2 is the number of turns of the secondary coil, Φ 11is the magnetic flux generated by the primary current, Φ 11m is the magnetic flux generated by the primary current coupled to the secondary side, Φ 22 is the magnetic flux generated by the secondary current, Φ 22m The magnetic flux coupled to the primary side by the secondary current.

[0090] The derivation of the above formula is defined as follows:

[0091]

[0092] Among them, L 1σ , L 2σ is the leakage inductance of the original secondary winding, Φ 11σ is the leakage flux generated by the primary coil and coupled only to the primary coil, Φ 22σ is the leakage flux generated by the secondary coil and coupled only to the secondary coil, Ψ 11σ is the leakage flux generated by the primary coil and coupled only to the primary coil, Ψ 22σ is the leakage flux generated by the secondary coil and only coupled with the secondary coil.

[0093] The following is the derivation of the leakage inductance formula of the high-frequency transformer, taking the analysis of the primary side induced voltage as an example:

[0094]

[0095] Similarly, for the analysis of the secondary side induced voltage, it can be deduced that:

[0096]

[0097] Step 104, based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns, obtain the primary leakage inductance of the target high-frequency transformer; based on the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns, obtain the secondary leakage inductance of the target high-frequency transformer.

[0098] Exemplarily, from the above analysis, it can be seen that obtaining the primary leakage inductance of the target high-frequency transformer based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns may include:

[0099] Based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns, combined with the first formula, the primary leakage inductance of the target high-frequency transformer is obtained.

[0100] The first formula can be:

[0101]

[0102] Among them, L1 represents the primary equivalent inductance, N1 represents the number of turns of the primary winding, N2 represents the number of turns of the secondary winding, and M 21Represents coupled inductance, L 1σ Represents the primary leakage inductance of the target high-frequency transformer.

[0103] Exemplarily, from the above analysis, it can be seen that based on the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns, the secondary leakage inductance of the target high-frequency transformer can be obtained, which may include:

[0104] Based on the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns, combined with the second formula, the secondary leakage inductance of the target high-frequency transformer is obtained.

[0105] The second formula can be:

[0106]

[0107] Among them, L2 represents the equivalent inductance of the secondary side, N1 represents the number of turns of the primary winding, N2 represents the number of turns of the secondary winding, and M 12 Represents coupled mutual inductance, L 2σ Represents the secondary leakage inductance of the target high-frequency transformer.

[0108] The above-mentioned high-frequency transformer leakage inductance measurement method directly calculates the primary leakage inductance through the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns, and directly calculates the secondary leakage inductance through the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns. The leakage inductance of the high-frequency transformer is calculated in a way that the secondary leakage inductance is calculated. The steps are simple and can make the calculated leakage inductance closer to the true value. In addition, the primary equivalent inductance, the secondary equivalent inductance, the coupled inductance and the coupled mutual inductance are all data obtained after the rated excitation input. Some parameters will offset each other during the calculation process. Therefore, there is no need to consider the excitation source type of the rated excitation, so it has a wider applicability.

[0109] In order to facilitate the understanding of the present invention, the following will be combined with the accompanying drawings to clearly and completely describe the technical solution in the embodiment of the present invention. The experimental device of the present invention also includes an impedance analyzer and a wire. The specific experimental steps are as follows: Figure 2 , Figure 3 As shown:

[0110] (1) First, a mutual inductance equivalent circuit model is established based on the high-frequency transformer structure. The relationship between the primary and secondary equivalent inductances, coupled inductance, coupled mutual inductance and leakage inductance of the high-frequency transformer is derived using the flux linkage method combined with Faraday's law of electromagnetic induction equations.

[0111] (2) Measure the primary equivalent inductance of the high-frequency transformer prototype. Clamp the two voltage clamps of the impedance analyzer at 3 and 4, open the secondary 1 and 2, apply an excitation of the rated frequency of 10 kHz to the primary coil, and record the data at this time as L1 = 350.381 mH. Then repeat the steps to measure the equivalent inductance of the secondary coil to obtain L2 = 114.410 mH.

[0112] (2) Connect terminals 1 and 4 of the high-frequency transformer with a wire, clamp the voltage clamp of the impedance analyzer on terminals 2 and 3, apply 10kHz excitation, and measure the inductance value of the forward connection between the same-name ends of the primary winding and the secondary winding at this time. S1 = 865.195mH; connect terminals 2 and 4 of the high-frequency transformer with a wire, and use the impedance analyzer to apply rated frequency excitation to terminals 1 and 3. The measured inductance value of the reverse connection between the same-name ends of the primary winding and the secondary winding is S2 = 64.387mH. The coupled mutual inductance calculation formula M 12 =(S1-S2) / 4, the coupled mutual inductance M can be obtained 12 =200.202mH, transformation ratio k=1.75;

[0113] (3) Substituting the above measured data into the leakage inductance calculation formula derived in the present invention, the leakage inductance of the primary winding can be obtained as L 1σ =0.0275mH, the leakage inductance of the secondary winding is L 2σ =0.00886mH, the specific measurement data are shown in Table 1:

[0114] Table 1 Data measured in the experiment

[0115] <![CDATA[S1]]> <![CDATA[S2]]> <![CDATA[M 12 ]]> <![CDATA[L1]]> <![CDATA[L2]]> k 865.195mH 64.387mH 200.202mH 350.381mH 114.410mH 1.75

[0116] (4) Finally, a short-circuit test is performed on the high-frequency transformer prototype to verify the leakage inductance results of the primary and secondary sides of the high-frequency transformer obtained by the test method of the present invention. The equivalent leakage inductance converted to the primary side is measured by the short-circuit test as L 1σ +k 2 L 2σ =55.736μH, the leakage inductance of the primary and secondary sides calculated by the method of the present invention is converted to the leakage inductance of the primary side, and the result is 54.634μH, with an error of only 1.98%, which is within the allowable error range, and the accuracy and practicality of the method of the present invention can be verified.

[0117] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0118] Corresponding to the high-frequency transformer leakage inductance measurement method described in the above embodiment, Figure 2 A structural block diagram of a high-frequency transformer leakage inductance measurement device provided in an embodiment of the present application is shown. For ease of explanation, only the parts related to the embodiment of the present application are shown.

[0119] See also Figure 2 , the high-frequency transformer leakage inductance measurement device in the embodiment of the present application may include:

[0120] The first acquisition module 201 is used to acquire the number of primary winding turns, the number of secondary winding turns, the primary equivalent inductance and the secondary equivalent inductance of the target high-frequency transformer.

[0121] The second acquisition module 202 is used to connect the same-name ends of the primary winding and the secondary winding of the target high-frequency transformer in forward direction to obtain a first inductance; and to connect the same-name ends of the primary winding and the secondary winding of the target high-frequency transformer in reverse direction to obtain a second inductance.

[0122] The data calculation module 203 is used to obtain the coupled inductance and the coupled mutual inductance based on the first inductance and the second inductance.

[0123] The result output module 204 is used to obtain the primary leakage inductance of the target high-frequency transformer based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns; and to obtain the secondary leakage inductance of the target high-frequency transformer based on the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns.

[0124] Exemplarily, the result output module 204 may be used to:

[0125] Based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns, combined with the first formula, the primary leakage inductance of the target high-frequency transformer is obtained.

[0126] The first formula is:

[0127]

[0128] Among them, L1 represents the primary equivalent inductance, N1 represents the number of turns of the primary winding, N2 represents the number of turns of the secondary winding, and M 21 Represents coupled inductance, L 1σ Represents the primary leakage inductance of the target high-frequency transformer.

[0129] Exemplarily, the result output module 204 may be used to:

[0130] Based on the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns, combined with the second formula, the secondary leakage inductance of the target high-frequency transformer is obtained.

[0131] The second formula is:

[0132]

[0133] Among them, L2 represents the equivalent inductance of the secondary side, N1 represents the number of turns of the primary winding, N2 represents the number of turns of the secondary winding, and M 12 Represents coupled mutual inductance, L 2σ Represents the secondary leakage inductance of the target high-frequency transformer.

[0134] Exemplarily, the data calculation module 203 may be used to:

[0135] Based on the first inductance and the second inductance and in combination with the third formula, a coupled inductance is obtained.

[0136] The third formula is:

[0137]

[0138] Where, S1 represents the first inductor, S2 represents the second inductor, and M 21 Represents coupled inductance.

[0139] Exemplarily, the data calculation module 203 may be used to:

[0140] Based on the first inductance and the second inductance and in combination with the fourth formula, the coupled mutual inductance is obtained.

[0141] The fourth formula is:

[0142]

[0143] Where, S1 represents the first inductor, S2 represents the second inductor, and M 12 Represents coupled mutual inductance.

[0144] Exemplarily, the first acquisition module 201 may be used for:

[0145] Place the target high-frequency transformer on the test bench, connect the impedance analyzer to both ends of the primary coil, open the secondary coil, apply excitation of the rated frequency, and measure the primary equivalent inductance of the target high-frequency transformer.

[0146] Exemplarily, the first acquisition module 201 may be used for:

[0147] Place the target high-frequency transformer on the test bench, connect the impedance analyzer to both ends of the secondary coil, open the primary coil, apply excitation of the rated frequency, and measure the secondary equivalent inductance of the target high-frequency transformer.

[0148] Exemplarily, the second acquisition module 202 may be used for:

[0149] The same-name ends of the primary winding and the secondary winding of the target high-frequency transformer are connected in forward direction, and an impedance analyzer is used to apply excitation to the remaining two ends of the coil after the forward connection, so as to measure the first inductance after the primary coil and the secondary coil of the target high-frequency transformer are connected in forward direction.

[0150] Exemplarily, the second acquisition module 202 may be used for:

[0151] The same-name ends of the primary winding and the secondary winding of the target high-frequency transformer are reversely connected, and an impedance analyzer is used to apply excitation to the remaining two ends of the reversely connected coil to measure the second inductance after the primary coil and the secondary coil of the target high-frequency transformer are reversely connected.

[0152] It should be noted that the information interaction, execution process, etc. between the above-mentioned devices / units are based on the same concept as the method embodiment of the present application. Their specific functions and technical effects can be found in the method embodiment part and will not be repeated here.

[0153] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0154] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0155] Those of ordinary skill in the art will appreciate that the templates, units, and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0156] If the module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present invention implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, the steps of the above-mentioned various high-frequency transformer leakage inductance measurement method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device that can carry the computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory, random access memory, electrical carrier signal, telecommunication signal and software distribution medium.

[0157] The embodiments described above are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included in the protection scope of the present invention.

Claims

1. A method for measuring leakage inductance of a high-frequency transformer, characterized in that: include: Obtain the primary winding turns, secondary winding turns, primary equivalent inductance, and secondary equivalent inductance of the target high-frequency transformer; Connecting the same-named ends of the primary winding and the secondary winding of the target high-frequency transformer forward to obtain a first inductor; connecting the same-named ends of the primary winding and the secondary winding of the target high-frequency transformer reversely to obtain a second inductor; Based on the first inductance and the second inductance, a coupled inductance and a coupled mutual inductance are obtained; Based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns, the primary leakage inductance of the target high-frequency transformer is obtained; Based on the coupled mutual inductance, the number of turns of the primary winding, the secondary equivalent inductance and the number of turns of the secondary winding, the secondary leakage inductance of the target high-frequency transformer is obtained.

2. The method for measuring leakage inductance of a high-frequency transformer according to claim 1, characterized in that: The obtaining of the primary leakage inductance of the target high-frequency transformer based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns includes: Based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns, in combination with the first formula, the primary leakage inductance of the target high-frequency transformer is obtained; The first formula is: Wherein, L1 represents the primary equivalent inductance, N1 represents the number of turns of the primary winding, N2 represents the number of turns of the secondary winding, and M 21 represents the coupled inductance, L 1σ represents the primary leakage inductance of the target high-frequency transformer.

3. The method for measuring leakage inductance of a high-frequency transformer according to claim 1, characterized in that: The obtaining of the secondary leakage inductance of the target high-frequency transformer based on the coupled mutual inductance, the number of turns of the primary winding, the secondary equivalent inductance and the number of turns of the secondary winding includes: Based on the coupled mutual inductance, the number of primary winding turns, the secondary equivalent inductance and the number of secondary winding turns, combined with the second formula, the secondary leakage inductance of the target high-frequency transformer is obtained; The second formula is: Wherein, L2 represents the secondary equivalent inductance, N1 represents the number of turns of the primary winding, N2 represents the number of turns of the secondary winding, and M 12 represents the coupled mutual inductance, L 2σ represents the secondary leakage inductance of the target high-frequency transformer.

4. The method for measuring leakage inductance of a high-frequency transformer according to claim 1, characterized in that: The step of obtaining a coupled inductor based on the first inductor and the second inductor includes: Based on the first inductance and the second inductance, combined with a third formula, a coupled inductance is obtained; The third formula is: Wherein, S1 represents the first inductor, S2 represents the second inductor, M 21 represents the coupled inductance.

5. The method for measuring leakage inductance of a high-frequency transformer according to claim 1, characterized in that: The step of obtaining a coupled mutual inductance based on the first inductance and the second inductance includes: Based on the first inductance and the second inductance, combined with the fourth formula, a coupled mutual inductance is obtained; The fourth formula is: Wherein, S1 represents the first inductor, S2 represents the second inductor, M 12 represents the coupled mutual inductance.

6. The method for measuring leakage inductance of a high-frequency transformer according to claim 1, characterized in that: The obtaining of the primary equivalent inductance of the target high-frequency transformer includes: The target high-frequency transformer is placed on a test bench, an impedance analyzer is connected to both ends of the primary coil, the secondary coil is open-circuited, an excitation of rated frequency is applied, and the primary equivalent inductance of the target high-frequency transformer is measured.

7. The method for measuring leakage inductance of a high-frequency transformer according to claim 1, characterized in that: The obtaining of the secondary side equivalent inductance of the target high frequency transformer includes: The target high-frequency transformer is placed on a test bench, an impedance analyzer is connected to both ends of the secondary coil, the primary coil is open-circuited, an excitation of rated frequency is applied, and the secondary equivalent inductance of the target high-frequency transformer is measured.

8. The method for measuring leakage inductance of a high-frequency transformer according to claim 1, characterized in that: The step of connecting the primary winding of the target high-frequency transformer and the secondary winding of the target high-frequency transformer in forward direction to obtain a first inductor comprises: The same-name ends of the primary winding and the secondary winding of the target high-frequency transformer are connected in forward direction, and an impedance analyzer is used to apply excitation to the remaining two ends of the coil after the forward connection to measure the first inductance of the primary coil and the secondary coil of the target high-frequency transformer after the forward connection.

9. The method for measuring leakage inductance of a high-frequency transformer according to claim 1, characterized in that: The step of reversely connecting the primary winding and the secondary winding of the target high-frequency transformer to obtain a second inductor comprises: The same-name ends of the primary winding and the secondary winding of the target high-frequency transformer are reversely connected, and an impedance analyzer is used to apply excitation to the remaining two ends of the reversely connected coil to measure the second inductance after the primary coil and the secondary coil of the target high-frequency transformer are reversely connected.

10. A high-frequency transformer leakage inductance measurement device, characterized in that: include: A first acquisition module is used to acquire the number of primary winding turns, the number of secondary winding turns, the primary equivalent inductance and the secondary equivalent inductance of the target high-frequency transformer; A second acquisition module, used for connecting the primary winding and the secondary winding of the target high-frequency transformer in forward direction to obtain a first inductance; Connecting the primary winding and the secondary winding of the target high-frequency transformer in reverse order to obtain a second inductor; A data calculation module, used for obtaining a coupled inductance and a coupled mutual inductance based on the first inductance and the second inductance; A result output module, used for obtaining the primary leakage inductance of the target high-frequency transformer based on the coupled inductance, the number of primary winding turns, the primary equivalent inductance and the number of secondary winding turns; Based on the coupled mutual inductance, the number of turns of the primary winding, the secondary equivalent inductance and the number of turns of the secondary winding, the secondary leakage inductance of the target high-frequency transformer is obtained.

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