Method and device for determining magnetic characteristic information of nanocrystalline strip and processor

Abstract

The invention discloses a method and device for determining magnetic characteristic information of a nanocrystalline strip and a processor. The method comprises the following steps: acquiring non-sinusoidal excitation data for a nanocrystalline strip; decomposing the non-sine excitation data into a plurality of sine harmonic data; determining a plurality of equivalent magnetic circuit lengths based on the plurality of sine harmonic data; based on the multiple equivalent magnetic circuit lengths, magnetic characteristic information of the nanocrystalline strip is determined, and the magnetic characteristic information at least comprises magnetic characteristic information and / or magnetostriction characteristic information. The technical problem that the magnetic property of the nanocrystalline strip cannot be determined is solved.

Description

Technical Field

[0001] The present invention relates to the field of material science and technology, and in particular to a method, device and processor for determining magnetic property information of a nanocrystalline strip. Background Art

[0002] At present, high-frequency transformers, as key equipment in power electronic transformers, are widely used in medium and high voltage intelligent distribution networks with new energy access. However, large-capacity high-frequency transformers often work under non-sinusoidal excitation, and the vibration contains a large number of high-order harmonic components, which produces harsh high-frequency noise, causing serious negative impacts on the surrounding environment and the health of residents. Long-term vibration will also affect the reliability of the transformer itself and pose a threat to the safe and stable operation of the power system. After analysis, the magnetostriction of nanocrystalline strips is the main source of vibration and noise in the core of medium and high frequency transformers. Studying the magnetostriction characteristics of nanocrystalline strips at different temperatures is of great significance to reducing the vibration noise of medium and high frequency transformers.

[0003] In the related art, the ring sample measurement method can only measure the magnetic properties of standard-sized ring cores, while nanocrystalline cores have many shapes and sizes. Therefore, the ring sample measurement method is difficult to accurately reflect the magnetic properties of cores of different sizes, and the single-piece measurement method can only measure the magnetic properties under several hundred Hz sinusoidal excitation, which does not conform to the actual working conditions of nanocrystalline cores. When multiple nanocrystalline strips are pasted together to measure the magnetic properties and magnetostriction, the different thicknesses of the paste have a greater impact on the measurement results, and the optical sensor needs to add a reflective block when measuring magnetostriction. The additional mass of the reflective block will also have a greater impact on the measurement results. In addition, medium and high frequency transformers often work under non-sinusoidal excitation. The current measurement method is mainly concentrated under sinusoidal excitation, which does not conform to the actual working conditions of nanocrystalline strips. Therefore, there is a lack of methods that can accurately measure the magnetic properties and magnetostriction of nanocrystalline strips under non-sinusoidal excitation, and obtain the magnetic properties and magnetostriction properties of nanocrystalline strips under non-sinusoidal excitation. Therefore, there is a technical problem that the magnetic properties of nanocrystalline strips cannot be determined.

[0004] With respect to the above-mentioned technical problem of being unable to determine the magnetic properties of nanocrystalline strips, no effective solution has been proposed so far. Summary of the invention

[0005] The embodiments of the present invention provide a method, device and processor for determining the magnetic property information of a nanocrystalline ribbon, so as to at least solve the technical problem that the magnetic properties of the nanocrystalline ribbon cannot be determined.

[0006] According to one aspect of an embodiment of the present invention, a method for determining magnetic property information of a nanocrystalline strip is provided. The method may include: obtaining non-sinusoidal excitation data for the nanocrystalline strip; decomposing the non-sinusoidal excitation data into a plurality of sinusoidal harmonic data; determining a plurality of equivalent magnetic circuit lengths based on the plurality of sinusoidal harmonic data; determining magnetic property information of the nanocrystalline strip based on the plurality of equivalent magnetic circuit lengths, wherein the magnetic property information includes at least magnetic property information and / or magnetostrictive property information.

[0007] Optionally, based on multiple sinusoidal harmonic data, multiple equivalent magnetic circuit lengths are determined, including: obtaining the number of stacking sheets of the nanocrystalline strip, wherein the number of stacking sheets is used to indicate the number of nanocrystalline strips stacked together; based on the number of stacking sheets and multiple sinusoidal harmonic data, multiple equivalent magnetic circuit lengths are determined.

[0008] Optionally, based on the number of laminations and multiple sinusoidal harmonic data, multiple equivalent magnetic circuit lengths are determined, including: determining the magnetic circuit lengths and magnetic density peaks corresponding to the multiple sinusoidal harmonic data; inputting the magnetic circuit lengths, magnetic density peaks and number of laminations into an equivalent magnetic circuit length model for analysis to obtain multiple equivalent magnetic circuit lengths, wherein the equivalent magnetic circuit length model is a pre-set model for calculating the equivalent magnetic circuit length.

[0009] Optionally, based on multiple equivalent magnetic circuit lengths, the magnetic property information of the nanocrystalline strip is determined, including: obtaining coil data of the nanocrystalline strip, wherein the coil data is used to indicate data related to the coil of the nanocrystalline strip; inputting the coil data and the equivalent magnetic circuit length into a magnetic property model for analysis to obtain magnetic property information.

[0010] Optionally, based on multiple equivalent magnetic circuit lengths, the magnetic property information of the nanocrystalline strip is determined, including: obtaining sample data of the nanocrystalline strip, wherein the sample data is used to indicate data related to the sample; inputting the sample data and the equivalent magnetic circuit length into a magnetostrictive property model for analysis to obtain magnetostrictive property information.

[0011] Optionally, the method for determining the magnetic property information of the nanocrystalline strip further includes: visualizing the magnetic property information.

[0012] According to another aspect of an embodiment of the present invention, a device for determining magnetic property information of a nanocrystalline strip is also provided. The device may include: an acquisition unit for acquiring non-sinusoidal excitation data for the nanocrystalline strip; a decomposition unit for decomposing the non-sinusoidal excitation data into a plurality of sinusoidal harmonic data; a first determination unit for determining a plurality of equivalent magnetic circuit lengths based on the plurality of sinusoidal harmonic data; and a second determination unit for determining the magnetic property information of the nanocrystalline strip based on the plurality of equivalent magnetic circuit lengths, wherein the magnetic property information at least includes magnetic property information and / or magnetostrictive property information.

[0013] According to another aspect of an embodiment of the present invention, a computer-readable storage medium is also provided, the computer-readable storage medium including a stored program, wherein when the program is executed by a processor, the device where the storage medium is located is controlled to execute the method for determining the magnetic property information of the nanocrystalline strip in an embodiment of the present invention.

[0014] According to another aspect of an embodiment of the present invention, a processor is provided, which is used to run a program, wherein when the program is run, the method for determining the magnetic property information of the nanocrystalline ribbon in the embodiment of the present invention is executed.

[0015] According to another aspect of the present invention, a computer program product is provided, which includes computer instructions, and when the computer instructions are executed by a processor, the method for determining the magnetic property information of the nanocrystalline ribbon in the present invention is implemented.

[0016] In an embodiment of the present invention, non-sinusoidal excitation data for a nanocrystalline ribbon is obtained; the non-sinusoidal excitation data is decomposed into a plurality of sinusoidal harmonic data; a plurality of equivalent magnetic circuit lengths are determined based on the plurality of sinusoidal harmonic data; and the magnetic property information of the nanocrystalline ribbon is determined based on the plurality of equivalent magnetic circuit lengths, wherein the magnetic property information at least includes magnetic property information and / or magnetostrictive property information. In other words, the embodiment of the present invention determines the magnetic property information of the nanocrystalline ribbon by processing the non-sinusoidal excitation data of the nanocrystalline ribbon to determine the equivalent magnetic circuit length. This solves the technical problem of being unable to determine the magnetic properties of the nanocrystalline ribbon and achieves the technical effect of determining the magnetic properties of the nanocrystalline ribbon. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of this application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0018] Figure 1 is a flow chart of a method for determining magnetic property information of a nanocrystalline strip according to an embodiment of the present invention;

[0019] Figure 2 is a flow chart of a method for measuring magnetic properties and magnetostriction of a nanocrystalline ribbon according to an embodiment of the present invention;

[0020] Figure 3 is a schematic diagram of a magnetic property and magnetostriction measurement platform according to an embodiment of the present invention;

[0021] Figure 4 is a schematic diagram of a device for determining magnetic property information of a nanocrystalline strip according to an embodiment of the present invention. DETAILED DESCRIPTION

[0022] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0023] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, functional component or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, functional components or devices.

[0024] According to an embodiment of the present invention, an embodiment of a method for determining magnetic property information of a nanocrystalline strip is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0025] Figure 1 is a flow chart of a method for determining magnetic property information of a nanocrystalline strip according to an embodiment of the present invention. Figure 1 As shown, the method may include the following steps:

[0026] Step S101 : acquiring non-sinusoidal excitation data for a nanocrystalline ribbon.

[0027] In the technical solution provided in the above step S101 of the present invention, the non-sinusoidal excitation data may also be referred to as non-sinusoidal excitation.

[0028] In this embodiment, non-sinusoidal excitation data for nanocrystalline strips is obtained. For example, non-sinusoidal excitation is performed on nanocrystalline strips by designing experiments, applying pulse loading or other non-periodic loading methods, and obtaining corresponding non-sinusoidal excitation data through sensors. This is only an illustrative example, and the specific method for obtaining non-sinusoidal excitation data for nanocrystalline strips is not limited.

[0029] Step S102, decomposing the non-sinusoidal excitation data into a plurality of sinusoidal harmonic data.

[0030] In the technical solution provided in the above step S102 of the present invention, the sinusoidal harmonic data may also be referred to as a sinusoidal harmonic signal.

[0031] In this embodiment, after the non-sinusoidal excitation data for the nanocrystalline strip is acquired in step S101, the non-sinusoidal excitation data is decomposed into a plurality of sinusoidal harmonic data. For example, the non-sinusoidal excitation data is decomposed into a plurality of sinusoidal harmonic data using Fourier transform, which is only an illustrative example and does not limit the specific method of decomposing the non-sinusoidal excitation data.

[0032] For example, non-sinusoidal excitation is decomposed into a plurality of superpositioned sinusoidal harmonic signals according to Fourier transform, the number of decomposed harmonics is determined by the harmonic frequency, and the maximum harmonic frequency is less than 20 kHz.

[0033] Step S103, determining a plurality of equivalent magnetic circuit lengths based on a plurality of sinusoidal harmonic data.

[0034] In the technical solution provided in the above step S103 of the present invention, after the non-sinusoidal excitation data is decomposed into a plurality of sinusoidal harmonic data in step S102, a plurality of equivalent magnetic circuit lengths are determined according to the plurality of sinusoidal harmonic data.

[0035] In this embodiment, a plurality of equivalent magnetic circuit lengths are determined using an equivalent magnetic circuit length formula.

[0036] For example, the equivalent magnetic path length formula can be expressed using the following formula (1):

[0037] l m_s =l1(n,B 1p )+l2(n,B 2p )+…+l m (n,B mp )+l c (n,B0) (1)

[0038] Among them, l m_s Indicates the equivalent magnetic path length of the measuring strip, l m represents the magnetic path length corresponding to the mth sinusoidal harmonic (the mth harmonic frequency is less than 20kHz), n represents the number of strip laminations, B mp represents the peak value of the magnetic density of the mth harmonic, l c It indicates the magnetic path length corresponding to the frequency exceeding 20kHz, at which time the peak magnetic flux density is the saturation magnetic flux density of the nanocrystalline ribbon.

[0039] Step S104, determining magnetic property information of the nanocrystalline ribbon based on a plurality of equivalent magnetic path lengths.

[0040] In the technical solution provided in the above step S104 of the present invention, the magnetic property information at least includes magnetic property information and / or magnetostrictive property information.

[0041] In this embodiment, after determining a plurality of equivalent magnetic path lengths in step S103, the magnetic characteristic information of the nanocrystalline strip is determined according to the plurality of equivalent magnetic path lengths. For example, the excitation current i in the excitation coil is obtained. s (t), thereby determining the magnetic property information of the nanocrystalline ribbon according to the excitation current and the equivalent magnetic circuit length. This is only an illustrative example and does not limit the specific method for determining the magnetic property information of the nanocrystalline ribbon.

[0042] For example, measuring the excitation current i in the excitation coil s (t), determine the magnetic field strength H under non-sinusoidal excitation t_s (t) is shown in the following formula (2):

[0043] N1i s (t) = H t_s (t)l m_s +ΔH s (t)l δ (2)

[0044] Where, N1 represents the number of turns of the excitation winding, i s (t) represents the excitation current, l m_s Denotes the equivalent magnetic circuit length under non-sinusoidal excitation, ΔH s (t) represents the field strength difference between the air gap and the sample under non-sinusoidal excitation, l δ Indicates the air gap length.

[0045] For another example, the laser vibrometer measures the vibration velocity of the sample, and the relative displacement ΔL of the strip along the magnetization direction is obtained by integration. Considering the influence of the weight of the reflective sheet, the magnetostriction coefficient λ is obtained, as shown in the following formula (3):

[0046]

[0047] Among them, M F Indicates the quality of the reflective sheet, M T Indicates the mass of the sample to be tested, l m represents the equivalent magnetic circuit length, ΔL represents the relative displacement, and L represents the strip length.

[0048] It should be noted that the above embodiments can be implemented through a magnetic property and magnetostriction measurement platform.

[0049] In the above steps S101 to S104 of the present invention, non-sinusoidal excitation data for nanocrystalline ribbons are obtained; the non-sinusoidal excitation data are decomposed into multiple sinusoidal harmonic data; multiple equivalent magnetic circuit lengths are determined based on the multiple sinusoidal harmonic data; and the magnetic property information of the nanocrystalline ribbon is determined based on the multiple equivalent magnetic circuit lengths, wherein the magnetic property information at least includes magnetic property information and / or magnetostrictive property information. In other words, the embodiment of the present invention determines the equivalent magnetic circuit length by processing the non-sinusoidal excitation data of the nanocrystalline ribbon, thereby determining the magnetic property information of the nanocrystalline ribbon. This solves the technical problem of being unable to determine the magnetic properties of the nanocrystalline ribbon, and achieves the technical effect of determining the magnetic properties of the nanocrystalline ribbon.

[0050] The above method of this embodiment is further introduced below.

[0051] As an optional implementation method, multiple equivalent magnetic path lengths are determined based on multiple sinusoidal harmonic data, including: obtaining the number of stacking sheets of the nanocrystalline strip, wherein the number of stacking sheets is used to indicate the number of nanocrystalline strips stacked together; and determining multiple equivalent magnetic path lengths based on the number of stacking sheets and multiple sinusoidal harmonic data.

[0052] In this embodiment, the number of stacked sheets of the nanocrystalline ribbon is obtained, where the number of stacked sheets can be represented by n.

[0053] Optionally, multiple equivalent magnetic circuit lengths are determined according to the number of laminations and multiple sinusoidal harmonic data. The specific method for determining the equivalent magnetic circuit length is shown in the above formula (1), which will not be repeated here.

[0054] Optionally, by considering the relationship between the effective magnetic path length under non-sinusoidal excitation and the magnetic density and the number of strips, the effective magnetic path length of different numbers of strips at different magnetic densities under non-sinusoidal excitation can be more accurately calculated, and then the magnetic field strength in the strip can be accurately calculated.

[0055] As an optional implementation method, multiple equivalent magnetic circuit lengths are determined based on the number of laminations and multiple sinusoidal harmonic data, including: determining the magnetic circuit length and magnetic density peak value corresponding to the multiple sinusoidal harmonic data; inputting the magnetic circuit length, magnetic density peak value and number of laminations into an equivalent magnetic circuit length model for analysis to obtain multiple equivalent magnetic circuit lengths, wherein the equivalent magnetic circuit length model is a pre-set model for calculating the equivalent magnetic circuit length.

[0056] In this embodiment, the magnetic path length and the magnetic density peak value corresponding to the plurality of sinusoidal harmonic data are determined. The magnetic path length can be calculated using l m To express it, the peak magnetic density can be expressed as B mp To express.

[0057] Optionally, the magnetic circuit length, the peak value of the magnetic density and the number of laminations are input into an equivalent magnetic circuit length model for analysis to obtain multiple equivalent magnetic circuit lengths. The equivalent magnetic circuit length model can be expressed as the aforementioned formula (1), which will not be described in detail here.

[0058] Optionally, by inputting the magnetic circuit lengths and magnetic density peaks corresponding to a plurality of sinusoidal harmonic data, the performance of the magnetic circuit can be analyzed more accurately, thereby improving the accuracy of the analysis results.

[0059] As an optional implementation method, the magnetic property information of the nanocrystalline strip is determined based on multiple equivalent magnetic circuit lengths, including: obtaining coil data of the nanocrystalline strip, wherein the coil data is used to indicate data related to the coil of the nanocrystalline strip; inputting the coil data and the equivalent magnetic circuit length into a magnetic property model for analysis to obtain magnetic property information.

[0060] In this embodiment, coil data of the nanocrystalline ribbon is obtained, wherein the coil data may at least include but is not limited to: the number of turns B of the coil, the cross-sectional area A of the sample, and the induced voltage U2(t) of the B coil.

[0061] Optionally, the coil data and the equivalent magnetic circuit length are input into a magnetic property model for analysis to obtain magnetic property information. The magnetic property information may include the magnetic polarization intensity J s (t) and magnetic field strength H t_s (t).

[0062] For example, the magnetic polarization intensity J s (t) can be calculated using the following formula (4):

[0063]

[0064] Among them, J s (t) is the magnetic polarization intensity, N2 is the number of turns of coil B, A is the cross-sectional area of ​​the sample, and U2(t) is the induced voltage of coil B.

[0065] As an optional implementation method, the magnetic property information of the nanocrystalline strip is determined based on multiple equivalent magnetic circuit lengths, including: obtaining sample data of the nanocrystalline strip, wherein the sample data is used to indicate data related to the sample; inputting the sample data and the equivalent magnetic circuit length into a magnetostrictive property model for analysis to obtain magnetostrictive property information.

[0066] In this embodiment, sample data of the nanocrystalline ribbon is obtained. The sample data may at least include but is not limited to: reflective sheet quality M F 、The mass of the sample to be tested M T .

[0067] Optionally, the sample data and the equivalent magnetic circuit length are input into a magnetostrictive characteristic model for analysis to obtain magnetostrictive characteristic information, wherein the magnetostrictive characteristic information can also be expressed as magnetostriction λ.

[0068] For example, a laser vibrometer measures the vibration velocity of the sample, and the relative displacement ΔL of the strip along the magnetization direction is obtained by integration. Considering the influence of the weight of the reflective sheet, the magnetostriction coefficient λ is obtained as shown in the above formula (3), which will not be repeated here.

[0069] As an optional embodiment, the method for determining the magnetic property information of the nanocrystalline strip further includes: visualizing the magnetic property information.

[0070] In this embodiment, the magnetic property information is visualized, for example, the magnetic property information is plotted as a curve.

[0071] For example, on the host computer, the hysteresis loop and magnetization curve are obtained according to the magnetic polarization intensity and magnetic field intensity of the strip under non-sinusoidal excitation, and the magnetostriction butterfly curve and magnetostriction single value curve are obtained according to the magnetic polarization intensity and magnetostriction, and the spectrum diagram of magnetostriction is displayed.

[0072] It should be noted that the above embodiments can be implemented through a magnetic property and magnetostriction measurement platform.

[0073] In this embodiment, non-sinusoidal excitation data for nanocrystalline ribbons are obtained; the non-sinusoidal excitation data are decomposed into multiple sinusoidal harmonic data; multiple equivalent magnetic circuit lengths are determined based on the multiple sinusoidal harmonic data; and the magnetic property information of the nanocrystalline ribbons is determined based on the multiple equivalent magnetic circuit lengths, wherein the magnetic property information at least includes magnetic property information and / or magnetostrictive property information. That is, the embodiment of the present invention determines the equivalent magnetic circuit length by processing the non-sinusoidal excitation data of the nanocrystalline ribbons, thereby determining the magnetic property information of the nanocrystalline ribbons. This solves the technical problem of being unable to determine the magnetic properties of the nanocrystalline ribbons, and achieves the technical effect of determining the magnetic properties of the nanocrystalline ribbons.

[0074] The technical solution of the embodiment of the present invention is illustrated below in conjunction with preferred implementation modes.

[0075] At present, high-frequency transformers, as key equipment in power electronic transformers, are widely used in medium and high voltage intelligent distribution networks with new energy access. However, large-capacity high-frequency transformers often work under non-sinusoidal excitation, and the vibration contains a large number of high-order harmonic components, which produces harsh high-frequency noise, causing serious negative impacts on the surrounding environment and the health of residents. Long-term vibration will also affect the reliability of the transformer itself and pose a threat to the safe and stable operation of the power system. After analysis, the magnetostriction of nanocrystalline strips is the main source of vibration and noise in the core of medium and high frequency transformers. Studying the magnetostriction characteristics of nanocrystalline strips at different temperatures is of great significance to reducing the vibration noise of medium and high frequency transformers.

[0076] In the related art, the ring sample measurement method can only measure the magnetic properties of standard-sized ring cores, while nanocrystalline cores have many shapes and sizes. Therefore, the ring sample measurement method is difficult to accurately reflect the magnetic properties of different sizes and cores, and the single-piece measurement method can only measure the magnetic properties under several hundred Hz sinusoidal excitation, which does not conform to the actual working conditions of nanocrystalline cores. When multiple nanocrystalline strips are pasted together to measure the magnetic properties and magnetostriction, the different thicknesses of the pasting have a greater impact on the measurement results, and the optical sensor needs to add a reflective block when measuring magnetostriction. The additional mass of the reflective block will also have a greater impact on the measurement results. In addition, medium and high frequency transformers often work under non-sinusoidal excitation. The current measurement method is mainly concentrated under sinusoidal excitation, which does not conform to the actual working conditions of nanocrystalline strips. Therefore, there is a lack of methods that can accurately measure the magnetic properties and magnetostriction of nanocrystalline strips under non-sinusoidal excitation, and obtain the magnetic properties and magnetostriction properties of nanocrystalline strips under non-sinusoidal excitation. Therefore, there is a technical problem that the magnetic properties of nanocrystalline strips cannot be determined. In view of the above-mentioned technical problem that the magnetic properties of nanocrystalline strips cannot be determined, no effective solution has been proposed.

[0077] However, the embodiment of the present invention proposes a method for measuring the magnetic properties and magnetostriction of nanocrystalline strips. By determining the expression of the equivalent magnetic path length under sinusoidal excitation, the non-sinusoidal excitation is decomposed into multiple sinusoidal harmonic signal superpositions according to Fourier transform, thereby determining the magnetic polarization intensity, magnetic field intensity and magnetostriction under non-sinusoidal excitation, and then the hysteresis loop and magnetization curve are obtained by drawing the magnetic polarization intensity and magnetic field intensity of the strip under non-sinusoidal excitation on the host computer, and the magnetostriction butterfly curve and magnetostriction single value curve are obtained by drawing the magnetic polarization intensity and magnetostriction, and the magnetostriction spectrum diagram is displayed. The technical problem of being unable to determine the magnetic properties of nanocrystalline strips is solved, and the technical effect of determining the magnetic properties of nanocrystalline strips is achieved.

[0078] The embodiments of the present invention are further described below.

[0079] Figure 2FIG. 1 is a flow chart of a method for measuring magnetic properties and magnetostriction of a nanocrystalline ribbon according to an embodiment of the present invention. Figure 2 As shown, the magnetic property and magnetostriction measurement method includes the following steps:

[0080] Step S201, determining an expression for the equivalent magnetic circuit length under sinusoidal excitation.

[0081] In this embodiment, a nanocrystalline alloy strip is placed in a permeameter, a sinusoidal excitation is applied through an excitation coil, and the induced voltage U on the H coil is measured. H (t), the magnetic field intensity H(t) passing through the strip is calculated as follows:

[0082]

[0083] Where H(t) is the magnetic field strength, μ0 is the magnetic permeability in vacuum, N H A H is the turn area of ​​coil H.

[0084] Optionally, the excitation current i(t) in the excitation coil is measured, and according to the conservation of magnetomotive force, the equivalent magnetic path length l is obtained. m As shown in the following formula (6):

[0085] N1i(t)=H t (t)l m +ΔH(t)l δ (6)

[0086] Where, N1 is the number of turns of the excitation winding, i(t) is the excitation current, l m is the equivalent magnetic circuit length, ΔH is the field strength difference between the air gap and the sample, l δ is the air gap length.

[0087] Optionally, the number of strip laminations is changed to obtain the equivalent magnetic path length corresponding to different numbers of strip laminations, and the magnetic flux density of the strip is changed by changing the excitation voltage amplitude to obtain the equivalent magnetic path length corresponding to different magnetic flux densities. The polynomial fitting obtains the relationship between the equivalent magnetic path length, the number of laminations n, and the peak magnetic flux density B. p The relationship l m =f(n,B p ).

[0088] Optionally, sinusoidal excitation refers to a method of using a sinusoidal signal as an input excitation in signal processing or system analysis. Sinusoidal excitation is usually used to test the frequency response characteristics of a system. By inputting sinusoidal signals of different frequencies, the response of the system at different frequencies can be obtained. Sinusoidal excitation is also commonly used in applications such as spectrum analysis and filter design in signal processing.

[0089] Step S202: decompose the non-sinusoidal excitation into a plurality of superposition sinusoidal harmonic signals according to Fourier transform.

[0090] In this embodiment, the non-sinusoidal excitation is decomposed into a plurality of superpositioned sinusoidal harmonic signals according to Fourier transform, the decomposed harmonic order is determined by the harmonic frequency, and the maximum harmonic frequency is less than 20 kHz.

[0091] Optionally, by measuring the magnetic properties and magnetostrictive properties of nanocrystalline ribbons under non-sinusoidal excitations such as the superposition of multiple harmonics or square waves, the foundation is laid for clarifying the vibration noise mechanism of high-frequency transformers made of nanocrystalline cores.

[0092] Alternatively, non-sinusoidal excitation refers to the process of using other waveforms or signals other than sine waves to excite a signal or circuit. Non-sinusoidal excitation is often used in the field of test and measurement to verify the performance of a circuit or system under different operating conditions.

[0093] Optionally, common non-sinusoidal excitations include square waves, pulse waves, triangle waves, etc. These waveforms can be used to simulate various signals and interferences in the real world, helping engineers to more comprehensively evaluate the performance and robustness of circuits or systems.

[0094] Alternatively, non-sinusoidal excitation is also commonly used in audio systems, for example, using various music signals or noise signals to test the performance of audio devices such as speakers and headphones. This method can more realistically simulate various audio signals that may be encountered in actual use, helping users better select and use equipment.

[0095] Step S203, determining the equivalent magnetic circuit length under non-sinusoidal excitation.

[0096] In this embodiment, as shown in the above formula (1), the equivalent magnetic path length l under non-sinusoidal excitation is determined as m_s . m is the magnetic path length corresponding to the mth sinusoidal harmonic (the mth harmonic frequency is less than 20kHz), n is the number of strip laminations, B mp is the peak value of the magnetic density of the mth harmonic, l c It is the magnetic path length corresponding to the frequency exceeding 20kHz, at which point the peak magnetic flux density is the saturation magnetic flux density of the nanocrystalline ribbon.

[0097] Optionally, the relationship between the effective magnetic path length under non-sinusoidal excitation, the magnetic density and the number of strips can more accurately calculate the effective magnetic path length under non-sinusoidal excitation with different numbers of strips at different magnetic densities, and then accurately calculate the magnetic field strength in the strip.

[0098] Optionally, the equivalent magnetic circuit length refers to the length of the magnetic flux transfer path considered in the magnetic circuit. In the magnetic circuit, the magnetic field can be transmitted along different paths, and the equivalent magnetic circuit length refers to an effective length obtained by comprehensively considering the lengths of all paths, which is used to calculate the magnetic resistance and reluctance ratio of the magnetic circuit. The size of the equivalent magnetic circuit length depends on the structure of the magnetic circuit and the distribution of the magnetic field. Usually, by analyzing and calculating the magnetic circuit, the equivalent length of the magnetic circuit can be determined, so as to more accurately describe the characteristics and performance of the magnetic circuit.

[0099] Step S204: applying a non-sinusoidal excitation voltage to the excitation coil.

[0100] In this embodiment, the nanocrystalline alloy strip to be tested is placed in the permeameter, and one end of the strip is fixed while the other end is free to expand and contract. A reflective sheet with good reflectivity is pasted in the rolling direction of the strip, and a non-sinusoidal excitation voltage is applied to the excitation coil.

[0101] Optionally, an excitation coil is a device for generating a magnetic field, usually consisting of a wire wound on an insulating material. When current passes through the excitation coil, a magnetic field is generated around it, so that objects in the space surrounded by the coil are affected by the magnetic field. Excitation coils are commonly used in devices such as electromagnetic induction, transformers, generators and motors to generate, transmit and control magnetic fields.

[0102] Optionally, the nanocrystalline alloy strip is an alloy strip material with a nanocrystalline structure. The nanocrystalline structure means that the grain size of the material is at the nanometer level, usually less than 100 nanometers. This structure makes the material have excellent properties, such as high strength, high hardness, good wear resistance and corrosion resistance.

[0103] Step S205, determining the magnetic polarization intensity under non-sinusoidal excitation.

[0104] In this embodiment, the magnetic polarization intensity under non-sinusoidal excitation is determined as shown in the above formula (4).

[0105] Alternatively, magnetic polarization refers to the sum of magnetic moments per unit volume, usually represented by a vector M, with units of ampere per meter (A / m). Magnetic polarization can represent the responsiveness of a material under an external magnetic field, and is one of the important parameters of a material's magnetic properties. Its magnitude depends on the material's magnetic properties and the strength of the external magnetic field.

[0106] Step S206, determining the magnetic field strength under non-sinusoidal excitation.

[0107] In this embodiment, the magnetic field strength under non-sinusoidal excitation is determined as shown in the above formula (2).

[0108] Optionally, magnetic field strength is a physical quantity that describes the strength of a magnetic field, usually represented by the symbol H, and the unit is ampere per meter (A / m). Magnetic field strength refers to the force per unit length in a magnetic field, and is a representation of the magnetic induction strength in a magnetic field. In a magnetic field, the magnetic field force exerted on an object is proportional to the magnetic field strength, that is, F=H*l, where F is the magnetic field force exerted on the object, H is the magnetic field strength, and l is the length of the object in the magnetic field. The magnitude of the magnetic field strength is related to factors such as the magnetic induction strength and magnetic permeability in the magnetic field.

[0109] Step S207, determining magnetostriction under non-sinusoidal excitation.

[0110] In this embodiment, magnetostriction under non-sinusoidal excitation is determined as shown in the aforementioned formula (3).

[0111] Alternatively, magnetostriction refers to the phenomenon that a material deforms under the action of an external magnetic field. When a material is in an external magnetic field, the magnetic field causes the magnetic moments inside the material to rearrange, thereby producing a magnetostrictive effect. This effect is common in ferromagnetic materials such as iron, nickel, cobalt, etc. Under the action of an external magnetic field, these materials will deform, that is, they will stretch or shrink in the direction of the magnetic field.

[0112] Alternatively, the magnetostrictive effect has a wide range of applications in engineering and science, such as in electromagnetic actuators, precision instruments, and magnetic material preparation. By controlling the magnitude and direction of the applied magnetic field, precise control of material deformation can be achieved, thereby realizing some specific functions, such as precision displacement control, sensors, etc.

[0113] Optionally, on the host computer, a hysteresis loop and a magnetization curve are obtained according to the magnetic polarization intensity and magnetic field intensity of the strip under non-sinusoidal excitation, a magnetostrictive butterfly curve and a magnetostrictive single-value curve are obtained according to the magnetic polarization intensity and magnetostriction, and a spectrum diagram of magnetostriction is displayed.

[0114] Optionally, since the nanocrystalline strip is very thin and light, when the present invention uses a laser vibrometer to measure the magnetostriction of the strip, the mass influence of the reflective block is taken into consideration and the measured vibration velocity is corrected to achieve accurate measurement of the magnetostriction of the strip.

[0115] Figure 3 FIG. 1 is a schematic diagram of a magnetic property and magnetostriction measurement platform according to an embodiment of the present invention. Figure 3 As shown, the magnetic property and magnetostriction measurement platform 300 includes: a power supply 301 , a laser vibrometer 302 , a permeometer 303 , a voltage probe 304 , a host computer 305 and a current probe 306 .

[0116] In this embodiment, the power supply 301 is composed of a programmable arbitrary waveform amplifier 3013 and a power amplifier 3012 , and is used to provide the required excitation to the permeometer 303 .

[0117] Optionally, the laser vibrometer 302 obtains the magnetostrictive length by measuring the vibration velocity of the sample.

[0118] Optionally, the permeameter 303 mainly includes a yoke 3031 and a coil. The sample to be tested is placed in the middle of the coil frame. Two layers of coils are wound around the coil frame. The outer layer is an excitation coil 3032 (also called a primary coil), and the inner layer is a B coil 3033. In addition, a group of H coils 3034 are placed on the coil frame near the lower surface of the sample. The yoke 3031 mainly provides a closed magnetic circuit structure for the test sample, and the coil is mainly used for excitation and measurement. The current probe 306 is used to measure the excitation current, and the voltage probe 304 is used to measure the induced voltage of the B coil 3033 and the H coil 3034. The whole set of equipment works on a suspended working platform.

[0119] Optionally, the host computer 305 processes the collected signals to obtain a hysteresis loop and a magnetization curve, a magnetostrictive butterfly curve and a magnetostrictive single value curve.

[0120] In this embodiment, by determining the expression of the equivalent magnetic circuit length under sinusoidal excitation, the non-sinusoidal excitation is decomposed into multiple sinusoidal harmonic signal superpositions according to Fourier transform, so as to determine the magnetic polarization intensity, magnetic field intensity and magnetostriction under non-sinusoidal excitation, and then the hysteresis loop and magnetization curve are obtained by drawing the magnetic polarization intensity and magnetic field intensity of the strip under non-sinusoidal excitation on the host computer, and the magnetostriction butterfly curve and magnetostriction single value curve are obtained by drawing the magnetic polarization intensity and magnetostriction, and the spectrum diagram of magnetostriction is displayed. The technical problem of being unable to determine the magnetic properties of nanocrystalline strips is solved, and the technical effect of determining the magnetic properties of nanocrystalline strips is achieved.

[0121] According to an embodiment of the present invention, a device for determining magnetic property information of a nanocrystalline strip is also provided. It should be noted that the device for determining magnetic property information of a nanocrystalline strip can be used to execute the method for determining magnetic property information of a nanocrystalline strip in the method embodiment.

[0122] Figure 4 Schematic diagram of a device for determining magnetic property information of a nanocrystalline strip according to an embodiment of the present invention. Figure 4 As shown, the device 400 for determining the magnetic property information of the nanocrystalline strip may include: an acquisition unit 401 , a decomposition unit 402 , a first determination unit 403 and a second determination unit 404 .

[0123] The acquisition unit 401 is used to acquire non-sinusoidal excitation data for the nanocrystalline ribbon.

[0124] The decomposition unit 402 is used to decompose the non-sinusoidal excitation data into a plurality of sinusoidal harmonic data.

[0125] The first determining unit 403 is used to determine a plurality of equivalent magnetic circuit lengths based on a plurality of sinusoidal harmonic data.

[0126] The second determining unit 404 is used to determine the magnetic property information of the nanocrystalline ribbon based on a plurality of equivalent magnetic path lengths, wherein the magnetic property information at least includes magnetic property information and / or magnetostrictive property information.

[0127] Optionally, the first determination unit 402 may include: a first acquisition module, used to obtain the number of stacking sheets of the nanocrystalline strip, wherein the number of stacking sheets is used to indicate the number of nanocrystalline strips stacked together; a first determination module, used to determine multiple equivalent magnetic circuit lengths based on the number of stacking sheets and multiple sinusoidal harmonic data.

[0128] Optionally, the first determination module may include: a determination submodule, used to determine the magnetic circuit length and magnetic density peak value corresponding to multiple sinusoidal harmonic data; an analysis submodule, used to input the magnetic circuit length, magnetic density peak value and number of laminations into an equivalent magnetic circuit length model for analysis to obtain multiple equivalent magnetic circuit lengths, wherein the equivalent magnetic circuit length model is a pre-set model for calculating the equivalent magnetic circuit length.

[0129] Optionally, the second determination unit 404 may include: a second acquisition module, used to acquire coil data of the nanocrystalline strip, wherein the coil data is used to indicate data related to the coil of the nanocrystalline strip; and a first analysis module, used to input the coil data and the equivalent magnetic circuit length into a magnetic property model for analysis to obtain magnetic property information.

[0130] Optionally, the second determination unit 404 may include: a third acquisition module, used to acquire sample data of the nanocrystalline strip, wherein the sample data is used to indicate data related to the sample; and a second analysis module, used to input the sample data and the equivalent magnetic circuit length into a magnetostrictive characteristic model for analysis to obtain magnetostrictive characteristic information.

[0131] Optionally, the device 400 for determining the magnetic property information of the nanocrystalline strip may further include: a visualization unit for visualizing the magnetic property information.

[0132] In this embodiment, non-sinusoidal excitation data for nanocrystalline ribbons are obtained; the non-sinusoidal excitation data are decomposed into multiple sinusoidal harmonic data; multiple equivalent magnetic circuit lengths are determined based on the multiple sinusoidal harmonic data; and the magnetic property information of the nanocrystalline ribbons is determined based on the multiple equivalent magnetic circuit lengths, wherein the magnetic property information at least includes magnetic property information and / or magnetostrictive property information. That is, the embodiment of the present invention determines the equivalent magnetic circuit length by processing the non-sinusoidal excitation data of the nanocrystalline ribbons, thereby determining the magnetic property information of the nanocrystalline ribbons. This solves the technical problem of being unable to determine the magnetic properties of the nanocrystalline ribbons, and achieves the technical effect of determining the magnetic properties of the nanocrystalline ribbons.

[0133] According to an embodiment of the present invention, a computer-readable storage medium is further provided. The storage medium includes a stored program, wherein the program executes the method for determining the magnetic property information of the nanocrystalline ribbon in the method embodiment.

[0134] According to an embodiment of the present invention, a processor is further provided. The processor is used to run a program. When the program is run, the method for determining the magnetic property information of the nanocrystalline strip in the method embodiment is executed.

[0135] According to an embodiment of the present invention, a computer program product is further provided. The computer program product includes computer instructions. When the computer instructions are executed by a processor, the method for determining magnetic property information of a nanocrystalline ribbon in the method embodiment is implemented.

[0136] The serial numbers of the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0137] In the above embodiments of the present invention, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0138] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the device embodiments described above are only schematic. For example, the division of units can be a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, which can be electrical or other forms.

[0139] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed over multiple units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0140] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0141] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent functional component, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software functional component, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, server or network device, etc.) to perform all or part of the steps of the methods of each embodiment of the present invention. The aforementioned storage medium includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, disk or optical disk, etc., which can store program codes.

[0142] The above are only preferred embodiments of the present invention. It should be pointed out that, for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.

Claims

1. A method for determining magnetic property information of a nanocrystalline strip, characterized in that: include: Acquiring non-sinusoidal excitation data for nanocrystalline ribbons; Decomposing the non-sinusoidal excitation data into a plurality of sinusoidal harmonic data; Determining a plurality of equivalent magnetic circuit lengths based on the plurality of sinusoidal harmonic data; Based on the multiple equivalent magnetic path lengths, magnetic property information of the nanocrystalline ribbon is determined, wherein the magnetic property information at least includes magnetic property information and / or magnetostrictive property information.

2. The method according to claim 1, characterized in that Based on the plurality of sinusoidal harmonic data, a plurality of equivalent magnetic path lengths are determined, comprising: Obtaining the number of stacked sheets of the nanocrystalline ribbon, wherein the number of stacked sheets is used to indicate the number of nanocrystalline ribbons stacked together; Based on the number of laminations and the plurality of sinusoidal harmonic data, a plurality of equivalent magnetic path lengths are determined.

3. The method according to claim 2, characterized in that Based on the number of laminations and the plurality of sinusoidal harmonic data, determining a plurality of equivalent magnetic path lengths, comprising: Determine the magnetic path length and magnetic density peak value corresponding to the plurality of sinusoidal harmonic data; The magnetic circuit length, the magnetic density peak value and the number of laminations are input into an equivalent magnetic circuit length model for analysis to obtain a plurality of equivalent magnetic circuit lengths, wherein the equivalent magnetic circuit length model is a pre-set model for calculating the equivalent magnetic circuit length.

4. The method according to claim 1, characterized in that: Determining the magnetic property information of the nanocrystalline ribbon based on the multiple equivalent magnetic path lengths includes: Acquiring coil data of the nanocrystalline ribbon, wherein the coil data is used to indicate data related to the coil of the nanocrystalline ribbon; The coil data and the equivalent magnetic circuit length are input into a magnetic property model for analysis to obtain the magnetic property information.

5. The method according to claim 1, characterized in that Determining the magnetic property information of the nanocrystalline ribbon based on the multiple equivalent magnetic path lengths includes: Acquiring sample data of the nanocrystalline strip, wherein the sample data is used to indicate data related to the sample; The sample data and the equivalent magnetic circuit length are input into a magnetostrictive characteristic model for analysis to obtain the magnetostrictive characteristic information.

6. The method according to any one of claims 1 to 5, characterized in that: The method further comprises: The magnetic property information is visualized.

7. A device for determining magnetic property information of a nanocrystalline strip, characterized in that: include: An acquisition unit, used for acquiring non-sinusoidal excitation data for the nanocrystalline ribbon; A decomposition unit, used for decomposing the non-sinusoidal excitation data into a plurality of sinusoidal harmonic data; A first determining unit, configured to determine a plurality of equivalent magnetic circuit lengths based on the plurality of sinusoidal harmonic data; The second determining unit is used to determine the magnetic property information of the nanocrystalline strip based on the multiple equivalent magnetic path lengths, wherein the magnetic property information at least includes magnetic property information and / or magnetostrictive property information.

8. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes a stored program, wherein when the program is executed by a processor, the device where the storage medium is located is controlled to execute the method according to any one of claims 1 to 6.

9. A processor, characterized in that: The processor is used to run a program, wherein the program executes the method according to any one of claims 1 to 6 when running.

10. A computer program product, characterized in that The computer program product comprises computer instructions, which implement the method according to any one of claims 1 to 6 when executed by a processor.

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