Rift valley identification method and device, electronic equipment and storage medium

Abstract

The invention discloses a rift valley identification method and device, electronic equipment and a storage medium. Diffracted wave imaging is carried out on the stratum to be identified, and a diffracted wave imaging result is obtained; judging whether a vertical section exists in a diffracted wave imaging result or not; and if it is determined that at least one vertical section exists in the diffracted wave imaging result, determining the position of a rift valley according to the position of the vertical section. The diffracted wave imaging result and the reflected wave imaging result are compared and analyzed, and the spatial distribution position of rift valleys possibly existing on the deep metamorphic rock substrate is determined. The method overcomes the problem that the prior art cannot distinguish the'illusion 'of rift valleys and multiples in stratified reflection of the deep metamorphic rock base strata, and improves the accuracy of judging the rift valleys in the deep metamorphic rock base strata.

Description

Technical Field

[0001] The present invention relates to the field of geophysical technology, and in particular to a method, device, electronic equipment and storage medium for rift identification. Background Art

[0002] Seismic exploration technology is an important channel for obtaining information on the underground distribution of oil and gas. For ultra-deep seismic exploration, there are problems with the identification and enhancement of effective signals and the suppression of multiple waves. Multiple waves are the most common interference waves in seismic exploration. Taking the metamorphic rock basement as an example, the interior of the basement shows chaotic reflection characteristics on the seismic profile. Due to the "accumulation" effect of multiple waves generated by shallow strata, multiple sets of layered seismic reflection phase axes appear in the basement that originally had chaotic reflections. If there is an early rift in the basement, there will also be sedimentary strata in the local depression area of ​​the rift, so layered reflections will also appear on the seismic profile. Existing seismic exploration technology cannot effectively identify whether the layered reflections at the base are caused by multiple waves or by the existence of rifts. Summary of the invention

[0003] The present invention provides a method, device, electronic equipment and storage medium for rift identification, so as to realize accurate identification of basement rifts.

[0004] In a first aspect, an embodiment of the present invention provides a rift identification method, the method comprising:

[0005] Perform diffraction wave imaging on the stratum to be identified to obtain the diffraction wave imaging result;

[0006] In the diffraction wave imaging results, determine whether there is a vertical section;

[0007] If it is determined that there is at least one vertical section in the diffraction wave imaging result, the position of the rift is determined according to the position of the vertical section.

[0008] In a second aspect, an embodiment of the present invention further provides a rift identification device, the device comprising:

[0009] Diffraction wave imaging result determination module: used to perform diffraction wave imaging on the stratum to be identified and obtain the diffraction wave imaging result;

[0010] Vertical section judgment module: used to judge whether there is a vertical section in the diffraction wave imaging result;

[0011] Rift position determination module: used to determine the position of the rift according to the position of the vertical section if it is determined that there is at least one vertical section in the diffraction wave imaging result.

[0012] In a third aspect, an embodiment of the present invention further provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, a rift identification method as described in any one of the embodiments of the present invention is implemented.

[0013] In a fourth aspect, an embodiment of the present invention further provides a storage medium storing computer executable instructions, wherein the computer executable instructions, when executed by a computer processor, are used to execute a rift identification method as described in any one of the embodiments of the present invention.

[0014] The technical solution of the embodiment of the present invention determines the spatial distribution position of the rift valley that may exist in the deep metamorphic basement by comparing and analyzing the diffraction wave imaging results and the reflection wave imaging results. This overcomes the problem that the existing technology cannot distinguish the "illusion" of rift valleys and multiple waves in the layered reflection of the deep metamorphic basement strata, and improves the accuracy of judging rift valleys in the deep metamorphic basement strata.

[0015] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0017] Figure 1 A flow chart of a rift identification method provided in Embodiment 1 of the present invention;

[0018] Figure 2 A cross-sectional view of diffraction wave imaging provided in Embodiment 1 of the present invention;

[0019] Figure 3 A two-dimensional velocity model provided in the first embodiment of the present invention;

[0020] Figure 4 The diffraction wave seismic imaging image provided by the first embodiment of the present invention;

[0021] Figure 5 The reflected wave seismic imaging image provided by the first embodiment of the present invention;

[0022] Figure 6 A schematic diagram of the structure of a rift identification device provided in Embodiment 2 of the present invention;

[0023] Figure 7It is a schematic diagram of the structure of an electronic device implementing an embodiment of the present invention. DETAILED DESCRIPTION

[0024] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0025] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0026] Embodiment 1

[0027] Figure 1 A flow chart of a rift identification method is provided for the first embodiment of the present invention. This embodiment is applicable to the situation of determining the location of rifts in metamorphic rock base strata. The method can be executed by a rift identification device. The rift identification device can be implemented in the form of hardware and / or software. The rift identification device can be configured in any electronic device with network communication function.

[0028] like Figure 1 As shown, the method includes:

[0029] S110, performing diffraction wave imaging on the stratum to be identified to obtain a diffraction wave imaging result.

[0030] The stratum to be identified may be the stratum for which the true position of the rift needs to be determined. The stratum to be identified may be a metamorphic basement stratum. The interior of the basement shows chaotic reflection characteristics on the seismic profile. Due to the "accumulation" effect of multiple waves generated by the shallow strata, multiple sets of layered seismic reflection phase axes appear in the basement that originally had chaotic reflections. If there is an early rift in the basement stratum, there will also be sedimentary strata in the local depression area of ​​the rift, so layered reflections will appear on the seismic profile.

[0031] Diffraction waves can be waves caused by places where seismic waves encounter drastic changes in the strata during propagation, such as fault points, fault edges, stratum pinch points, inhomogeneous bodies, intrusive bodies and the edges of underground reefs. The imaging form of diffraction waves is horizontal event axes, where the event axes can be lines connecting the same phase (wave crests or wave troughs) on the seismic record. Horizontal event axes can be lines connecting the same horizontal phase on the seismic record.

[0032] Furthermore, the diffraction wave is used for imaging because the diffraction wave imaging is sensitive to the boundary points existing in the strata and rift profiles, and thus can better display the boundary points of the strata and rift profiles.

[0033] The diffraction wave imaging method is used to perform diffraction wave imaging on the diffraction waves of the stratum to be identified, thereby obtaining a diffraction wave imaging result, which can be a three-dimensional seismic data volume. Among them, the diffraction wave imaging method can be a multiplication imaging condition method and a dip angle domain picking method, etc. This application does not limit the diffraction wave imaging method.

[0034] Further, Figure 2 A cross-sectional view of diffraction wave imaging is provided, such as Figure 2 As shown, from the cross-sectional diagram of diffraction wave imaging, it can be seen that in addition to the layered reflection, there are also three vertical sections within the range of 2km-6km.

[0035] Optionally, the stratigraphic depth of the stratum to be identified is greater than or equal to 8,000 meters and less than or equal to 10,000 meters.

[0036] Furthermore, the depth of the stratum to be identified is between 8,000 and 10,000 meters. This is because the wave field information of ultra-deep strata is complex. When conducting traditional seismic exploration, problems such as complex wave field analysis will arise. Therefore, it is difficult and ineffective to identify and separate the wave field of ultra-deep strata. The method used in this application can overcome this problem.

[0037] For example, a model of the formation to be identified can be established to verify that the method of the present application can identify the true location of the rift. Figure 3As shown in the figure, the model is a stratigraphic model in the vertical direction of the rift. The model is composed of horizontal layers, rift depressions, and isolated diffraction points. There is a high-speed layer in the middle of the model, and there is a horizontal interface at the bottom of the model. The inflection point of the interface represents the boundary point of the rift in the stratum. From the horizontal direction (vertical to the rift direction), the rift is an inverted trapezoid. The model is 8km long horizontally and 4km deep vertically. The horizontal and vertical grid track spacing is 5m. The seismic data is generated by finite difference forward simulation. The shot points and receiving points are evenly distributed on the surface. A total of 401 shots are simulated, and 801 channels are received for each shot. Among them, the shot point can be the location where seismic waves are excited in the field, and the receiving point is the location where seismic waves are received. A shot point is set every 20m, and a receiving point is set every 10m. The principle of finite difference forward simulation is to replace the derivatives of the wave field function in the wave equation with respect to space and time with the corresponding differences.

[0038] Optionally, performing diffraction wave imaging on the stratum to be identified to obtain a diffraction wave imaging result includes steps A1-A2:

[0039] Step A1: perform imaging amplitude scanning on the stratum to be identified to obtain the reflection wave Fresnel zone and horizontal phase axis.

[0040] The Fresnel Zone is an ellipsoidal space between the transmitting antenna and the receiving antenna.

[0041] The collected original acquisition shot gather data of the formation to be identified are analyzed to obtain the common imaging point gather in the dip domain, and the common imaging point gather in the dip domain is imaged and scanned to obtain the Fresnel zone of the reflection wave and the horizontal phase axis of the diffraction wave.

[0042] Step A2: performing amplitude superposition on the horizontal event axes to obtain a diffraction wave imaging result.

[0043] For example, in the process of amplitude stacking of the common imaging point gathers in the dip domain, the Fresnel band of the reflected wave is avoided, and at the same time, the amplitude stacking of the omnidirectional dip gathers is performed on the identified horizontal phase axis to avoid the leakage of the diffraction wave energy and realize the diffraction wave amplitude preservation imaging, such as Figure 4 Among them, the omnidirectional dip gather can construct a weight function curve, which reflects the underground dip distribution through the gather itself, and can effectively calculate the reflected wave and diffracted wave based on the Fresnel zone, thereby achieving targeted high-definition imaging.

[0044] Furthermore, if Figure 4 As shown in the figure, the black and white dots are boundary points in the stratum. Among them, the boundary points can be the inflection points of the stratum interface, that is, the boundary points of the rift valley and the isolated diffraction points, such as Figure 3 shown.

[0045] Optionally, the rift identification method further includes:

[0046] Reflection wave imaging is performed on the stratum to be identified to obtain a reflection wave imaging result; wherein the reflection wave imaging result contains layered reflections caused by multiple wave interference.

[0047] Layered reflections can be the formation "illusions" produced by multiple waves in the formation to be identified in the reflection imaging results, as well as the formation images produced by sedimentary formations in the rift depression area. Among them, the formation illusion can be called "false formation", which is a formation that appears in the reflection wave but has no response in the diffraction wave.

[0048] Reflection waves are waves that are reflected and refracted at the interface of media with different densities. Multiple waves are generated because some reflection interfaces with large reflection coefficients on the surface or underground cause the primary reflection waves to be reflected back underground. Multiple waves are common interference waves in seismic exploration. The appearance and existence of multiple waves make seismic imaging unrealistic, distort the amplitude, frequency and phase of the reflection waves of the target layer, and affect the authenticity and reliability of seismic imaging. The reflection wave imaging result can be a three-dimensional seismic data body. The imaging form of reflection waves and multiple waves is a convex pseudo-hyperbola.

[0049] For example, Figure 3 The model shown in the figure is used to perform reflection wave imaging to obtain the reflection wave imaging as shown in the figure. Figure 5 As shown. Figure 5 It can be seen that layered reflections caused by multiple waves appear within 2-4 km, and the shape of the event axis is very similar to that of the reflected wave. Both are convex pseudo-hyperbolas, which makes it difficult to distinguish between the reflected wave and the multiple waves in the imaging section.

[0050] The reflection wave imaging method is used to perform reflection wave imaging on the reflection waves of the formation to be identified, thereby obtaining a reflection wave imaging result. The reflection wave imaging method may be Kirchhoff migration, one-way wave migration, reverse time migration, multi-wave multi-component migration, etc., and the present application does not limit the reflection wave imaging method.

[0051] Furthermore, before performing reflection wave imaging and diffraction wave imaging on the stratum to be identified, it is also necessary to obtain the reflection wave and diffraction wave information, and analyze the collected original acquisition data of seismic exploration to obtain the reflection wave and diffraction wave information. Among them, the original acquisition data of seismic exploration may include the data required for seismic imaging such as the original acquisition shot gather and velocity field, and the diffraction wave and reflection wave information are included in the original acquisition shot gather data record.

[0052] Furthermore, the diffraction waves and reflection waves in the original acquired shot gather data can be separated because there are differences between the diffraction waves and the reflection waves in terms of the time-distance relationship in the data space, the wave field dynamic characteristics, and the time-distance relationship in the imaging space. Based on these differences, the two can be separated.

[0053] S120. In the diffraction wave imaging result, determine whether there is a vertical section.

[0054] In this embodiment, the cross-sectional view of the diffraction wave imaging is analyzed to determine whether there is a vertical section. The vertical section is presented in the cross-sectional view of the diffraction wave imaging in the form of a vertical line, such as Figure 2 As shown, the circles drawn by dotted lines are three vertical sections.

[0055] S130: If it is determined that there is at least one vertical section in the diffraction wave imaging result, determine the position of the rift according to the position of the vertical section.

[0056] By judging the diffraction wave imaging results, it is determined that there is at least one vertical section, and the position of the rift is determined based on the position of the vertical section.

[0057] For example, Figure 4 As shown, there is a vertical section in the diffraction wave imaging results. The position of the vertical section in the x-axis direction is between 2-6 km and the position in the z-axis direction is between 0-2 km. The position of the rift can be obtained based on the position of the vertical section.

[0058] Optionally, after determining that there is at least one vertical section in the diffraction wave imaging result, the method further includes step B1:

[0059] Step B1: verify the position of the vertical section according to the position of the layered reflection in the reflection wave imaging result.

[0060] For example, Figure 5 As shown. Figure 5 It can be seen that the position of the layered reflection of the rift in the x-axis direction is between 2-6 km and in the z-axis direction is between 0-2 km, which coincides with the position of the vertical section in the diffraction wave imaging. Therefore, it can be determined that the position of the vertical section is the true position of the rift.

[0061] Optionally, after determining that there is at least one vertical section in the diffraction wave imaging result, the method further includes step C1:

[0062] Step C1, taking the layered reflections in the reflection wave imaging result that do not match the vertical sections in the diffraction wave imaging result as multiple wave interference layered reflections.

[0063] For example, Figure 4 , 5 As shown, the stratum in which the boundary points in the reflection wave imaging result do not match the boundary points in the diffraction wave imaging result is the stratum between 2 and 4 km, and the stratum is regarded as a multiple wave interference layered reflection.

[0064] The technical solution of the embodiment of the present invention determines the spatial distribution positions of possible rifts in the deep metamorphic basement by comparing and analyzing the diffraction wave imaging results and the reflection wave imaging results. This overcomes the problem that current technology cannot distinguish between rifts and the "illusions" of multiple waves in the layered reflections of the deep metamorphic basement strata, and improves the accuracy of judging rifts in the deep metamorphic basement strata.

[0065] Embodiment 2

[0066] Figure 6 This is a schematic diagram of the structure of a rift identification device provided in Embodiment 2 of the present invention. Figure 6 As shown, the device comprises:

[0067] The diffraction wave imaging result determination module 210 is used to perform diffraction wave imaging on the stratum to be identified and obtain the diffraction wave imaging result;

[0068] A vertical section judging module 220 is used to judge whether there is a vertical section in the diffraction wave imaging result;

[0069] The rift position determination module 230 is used to determine the position of the rift according to the position of the vertical section if it is determined that there is at least one vertical section in the diffraction wave imaging result.

[0070] Optionally, the stratum depth of the stratum to be identified is greater than or equal to 8,000 meters and less than or equal to 10,000 meters, and the diffraction wave imaging result determination module 210 includes:

[0071] Imaging amplitude scanning unit: used to perform imaging amplitude scanning on the stratum to be identified, and obtain the horizontal phase axis and Fresnel zone of the reflected wave;

[0072] Imaging result determination unit: used to perform amplitude stacking on the horizontal event axis to obtain the diffraction wave imaging result of the formation to be identified.

[0073] Optionally, the vertical section determination module 220 is specifically used for:

[0074] Position verification subunit: used to verify the position of the vertical section according to the position of the layered reflection in the reflection wave imaging result.

[0075] Optionally, the rift position determination module 230 is specifically configured to:

[0076] The layered reflections in the reflection wave imaging results that do not match the vertical sections in the diffraction wave imaging results are regarded as multiple wave interference layered reflections.

[0077] Optionally, the rift identification device also includes:

[0078] The reflection wave imaging result determination module is used to perform reflection wave imaging on the stratum to be identified and obtain the reflection wave imaging result; wherein, the reflection wave imaging result contains layered reflections caused by multiple wave interference.

[0079] The crack identification device provided in the embodiment of the present invention can execute the crack identification method provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method.

[0080] Embodiment 3

[0081] Figure 7 A schematic diagram of the structure of an electronic device for implementing an embodiment of the present invention. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.

[0082] like Figure 7 As shown, the electronic device 10 includes at least one processor 11, and a memory connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 to the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0083] A number of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0084] The processor 11 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 performs the various methods and processes described above, such as the rift identification method.

[0085] In some embodiments, the rift identification method may be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the rift identification method described above may be performed. Alternatively, in other embodiments, the processor 11 may be configured to perform the rift identification method in any other appropriate manner (e.g., by means of firmware).

[0086] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0087] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0088] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in combination with an instruction execution system, device or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0089] To provide interaction with a user, the systems and techniques described herein may be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

[0090] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0091] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0092] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

[0093] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for rift identification, characterized in that: include: Perform diffraction wave imaging on the stratum to be identified to obtain the diffraction wave imaging result; In the diffraction wave imaging result, determining whether there is a vertical section; If it is determined that there is at least one vertical section in the diffraction wave imaging result, the position of the rift is determined according to the position of the vertical section.

2. The method according to claim 1, characterized in that Perform diffraction wave imaging on the stratum to be identified and obtain diffraction wave imaging results, including: Performing imaging amplitude scanning on the stratum to be identified to obtain a horizontal event axis and a Fresnel zone of a reflected wave; The horizontal phase axes are amplitude stacked to obtain the diffraction wave imaging results of the formation to be identified.

3. The method according to claim 1, characterized in that The method further comprises: Perform reflection wave imaging on the stratum to be identified to obtain reflection wave imaging results; There are layered reflections caused by multiple wave interference in the reflected wave imaging result.

4. The method according to claim 3, characterized in that After determining that there is at least one vertical section in the diffraction wave imaging result, the method further includes: The position of the vertical section is verified according to the position of the layered reflection in the reflection wave imaging result.

5. The method according to claim 3, characterized in that: After determining that there is at least one vertical section in the diffraction wave imaging result, the method further includes: The layered reflections in the reflection wave imaging result that do not match the vertical sections in the diffraction wave imaging result are regarded as multiple wave interference layered reflections.

6. The method according to any one of claims 1 to 5, characterized in that: The stratum depth of the stratum to be identified is greater than or equal to 8,000 meters and less than or equal to 10,000 meters.

7. A device for rift identification, characterized in that: include: Diffraction wave imaging result determination module: used to perform diffraction wave imaging on the stratum to be identified and obtain the diffraction wave imaging result; A vertical section judging module: used for judging whether there is a vertical section in the diffraction wave imaging result; The rift position determination module is used to determine the position of the rift according to the position of the vertical section if it is determined that there is at least one vertical section in the diffraction wave imaging result.

8. The device according to claim 7, characterized in that The device also includes: A reflection wave imaging result determination module is used to perform reflection wave imaging on the stratum to be identified and obtain a reflection wave imaging result; There are layered reflections caused by multiple wave interference in the reflected wave imaging result.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the program, the crack identification method as described in any one of claims 1-7 is implemented.

10. A storage medium storing computer executable instructions, characterized in that: The computer executable instructions are used to perform the rift identification method as described in any one of claims 1-7 when executed by a computer processor.

Images