Intelligent control method for configuration computer numerical control system

Abstract

The invention relates to the technical field of numerical control system control, and provides an intelligent control method for a configuration computer numerical control system, which comprises the following steps: collecting the space coordinates of a tool bit and the current of a lathe when the configuration computer numerical control system controls the lathe to process parts; determining the current change saliency at the target sampling moment, determining a current sequence and dividing current subsequences; marking a first target current sub-sequence according to the number of the current sub-sequences, and determining a first predicted value of the current sampling moment in combination with a historical sampling moment corresponding to the sampling moment; and marking a second target current sub-sequence according to the number of the current sub-sequences, determining a second predicted value of the current sampling moment according to the first predicted value and the co-processing sampling moment of the current sampling moment, and realizing control of the configuration computer numerical control system in combination with the first predicted value. The configuration computer numerical control system can be controlled in real time according to processing materials.

Description

Technical Field

[0001] The invention relates to the technical field of numerical control system control, and in particular to an intelligent control method for configuring a computer numerical control system. Background Art

[0002] A configuration computer is an automation system that controls machine tools and other manufacturing equipment through preset programs. A CNC system is a control system that executes digital instructions based on the processing program created by the user, and drives the motor and actuator to move along a predetermined path and speed to complete the processing task. During the part processing process, the configuration computer CNC system adjusts the feed rate, cutting depth, depth of cutter penetration into the workpiece, speed, torque and other processing parameters of the processing equipment by controlling the current of the processing equipment.

[0003] When processing parts, the processed materials usually contain impurities, and the location and type of impurities contained in different batches of materials are different. When using a configuration computer numerical control system to control part processing, it is often affected by the impurities of the processing material itself, resulting in differences between the parts processed by the actual processing parameters and the preset parts, affecting the quality and processing efficiency of the processed parts. Summary of the invention

[0004] The present invention provides an intelligent control method for a configuration computer numerical control system to solve the problem that the processing process preset by the configuration computer numerical control system cannot be adjusted in real time according to the impurities of the processing material itself, resulting in differences between the processed parts and the preset plan. The technical solution adopted is as follows: An embodiment of the present invention provides an intelligent control method for configuring a computer numerical control system, the method comprising the following steps: In the process of configuring a computer numerical control system to control a lathe to process parts, the initial spatial coordinates of the tool head are collected, and the current of the lathe and the spatial coordinates of the tool head at the current sampling moment and at different sampling moments before the current sampling moment are collected, and the spatial coordinates of the tool head and the current of the lathe at the historical sampling moments are extracted; Record any sampling moment as a target sampling moment, determine the current change significance at the target sampling moment according to the difference between the spatial coordinates of the tool head at the target sampling moment and the initial spatial coordinates of the tool head, and the difference between the current at the target sampling moment and the adjacent sampling moments, determine the current sequence according to all current values ​​and the current change significance of the current, and divide the current subsequence; Determine whether the current subsequence to which the current at the current sampling moment belongs is the first target current subsequence according to the number of current subsequences; if so, determine the corresponding historical sampling moment of the sampling moment according to the arrangement order of the historical sampling moments and the sampling moments included in the first target current subsequence; and determine the first predicted value of the current sampling moment according to the difference between the current at the current sampling moment and the current at the corresponding historical sampling moment of the current sampling moment; If not, the current subsequence in which the current at the current sampling moment is located is recorded as the second target current subsequence, and the first predicted value at the current sampling moment is obtained according to the second target current subsequence. The same-processing sampling moment of the current sampling moment is determined according to the previous adjacent current subsequence of the second target current subsequence in the current sequence; the second predicted value of the current sampling moment is determined according to the current at the same-processing sampling moment of the current sampling moment, the current at the corresponding historical sampling moment and the first predicted value, and the intelligent control of the configuration computer numerical control system is realized according to the first predicted value and the second predicted value at the current sampling moment.

[0005] Further, the method for determining the current change significance at the target sampling time is: The Euclidean distance between the spatial coordinates of the tool head at the target sampling moment and the initial spatial coordinates of the tool head is recorded as the tool head moving distance at the target sampling moment; The absolute value of the difference between the current at the target sampling time and the current at the adjacent sampling time before the target sampling time is recorded as the current difference at the target sampling time, and the ratio of the current difference at the target sampling time to the current at the target sampling time is recorded as the current change rate at the target sampling time; The product of the tool head movement distance and the current at the target sampling time is recorded as the first product at the target sampling time, and the product of the power with the natural constant as the base and the opposite number of the first product at the target sampling time as the exponent and the current change rate at the target sampling time is recorded as the current change significance at the target sampling time.

[0006] Furthermore, the method of determining the current sequence and dividing the current subsequences according to the values ​​of all currents and the current change significance of the currents includes the following specific methods: Marking a current change significance greater than a preset division threshold as a first current change significance, marking a current change significance less than or equal to the preset division threshold as a second current change significance, and recording both the first current change significance and the second current change significance as types of current; Arrange the current of the lathe in the order of sampling time to obtain the current sequence; A subsequence consisting of continuous currents of the same type in the current sequence is recorded as a current subsequence.

[0007] Furthermore, the method for determining the historical sampling time corresponding to the sampling time is: Select the historical sampling moments with the earliest sampling moments and the same number as all the sampling moments from the historical sampling moments, compare the order of the sampling moments among all the sampling moments with the order of the historical sampling moments among all the historical sampling moments, and take the historical sampling moments with the same order as the corresponding historical sampling moments of the sampling moments.

[0008] Further, the first prediction value at the current sampling moment is determined according to the difference between the current at the current sampling moment and the current at the corresponding historical sampling moment, and the specific method includes: The corresponding historical sampling moment of the target sampling moment is recorded as the target historical sampling moment, and the absolute value of the difference between the current at the target historical sampling moment and the current at the adjacent sampling moment before the target historical sampling moment is recorded as the current difference at the target historical sampling moment; the ratio of the current difference at the target historical sampling moment to the current at the target historical sampling moment is recorded as the current change rate at the target historical sampling moment; According to the difference between the current change rate at the current sampling moment and the current change rate at the corresponding historical sampling moment, and the difference between all currents included in the first target current subsequence and the current at the corresponding historical sampling moment, the current change rate at the same stage at the current sampling moment is obtained; The first prediction value at the current sampling moment is determined according to the current at the next historical sampling moment corresponding to the historical sampling moment of the current sampling moment and the current change rate at the same stage of the current sampling moment.

[0009] Further, the current change rate at the same stage of the current sampling moment is obtained according to the difference between the current change rate at the current sampling moment and the current change rate at the corresponding historical sampling moment, and the difference between all currents included in the first target current subsequence and the current at the corresponding historical sampling moment, including the specific method of: The absolute value of the difference between the current change rate at the current sampling moment and the current change rate at the corresponding historical sampling moment is recorded as the current change rate difference at the current sampling moment; The absolute value of the difference between the current at the sampling moment and the corresponding historical sampling moment is recorded as the synchronous current difference at the sampling moment, and the cumulative sum of the synchronous current differences at the sampling moment corresponding to all currents included in the first target current subsequence is recorded as the synchronous cumulative current difference at the current sampling moment; The inverse of the product of the current change rate difference at the current sampling moment and the accumulated current difference at the same stage is recorded as the second product at the current sampling moment; based on the second product at the current sampling moment, the current change rate at the same stage at the current sampling moment is determined, and the current change rate at the same stage at the current sampling moment is positively correlated with the second product at the current sampling moment.

[0010] Further, the first prediction value at the current sampling moment is determined according to the current at the next historical sampling moment corresponding to the historical sampling moment of the current sampling moment and the current change rate at the same stage of the current sampling moment, including the specific method of: The product of the current at the next historical sampling moment corresponding to the historical sampling moment of the current sampling moment and the current change rate at the same stage of the current sampling moment is recorded as the first prediction value of the current sampling moment.

[0011] Further, the method for determining the same processing sampling time as the current sampling time is: Recording a previous adjacent current subsequence of the second target current subsequence in the current sequence as a previous adjacent subsequence of the second target current subsequence; Calculate the number of sampling moments corresponding to all currents included in the second target current subsequence, select the earliest sampling moment in the previous adjacent subsequence and the same sampling moment as the number of currents included in the second target current subsequence, compare the order of the sampling moments selected in the previous adjacent subsequence with the order of the sampling moments corresponding to all currents included in the second target current subsequence in the second target current subsequence, and use the selected sampling moments with the same order as the same-processed sampling moments corresponding to the currents included in the second target current subsequence.

[0012] Further, the calculation formula of the second prediction value at the current sampling time is: In the formula, Indicates the current sampling time The second predicted value of Indicates the current sampling time The first predicted value of Indicates the current sampling time The current at the same processing sampling moment; Indicates the current sampling time The current corresponding to the historical sampling moment.

[0013] Furthermore, the intelligent control of the configuration computer numerical control system according to the first prediction value and the second prediction value at the current sampling moment includes the following specific methods: When the number of current subsequences is 1, the current subsequence where the current at the current sampling moment belongs is recorded as the first target current subsequence, and the second predicted value at the current sampling moment is used as the predicted value of the current value at the next sampling moment of the current sampling moment; When there is more than one current subsequence, the current subsequence where the current at the current sampling moment belongs is recorded as the second target current subsequence, and the first predicted value at the current sampling moment is used as the predicted value of the current value at the next sampling moment of the current sampling moment; The predicted value of the current value at the next sampling moment of the current sampling moment is used as the value of the current value at the next sampling moment, so as to realize the intelligent control of the configuration computer numerical control system.

[0014] The beneficial effects of the present invention are: The present application evaluates the change of current based on the characteristics of layer-by-layer processing of materials on a lathe and the characteristics that the chip force of the machine tool is positively correlated with the change trend of the current, obtains the significance of the current change, and determines the current sequence and divides the current sub-sequences according to the significance of the current change, and one current sub-sequence corresponds to one layer of cutting processing; when the current sub-sequence to which the current at the current sampling moment belongs is the first current sub-sequence in the current sequence, and there is no current data with an earlier collection time in the current sequence that can be used to predict the current data at the next adjacent sampling moment after the current sampling moment, the current value at the collection moment corresponding to the first target current sub-sequence in the historical sampling moment is used. distribution, determine the first prediction value at the current sampling moment, and use the first prediction value at the current sampling moment as the prediction value of the current value at the next sampling moment of the current sampling moment; when the current subsequence in which the current at the current sampling moment belongs is not the first current subsequence in the current sequence, according to the similar characteristics of the current change trends of the machine tools corresponding to the cutting processes of different layers, combined with the numerical distribution of the current at the collection moment corresponding to the second target current subsequence in the historical sampling moments, determine the second prediction value at the current sampling moment, use the second prediction value at the current sampling moment as the prediction value of the current value at the next sampling moment of the current sampling moment, and realize the intelligent control of the configuration computer numerical control system. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0016] Figure 1 A schematic flow chart of an intelligent control method for configuring a computer numerical control system provided by one embodiment of the present invention; Figure 2 A flow chart for obtaining the current change rate in the same stage provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0017] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0018] See also Figure 1 , which shows a flow chart of an intelligent control method for configuring a computer numerical control system provided by an embodiment of the present invention, the method comprising the following steps: Step S001, in the process of configuring a computer numerical control system to control a lathe to process parts, collect the initial spatial coordinates of the tool head and collect the current of the lathe and the spatial coordinates of the tool head at the current sampling moment and at different sampling moments before the current sampling moment, and extract the spatial coordinates of the tool head and the current of the lathe at the historical sampling moments.

[0019] In the process of using the configuration computer numerical control system to control the lathe to process parts, the current sensor is used to collect the current of the lathe, and the configuration computer numerical control system is used to collect the spatial coordinates of the tool head.

[0020] Preferably, in one embodiment of the present application, when collecting the spatial coordinates of the current and the tool head, the present embodiment sets the sampling time interval to 0.02 seconds, and stops collecting the spatial coordinates of the current and the tool head until the part processing is completed. In actual application, as other implementation methods, the implementer can decide the value of the sampling time interval according to the actual situation, and the present application does not impose any special restrictions.

[0021] The initial spatial coordinates of the tool head are extracted from the configured computer numerical control system. The spatial coordinates of the tool head and the current of the lathe at each historical sampling moment when processing the same part are extracted from the configured computer numerical control system.

[0022] It should be noted that the historical sampling time is the time when the configured computer numerical control system processed the same part in the past, and the sampling time is the time when the configured computer numerical control system controls the lathe to process the part. The current sampling time is also the time when the configured computer numerical control system controls the lathe to process the part, and there is no time overlap between the sampling time and the historical sampling time.

[0023] At this point, the initial spatial coordinates of the tool head are obtained, and the current and spatial coordinates of the tool head at each sampling moment in the process of lathe machining parts are controlled by the configuration computer numerical control system, as well as the current and spatial coordinates of the tool head at each historical sampling moment.

[0024] Step S002: record any sampling moment as the target sampling moment, determine the current change significance at the target sampling moment according to the difference between the spatial coordinates of the tool head at the target sampling moment and the initial spatial coordinates of the tool head, and the difference between the current at the target sampling moment and the adjacent sampling moments, determine the current sequence according to the values ​​of all currents and the current change significance of the currents, and divide the current subsequences.

[0025] When the lathe processes the material, it cuts the material layer by layer until the material is cut to the target size. Therefore, when the material contains impurities, if the impurity position is cut in a certain layer, the impurity will also be cut in the same position of the adjacent layer after this layer. The change trend of the chip force of the machine tool corresponding to the two-layer cutting process is similar. When the chip force of the machine tool changes, the current of the lathe will also change accordingly. In other words, the current change trend of the machine tool corresponding to the two-layer cutting process is similar. Therefore, the processing process of the part can be segmented according to the change of the current, which is convenient for subsequent analysis.

[0026] Any sampling time is recorded as the target sampling time, and the Euclidean distance between the spatial coordinates of the tool head at the target sampling time and the initial spatial coordinates of the tool head is recorded as the tool head moving distance at the target sampling time.

[0027] It is understandable that impurities on the surface of materials processed by lathes are relatively obvious. During material quality inspection, the material on the surface has been removed. At the first moment when the cutter head processes the material, impurities will not be encountered. Therefore, this embodiment does not analyze the first sampling moment in the process of configuring the computer numerical control system to control the lathe to process parts.

[0028] The current change significance at the target sampling moment is determined according to the current at the target sampling moment and the adjacent sampling moments, and the tool head movement distance at the target sampling moment.

[0029] Preferably, in one embodiment of the present application, the absolute value of the difference between the current at the target sampling moment and the current at the adjacent sampling moment before the target sampling moment is recorded as the current difference at the target sampling moment, and the ratio of the current difference at the target sampling moment to the current at the target sampling moment is recorded as the current change rate at the target sampling moment; the product of the tool head movement distance at the target sampling moment and the current is recorded as the first product at the target sampling moment, and the product of a power with a natural constant as the base and the opposite of the first product at the target sampling moment as the exponent and the current change rate at the target sampling moment is recorded as the current change significance at the target sampling moment.

[0030] The larger the Euclidean distance between the spatial coordinates of the tool head at the target sampling moment and the initial spatial coordinates of the tool head, the farther the position of the tool head is from the initial position of the tool head at the target sampling moment. At the same time, the larger the difference between the current at the target sampling moment and the adjacent sampling moment, the more significant the abnormal change in the current of the lathe at the target sampling moment. At this time, the significance of the current change at the target sampling moment is greater.

[0031] A division threshold is set. In this embodiment, the division threshold is set to 0.75.

[0032] The current change significance greater than the division threshold is marked as the first current change significance, and the current change significance less than or equal to the division threshold is marked as the second current change significance. The first current change significance and the second current change significance are both recorded as current types.

[0033] The currents of the lathe are arranged in the order of sampling moments to obtain a current sequence, and a subsequence consisting of continuous currents of the same type in the current sequence is recorded as a current subsequence.

[0034] At this point, the current subsequence is obtained.

[0035] Step S003: determine whether the current subsequence to which the current at the current sampling moment belongs is the first target current subsequence based on the number of current subsequences; if so, determine the corresponding historical sampling moment of the sampling moment based on the arrangement order of the historical sampling moments and the sampling moments included in the first target current subsequence; and determine the first predicted value of the current sampling moment based on the difference between the current at the current sampling moment and the current at the corresponding historical sampling moment.

[0036] When the current subsequence in which the current at the current sampling moment belongs is the first current subsequence in the current sequence, that is, when there is only one current subsequence, there is no current data with an earlier collection time in the current sequence that can be used to predict the current data at the next adjacent sampling moment after the current sampling moment. Therefore, the current data at the next adjacent sampling moment after the current sampling moment is predicted based on the current of the lathe at the historical sampling moments.

[0037] When the current subsequence to which the current at the current sampling moment belongs is the first current subsequence in the current sequence, the current subsequence to which the current at the current sampling moment belongs is recorded as the first target current subsequence.

[0038] The current of the lathe at the historical sampling moment is collected when the lathe processes the same parts. Therefore, the current of the lathe at the historical sampling moment has a reference significance for predicting the current data at the next adjacent sampling moment after the current sampling moment.

[0039] Calculate the number of all sampling moments, select the same number of historical sampling moments with the earliest sampling moment among the historical sampling moments, compare the order of the sampling moments among all sampling moments with the order of the historical sampling moments among all historical sampling moments, and take the historical sampling moments with the same order as the corresponding historical sampling moments of the sampling moment.

[0040] For ease of understanding, for example, if the current sampling moment is the third sampling moment of all sampling moments, the number of all sampling moments is 3, and the three historical sampling moments with the earliest sampling moments are selected from the historical sampling moments. The first selected historical sampling moment is used as the corresponding historical sampling moment of the first sampling moment, the second selected historical sampling moment is used as the corresponding historical sampling moment of the second sampling moment, and the third selected historical sampling moment is used as the corresponding historical sampling moment of the third sampling moment, that is, the third selected historical sampling moment is used as the corresponding historical sampling moment of the current sampling moment.

[0041] The current change rate at the historical sampling moment is determined according to the difference between the currents at adjacent historical sampling moments.

[0042] The corresponding historical sampling time of the target sampling time is recorded as the target historical sampling time, the absolute value of the difference between the current at the target historical sampling time and the current at the adjacent sampling time before the target historical sampling time is recorded as the current difference at the target historical sampling time, and the ratio of the current difference at the target historical sampling time to the current at the target historical sampling time is recorded as the current change rate at the target historical sampling time.

[0043] The current change rate at the same stage of the current sampling moment is obtained according to the difference between the current change rate at the current sampling moment and the current change rate at the corresponding historical sampling moment, and the difference between all currents included in the first target current subsequence and the currents at the corresponding historical sampling moments.

[0044] The absolute value of the difference between the current change rate at the current sampling moment and the corresponding historical sampling moment of the current sampling moment is recorded as the current change rate difference at the current sampling moment; the absolute value of the difference between the current at the sampling moment and the corresponding historical sampling moment of the current sampling moment is recorded as the synchronous current difference at the sampling moment; the cumulative sum of the synchronous current differences at the sampling moments corresponding to all currents included in the first target current subsequence is recorded as the synchronous cumulative current difference at the current sampling moment; the inverse of the product of the current change rate difference at the current sampling moment and the synchronous cumulative current difference is recorded as the second product at the current sampling moment. According to the second product at the current sampling moment, the current change rate at the same stage at the current sampling moment is determined, and the current change rate at the same stage at the current sampling moment is positively correlated with the second product at the current sampling moment.

[0045] It can be understood that the positive correlation in the present application means that the dependent variable increases (decreases) as the independent variable increases (decreases), which can be an additive relationship, a multiplicative relationship, etc.

[0046] Preferably, in one embodiment of the present application, the value of an exponential function with a natural constant as the base and the second product at the current sampling moment as the exponent is recorded as the current change rate at the same stage at the current sampling moment.

[0047] The flow chart for obtaining the current change rate at the same stage is as follows Figure 2 shown.

[0048] The first prediction value at the current sampling moment is determined according to the current at the next historical sampling moment corresponding to the historical sampling moment of the current sampling moment and the current change rate at the same stage of the current sampling moment.

[0049] Preferably, in an embodiment of the present application, the product of the current at the next historical sampling moment corresponding to the historical sampling moment of the current sampling moment and the current change rate at the same stage of the current sampling moment is recorded as the first predicted value of the current sampling moment.

[0050] The first predicted value at the current sampling moment is used as the predicted value of the current value at the next sampling moment of the current sampling moment.

[0051] At this point, when the current subsequence to which the current at the current sampling moment belongs is the first current subsequence in the current sequence, that is, when there is only one current subsequence, a predicted value of the current value at the next sampling moment of the current sampling moment is obtained.

[0052] Step S004, if not, record the current subsequence where the current at the current sampling moment is located as the second target current subsequence, obtain the first prediction value at the current sampling moment according to the second target current subsequence, determine the same-processing sampling moment at the current sampling moment according to the previous adjacent current subsequence of the second target current subsequence in the current sequence; determine the second prediction value at the current sampling moment according to the current at the same-processing sampling moment at the current sampling moment, the current at the corresponding historical sampling moment and the first prediction value, and realize intelligent control of the configuration computer numerical control system according to the first prediction value and the second prediction value at the current sampling moment.

[0053] When the current subsequence in which the current at the current sampling moment is located is not the first current subsequence in the current sequence, according to the similar characteristics of the current change trends of the machine tool corresponding to the cutting processes of different layers, the current subsequences before the current subsequence in which the current at the current sampling moment is located can be used as a more accurate basis for predicting the current data at the next adjacent sampling moment after the current sampling moment.

[0054] When the current subsequence to which the current at the current sampling moment belongs is not the first current subsequence in the current sequence, that is, when there is more than one current subsequence, the current subsequence to which the current at the current sampling moment belongs is recorded as the second target current subsequence.

[0055] According to the method of obtaining the first predicted value at the current sampling moment according to the first target current subsequence, the first predicted value at the current sampling moment is obtained according to the second target current subsequence.

[0056] The specific process of obtaining the first predicted value at the current sampling moment according to the second target current subsequence is as follows.

[0057] Calculate the number of all sampling moments, select the same number of historical sampling moments with the earliest sampling moment among the historical sampling moments, compare the order of the sampling moments among all sampling moments with the order of the historical sampling moments among all historical sampling moments, and take the historical sampling moments with the same order as the corresponding historical sampling moments of the sampling moment.

[0058] The current change rate at the historical sampling moment is determined according to the difference between the currents at adjacent historical sampling moments.

[0059] The corresponding historical sampling time of the target sampling time is recorded as the target historical sampling time, the absolute value of the difference between the current at the target historical sampling time and the current at the adjacent sampling time before the target historical sampling time is recorded as the current difference at the target historical sampling time, and the ratio of the current difference at the target historical sampling time to the current at the target historical sampling time is recorded as the current change rate at the target historical sampling time.

[0060] The current change rate at the same stage of the current sampling moment is obtained according to the difference between the current change rate at the current sampling moment and the current change rate at the corresponding historical sampling moment, and the difference between all currents included in the second target current subsequence and the currents at the corresponding historical sampling moments.

[0061] The absolute value of the difference between the current change rate at the current sampling moment and the corresponding historical sampling moment of the current sampling moment is recorded as the current change rate difference at the current sampling moment; the absolute value of the difference between the current at the sampling moment and the corresponding historical sampling moment of the current sampling moment is recorded as the synchronous current difference at the sampling moment; the cumulative sum of the synchronous current differences at the sampling moments corresponding to all currents included in the second target current subsequence is recorded as the synchronous cumulative current difference at the current sampling moment; the inverse of the product of the current change rate difference at the current sampling moment and the synchronous cumulative current difference is recorded as the second product at the current sampling moment. According to the second product at the current sampling moment, the current change rate at the same stage at the current sampling moment is determined, and the current change rate at the same stage at the current sampling moment is positively correlated with the second product at the current sampling moment.

[0062] Preferably, in one embodiment of the present application, the value of an exponential function with a natural constant as the base and the second product at the current sampling moment as the exponent is recorded as the current change rate at the same stage at the current sampling moment.

[0063] The first prediction value at the current sampling moment is determined according to the current at the next historical sampling moment corresponding to the historical sampling moment of the current sampling moment and the current change rate at the same stage of the current sampling moment.

[0064] Preferably, in an embodiment of the present application, the product of the current at the next historical sampling moment corresponding to the historical sampling moment of the current sampling moment and the current change rate at the same stage of the current sampling moment is recorded as the first predicted value of the current sampling moment.

[0065] The same processing sampling moment of the current sampling moment is determined according to a previous adjacent current subsequence of the second target current subsequence in the current sequence.

[0066] The previous adjacent current subsequence of the second target current subsequence in the current sequence is recorded as the previous adjacent subsequence of the second target current subsequence. The number of sampling moments corresponding to all currents included in the second target current subsequence is calculated, and the same number of sampling moments with the earliest sampling moments are selected in the previous adjacent subsequence, and the order of the sampling moments selected in the previous adjacent subsequence is compared with the order of the sampling moments corresponding to all currents included in the second target current subsequence in the second target current subsequence, and the selected sampling moments with the same order are used as the same processing sampling moments corresponding to the sampling moments of the currents included in the second target current subsequence.

[0067] For ease of understanding, for example, if the current sampling moment is the third sampling moment in the second target current subsequence, the three earliest sampling moments are selected in the previous adjacent subsequence of the second target current subsequence, the first sampling moment selected in the previous adjacent subsequence is used as the same processing sampling moment of the first sampling moment in the second target current subsequence, the second sampling moment selected in the previous adjacent subsequence is used as the same processing sampling moment of the second sampling moment in the second target current subsequence, and the third sampling moment selected in the previous adjacent subsequence is used as the same processing sampling moment of the third sampling moment in the second target current subsequence, that is, the third sampling moment selected in the previous adjacent subsequence is used as the same processing sampling moment of the current sampling moment. Therefore, the same processing sampling moment of the current sampling moment can be obtained.

[0068] A second prediction value at the current sampling moment is determined according to the current at the same processing sampling moment as the current sampling moment, the current at the corresponding historical sampling moment, and the first prediction value.

[0069] In the formula, Indicates the current sampling time The second predicted value of Indicates the current sampling time The first predicted value of Indicates the current sampling time The current at the same processing sampling moment; Indicates the current sampling time The current corresponding to the historical sampling moment.

[0070] When the current subsequence to which the current at the current sampling moment belongs is not the first current subsequence in the current sequence, that is, when there is more than one current subsequence, the second prediction value at the current sampling moment can be obtained, and the second prediction value at the current sampling moment can be used as the prediction value of the current value at the next sampling moment of the current sampling moment.

[0071] The predicted value of the current value at the next sampling moment of the current sampling moment is used as the value of the current value at the next sampling moment, so as to realize the intelligent control of the configuration computer numerical control system.

[0072] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the principles of the present invention should be included in the protection scope of the present invention.

Claims

1. An intelligent control method for configuring a computer numerical control system, characterized in that: The method comprises the following steps: In the process of configuring a computer numerical control system to control a lathe to process parts, the initial spatial coordinates of the tool head are collected, and the current of the lathe and the spatial coordinates of the tool head at the current sampling moment and at different sampling moments before the current sampling moment are collected, and the spatial coordinates of the tool head and the current of the lathe at the historical sampling moments are extracted; Record any sampling moment as a target sampling moment, determine the current change significance at the target sampling moment according to the difference between the spatial coordinates of the tool head at the target sampling moment and the initial spatial coordinates of the tool head, and the difference between the current at the target sampling moment and the adjacent sampling moments, determine the current sequence according to all current values ​​and the current change significance of the current, and divide the current subsequence; Determine whether the current subsequence to which the current at the current sampling moment belongs is the first target current subsequence according to the number of current subsequences; if so, determine the corresponding historical sampling moment of the sampling moment according to the arrangement order of the historical sampling moments and the sampling moments included in the first target current subsequence; and determine the first predicted value of the current sampling moment according to the difference between the current at the current sampling moment and the current at the corresponding historical sampling moment of the current sampling moment; If not, the current subsequence in which the current at the current sampling moment is located is recorded as the second target current subsequence, and the first predicted value at the current sampling moment is obtained according to the second target current subsequence. The same-processing sampling moment of the current sampling moment is determined according to the previous adjacent current subsequence of the second target current subsequence in the current sequence; the second predicted value of the current sampling moment is determined according to the current at the same-processing sampling moment of the current sampling moment, the current at the corresponding historical sampling moment and the first predicted value, and the intelligent control of the configuration computer numerical control system is realized according to the first predicted value and the second predicted value at the current sampling moment.

2. The intelligent control method for configuring a computer numerical control system according to claim 1, characterized in that: The method for determining the current change significance at the target sampling time is: The Euclidean distance between the spatial coordinates of the tool head at the target sampling moment and the initial spatial coordinates of the tool head is recorded as the tool head moving distance at the target sampling moment; The absolute value of the difference between the current at the target sampling time and the current at the adjacent sampling time before the target sampling time is recorded as the current difference at the target sampling time, and the ratio of the current difference at the target sampling time to the current at the target sampling time is recorded as the current change rate at the target sampling time; The product of the tool head movement distance and the current at the target sampling time is recorded as the first product at the target sampling time, and the product of the power with the natural constant as the base and the opposite number of the first product at the target sampling time as the exponent and the current change rate at the target sampling time is recorded as the current change significance at the target sampling time.

3. The intelligent control method for configuring a computer numerical control system according to claim 1, characterized in that: The specific method of determining the current sequence and dividing the current subsequences according to the values ​​of all currents and the current change significance of the currents includes: Marking a current change significance greater than a preset division threshold as a first current change significance, marking a current change significance less than or equal to the preset division threshold as a second current change significance, and recording both the first current change significance and the second current change significance as types of current; Arrange the current of the lathe in the order of sampling time to obtain the current sequence; A subsequence consisting of continuous currents of the same type in the current sequence is recorded as a current subsequence.

4. The intelligent control method for configuring a computer numerical control system according to claim 1, characterized in that: The method for determining the historical sampling time corresponding to the sampling time is: Select the historical sampling moments with the earliest sampling moments and the same number as all the sampling moments from the historical sampling moments, compare the order of the sampling moments among all the sampling moments with the order of the historical sampling moments among all the historical sampling moments, and take the historical sampling moments with the same order as the corresponding historical sampling moments of the sampling moments.

5. The intelligent control method for configuring a computer numerical control system according to claim 1, characterized in that: The method of determining the first predicted value at the current sampling moment according to the difference between the current at the current sampling moment and the current at the corresponding historical sampling moment includes: The corresponding historical sampling moment of the target sampling moment is recorded as the target historical sampling moment, and the absolute value of the difference between the current at the target historical sampling moment and the current at the adjacent sampling moment before the target historical sampling moment is recorded as the current difference at the target historical sampling moment; the ratio of the current difference at the target historical sampling moment to the current at the target historical sampling moment is recorded as the current change rate at the target historical sampling moment; According to the difference between the current change rate at the current sampling moment and the current change rate at the corresponding historical sampling moment, and the difference between all currents included in the first target current subsequence and the current at the corresponding historical sampling moment, the current change rate at the same stage at the current sampling moment is obtained; The first prediction value at the current sampling moment is determined according to the current at the next historical sampling moment corresponding to the historical sampling moment of the current sampling moment and the current change rate at the same stage of the current sampling moment.

6. The intelligent control method for configuring a computer numerical control system according to claim 5, characterized in that: The method of obtaining the current change rate at the same stage of the current sampling moment according to the difference between the current change rate at the current sampling moment and the current change rate at the corresponding historical sampling moment, and the difference between all currents included in the first target current subsequence and the current at the corresponding historical sampling moment, includes the following specific methods: The absolute value of the difference between the current change rate at the current sampling moment and the current change rate at the corresponding historical sampling moment is recorded as the current change rate difference at the current sampling moment; The absolute value of the difference between the current at the sampling moment and the corresponding historical sampling moment is recorded as the synchronous current difference at the sampling moment, and the cumulative sum of the synchronous current differences at the sampling moment corresponding to all currents included in the first target current subsequence is recorded as the synchronous cumulative current difference at the current sampling moment; The inverse of the product of the current change rate difference at the current sampling moment and the accumulated current difference at the same stage is recorded as the second product at the current sampling moment; based on the second product at the current sampling moment, the current change rate at the same stage at the current sampling moment is determined, and the current change rate at the same stage at the current sampling moment is positively correlated with the second product at the current sampling moment.

7. An intelligent control method for configuring a computer numerical control system according to claim 6, characterized in that: The method of determining the first predicted value at the current sampling moment according to the current at the next historical sampling moment corresponding to the historical sampling moment of the current sampling moment and the current change rate at the same stage of the current sampling moment includes: The product of the current at the next historical sampling moment corresponding to the historical sampling moment of the current sampling moment and the current change rate at the same stage of the current sampling moment is recorded as the first prediction value of the current sampling moment.

8. The intelligent control method for configuring a computer numerical control system according to claim 1, characterized in that: The method for determining the same processing sampling time as the current sampling time is: Recording a previous adjacent current subsequence of the second target current subsequence in the current sequence as a previous adjacent subsequence of the second target current subsequence; Calculate the number of sampling moments corresponding to all currents included in the second target current subsequence, select the earliest sampling moment in the previous adjacent subsequence and the same sampling moment as the number of currents included in the second target current subsequence, compare the order of the sampling moments selected in the previous adjacent subsequence with the order of the sampling moments corresponding to all currents included in the second target current subsequence in the second target current subsequence, and use the selected sampling moments with the same order as the same-processed sampling moments corresponding to the currents included in the second target current subsequence.

9. The intelligent control method for configuring a computer numerical control system according to claim 1, characterized in that: The calculation formula of the second predicted value at the current sampling time is: In the formula, Indicates the current sampling time The second predicted value of Indicates the current sampling time The first predicted value of Indicates the current sampling time The current at the same processing sampling moment; Indicates the current sampling time The current corresponding to the historical sampling moment.

10. The intelligent control method for configuring a computer numerical control system according to claim 1, characterized in that: The specific method of realizing intelligent control of the configuration computer numerical control system according to the first prediction value and the second prediction value at the current sampling moment includes: When the number of current subsequences is 1, the current subsequence where the current at the current sampling moment belongs is recorded as the first target current subsequence, and the second predicted value at the current sampling moment is used as the predicted value of the current value at the next sampling moment of the current sampling moment; When there is more than one current subsequence, the current subsequence where the current at the current sampling moment belongs is recorded as the second target current subsequence, and the first predicted value at the current sampling moment is used as the predicted value of the current value at the next sampling moment of the current sampling moment; The predicted value of the current value at the next sampling moment of the current sampling moment is used as the value of the current value at the next sampling moment, so as to realize the intelligent control of the configuration computer numerical control system.

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