Device and method for testing MCU (Microprogrammed Control Unit) chip

Abstract

The invention discloses a device and a method for testing a microcontroller MCU chip, and belongs to the technical field of semiconductors. The device comprises a main control circuit board, an MCU test mother circuit board and an MCU test sub circuit board, the MCU test sub-circuit board is used for acquiring multi-path output parameters of an MCU chip to be tested and sending the multi-path output parameters to the main control circuit board through the MCU test mother circuit board, and the main control circuit board is used for selecting one path of output parameters in the multi-path output parameters for output. Carrying out the performance or function test of the MCU chip to be tested through one path of output parameters until the test of the multiple paths of output parameters is completed; and the MCU test sub-circuit board is in communication connection with the MCU chip to be tested. The device is simple and efficient in test implementation and high in compatibility.

Description

Technical Field

[0001] The present invention relates to the field of semiconductor technology, and more specifically, to a device and method for testing a microcontroller MCU chip. Background Art

[0002] A microcontroller (hereinafter referred to as "MCU") chip is a device that integrates the main functions of a microcomputer on a single integrated circuit. It usually consists of a central processing unit (CPU), memory (including flash memory for program storage and RAM for data storage), input / output interface, timer / counter and other key functional modules. The performance and function of the MCU chip can be quantitatively or qualitatively evaluated by burning a specific program in the MCU chip memory, the chip automatically executing the program and outputting the results, and testing the chip output.

[0003] This method can be used to judge the performance and functional level of the chip at the application level, and can also be used to judge the functional integrity of the chip after being subjected to harsh conditions such as static electricity, high-temperature storage, etc. The testing of MCU chips in the industry is mostly carried out at the physical layer or data link layer of the chip. By giving specific inputs to specific combinations of pins on the chip and reading the data of the input pins, the performance of the chip can be judged.

[0004] Since the physical layer and data link layer of MCUs from different manufacturers and different packages are very different, the test equipment is expensive and not universal. This test method is only applicable to chip manufacturers testing their own products. As an electronic equipment manufacturer using MCU chips, this method is costly, inefficient, and difficult to operate. It is not suitable for selecting chip suppliers and comparing the performance of MCU chips from different suppliers. Summary of the invention

[0005] In view of the above problems, the present invention proposes a device for testing a microcontroller MCU chip, comprising: a main control circuit board, an MCU test mother circuit board and an MCU test daughter circuit board;

[0006] The MCU test sub-circuit board is used to obtain the multi-channel output parameters of the MCU chip to be tested, and send the multi-channel output parameters to the main control circuit board through the MCU test mother circuit board, and the main control circuit board is used to select one output parameter from the multi-channel output parameters for output, and perform the performance or function test of the MCU chip to be tested with the one output parameter until the multi-channel output parameters are all tested;

[0007] The MCU test sub-circuit board is communicatively connected with the MCU chip to be tested.

[0008] Optionally, the MCU test sub-circuit board sends multiple output parameters to the MCU test mother circuit board through a connection socket.

[0009] Optionally, the MCU test sub-circuit boards include multiple, and the MCU test mother circuit board communicates with the multiple MCU test sub-circuit boards respectively through multiple device connection sockets.

[0010] Optionally, the main control circuit board and the MCU test mother circuit board communicate data via a data connection line.

[0011] Optionally, the MCU test sub-circuit board includes: a burning socket, which is used to download test programs for different performance and function tests for the MCU chip to be tested.

[0012] Optionally, the MCU test mother circuit board can test different MCU chips to be tested by plugging different MCU test sub-circuits.

[0013] Optionally, the output parameters include at least one of the following: input current, output level and output signal frequency.

[0014] On the other hand, the present invention also proposes a method for testing a microcontroller MCU chip, comprising:

[0015] Obtain the multi-channel output parameters of the MCU chip to be tested through the MCU test sub-circuit board;

[0016] Sending the multi-channel output parameters to the main control circuit board through the MCU test mother circuit board;

[0017] Selecting one output parameter from the multiple output parameters for output through the main control circuit board;

[0018] The performance or function test of the MCU chip to be tested is performed using the one-way output parameter until the multiple-way output parameters have all been tested.

[0019] In yet another aspect, the present invention further provides a computing device, comprising: one or more processors;

[0020] a processor for executing one or more programs;

[0021] When the one or more programs are executed by the one or more processors, the above-described method is implemented.

[0022] In yet another aspect, the present invention further provides a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed, the method described above is implemented.

[0023] Compared with the prior art, the present invention has the following beneficial effects:

[0024] The present invention provides a device for testing a microcontroller MCU chip, comprising: a main control circuit board, an MCU test mother circuit board and an MCU test sub-circuit board; the MCU test sub-circuit board is used to obtain the multi-channel output parameters of the MCU chip to be tested, and the multi-channel output parameters are sent to the main control circuit board through the MCU test mother circuit board, the main control circuit board is used to select one output parameter from the multi-channel output parameters for output, and the performance or function test of the MCU chip to be tested is performed with the one output parameter until the multi-channel output parameters are all tested; the MCU test sub-circuit board is connected to the MCU chip to be tested in communication. The device of the present invention is simple, efficient and highly compatible in implementing the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 is a structural block diagram of a device according to an embodiment of the present invention;

[0026] Figure 2 A schematic block diagram of a microcontroller test sub-circuit board according to an embodiment of the present invention;

[0027] Figure 3 A schematic diagram of a microcontroller test mother circuit board according to an embodiment of the present invention;

[0028] Figure 4 A schematic block diagram of a microcontroller indicator signal isolation circuit board according to an embodiment of the present invention;

[0029] Figure 5 A power supply circuit for a daughter board according to an embodiment of the present invention;

[0030] Figure 6 A schematic diagram of a main control circuit board according to an embodiment of the present invention;

[0031] Figure 7 is a schematic block diagram of a channel control circuit according to an embodiment of the present invention;

[0032] Figure 8 4 is a principle block diagram of a channel control circuit according to an embodiment of the present invention. DETAILED DESCRIPTION

[0033] Now, exemplary embodiments of the present invention are described with reference to the accompanying drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. These embodiments are provided to disclose the present invention in detail and completely and to fully convey the scope of the present invention to those skilled in the art. The terms used in the exemplary embodiments shown in the accompanying drawings are not intended to limit the present invention. In the accompanying drawings, the same units / elements are marked with the same reference numerals.

[0034] Unless otherwise specified, the terms (including technical terms) used herein have the commonly understood meanings to those skilled in the art. In addition, it is understood that the terms defined in commonly used dictionaries should be understood to have the same meanings as those in the context of the relevant fields, and should not be understood as idealized or overly formal meanings.

[0035] Embodiment 1:

[0036] The present invention proposes a device for testing a microcontroller MCU chip, such as Figure 1 As shown, it includes: a main control circuit board, an MCU test mother circuit board and an MCU test sub-circuit board; the MCU test sub-circuit board is communicated and connected with the chip to be tested through the MCU test sub-circuit board to obtain the output parameters of the chip to be tested, and the parameters are sent to the MCU test mother circuit board through the connection socket; the MCU test mother circuit board communicates with multiple MCU test sub-circuits through multiple device connection sockets respectively; the main control circuit board and the MCU test mother circuit board communicate data through the data connection line.

[0037] Among them, the MCU test sub-circuit board is customized according to the operating logic of the MCU chip of a specific package and a specific manufacturer; the MCU test sub-circuit board is connected to the chip to be tested for communication, and the input current, output level, output signal frequency and other parameters of the chip to be tested are obtained, and the output parameters are sent to the MCU test mother circuit board through the connection socket; the MCU test mother circuit board receives the parameters, and sends the parameters to the main control circuit board; the main control circuit board controls the selection of one channel of the parameters and outputs them, so as to prevent the simultaneous superposition and output of multiple channels of parameters from affecting the recognition of the test results.

[0038] like Figure 2 As shown, Figure 2 Figure 3 This is a schematic diagram of the MCU test mother circuit board. The circuit board is mainly composed of four parts, namely the connection port with the main control board, the MCU indicator signal isolation circuit, the daughter board power supply circuit and the daughter board connection interface.

[0039] The connection interface with the main board is a DB26 interface, and the motherboard is connected to the main control board through the corresponding isolated data line and the corresponding data is transmitted; the MCU operation index signal isolation circuit mainly uses the logic chip of the phase converter, and the logic chip has the advantages of large noise tolerance and insensitivity to noise and interference. First, the output signal of the daughter board is transmitted through the phase converter to make the signal more stable; second, the daughter board and the motherboard are allowed to operate under extreme environmental conditions; third, the signal is amplified to ensure the integrity of the signal when transmitting with the main control board over a long data line to avoid signal distortion; the daughter board power supply circuit provides smooth transmission of electric energy and abnormal protection for the power supply process; the daughter board connection interface is connected to the MCU test sub-circuit board to transmit the output signal of the MCU test sub-circuit board and power the MCU test sub-circuit board.

[0040] like Figure 3 As shown, Figure 3 This is a schematic diagram of the MCU test sub-circuit board. The circuit board is mainly composed of four parts, namely the chip base, the minimum system circuit, the burning socket and the motherboard connection socket.

[0041] The chip base is used to accurately install the MCU chip to ensure the integrity of voltage, current and signal transmission and the normal power supply of the chip; the minimum system circuit is the minimum system of the chip built according to the model, package, specification, manufacturer and other characteristics of the MCU chip being tested, generally composed of power supply, clock circuit and reset circuit; the burning socket is used to connect the chip program burning device to download the running program of the chip being tested; the motherboard connection socket is connected to the MCU test mother circuit board to transmit the output signal of the MCU test sub-circuit board and power the MCU test sub-circuit board.

[0042] Among them, the schematic block diagram of the MCU indicator signal isolation circuit is as follows: Figure 4 shown.

[0043] like Figure 5 As shown, Figure 5 This is a schematic block diagram of the daughter board power supply circuit, which is mainly composed of an anti-reverse circuit and a filter circuit. The anti-reverse circuit uses an anti-reverse diode and a TVS tube. If there is a short circuit in the daughter board circuit, the anti-reverse diode can be used for protection to avoid abnormalities in the mother board circuit; if there is a short circuit in the mother board circuit or a large impact signal is transmitted, the TVS can be used for protection to protect the daughter board circuit; the C1 capacitor is the filter capacitor of the filter circuit part, which can reduce the ripple of the input voltage, making the back end work stable and the output waveform more stable.

[0044] like Figure 6 As shown, Figure 6 This is a schematic block diagram of the main control circuit board. The main control circuit board consists of four parts: power module, channel control circuit, connection interface with MCU test motherboard and signal output.

[0045] The power module modulates the external AC voltage of the mains into a smooth DC voltage to supply power to the main control circuit board and the sub-circuit board; the channel control circuit outputs a channel selection signal to realize the selective output of chip parameters of multiple sub-circuit boards; the connection interface with the MCU test mother board is a DB26 interface, which is connected to the MCU test mother circuit board to transmit the output signal from the MCU test sub-circuit board and supply power to the MCU test sub-circuit board; the signal output module is composed of an output port, and when the MCU test mother circuit board receives the channel selection signal, it feeds back the output signal of the selected MCU test sub-circuit board to the main control circuit board through the isolated data line, and then the signal is transmitted to the external test equipment through the output port to evaluate the MCU performance and function.

[0046] in, Figure 7 The figure shows a schematic block diagram of the channel control circuit, which is mainly composed of four parts, namely, a channel selection module for output signals, a channel indication module for output signals, an output channel selection operation module and a decoder chip.

[0047] Among them, the specific principle block diagram of the channel control circuit is as follows Figure 8 shown.

[0048] The output channel selection operation module is used to select the output channel of the corresponding MCU test sub-circuit board. This part consists of three coding buttons KA0~KA2 and an enable button KEN, and all buttons are self-locking buttons; the enable button KEN is responsible for controlling whether the circuit works or not, and the default state of the button protrusion is the non-working state; the coding buttons are arranged according to high and low bits, namely KA2, KA1 and KA0, and the default output of the button protrusion state is 0, and the output is 1 when the button is pressed, thereby generating 23=8 kinds of button codes, representing the selection of 8 channels; for the total number of channels is greater than 8, for example, there are N channels, then the number of buttons K should be the integer value of the formula of log2(N). The channel indication module of the output signal uses an indicator light to display the channel selection status. The decoder chip decodes the coding button and outputs the channel selection signal, that is, the 000 code corresponds to channel 1, and it increases in sequence afterwards, and the 111 code corresponds to channel 8;

[0049] The MCU test sub-circuit board of the present invention is compatible with product chips of the same manufacturer, same model, different batches and different versions. Data transmission can be performed without changing the circuit. At the same time, different performance and function test programs can be downloaded to the chip through the burning socket, and the test is efficient and convenient.

[0050] The MCU test mother circuit board of the present invention is compatible with product chips of different manufacturers, different models and different packages. There is no need to modify the MCU test mother circuit board. Only the corresponding MCU test sub-circuit board needs to be plugged in to perform chip test parameter transmission and power supply. The test compatibility of the MCU chip is strong.

[0051] Embodiment 2:

[0052] The present invention also proposes a method for testing a microcontroller MCU chip, comprising:

[0053] Step 1: Obtain the multi-channel output parameters of the MCU chip to be tested through the MCU test sub-circuit board;

[0054] Step 2: sending the multi-channel output parameters to the main control circuit board through the MCU test mother circuit board;

[0055] Step 3, selecting one output parameter from the multiple output parameters for output through the main control circuit board;

[0056] Step 4: Perform a performance or function test on the MCU chip to be tested using the one-way output parameter until all the multiple-way output parameters have completed the test.

[0057] The device of the present invention is simple, efficient and highly compatible in testing.

[0058] Embodiment 3:

[0059] Based on the same inventive concept, the present invention also provides a computer device, which includes a processor and a memory, wherein the memory is used to store a computer program, the computer program includes program instructions, and the processor is used to execute the program instructions stored in the computer storage medium. The processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc. It is the computing core and control core of the terminal, which is suitable for implementing one or more instructions, and is specifically suitable for loading and executing one or more instructions in the computer storage medium to implement the corresponding method flow or corresponding functions, so as to implement the steps of the method in the above embodiment.

[0060] Embodiment 4:

[0061] Based on the same inventive concept, the present invention also provides a storage medium, specifically a computer-readable storage medium (Memory), which is a memory device in a computer device for storing programs and data. It is understandable that the computer-readable storage medium here can include both a built-in storage medium in a computer device and an extended storage medium supported by the computer device. The computer-readable storage medium provides a storage space, which stores the operating system of the terminal. In addition, one or more instructions suitable for being loaded and executed by a processor are also stored in the storage space, and these instructions can be one or more computer programs (including program codes). It should be noted that the computer-readable storage medium here can be a high-speed RAM memory or a non-volatile memory, such as at least one disk memory. The processor can load and execute one or more instructions stored in the computer-readable storage medium to implement the steps of the method in the above embodiment.

[0062] It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes. The schemes in the embodiments of the present invention may be implemented in various computer languages, for example, object-oriented programming language Java and literal scripting language JavaScript, etc.

[0063] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0064] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0065] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0066] Although the preferred embodiments of the present invention have been described, those skilled in the art may make other changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.

[0067] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A device for testing a microcontroller MCU chip, characterized in that: include: Main control circuit board, MCU test mother circuit board and MCU test daughter circuit board; The MCU test sub-circuit board is used to obtain the multi-channel output parameters of the MCU chip to be tested, and send the multi-channel output parameters to the main control circuit board through the MCU test mother circuit board, and the main control circuit board is used to select one output parameter from the multi-channel output parameters for output, and perform the performance or function test of the MCU chip to be tested with the one output parameter until the multi-channel output parameters are all tested; The MCU test sub-circuit board is communicatively connected with the MCU chip to be tested.

2. The device according to claim 1, characterized in that The MCU test sub-circuit board sends the multi-channel output parameters to the MCU test mother circuit board through the connection socket.

3. The device according to claim 1, characterized in that The MCU test sub-circuit boards include a plurality of them, and the MCU test mother circuit board communicates with the plurality of MCU test sub-circuit boards respectively through a plurality of device connection sockets.

4. The device according to claim 1, characterized in that The main control circuit board communicates data with the MCU test mother circuit board via a data connection line.

5. The device according to claim 1, characterized in that The MCU test sub-circuit board comprises: a burning socket, and the burning socket is used to download test programs of different performance and function tests for the MCU chip to be tested.

6. The device according to claim 1, characterized in that The MCU test mother circuit board is connected with different MCU test sub-circuits to test different MCU chips to be tested.

7. The device according to claim 1, characterized in that The output parameter includes at least one of the following: input current, output level and output signal frequency.

8. A method for testing a microcontroller MCU chip using a device as claimed in any one of claims 1 to 7, characterized in that: include: Obtain the multi-channel output parameters of the MCU chip to be tested through the MCU test sub-circuit board; Sending the multi-channel output parameters to the main control circuit board through the MCU test mother circuit board; Selecting one output parameter from the multiple output parameters for output through the main control circuit board; The performance or function test of the MCU chip to be tested is performed using the one-way output parameter until the multiple-way output parameters have all been tested.

9. A computer device, characterized in that: include: one or more processors; a processor for executing one or more programs; When the one or more programs are executed by the one or more processors, the method according to claim 8 is implemented.

10. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and when the computer program is executed, the method according to claim 8 is implemented.

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