Appliance aging test method and device, storage medium and computer equipment

Abstract

According to the appliance aging test method and device, the storage medium and the computer equipment provided by the invention, after it is detected that the appliance to be tested is connected with the charger and the automatic test is started, the appliance is charged through the charger until the electric quantity of the appliance reaches the upper limit threshold, charging is stopped; then heating and aging the appliance according to a preset discharge heating link so as to ensure the consistency of test conditions in the test process until the electric quantity of the appliance is lower than a lower limit threshold value, recording test data of the appliance in the current round, and collecting the test data based on active collection and passive collection modes in a data collection strategy; automatic data acquisition under various acquisition requirements can be met; and finally, updating and adding the database according to the test data, and returning to the charging of the appliance through the charger and the subsequent steps until it is detected that the appliance is disconnected from the charger, so that the charge-discharge cycle of the appliance aging test is realized, and the large-scale and high-efficiency production test requirements are met.

Description

Technical Field

[0001] The present application relates to the field of automated testing technology, and in particular to an equipment aging test method, device, storage medium and computer equipment. Background Art

[0002] As the heat-not-burn industry matures, the quality and reliability of its main products, heat-not-burn appliances, are directly related to consumers' experience and the market competitiveness of the products. In order to ensure that these appliances meet strict quality standards before being put on the market, they must undergo a series of rigorous aging tests after production, which are designed to evaluate the durability, stability and potential safety risks of the products by simulating working conditions for long-term use.

[0003] However, in the existing test process, artificial aging test occupies a dominant position. This test method is not only inefficient, but also lacks stability in the test process. For example, manual operation often makes it difficult to accurately control the test conditions, which affects the consistency of the test results; at the same time, manually recording the number of aging times and data is also prone to errors. In short, the traditional artificial aging test method can no longer meet the needs of large-scale and efficient production testing. Summary of the invention

[0004] The purpose of the present application is to solve at least one of the above-mentioned technical defects, especially the technical defect that the artificial aging test method in the prior art can no longer meet the needs of large-scale and efficient production testing.

[0005] The present application provides an apparatus aging test method, the method comprising:

[0006] When it is detected that the device to be tested is connected to the charger, the device is charged by the charger until the power of the device reaches an upper limit threshold, and the charging is stopped;

[0007] Performing a heating aging cycle on the device according to a preset discharge heating link until the power of the device is lower than a lower threshold or the battery is under-voltage, and recording the number of charging times and aging data of the device in the current round;

[0008] The charging times and the aging data are collected based on a data collection strategy to obtain the test data of the current round; wherein the data collection strategy includes active collection and passive collection;

[0009] The stored data in the database is updated according to the test data, and the process of charging the appliance through the charger and subsequent steps thereof is returned to until it is detected that the appliance is disconnected from the charger.

[0010] Optionally, the heating aging process of the discharge heating link includes:

[0011] Determining test parameters of the device; the test parameters include ambient temperature, puff frequency and single puff duration;

[0012] heating the device and performing a simulated operation of a suction cycle on the device within a first preset time period according to the test parameters;

[0013] After the appliance finishes the simulation operation, the heating of the appliance is stopped, and the appliance is left to stand for a second preset time period.

[0014] Optionally, recording the number of charging times and aging data of the appliance in the current round includes:

[0015] When the device stops charging, the number of charging times recorded by the device is incremented to obtain the number of charging times in the current round, and the charging time, component temperature and heating element resistance of the device in the current round are read;

[0016] After the power level of the device is lower than the lower threshold, recording the number of heating aging times of the device in the current round;

[0017] The aging data of the device in the current round is formed according to the charging time, the component temperature, the resistance of the heating element and the number of heating aging times.

[0018] Optionally, the collecting the charging times and the aging data based on the data collection strategy to obtain the test data of the current round includes:

[0019] Obtaining the collection requirements of the device and determining a data collection strategy corresponding to the collection requirements;

[0020] When it is determined that the data collection strategy is active collection, a data reading request is periodically initiated to the device, and the number of charging times and aging data returned by the device according to the data reading request are received as test data of the device in the current round;

[0021] When it is determined that the data collection strategy is passive collection, the charging times and aging data directly sent by the device are received as the test data of the device in the current round.

[0022] Optionally, the timing initiating a data reading request to the device, and receiving the number of charging times and aging data returned by the device according to the data reading request as test data of the device in the current round, includes:

[0023] Obtaining the address of the device to be collected and generating a data reading request;

[0024] The data read request is sent to the device corresponding to the device address using the MODBUS protocol, so that the device parses the data read request, and the number of charging times and aging data returned according to the parsing result are used as the test data of the device in the current round.

[0025] Optionally, the receiving the charging times and aging data directly sent by the appliance as test data of the appliance in the current round includes:

[0026] Receiving communication information sent by the device; the communication information includes device number, charging times and aging data;

[0027] The charging times and the aging data are aggregated according to the device number to form test data of the device in the current round.

[0028] Optionally, the stored data includes historical rounds of test data corresponding to multiple instrument numbers;

[0029] The updating of the stored data in the database according to the test data comprises:

[0030] Determine the instrument number corresponding to the test data, and retrieve the historical round of test data corresponding to the instrument number in the database;

[0031] The charging times in the historical rounds of test data are modified according to the charging times in the current round, and the aging data in the current round is added to the historical rounds of test data.

[0032] The present application also provides an equipment aging test device, comprising:

[0033] The device charging module is used to detect that the device to be tested is connected to the charger, charge the device through the charger until the power of the device reaches an upper limit threshold, and then stop charging;

[0034] A heating aging module, used to perform a heating aging cycle on the device according to a preset discharge heating link until the power of the device is lower than a lower threshold or the battery is undervoltage, and record the number of charging times and aging data of the device in the current round;

[0035] A data acquisition module, used to collect the charging times and the aging data based on a data acquisition strategy to obtain the test data of the current round; wherein the data acquisition strategy includes active acquisition and passive acquisition;

[0036] A test cycle module is used to update and add the stored data in the database according to the test data, and return to charging the device through the charger and subsequent steps until it is detected that the device is disconnected from the charger.

[0037] The present application also provides a storage medium, in which computer-readable instructions are stored. When the computer-readable instructions are executed by one or more processors, the one or more processors execute the steps of the device aging test method as described in any of the above embodiments.

[0038] The present application also provides a computer device, comprising: one or more processors, and a memory;

[0039] The memory stores computer-readable instructions, and when the computer-readable instructions are executed by the one or more processors, the steps of the device aging test method described in any one of the above embodiments are performed.

[0040] It can be seen from the above technical solutions that the embodiments of the present application have the following advantages:

[0041] The device aging test method, device, storage medium and computer equipment provided by the present application can charge the device through the charger when performing the device aging test after detecting that the device to be tested is connected to the charger and starting the automated test, until the power of the device reaches the upper threshold, and then stop charging, so as to realize the automated charging of the device, and then the device can be heated and aged according to the preset discharge and heating link, so as to ensure the consistency of the test conditions during the test, until the power of the device is lower than the lower threshold, the number of charging times and aging data of the device in the current round are recorded, and the automated monitoring and recording of the data during the test are realized; then, the present application can collect the number of charging times and aging data based on the data collection strategy to obtain the test data of the current round, and here, through the active collection and passive collection in the data collection strategy, various data collection requirements can be adapted; finally, the stored data in the database can be updated and added according to the test data, and the charging of the device through the charger and its subsequent steps are returned until it is detected that the device is disconnected from the charger, so that the charging and discharging cycle and data collection of the device aging test can be realized, thereby meeting the large-scale and efficient production test requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0043] Figure 1 A schematic diagram of a flow chart of an apparatus aging test method provided in an embodiment of the present application;

[0044] Figure 2 A flow chart of a test data recording process provided in an embodiment of the present application;

[0045] Figure 3 A flow chart of a test data collection process provided in an embodiment of the present application;

[0046] Figure 4 A schematic diagram of the structure of an equipment aging test device provided in an embodiment of the present application;

[0047] Figure 5 A schematic diagram of the internal structure of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0048] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0049] In the existing test process, artificial aging test occupies a dominant position. This test method is not only inefficient, but also lacks stability in the test process. For example, manual operation often makes it difficult to accurately control the test conditions, which affects the consistency of the test results; at the same time, manually recording the number of aging times and data is also prone to errors. In short, the traditional artificial aging test method can no longer meet the needs of large-scale and efficient production testing.

[0050] Based on this, this application proposes the following technical solutions, see below for details:

[0051] In one embodiment, Figure 1 As shown, Figure 1 A schematic diagram of a flow chart of an apparatus aging test method provided in an embodiment of the present application; the present application provides an apparatus aging test method, which specifically includes the following:

[0052] S110: When it is detected that the device to be tested is connected to the charger, the device is charged by the charger until the power of the device reaches an upper limit threshold, and then the charging is stopped.

[0053] In this step, when the manufacturer needs to conduct a heating aging test on the heat-not-burning appliances, the appliances to be tested can be connected to the charger in the aging test system, so that after the computer device detects that these appliances are successfully connected to the charger, it can start the automated testing process of the aging test system. At this time, the computer device can first charge the appliances through the charger until the battery power of the appliances reaches the upper limit threshold and then stop charging, thereby realizing automated charging of the appliances.

[0054] Among them, the aging test system is an important test equipment used to detect the performance, reliability and stability of heat-not-burn appliances. It can run the equipment for a long time under specific environmental conditions to simulate various working conditions that may be encountered during the actual use of the equipment, so as to discover potential problems in advance. Therefore, computer equipment can use the test logic in the aging test system to provide a stable test link for the appliance, thereby improving the efficiency and reliability of the appliance aging test.

[0055] Specifically, the device can be connected to the charger via a standard charging cable, and the charging cable is equipped with a serial port line for transmitting relevant data during the test. After detecting that the device has completed the charging connection, the computer device can charge the device through the charger. During the charging process, the computer device can also monitor and record the power changes of the device and other relevant data in real time to ensure the stability and safety of charging. When the power of the device reaches the set upper limit threshold, the computer device will automatically stop charging the device. Therefore, the charging process can achieve full automation of charging start and stop without human intervention.

[0056] It should be noted that the aging test system of the present application is provided with multiple test modules, each of which includes a charger. Therefore, the computer device can be serially connected to multiple devices through the various test modules in the aging test system to achieve simultaneous testing of multiple devices, thereby further improving the test efficiency of heating aging of the devices.

[0057] S120: Perform a heating and aging cycle on the device according to a preset discharge and heating step until the power level of the device is lower than a lower threshold or the battery is under-voltage, and record the number of charging times and aging data of the device in the current round.

[0058] In this step, after the charging of the device is completed through step S110, the computer device can also perform a heating aging cycle on the device according to the discharge heating link pre-set in the aging test system to ensure the consistency of the test conditions during the test, until the power of the device is lower than the lower limit threshold or the battery is under-voltage, and then record the number of charging times and aging data of the device in the current round, so as to realize automatic monitoring and recording of data during the test.

[0059] Among them, the discharge heating link refers to a test link used to simulate the real working state of the instrument during the aging test of the instrument. By gradually releasing the power of the instrument to activate its heating and suction functions, its performance and durability under the condition of reduced power and continuous heating are tested. The aging data recorded during the aging test of the instrument refers to the relevant performance data generated during the instrument's miscellaneous testing process, such as charging time, component temperature, heating element resistance, and heating aging times. This application can use different rounds of aging data to compare and reflect the performance changes and aging degree of the instrument.

[0060] It should be noted that if the power level of the device is lower than the lower threshold, it indicates that the battery power of the device is lower than the power consumption required for its normal operation, and battery undervoltage indicates that the battery voltage of the device is lower than the voltage range required for its normal operation. Therefore, when the power level of the device is lower than the lower threshold or the battery is undervoltage, the device cannot work normally. At this time, it can be regarded that the current round of testing of the device is completed, and the data recording of the current round of testing process can be completed.

[0061] Specifically, during the heating aging cycle, the computer device can strictly control the heating temperature to ensure that the device can be aged under the same conditions. At the same time, the computer device can also release the power of the device through precise current control to ensure that the battery can be discharged evenly, and when the battery power gradually approaches the lower limit threshold, the computer device can slow down the heating intensity and adjust the discharge rate to ensure the safe operation of the device. During the entire test process, the computer device can also continuously monitor and record key data, such as the current number of cycles, power curve, heating temperature changes, and the operating status of the device, to reflect the battery performance and heating efficiency of the device.

[0062] It is understandable that through the cyclic test of the discharge heating link, the computer equipment can ensure the consistency of the test conditions and avoid deviations caused by external interference or human operation. More importantly, the data can be automatically monitored and recorded throughout the process, greatly reducing human intervention, which can not only improve the test efficiency, but also ensure the accuracy and traceability of the data.

[0063] S130: Collect the number of charging times and aging data based on a data collection strategy to obtain test data of the current round; wherein the data collection strategy includes active collection and passive collection.

[0064] In this step, after completing the aging test of the device in the current round through step S120, the computer device can automatically collect the number of charging times and aging data based on the data collection strategy to obtain the test data of the current round. Here, through active collection and passive collection in the data collection strategy, various data collection needs can be adapted.

[0065] Among them, the data collection strategy refers to a method of systematically acquiring relevant data monitored during the test according to the collection requirements. It determines the data collection method, scope, frequency and trigger mechanism to meet different test needs. In this application, it mainly uses active collection and passive collection to flexibly adapt to the test scenario; active collection here refers to the computer equipment actively sending instructions to the equipment through the aging test system to obtain the corresponding data for data collection, while passive collection refers to the equipment actively transmitting the monitoring-related data during the test to the computer equipment through the aging test system.

[0066] It can be understood that through the coordinated work of active and passive collection in the data collection strategy, computer equipment can flexibly adapt to diverse test collection needs, which can not only meet the needs of high-precision real-time data monitoring, but also take into account the reliability of the data collected by the instrument itself, further improving the efficiency of the instrument heating aging test process and the reliability of the test results.

[0067] S140: Update the stored data in the database according to the test data, and return to charging the appliance through the charger and subsequent steps until it is detected that the appliance is disconnected from the charger.

[0068] In this step, after collecting the test data of the device through step S130, the computer device can update the stored data in the database according to the test data. The update here can include operations such as adding, deleting, checking and modifying data, which are not limited here; at the same time, the computer device can also charge the device through the charger to perform the next round of testing, until the computer device detects that the device is disconnected from the charger, which can be regarded as the end of the entire cycle of the heating aging test of the device. Therefore, the present application can realize the charge and discharge cycle and data collection of the device aging test in this way, thereby meeting the needs of large-scale and efficient production testing.

[0069] Specifically, after collecting the test data of the device, the computer device can compare and process the test data with the existing stored data in the database. On the one hand, the computer device can update the relevant data accumulated in the database, such as the number of charging times, based on the test results of the current round; on the other hand, the computer device can also add the newly generated data of this round of testing to the database as part of the stored data. Through such update and addition operations, the database can continuously record the entire test process of the equipment, providing detailed basic data for subsequent equipment performance analysis, problem diagnosis, and production quality control.

[0070] Furthermore, after the current round of testing is completed, the computer device can directly perform the next round of testing on the device to repeat the test cycle. When the computer device detects that the device is disconnected from the charger, it will automatically record the termination status of the device test and generate a complete test report, including the test data of the entire test cycle; at the same time, these data will be stored in the database to form a device test file, providing a basis for subsequent quality traceability and product optimization.

[0071] It is understandable that through the automated testing process of this application, not only can the whole process monitoring of the charging and discharging cycle and aging test of the device be realized, but also the integrated operation of data collection, updating, storage and report generation is ensured. The whole process makes full use of the intelligent advantages of computer equipment, does not require manual intervention, meets the needs of large-scale and high-efficiency production testing, and can significantly improve the test efficiency and the accuracy of data management, providing manufacturers with more reliable product quality assurance means in mass production, while reducing labor costs and improving the automation level and overall efficiency of testing.

[0072] In the above embodiment, when performing an appliance aging test, after detecting that the appliance to be tested is connected to the charger and starting the automated test, the appliance can be charged through the charger until the power of the appliance reaches the upper threshold, and charging is stopped, thereby realizing automated charging of the appliance, and then the appliance can be heated and aged according to the preset discharge and heating link, so as to ensure the consistency of the test conditions during the test process, until the power of the appliance is lower than the lower threshold, the number of charging times and aging data of the appliance in the current round are recorded, and automated monitoring and recording of data during the test process are realized; then, the present application can collect the number of charging times and aging data based on the data acquisition strategy to obtain the test data of the current round, where the active acquisition and passive acquisition in the data acquisition strategy can be adapted to various data acquisition requirements; finally, the stored data in the database can be updated and added according to the test data, and the charging of the appliance through the charger and its subsequent steps are returned until it is detected that the appliance is disconnected from the charger, so that the charge and discharge cycle and data acquisition of the appliance aging test can be realized, thereby meeting the large-scale and efficient production test requirements.

[0073] In one embodiment, the heating aging process of the discharge heating link in step S120 may include:

[0074] S121: Determine the test parameters of the device; the test parameters include ambient temperature, puff frequency and single puff duration.

[0075] S122: Heating the appliance, and performing a simulated operation of a suction cycle on the appliance within a first preset time period according to the test parameters.

[0076] S123: After the device finishes the simulation operation, the heating of the device is stopped, and the device is left to stand for a second preset time period.

[0077] In this embodiment, when the computer device performs a complete discharge heating process on the device, it first heats the device, and simulates the suction cycle of the device within a first preset time, and after the device finishes the simulated operation, stops heating the device, and leaves the device still for a second preset time. This application forms a complete discharge heating process through these two operation stages, which can ensure the scientific nature of the test conditions and the reliability of the test results.

[0078] In the specific implementation, first, the computer device can determine the test parameters of the device according to the following, which include not only the ambient temperature, suction frequency and single suction duration, but also the target temperature, power and other parameters used to heat the device to the target state. During the heating period, the computer device can monitor the temperature changes of the device in real time to ensure the uniformity and stability of the heating. In addition, due to the different effects of different ambient temperatures on the aging rate of the device test, for example, the chemical reaction that occurs when the device is heated inside the high temperature environment is accelerated, resulting in faster attenuation of the device performance, while the cold air enters the device in the low temperature environment, which is easy to affect the heating efficiency of the device, thereby increasing energy consumption; therefore, when the device is heated and aged, the present application can also test the same type of device under multiple temperature conditions separately, thereby improving the reliability of the test results of this type of device.

[0079] In some embodiments, while heating the appliance, the computer device can also perform a simulated operation of air flow circulation on the appliance within a first preset time period, aiming to simulate the working state of the appliance in an actual use scenario; through a built-in simulation device, the computer device can simulate the changes in air flow according to a specific suction frequency, force and rhythm through an aging test system, and perform a circulation operation to detect the performance of the appliance in a working state, thereby effectively evaluating the load conditions that the appliance may encounter during actual use, and providing a basis for performance evaluation by collecting relevant data, such as temperature changes, power consumption and responsiveness.

[0080] Furthermore, the computer device can use different single puffing durations to perform heating aging tests on the device, so as to combine a variety of different test environments to further improve the reliability of the test results. To expand on this, when the single puffing duration of the device is a short-term inhalation, that is, simulating a user to inhale a breath in a short time, the airflow stays in the device for a short time, so that the working cycle of the device discharge heating link is short, that is, the first preset duration is relatively short, and the pressure on the battery and the heating module is small, but it affects the concentration of aerosol generated in the device; when the single puffing duration of the device is a long-term inhalation, that is, simulating a user to inhale a breath in a long time, the air stays in the device for a longer time, so that the heat transfer inside the device is more sufficient, and the quality and uniformity of aerosol generation in the device are higher, but it is easy to increase the load of the battery and the heating module. Therefore, when performing a heating aging test on the device, in addition to adjusting the ambient temperature of the device test, the computer device can also perform different tests on the device by adjusting the inhalation duration of the device puffing action to improve the reliability of the device test results.

[0081] Secondly, when the simulated operation of the device reaches the first preset time, the computer device can stop the simulated operation and terminate the heating process of the device. The precise control of this action can ensure that the device gradually transitions from the working state to the non-working state without causing overheating or other unnecessary loads to the device. Then, the computer device can keep the device in a static state for a second preset time, aiming to simulate the recovery process of the device in the non-working state, and provide supplementary data for a comprehensive assessment of the stability and durability of the device.

[0082] In one embodiment, Figure 2 As shown, Figure 2 A flow chart of a test data recording process provided in an embodiment of the present application; Figure 2 In step S120, the process of recording the number of charging times and aging data of the appliance in the current round may include:

[0083] S123: When the device stops charging, the number of charging times recorded by the device is incremented to obtain the number of charging times in the current round, and the charging time, component temperature and heating element resistance of the device in the current round are read.

[0084] S124: After the power level of the appliance is lower than the lower threshold, the number of heating aging times of the appliance in the current round is recorded.

[0085] S125: Based on the charging time, component temperature, heating element resistance and heating aging times, the aging data of the device in the current round is generated.

[0086] In this embodiment, the computer device can automatically record the relevant data of the device during the test process in two stages to improve the accuracy of data recording. In the first stage, when the device stops charging, the computer device can perform a self-increment operation on the number of charging times recorded by the device to obtain the number of charging times in the current round, and read the charging time, component temperature and heating element resistance of the device in the current round; in the second stage, after the power of the device is lower than the lower limit threshold, the computer device can record the number of heating aging times of the device in the current round; finally, the computer device can form the aging data of the device in the current round based on the charging time, component temperature, heating element resistance and heating aging times.

[0087] It is understandable that after the device stops charging, the computer device can automatically increase the number of charging times and update the number of charging times for the current round to ensure the continuity and accuracy of the charging times. Then, the relevant data of the device during this charging process can be read and recorded, especially the charging time, component temperature and resistance of the heating element. These data are key indicators for evaluating the performance of the device and the stability of the heating element. To elaborate, by accurately measuring the charging time, the computer device can monitor the efficiency of the charging process; by recording component temperatures, such as battery temperature and PCB temperature, the computer device can track the thermal management of the device during the charging process; through the resistance of the heating element, the health of the heating element can be evaluated to timely discover potential losses or failure risks.

[0088] In addition, when the power level of the device is lower than the lower threshold, the computer device can accurately determine when the lower threshold is reached by reading the value of the power sensor, and record the number of heating aging at this time to ensure that the number of cycles in each round is fully preserved. Here, by recording the number of charging and aging times in each round, the computer device can accurately track the use history of the device, and through data analysis, discover possible abnormal patterns in the test process, such as reduced heating effect, battery performance degradation, etc., thereby providing strong support for the quality management and product optimization of the manufacturer.

[0089] In one embodiment, Figure 3 As shown, Figure 3 A flow chart of a test data collection process provided in an embodiment of the present application; Figure 3 In step S130, the process of collecting the number of charging times and aging data based on the data collection strategy to obtain the test data of the current round may include:

[0090] S131: Obtain the collection requirements of the device and determine the data collection strategy corresponding to the collection requirements.

[0091] S132: When the data collection strategy is determined to be active collection, a data reading request is periodically initiated to the device, and the charging times and aging data returned by the device according to the data reading request are received as test data of the device in the current round.

[0092] S133: When the data collection strategy is determined to be passive collection, the charging times and aging data directly sent by the device are received as the test data of the device in the current round.

[0093] In this embodiment, when the computer device collects the test data of the device, it can first obtain the collection requirements of the device, and then use the data collection strategy corresponding to the collection requirements to collect the test data of the device in the current round. Among them, when the data collection strategy is active collection, the computer device can periodically initiate a data reading request to the device, and receive the number of charging times and aging data returned by the device according to the data reading request as the test data of the device in the current round; when it is determined that the data collection strategy is passive collection, the computer device can periodically initiate a data reading request to the device, and receive the number of charging times and aging data returned by the device according to the data reading request as the test data of the device in the current round.

[0094] It is understandable that in the active collection mode, the computer device can ensure that the latest test data of the device is collected and stored within each set time interval; through active collection, the computer device can monitor the operating status of the device in real time with high frequency and high precision, and capture any possible abnormal or fault information in time. In the passive collection mode, the computer device does not actively initiate a request, but collects data by responding to the data actively uploaded by the device; through passive collection, the device itself will actively push its latest test data to the computer device according to the preset collection interval, thereby reducing the computing resource consumption of the computer device and improving the collection efficiency.

[0095] It should be noted that when the computer equipment performs heating aging tests on multiple devices at the same time through the aging test system, the computer equipment can adopt different data collection strategies according to the collection requirements of each device to collect the test data of each device separately, so as to reduce the consumption of computing resources and improve the efficiency of data collection.

[0096] In one embodiment, the process of periodically initiating a data reading request to the appliance in step S132, and receiving the number of charging times and aging data returned by the appliance according to the data reading request as the test data of the appliance in the current round, may include:

[0097] S1321: Obtain the address of the device to be collected and generate a data reading request.

[0098] S1322: Use the MODBUS protocol to send a data read request to the device corresponding to the device address, so that the device parses the data read request, and returns the number of charging times and aging data based on the parsing result as the test data of the device in the current round.

[0099] In this embodiment, in the active collection mode, the computer device can obtain the address of the device to be collected, and generate a data read request, and then use the MODBUS protocol to send the data read request to the device corresponding to the device address, so that the device can parse the data read request, and return the number of charging times and aging data based on the analysis results as the test data of the device in the current round.

[0100] Among them, MODBUS protocol refers to a communication protocol widely used in the industrial field for connecting industrial electronic equipment. In this application, in order to further improve the security and efficiency of data transmission, the computer equipment can modify and expand the basic standard of MODBUS protocol according to the actual needs of the equipment heating aging test, and use the modified and expanded MODBUS protocol to achieve communication connection with the equipment through serial port to 485 communication.

[0101] Specifically, the computer device can identify and read the test data of the corresponding device through the device address. To elaborate, each device connected to the aging test system has a unique device address. When the computer device sends a data read request carrying the device address to each, only the device corresponding to the device address will respond and return the corresponding test data, and other devices will not respond. When there are multiple devices in the aging test system that need to be actively collected, the computer device can collect the test data of these devices in the current round in turn by polling.

[0102] In one embodiment, the process of receiving the charging times and aging data directly sent by the appliance as the test data of the appliance in the current round in step S133 may include:

[0103] S1331: Receive communication information sent by the device; the communication information includes the device number, charging times and aging data.

[0104] S1332: Summarize the charging times and aging data according to the device number to form the test data of the device in the current round.

[0105] In this embodiment, in the passive collection mode, the computer device can receive communication information sent by the device. Since the communication information includes the device number, charging times and aging data, after receiving the communication information sent by the device, the computer device can summarize the charging times and aging data according to the device number to form the test data of the device in the current round.

[0106] Specifically, the computer device can perform data analysis on the received communication information to ensure the integrity and correctness of the data. The analysis process here may include verification and validation operations, such as checking whether the data format complies with regulations, ensuring that no data is lost or damaged, etc. After the data verification is passed, the computer device can associate the number of charging times and aging data according to the analyzed device number, and summarize them into the test data of the device in the current round.

[0107] In one embodiment, the stored data in step S140 may include test data of historical rounds corresponding to multiple instrument numbers; wherein the process of updating the stored data in the database according to the test data may include:

[0108] S141: Determine the instrument number corresponding to the test data, and retrieve the historical round of test data corresponding to the instrument number in the database.

[0109] S142: modifying the number of charging times in the test data of the historical rounds according to the number of charging times in the current round, and adding the aging data of the current round to the test data of the historical rounds.

[0110] In this embodiment, after the computer device collects the test data of the device, it can first determine the device number corresponding to the device data, so as to retrieve the historical rounds of test data corresponding to the device number in the database, and then, the computer device can modify the number of charging times in the historical rounds of test data according to the number of charging times in the current round, and add the aging data of the current round to the test data of the historical rounds.

[0111] It is understandable that the device number, as a parameter that uniquely identifies each device during the test process, can assist the computer device in locating the test data of the corresponding device in historical rounds from the database. After confirming the test data of the device in historical rounds, the computer device can modify the number of charges in the test data of historical rounds according to the number of charges in the current round, ensuring that the number of charges accurately reflects the total number of charges of the device during the entire test cycle. In addition, the computer device also needs to add the aging data of the current round to the test data of the historical round. The aging data reflects the durability and performance of the device under high load, long-term use, etc. Therefore, by integrating the aging data of the current round into the historical data, the computer device can establish a more complete test history archive for the device.

[0112] It should be noted that the update and add operations of this application can ensure the integrity and consistency of the test data through the transaction management of the database to prevent loss or errors during the data update process. When the computer device performs these operations, each update needs to be verified to ensure that each round of test data is accurate.

[0113] The following is a description of an equipment aging test device provided in an embodiment of the present application. The equipment aging test device described below and the equipment aging test method described above can be referenced to each other.

[0114] In one embodiment, Figure 4 As shown, Figure 4 This is a structural diagram of an appliance aging test device provided in an embodiment of the present application; the present application also provides an appliance aging test device, including an appliance charging module 210, a heating aging module 220, a data acquisition module 230 and a test cycle module 240, which specifically include the following:

[0115] The device charging module 210 is used to detect that the device to be tested is connected to the charger, charge the device through the charger until the power of the device reaches an upper limit threshold, and then stop charging.

[0116] The heating aging module 220 is used to perform a heating aging cycle on the device according to a preset discharge heating link until the power of the device is lower than a lower threshold or the battery is under-voltage, and record the number of charging times and aging data of the device in the current round.

[0117] The data collection module 230 is used to collect the number of charging times and aging data based on the data collection strategy to obtain the test data of the current round; wherein the data collection strategy includes active collection and passive collection.

[0118] The test cycle module 240 is used to update the stored data in the database according to the test data, and return to charging the appliance through the charger and subsequent steps until it is detected that the appliance is disconnected from the charger.

[0119] In the above embodiment, when performing an appliance aging test, after detecting that the appliance to be tested is connected to the charger and starting the automated test, the appliance can be charged through the charger until the power of the appliance reaches the upper threshold, and charging is stopped, thereby realizing automated charging of the appliance, and then the appliance can be heated and aged according to the preset discharge and heating link, so as to ensure the consistency of the test conditions during the test process, until the power of the appliance is lower than the lower threshold, the number of charging times and aging data of the appliance in the current round are recorded, and automated monitoring and recording of data during the test process are realized; then, the present application can collect the number of charging times and aging data based on the data acquisition strategy to obtain the test data of the current round, where the active acquisition and passive acquisition in the data acquisition strategy can be adapted to various data acquisition requirements; finally, the stored data in the database can be updated and added according to the test data, and the charging of the appliance through the charger and its subsequent steps are returned until it is detected that the appliance is disconnected from the charger, so that the charge and discharge cycle and data acquisition of the appliance aging test can be realized, thereby meeting the large-scale and efficient production test requirements.

[0120] In one embodiment, the thermal aging module 220 may include:

[0121] The parameter determination submodule is used to determine the test parameters of the device; the test parameters include ambient temperature, puff frequency and single puff duration.

[0122] The suction simulation submodule is used to heat the appliance and perform a simulated operation of a suction cycle on the appliance within a first preset time period according to the test parameters.

[0123] The appliance static submodule is used to stop heating the appliance and to keep the appliance static for a second preset time period after the appliance finishes the simulation operation.

[0124] In one embodiment, the heating aging module 220 may further include:

[0125] The first recording submodule is used to increment the number of charging times recorded by the device when the device stops charging, obtain the number of charging times in the current round, and read the charging time, component temperature and heating element resistance of the device in the current round.

[0126] The second recording submodule is used to record the number of heating aging times of the appliance in the current round after the power of the appliance is lower than the lower limit threshold.

[0127] The data summary submodule is used to form the aging data of the appliance in the current round based on the charging time, component temperature, heating element resistance and heating aging times.

[0128] In one embodiment, the data collection module 230 may include:

[0129] The strategy determination submodule is used to obtain the collection requirements of the device and determine the data collection strategy corresponding to the collection requirements.

[0130] The first acquisition submodule is used to initiate a data reading request to the device at a regular time when the data acquisition strategy is determined to be active acquisition, and receive the number of charging times and aging data returned by the device according to the data reading request as the test data of the device in the current round.

[0131] The second acquisition submodule is used to receive the charging times and aging data directly sent by the device as the test data of the device in the current round when the data acquisition strategy is determined to be passive acquisition.

[0132] In one embodiment, the first acquisition submodule may include:

[0133] The request production unit is used to obtain the address of the device to be collected and generate a data reading request.

[0134] The data request unit is used to send a data read request to the device corresponding to the device address using the MODBUS protocol, so that the device can parse the data read request and return the charging times and aging data according to the parsing result as the test data of the device in the current round.

[0135] In one embodiment, the second acquisition submodule may include:

[0136] The information receiving unit is used to receive the communication information sent by the device; the communication information includes the device number, charging times and aging data.

[0137] The data forming unit is used to summarize the charging times and aging data according to the device number to form the test data of the device in the current round.

[0138] In one embodiment, the test loop module 240 may include:

[0139] The number retrieval submodule is used to determine the instrument number corresponding to the test data, and retrieve the historical round of test data corresponding to the instrument number in the database.

[0140] The data storage submodule is used to modify the charging times in the test data of the historical rounds according to the charging times in the current round, and to add the aging data of the current round to the test data of the historical rounds.

[0141] In one embodiment, the present application also provides a storage medium storing computer-readable instructions. When the computer-readable instructions are executed by one or more processors, the one or more processors execute the steps of the device aging test method as described in any of the above embodiments.

[0142] In one embodiment, the present application also provides a computer device having computer-readable instructions stored therein. When the computer-readable instructions are executed by one or more processors, the one or more processors execute the steps of the device aging test method as described in any one of the above embodiments.

[0143] Indicatively, if Figure 5 As shown, Figure 5 This is a schematic diagram of the internal structure of a computer device provided in an embodiment of the present application. The computer device 300 may be provided as a server. Figure 5 The computer device 300 includes a processing component 302, which further includes one or more processors, and a memory resource represented by a memory 301 for storing instructions executable by the processing component 302, such as an application. The application stored in the memory 301 may include one or more modules, each corresponding to a set of instructions. In addition, the processing component 302 is configured to execute instructions to perform the device aging test method of any of the above embodiments.

[0144] The computer device 300 may further include a power supply component 303 configured to perform power management of the computer device 300, a wired or wireless network interface 304 configured to connect the computer device 300 to a network, and an input / output (I / O) interface 305. The computer device 300 may operate based on an operating system stored in the memory 301, such as Windows Server TM, Mac OS X TM, Unix TM, Linux TM, Free BSD TM, or the like.

[0145] Those skilled in the art will understand that Figure 5 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0146] Finally, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0147] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The various embodiments can be combined as needed, and the same or similar parts can refer to each other.

[0148] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A device aging test method, characterized in that: The method comprises: When it is detected that the device to be tested is connected to the charger, the device is charged by the charger until the power of the device reaches an upper limit threshold, and the charging is stopped; Performing a heating aging cycle on the device according to a preset discharge heating link until the power of the device is lower than a lower threshold or the battery is under-voltage, and recording the number of charging times and aging data of the device in the current round; The charging times and the aging data are collected based on a data collection strategy to obtain the test data of the current round; wherein the data collection strategy includes active collection and passive collection; The stored data in the database is updated according to the test data, and the process of charging the appliance through the charger and subsequent steps thereof is returned to until it is detected that the appliance is disconnected from the charger.

2. The device aging test method according to claim 1, characterized in that: The heating aging process of the discharge heating link includes: Determining test parameters of the device; the test parameters include ambient temperature, puff frequency and single puff duration; heating the device and performing a simulated operation of a suction cycle on the device within a first preset time period according to the test parameters; After the appliance finishes the simulation operation, the heating of the appliance is stopped, and the appliance is left to stand for a second preset time period.

3. The device aging test method according to claim 1, characterized in that: The recording of the number of charging times and aging data of the device in the current round includes: When the device stops charging, the number of charging times recorded by the device is incremented to obtain the number of charging times in the current round, and the charging time, component temperature and heating element resistance of the device in the current round are read; After the power level of the device is lower than the lower threshold, recording the number of heating aging times of the device in the current round; The aging data of the device in the current round is formed according to the charging time, the component temperature, the resistance of the heating element and the number of heating aging times.

4. The device aging test method according to claim 1, characterized in that: The collecting the charging times and the aging data based on the data collection strategy to obtain the test data of the current round includes: Obtaining the collection requirements of the device and determining a data collection strategy corresponding to the collection requirements; When it is determined that the data collection strategy is active collection, a data reading request is periodically initiated to the device, and the number of charging times and aging data returned by the device according to the data reading request are received as test data of the device in the current round; When it is determined that the data collection strategy is passive collection, the charging times and aging data directly sent by the device are received as the test data of the device in the current round.

5. The device aging test method according to claim 4, characterized in that: The timing of initiating a data reading request to the device, and receiving the number of charging times and aging data returned by the device according to the data reading request as test data of the device in the current round, includes: Obtaining the address of the device to be collected and generating a data reading request; The data read request is sent to the device corresponding to the device address using the MODBUS protocol, so that the device parses the data read request, and the number of charging times and aging data returned according to the parsing result are used as the test data of the device in the current round.

6. The device aging test method according to claim 4, characterized in that: The receiving the charging times and aging data directly sent by the device as test data of the device in the current round includes: Receiving communication information sent by the device; the communication information includes device number, charging times and aging data; The charging times and the aging data are aggregated according to the device number to form test data of the device in the current round.

7. The device aging test method according to claim 1, characterized in that: The stored data includes historical rounds of test data corresponding to multiple instrument numbers; The updating of the stored data in the database according to the test data comprises: Determine the instrument number corresponding to the test data, and retrieve the historical round of test data corresponding to the instrument number in the database; The charging times in the historical rounds of test data are modified according to the charging times in the current round, and the aging data in the current round is added to the historical rounds of test data.

8. An equipment aging test device, characterized in that: include: The device charging module is used to detect that the device to be tested is connected to the charger, charge the device through the charger until the power of the device reaches an upper limit threshold, and then stop charging; A heating aging module, used to perform a heating aging cycle on the device according to a preset discharge heating link until the power of the device is lower than a lower threshold or the battery is undervoltage, and record the number of charging times and aging data of the device in the current round; A data acquisition module, used to collect the charging times and the aging data based on a data acquisition strategy to obtain the test data of the current round; wherein the data acquisition strategy includes active acquisition and passive acquisition; A test cycle module is used to update the stored data in the database according to the test data, and return to charging the device through the charger and subsequent steps until it is detected that the device is disconnected from the charger.

9. A storage medium, characterized in that: The storage medium stores computer-readable instructions, and when the computer-readable instructions are executed by one or more processors, the one or more processors execute the steps of the device aging test method according to any one of claims 1 to 7.

10. A computer device, characterized in that: include: one or more processors, and memory; The memory stores computer-readable instructions, and when the computer-readable instructions are executed by the one or more processors, the steps of the device aging test method according to any one of claims 1 to 7 are performed.

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